Patent application number | Description | Published |
20100246268 | METHOD OF PROGRAMMING NONVOLATILE MEMORY DEVICE - In a method of programming a nonvolatile memory device, when a program is performed, a program voltage is applied to a first word line selected for the program. A first pass voltage is applied to three second word lines neighboring the first word line toward a source select line. First and second voltages are applied to third and fourth word lines neighboring the first word line toward the source select line. A second pass voltage is applied to the remaining word lines other than the first to fourth word lines. | 09-30-2010 |
20100329021 | METHOD OF PROGRAMMING NONVOLATILE MEMORY DEVICE - A method of programming a nonvolatile memory device includes inputting program data to page buffers; performing a program operation and a program verification operation until threshold voltages of memory cells included in a selected page reach a target level according to the program data; when the threshold voltages of the memory cells reach the target level, performing an over-program verification operation to determine over-programmed memory cells in the memory cells; and making a determination of whether error checking and correction (ECC) processing for the over-programmed memory cells is feasible. | 12-30-2010 |
20110261623 | METHOD OF ERASING SEMICONDUCTOR MEMORY DEVICE - A method of erasing a semiconductor memory device comprises grouping a plurality of word lines of each memory block into at least two groups based on intensity of disturbance between neighboring word lines; performing an erase operation by applying a ground voltage to all word lines of a selected memory block and by applying an erase voltage to a well of the selected memory block; and first increasing the ground voltage of one group of the groups to a positive voltage during the erase operation. | 10-27-2011 |
20120294091 | METHOD FOR OPERATING NON-VOLATILE MEMORY DEVICE - A method for operating a non-volatile memory device which includes a plurality of memory cells serially coupled between a source selection transistor and a drain selection transistor, a first dummy memory cell coupled between the source selection transistor and the memory cells, and a second dummy memory cell coupled between the drain selection transistor and the memory cells includes applying a verification voltage to a gate of a selected memory cell, applying a first voltage to gates of unselected memory cells, and applying a second voltage that is lower than the first voltage to a gate of at least one of the first dummy memory cell and the second dummy memory cell, during a program verification operation. | 11-22-2012 |
20130235671 | SEMICONDUCTOR MEMORY DEVICE AND OPERATING METHOD THEREOF - A semiconductor memory device and a method of operating a semiconductor memory device includes connecting selected even bit lines to selected even cell strings, programming memory cells in the selected even cell strings by using a second program permission voltage higher than a first program permission voltage, connecting selected odd bit lines to selected odd cell strings when programming of the memory cells is finished, and programming memory cells in the selected odd cell strings by using the first program permission voltage. | 09-12-2013 |
20150325306 | SEMICONDUCTOR MEMORY DEVICE AND A READING METHOD THEREOF - A semiconductor memory device may include a common source line controller configured to provide a channel current to a cell string via a common source line during a read operation and a page buffer configured to detect data stored in a selected memory cell by detecting a current of the bit line when the channel current is provided. The page buffer may selectively bias the bit line to maintain a voltage of the bit line to be the same as or higher than a reference voltage. | 11-12-2015 |
20160062686 | SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME - A semiconductor device and a method of operating the same are provided. A plurality of memory blocks are erased. It is determined whether a selected memory block among the memory blocks is a lastly erased memory block. The selected memory block or another memory block is programmed according to a result of determination. | 03-03-2016 |
20160125935 | SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME - A semiconductor device and a method of operating the same are provided. The method includes performing a program operation on a memory cell so that a threshold voltage of the memory cell is greater than a main verifying voltage, and while the program operation is performed, a bit line voltage applied to a bit line connected to the memory cell gradually increases based on the threshold voltage of the memory cell and the number of times a program voltage is applied to a word line connected to the memory cell. | 05-05-2016 |