Dama
Jonathan Dama, Pasadena, CA US
Patent application number | Description | Published |
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20100161892 | PSEUDO DUAL-PORTED SRAM - A memory is described which includes a main memory array made up of multiple single-ported memory banks connected by parallel read and write buses, and a sideband memory equivalent to a single dual-ported memory bank. Control logic and tags state facilitates a pattern of access to the main memory and the sideband memory such that the memory performs like a fully provisioned dual-ported memory capable of reading and writing any two arbitrary addresses on the same cycle. | 06-24-2010 |
Jonathan A. Dama, Encino, CA US
Patent application number | Description | Published |
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20150341277 | SINGLE-LANE, TWENTY-FIVE GIGABIT ETHERNET - Technologies for high-speed data transmission including a network port logic having a communication lane coupled to a physical medium dependent/physical medium attachment (PMD/PMA) sublayer, a physical coding sublayer (PCS), and a media access control (MAC) sublayer. The communication lane receives serial binary data at a line speed such as 25 gigabits per second. The PMD/PMA converts the serial binary data into parallel data, and the PCS decodes that parallel data using a line code also used for a slower line speed such as 10 gigabits per second. The network port logic may include four independent communication lanes, with each communication lane coupled to a dedicated PMD/PMA, PCS, and MAC. The network port logic may also include a multi-lane PCS and multi-lane MAC to receive and transmit data striped over the four communication lanes. Other embodiments are described and claimed. | 11-26-2015 |
Rajiv Dama, Chanhassen, MN US
Patent application number | Description | Published |
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20150075264 | MICROSCOPE OBJECTIVE MECHANICAL TESTING INSTRUMENT - An objective testing module includes a module base configured for coupling with an objective turret of a microscope. The objective testing module includes a mechanical testing assembly. The mechanical testing assembly is configured to mechanically test a sample at macro scale or less, and quantitatively determine one or more properties of the sample based on the mechanical testing. The mechanical testing assembly optionally includes a probe and one or more transducers coupled with the probe. The transducer measures one or more of force applied to a sample by the probe or displacement of the probe within the sample. In operation, an optical instrument locates a test location on a sample and the objective testing module mechanically tests at the test location with the mechanical testing assembly at a macro scale or less. The mechanical testing assembly further determines one or more properties of the sample according to the mechanical test. | 03-19-2015 |