Patent application number | Description | Published |
20130188433 | MEMORY CIRCUIT AND METHOD OF WRITING DATUM TO MEMORY CIRCUIT - A circuit includes a first node, a second node, a memory cell, a first data line, a second data line, and a write driver. The memory cell is coupled to the first node and the second node and powered by a first voltage at the first node and a second voltage at the second node. The first data line and the second data line are coupled to the memory cell. The write driver has a third node carrying a third voltage less than the first voltage during a write operation. The write deriver is coupled to the first data line and the second data line and configured to, during a write operation, selectively coupling one of the first data line and the second data line to the third node and coupling the other one of the first data line and the second data line to the first node. | 07-25-2013 |
20140119101 | WORDLINE TRACKING FOR BOOSTED-WORDLINE TIMING SCHEME - Some aspects of the present disclosure a method. In this method, a wordline voltage is provided to a wordline, which is coupled to a plurality of memory cells. A boost enable signal is provided. The state of the boost enable signal is indicative of whether the wordline voltage at a predetermined position on the wordline has reached a non-zero, predetermined wordline voltage. The wordline voltage is selectively boosted to a boosted wordline voltage level based on the boost enable signal. | 05-01-2014 |
20140211578 | BOOSTED READ WRITE WORD LINE - One or more techniques or systems for boosting a read word line (RWL) or a write word line (WWL) of a two port synchronous random access memory (SRAM) bit cell array are provided herein. In some embodiments, a boosted control block is configured to generate a boosted word line signal configured to operate a RWL, a WWL, or a read write word line (RWWL). In some embodiments, the boosted word line signal includes a first stage and a second stage. For example, the first stage is associated with a first stage voltage level at a positive supply voltage (Vdd) voltage level and the second stage is associated with a second stage voltage level above the Vdd voltage level. In this manner, a read or write operation is boosted for an SRAM bit cell, because the second stage boosts a corresponding transistor in the SRAM bit cell, for example. | 07-31-2014 |
20150130068 | APPARATUS AND METHOD OF THREE DIMENSIONAL CONDUCTIVE LINES - An apparatus and method of three dimensional conductive lines comprising a first memory column segment in a first tier, a second memory column segment in a second tier, and conductive lines connecting the first memory column segment to the second memory column segment. In some embodiments a conductive line is disposed in the first tier on a first side of the memory column and in the second tier on a second side of the memory column. | 05-14-2015 |
20150277770 | MEMORY DEVICE WITH TRACKING MECHANISM - A memory device includes storage layers each comprising memory cells arranged in a plurality of rows, bit lines coupled to the memory cells in the corresponding rows, tracking cells arranged in at least one row, at least one tracking bit line coupled to the tracking cells, and at least one sense amplifier coupled to the bit lines. The sense amplifier is configured to detect data stored in the memory cells, and has an enabling terminal coupled to the at least one tracking bit line. The memory device further comprises word lines and tracking word lines extending through the storage layers. The word lines are coupled to the corresponding memory cells in the storage layers. The tracking word lines are coupled to the corresponding tracking cells in the storage layers. | 10-01-2015 |
20150348598 | STATIC RANDOM ACCESS MEMORY AND METHOD OF CONTROLLING THE SAME - A static random access memory (SRAM) that includes a memory cell comprising at least two p-type pass gates. The SRAM also includes a first data line connected to the memory cell, a second data line connected to the memory cell and a voltage control unit connected to the first data line, wherein the voltage control unit is configured to control the memory cell. | 12-03-2015 |
20150380082 | BOOSTED READ WRITE WORD LINE - One or more techniques or systems for boosting a read word line (RWL) or a write word line (WWL) of a two port synchronous random access memory (SRAM) bit cell array are provided herein. In some embodiments, a boosted control block is configured to generate a boosted word line signal configured to operate a RWL, a WWL, or a read write word line (RWWL). In some embodiments, the boosted word line signal includes a first stage and a second stage. For example, the first stage is associated with a first stage voltage level at a positive supply voltage (Vdd) voltage level and the second stage is associated with a second stage voltage level above the Vdd voltage level. In this manner, a read or write operation is boosted for an SRAM bit cell, because the second stage boosts a corresponding transistor in the SRAM bit cell, for example. | 12-31-2015 |
20160111143 | STATIC RANDOM ACCESS MEMORY AND METHOD OF CONTROLLING THE SAME - A static random access memory (SRAM) including at least a first memory cell array, a second memory cell array, a first data line connected to the first memory cell array and the second memory cell array, a primary driver circuit connected to the first data line and a supplementary driver circuit connected to the first data line, wherein the supplementary driver circuit is configured to pull a voltage level of the first data line to a first voltage level during a write operation of the SRAM. | 04-21-2016 |