Patent application number | Description | Published |
20130043927 | Integrated Circuit With Pre-Heating For Reduced Subthreshold Leakage - Certain semiconductor processes provide for the use of multiple different types of transistors with different threshold voltages in a single IC. It can be shown that in certain ones of these semiconductor processes, the speed at which high threshold transistors can operate at decreases with decreasing temperature. Thus, the overall processing speed of an IC that implements high threshold transistors is often limited by the lowest temperature at which the IC is designed (or guaranteed) to properly function. Embodiments of a system and method that overcome this deficiency by “pre-heating” the IC (or at least portions of the IC that implement the high threshold transistors) such that the IC can operate at a frequency (once pre-heated) higher than what would otherwise be possible for a given, minimum temperature at which the IC is designed (or guaranteed) to properly function at are provided. | 02-21-2013 |
20130047023 | Adaptive Clocking Scheme to Accommodate Supply Voltage Transients - Adaptive clocking schemes for synchronized on-chip functional Hocks are provided. The clocking schemes enable synchronous clocking which can be adapted according to changes in signal path propagation delay due temperature, process, and voltage variations, for example, in embodiments, the docking schemes allow for the capacity utilization of a logic path to be increased. | 02-21-2013 |
20130047166 | Systems and Methods for Distributing an Aging Burden Among Processor Cores - Systems and methods are presented for reducing the impact of high load and aging on processor cores in a processor. A Power Management Unit (PMU) can monitor aging, temperature, and increased load on the processor cores. The PMU instructs the processor to take action such that aging, temperature, and/or increased load are approximately evenly distributed across the processor cores, so that the processor can continue to efficiently process instructions. | 02-21-2013 |
20130082764 | APPARATUS AND METHOD TO COMBINE PIN FUNCTIONALITY IN AN INTEGRATED CIRCUIT - An apparatus and method are disclosed to combine pad functionality in an integrated circuit. A power, ground, or signal pad is connected to a power, ground, or signal source, respectively. The power, ground, or signal pad is additionally connected to an additional signal source, such as automatic test equipment in a testing environment. By temporarily disconnecting either the power, ground, or signal source, from the functional block within the integrated circuit to which the source is delivered, the same pad may pass in another signal to other portions of the integrated circuit. In the alternative, the same pad may pass in another signal to other portions of the integrated circuit without disconnecting the original signal by coupling the additional signal over the original signal. Further, combining pad functionality enables reuse of an input pad as an output pad for signals originating from within the integrated circuit. | 04-04-2013 |
20130117626 | Adaptive Ultra-Low Voltage Memory - Embodiments provide an adaptive memory that allows for low voltage modes of operation. In the low voltage modes of operation, the supply voltage provided to the memory is reduced below Vcc(min), which allows for significant savings in the power consumption of circuit components (e.g., the CPU) whose minimum voltage is dictated by Vcc(min). According to further embodiments, the memory can be configured dynamically according to various configurations depending on desired power savings (e.g., target Vcc(min)) and/or performance requirements (e.g., reliability, cache size requirement, etc.). | 05-09-2013 |
20130214433 | Efficient Non-Integral Multi-Height Standard Cell Placement - An integrated circuit including a first portion of a first cell library including a first plurality of rows, each of the first plurality of rows having a first row height and the first portion having a first portion height, a second portion of a second cell library including a second plurality of rows, each of the second plurality of rows having a second row height and the second portion having a second portion height, wherein the first portion height is equal to the second portion height and the first row height is different from the second row height, and a connector to electrically connect the first portion of the first cell library to the second portion of the second cell library. | 08-22-2013 |
20140028344 | Pre-Heating For Reduced Subthreshold Leakage - Certain semiconductor processes provide for the use of multiple different types of transistors with different threshold voltages in a single IC. It can be shown that in certain ones of these semiconductor processes, the speed at which high threshold transistors can operate at decreases with decreasing temperature. Thus, the overall processing speed of an IC that implements high, threshold transistors is often limited by the lowest temperature at which the IC is designed (or guaranteed) to properly function. Embodiments of a system and method that overcome this deficiency by “pre-heating” the IC (or at least portions of the IC that implement the high threshold transistors) such that the IC can operate at a frequency (once pre-heated) higher than what would otherwise be possible for a given minimum temperature at which the IC is designed or guaranteed) to properly function at are provided. | 01-30-2014 |
20140139262 | MULTIPLE THRESHOLD VOLTAGE STANDARD CELLS - An integrated circuit cell includes a set of circuit elements associated with a logic function along a logical path between an input and an output of the integrated circuit cell. The set of circuit elements includes a first subset of circuit elements having a first width size and a first threshold voltage and configured to operate within a cycle of time. The set of circuit elements also includes a second subset of circuit elements having a second width size and a second threshold voltage and configured to operate within the cycle of time. The first subset and second subset of circuit elements are configured to toggle data between the input and the output. The second threshold voltage is less than the first threshold voltage when the second width size is less than the first width size. | 05-22-2014 |
20140167815 | AREA RECONFIGURABLE CELLS OF A STANDARD CELL LIBRARY - An integrated circuit using area reconfigurable cells of a standard cell library includes standard cells placed adjacent with one another in rows and columns. Each of the standard cells has a boundary type and each has a body having a first pair of opposite sides and a second pair of opposite sides orthogonal to the first pair of opposite sides. Each standard cell also has a spacer located adjacent to each of the first pair of opposite sides of the body. The spacer has a spacer type that corresponds to the boundary type of the standard cell. The spacer is removable from the standard cell when the spacer has a spacer type that matches another spacer of an adjacent standard cell. | 06-19-2014 |
20140181774 | NON-INTEGER HEIGHT STANDARD CELL LIBRARY - A standard cell library for designing integrated circuits is provided. In some aspects, the standard cell library includes a plurality of standard cells having a cell height that is a non-integer multiple of a wiring pitch of routing tracks associated with the standard cell library. The standard cell library further includes a plurality of landing pins for connecting to the routing tracks arranged in the plurality of standard cells, wherein each of the plurality of landing pins is extended by half of the wiring pitch in opposite directions orthogonal to an orientation of the routing tracks. | 06-26-2014 |
20140183646 | GEOMETRIC REGULARITY IN FIN-BASED MULTI-GATE TRANSISTORS OF A STANDARD CELL LIBRARY - A method of optimizing a layout of an integrated circuit formed using fin-based cells of a standard cell library is provided. The method includes arranging cell rows of different track heights having standard cells. For each cell row, each of the standard cells includes sub-cell rows with sub-cells of one or more types. The sub-cells are interchangeable with one another to modify a device characteristic of the standard cell. The method also includes evaluating the integrated circuit to determine whether a performance metric of the integrated circuit has been satisfied. The method also includes identifying one or more standard cells to modify a device characteristic of the standard cell for satisfying the performance metric of the integrated circuit. The method further includes modifying the one or more standard cells until the performance metric of the integrated circuit is satisfied. | 07-03-2014 |
20140266365 | LATENCY/AREA/POWER FLIP-FLOPS FOR HIGH-SPEED CPU APPLICATIONS - A circuit for a low latency, low area, and low power flip-flop may include a pass-gate multiplexer that can selectively allow one of input or test data to enter a master cell when a clock signal is low. The master cell may include a first inverter cross-coupled to a second inverter, and may receive the input or test data and may latch and provide at an input node of the slave cell, an inverted input data or the test data, upon a transition of the clock signal to a high state. The slave cell may include a second clock pass-gate and a third inverter that is cross-coupled to a fourth inverter, and may receive the inverted input data or the test data and may latch and provide at an output node, the input data or the test data, upon the transition of the clock signal to a high state. | 09-18-2014 |