Patent application number | Description | Published |
20100010366 | METHOD TO EVALUATE PSYCHOLOGICAL RESPONSES TO VISUAL OBJECTS - A method of evaluating the response of a subject to visual features of a visual display, the method including the steps of: (a) presenting a visual display having particular visual features to the subject during a first period; (b) determining brain activity of the subject during the first period; (c) presenting reference display material to a subject during a second period; (d) determining reference brain activity of the subject during the second period; (e) tracking the gaze position of at least one of the eyes of the subject on the visual display during the first period; and (f) evaluating the response of the subject to particular visual features of the visual display by determining differences in brain activity determined between steps (b) and (d) when the gaze of the subject is directed at the particular features. | 01-14-2010 |
20100030097 | METHOD TO DETERMINE THE ATTRIBUTES ASSOCIATED WITH A BRAND OR PRODUCT - A method of evaluating characteristics of a brand or product including the steps of: (a) presenting the brand or product to the subject during a first period; (b) determining brain activity of the subject during the first period; (c) presenting neutral visual and/or audio material to a subject during a second period; (d) determining a reference level of brain activity of the subject during the second period; and (e) evaluating attributes associated by the subject with the brand or product by determining differences in brain activities between the first and second periods. | 02-04-2010 |
20100056276 | ASSESSMENT OF COMPUTER GAMES - A method of improving a computer game, the method including the steps of: (a) causing a player to play the computer game in which various game situations are presented to the player during the course of the game; (b) recording game situation parameters corresponding to the various game situations of step (a); (c) determining brain activity of the player during each of the game situations which are presented to the player; (d) evaluating effectiveness of the game situation parameters by reference to brain activities determined in step (c) for each of the game situation parameters recorded in step (b); and (e) improving the game by eliminating or modifying those game situations which have low levels of brain activity as determined in step (d). | 03-04-2010 |
20100092934 | METHOD TO DETERMINE THE PSYCHOLOGICAL IMPACT OF ENTERTAINMENT OR INDIVIDUAL PRESENTERS - A method for determining the psychological impact of entertainment material having at least first and later episodes, the method including the steps of: (a) presenting a first episode to a target group of subjects, (b) after a predetermined period of time, presenting the later episode to the target group of subjects; (c) determining brain activities of the target group of subjects whilst the later episode is being presented to the target group of subjects; and (d) evaluating the psychological impact of the entertainment material by reference to the levels of brain activities determined in step (c). The method of presenting material and determining brain activities also being used for determining the suitability of an actor from a group of actors or selecting a person from a group of persons for a public role. | 04-15-2010 |
20100094702 | METHOD FOR EVALUATING THE EFFECTIVENESS OF COMMERCIAL COMMUNICATION - A method of quantitatively assessing the effectiveness of an audiovisual, visual or audio advertisement including the steps of: presenting the advertisement to a plurality of subjects, the advertisement having a sequence of audiovisual, visual and/or audio features which occur as a function of time; obtaining, during presentation of the advertisement, EEG signals from the subjects from predetermined scalp sites thereof; calculating SSVEP amplitudes and/or phase differences from EEG signals obtained from the predetermined scalp sites in order to obtain output signals which represent predetermined psychological states of each subject to the features as a function of time; combining the output signals from the subjects to obtain pooled output signals; and displaying the pooled output signals to thereby enable quantitative assessment of the subjects' responses to the features of the advertisement in order to assess the effectiveness of the features of the advertisement. | 04-15-2010 |
20140207558 | Method For Evaluating The Effectiveness Of Commercial Communication - A method of quantitatively assessing the effectiveness of an audiovisual, visual or audio advertisement including the steps of: presenting the advertisement to a plurality of subjects, the advertisement having a sequence of audiovisual, visual and/or audio features which occur as a function of time; obtaining, during presentation of the advertisement, EEG signals from the subjects from predetermined scalp sites thereof; calculating SSVEP amplitudes and/or phase differences from EEG signals obtained from the predetermined scalp sites in order to obtain output signals which represent predetermined psychological states of each subject to the features as a function of time; combining the output signals from the subjects to obtain pooled output signals; and displaying the pooled output signals to thereby enable quantitative assessment of the subjects' responses to the features of the advertisement in order to assess the effectiveness of the features of the advertisement. | 07-24-2014 |
Patent application number | Description | Published |
20080307908 | Optical Inspection Including Partial Scanning of Wafers - Inspection of objects, such as semiconductor wafers, can be performed using a diluted scan wherein not all of an inspected area is actually imaged. Instead, a dilution plan can be devised based on the desired amount of area to be skipped and the particular parameters of the inspection, such as the size of each unit area to be imaged or not imaged and the distribution features of the wafer. When the same area is inspected in multiple wafers, the wafers can be inspected in sets using a dilution plan whereby a wafer (or inspected area) can be statistically inspected using diluted scans of the set of wafers. Similarly a die or group of dies of a specified type can be statistically inspected using diluted scans of a set of dies (or group of dies). When statistical inspection is used, the end results of such inspections, such as defect densities and distributions, can be corrected to account for inaccuracies that may be introduced when certain portions are imaged more often than others due to the dilution plan. | 12-18-2008 |
20090030630 | OPTICAL INSPECTION TOOL FEATURING MULTIPLE SPEED MODES - An optical inspection tool can feature a double-speed and other modes whereby the inspection rate is increased by using pixel binning. For instance, the tool may include an array of pixels provided by one or more detectors. Some or all of the pixels in one or more of the detectors may be binned according to inspection requirements. Based on the reduction in effective pixels due to the binning, in some embodiments, the rate of imaging and scanning rate of the wafer (or other object) can be increased. Different portions of the array may be binned differently to provide for increased throughput during inspections; for instance, the binning arrangement across an array can be correlated to the features that will be imaged using the array. | 01-29-2009 |
20090201494 | Inspection Tools Supporting Multiple Operating States for Multiple Detector Arrangements - An inspection system can support operation in multiple states. For instance, when inspecting an article, such as a semiconductor wafer, the tool can switch between imaging multiple locations using respective detectors to another operating state wherein multiple detectors operating in multiple imaging modes inspect a single location. An inspection system may combine the use of multiple detectors for multiple locations and the use of multiple viewing angles or modes for the same locations and thereby achieve high throughput. The different imaging modes can comprise, for example, different collection angles, polarizations, different spectral bands, different attenuations, different focal positions relative to the wafer, and other different types of imaging. | 08-13-2009 |
20090225307 | WAFER INSPECTION USING SHORT-PULSED CONTINUOUS BROADBAND ILLUMINATION - An inspection system may be configured to inspect objects, such as semiconductor wafers, using narrow-pulse broadband illumination. The illumination may be obtained in some embodiments using a laser configured to emit light into a material having a spectral broadening effect. The inspection system can include various filters which may be selectively placed in the illumination and/or imaging path in order to tune the spectrum of light impinging on the wafer and the light that is detected. The filters may include selectable filters, fixed filters, and filters whose characteristics can be adjusted in-place. In some embodiments, filters may be used to match the illumination/detection spectra of different tools. Additionally, the broadband illumination may be tuned between inspections and/or during inspections for best results. The system may support Fourier filtering whereby light, related to repetitive features of the object and in one or more wavelength sub-bands of the illumination, may be filtered. | 09-10-2009 |
20090323052 | Dynamic Illumination in Optical Inspection Systems - An optical inspection system or tool can be configured to inspect objects using dynamic illumination where one or more characteristics of the illumination is/are adjusted to meet the inspection needs of different areas. For example, the illumination intensity may be increased or decreased as the tool inspects areas of memory and periphery features in a wafer die. In some embodiments, the adjustment can be based on data obtained during a pre-inspection setup sequence in which images taken based on illumination with varying characteristics are evaluated for suitability in the remainder of the inspection process. | 12-31-2009 |
20090324057 | Optical Inspection Tools Featuring Parallel Post-Inspection Analysis - An optical inspection tool can automatically perform analysis/operations that after the tool has generated data identifying defects (e.g. a defect list) from an inspection run of an object such as a semiconductor wafer. The tool can decouple post-inspection tasks from performing inspection runs so that one or more post-inspection tasks are performed on defect data from a previous inspection run while another inspection run is in progress. This can significantly improve the throughput of the tool when multiple inspections are performed, since the inspection run time effectively is shortened to include only the time the tool is actually used to acquire defect data. One or more post-inspection tasks can be performed, including, but not limited to, merging inspection runs, removing duplicate defects, removing straight-line false alarms, and characterizing defects. | 12-31-2009 |