Li-Jia
Li-Jia Chen, Beijing CN
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20150135791 | METHOD OF ROLLING NIW ALLOY TAPES FOR COATED CONDUCTORS - A method of rolling NiW alloy tapes for coated conductors belongs to the technical field of metal materials rolling. According to the method, a cylindrical NiW alloy ingot with a diameter not less than 10 mm is used to be rolled back and forth along the axial direction as a rolling direction, wherein the content of W is 5˜7 at. %, and the axis of this ingot is perpendicular to the plane where the axes of working rollers are located. During rolling process, the cross sectional area reduction of the ingot is retained at 5% per pass. When the total cross sectional area reduction of the ingot is larger than 98% and the thickness of the tape is down to 60˜100 μm, the rolling is stopped, and thus the NiW alloy tape is obtained. The method has the advantages that the negative influence generated when the NiW alloy tape is produced from a cuboid initial NiW alloy ingot can be reduced as much as possible, the yield of the NiW alloy tapes is increased, as well as relatively ideal effects can be obtained in terms of the surface biaxial texture, the length and the axial quality. | 05-21-2015 |
Li-Jia Li, Stanford, CA US
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20120213426 | Method for Implementing a High-Level Image Representation for Image Analysis - Robust low-level image features have been proven to be effective representations for a variety of visual recognition tasks such as object recognition and scene classification; but pixels, or even local image patches, carry little semantic meanings. For high-level visual tasks, such low-level image representations are potentially not enough. The present invention provides a high-level image representation where an image is represented as a scale-invariant response map of a large number of pre-trained generic object detectors, blind to the testing dataset or visual task. Leveraging on this representation, superior performances on high-level visual recognition tasks are achieved with relatively classifiers such as logistic regression and linear SVM classifiers. | 08-23-2012 |
Li-Jia Liou, Chiayi City TW
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20150371882 | SEMICONDUCTOR MANUFACTURING APPARATUS - A semiconductor manufacturing apparatus includes a chamber, a view port window on a sidewall of the chamber and configured to receive an optical emission spectroscopy (OES); and an air distributor located between the view port window and an inner space of the chamber. The air distributor includes a hollow region aligned with the transparent window and configured to generate an air curtain in the hollow region to isolate the view port from the inner space. | 12-24-2015 |