Patent application number | Description | Published |
20080270608 | COMPUTER SYSTEM - The Computer System consists of components including more than one Computer and Storage Subsystem to which more than one Computer are connected. The Storage Subsystem is equipped with more than one Storage Unit, Management Table registering information to manage Storage Units accessible by each of the Computers and Controller to control accesses by more than one Computer to more than one Storage Unit. The controller controls the accesses according to the information set in the Management Table when the Storage Unit is accessed by the Computer. | 10-30-2008 |
20100196804 | Mask inspection apparatus and image creation method - Provided is a mask inspection apparatus including: emitting unit for emitting electron beams onto a sample; electron detecting unit for detecting the quantity of electrons produced, by the emission of the electron beams, from the sample with patterns formed thereon; image processing unit for generating image data for the patterns on the basis of the electron quantity; and controlling unit for controlling the emitting unit, the electron detecting unit, and the image processing unit. The controlling unit calculates, from the size of a designated observation area of the sample, a division number of divisional images that are synthesized to form a joint image that covers the entire designated observation area. The controlling unit determines divisional areas so that adjacent divisional areas partially overlap each other. The controlling unit acquires SEM images for the respective divisional areas. The controlling unit synthesizes the SEM images of the divisional areas on the basis of coordinate data for the divisional areas and on the basis of edge information for patterns included in the overlapping regions, and thereby creates an SEM image of a wide field of view that covers the observation area. | 08-05-2010 |
20100324367 | CAPSULE MEDICAL APPARATUS AND METHOD OF MANUFACTURING THEREOF - A capsule medical apparatus is provided with a plurality of rigid boards which are connected in line via a flexible board; and molded bodies. The molded bodies are formed in a manner of covering functional components mounted on the respective rigid boards. The molded bodies keep an inter-board interval between the rigid boards by intervening between facing rigid boards. The molded bodies keep an inter-board interval between the rigid boards by intervening between facing rigid boards. | 12-23-2010 |
20110049362 | Pattern measuring apparatus and pattern measuring method - A pattern measuring apparatus includes: an electron irradiating unit for radiating an electron beam onto a sample while scanning; an image data acquiring unit for acquiring an image of a pattern on the basis of an amount of electrons generated from the sample where the pattern is formed, by the radiation of the electron beam; a measurement region setting unit for setting paired measurement regions each including a pattern edge in the image of the pattern; and a controlling unit for calculating a distance between pattern edges in the paired measurement regions by detecting a shape of the pattern edge in each measurement region, respectively. The control unit calculates edge characteristic curves by finding moving averages of edge profiles by use of predetermined moving average widths, respectively, each edge profile representing the pattern edge in one of the measurement regions with position coordinates of each of measurement points arranged at predetermined intervals, and defines the positions of peak values of the edge characteristic curves as edge positions of the patterns in the measurement regions. | 03-03-2011 |
20110206271 | Pattern measurement apparatus and pattern measurement method - A pattern measurement apparatus includes: an irradiation unit for irradiating a sample with an electron beam; an electron detection unit for detecting the amount of electrons generated from the sample on which a pattern is formed; an image processor for generating an SEM image of the pattern based on the amount of electrons; and a controller for acquiring a rectangular measurement specification region of the SEM image and calculating a loss ratio of a corner portion of the pattern from areas of the measurement specification region and the corner portion of the pattern. The controller detects edge positions in a predetermined range including a position where a corner of the measurement specification region intersects with a side of the SEM image, and adjusts the measurement specification region in accordance with the edge positions. | 08-25-2011 |
20110233400 | Pattern measurement apparatus and pattern measurement method - A pattern measurement apparatus includes a beam intensity distribution creation unit to scan a charged particle beam over a reference pattern having edge portions formed at a right angle to create a line profile of the reference pattern and thus create a reference-beam intensity distribution, an edge width detection unit to determine line profiles for pattern models including edges formed at various inclination angles by use of the reference-beam intensity distribution and calculate edge widths reflecting an influence of a width of a reference beam, and a correspondence table creation unit to calculate correction values for edge positions from the calculated edge widths and the pattern models and create a correspondence table in which the edge widths and the correction values are associated with one another. | 09-29-2011 |
20120082842 | ENDOSCOPIC DEVICE - An endoscope device is provided, which includes at least two component members bonded together through an adhesive layer which is formed by curing an adhesive composition, the adhesive composition containing a main agent containing a bisphenol A epoxy resin, a phenol novolac epoxy resin, and an acrylic rubber, a curing agent containing xylylenediamine and its derivative, and a filler. The filler is spherical silica having an average particle size of 0.5 to 20 μm, and accounts for 22 to 44% by mass of a total amount of the adhesive composition. | 04-05-2012 |
20120318976 | PATTERN MEASUREMENT APPARATUS AND PATTERN MEASUREMENT METHOD - A pattern measurement apparatus scans an observation region of a sample surface with an electron beam and detects secondary electrons emitted from the sample surface with the irradiation of the electron beam, by using a plurality of electron detectors arranged around the optical axis of the electron beam. Images are taken in two directions that are orthogonal to a pattern extending direction, and are opposite to each other across the optical axis. Then, profiles of a line orthogonal to each of edges are extracted from the images, and a subtraction between the line profiles is taken to obtain a subtractive profile. The position of an upper end of each edge is detected based on a descending portion of the subtractive profile, and the position of a lower end of the edge is detected based on a rising portion or a descending portion of one of the line profiles. | 12-20-2012 |
20140128669 | ADHESIVE COMPOSITION USED IN A MEDICAL INSTRUMENT AND ENDOSCOPE DEVICE - The adhesive composition used in a medical instrument containing: a main agent which is an epoxy resin selected from the group consisting of bisphenol A-type epoxy resins, bisphenol F-type epoxy resins, and phenol novolac type epoxy resins; a curing agent comprising one or both of meta xylylene diamine and a derivative thereof; acrylic rubber, a filler which contains alumina. | 05-08-2014 |
20140184215 | EDDY CURRENT TESTING APPARATUS, EDDY CURRENT TESTING PROBE, AND EDDY CURRENT TESTING METHOD - An eddy current testing apparatus includes: an eddy current testing probe having an eddy current testing coil arranged on a bottom portion of a casing; a pressing mechanism configured to press the eddy current testing probe so that the bottom portion of the eddy current testing probe is placed in contact with a part of an inner wall surface of a slot formed in an object to be inspected; a carriage configured to mount the pressing mechanism and the eddy current testing probe, the carriage traveling in a depth direction of the slot; and an eddy current testing control device configured to control defect detection for the inner wall surface of the slot by acquiring a detected eddy current signal from the eddy current testing coil. | 07-03-2014 |