Patent application number | Description | Published |
20100052763 | CMOS Level Shifter Circuit Design - A level shifting circuit has a pair of assist circuits. The level shifting circuit includes an input point, an output point, a pair of cross-coupled PMOS transistors coupled to the output point, and a pair of NMOS transistors coupled between the input and output points. Each assist circuit includes a pair of PMOS transistors, one responsive to an input applied to the input point, the other responsive to the drain voltage of one of the NMOS transistors. The assist circuits temporarily weaken the cross-coupled PMOS transistors when an input changes from low to high, or from high to low. The assist circuits also transiently boost the output. | 03-04-2010 |
20100061161 | Self Reset Clock Buffer In Memory Devices - A memory device includes a clock buffer circuit. The clock buffer circuit includes a cross-coupled logic circuit. The cross-coupled logic circuit has at least two logic gates in which an output of at least one of the logic gates is coupled to an input of at least one of the logic gates. The cross-coupled logic circuit is coupled to an input for accepting a clock signal. The memory device also includes a clock driver operable to generate a clock signal from the output of the cross-coupled logic circuit. A feedback loop from the clock signal to the cross-coupled logic circuit controls the cross-coupled logic circuit. A buffer circuit including a tri-state inverter is coupled to the clock signal to maintain the clock signal while avoiding contention with the clock generator. The memory device is enabled by a chip select signal. | 03-11-2010 |
20100142300 | Semiconductor Memory Device And Methods Of Performing A Stress Test On The Semiconductor Memory Device - A semiconductor memory device and method of performing a stress test on a semiconductor memory device are provided. In an example, the semiconductor memory device includes a multiplexer arrangement configured to switch a timing signal that controls an internal timing of the semiconductor memory device from an internal signal to an external signal during a stress mode, and further includes one or more word lines of the semiconductor memory device receiving a stress voltage during the stress mode, a duration of the stress mode based upon the external signal. In another example, the semiconductor memory device includes one or more word lines configured to receive a stress voltage during a stress mode, and a precharge circuit configured to provide a precharge voltage to a bit line of the semiconductor memory device during the stress mode. | 06-10-2010 |
20100226191 | Leakage Reduction in Memory Devices - A memory device includes a core array that includes memory cells. The memory device also includes a headswitch coupled to the core array and a positive supply voltage. The headswitch reduces leakage current from the core array by disconnecting the core array from the positive supply voltage. Additionally, head switches are added for pre-charge devices to further reduce leakage current. | 09-09-2010 |
20100238756 | Self Reset Clock Buffer In Memory Devices - A memory device includes a clock buffer circuit. The clock buffer circuit includes a cross-coupled logic circuit. The cross-coupled logic circuit has at least two logic gates in which an output of at least one of the logic gates is coupled to an input of at least one of the logic gates. The cross-coupled logic circuit is coupled to an input for accepting a clock signal. The memory device also includes a clock driver operable to generate a clock signal from the output of the cross-coupled logic circuit. A feedback loop from the clock signal to the cross-coupled logic circuit controls the cross-coupled logic circuit. A buffer circuit including a tri-state inverter is coupled to the clock signal to maintain the clock signal while avoiding contention with the clock generator. The memory device is enabled by a chip select signal. | 09-23-2010 |
20110051537 | Address Multiplexing in Pseudo-Dual Port Memory - A pseudo-dual port memory address multiplexing system includes a control circuit operative to identify a read request and a write request to be accomplished during a single clock cycle. A self time tracking circuit monitors a read operation and generates a switching signal when the read operation is determined to be complete. A multiplexer is responsive to the switching signal for selectively providing a read address and a write address to a memory address unit at the proper time. | 03-03-2011 |
20110188328 | Systems and Methods for Writing to Multiple Port Memory Circuits - A multiple-port RAM circuit has a data-in line coupled to multiple bit lines and multiple bit line bars. The circuit also has multiple word lines. A memory cell is coupled to the bit lines, bit line bars, and word lines. The circuit further includes a controller than enables the word lines to substantially simultaneously write a value from the bit lines to the memory cell. | 08-04-2011 |
20130223176 | MEMORY PRE-DECODER CIRCUITS EMPLOYING PULSE LATCH(ES) FOR REDUCING MEMORY ACCESS TIMES, AND RELATED SYSTEMS AND METHODS - Memory pre-decoder circuits employing pulse latch(es) for reducing memory access times, and related systems and methods are disclosed. In one embodiment, the memory pre-decoder circuit includes a memory pre-decoder configured to pre-decode a memory address input within a memory pre-decode setup path to generate a pre-decoded memory address input. Additionally, a pulse latch is provided in the memory pre-decoder circuit outside of the memory pre-decode setup path. The pulse latch samples the pre-decoded memory address input based on a clock signal and generates a pre-decoded memory address output. As such, the memory pre-decode setup path sets up the pre-decoded memory address input prior to the clock signal for the pulse latch. In this manner, the pulse latch is configured to generate a pre-decoded memory address output without increasing setup times in the memory pre-decode setup path. | 08-29-2013 |
20130223178 | GLOBAL RESET WITH REPLICA FOR PULSE LATCH PRE-DECODERS - A global reset generation method for a pulse latch based pre-decoders in memories that comprises generating a pre-decoded memory address output for a pulse latch circuit, generating a reset signal to reset the pulse latch circuit, providing a combined signal of the pre-decoded memory address output and the reset signal, feeding the combined signal into a low voltage threshold device to manipulate resetting the pulse latch circuit, wherein generating a reset signal comprises generating a reset signal from a matched circuit that is configured to mimic the function of the latch circuit to be reset and wherein generating a reset signal comprises configuring the matched circuit to accommodate a worst case hold pulse delay to allow for resetting the pulse latch before a new clock cycle performs the resetting and having the matched circuit provide the reset signal and a pre-decoded memory address output in the same voltage domain. | 08-29-2013 |
20140112061 | WRITE WORD-LINE ASSIST CIRCUITRY FOR A BYTE-WRITEABLE MEMORY - A write-assisted memory. The write-assisted memory includes a word-line decoder that is implemented within a low VDD power domain. The write-assisted memory also includes a write-segment controller that is partially implemented within the low VDD power domain and is partially implemented within a high VDD power domain. The write-assisted memory further includes a local write word-line decoder that is implemented within the high VDD power domain. | 04-24-2014 |
20140177310 | PSEUDO-NOR CELL FOR TERNARY CONTENT ADDRESSABLE MEMORY - A method within a ternary content addressable memory (TCAM) includes receiving a match line output from a previous TCAM stage at a gate of a pull-up transistor of a current TCAM stage and at a gate of a pull-down transistor of the current TCAM stage. The method sets a match line bar at the current TCAM stage to a low value, via the pull-down transistor, when the match line output from the previous TCAM stage indicates a mismatch. The method also sets the match line bar at the current TCAM stage to a high value, via the pull-up transistor, when the match line output from the previous TCAM stage indicates a match. | 06-26-2014 |
20140185348 | HYBRID TERNARY CONTENT ADDRESSABLE MEMORY - A method within a hybrid ternary content addressable memory (TCAM) includes comparing a first portion of a search word to a first portion of a stored word in a first TCAM stage. The method further includes interfacing an output of the first TCAM stage to an input of the second TCAM stage. The method also includes comparing a second portion of the search word to a second portion of the stored word in a second TCAM stage when the first portion of the search word matches the first portion of the stored word. The first TCAM stage is different from the second TCAM stage. | 07-03-2014 |
20140185349 | STATIC NAND CELL FOR TERNARY CONTENT ADDRESSABLE MEMORY (TCAM) - A static, ternary content addressable memory (TCAM) includes a key cell and a mask cell coupled to intermediate match lines. The key cell is coupled to a first pull-down transistor and a first pull-up transistor. The mask cell is coupled to a second pull-down transistor and a second pull-up transistor. The first pull-down transistor and second pull-down transistor are connected in parallel and the first pull-up transistor and second pull-up transistor are connected in series. A match line output is also coupled to the first pull-down transistor and second pull-down transistor and further coupled to the first pull-up transistor and second pull-up transistor. | 07-03-2014 |
20140198598 | SYSTEM AND METHOD OF PERFORMING POWER ON RESET FOR MEMORY ARRAY CIRCUITS - The disclosure relates to an apparatus for deactivating one or more predecoded address lines of a memory circuit in response to one or more of the predecoded address lines being activated upon powering on of at least a portion of the apparatus. In particular, the apparatus includes a memory device; an address predecoder configured to activate one or more of a plurality of predecoded address lines based on an input address, wherein the plurality of predecoded address lines are coupled to the memory device for accessing one or more memory cells associated with the one or more activated predecoded address lines; and a power-on-reset circuit configured to deactivate one or more of the predecoded address lines in response to the one or more of the predecoded address lines being activated upon powering on the at least portion of the apparatus. | 07-17-2014 |
20140219039 | WRITE DRIVER FOR WRITE ASSISTANCE IN MEMORY DEVICE - A write assist driver circuit is provided that assists a memory cell (e.g., volatile memory bit cell) in write operations to keep the voltage at the memory core sufficiently high for correct write operations, even when the supply voltage is lowered. The write assist driver circuit may be configured to provide a memory supply voltage VddM to a bit cell core during a standby mode of operation. In a write mode of operation, the write assist driver circuit may provide a lowered memory supply voltage VddM | 08-07-2014 |
20140253201 | PULSE GENERATION IN DUAL SUPPLY SYSTEMS - Various apparatuses and methods are disclosed. The system describes a pulse generator comprising a first stage configured to be powered by a first voltage; and a second stage configured to be powered by a second voltage different from the first voltage, wherein the second stage is further configured to generate a pulse in response to an input to the first stage comprising a trigger and feedback from the second stage. | 09-11-2014 |
20140254293 | HIGH-SPEED MEMORY WRITE DRIVER CIRCUIT WITH VOLTAGE LEVEL SHIFTING FEATURES - Various aspects of a fast, energy efficient write driver capable of efficient operation in a dual-voltage domain memory architecture are provided herein. Specifically, various aspects of the write driver described herein combine a high speed driver with voltage level shifting capabilities that may be implemented efficiently in reducing use of silicon area while using lower power. The write driver circuit shifts or adjusts voltage levels between a first voltage domain to a second voltage domain. In one example, the write driver circuit is coupled to a global write bitline and a local write bitline that is coupled to one or more bitcells (of SRAM memory). The write driver circuit converts a first voltage level at the global write bitline to a second voltage level at the local write bitline during a write operation. | 09-11-2014 |
20140269112 | APPARATUS AND METHOD FOR WRITING DATA TO MEMORY ARRAY CIRCUITS - A write driver for a memory circuit includes a control circuit configured to: operate a first push-pull driver to generate a first drive signal in a first voltage domain at a first node based on an input signal in a second domain and in response to a mode select signal being in a first mode, wherein the first drive signal is at a same logic level as the input signal; operate a second push-pull driver to generate a second drive signal in the first voltage domain at a second node based on the input signal and in response to the mode select signal being in the first mode, wherein the second drive signal is at a complement logic level with respect to the input signal; and operate the first and second push-pull drivers to float the first and second nodes in response to the mode select signal being in a second mode. | 09-18-2014 |
20140355365 | PULSE GENERATOR - Various circuits and methods of operating circuits are disclosed. A circuit may include a pulse generator and a latch having an output configured to trigger the pulse generator, wherein the latch is configured to be set by an input signal and reset by feedback from the pulse generator. A method may include resetting a latch using feedback from a pulse generator by setting a latch using an input signal, triggering a pulse generator using an output from the latch, and resetting the latch using feedback from the pulse generator. | 12-04-2014 |
20150029782 | WIDE RANGE MULTIPORT BITCELL - A multiport bitcell including a pair of cross-coupled inverters is provided with increased write speed and enhanced operating voltage range by the selective isolation of a first one of the cross-coupled inverters from a power supply and ground during a write operation. The write operation occurs through a write port that includes a transmission gate configured to couple a first node driven by the first cross-coupled inverter to a write bit line. A remaining second cross-coupled inverter in the bitcell is configured to drive a second node that couples to a plurality of read ports. | 01-29-2015 |
20150067290 | MEMORY ACCESS TIME TRACKING IN DUAL-RAIL SYSTEMS - Disclosed are various apparatuses and methods for memory access time tracking in dual-rail systems. An apparatus may include a memory coupled to a first voltage rail and having a data output, a data circuit coupled to a second voltage rail and configured to receive the data output from the memory, and a timing circuit configured to adjust an access time of the memory based on a second voltage rail level. A method may include determining a voltage rail level of a data circuit, adjusting the access time of the memory based on the voltage rail level of the data circuit, outputting data from the memory, and receiving the output data by the data circuit. | 03-05-2015 |
20150085554 | STATIC NAND CELL FOR TERNARY CONTENT ADDRESSABLE MEMORY (TCAM) - A static, ternary content addressable memory (TCAM) includes a key cell and a mask cell coupled to intermediate match lines. The key cell is coupled to a first pull-down transistor and a first pull-up transistor. The mask cell is coupled to a second pull-down transistor and a second pull-up transistor. The first pull-down transistor and second pull-down transistor are connected in parallel and the first pull-up transistor and second pull-up transistor are connected in series. A match line output is also coupled to the first pull-down transistor and second pull-down transistor and further coupled to the first pull-up transistor and second pull-up transistor. | 03-26-2015 |