Hariyama
Takahiko Hariyama, Shizuoka JP
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20150224452 | ORGANIC POLYMER THIN MEMBRANE, AND METHOD FOR PRODUCING SAME - Provided is a technique for fabricating a novel thin membrane with a starting material such as a biocompatible compound that is not easily processible into a membrane, particularly a technique for fabricating a novel thin membrane of a composition that is gradually polymerized from a membrane surface into the membrane in the cross sectional direction of the membrane, and having, for example, different structures on the front and back of the membrane. The technique includes the steps of preparing a solution of a starting material compound; forming a thin membrane of the solution on a base material surface; and forming the organic polymer thin membrane through a polymerization reaction caused by irradiating the exposed surface of the thin membrane with a plasma or an electron beam. | 08-13-2015 |
Tatsuo Hariyama, Fujisawa JP
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20090190123 | METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE - The present invention relates to an apparatus for detecting defects on a disk surface which projects light on the disk surface by a light transmitting system, receives specula reflection light and scattered light by a light receiving system, exposes defects by performing a two-dimensional frequency filter process on a signal, and performs a defect determination process to extract a linear-shaped isolative defect candidate. Next, the present invention performs a periodicity determination process to classify and detect the periodically generated linear and circular arc defects and the isolatively generated linear and circular arc defects. | 07-30-2009 |
20090237669 | SURFACE DEFECT INSPECTING APPARATUS WITH DEFECT DETECTION OPTICAL SYSTEM AND DEFECT-DETECTED IMAGE PROCESSING - There is provided a defect inspecting apparatus, which includes an irradiating optical system of irradiating a light beam on a surface of a face plate of a disk mounted on a stage to scan the surface of the face plate, a light-receiving optical system of receiving specular reflection light that has transmitted a shading filter with a shading difference that changes an amount of the specular reflection light from the face plate resulting from the light beam irradiated on the disk, and a processing unit of identifying defects on the surface of the face plate from the change in amount of the specular reflection light that has transmitted a filter, so that a size and a height of the defect can be measured with high accuracy when irregular defects are determined, which is not easily achieved by a conventional lens effect. | 09-24-2009 |
20100201975 | DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND INSPECTION METHOD THEREOF - The invention has a function of preparing a data base for a relation between a defect shape and an arrangement for the optical system capable of detecting the shape at high sensitivity and automatically adjusting the arrangement for the optical system. As the method of preparing the data base, a method of using optical simulation or an experimental method of using a sample having an optical shape is applied. A pinhole position and a beam size are adjusted automatically so as to attain the optimal arrangement for the optical system to an inputted defect shape based on the data base. | 08-12-2010 |
Tatsuo Hariyama, Yokohama-Shi JP
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20130140445 | Multi-Point Measuring Method of FBG Sensor and Multi-Point Measuring Apparatus - A multi-point measuring apparatus of FBG sensor has an optical fiber, a wide-band wavelength light source, a light-source side light modulator for controlling time of a light entering into the optical fiber, among lights from this light source, a detector side light modulator for controlling time, during which a reflection light from a diffraction grating of the optical fiber penetrates through, a wavelength shift amount calculator for processing a signal obtained through detection of the reflection light from this light modulator, a temperature/distortion calculator for calculating an amount of deformation of a target to be measured from a result of this calculator, and a display portion for displaying information relating to the amount of deformation of this target to be measured. | 06-06-2013 |
Tatsuo Hariyama, Yokohama JP
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20130003038 | Distance Measuring Device and Distance Measuring Method - Disclosed is a distance measuring device using an optical comb. In order for the absolute distance to an object to be measured which has a surface with low reflection ratio or a scattering surface and is approximately 10 m apart, to be easily measured with accuracy of 0.1 mm or more using an optical and contactless method, the distance measuring device which measures the distance to the object to be measured is configured such that the distance to the object to be measured is measured by comparing the phase of the beat signal between a light source and a plurality of CW lasers which are reflected or scattered by the object with the phase of the beat signal between the light source and a plurality of CW lasers prior to being irradiated onto the object. | 01-03-2013 |
Tatsuo Hariyama, Tokyo JP
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20150241206 | SHAPE MEASURING METHOD AND DEVICE - The purpose of the present invention is to provide a shape inspection device that improves, without making the device larger, durability and measurement precision by measuring a plurality of points with a single distance sensor. The present invention provides a shape measuring device that measures the shape of an object to be measured and that comprises: a distance sensor that calculates the distance to the object to be measure by irradiating a measurement light toward the object to be measured and detecting the reflected light from the object to be measured; a separating unit that separates the measurement light from the distance sensor into a plurality of measurement light rays to be irradiated onto a plurality of measuring points; and a selecting unit that selects, from the plurality of measurement light beams separated by the separating unit, the measurement light to irradiate the object to be measured. | 08-27-2015 |