Dubler
Jeffrey Lee Dubler, Lewistown, PA US
Patent application number | Description | Published |
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20130333441 | METHOD AND SYSTEM FOR CORRECTING FOR TEMPERATURE VARIATIONS IN ULTRASONIC TESTING SYSTEMS - A method and system for correcting for temperature variation in ultrasonic testing systems is disclosed. In one embodiment, an offset is determined for correcting a time of flight measurement, wherein the offset is based on the pulse delays at first and second calibration temperatures. In another embodiment, a factor is determined for correcting a time of flight measurement, wherein the factor is based on clock signal errors at first and second calibration temperatures. | 12-19-2013 |
Peter Dubler, Surcuolm CH
Patent application number | Description | Published |
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20110146708 | Mechanical Support Rail Cleaners for Cleaning Support Rails of Workpiece Supports in Machine Tools - The disclosure relates to mechanical support rail cleaners for cleaning support rails of workpiece supports in machine tools, such as in machine tools for thermally cutting workpieces. The cleaners include one or more cleaning member carriers, which carry at least one cleaning member, and a parallel drive, by means of which the cleaning member and the support rail can be moved relative to each other in parallel with a lateral longitudinal face of the support rails and transversely relative to a longitudinal axis of the support rail to remove deposits from the support rail by means of the cleaning member. The support rail cleaner further includes a transverse drive configured to periodically move the one or more cleaning member carriers and the support rail towards and away from each other transversely relative to the lateral longitudinal face of the support rail. | 06-23-2011 |
Robert A. Dubler, Harrisburg, PA US
Patent application number | Description | Published |
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20120137486 | CRIMPING APPARATUS HAVING A CRIMP QUALITY MONITORING SYSTEM - A crimping apparatus includes a ram having crimp tooling for crimping a terminal to a wire during a crimp stroke and a force sensor detecting a crimp force during the crimp stroke. The crimping apparatus also includes a controller that monitors the crimp quality of a crimp based on a frequency profile of the crimp. Optionally, the controller may create the frequency profile based on a force profile using a frequency transform algorithm. The frequency transform algorithm may be a Fast Fourier Transform algorithm. | 06-07-2012 |