| Patent application number | Description | Published |
|---|
| 20090103100 | Compensating for Time Varying Phase Changes in Interferometric Measurements - An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data. | 04-23-2009 |
| 20100321702 | Compensating for time varying phase changes in interferometric measurements - An optical device under test (DUT) is interferometrically measured. The DUT can include one or more of an optical fiber, an optical component, or an optical system. First interference pattern data for the DUT is obtained for a first path to the DUT, and second interference pattern data for the DUT is obtained for a second somewhat longer path to the DUT. Because of that longer length, the second interference pattern data is delayed in time from the first interference pattern data. A time varying component of the DUT interference pattern data is then identified from the first and second interference pattern data. The identified time varying component is used to modify the first or the second interference pattern data to compensate for the time-varying phase caused by vibrations, etc. One or more optical characteristics of the DUT may then be determined based on the modified interference pattern data. | 12-23-2010 |
| 20110109898 | OPTICAL POSITION AND/OR SHAPE SENSING - An accurate measurement method and apparatus are disclosed for shape sensing with a multi-core fiber. A change in optical length is detected in ones of the cores in the multi-core fiber up to a point on the multi-core fiber. A location and/or a pointing direction are/is determined at the point on the multi-core fiber based on the detected changes in optical length. The accuracy of the determination is better than 0.5% of the optical length of the multi-core fiber up to the point on the multi-core fiber. In a preferred example embodiment, the determining includes determining a shape of at least a portion of the multi-core fiber based on the detected changes in optical length. | 05-12-2011 |
| 20110247427 | STRAIN SENSING WITH OPTICAL FIBER ROSETTES - One or more mechanical parameters of a structure subjected to a force or condition are measured using distributed, optical fiber sensing technology. At least a curved portion an optical fiber having is attached to an object. A distributed, optically-based, strain sensing technique is used to determine strain information associated with multiple points along the curved portion of the fiber. The determined strain information is processed to generate one or more representations of one or more of the following: an expansion of the object, a thermal gradient associated with the object, or a stress-induced strain at multiple locations on the object corresponding to ones of the multiple points. An output is generated corresponding to the representation. | 10-13-2011 |
| 20110317148 | REGISTRATION OF AN EXTENDED REFERENCE FOR PARAMETER MEASUREMENT IN AN OPTICAL SENSING SYSTEM - An interferometric measurement system measures a parameter using at least one optical waveguide. A memory stores reference interferometric pattern data associated with a segment of the optical waveguide. Interferometric detection circuitry detects and stores measurement interferometric pattern data associated with the segment of the optical waveguide during a measurement operation. A spectral range of the reference interferometric pattern of the optical waveguide is greater than a spectral range of the measurement interferometric pattern of the optical waveguide. A processor shifts one or both of the measurement interferometric pattern data and the reference interferometric pattern data relative to the other to obtain a match and to use the match to measure the parameter. An example parameter is strain. | 12-29-2011 |
| 20120069347 | COMPENSATING FOR NON-IDEAL MULTI-CORE OPTICAL FIBER STRUCTURE - An interferometric measurement system includes a spun optical fiber including multiple optical waveguides configured in the fiber. Interferometric detection circuitry detects measurement interferometric pattern data associated with each of the multiple optical waveguides when the optical fiber is placed into a bend. Data processing circuitry determines compensation parameters that compensate for variations between an optimal configuration of the multiple optical waveguides in the fiber and an actual configuration of multiple optical waveguides in the fiber. The compensation parameters are stored in memory for compensating subsequently-obtained measurement interferometric pattern data for the fiber. The compensation parameters are applied to the subsequently-obtained measurement interferometric pattern data in order to distinguish between axial strain, bend strain, and twist strain on the fiber and to accurately determine one or more strain values for the fiber corresponding to one or more of the axial strain, bend strain, or twist strain on the fiber. | 03-22-2012 |
| 20140320846 | OPTICAL POSITION AND/OR SHAPE SENSING - An accurate measurement method and apparatus using an optical fiber are disclosed. A total change in optical length in an optical core in the optical fiber is determined that reflects an accumulation of all of the changes in optical length for multiple segment lengths of the optical core up to a point on the optical fiber. The total change in optical length in the optical core is provided for calculation of an average strain over a length of the optical core based on the detected total change in optical length. | 10-30-2014 |
| 20140336973 | METHOD AND APPARATUS FOR MOTION COMPENSATION IN INTERFEROMETRIC SENSING SYSTEMS - An optical interrogation system, e.g., an OFDR-based system, measures local changes, of index of refraction of a sensing light guide subjected to a time-varying disturbance. Interferometric measurement signals detected for a length of the sensing light guide are transformed into the spectral domain. A time varying signal is determined from the transformed interferometric measurement data set. A compensating signal is determined from the time varying signal which is used to compensate the interferometric measurement data set for the time-varying disturbance. Further robustness is achieved using averaging and strain compensation. The compensation technique may be applied along the length of the light guide. | 11-13-2014 |
