Patent application number | Description | Published |
20130248483 | METHOD FOR FABRICATING EMITTER - A method for fabricating a sharpened needle-like emitter, the method including: electrolytically polishing an end portion of an electrically conductive emitter material so as to be tapered toward a tip portion thereof; performing a first etching in which the electrolytically polished part of the emitter material is irradiated with a charged-particle beam to form a pyramid-like sharpened part having a vertex including the tip portion; performing a second etching in which the tip portion is further sharpened through field-assisted gas etching, while observing a crystal structure at the tip portion by a field ion microscope and keeping the number of atoms at a leading edge of the tip portion at a predetermined number or less; and heating the emitter material to arrange the atoms at the leading edge of the tip portion of the sharpened part in a pyramid shape. | 09-26-2013 |
20140246397 | METHOD FOR FABRICATING EMITTER - A method for fabricating a sharpened needle-like emitter, the method including: electrolytically polishing an end portion of an electrically conductive emitter material so as to be tapered toward a tip portion thereof; performing a first etching in which the electrolytically polished part of the emitter material is irradiated with a charged-particle beam to form a pyramid-like sharpened part having a vertex including the tip portion; performing a second etching in which the tip portion is further sharpened through field-assisted gas etching, while observing a crystal structure at the tip portion by a field ion microscope and keeping the number of atoms at a leading edge of the tip portion at a predetermined number or less; and heating the emitter material to arrange the atoms at the leading edge of the tip portion of the sharpened part in a pyramid shape. | 09-04-2014 |
20140291509 | CHARGED PARTICLE BEAM APPARATUS AND METHOD FOR FORMING OBSERVATION IMAGE - A focused ion beam apparatus includes a lens interferometer configured to detect a relative position of an ion beam column and a sample. An image forming section includes an irradiation position specifying section configured to specify an irradiation position of an ion beam based on the detected relative position of the ion beam column and the sample, and a luminance setting section configured to set luminance of a pixel of an observation image based on the specified irradiation position of the ion beam and a detected amount of secondary particles. | 10-02-2014 |
20140292189 | FOCUSED ION BEAM APPARATUS AND CONTROL METHOD THEREOF - A focused ion beam apparatus is configured to perform at least one of a process of controlling an operation of a cooling unit so that a temperature of a wall surface contacting a source gas in an ion source chamber is maintained at a temperature higher than a temperature at which the source gas freezes and a process of controlling an operation of a heater so that an emitter is temporarily heated when the source gas is exchanged. | 10-02-2014 |
20150047079 | Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus - There is provided an iridium tip including a pyramid structure having one {100} crystal plane as one of a plurality of pyramid surfaces in a sharpened apex portion of a single crystal with <210> orientation. The iridium tip is applied to a gas field ion source or an electron source. The gas field ion source and/or the electron source is applied to a focused ion beam apparatus, an electron microscope, an electron beam applied analysis apparatus, an ion-electron multi-beam apparatus, a scanning probe microscope or a mask repair apparatus. | 02-12-2015 |
20150053866 | Repair Apparatus - There is provided a repair apparatus including a gas field ion source which includes an ion generation section including a sharpened tip, a cooling unit which cools the tip, an ion beam column which forms a focused ion beam by focusing ions of a gas generated in the gas field ion source, a sample stage which moves while a sample to be irradiated with the focused ion beam is placed thereon, a sample chamber which accommodates at least the sample stage therein, and a control unit which repairs a mask or a mold for nano-imprint lithography, which is the sample, with the focused ion beam formed by the ion beam column. The gas field ion source generates nitrogen ions as the ions, and the tip is constituted by an iridium single crystal capable of generating the ions. | 02-26-2015 |
20150162160 | FOCUSED ION BEAM APPARATUS - A focused ion beam apparatus has an ion source chamber in which is disposed an emitter for emitting ions. The surface of the emitter is formed of a precious metal, such as platinum, palladium, iridium, rhodium or gold. A gas supply unit supplies nitrogen gas to the ion source chamber so that the nitrogen gas adsorbs on the surface of the emitter. An extracting electrode is spaced from the emitter, and a voltage is applied to the extracting electrode to ionize the adsorbed nitrogen gas and extract nitrogen ions in the form of an ion beam. A temperature control unit controls the temperature of the emitter. | 06-11-2015 |
20150206708 | CHARGED PARTICLE BEAM APPARATUS AND PROCESSING METHOD - A charged particle beam apparatus is provided with: a charged particle beam column configured to irradiate a charged particle beam; and a controller configured to control the charged particle beam column to irradiate the charged particle beam at a first pixel interval for a first region and to irradiate the charged particle beam at a second pixel interval different from the first pixel interval for a second region included in the first region. | 07-23-2015 |
Patent application number | Description | Published |
20090281210 | METHOD FOR PRODUCING POLYAMIDE MASTERBATCH - A polyamide masterbatch free from metal copper deposition and metal corrosion in an extruder or a molding machine, deterioration in mechanical physical properties of the product, and a color change of appearance due to water absorption and having improved heat aging resistance is produced by mixing, by melt kneading, a) 100 parts by weight of a polyamide having a water content of from 0.05 to 2.0 wt. %, b) from 0.1 to 10 parts by weight of an organic compound having at least one amide group, c) from 0.1 to 5 parts by weight of a copper compound having a maximum particle size of 50 μm or less, and d) from 1 to 50 parts by weight of a halogen compound (with the proviso that a copper halide is excluded) having a maximum particle size of 50 μm or less. | 11-12-2009 |
20090302272 | POLYAMIDE COMPOSITION - The present invention can provide a polyamide composition that is more excellent in the heat resistance and tensile elongation of molded products and also more excellent in a balance between these properties than those given by conventional polyamide compositions. The present invention relates to a polyamide composition comprising polyamide, liquid-crystalline polyester, and non-liquid-crystalline polyester, characterized in that Ma part by mass of the polyamide, Mb part by mass of the liquid-crystalline polyester, and Mc part by mass of the non-liquid-crystalline polyester with respect to 100 parts by mass in total of the polyamide, the liquid-crystalline polyester, and the non-liquid-crystalline polyester satisfy the following formulas: 60≦Ma≦90, 2≦Mb≦38, and 2≦Mc≦Ma×0.2−2. | 12-10-2009 |
20110028614 | POLYAMIDE, POLYAMIDE COMPOSITION, AND METHOD FOR PRODUCING POLYAMIDE - The present invention relates to a polyamide obtainable by polymerizing an (a) dicarboxylic acid comprising at least 50 mol % of an alicyclic dicarboxylic acid and a (b) diamine comprising at least 50 mol % of a diamine having a substituent branched from a main chain. | 02-03-2011 |
20130281655 | POLYAMIDE, POLYAMIDE COMPOSITION, AND METHOD FOR PRODUCING POLYAMIDE - The present invention relates to a polyamide obtainable by polymerizing an (a) dicarboxylic acid comprising at least 50 mol % of an alicyclic dicarboxylic acid and a (b) diamine comprising at least 50 mol % of a diamine having a substituent branched from a main chain. | 10-24-2013 |
Patent application number | Description | Published |
20140212660 | MEDIUM CARBON STEEL SHEET FOR COLD WORKING AND METHOD FOR MANUFACTURING THE SAME - Disclosed is a medium carbon steel sheet for cold working that has a hardness of 500 HV to 900 HV when subjected to high-frequency quenching in which a temperature is raised at an average heating rate of 100° C./second, the temperature is held at 1,000° C. for 10 seconds, and a quick cooling to a room temperature is carried out at an average cooling rate of 200° C./second. The medium carbon steel sheet includes, by mass %, C: 0.30 to 0.60%, Si: 0.06 to 0.30%, Mn: 0.3 to 2.0%, P: 0.03% or less, S: 0.0075% or less, Al: 0.005 to 0.10%, N: 0.001 to 0.01%, and Cr: 0.001 to 0.10%, the balance composed of Fe and inevitable impurities. An average diameter d of a carbide is 0.6 μm or less, a spheroidizing ratio p of the carbide is equal to or more than 70% and less than 90%, and the average diameter d (μm) of the carbide and the spheroidizing ratio p % of the carbide satisfy d≦0.04×p−2.6. | 07-31-2014 |
20140230973 | STEEL SHEET AND METHOD OF PRODUCING THE SAME - A steel sheet of the present invention has a steel structure obtained by performing a soaking at a dual phase region temperature of Ac1 temperature or higher and lower than Ac3 temperature for a soaking time of 15 seconds or longer and 35 seconds or shorter, next, performing a primary cooling to a temperature range of 250° C. or higher and 380° C. or lower within 3 seconds at a cooling rate of 0.5° C./s or more and 30° C./s or less, and performing a retention in a temperature range of 260° C. or higher and 370° C. or lower for 180 seconds or longer and 540 seconds or shorter, in which a yield ratio is 65% or less and tensile strength is 590 MPa or more after the primary cooling. | 08-21-2014 |
20140241934 | STEEL SHEET - Disclosed is a steel sheet in which the amounts of respective elements in chemical components, which are represented by mass %, satisfy the following Expression 1 and Expression 2. In addition, the steel contains Ti-included-carbonitrides as inclusions, and the number density of the Ti-included-carbonitrides having a long side of 5 μm or more is 3 pieces/mm | 08-28-2014 |