Patent application number | Description | Published |
20120025304 | Trench Semiconductor Device and Method of Manufacturing - A semiconductor device includes a semiconductor body including a trench with first and second opposing sidewalls. A first electrode is arranged in a lower portion of the trench and a second electrode in an upper portion of the trench. A dielectric structure is arranged in the trench, including a first portion between the electrodes. The first portion includes, in sequence along a lateral direction from the first sidewall to the second sidewall, a first part including a first dielectric material, a second part including a second dielectric material selectively etchable to the first dielectric material, a third part including the first dielectric material, the first dielectric material of the third part being continuously arranged along a vertical direction from a top side of the first electrode to a bottom side of the second electrode, a fourth part including the second dielectric material and a fifth part including the first dielectric material. | 02-02-2012 |
20120153386 | SEMICONDUCTOR COMPONENT WITH A SPACE SAVING EDGE STRUCTURE - A semiconductor component is disclosed. One embodiment includes a semiconductor body including a first semiconductor layer having at least one active component zone, a cell array with a plurality of trenches, and at least one cell array edge zone. The cell array edge zone is only arranged in an edge region of the cell array, adjoining at least one trench of the cell array, and being at least partially arranged below the at least one trench in the cell array. | 06-21-2012 |
20130137230 | Semiconductor Device with Field Electrode - A method of producing a semiconductor device includes providing a semiconductor body having a first surface and a dielectric layer arranged on the first surface and forming at least one first trench in the dielectric layer. The at least one first trench extends to the semiconductor body and defines a dielectric mesa region in the dielectric layer. The method further includes forming a second trench in the dielectric mesa region distant to the at least one first trench, forming a semiconductor layer on uncovered regions of the semiconductor body in the at least one first trench and forming a field electrode in the second trench. | 05-30-2013 |
20130221427 | Semiconductor Device With Improved Robustness - A semiconductor device includes a first contact in low Ohmic contact with a source region of the device and a first portion of a body region of the device formed in an active area of the device, and a second contact in low Ohmic contact with a second portion of the body region formed in a peripheral area of the device. The minimum width of the second contact at a first surface of the device is larger than the minimum width of the first contact at the first surface so that maximum current density during commutating the semiconductor device is reduced and thus the risk of device damage during hard commutating is also reduced. | 08-29-2013 |
20130248993 | Stress-Reduced Field-Effect Semiconductor Device and Method for Forming Therefor - A field-effect semiconductor device is provided. The field-effect semiconductor device includes a semiconductor body with a first surface defining a vertical direction. In a vertical cross-section the field-effect semiconductor device further includes a vertical trench extending from the first surface into the semiconductor body. The vertical trench includes a field electrode, a cavity at least partly surrounded by the field electrode, and an insulation structure substantially surrounding at least the field electrode. Further, a method for producing a field-effect semiconductor device is provided. | 09-26-2013 |
20130334565 | Method of Manufacturing a Semiconductor Device Using an Impurity Source Containing a Metallic Recombination Element and Semiconductor Device - Source zones of a first conductivity type and body zones of a second conductivity type are formed in a semiconductor die. The source zones directly adjoin a first surface of the semiconductor die. A dielectric layer adjoins the first surface. Polysilicon plugs extend through the dielectric layer and are electrically connected to the source and the body zones. An impurity source containing at least one metallic recombination element is provided in contact with deposited polycrystalline silicon material forming the polysilicon plugs and distant to the semiconductor die. Atoms of the metallic recombination element, for example platinum atoms, may be diffused out from the impurity source into the semiconductor die to reliably reduce the reverse recovery charge. | 12-19-2013 |
20140131792 | Semiconductor Device with Metal-Filled Groove in Polysilicon Gate Electrode - A semiconductor device includes a semiconductor substrate, a body region of a first conductivity type in the substrate, a source region of a second conductivity type opposite the first conductivity type adjacent the body region, and a trench extending into the substrate adjacent the source and body regions. The trench contains a polysilicon gate electrode insulated from the substrate. The device further includes a dielectric layer on the substrate, a gate metallization on the dielectric layer and covering part of the substrate and a source metallization on the dielectric layer and electrically connected to the source region. The source metallization is spaced apart from the gate metallization and covers a different part of the substrate than the gate metallization. A metal-filled groove in the polysilicon gate electrode is electrically connected to the gate metallization, and extends along a length of the trench underneath at least part of the source metallization. | 05-15-2014 |
20140299932 | Semiconductor Device Including a Gate Trench and a Source Trench - A semiconductor device includes a source trench extending into a semiconductor body from a first surface of the semiconductor body. A source trench dielectric and a source trench electrode are in the source trench. A gate trench dielectric and a gate trench electrode are in a gate trench extending into the semiconductor body from the first surface. A body region of a first conductivity type is between the gate and source trenches. A source region of a second conductivity type different from the first conductivity type is between the gate and source trenches. An interconnection electrically couples the body region and the source trench electrode. The interconnection adjoins a lateral face of the source trench electrode and the body region. A source contact is on the source trench electrode at the first surface. | 10-09-2014 |
20150041816 | SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME - The disclosure relates to a semiconductor device including a semiconductor body, having a first surface, a gate electrode structure, which includes polycrystalline silicon, of an IGFET in a first trench extending from the first surface into the semiconductor body. The device also includes a semiconductor element, which is different from the gate electrode structure of the IGFET and includes polycrystalline silicon, in a second trench extending from the first surface into the semiconductor body, wherein the polycrystalline silicon of the IGFET and of the semiconductor element different therefrom ends below a top side of an insulation layer adjoining the first surface of the semiconductor body. | 02-12-2015 |
20150084121 | Transistor Device with a Field Electrode - A transistor device includes a source region, a drift region, and a body region arranged between the source region and the drift region. A gate electrode is adjacent to the body region, and dielectrically insulated from the body region by a gate dielectric. A field electrode arrangement is adjacent to the drift region and the body region, spaced apart from the gate electrode in a first direction that is perpendicular to a vertical direction in which the source region and the drift region are spaced apart, and includes a field electrode and a field electrode dielectric. The field electrode dielectric dielectrically insulates the field electrode at least from the drift region. The field electrode arrangement has a first width adjacent the drift region, and a second width adjacent the body region and the first width is larger than the second width. | 03-26-2015 |