Patent application number | Description | Published |
20080298156 | SEMICONDUCTOR DEVICE UNDERGOING DEFECT DETECTION TEST - A semiconductor device has a first operation mode and a second operation mode in which power supply with a higher voltage value than that in the first operation mode is provided. The semiconductor device includes a memory portion having memory cells for storing data and a power supply circuit portion supplying a first voltage and a second voltage to the memory portion. The memory portion writes or reads data to or from the memory cells based on the first voltage and the second voltage, and the power supply circuit portion provides a smaller voltage difference between the first voltage and the second voltage in the second operation mode as compared with the voltage difference in the first operation mode. | 12-04-2008 |
20100109761 | SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT - A semiconductor integrated circuit device has a negative voltage generation circuit provided at each power supply circuit unit for six memory macros. Therefore, the response with respect to variation in a negative voltage is increased. In a standby mode, a negative voltage supply line for the six memory macros is connected by a switch circuit, and only a negative voltage generation circuit of one power supply circuit unit among six negative voltage generation circuits of the six power supply circuit units is rendered active. Thus, increase in standby current can be prevented. | 05-06-2010 |
20110182131 | SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT - A semiconductor integrated circuit device has a negative voltage generation circuit provided at each power supply circuit unit for six memory macros. Therefore, the response with respect to variation in a negative voltage is increased. In a standby mode, a negative voltage supply line for the six memory macros is connected by a switch circuit, and only a negative voltage generation circuit of one power supply circuit unit among six negative voltage generation circuits of the six power supply circuit units is rendered active. Thus, increase in standby current can be prevented. | 07-28-2011 |
20130249624 | SEMICONDUCTOR DEVICE INCLUDING INTERNAL VOLTAGE GENERATION CIRCUIT - A semiconductor integrated circuit device has a negative voltage generation circuit provided at each power supply circuit unit for six memory macros. Therefore, the response with respect to variation in a negative voltage is increased. In a standby mode, a negative voltage supply line for the six memory macros is connected by a switch circuit, and only a negative voltage generation circuit of one power supply circuit unit among six negative voltage generation circuits of the six power supply circuit units is rendered active. Thus, increase in standby current can be prevented. | 09-26-2013 |
Patent application number | Description | Published |
20080307630 | Hemming Working Method and Working Apparatus - A moving die is held by a robot and made to approach a vehicle, and a positioning pin is inserted into a positioning hole of the vehicle. The moving die is brought into a floating state of being displaceable relative to the vehicle by reducing a force of the robot for maintaining an attitude thereof. In a state of holding the moving die by the robot, a surface of the moving die is brought into contact with the vehicle by an adsorbing mechanism including an adsorbing portion of an elastic member provided to the moving die. The moving die and the robot are cut to be separated. | 12-18-2008 |
20090031812 | Spot welding inspecting apparatus - A spot welding inspecting apparatus is provided with: a gun chip; a signal transmitting part; an ultrasonic sensor; an inner cylinder; a through hole; a partitioning cylinder; a first flow path; a second flow path; and a third flow path. | 02-05-2009 |
20110245052 | FASTENING DEVICE, METHOD OF LOADING FASTENING MEMBER, AND DEVICE FOR LOADING FASTENING MEMBER - A fastening device includes a rotational drive portion that rotationally drives a socket, an advance/retract drive portion that causes this socket to advance or retract along a rotational axis thereof, a magazine that retains a plurality of heads that retain bolts, and a switching portion that moves this magazine to selectively position one of a plurality of heads ahead and on the rotational axis of the socket. One of the heads is selected and positioned on the rotational axis of the socket by the switching portion, then the socket is advanced by the advance/retract drive portion and the head thus selected is retained by the socket, then the socket is advanced further by the advance/retract drive portion and the head to detach is detached from the magazine, and then the head is rotated by driving the rotational drive portion, thereby fastening a bolt retained in the head. | 10-06-2011 |
20120291508 | HEMMING WORKING METHOD AND WORKING APPARATUS - A moving die is held by a robot and made to approach a vehicle, and a positioning pin is inserted into a positioning hole of the vehicle. The moving die is brought into a floating state of being displaceable relative to the vehicle by reducing a force of the robot for maintaining an attitude thereof. In a state of holding the moving die by the robot, a surface of the moving die is brought into contact with the vehicle by an adsorbing mechanism including an adsorbing portion of an elastic member provided to the moving die. The moving die and the robot are cut to be separated. | 11-22-2012 |
Patent application number | Description | Published |
20100024558 | METHOD OF EVALUATION USING ULTRASONIC WAVES - The intensity of first reflected ultrasonic waves reflected from an end of a first electrode tip is measured while the electrode tip is separated from a workpiece. The intensity of second reflected waves reflected from the end of the electrode tip is measured while the electrode tip contacts with the workpiece. Based on the above intensities, an intensity ratio (reflectance) and the fraction of the waves entering the workpiece are determined from the following equations. | 02-04-2010 |
20110233174 | SPOT WELDING METHOD - For spot-welding a plurality of metal workpieces, the metal workpieces are gripped and pressed under a pressing force by a pair of electrode tips, thereby forming a contact interface between the metal workpieces. Then, an electric current is passed between the electrode tips, and it is determined whether the contact interface is melted or not. Simultaneously when it is judged that the contact interface is melted, the pressing force applied from the electrode tips to the metal workpieces is reduced to such a level that the electrode tips and the metal workpieces are kept in contact with each other, the metal workpieces are kept in contact with each other, and the electric current keeps flowing between the electrode tips. | 09-29-2011 |
20130153544 | WELDING METHOD AND WELDING DEVICE - A resistance welding device is provided with a lower tip and an upper tip that serve as welding tips, and pressing rods that serve as pressing members. The upper tip and the pressing rods press a stacked body, which is to be welded, from the metallic plate side, which is the outermost member of the stacked body. The lower tip presses the stacked body from the lowermost metallic plate side. In this state, and electric current is conducted from the upper tip to the lower tip. | 06-20-2013 |