Patent application number | Description | Published |
20080226025 | Device and Method for Mapping the Distribution of an X-ray Fluorescence Marker - The invention relates to a method and a device for determining the distribution of an X-ray fluorescence (XRF) marker ( | 09-18-2008 |
20090003514 | INTEGRATED MULTI-SENSOR SYSTEMS FOR AND METHODS OF EXPLOSIVES DETECTION - An integrated, multi-sensor, Level 1 screening device is described, which system provides a next-generation Explosives Detection System (EDS) that enables high throughput, while drastically reducing false alarms. In exemplary embodiments, the present system comprises a non-rotational, Computed Tomography (CT) system and a non-translational, X-ray diffraction (XRD) system, both in an inline configuration. | 01-01-2009 |
20090028294 | SYSTEMS AND METHODS FOR IDENTIFYING A SUBSTANCE - A method for identifying a substance is described. The method includes detecting, by a first scatter detector, a first set of scattered radiation, generating a first effective atomic number from the first set of scattered radiation, detecting, by a second scatter detector, a second set of scattered radiation, generating a second effective atomic number from the second set of scattered radiation, and determining whether the first effective atomic number is within a limit of the second effective atomic number. | 01-29-2009 |
20090060133 | SYSTEMS AND METHODS FOR USING A CRYSTALLINITY OF A SUBSTANCE TO IDENTIFY THE SUBSTANCE - A method for naming a substance is described. The method includes using a crystallinity of the substance to name the substance. | 03-05-2009 |
20090166551 | Systems and methods for reducing a degradation effect on a signal - Systems and methods for reducing a degradation effect on a signal are described. One of the methods includes pre-processing data based on a scan of a reference object and a scan of a substance. The reference object includes a material having an atomic number ranging from and including forty to sixty. | 07-02-2009 |
20090168957 | METHOD, A PROCESSOR, AND A SYSTEM FOR TRACKING A FOCUS OF A BEAM - A system, a processor, and a method for tracking a focus of a beam are described. The method includes determining a plurality of intensities corresponding to a plurality of voltages, and applying a first voltage of the plurality of voltages corresponding to a maximum intensity of the plurality of intensities during a scan. | 07-02-2009 |
20090168958 | APPARATUS AND METHOD FOR IDENTIFYING COMPONENTS IN A CONTAINER - A scanner includes a transmission detector, an x-ray source positioned to emit a beam of x-rays toward the transmission detector, and a scatter detector positioned to receive x-rays scattered from the beam of x-rays by an object. The scanner includes a computer programmed to receive data from the transmission detector and from the scatter detector, and determine a material composition of the object based on the data received from the transmission and scatter detectors. | 07-02-2009 |
20090168962 | System and methods for characterizing a substance - A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line. | 07-02-2009 |
20090168963 | Method, a processor, and a system for identifying a substance - A method, a processor, and a system for identifying a substance are described. The method includes identifying a substance based on a plurality of integrated intensities of a plurality of X-ray diffraction profiles. | 07-02-2009 |
20090213989 | SYSTEM AND METHOD FOR XRD-BASED THREAT DETECTION - System and method for XRD-based threat detection. An object is scanned with a first threat detection system. One or more alarm objects are identified. Data about the one or more alarm objects is passed from the first threat detection system to a second threat detection system and is used to move and/or to rotate the object in a predetermined ray path that decreases attenuation of scattered x-ray radiation. Also disclosed is a secondary collimator for XRD-based false alarm resolution in computed tomography {“CT”) threat detection systems. The secondary collimator comprises one or more slit apertures configured to provide a multi-angle capability that extends a range of momenta for which XRD intensities are measured for a predetermined range of photon intensities. | 08-27-2009 |
20090245463 | AUTOMATIC MATERIAL DISCRIMINATION BY USING COMPUTER TOMOGRAPHY - Method and apparatus are provided for combining information obtained from CT and Coherent Scatter Computed Tomography to better determine whether there are dangerous materials in the baggage or not. Hence, the attenuation coefficient and the diffraction pattern of the item of baggage are used to determine whether the baggage should be cleared. | 10-01-2009 |
20090323889 | XRD-BASED FALSE ALARM RESOLUTION IN MEGAVOLTAGE COMPUTED TOMOGRAPHY SYSTEMS - System and method for XRD-based false alarm resolution in computed tomography (“CT”) threat detection systems. Following a scan of an object with a megavoltage CT-based threat detection system, a suspicious area in the object is identified. The three dimensional position of the suspicious area is used to determine a ray path for the XRD-based threat detection system that provides minimal X-ray attenuation. The object is then positioned for XRD scanning of the suspicious area along this determined ray path. The XRD-based threat detection system is configured to detect high density metals (“HDMs) as well as shielded Special Nuclear Materials (“SNMs”) based on cubic or non-cubic diffraction profiles. | 12-31-2009 |
20100046707 | XRD SCREENING SYSTEM AND METHOD - Method and system for distinguishing a special nuclear material from a non-threat, high-density metal using X-ray Diffraction. In one embodiment, an X-ray image of an object is examined to detect those voxels having intense XRD profiles, indicating the presence of a high-Z metal. Second, the XRD profiles of such voxels are examined to find the widths and positions of any bands of momentum that are empty of Bragg diffraction peaks. If no such bands are found, then each XRD profile is uniformly populated with Bragg peaks; and it is determined that a special nuclear material is present. If such bands are found, then at least one XRD profile is not uniformly populated with Bragg peaks; and it is determined that a non-threat, high-Z metal is present. | 02-25-2010 |
20100061512 | X-RAY SOURCE AND DETECTOR CONFIGURATION FOR A NON-TRANSLATIONAL X-RAY DIFFRACTION SYSTEM - A system and method for scanning objects using a non-translational x-ray diffraction (XRD) system is disclosed. The system includes a scanning area through which an object to be scanned traverses and a distributed x-ray source having a plurality of focal spot locations. The distributed x-ray source is affixed on the scanning area and is configured to emit x-rays towards the object as a series of parallel x-ray beams. A stationary detector arrangement is affixed on another side of the scanning area generally opposite the distributed x-ray source and is configured to measure a coherent scatter spectra of the x-rays after passing through the object. A data acquisition system (DAS) is connected to the detector arrangement and is configured to measure the coherent scatter spectra, which is utilized to generate XRD data and determine a material composition of at least a portion of the object from the XRD data. | 03-11-2010 |
20100061514 | SYSTEMS AND METHODS FOR DEVELOPING A SECONDARY COLLIMATOR - A method for developing a secondary collimator is described. The method includes orienting a plurality of collimator elements in a plane such that a gap is defined between a first collimator element and a second collimator element. The first collimator element has a first curved end, and the first curved end faces the second collimator element across the gap. | 03-11-2010 |
20100111253 | SYSTEM AND METHOD TO ACCOUNT FOR CROSS-TALK AMONG COHERENT SCATTER DETECTORS - A method to account for cross-talk among a plurality of coherent scatter detectors of a multi-detector inverse fan beam x-ray diffraction imaging (MD-IFB XDI) system. The MD-IFB XDI system includes a multi-focus x-ray source (MFXS) that emits radiation sequentially from a plurality of focus points denoted by F | 05-06-2010 |
20100111255 | SYSTEM AND METHOD FOR X-RAY DIFFRACTION IMAGING - An X-ray diffraction imaging system is provided. The X-ray diffraction imaging system includes an X-ray source configured to emit an X-ray pencil beam and a scatter detector configured to receive scattered radiation having a scatter angle from the X-ray pencil beam. The scatter detector is located substantially in a plane and includes a plurality of detector strips. A first detector strip has a first width equal to a linear extent of the X-ray pencil beam measured at the plane in a direction parallel to the first width. | 05-06-2010 |
20100124315 | METHODS AND SYSTEM FOR CALIBRATING AND CORRECTING A DETECTION SYSTEM - A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle. | 05-20-2010 |
20100135462 | PRIMARY COLLIMATOR AND SYSTEMS FOR X-RAY DIFFRACTION IMAGING, AND METHOD FOR FABRICATING A PRIMARY COLLIMATOR - A primary collimator for a multiple inverse fan beam x-ray diffraction imaging (MIFB XDI) system. The MIFB XDI system includes a multi-focus x-ray source (MFXS) defining a plurality of focus points arranged along a length of the MFXS. Each focus point is sequentially activated to emit an x-ray fan beam including a plurality of primary beams each directed to a corresponding convergence point. The primary collimator includes a first diaphragm configured to be positioned with respect to the MFXS. The first diaphragm defines a plurality of first channels through a thickness of the first diaphragm. Each first channel is aligned with a corresponding focus point and configured to transmit the x-ray fan beam. A second diaphragm is positioned with respect to the first diaphragm and defines a plurality of second channels through a thickness of the second diaphragm. Each second channel is axially aligned with a corresponding first channel. | 06-03-2010 |
20100226478 | X-RAY DIFFRACTION DEVICE, OBJECT IMAGING SYSTEM, AND METHOD FOR OPERATING A SECURITY SYSTEM - An x-ray diffraction imaging device includes at least one x-ray detector and at least one scatter collimator positioned upstream of the at least one x-ray detector. The at least one collimator includes a plurality of successive plates. Each of the plurality of plates defines a plurality of rectangular holes. The plurality of successive plates are arranged such that the plurality of rectangular holes define a plurality of quadrilateral passages extending through the at least one scatter collimator. Each of the plurality of quadrilateral passages is configured to increase a rate of detection of first x-rays that define an x-ray transit path enclosed within a single such quadrilateral passage. Also, the plurality of quadrilateral passages is configured to decrease a rate of detection of second x-rays that define an x-ray transit path that intersects more than one such quadrilateral passage. | 09-09-2010 |
20100254516 | SECONDARY COLLIMATOR AND METHOD OF ASSEMBLING THE SAME - A method for assembling a secondary collimator including a first face plate having a first surface and an opposing second surface is provided. The method includes positioning a lamella assembly on the first face plate, wherein the lamella assembly includes at least one radiation-absorbing material layer and at least one radiation-transmitting material layer, such that a first surface of the lamella assembly is adjacent the second surface of the first face plate. The method also includes coupling a second face plate to the first face plate and the lamella assembly such that a first surface of the second face plate is adjacent a second surface of the lamella assembly. | 10-07-2010 |
20100277312 | IN-LINE HIGH-THROUGHPUT CONTRABAND DETECTION SYSTEM - A contraband detection system includes a first contraband detection apparatus designed to perform a first scan on an object and a second contraband detection apparatus positioned in-line with the first contraband detection apparatus to perform a second scan on the object. A computer is included in the contraband detection system and is programmed to cause the first contraband detection apparatus to perform the first scan and acquire object data therefrom. The computer is further programmed to identify one or more regions of interest (ROI) in the object based on the object data, cause the second contraband detection apparatus to perform the second scan on the one or more identified ROIs, and acquire object data from the second scan. | 11-04-2010 |
20100329424 | X-RAY DIFFRACTION IMAGING SYSTEM AND METHOD FOR OPERATING THE SAME - A method for operating an X-ray diffraction imaging (XDI) system to scan an object includes generating an X-ray beam from at least one source focus at a first focus location, and receiving first scatter radiation at a first scatter angle at a scatter detector. The first scatter radiation is produced when the X-ray beam interacts with the object. The method further includes displacing the at least one source focus from the first focus location to a second focus location, generating a displaced X-ray beam from the at least one source focus at the second focus location, and receiving second scatter radiation at a second scatter angle at the scatter detector. The second scatter radiation is produced when the displaced X-ray beam interacts with the object. An identification of the object based on one of the first scatter radiation and the second scatter radiation is output. | 12-30-2010 |
20110081003 | METHOD AND SYSTEM FOR PERFORMING MATERIALS ANALYSIS WITH REFLECTED INELASTIC SCATTER - A method for performing materials analysis of an object using an X-ray system includes generating an X-ray beam using an X-ray source having an anode and acquiring a scatter spectrum from Compton scatter produced when the X-ray beam interacts with the object. The scatter spectrum is acquired using an energy resolving detector. A Compton profile is extracted from the scatter spectrum by processing the scatter spectrum using a control system of the X-ray system. The Compton profile includes peaks at characteristic lines of the anode. The method further includes identifying a characteristic of a material of the object using the Compton profile, and outputting an indication of the characteristic of the material. | 04-07-2011 |
20110081004 | SECONDARY COLLIMATOR AND METHOD OF MAKING THE SAME - A method for making a secondary collimator that includes at least one plate having a plurality of slits defined therein includes determining a gap thickness between plate positions of the secondary collimator based on at least one dimension of the at least one plate and fabricating a base plate from a base plate blank. The base plate includes at least two slots being spaced apart by the gap thickness. The at least one plate is inserted into a first slot of the at least two slots to form the secondary collimator. | 04-07-2011 |
20110188632 | MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME - A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams. | 08-04-2011 |
20120133516 | METHOD AND SYSTEM FOR DERIVING MOLECULAR INTERFERENCE FUNCTIONS FROM XRD PROFILES - A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF. | 05-31-2012 |
20120177182 | OBJECT IMAGING SYSTEM AND X-RAY DIFFRACTION IMAGING DEVICE FOR A SECURITY SYSTEM - An x-ray diffraction imaging (XDI) device includes at least one x-ray source configured to emit an x-ray fan-beam. The XDI device also includes a primary collimator positioned downstream of the at least one x-ray source. The primary collimator defines a plurality of rows of slits. Each slit and each row of slits is separated by an x-ray absorbing material. Each of the rows of slits oriented to transmit at least one x-ray slit-beam in a plane substantially orthogonal to the primary collimator. | 07-12-2012 |
20120263275 | SYSTEM AND METHOD FOR CORRECTING X-RAY DIFFRACTION PROFILES - A method for correcting an X-ray diffraction (XRD) profile measured by an X-ray diffraction imaging (XDi) system is provided. The XDi system includes an anode, a detector, and a control system. The method includes obtaining an emission spectrum of the anode using the control system. The emission spectrum includes spectral structures. The method further includes calculating a piecewise spectral-correction function using the spectral structures in the emission spectrum, obtaining a measured spectrum of an object, and applying the spectral-correction function to the measured spectrum to generate a spectrally-corrected measured spectrum. | 10-18-2012 |
20140369468 | MULTI-STAGE SECURITY SCREENING SYSTEM AND SMART COMMUNICATION SYSTEM - A multi-stage screening system for screening a container includes a pre-screening stage including a transmission X-ray device. The pre-screening stage is configured to generate constraint data associated with the contents of the container. The system also includes a screening stage including an X-ray diffraction imaging (XDI) device. The screening stage is configured to generate image data associated with the contents of the container. The system further includes a communication system coupled to the pre-screening stage and the screening stage. The communication system is configured to receive and transmit the constraint data and reconstruct at least one image of the container at least partially as a function of the constraint data and the image data. | 12-18-2014 |
20140369476 | DEVICE FOR GENERATING X-RAYS HAVING A LIQUID METAL ANODE - A device for generating X-rays includes at least one electron source for the emission of an electron beam that defines a plane having a predetermined width value in a width dimension and a predetermined length value in a length dimension. The width dimension is substantially perpendicular to the length dimension. The device also includes at least one window frame at least partially defining at least one liquid metal flow path. The device further includes at least one electron window coupled to the at least one window frame. The at least one electron window is positioned within the at least one liquid metal flow path and is configured to receive the electron beam. The at least one electron window emits X-rays in response to an incidence of electrons thereon. The at least one electron window includes a surface curved in at least one of the width dimension and the length dimension. | 12-18-2014 |
20150085983 | ANGLE-DEPENDENT X-RAY DIFFRACTION IMAGING SYSTEM AND METHOD OF OPERATING THE SAME - An x-ray diffraction imaging (XDI) system having a system axis includes at least one x-ray source configured to generate x-rays directed toward an object that includes at least one substance. The at least one x-ray source is further configured to irradiate at least one voxel defined within the object with x-rays arriving from a plurality of directions, each direction defined by an angle of incidence with respect to the system axis. The system also includes at least one detector configured to detect scattered x-rays after the x-rays have passed through the object. The system further includes at least one processor coupled to the at least one detector. The processor is programmed to generate a plurality of XDI profiles of the object voxel. Each XDI profile is a function of an associated angle of incidence. | 03-26-2015 |