Ki-Sang
Ki-Sang Kang, Yongin-Si KR
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20090199059 | Semiconductor memory test device and method thereof - A semiconductor memory test device and method thereof are provided. The example semiconductor memory test device may include a fail memory configured to store at least one test result of a memory under test, a mode selecting unit configured to output a selection signal for selecting a memory address protocol of the fail memory based upon which one of a plurality of test modes is active in the memory under test and an address arranging unit configured to arrange address signals to conform with the selected memory address protocol in response to the selection signal received from the mode selecting unit. | 08-06-2009 |
Ki-Sang Kang, Gyeonggi-Do KR
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20090206856 | WAFER BURN-IN SYSTEM WITH PROBE COOLING - The present disclosure relates to a wafer burn-in system having a device cooling a probe card and thereby restraining heat accumulation in the probe card. The disclosed wafer burn-in system includes a probe station and a tester. The probe station includes a burn-in chamber, a probe head, and a wafer stage. The probe head has a probe card installed on the lower surface of the probe head. A cooling device restrains heat accumulation in the probe card, e.g., by generating airflow around the probe card. The wafer stage of the burn-in chamber fixes a wafer loaded on the upper surface of the wafer stage and elevates the wafer for contact with the probe card. The tester connects to the probe station through a general purpose interface bus (GPIB) to convey test signals to and from the probe head, and to control operation of the cooling device. The tester activates the cooling device, e.g., activates air blowers to generate airflow forcibly around the probe card and thereby restrain heat accumulation in the probe card during a burn-in process performed in the burn-in chamber. | 08-20-2009 |
Ki-Sang Kim, Seongnam-Si KR
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20110250758 | PLASMA PROCESSING METHOD OF SEMICONDUCTOR MANUFACTURING APPARATUS - Plasma processing methods of a semiconductor manufacturing apparatus which can minimize the amount of impurities adhered to the surface of a wafer, when a desired process using plasma is performed. According to the plasma processing methods of the semiconductor manufacturing apparatus, after the desired process is completed, the plasma generated over the wafer is diffused, and then the wafer is de-chucked. | 10-13-2011 |
Ki-Sang Kim, Yongin-City KR
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20090203211 | MULTI-CHAMBER SYSTEM HAVING COMPACT INSTALLATION SET-UP FOR AN ETCHING FACILITY FOR SEMICONDUCTOR DEVICE MANUFACTURING - A multi-chamber system of an etching facility for manufacturing semiconductor devices occupies a minimum amount of floor space in a clean room by installing a plurality of processing chambers in multi-layers and in parallel along a transfer path situated between the processing chambers. The multi-layers number | 08-13-2009 |
20090291558 | MULTI-CHAMBER SYSTEM HAVING COMPACT INSTALLATION SET-UP FOR AN ETCHING FACILITY FOR SEMICONDUCTOR DEVICE MANUFACTURING - A multi-chamber system of an etching facility for manufacturing semiconductor devices occupies a minimum amount of floor space in a clean room by installing a plurality of processing chambers in multi-layers and in parallel along a transfer path situated between the processing chambers. The multi-layers number 2 to 5, and the transfer path can be rectangular in shape and need only be slightly wider than the diameter of a wafer. The total width of the multi-chamber system is the sum of the width of one processing chamber plus the width of the transfer path. | 11-26-2009 |
Ki-Sang Moon, Changwon-City KR
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20140146163 | REEL-TO-REEL INSPECTION APPARATUS AND INSPECTION METHOD USING THE SAME - Provided are a reel-to-reel inspection apparatus and method. The reel-to-reel inspection apparatus includes: an unwinding unit configured to unwind a roll-shaped object; a first inspection unit configured to photograph a surface of the object discharged from the unwinding unit; a second inspection unit configured to photograph another surface of the object which has passed through the first inspection unit; a marking unit configured to indicate a mark on the object which has passed through the second inspection unit; and a winding unit configured to wind in a roll shape the object which has passed through the marking unit. | 05-29-2014 |
Ki-Sang Song, Seoul KR
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20130192736 | FILM FOR A TIRE INNER LINER AND PREPARATION METHOD THEREFOR - The present invention relates to a film for a tire inner liner including: a base film layer including polyamide-based resin and a copolymer including a polyamide-based segment and a polyether-based segment; and an adhesive layer including a resorcinol-formalin-latex (RFL)-based adhesive, wherein there is little difference between properties in an MD (machine direction) and a TD (transverse direction), and a method for preparing a film for a tire inner liner, including melting the polyamide-based resin and the copolymer at 230 to 300° C., extruding the molten substance under specific die gap conditions to form a base film, and forming an adhesive layer including a resorcinol-formalin-latex (RFL)-based adhesive on the base film. | 08-01-2013 |
20140242370 | FILM FOR AN INNER LINER FOR A TIRE, AND METHOD FOR MANUFACTURING SAME - This disclosure relates to a film for a tire inner liner including a base film layer including a copolymer or a mixture of 50 wt % to 95 wt % of a polyamide-based resin and 5 wt % to 50 wt % of a polyether-based resin, and an adhesive layer including a resorcinol-formalin-latex (RFL)-based adhesive formed on at least one side of the base film layer, wherein a difference between a maximum thickness and an average thickness of the base film layer and a difference between a minimum thickness and the average thickness of the base film layer are respectively 6% or less of the base film, and a method for manufacturing the same. According to the present invention, an excellent gas barrier property may be achieved with a thin thickness, and thus the weight of a tire may become light and the mileage of automobiles may be improved, and as the inner liner film may have a uniform thickness, excellent forming stability and a tire having excellent durability may be provided. | 08-28-2014 |
Ki-Sang Yoon, Gangwon-Do KR
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20150057546 | METHOD OF GENERATING BODY MARKER AND ULTRASOUND DIAGNOSIS APPARATUS USING THE SAME - A body marker generation method and an ultrasound diagnosis apparatus using the same are provided. The body marker generation method includes capturing an image of a subject by using a three-dimensional (3D) infrared sensor; acquiring position information indicating a position of a probe with respect to the subject; determining a diagnostic part of the subject based on the position information, the diagnostic part being a target object to which the probe transmits an ultrasonic signal; and displaying a body marker for the diagnostic part. | 02-26-2015 |