Patent application number | Description | Published |
20080253928 | Substrate for Biochip and Method for Manufacturing Substrate for Biochip - A substrate for biochips has a substrate surface having a reaction region capable of reacting with biological substances and a non-reaction region not reacting with the biological substances, sunken bottomed wells formed in the substrate surface, and a layer of a material capable of reacting with the biological substances having a surface exposed only at the bottoms of the bottomed wells, the exposed surface forming the reaction region. | 10-16-2008 |
20100233429 | Substrate for Biochip, Biochip, Method for Manufacturing Substrate for Biochip and Method for Manufacturing Biochip - A base plate having a surface on which a plurality of hydroxyl groups can be introduced, a metallic membrane disposed on the base plate and having a plurality of wells reaching the base plate, and a crosslinkable polymer membrane disposed on the metallic membrane are included. | 09-16-2010 |
20100288727 | METHOD FOR MANUFACTURING SUBSTRATE FOR BIOCHIP - A substrate for biochips is manufactured so that the substrate has a substrate surface having a reaction region capable of reacting with biological substances and a non-reaction region not reacting with the biological substances, sunken bottomed wells formed in the substrate surface, and a layer of a material capable of reacting with the biological substances having a surface exposed only at the bottoms of the bottomed wells, the exposed surface forming the reaction region. | 11-18-2010 |
20110174773 | SUBSTRATE FOR BIOCHIP, BIOCHIP, METHOD FOR MANUFACTURING SUBSTRATE FOR BIOCHIP, AND METHOD FOR MANUFACTURING BIOCHIP - A base plate having a surface on which a plurality of hydroxyl groups can be introduced, a metallic membrane disposed on the base plate and having a plurality of wells reaching the base plate, and a crosslinkable polymer membrane disposed on the metallic membrane are included. | 07-21-2011 |
20140199725 | MICROORGANISM DETECTING SYSTEM AND MICROORGANISM DETECTING METHOD - A microorganism detecting device is provided for illuminating a solution with light, for detecting fluorescent light that is produced by a microorganism included in the solution, and for detecting the number of microorganisms included in the solution. The microorganism detecting device includes a relationship storing device that stores a correlation relationship between a number of microorganisms in a solution and a number of colonies formed by the microorganisms on a culture medium, and a converting portion that uses the correlation relationship to convert, into a number of colonies that may be formed, the number of microorganisms detected by the microorganism detecting device. | 07-17-2014 |
20150346072 | PURIFIED WATER MANUFACTURING DEVICE MONITORING SYSTEM AND PURIFIED WATER MANUFACTURING DEVICE MONITORING METHOD - A purified water manufacturing device monitoring system includes: a detecting device that illuminates, with an inspection beam, water either that is in a process of being manufactured or that has been manufactured by a purified water manufacturing device, detects light in a region illuminated by the inspection beam, and detects a microorganism or a non-microorganism particle included in the water; a measured value specifying portion that specifies a measured value for a number of microorganisms detected and specifies a measured value for a number of non-microorganism particles detected; and a state evaluating portion that evaluates that a problem has occurred in the purified water manufacturing device when either or both the measured value for the number of microorganisms and the measured value for the number of non-microorganism particles are greater than a prescribed value. | 12-03-2015 |
20150346091 | DEVICE FOR DETECTING PARTICLES IN A LIQUID AND METHOD FOR DETECTING PARTICLES IN A LIQUID - A device, which detects particles in a liquid, includes: a flow cell through which a liquid flows; a light source that illuminates the flow cell with an inspection beam; a scattered light detector that detects scattered light that is produced in a region illuminated by the inspection beam; and an evaluating portion that evaluates that a particle is included in the liquid when the scattered light is detected for less than a prescribed time and evaluates that the flow cell is not filled with the liquid when the scattered light is detected for more than a prescribed time. | 12-03-2015 |
20150377785 | PARTICLE DETECTING DEVICE AND PARTICLE DETECTING METHOD - A particle detecting device includes: a storing device that stores first boundary information wherein the third light intensity is recorded in a first range at a discriminating boundary for particles of first and second classifications, second boundary information wherein the third light intensity is recorded in a second range at a discriminating boundary for particles of first and second classifications, and discriminating information wherein identifiers for particles of the first and second classifications are recorded in cells bounded and not bounded by the discriminating boundary, respectively; and a particle identifying portion that evaluates a particle being measured as a particle of the first classification when the identifier for a particle of the first classification is acquired based on the measured values for the first and second light intensities and the measured value for the third light intensity falls between the first and second boundary values. | 12-31-2015 |
20150377786 | PARTICLE DETECTING DEVICE AND PARTICLE DETECTING METHOD - A particle detecting device includes: a light measuring instrument that measures measured values for intensities of first, second, and third lights of mutually differing wavelengths, produced by particles to be measured; a boundary information storing portion that stores a non-linear discriminating boundary for separating a class of a first classification of particles and a class of a second classification of particles; and a particle classifying portion that classifies the particle being measured into either of the classifications for the first and second classifications of particles, based on measured values for the intensities of the first through third lights and on the discriminating boundary. | 12-31-2015 |