Patent application number | Description | Published |
20080229265 | Design Structure for a Clock Distribution Network, Structure, and Method for Providing Balanced Loading in Integrated Circuit Clock Trees - Design structure for a clock distribution network, structure, and method for providing balanced loading is disclosed. In particular, a design structure for a clock distribution network may be formed of one or more clock fanout distribution levels. Each respective distribution level may include an equal number of buffer circuits and wiring routes that have substantially identical physical and electrical properties. Additionally, a final distribution level may include wiring routes that have substantially identical physical and electrical properties connecting buffer circuits to one or more logic leaf connection nodes. | 09-18-2008 |
20080229266 | Design Structure for a Clock Distribution Network, Structure, and Method for Providing Balanced Loading in Integrated Circuit Clock Trees - Design structure for a clock distribution network, structure, and method for providing balanced loading is disclosed. In particular, a clock distribution network may be formed of one or more clock fanout distribution levels. Each respective distribution level may include an equal number of buffer circuits and wiring routes that have substantially identical physical and electrical properties. Additionally, a final distribution level may include wiring routes that have substantially identical physical and electrical properties connecting buffer circuits to one or more logic leaf connection nodes. | 09-18-2008 |
20080240222 | SYSTEM AND METHOD FOR BALANCING DELAY OF SIGNAL COMMUNICATION PATHS THROUGH WELL VOLTAGE ADJUSTMENT - A method of balancing signal interconnect path delays between an analog domain and a digital domain of an integrated circuit includes applying a test signal to a selected one of a plurality of communication paths between the analog domain and the digital domain. A rising edge delay and a falling edge delay of the test signal is equalized by adjusting a body bias voltage of a delay element configured within the selected communication path. A rising edge delay and a falling edge delay for each of the remaining communication paths is compared with the equalized rising edge delay and falling edge delay of the selected communication path, and a body bias voltage for one or more of a plurality of delay elements configured within each of the remaining communication paths is adjusted until corresponding rising and falling edge delays thereof match the equalized rising edge delay and falling edge delay of the selected communication path. | 10-02-2008 |
20080244479 | STRUCTURE FOR INTRINSIC RC POWER DISTRIBUTION FOR NOISE FILTERING OF ANALOG SUPPLIES - A design structure for intrinsic RC power distribution for noise filtering of analog supplies. The design structure is embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit. The design structure includes a voltage regulator; a variable resistor coupled to the voltage regulator; and a performance monitor and control circuit providing a feedback loop to the variable resistor. | 10-02-2008 |
20080273366 | DESIGN STRUCTURE FOR IMPROVED SRAM DEVICE PERFORMANCE THROUGH DOUBLE GATE TOPOLOGY - A design structure embodied in a machine readable medium used in a design process includes a static random access memory (SRAM) device having a pair of cross-coupled, complementary metal oxide semiconductor (CMOS) inverters configured as a storage cell for a bit of data, a first pair of transfer gates configured to couple complementary internal nodes of the storage cell to a corresponding pair of bitlines during a read operation of the device; and a second pair of transfer gates configured to couple the storage cell nodes to the pair of bitlines during a write operation of the device, wherein impedance between the bitlines and the storage cell nodes during the write operation is less than that for the read operation, wherein impedance between the bitlines and the storage cell nodes during the write operation is less than that for the read operation. | 11-06-2008 |
20080273373 | APPARATUS FOR IMPROVED SRAM DEVICE PERFORMANCE THROUGH DOUBLE GATE TOPOLOGY - A static random access memory (SRAM) device a pair of cross-coupled, complementary metal oxide semiconductor (CMOS) inverters configured as a storage cell for a bit of data, a first pair of transfer gates configured to couple complementary internal nodes of the storage cell to a corresponding pair of bitlines during a read operation of the device; and a second pair of transfer gates configured to couple the storage cell nodes to the pair of bitlines during a write operation of the device, wherein impedance between the bitlines and the storage cell nodes during the write operation is less than that for the read operation, wherein impedance between the bitlines and the storage cell nodes during the write operation is less than that for the read operation. | 11-06-2008 |
20080304192 | Low Voltage Head Room Detection For Reliable Start-Up Of Self-Biased Analog Circuits - A method and structure for preventing operation of a circuit in a high current operating region by disabling a start-up circuit until a power supply headroom is detected at a predetermined voltage level. | 12-11-2008 |
20090003419 | TRANSCEIVER FOR RECEIVING AND TRANSMITTING DATA OVER A NETWORK AND METHOD FOR TESTING THE SAME - The present invention provides a transceiver for receiving and transmitting data over a network, and a method for testing the same. In particular, the present invention provides a physical layer transceiver having a built-in-self-test (BIST) device that allows for, among other things, pulse density/width variation and jitter control. | 01-01-2009 |
20090021085 | DESIGN STRUCTURES, METHOD AND SYSTEMS OF POWERING ON INTEGRATED CIRCUIT - Design structures, method and systems of powering on an integrated circuit (IC) are disclosed. In one embodiment, the system includes a region in the IC including functional logic, a temperature sensor for sensing a temperature in the region when the IC is powered up and a heating element therefor; a processing unit including: a comparator for comparing the temperature against a predetermined temperature value, a controller, which in the case that the temperature is below the predetermined temperature value, delays functional operation of the IC and controls heating of the region of the IC, and a monitor for monitoring the temperature in the region; and wherein the controller, in the case that the temperature rises above the predetermined temperature value, ceases the heating and initiates functional operation of the IC. | 01-22-2009 |
20090024972 | STRUCTURES OF POWERING ON INTEGRATED CIRCUIT - Design structures, method and systems of powering on an integrated circuit (IC) are disclosed. In one embodiment, the system includes a region in the IC including functional logic, a temperature sensor for sensing a temperature in the region when the IC is powered up and a heating element therefor; a processing unit including: a comparator for comparing the temperature against a predetermined temperature value, a controller, which in the case that the temperature is below the predetermined temperature value, delays functional operation of the IC and controls heating of the region of the IC, and a monitor for monitoring the temperature in the region; and wherein the controller, in the case that the temperature rises above the predetermined temperature value, ceases the heating and initiates functional operation of the IC. | 01-22-2009 |
20090033389 | MICRO-PHASE ADJUSTING AND MICRO-PHASE ADJUSTING MIXER CIRCUITS DESIGNED WITH STANDARD FIELD EFFECT TRANSISTOR STRUCTURES - Disclosed herein are embodiments of a programmable phase adjusting circuit, a programmable phase adjusting mixer circuit and design structures for these circuits. These circuits comprise a variable delay device connected between input and output nodes. The device includes multiple FETs with input diffusion regions that are connected to a voltage rail via switches so that they can be selectively biased, gates that are connected in series to the input node so that a periodic input signal can be propagated sequentially through each of the gates and output diffusion regions that are connected in parallel to the output node. A current source is connected between the output node and another voltage rail for biasing the output node when the variable delay device is off. The variable delay device enables a circuit in which small increments of selectable phase adjustments can be made to the periodic input signal as a function of propagation delay. | 02-05-2009 |
20090033395 | MULTIPLE SOURCE-SINGLE DRAIN FIELD EFFECT SEMICONDUCTOR DEVICE AND CIRCUIT - Disclosed are embodiments of a variable-delay field effect transistor (FET) having multiple source regions that can be individually and selectively biased to provide an electrical connection to a single drain region. Delay is a function of which of the multiple source regions is/are selectively biased as well as a function of gate resistance and capacitance. Such a variable-delay FET can be incorporated into a phase adjusting circuit, which uses gate propagation delays to selectively phase adjust an input signal. The phase adjusting circuit can be tuned by incorporating non-salicided resistances and additional capacitance at various positions on the gate structure. The phase adjusting circuit can further be modified into a phase adjusting mixer circuit that enables a phase adjusted signal to be combined with an additional signal. | 02-05-2009 |
20090051420 | INTRINSIC RC POWER DISTRIBUTION FOR NOISE FILTERING OF ANALOG SUPPLIES - Analog supply for an analog circuit and process for supplying an analog signal to an analog circuit. The analog supply includes a noise filter having a variable resistor, and a control device coupled to adjust the variable resistor. The control device is structured and arranged to set the resistance of the variable resistor to maximize noise filtering and optimize performance of the analog circuit. | 02-26-2009 |
20090089724 | Detection Method for Identifying Unintentionally Forward-Biased Diode Devices in an Integrated Circuit Device Design - A detection method for identifying unintentionally forward-biased diode devices identifies one or more forward-biased diodes directly from a graphical representation of an integrated circuit (IC) device design. The graphical representation describing one or more IC components as a plurality of geometric shapes that correspond to a set of patterns in at least one semiconductor layer. A detection method may work in conjunction with one or more checks (e.g., electrical rule check (ERC)) to analyze the graphical representation and ensure its manufacturability by reducing the likelihood the forward-biased diodes will be present in the manufactured IC device. | 04-02-2009 |
20090101940 | DUAL GATE FET STRUCTURES FOR FLEXIBLE GATE ARRAY DESIGN METHODOLOGIES - A gate array cell adapted for standard cell design methodology or programmable gate array that incorporates a dual gate FET device to offer a range of performance options within the same unit cell area. The conductivity and drive strength of the dual gate device may be selectively tuned through independent processing of manufacturing parameters to provide an asymmetric circuit response for the device or a symmetric response as dictated by the circuit application. | 04-23-2009 |
20090102529 | SHIFTING INACTIVE CLOCK EDGE FOR NOISE REDUCTION - An integrated circuit and a design structure are disclosed. An integrated circuit may comprise: multiple clocked elements; a clock signal source providing clock signals to the multiple clocked elements; and a clock shifting means coupled between the clock signal source and each of the multiple clocked elements; wherein the clock shifting means shifts clock signals of the multiple clocked elements such that the clock signals of the multiple clocked elements have aligned active edges and misaligned inactive edges to reduce the clock noise generated by the inactive edges of the clock signals. | 04-23-2009 |
20090106707 | Multiple Source-Single Drain Field Effect Semiconductor Device and Circuit - Disclosed are embodiments of a design structure for a variable-delay field effect transistor (FET) having multiple source regions that can be individually and selectively biased to provide an electrical connection to a single drain region. Delay is a function of which of the multiple source regions is/are selectively biased as well as a function of gate resistance and capacitance. Such a variable-delay FET can be incorporated into a phase adjusting circuit, which uses gate propagation delays to selectively phase adjust an input signal. The phase adjusting circuit can be tuned by incorporating non-salicided resistances and additional capacitance at various positions on the gate structure. The phase adjusting circuit can further be modified into a phase adjusting mixer circuit that enables a phase adjusted signal to be combined with an additional signal. | 04-23-2009 |
20090106724 | Transition Balancing For Noise Reduction/Di/Dt Reduction During Design, Synthesis, and Physical Design - An embodiment of a design structure is shown for noise reduction comprising synthesizing blocks of sequential latches, e.g., a pipeline circuit architecture or clocking domain, which comprises combinational logic, synthesizing a root or a master clock and at least one phase-shifted sub-domain clock for each block, assigning primary inputs and primary outputs of the block to the root clock, assigning non-primary inputs and non-primary outputs of the block to the sub-domain clock, splitting root clock inputs into root clock inputs and phase-shifted sub-domain clock inputs, assigning each of the blocks a different phase-shifted sub-domain clock phase offset, creating a clock generation circuitry for the root clocks and the phase-shifted sub-domain clocks. | 04-23-2009 |
20090108320 | TUNABLE CAPACITOR - Disclosed are embodiments of a design structure transistor that operates as a capacitor and an associated method of tuning capacitance within such a capacitor. The embodiments of the capacitor comprise a field effect transistor with front and back gates above and below a semiconductor layer, respectively. The capacitance value exhibited by the capacitor can be selectively varied between two different values by changing the voltage condition in a source/drain region of the transistor, e.g., using a switch or resistor between the source/drain region and a voltage supply. Alternatively, the capacitance value exhibited by the capacitor can be selectively varied between multiple different values by changing voltage conditions in one or more of multiple channel regions that are flanked by multiple source/drain regions within the transistor. The capacitor will exhibit different capacitance values depending upon the conductivity in each of the channel regions. | 04-30-2009 |
20090108869 | Design Structure for a Flexible Multimode Logic Element For Use In A Configurable Mixed-Logic Signal Distribution Path - A design structure for a multimode circuit that is configured to operate in one of multiple operating modes is disclosed. In particular, an exemplary multimode circuit may be configured to operating in one of a full-swing mode, a limited-swing mode, a full-swing to limited-swing converter mode, and a limited-swing to full-swing converter mode. The operating modes of the multimode circuit may be dynamically selectable. One or more multimode circuits may be part of a configurable distribution path for controlling the performance of a signal distribution path or tree of an integrated circuit. | 04-30-2009 |
20090152543 | System, Structure and Method of Providing Dynamic Optimization of Integrated Circuits Using a Non-Contact Method of Selection, and a Design Structure - A system, structure and method is provided for providing dynamic optimization of integrated circuits using a non-contact method of selection, and a design structure on which a subject circuit resides. The method is provided for optimizing an electronic system having at least one integrated circuit. The method includes storing a target performance voltage of the at least one integrated circuit; remotely querying the at least one integrated circuit to obtain the target performance voltage; and providing an operational voltage of a next-level assembly according to the stored target performance voltage. | 06-18-2009 |
20090160689 | HIGH SPEED RESISTOR-BASED DIGITAL-TO-ANALOG CONVERTER (DAC) ARCHITECTURE - A digital to analog converter (DAC) system comprising, a first segment, wherein a segment comprises, a first path including an array of resistors connected in series between a first reference voltage node and a second reference voltage node, wherein the array is connected to a first switch device disposed between nodes of the array and an output node, and a third path including a second resistor in series with a second switch device, wherein the third path is connected in parallel with the first path. | 06-25-2009 |
20090160691 | Digital to Analog Converter Having Fastpaths - A resistor-based digital to analog converter (DAC) having mux fastpaths, which selectively connect a subset (or an entirety) of voltage divider nodes in a DAC to either a higher level of multiplexor hierarchy, or a DAC output node, effectively bypassing one or more levels of multiplexor devices. In addition, the fastpaths may selectively connect lower levels of multiplexor hierarchy to higher levels of multiplexor hierarchy and/or a DAC output node. | 06-25-2009 |
20100019816 | MICRO-PHASE ADJUSTING AND MICRO-PHASE ADJUSTING MIXER CIRCUITS DESIGNED WITH STANDARD FIELD EFFECT TRANSISTOR STRUCTURES - Disclosed herein are embodiments of a programmable phase adjusting circuit, a programmable phase adjusting mixer circuit and design structures for these circuits. These circuits comprise a variable delay device connected between input and output nodes. The device includes multiple FETs with input diffusion regions that are connected to a voltage rail via switches so that they can be selectively biased, gates that are connected in series to the input node so that a periodic input signal can be propagated sequentially through each of the gates and output diffusion regions that are connected in parallel to the output node. A current source is connected between the output node and another voltage rail for biasing the output node when the variable delay device is off. The variable delay device enables a circuit in which small increments of selectable phase adjustments can be made to the periodic input signal as a function of propagation delay. | 01-28-2010 |
20100201377 | Critical Path Redundant Logic for Mitigation of Hardware Across Chip Variation - Cross-die connection structure and method for a die or chip includes buffer elements having a buffer driver and bypass, and control lines coupled to the buffer elements in order to select one of the buffer driver and bypass for each respective buffer element. A logic network is arranged with the buffer elements to form functional paths, a test unit is structured and arranged to test the functional paths and to be coupled to the control lines, and a configuration storage register to set the selected one of the buffer driver and bypass for each passing functional path. | 08-12-2010 |
20120153909 | HYBRID FAST-SLOW PASSGATE CONTROL METHODS FOR VOLTAGE REGULATORS EMPLOYING HIGH SPEED COMPARATORS - Voltage regulator circuits and methods implementing hybrid fast-slow passgate control circuitry are provided to minimize the ripple amplitude of a regulated voltage output. In one aspect, a voltage regulator circuit includes a comparator, a first passgate device, a second passgate device, and a bandwidth limiting control circuit. The comparator compares a reference voltage to a regulated voltage at an output node of the voltage regulator circuit and generates a first control signal on a first gate control path based on a result of the comparing. The first and second passgate devices are connected to the output node of the regulator circuit. The first passgate device is controlled in a bang-bang mode of operation by the first control signal to supply current to the output node. The bandwidth limiting control circuit has an input connected to the first gate control path and an output connected to the second passgate device. The bandwidth limiting control circuit generates a second control signal based on the first control signal, wherein the second control signal is a slew rate limited version of the first control signal, and wherein the second passgate is controlled by the second control signal to supply current to the output node. | 06-21-2012 |
20120153910 | DUAL-LOOP VOLTAGE REGULATOR ARCHITECTURE WITH HIGH DC ACCURACY AND FAST RESPONSE TIME - Dual-loop voltage regulator circuits and methods in which a dual-loop voltage regulation framework is implemented with a first inner loop having a bang-bang voltage regulator to achieve nearly instantaneous response time, and a second outer loop, which is slower in operating speed than the first inner loop, to controllably adjust a trip point of the bang-bang voltage regulator to achieve high DC accuracy. | 06-21-2012 |
20130293991 | CURRENT LEAKAGE IN RC ESD CLAMPS - Aspects of the invention provide an electrostatic discharge (ESD) protection device for eliminating current leakage, and a related method. In one embodiment, an ESD protection device includes: a resistor-capacitor (RC) circuit for receiving a power supply voltage; an ESD clamp including a plurality of n-type field-effect transistors (nFETs) for protecting the IC during an ESD event; a trigger circuit for receiving an output of the RC circuit and generating a trigger pulse to turn on the ESD clamp during the ESD event; and an nFET bias selection circuit connected to the trigger circuit, the nFET bias selection circuit for selecting one of: a low voltage supply or a negative bias voltage supply for the trigger circuit, such that the trigger circuit generates a trigger pulse, in response to selecting the negative bias voltage supply, to turn off the ESD clamp during normal operation. | 11-07-2013 |
20130335248 | RESISTOR-2 RESISTOR (R-2R) DIGITAL-TO-ANALOG CONVERTER WITH PARTIAL RESISTOR NETWORK RECONFIGURATION - A resistor-2 resistor (R-2R) digital-to-analog converter with partial resistor network reconfiguration. A circuit includes a plurality of resistor stacks. The circuit also includes a plurality of separation resistors which separate each of the plurality of resistor stacks. The circuit further includes a first selection circuit connected to a first resistor stack of the plurality of resistor stacks and a plurality of selection circuits connected between the plurality of separation resistors. The circuit also includes a termination resistor stack connected to a drain of the first resistor stack. | 12-19-2013 |
20130335249 | RESISTOR-2 RESISTOR (R-2R) DIGITAL-TO-ANALOG CONVERTER WITH RESISTOR NETWORK REVERSAL - A resistor-2 resistor (R-2R) digital-to-analog converter with resistor network reversal and methods of use are disclosed. A circuit includes a plurality of resistor stacks and a plurality of separation resistors which separate the resistor stacks. The circuit further includes a plurality of selection devices connected to a respective one of the plurality of resistor stacks. The circuit also includes a first termination resistor stack connected to a drain of a first resistor stack of the plurality of resistor stacks and a second termination resistor stack connected to a drain of a last resistor stack of the plurality of resistor stacks. The circuit further includes a first switch connected to the drain of the first resistor stack of the plurality of resistor stacks and an output. The circuit also includes a second switch connected to the drain of the last resistor stack of the plurality of resistor stacks and the output. | 12-19-2013 |
20140365988 | NETWORK RECONFIGURATION IN A DATA CONVERTER FOR IMPROVED ELECTRICAL CHARACTERISTICS - A process of optimizing a resistor-2 resistor (R-2R) digital-to-analog converter (DAC) by partial resistor network reconfiguration is disclosed. The method includes analyzing a circuit to determine whether any specifications are outside predetermined limits. The method further includes determining one or more addresses that cause the circuit to be outside of the predetermined limits. The method further includes defining logic to detect address information and control function to alter the circuit to improve the specifications. The method further includes installing the control function into the circuit to improve the specifications. | 12-11-2014 |