Patent application number | Description | Published |
20090150588 | Hard Disk Drive Cache Memory and Playback Device - A NOR emulating device using a controller and NAND memories can be used in a computer system in placed of the main memory or in place of the BIOS NOR memory. Thus, the emulating device can function as a bootable memory. In addition, the device can act as a cache to the hard disk drive. Further, with the addition of an MP3 player controller into the device, the device can function as a stand alone audio playback device, even while the PC is turned off or is in a hibernating mode. Finally with the MP3 player controller, the device can access additional audio data stored on the hard drive, again with the PC in an off mode or a hibernating mode. Finally, the device can function to operate the disk drive, even while the PC is off or is in a hibernating mode, and control USB ports attached thereto. | 06-11-2009 |
20090219760 | MEMORY DEVICE HAVING READ CACHE - A memory device comprises a non-volatile electrically alterable memory which is susceptible to read disturbance. The device has a control circuit for controlling the operation of the non-volatile memory. The device further has a first volatile cache memory. The first volatile cache memory is connected to the control circuit and is for storing data to be written to or read from the non-volatile memory, as cache for the memory device. The device further has a second volatile cache memory. The second volatile cache memory is connected to the control circuit and is for storing data read from the non-volatile memory as read cache for the memory device. Finally the control circuit reads data from the second volatile cache memory in the event of a data miss from the first volatile cache memory, and reads data from the non-volatile memory in the event of a data miss from the first and second volatile cache memories. | 09-03-2009 |
20090273007 | Method Of Testing An Integrated Circuit Die, And An Integrated Circuit Die - In the present invention, a method of testing an unpackaged integrated circuit die is disclosed. The die has a plurality of first input/output pads. A serial electrical connection is fabricated in the die between all of the input/output pads of the die which are not of the first plurality (hereinafter: “second plurality”). The second plurality has a start input and an end output. The start input of the second plurality is connected to the output of one selected input buffer of the input pad of the first plurality and the end output of the second plurality is also connected to the input of one selected output pad of the first plurality. The second plurality of input/output pads are tested through selected input pad and selected output pad of the first plurality without electrical probes making contact during the wafer sort. The present invention also relates to an integrated circuit die so fabricated as to facilitate testing. | 11-05-2009 |
20100088459 | Improved Hybrid Drive - A non-volatile storage system comprises a hard disk drive (HDD) having a first capacity for storing information therein in a plurality of blocks. The storage system also comprises a non-volatile solid state memory (SSD) having a second capacity, less than the first capacity, for storing information therein. Finally, the storage system comprises a controller having a volatile memory and for controlling the read operation of the HDD and the read/write operation of the SSD. The controller stores in the volatile memory the address of read blocks from the HDD in a first period of time and determines a plurality of the most frequently read blocks in the first period of time, The controller then causes the SSD to store information from the most frequently read blocks from the HDD, and thereafter causes information to be read from the SSD when the storage system is requested to access information from the most frequently read blocks. The controller resets the identity of the most frequently read blocks in the volatile memory after a second period of time, where the second period of time is longer than said first period of time. | 04-08-2010 |
20100125444 | Method And Apparatus For Reducing Read Latency In A Pseudo Nor Device - A NOR emulating memory device has a memory controller with a first bus for receiving a NOR command signal, and for servicing a read operation from a desired address in a NOR memory. The memory controller has a second bus for communicating with a NAND memory in a NAND memory protocol, and a third bus for communicating with a RAM memory. A NAND memory is connected to the second bus. The NAND memory has an array of memory cells divided into a plurality of pages with each page divided into a plurality of sectors, with each sector having a plurality of bits. The NAND memory further has a page buffer for storing a page of bits read from the array during the read operation of the NAND memory. A RAM memory is connected to the third bus. The memory controller has a NOR memory for storing program code for initiating the operation of the memory controller, and for receiving NOR commands from the first bus and issuing NAND protocol commands on the second bus, in response thereto, to emulate the operation of a NOR memory device. The program code causes the memory controller to read a first sector of bits from the page buffer of the NAND memory and to write the sector of bits into the RAM memory, wherein the first sector contains the location of the desired address, and supplying data from said RAM memory in response to the read operation. | 05-20-2010 |
20100125696 | Memory Controller For Controlling The Wear In A Non-volatile Memory Device And A Method Of Operation Therefor - A memory controller controls the operation of a non-volatile memory device. The memory device has a data storage section and an erased storage section. The data storage section has a first plurality of blocks and the erased storage section has a second plurality of blocks. Each of the first and second plurality of blocks has a plurality of non-volatile memory bits that are erased together. Further, each block has an associated counter for storing the number of times the block has been erased. The memory controller has program instructions which are to scan the counters associated with the blocks of the first plurality of blocks based upon the count contained in each of the counters associated therewith to select a third block, and to scan the counters associated with the blocks of the second plurality of blocks based upon the count contained in each of the counters associated therewith to select a fourth block. The program instructions are further configured to transfer data from the third block to the fourth block, and associating said fourth block with said first plurality of blocks. Finally the program instructions are configured to erase said third block and incrementing the counter associated with said third block, and associating said third block with said second plurality of blocks. The present invention is also a method of operating a non-volatile memory device in accordance with the above described steps. | 05-20-2010 |
20100138588 | MEMORY CONTROLLER AND A METHOD OF OPERATING AN ELECTRICALLY ALTERABLE NON-VOLATILE MEMORY DEVICE - A controller operates a NAND non-volatile memory device which has an array of non-volatile memory cells. The array of non-volatile memory cells is susceptible to suffering loss of data stored in one or more memory cells of the array. The controller interfaces with a host device and receives from the host device a time-stamp signal. The controller comprises a processor, and a memory having program code stored therein for execution by the processor. The program code is configured to receive by the controller the time stamp signal from the host device; to compare the received time stamp signal with a stored signal wherein the stored signal is a time stamp signal received earlier in time by the controller from the host device; and to determine when to perform a data retention and refresh operation for data stored in the memory array based upon the comparing step. | 06-03-2010 |
20100199020 | NON-VOLATILE MEMORY SUBSYSTEM AND A MEMORY CONTROLLER THEREFOR - In the present invention a non-volatile memory subsystem comprises a non-volatile memory device and a memory controller. The memory controller controls the operation of the non-volatile memory device with the memory controller having a processor for executing computer program instructions for partitioning the non-volatile memory device into a plurality of partitions, with each partition having adjustable parameters for wear level and data retention. The memory subsystem also comprises a clock for supplying timing signals to the memory controller. | 08-05-2010 |
20100203654 | Method of Testing an Integrated Circuit Die, and an Integrated Circuit Die - In the present invention, a method of testing an unpackaged integrated circuit die is disclosed. The die has a plurality of first input/output pads. A serial electrical connection is fabricated in the die between all of the input/output pads of the die which are not of the first plurality (hereinafter: “second plurality”). The second plurality has a start input and an end output. The start input of the second plurality is connected to the output of one selected input buffer of the input pad of the first plurality and the end output of the second plurality is also connected to the input of one selected output pad of the first plurality. The second plurality of input/output pads are tested through selected input pad and selected output pad of the first plurality without electrical probes making contact during the wafer sort. The present invention also relates to an integrated circuit die so fabricated as to facilitate testing. | 08-12-2010 |
20100226170 | Non-volatile Memory Array Having Circuitry To Complete Programming Operation In The Event Of Power Interrupt - An electrically programmable non-volatile memory device comprises a memory circuit which includes an array of non-volatile memory cells. Each memory cell is capable of being programmed. A programming circuit can generate a programming signal to program one or more of the memory cells. A voltage detector circuit is connected to a voltage source which outputs a certain voltage. The voltage detector circuit detects when the certain voltage has decreased to a certain level, and in response thereto, the voltage detector provides an output signal to the memory controller to complete the on-going programming command sequence and to power down itself. An auxiliary voltage source maintains voltage to the memory circuit for a period of time sufficient for the programming circuit to complete the programming of the one or more of the memory cells, when the certain voltage is at or below the certain level. | 09-09-2010 |
20100312926 | SWITCH FOR A TWO WAY CONNECTION BETWEEN A REMOVABLE CARD, A MOBILE WIRELESS COMMUNICATION DEVICE, OR A COMPUTER - A USB switching device can selectively connect between a removable card and a mobile wireless communication device and a computer. The removable card has a first port; the mobile wireless communicating device has a second port while the computer has a third port. The switching device comprises a first full duplex switch having an input and a first output and a second output, and a select port for switching the connection of the input to the first output and the connection of the input to the second output. The switching device further comprises a second full duplex switch having an input and a first output and a second output, and a select port for switching the connection of the input to the first output and the connection of the input to the second output. The switching device further comprises a third full duplex switch having an input and a first output and a second output, and a select port for switching the connection of the input to the first output and the connection of the input to the second output. The input of the first switch is connected to the first port. The input of the second switch is connected to the second port. The input of the third switch is connected to the third port. The first output of the first switch is connected to the second output of the second switch. The second output of the first switch is connected to the first output of the third switch. Finally, the first output of the second switch is connected to the second output of the third switch. | 12-09-2010 |