Sung-Ok
Sung Ok Han, Seoul KR
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20120149074 | Transformant Comprising Gene Coding for ws/dgat and Method of Producing Fatty Acid Ethyl Esters Using the Same - The present invention relates to a transformant comprising a gene encoding ws/dgat (wax ester synthase/acyl-coenzyme A: diacylglycerol acyltransferase) and a method of producing fatty acid ethyl esters using the same. Specifically, the transformant for producing fatty acid ethyl esters is constructed such that glycerol is used as a fermentation substrate, and comprises an atfA gene encoding ws/dgat (wax ester synthase/acyl-coenzyme A: diacylglycerol acyltransferase) from | 06-14-2012 |
20130109070 | TRANSFORMANT FOR ENHANCING BIOETHANOL PRODUCTION, AND METHOD FOR PRODUCING ETHANOL BY USING SAID STRAIN | 05-02-2013 |
Sung Ok Kang, Gyeonggi-Do KR
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20140292195 | PLASMA WAVGUIDE USING STEP PART AND BLOCK PART - In a magnetron and a plasma waveguide through which a microwave oscillated from the magnetron moves, there is provided a plasma waveguide including a plurality of step parts formed at any one side on an inner side surface of the waveguide, and a block part of a predetermined height formed at any other side on the inner side surface of the waveguide, wherein the block part is formed at a side opposite to a boundary part between the plurality of step parts. | 10-02-2014 |
Sung Ok Yoo, Gunpo-Si KR
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20150114377 | PITCHING MACHINE - The present invention relates to a pitching machine. According to the present invention, an upper wheel ( | 04-30-2015 |
Sung-Ok Jang, Gyeonggi-Do KR
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20080293020 | Learner-Controlled Foreign Language Learning Processing Method and System - Learner-controlled foreign language learning method and system are disclosed. The method is performed by a learner's computer and an education server by providing foreign language learning contents to a computer through the Internet, and includes reproducing entire details of a selected foreign language learning content, determining whether there is a request for repeatedly reproducing, and reproducing the entire details of the foreign language learning content again when repeatedly reproducing is requested, processing a repeat-of-pronunciation by reading the details containing the foreign language learning content when the request for repeatedly reproducing is not asked; and processing the learning of the foreign language learning content by providing a question with respect to the details of the foreign language learning content and a request for an answer after the processing the repeat-of-pronunciation, and by comparing a learner's answer with the question. | 11-27-2008 |
20080293021 | Foreign Language Voice Evaluating Method and System - Disclosed are a foreign language oral test method and a system in which a non-native speaker can evaluate a vocal answer of a learner. An education server of the method includes providing at least one of foreign language questions to a leaner computer and receiving and recording the vocal answer corresponding to the provided foreign language question; displaying a plurality of evaluation references such that a non-specialist for foreign language can evaluate the vocal answer of the learner; reproducing a required vocal answer for the provided foreign language question and the recorded vocal answer of the learner; and storing any one of the evaluation references selected by an evaluator who listens to the required vocal answer and the vocal answer of the learner. | 11-27-2008 |
Sung-Ok Kim, Chungcheongnam-Do KR
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20090140761 | METHOD OF TESTING SEMICONDUCTOR DEVICE - A method of testing a semiconductor device, which can reduce a period of time for testing a packaged semiconductor chip. First, semiconductor chips to be tested are classified in a lot unit. The semiconductor chips are fist tested in units of lots. The defective semiconductor chips among the semiconductor chips of a predetermined number of lots that are first time tested are collectively retested. First test data regarding the semiconductor chips may be classified and stored for each respective lot. Retest data regarding the semiconductor chips may be classified and stored for each respective lot. Test data regarding the semiconductor chips may be classified and stored into first test data and retest data for each respective lot. | 06-04-2009 |
Sung-Ok Kim, Chungcheongnam KR
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20080197874 | TEST APPARATUS HAVING MULTIPLE TEST SITES AT ONE HANDLER AND ITS TEST METHOD - A test apparatus includes one handler connected to a tester and one test board divided into two or more sites or two or more test boards. Since only the sites on the test board (or test boards) need be duplicated, rather than the loading lanes or sorters of the handler, the test apparatus can be conveniently compact. Further, while testing semiconductor devices on one site or one test board, semiconductor devices in another site or on another test board can be sorted according to the test result. This enables the reduction or elimination of tester idle time to optimize the efficiency of the test apparatus. | 08-21-2008 |