Patent application number | Description | Published |
20130293249 | Methods for Modeling Tunable Radio-Frequency Elements - A test system for characterizing an antenna tuning element is provided. The test system may include a test host, a radio-frequency tester, and a test fixture. The test system may calibrate the radio-frequency tester using known coaxial standards. The test system may then calibrate transmission line effects associated with the test fixture using a THRU-REFLECT-LINE calibration algorithm. The antenna tuning element may be mounted on a test socket that is part of the test fixture. While the antenna tuning element is mounted on the test socket, scattering parameter measurements may be obtained using the radio-frequency tester. An equivalent circuit model for the test socket can be obtained based on the measured scattering parameters and known characteristics of the antenna tuning element. Once the test socket has been characterized, an equivalent circuit model for the antenna tuning element can be obtained by extracting suitable modeling parameters from the measured scattering parameters. | 11-07-2013 |
20130321012 | Methods and Apparatus for Testing Small Form Factor Antenna Tuning Elements - A test system for testing a device under test (DUT) is provided. The test system may include a DUT receiving structure configured to receive the DUT during testing and a DUT retention structure that is configured to press the DUT against the DUT receiving structure so that DUT cannot inadvertently shift around during testing. The DUT retention structure may include a pressure sensor operable to detect an amount of pressure that is applied to the DUT. The DUT retention structure may be raised and lowered vertically using a manually-controlled or a computer-controlled positioner. The positioner may be adjusted using a coarse tuning knob and a fine tuning knob. The positioner may be calibrated such that the DUT retention structure applies a sufficient amount of pressure on the DUT during production testing. | 12-05-2013 |
20130328582 | Methods and Apparatus for Performing Wafer-Level Testing on Antenna Tuning Elements - A test system for testing an antenna tuning element is provided. The test system may include a tester, a test fixture, and a probing structure. The probing structure may include probe tips configured to mate with corresponding solder bumps formed on a device under test (DUT) containing an antenna tuning element. The DUT may be tested in a shunt or series configuration. The tester may be electrically coupled to the test probe via first and second connectors on the test fixture. An adjustable load circuit that is coupled to the second connector may be configured in a selected state so that a desired amount of electrical stress may be presented to the DUT during testing. The tester may be used to obtain measurement results on the DUT. Systematic effects associated with the test structures may be de-embedded from the measured results to obtain calibrated results. | 12-12-2013 |
20140087668 | Methods and Apparatus for Performing Coexistence Testing for Multi-Antenna Electronic Devices - Radio frequency test systems for characterizing antenna performance in various radio coexistence scenarios are provided. In one suitable arrangement, a test system may be used to perform passive radio coexistence characterization. During passive radio coexistence characterization, at least one signal generator may be used to feed aggressor signals directly to antennas within an electronic device under test (DUT). The aggressor signals may generate undesired interference signals in a victim frequency band, which can then be received and analyzed using a spectrum analyzer. During active radio coexistence characterization, at least one radio communications emulator may be used to communicate with a DUT via a first test antenna. While the DUT is communicating with the at least one radio communications emulator, test signals may also be conveyed between DUT | 03-27-2014 |
20140167794 | Methods for Validating Radio-Frequency Test Stations - A manufacturing system for assembling wireless electronic devices is provided. The manufacturing system may include test stations for testing the radio-frequency performance of components that are to be assembled within the electronic devices. A reference test station may be calibrated using calibration coupons having known radio-frequency characteristics. The calibration coupons may include transmission line structures. The reference test station may measure verification standards to establish baseline measurement data. The verification standards may include circuitry having electrical components with given impedance values. Many verification coupons may be measured to enable testing for a wide range of impedance values. Test stations in the manufacturing system may subsequently measure the verification standards to generate test measurement data. The test measurement data may be compared to the baseline measurement data to characterize the performance of the test stations to ensure consistent test measurements across the test stations. | 06-19-2014 |
20140266941 | Electronic Device With Hybrid Inverted-F Slot Antenna - An electronic device may be provided with a housing. The housing may have a periphery that is surrounded by peripheral conductive structures such as a segmented peripheral metal member. A segment of the peripheral metal member may be separated from a ground by a slot. An antenna feed may have a positive antenna terminal coupled to the peripheral metal member and a ground terminal coupled to the ground and may feed both an inverted-F antenna structure that is formed from the peripheral metal member and the ground and a slot antenna structure that is formed from the slot. Control circuitry may tune the antenna by controlling adjustable components that are coupled to the peripheral metal member. The adjustable components may include adjustable inductors and adjustable capacitors. | 09-18-2014 |
20140302797 | Methods and Apparatus for Testing Electronic Devices Under Specified Radio-frequency Voltage and Current Stress - Test systems for characterizing devices under test (DUTs) are provided. A test system for testing a DUT in a shunt configuration may include a signal generator and a matching network that is coupled between the signal generator and the DUT and that is optimized to apply desired voltage/current stress to the DUT with reduced source power. The matching network may be configured to provide matching and desired stress levels at two or more frequency bands. In another suitable embodiment, a test system for testing a DUT in a series configuration may include a signal generator, an input matching network coupled between the DUT and a first terminal of the DUT, and an output matching network coupled between the DUT and a second terminal of the DUT. The input and output matching network may be optimized to apply desired voltage/current stress to the DUT with reduced source power. | 10-09-2014 |
20140329558 | Electronic Device With Multiple Antenna Feeds and Adjustable Filter and Matching Circuitry - Electronic devices may include antenna structures. The antenna structures may form an antenna having first and second feeds at different locations. A first transceiver may be coupled to the first feed using a first circuit. A second transceiver may be coupled to the second feed using a second circuit. The first and second feeds may be isolated from each other using the first and second circuits. The second circuit may have a notch filter that isolates the second feed from the first feed at operating frequencies associated with the first transceiver. The first circuit may include an adjustable component such as an adjustable capacitor. The adjustable component may be placed in different states depending on the mode of operation of the second transceiver to ensure that the first feed is isolated from the second feed. | 11-06-2014 |
20140333495 | Electronic Device Antenna With Multiple Feeds for Covering Three Communications Bands - Electronic devices may be provided that include radio-frequency transceiver circuitry and antennas. An antenna may be formed from an antenna resonating element and an antenna ground. The antenna resonating element may have a shorter portion that resonates at higher communications band frequencies and a longer portion that resonates at lower communications band frequencies. An extended portion of the antenna ground may form an inverted-F antenna resonating element portion of the antenna resonating element. The antenna resonating element may be formed from a peripheral conductive electronic device housing structure that is separated from the antenna ground by an opening. A first antenna feed may be coupled between the peripheral conductive electronic device housing structures and the antenna ground across the opening. A second antenna feed may be coupled to the inverted-F antenna resonating element portion of the antenna resonating element. | 11-13-2014 |
20140333496 | Antenna With Tunable High Band Parasitic Element - Electronic devices may be provided that include radio-frequency transceiver circuitry and antennas. An antenna may be formed from an antenna resonating element and an antenna ground. The antenna resonating element may have a shorter portion that resonates at higher communications band frequencies and a longer portion that resonates at lower communications band frequencies. The resonating element may be formed from a peripheral conductive electronic device housing structure that is separated from the antenna ground by an opening. A parasitic monopole antenna resonating element or parasitic loop antenna resonating element may be located in the opening. Antenna tuning in the higher communications band may be implemented using an adjustable inductor in the parasitic element. Antenna tuning in the lower communications band may be implemented using an adjustable inductor that couples the antenna resonating element to the antenna ground. | 11-13-2014 |