Patent application number | Description | Published |
20130219107 | WRITE ABORT RECOVERY THROUGH INTERMEDIATE STATE SHIFTING - A memory system or flash card may include a multi-level cell block with multiple states. Before the upper page is written, an intermediate state may be shifted to prevent or minimize overlapping of the states from the corresponding lower page. A write abort during the writing of the upper page will not result in a loss of data from the corresponding lower page. | 08-22-2013 |
20130229868 | Saving of Data in Cases of Word-Line to Word-Line Short in Memory Arrays - Technique of operating a non-volatile memory are presented so that in case data that would otherwise be lost in the case of a word line to word line short is preserved. Before writing a word line, the data from a previously written adjacent is word line is read back and stored in data latches associated with the corresponding bit lines, but that are not being used for the data to be written. If a short occurs, as the data for both word lines is still in the latches, it can be written to a new location. This technique can also be incorporated into cache write operations and for a binary write operation inserted into a pause of a multi-state write. | 09-05-2013 |
20150117099 | Selection of Data for Redundancy Calculation By Likely Error Rate - Layers in a multi-layer memory array are categorized according to likely error rates as predicted from their memory hole diameters. Data to be stored along a word line in a high risk layer is subject to a redundancy operation (e.g. XOR) with data to be stored along a word line in a low risk layer so that the risk of both being bad is low. | 04-30-2015 |
20150121156 | Block Structure Profiling in Three Dimensional Memory - Memory hole diameter in a three dimensional memory array may be calculated from characteristics that are observed during programming. Suitable operating parameters may be selected for operating a block based on memory hole diameters. Hot counts of blocks may be adjusted according to memory hole size so that blocks that are expected to fail earlier because of small memory holes are more lightly used than blocks with larger memory holes. | 04-30-2015 |
20150121157 | Selection of Data for Redundancy Calculation By Likely Error Rate - Layers in a multi-layer memory array are categorized according to likely error rates as predicted from their memory hole diameters. Data to be stored along a word line in a high risk layer is subject to a redundancy operation (e.g. XOR) with data to be stored along a word line in a low risk layer so that the risk of both being bad is low. | 04-30-2015 |
20150162086 | Systems and Methods for Partial Page Programming of Multi Level Cells - Multiple bits of data are programmed together to each cell of a segment of a word line while other segments of the same word line are unprogrammed. Subsequently, additional segments are similarly programmed. Data is read from a partially programmed word line (with a mix of programmed and unprogrammed segments) using a single reading scheme. | 06-11-2015 |
20150162088 | String Dependent Parameter Setup - In a three-dimensional NAND memory in which a block contains multiple separately-selectable sets of strings connected to the same set of bit lines, sets of strings are zoned, and different operating parameters applied to different zones. Operating parameters for a zone are obtained from characterizing a reference set of strings in the zone. | 06-11-2015 |
20150179275 | ASYMMETRIC STATE DETECTION FOR NON-VOLATILE STORAGE - Techniques are disclosed herein for determining whether there is a defect that occurred as a result of programming non-volatile storage elements. Example defects include: broken word lines, control gate to substrate shorts, word line to word line shorts, double writes, etc. The memory cells may be programmed such that there will be a substantially even distribution of the memory cells in different data states. After programming, the memory cells are sensed at one or more reference levels. Two sub-groups of memory cells are strategically formed based on the sensing to enable detection of defects in a simple and efficient manner. The sub-groups may have a certain degree of separation of the data states to avoid missing a defect. The number of memory cells in one sub-group is compared with the other. If there is a significant imbalance between the two sub-groups, then a defect is detected. | 06-25-2015 |