51st week of 2010 patent applcation highlights part 20 |
Patent application number | Title | Published |
20100320998 | SYSTEM FOR TESTING POWER SUPPLY PERFORMANCE - A system for testing power supply performance includes a DC power supply, a test apparatus for testing the DC power supply, and a control circuit electrically coupled to the DC power supply and the test apparatus. The control circuit includes an A/D conversion circuit, and a voltage level conversion circuit. The A/D conversion circuit receives DC voltage signals from the power supply, and converts the received DC voltage signals to digital signals. The voltage level conversion circuit receives the digital signals, and converts the received digital signals to voltage level signals which can be identified by the test apparatus. The test apparatus receives the voltage level signals, and generates signal waveforms of the voltage signals according to the received voltage level signals. | 2010-12-23 |
20100320999 | TESTING APPARATUS - A testing apparatus is provided to test whether a distance between a first and a second portions of an object is eligible. The testing apparatus includes a worktable, a positioning mechanism to support the object, a pressing mechanism to secure the object, and an actuating mechanism. The actuating mechanism outputs signals to reflect the relative position of the correspond to-be-tested portion and the actuating mechanism, therefore a controlling device indicates whether the distance between the to-be-tested portion and the base plane is eligible or not according the outputting signals of the corresponding actuating mechanism. | 2010-12-23 |
20100321000 | AC DETECTION CIRCUIT FOR POWER SUPPLY - There is provided an alternating current (AC) detection circuit for a power supply, the circuit including: a rectifying part rectifying an AC voltage; a voltage division part dividing the voltage rectified by the rectifying part according to a preset division ratio; a voltage stabilization circuit part stabilizing the voltage divided by the voltage division part; a comparing part comparing the voltage stabilized by the voltage stabilization circuit part with an internal reference voltage and generating an input detection signal when the stabilized voltage is higher than the internal reference voltage; and an output part outputting an AC detection signal when the input detection signal is inputted from the comparing part. | 2010-12-23 |
20100321001 | PHASE DETECTING APPARATUS, TEST APPARATUS AND ADJUSTING METHOD - Provided is a phase detecting apparatus that detects a phase difference between signals, comprising a phase comparing section that sequentially delays a second input signal relative to a first input signal, according to a set value, and that compares a phase of the second input signal to a phase of the first input signal each time a relative phase between the input signals changes; and a delay adjusting section that adjusts in advance a delay amount of a signal in the phase comparing section. The delay adjusting section includes a signal generating section that generates a first adjustment signal and a second adjustment signal, which has a period that is shorter than a period of the first adjustment signal by an amount corresponding to the set value, and inputs the first adjustment signal and the second adjustment signal to the phase comparing section as the first input signal and the second input signal, respectively; and an adjusting section that adjusts a delay amount of the phase in the phase comparing section based on the phase comparison result by the phase comparing section between the first adjustment signal and the second adjustment signal. | 2010-12-23 |
20100321002 | INTEGRATED SENSOR WITH CAPACITIVE COUPLING REJECTION TO THE MECHANICAL GROUND - An integrated sensor includes: i) a voltage regulator coupled with a mechanical ground and delivering a regulated voltage based on a primary power supply voltage referencing an electrical ground; ii) a high-impedance sensitive element powered by the primary power supply, electrically coupled to the mechanical ground and delivering an electrical quantity representative of a physical quantity; iii) an amplification module powered by the regulated voltage and including a first input receiving an analog reference dependent on the regulated voltage and a second input receiving the electrical quantity, and designed to deliver a first output voltage representing the amplified measurement voltage; and iv) a differential amplifier powered by the primary power supply voltage, referencing the electrical ground and including first and a second inputs receiving the analog reference and the first output voltage, respectively, and delivering a second output voltage representing the first amplified output voltage referenced to the electrical ground. | 2010-12-23 |
20100321003 | METER-MOUNTED EXTENDER - A method of designing a meter-mounted extender with a transformer is disclosed, wherein losses from primary and secondary windings are equalized for a given secondary load. | 2010-12-23 |
20100321004 | DIAGNOSTIC DEVICES INCORPORATING FLUIDICS AND METHODS OF MANUFACTURE - The present invention relates to diagnostic devices incorporating electrode modules and fluidics for performing chemical analyses. The invented devices consist of a sensor array formed on an electrode module, the sensor array being contained within a fluidic housing. The electrode module is a laminate of a perforated epoxy foil and a photo-formed metal foil with sensor membranes deposited into the perforations. The fluidic housing is an element consisting of a plastic card-like body with fluidic conduits and a sealed fluid reservoir contained in a foil-lined cavity. | 2010-12-23 |
20100321005 | PERSONAL MEDIA DEVICE DOCKING STATION HAVING AN ACCESSORY DEVICE DETECTOR - Systems and methods include a circuit for detecting the insertion of a component into a docking station, e.g., an audio plug. When the component is inserted into the docking station, an electronic switch can be opened. When the switch is opened, a detector (e.g., monostable multivibrator) for detecting a change in state of the switch can be activated. Responsive to the detected change in state, the detector can issue a signal to a control device. Responsive to the signal, the controller can look to a resistive identification circuit and, based on its resistance, determine whether the component has just been inserted or removed from the docking station. | 2010-12-23 |
20100321006 | Rotational Angle-Measurement Apparatus and Rotational Speed-Measurement Apparatus - A rotational angle-measurement apparatus with high accuracy is provided through the electric correction of the rotational angle-measurement apparatus by rotating the rotation shaft at a constant speed. | 2010-12-23 |
20100321007 | SHEET COIL TYPE RESOLVER - A sheet coil type is provided in which a detection coil of two phases is disposed at a stator section and structured such that a coil of sine phase a coil of cosine phase are circumferentially arranged alternately on the same plane, wherein the distance between an excitation coil at a rotor section and the coil of sine phase at the stator section is identical to the distance between the excitation coil at the rotor section and the coil of cosine phase at the stator section, whereby the difference in amplitude between at a sine phase output and at a cosine phase output is eliminated. | 2010-12-23 |
20100321008 | ROTATION-ANGLE-DETECTING APPARATUS, ROTATING MACHINE AND ROTATION-ANGLE-DETECTING METHOD - An apparatus for detecting a rotation angle using a magnet rotor comprising a magnet having 2N poles, wherein N is a natural number, and a sensor device for detecting the direction of a magnetic flux from the magnet rotor, at least one of two output voltages obtained in radial and rotational directions by the sensor device being multiplied by a correction coefficient, and the rotation angle being calculated from the two corrected output voltages to increase the detection accuracy of the rotation angle. | 2010-12-23 |
20100321009 | MAGNETOSTRICTIVE TRANSDUCER AND APPARATUS AND METHOD FOR MONITORING STRUCTURAL HEALTH USING THE SAME - A magnetostrictive transducer that generates a large shear horizontal (SH) wave useful for non-destructive testing of a plate member, and method and apparatus for structural health monitoring by using the magnetostrictive transducer. The magnetostrictive transducer includes: a magnetostrictive patch array comprising a plurality of magnetostrictive patches that have different radii of curvature, and have the same center of curvature when arranged on a plate member and form an overall fan-shape; a static magnetic field forming unit comprising two magnets that are respectively installed on both sides of the magnetostrictive patch so that a magnetic field is formed in parallel to an arc direction of the magnetostrictive patch; and a dynamic magnetic field forming unit comprising a wound coil comprising a plurality of curved portions. | 2010-12-23 |
20100321010 | MAGNETIC FIELD SENSOR - A magnetic field sensor assembly ( | 2010-12-23 |
20100321011 | Method and system for inflight refueling of unmanned aerial vehicles - A system and method for refueling unmanned aerial vehicles. The system is adapted to refuel a first unmanned aerial vehicle from a second unmanned aerial vehicle and includes an arrangement for flying the first and second vehicles to proximity within a predetermined range and for connecting an umbilical from the second vehicle to the first vehicle in flight. In the illustrative embodiment, the arrangement for connecting includes a targeting system for electromagnetically detecting a refueling receptacle on the first vehicle. The targeting system includes a first coil around a refueling receptacle on the first vehicle. A seeker is disposed at a first end of said umbilical on the second vehicle. The seeker includes three detector coils adapted to detect a magnetic signal from the first coil around the receptacle on the first vehicle. The coils are mounted such that the detector coils point in different directions. The outputs of the coils are processed to determine the direction and range to the UAV from the tanker UAV. | 2010-12-23 |
20100321012 | DRIVE COIL, MEASUREMENT PROBE COMPRISING THE DRIVE COIL AND METHODS UTILIZING THE MEASUREMENT PROBE - The invention provides a drive coil and measurement probe comprising the drive coil. The measurement probes can be used, for example, in in-situ, non-destructive testing methods, also provided herein. | 2010-12-23 |
20100321013 | Magnetic-field analyzing apparatus and magnetic-field analyzing program - A first equation is created, using the physical property data of a user-specified target to be analyzed, to calculate a first magnetic field due to a current vector in the target to be analyzed in such a manner that a finite element method and a boundary integral method are applicable to the first equation. A second equation is created, using the physical property data of the user-specified target to be analyzed, to calculate a second magnetic field due to a magnetization vector in the target to be analyzed in such a manner that the finite element method and the boundary integral method are applicable to the second equation. A first magnetic field and a second magnetic field are calculated using the first equation and the second equation, respectively. The sum of the first magnetic field and the second magnetic field is set to the magnetic field of the target. | 2010-12-23 |
20100321014 | EXTERNAL MAGNETIC FIELD ANGLE DETERMINATION - Magnetoresistive sensors are commonly used for angular detection in many automotive applications. According to an exemplary embodiment of the present invention, a sensor is provided in which a first half-bridge has magnetoresistive resistors with barber-pole stripes and in which a second half-bridge has magnetoresistive resistors without barber-pole stripes. One of the resistors without barber-pole stripes is rotated with respect to the other three resistors by 90°. This may provide for an improved angle determination with reduced angular errors due to offset. | 2010-12-23 |
20100321015 | MINIATURE COILS ON CORE WITH PRINTED CIRCUIT - A method for producing a coil assembly includes overlaying printed circuit traces on a core. The traces include terminals for coupling to conductive connections on a base on which the coil assembly is to be mounted. Two or more wires are wrapped around the core so as to define two or more coils, wrapped in different, respective directions. The ends of the wires are coupled to the printed circuit traces, so as to connect the wires through the traces to the terminals. | 2010-12-23 |
20100321016 | MAGNETIC RESONANCE IMAGING APPARATUS AND SCANNING-CONDITION CREATING METHOD - A storage unit stores a parameter list that defines a method of creating scanning conditions for a preparation scan from scanning conditions set for a main scan, with respect to each type of scanning. A scanning-condition edit/scan positioning unit receives an operation of selecting a type of a preparation scan, and when the operation of selecting the type of the preparation scan is received, the scanning-parameter limit calculating unit acquires the parameter list corresponding to the type of the preparation scan, from among the parameter lists stored by the storage unit, creates scanning conditions for the preparation scan from scanning conditions set for a main scan based on the parameter list corresponding to the type of the preparation scan. The pulse-sequence execution-data creating unit then causes execution of the preparation scan based on the created scanning conditions. | 2010-12-23 |
20100321017 | ULTRAHIGH TIME RESOLUTION MAGNETIC RESONANCE - Ultrahigh time resolution magnetic resonance is achieved in a flow-through device such as a microfluidic chip by imaging along the flow dimension. Position within the one-dimensional image may be related to time by the flow velocity. Thus, a time resolution corresponding to the one-dimensional image resolution is obtainable. | 2010-12-23 |
20100321018 | High-Resolution NMR Probe - A high-resolution NMR probe is offered which is simple in structure and can be fabricated at low cost. The inside of the probe is maintained in a vacuum to adiabatically isolate the inside from the outside. Liquid helium is sent into a first heat exchanger located immediately close to a measurement portion via the innermost region of a triple tube placed in the vacuum. The helium is evaporated in the exchanger to cool a transmit-receive coil and a variable capacitor. The evaporated helium gas is returned via the outermost region of the triple tube. At this time, a radiation shield placed in the vacuum is cooled by a second heat exchanger placed in the return path. | 2010-12-23 |
20100321019 | GRADIENT MAGNETIC FIELD COIL DEVICE AND MAGNETIC RESONANCE IMAGING APPARATUS - When the gradient magnetic field | 2010-12-23 |
20100321020 | BANDWIDTH EXPANSION IN MAGNETIC RESONANCE - An apparatus for use in a magnetic resonance examination includes a radio frequency receive coil ( | 2010-12-23 |
20100321021 | Metal detection excavation apparatus and method - An excavation apparatus for locating and separating an object from a medium comprising a handle, an excavation tool, a metal detector circuit, at least one coil connected to the metal detector circuit, and at least one output signal device connected to the metal detector circuit. The handle and the excavation tool share a unitary structure. The metal detector circuit is disposed within the handle, and has the at least one coil disposed inside of the excavation tool configured to produce a search field around the excavation tool from within the excavation tool, and the metal detector circuit is configured to notify user with the at least one output signal device when a metallic object is in proximity of the search field. | 2010-12-23 |
20100321022 | APPARATUS AND SYSTEM FOR WELL PLACEMENT AND RESERVOIR CHARACTERIZATION - A resistivity array having a modular design includes a transmitter module with at least one antenna, wherein the transmitter module has connectors on both ends adapted to connect with other downhole tools; and a receiver module with at least one antenna, wherein the transmitter module has connectors on both ends adapted to connect with other downhole tools; and wherein the transmitter module and the receiver module are spaced apart on a drill string and separated by at least one downhole tool. Each transmitter and receiver module may comprise at least one antenna coil with a magnetic moment orientation not limited to the tool longitudinal direction. A spacing between the transmitter and receiver module may be selected based on expected reservoir thickness. | 2010-12-23 |
20100321023 | ATTENUATION OF ELECTROMAGNETIC SIGNALS PASSING THROUGH CONDUCTIVE MATERIAL - The present disclosure relates to determining the attenuation of an electromagnetic signal passing through a conductive material. An antenna is provided and placed in relatively close proximity to the conductive material. An alternating current is passed through the antenna and the impedance of the antenna is measured. The attenuation is determined using the measured impedance. A single frequency measurement may be made, or multiple measurements using different frequencies may be made. Grouped parameters based on properties of the material and the frequency of the current are used to relate the coil impedance to the attenuation. A current frequency for which the ratio of the antenna's resistive part of the impedance to the angular frequency of the current is substantially insensitive to at least one of the parameters is preferred. | 2010-12-23 |
20100321024 | DERIVING AN ELECTROMAGNETIC FIELD IN ONE DIRECTION BASED ON MEASUREMENT DATA OF ONE OR MORE SENSING ELEMENTS FOR MEASURING AN ELECTROMAGNETIC FIELD IN ANOTHER DIRECTION - A survey module includes at least one sensing element to measure a first electromagnetic (EM) field along a first direction, and circuitry to derive a second EM field along a second, different direction based on the first EM field. | 2010-12-23 |
20100321025 | Method for use With A Vehicle Battery Pack Having A Number of Individual Battery Cells - A system and method for use with a vehicle battery pack having a number of individual battery cells, such as a lithium-ion battery commonly used in hybrid electric vehicles. In one embodiment, the method evaluates individual battery cells within a vehicle battery pack in order to obtain accurate estimates regarding their average transient voltage effect, open circuit voltage (OCV | 2010-12-23 |
20100321026 | VOLTAGE MEASURING APPARATUS FOR ASSEMBLED BATTERY - There is provided a voltage measuring apparatus for measuring a voltage of an assembled battery in which a plurality of unit cells are connected in series. The voltage measuring apparatus comprises: block voltage detection sections, each section measuring a voltage of each block of a plurality of blocks into which the plurality of unit cells are divided; a reference voltage output section provided in each of the voltage detection sections to output a reference voltage; a difference voltage calculating section which calculates a difference voltage between measured values of the reference voltages measured by two block voltage detection sections; a difference voltage determination section which determines whether each of the difference voltages exceeds a given threshold voltage or not; and an abnormality determination section which determines that abnormality occurs in the voltage measuring apparatus when at least one of the difference voltages is determined as greater than the threshold voltage. | 2010-12-23 |
20100321027 | Methods and Systems for Detection Using Threshold-Type Electrostatic Sensors - Methods, apparatus and systems are described as relating to electrostatic sensors for detection in micro or nano electromechanical systems. In exemplary embodiments, a sensor for detecting a threshold value of is provided. The sensor includes a deformable member with a mass detection area, an electrostatic actuator having first and second plates, the first plate being connected to the mass detection area, and a voltage source connected to each of the first and second plate. The operating voltage being proximate to a local bifurcation point of the electrostatic sensor for the first and second plates to pull-in together. Upon an external mass having the threshold value appearing on the mass detection area, the local bifurcation point of the electrostatic sensor is shifted such that the first and second plates will pull in to contact each other by movement of the deformable member to signal detection. | 2010-12-23 |
20100321028 | SYSTEM AND METHOD FOR DETERMINING THE PERFORMANCE OF A WEARABLE ELECTRODE | 2010-12-23 |
20100321029 | PLASMA MEASURING METHOD, PLASMA MEASURING DEVICE AND STORAGE MEDIUM - Provided is a technique capable of ascertaining the process condition of the boundary between electrically positive and negative plasma regions. In a vacuum chamber, one of the parameters of process conditions is stepwisely changed to generate a plasma under at least three process conditions. The parameters include a flow rate ratio between an electrically negative gas and an electrically positive gas, a pressure in the vacuum chamber and the magnitude of an energy supplied to the gases. Next, a voltage is applied to a Langmuir probe positioned in that plasma, and a current-voltage curve indicating the relationship between the applied voltage and the electric current to flow through the probe is acquired for each of the process conditions. On the basis of the current-voltage curve group acquired, the process conditions are determined for the boundary between the electrically positive and negative plasma regions. | 2010-12-23 |
20100321030 | SYSTEM AND METHOD TO PROVIDE LUBRICATION FOR A PLUG-IN HYBRID - In hybrid electric vehicles having increased battery storage capacity and plug-in capability, electric-only operation of significant duration is available. To supplement lubrication for the electric and mechanical components provided in a fluid circuit by an engine-driven mechanical pump, an electric pump is provided in parallel to the mechanical pump. When the electric pump is operating, a diagnostic can be performed to determine system integrity. According to one embodiment, an actual quantity provide to the circuit is determined; an expected quantity is estimated; and a fault is determined when the actual and expected quantities differ by more than a predetermined amount. The fault may indicate a leak or plug in the fluid circuit or a failure of a component in the fluid circuit. | 2010-12-23 |
20100321031 | OPTICAL COMPONENT IDENTIFIER - A circuit board including a plurality of components; a plurality of light sources aligned along at least one axis; and a controller configured to activate the light sources to identify at least one of the components. The components on the circuit board can be identified by the light sources in response to a variety of conditions. | 2010-12-23 |
20100321032 | Pre-Settable Current Sensing Apparatus, System, and/or Method - The present invention relates to electromechanical device status monitoring and equipment protection applications for industrial automation, HVAC, and other implementations; and, more particularly, to the use of current sensing devices to detect loss-of-flow conditions. Presently described embodiments can comprise simplified, compact current sensing devices that can be economical to build, inventory, distribute, and purchase. Present embodiments can easily be calibrated and/or set by hand prior to installation, and they can be configured for automatically offering proof-of-flow detection based, at least in part, on the initially provided setting. | 2010-12-23 |
20100321033 | Method and System for Optimal Source Impedance Matching at the Input of Electronic Components, Particularly Transistors - A method for determining optimal source impedance at the input of a device under testing (DUT) in a measurement bench, includes the steps of calibrating a source pull type bench as a measurement bench, adjusting a load impedance and continuous bias of the DUT, generating an electric power signal by the source and injected in the DUT, acquiring input impedances of the DUT and corresponding gain performances. | 2010-12-23 |
20100321034 | SYSTEM AND METHOD FOR DETECTING INTERFERNCE IN A SENSOR DEVICE USING PHASE SHIFTING - A capacitive sensor device and method is configured to respond a stimulus provided in a sensing region with an output signal. A signal generator is configured to apply a carrier signal to the capacitive sensor device. The carrier signal is switched between a plurality of phases at a switching rate, where the switching rate is less than a demodulation filter bandwidth. The result of the carrier phase shifting is that effects of interference in the output signal are frequency shifted away from the effects of user applied stimulus. An interference detection filter is configured to filter from the sensor outputs at least one effect produced by the stimulus. An interference measuring device is configured to determine a level of interference in the at least one interference output. Thus, the system can detect interference in the output of the capacitive sensor device. | 2010-12-23 |
20100321035 | LOOP ELEMENT AND NOISE ANALYZER - There is provided a shield-structured loop element which can suppress noise via a silicon substrate and can be manufactured by a semiconductor process. The loop element includes: a first well of a first polarity that is formed on a substrate; a deep well of a second polarity that is formed below the first well; a ring-shaped second well of a second polarity that is formed on the deep well along an outer periphery of the deep well; a third well of the first polarity that is formed in an island area surrounded by the deep well and the second well; a looped conductor that is formed in a layer above the third well and has smaller outer dimensions than those of the third well; and a first path that connects the second well to a bias power supply. The second well and the deep well are electrically connected to each other. | 2010-12-23 |
20100321036 | DUAL TONE MEASUREMENT OF CONDUCTIVITY AND DIELECTRIC PROPERTIES - The invention relates to a method of simultaneously determining both the conductivity and dielectric properties of a sample such as lubricating oil or a fuel. First and second signals are applied to a test cell through a combiner. Output of the cell is measured by a pair of frequency selective AC voltage measuring devices through a load on the output of the test cell. Through simultaneous readings, conductivity and dielectric properties are accurately calculated rather than estimated. | 2010-12-23 |
20100321037 | CONFIGURABLE VOLTAGE REGULATOR - A configurable semiconductor includes N terminals adapted to be connected to at least one of T external impedances. N is an integer greater than zero and T is an integer greater than one. The T external impedances have impedance values within predetermined tolerances. A measurement circuit measures an impedance value of at least one of the T external impedances. A control circuit compares the measured impedance value to T ranges and selects a value of a device characteristic based on comparison. The value of the device characteristic selected by the control circuit is independent of the predetermined tolerances of the T external impedances. | 2010-12-23 |
20100321038 | MONITORING OF THE AGING OF THE CAPACITORS IN A CONVERTER BY MEANS OF CAPACITANCE MEASUREMENT - A method and a device for converting an electrical current include at least one phase module having an AC voltage connection and at least one DC voltage connection. A phase module branch is disposed between each DC voltage connection and the AC voltage connection. Each phase module branch includes a series circuit of submodules, each having a capacitor and at least one power semiconductor. The apparatus can establish aging of an energy storage device in a simple manner by using a capacitor diagnosis device for a time-dependent determination of the capacitance of each capacitor. | 2010-12-23 |
20100321039 | METHOD AND APPARATUS TO SELECT A PARAMETER/MODE BASED ON A TIME MEASUREMENT - An example integrated control circuit includes a regulator, a first comparator, a second comparator, and a counter. The regulator is to charge, during a time period, a capacitor. The first comparator is to provide an output indicating when a voltage on the capacitor reaches a first threshold voltage. The second comparator is coupled to provide an output indicating when the voltage on the capacitor reaches a second threshold voltage. The counter is coupled to begin counting in response to the first threshold voltage being reached and is coupled to stop counting in response to the second threshold voltage being reached. The counter is coupled to provide an output representative of the capacitance value of the capacitor during the time period and the integrated control circuit receives a bias current at the terminal from the capacitor to provide power to operate the integrated control circuit after the time period has ended. | 2010-12-23 |
20100321040 | CAPACITOR CAPACITANCE DIAGNOSIS DEVICE AND ELECTRIC POWER APPARATUS EQUIPPED WITH CAPACITOR CAPACITANCE DIAGNOSIS DEVICE - A capacitor capacitance diagnosis device includes a power supply which is for charging a capacitor, a discharge circuit which is connected to the capacitor in parallel to discharge energy of the capacitor, a resistance dividing circuit which is for measuring voltage drop value during discharging, a measurement circuit which measures divided voltage, and a diagnosis circuit which determines adequacy of capacitor capacitance from a time change in voltage due to the discharge. This makes it possible to diagnose adequacy of capacitor capacitance of an electric power apparatus during operation. | 2010-12-23 |
20100321041 | Determining the dead time in driving a half-bridge - Disclosed is a circuit arrangement for determining a temporal change of an output voltage of a half-bridge circuit during a dead time. In one embodiment, the circuit arrangement includes a first input for applying the output voltage. A capacitive network is provided having a first and a second circuit node capacitively coupled to the input, and having a terminal for a reference potential. A recharging circuit is configured, during the switched-on phase of one of a first and second switching elements, to adjust electrical potentials of the first and second nodes, the electrical potentials each being different from the reference potential. A comparator arrangement is provided that is configured during the dead time to determine a time difference between such times at which the electrical potentials at the first and second node each assume a given potential value, the time difference being a measure for the change with time of the output voltage. | 2010-12-23 |
20100321042 | CONFIGURABLE PSRO STRUCTURE FOR MEASURING FREQUENCY DEPENDENT CAPACITIVE LOADS - A configurable PSRO measurement circuit is used to measure the frequency dependent capacitance of a target through silicon via (TSV) or other conductive structure. Measurements of the target structure are aided by using adjustable resistors and a de-embedding structure to measure the effects of parasitic capacitance, C | 2010-12-23 |
20100321043 | TWO-DIMENSIONAL POSITION SENSOR - A two-dimensional position sensor is formed by drive electrodes ( | 2010-12-23 |
20100321044 | Sensing element integrating silicon nanowire gated-diodes, manufacturing method and detecting system thereof - The invention disclosed a sensing element integrating silicon nanowire gated-diodes with microfluidic channel, a manufacturing method and a detecting system thereof. The sensing element integrating silicon nanowire gated-diodes with a microfluidic channel comprises a silicon nanowire gated-diode, a plurality of reference electrodes, a passivation layer and a microfluidic channel. The reference electrodes are formed on the silicon nanowire gated-diodes, and the passivation layer having a surface decorated with chemical materials is used for covering the silicon nanowire gated-diodes, and the microfluidic channel is connected with the passivation layer. When a detecting sample is connected or absorbed on the surface of the passivation layer, the sensing element integrating silicon nanowire gated-diodes with the microfluidic channel can detect an electrical signal change. | 2010-12-23 |
20100321045 | Device And System For Measuring Properties Of Cells And Method Of Measuring Properties Of Cells Using The Same - According to a device and system for measuring the properties of cells, there is an advantage in that, since a cell accommodation unit having a volume is provided, the properties of three-dimensional cells can be measured. Further, the present invention is advantageous in that it enables passive measurement of multiple properties which passively measures the electrical, mechanical and/or optical properties of cells, and active measurement of multiple properties which actively applies electrical, mechanical and optical types of stimulation to cells and measures their electrical, mechanical and/or optical reactions, thus measuring the multiple properties of cells with high reliability. | 2010-12-23 |
20100321046 | WIPEABLE CONDUCTIVITY PROBE AND METHOD OF MAKING SAME - A conductivity sensor is disclosed that comprises a forked electrode support that includes a first opposing arm and a second opposing arm spaced apart by a slot. Both the first arm and the second arm include a plurality of electrodes embedded in each arm. The first and second arms and the slot are capable of retaining a volume of fluid within the volume defined by the arms and the slot such that the conductivity of the fluid in the slot can be determined. The conductivity sensor is wipeable by a reciprocating wiper assembly positioned adjacent the forked electrode support such that the wiper element can travel through the slot and remove contaminants from the slot and the plurality of electrodes in each of the first and second arms. Also disclosed are methods of making the conductivity sensor. | 2010-12-23 |
20100321047 | METHOD AND DEVICE FOR DETECTING ELECTRIC POTENTIAL AND ELECTRIC CHARGES IN A PRINTER OR COPIER - In a system or method to detect an electrical potential and layer thickness of a layer of toner particles in a printer or copier, a measurement arrangement is provided having a first electrode and at least one second electrode situated opposite the first electrode. An intermediate image carrier is provided on a surface of which a toner image is generated. A drive unit drives the intermediate image carrier so that its surface is directed past the first electrode situated opposite the surface. An evaluation unit is electrically connected with the first electrode. The evaluation unit detects an electrical current flowing between the first electrode and the evaluation unit. The evaluation unit determines an electrical charge of toner particles arranged in a detection region in a first measurement procedure with aid of the detected current. The evaluation unit also determines the layer thickness of the layer of toner particles in an inked region via at least one second measurement procedure. | 2010-12-23 |
20100321048 | SYSTEMS FOR INSPECTION OF SHROUDS - A system to measure thickness of a shroud is provided. The system includes at least one resistive element embedded within the shroud. The system also includes an impedance measurement device that measures a total resistance associated with the at least one resistive element. | 2010-12-23 |
20100321049 | INTEGRATED CIRCUIT CHIP IDENTIFICATION ELEMENT - A element for identifying an integrated circuit chip having identical diffused resistors connected as a Wheatstone bridge. | 2010-12-23 |
20100321050 | ON-CHIP MEASUREMENT OF SIGNALS - A method, system, and computer usable program product for on-chip measurement of signals in an integrated circuit are provided in the illustrative embodiments. A signal to be measured is identified in the IC. The signal is provided as a first control voltage input to a first VCO in the IC. A first output frequency is generated from the first VCO, the first output frequency having a first frequency value corresponding to the signal. The signal is provided as a second control voltage input to a second VCO in the IC. A second output frequency is generated from the second VCO, the second output frequency having a second frequency value corresponding to the signal. The first and the second output frequency values are exported from the IC. A mean value and a standard deviation of the signal are computed using the output first and second frequency values. | 2010-12-23 |
20100321051 | SEMICONDUCTOR INTEGRATED CIRCUIT, DEBUG/TRACE CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT OPERATION OBSERVING METHOD - A main functional structure executes continuous predetermined operations to continuously generate events associated with the operations. A debug/trace circuit compares an event occurring at the main functional structure with detection condition indicating information of one entry in a control information list, and executes the operation designated by operation indicating information paired with the detection condition indicating information in accordance with the result of the comparison. The debug/trace circuit continuously performs this in accordance with the control information list to identify the event. | 2010-12-23 |
20100321052 | PRE-ALIGNMENT METHOD OF SEMICONDUCTOR WAFER AND COMPUTER-READABLE RECORDING MEDIUM HAVING PRE-ALIGNMENT PROGRAM RECORDED THEREON - Disclosed is a pre-alignment method and a computer-readable medium storing a pre-alignment program capable of reducing pre-alignment time and transfer time of a semiconductor wafer. The pre-alignment method includes steps of rotating the semiconductor wafer transferred from a receiving unit onto a rotating body of a pre-alignment mechanism by a transfer mechanism, calculating and storing an eccentric value between a shaft center of the rotating body and a center of the semiconductor wafer detected by a sensor of the pre-alignment mechanism, correcting a positional deviation of the semiconductor wafer on the rotating body by the transfer mechanism according to the calculated eccentric value, when the calculated eccentric value exceeds a predetermined value, and estimating the eccentric value when conducting the pre-alignment operation for a succeeding semiconductor wafer, based on the eccentric value accumulated during the pre-alignment operation conducted for semiconductor wafers prior to the succeeding semiconductor wafer. | 2010-12-23 |
20100321053 | SEMICONDUCTOR INSPECTION APPARATUS, SEMICONDUCTOR WAFER POSITIONING METHOD, AND SEMICONDUCTOR WAFER INSPECTION METHOD - A semiconductor inspection apparatus comprising: a plurality of wafer stages provided independently for each of a plurality of laminated semiconductor wafers, that directly or indirectly secure the corresponding semiconductor wafers and that possess a mechanism for positioning the corresponding semiconductor wafers; and a probe card, arranged outside or in between the plurality of laminated semiconductor wafers so as to face the semiconductor wafers, that transmits a signal or power to the plurality of semiconductor wafers. | 2010-12-23 |
20100321054 | SEMICONDUCTOR INSPECTING DEVICE AND SEMICONDUCTOR INSPECTING METHOD - A semiconductor inspecting device comprises a probe card for transmitting a signal or power supply to semiconductor wafers having one or more subject chips formed therein, and is constituted such that the first semiconductor wafer faces the first face of the probe card and such that the second semiconductor wafer faces the second face of the probe card on the opposite side of the first face. The probe card includes one or more inspecting chips, which can perform non-contact transmissions with the first subject chip in the first semiconductor wafer and the second subject chip in the second semiconductor wafer. | 2010-12-23 |
20100321055 | IC TEST VECTOR GENERATOR FOR SYNCHRONIZED PHYSICAL PROBING - Systems, methods, and computer readable media storing instructions for such methods relate to generating test vectors that can be used for exercising a particular area of interest in an integrated circuit. The test vectors generally include a non-overlapping repeating and/or predictable sequence of care bits (a care bit pattern) that can be used by a tester to cause the exercise of the area and collect emissions caused by exercising the area. Such emissions can be used for analysis and debugging of the circuit and/or a portion of it. Aspects can include providing a synchronization signal that can be used by a tester to allow sensor activation at appropriate times. | 2010-12-23 |
20100321056 | SYSTEM AND METHOD OF MEASURING PROBE FLOAT - A system and method allow accurate calculation of probe float through optical free-hanging and electrical planarity measurement techniques. In accordance with an examplary embodiment, probe float may be determined by acquiring a free-hanging planarity measurement, obtaining a first electrical contact planarity measurement, and calculating probe float using results of the acquiring and the obtaining operations. | 2010-12-23 |
20100321057 | PROBE PIN AND METHOD OF MANUFACTURING THE SAME - A probe pin having a bent portion at its tip end portion is used for a probe card, the probe pin is configured such that an angle constituted by a direction of work groove generated at a time of machine-working of a tip end portion of the probe pin and a longitudinal direction of a metal wire is set to 45 degree or less, or both directions are set to be almost parallel to each other. Due to above configuration, even if the tip end portion of the probe pin is subjected to a bending work and a worked surface is formed with recessed portion, a breakage of the probe pin caused by the recessed portion existing on the worked surface and functioning as a starting point of the breakage can be effectively prevented whereby a lowering of a production yield of the probe pin can be greatly suppressed. | 2010-12-23 |
20100321058 | Fault Tolerant Integrated Circuit Architecture - The exemplary embodiments provide a resilient integrated circuit. An exemplary IC comprises a plurality of composite circuit elements, a state machine element (SME), and a plurality of communication elements. Each composite circuit element comprises an element interface and a selected circuit element which may vary by element type, and which may be configurable. The state machine element assigns various functions based on element type, such as assigning a first configuration to a first element type, assigning a second configuration to a second element type, and providing a first data link for the corresponding assignments. In response to detection of a fault or failure, the state machine element re-assigns the first configuration to another composite circuit element and creates a second data link for performance of the same function. The assignment, routing, fault detection, and re-assignment and data re-routing can occur in real time for a wide variety of programs and algorithms, providing for the IC to continue the same functioning despite defects which may arise during operation. | 2010-12-23 |
20100321059 | IMPEDANCE ADJUSTMENT CIRCUIT - An impedance adjustment circuit according to the present invention includes a first input buffer which detects that an input signal exceeds VREFA, a second input buffer which detects that the input signal exceeds VREFB, VREFB being higher than VREFA, a counter circuit A which performs count based on an output from the first input buffer, a counter circuit B which performs count based on an output from the second input buffer, and a termination resistor control circuit which controls impedance of a termination resistor provided in a termination of a transmission path based on the count in the counter circuit A and the count in the counter circuit B. | 2010-12-23 |
20100321060 | SEMICONDUCTOR LSI AND SEMICONDUCTOR DEVICE - In a signal transmission system, performing signal transmission via signal interconnections | 2010-12-23 |
20100321061 | THRESHOLD LOGIC ELEMENT HAVING LOW LEAKAGE POWER AND HIGH PERFORMANCE - Embodiments of a threshold logic element are provided. Preferably, embodiments of the threshold logic element discussed herein have low leakage power and high performance characteristics. In the preferred embodiment, the threshold logic element is a threshold logic latch (TLL). The TLL is a dynamically operated current-mode threshold logic cell that provides fast and efficient implementation of digital logic functions. The TLL can be operated synchronously or asynchronously and is fully compatible with standard Complementary Metal-Oxide-Semiconductor (CMOS) technology. | 2010-12-23 |
20100321062 | CONFIGURABLE CIRCUIT AND CONFIGURATION METHOD - A configurable circuit of the present invention includes a plurality of logic blocks ( | 2010-12-23 |
20100321063 | INTEGRATED CIRCUIT AND STANDARD CELL FOR AN INTEGRATED CIRCUIT - An integrated circuit and a standard cell of an integrated circuit, having a master-slave flip-flop, having a comparator logic at whose inputs the input signal of the master-slave flip-flop, the inverted input signal of the master-slave flip-flop, the output signal of the master-slave flip-flop, and the inverted output signal of the master-slave flip-flops are present, wherein the master-slave flip-flop has a master flip-flop and a slave flip-flop, wherein the slave flip-flop has a first inverting element and a second inverting element. Whereby for feedback, an output of the first inverting element is connected to an input of the second inverting element and an output of the second inverting element to an input of the first inverting element. Wherein, to output the output signal and the inverted output signal of the master-slave flip-flop, it is possible to connect the output and the input of the second inverting element to the inputs of the comparator logic so that the second inverting element and the comparator logic and an inverter form an exclusive-OR operation of the standard cell. | 2010-12-23 |
20100321064 | COMBINATORIAL CIRCUIT WITH SHORTER DELAY WHEN INPUTS ARRIVE SEQUENTIALLY AND DELTA SIGMA MODULATOR USING THE COMBINATORIAL CIRCUIT - A combinatorial circuit with pre-calculation and having shorter delay is described. The combinatorial circuit uses information available from earlier input signals to pre-calculate intermediate signals, which are used to generate output signals when the last input signal arrives. The combinatorial circuit includes an input calculation block, at least one pre-calculation block, and an output calculation block coupled in series. The input calculation block receives some input signals and generates intermediate signals for the first pre-calculation block. The pre-calculation block(s) receive at least one earlier input signal and generate additional intermediate signals. The output calculation block receives the latest input signal and the intermediate signals from the last pre-calculation block and generates the output signals. The pre-calculation block(s) and the output calculation block may be implemented with simple circuits. In another aspect, a delta sigma (ΔΣ) modulator may use the combinatorial circuit with pre-calculation in order to improve operating speed. | 2010-12-23 |
20100321065 | SEMICONDUCTOR INTEGRATED CIRCUIT HAVING INSULATED GATE FIELD EFFECT TRANSISTORS - A semiconductor integrated circuit includes a multiplexer, a signal generating circuit, a control circuit, m inverters, n two-input NOR circuits, and cascade connected n two-shift registers. The control circuit generates a control signal in the disable state in a normal operation in which the clock signal is supplied. The control circuit generates a control signal in an enable state in the other-than-normal operation in which a higher voltage source voltage is supplied while the clock signal is not supplied. The multiplexer receives the clock signal and a low-frequency signal outputted from the signal generating circuit. The multiplexer supplies the clock signal to the sequence of the inverters upon receipt of the control signal in the disable state, and supplies the low-frequency signal to the sequence of the inverters upon receipt of the control signal in the enable state. | 2010-12-23 |
20100321066 | DIGITAL NOISE FILTER - A digital noise filter circuit includes a gating clock generating circuit and a noise filter circuit. The gating clock generating circuit compares logic levels of an input signal and an output signal of the noise filter circuit. The gating clock generating circuit supplies a gating clock as an operating clock to the noise filter circuit when the logic levels of both signals do not coincide, and halts supply of the gating clock when the logic levels of both signals do coincide. The noise filter circuit removes noise from the input signal and outputting the resultant signal as the output signal. | 2010-12-23 |
20100321067 | Programmable Gain Amplifier - A programmable gain amplifier comprising alternatively selectable parallel circuits in a front end and independently selectable serial amplification circuits in a back end. The front end may include, for example, a plurality of transconductors in parallel and each configured to generate a current proportional to a received voltage. A ratio of the generated current to the received voltage being different for each of the transconductors. The back end is configured to receive an output of a selected member of the parallel circuits and may include a plurality of current or voltage mode amplifiers in series. For example, the back end may include a plurality of current-mode gain stages and switches configured to control which of the current-mode gain stages are used to amplify the output of the front end. The programmable gain amplifier may be used between a signal receiver and an analog to digital converter. | 2010-12-23 |
20100321068 | Frequency Synthesizer - An object of the present invention provides a frequency synthesizer having a broad frequency entraining range which can finely set a frequency over a broad band by a novel principle. | 2010-12-23 |
20100321069 | AC-COUPLED INTERFACE CIRCUIT - A differential driver ( | 2010-12-23 |
20100321070 | SWITCHING ELEMENT DRIVING CIRCUIT AND CONVERTER - A driving circuit in which, during an on-period of a switching element, a voltage applied to the switching element is stored, and during an off-period of the switching element, the stored voltage is supplied to turn off the switching element. | 2010-12-23 |
20100321071 | Semiconductor integrated circuit - A resume signal hold circuit holds an assertion of a resume signal instructed while the circuit block is in a stand-by mode. A resume signal mask circuit is provided between the circuit block and the resume signal hold circuit, and masks the signals while the circuit block is in the stand-by mode so that no signal can be input to the circuit block. A power saving control circuit causes the resume signal hold circuit to hold the assertion of the event signal and causes the resume signal mask circuit to mask the signals while the circuit block is in a stand-by mode. The power saving control circuit also causes the resume signal hold circuit to cancel the holding of the assertion of the resume signal after the completion of the resume setting of the circuit block and cancelling of the signal masking by the resume signal mask circuit. | 2010-12-23 |
20100321072 | Device and Method for Signal Detection in a TDMA Network - The present invention is related to a circuit ( | 2010-12-23 |
20100321073 | OSCILLATOR AND PHASE SYNCHRONIZING CIRCUIT - When a direct-current voltage is applied from a power supply, a signal line generates a standing wave having the ¾ wavelength where a starting end of the signal line connected to the power supply is used as a node and a terminating end is used as an antinode. Strips are connected to a ground layer through switches, respectively. The switches switch connection and non-connection of the strips and the ground layer, under the control from a switch controller. By switching the connection and non-connection of the switches, the distance between the signal line and the ground layer is pseudo adjusted and the effective permittivity in a transmission line unit changes. Therefore, the frequency of the standing wave can be adjusted. | 2010-12-23 |
20100321074 | METHODS AND APPARATUSES FOR INCREMENTAL BANDWIDTH CHANGES RESPONSIVE TO FREQUENCY CHANGES OF A PHASE-LOCKED LOOP - In a phase-locked loop, a desired change in frequency is indicated. The phase-locked loop locks to the new frequency and a loop bandwidth of the phase-locked loop is changed. In changing the loop bandwidth, a frequency adjustment signal to a voltage-controlled oscillator may include a voltage spike. The voltage spike is reduced by detecting a lock when the reference clock and a feedback clock reach a same frequency, then waiting for a time delay after the detecting the lock, and adjusting a current level of a charge pump pulse by an incremental amount to achieve a fractional portion of a new loop bandwidth. The charge pump pulse is filtered to generate the frequency adjustment signal and the frequency spike reduction process is repeated until the new loop bandwidth is achieved. | 2010-12-23 |
20100321075 | Dual Phase Detector Phase-Locked Loop - A phase-locked loop for generating an output signal that has a predetermined frequency relationship with a reference signal, the phase-locked loop comprising a signal generator arranged to generate the output signal, a charge pump arranged to generate current pulses for controlling the signal generator, two control units for controlling a duration of the current pulses generated by the charge pump and a selection unit arranged to select either the first control unit or the second control unit to control the charge pump, wherein a first one of the control units is arranged to continuously monitor a phase-difference between the reference signal and a feedback signal formed from the output signal and to, when selected by the selection unit, control the charge pump to output a current pulse having a duration that is dependent on that phase-difference and a second one of the control units is arranged to, when selected by the selection unit, control the charge pump to output a current pulse of predetermined duration that compensates for a phase error in the feedback signal. | 2010-12-23 |
20100321076 | DELAY-LOCKED LOOP FOR CORRECTING DUTY RATIO OF INPUT CLOCK SIGNAL AND OUTPUT CLOCK SIGNAL AND ELECTRONIC DEVICE INCLUDING THE SAME - A delay-locked loop includes a delay line and a duty correction block. The delay line includes receives an input clock signal and includes a cascade of delay cells for respectively generating a plurality of delayed input clock signals based on the input clock signal. The duty correction block is for correcting a duty ratio of the input clock signal based on a duty ratio of at least one clock signal from among the input clock signal and the plurality of delayed input clock signals in a first duty correction operation in which the duty ratio of the input clock signal is corrected, and correcting a duty ratio of an output clock signal based on the duty ratio of the output clock in a second duty correction operation in which the duty ratio of the output clock signal is corrected. | 2010-12-23 |
20100321077 | PHASE SYNCHRONIZATION APPARATUS - A phase synchronization apparatus includes a bias control unit configured to sequentially delay an input clock signal to generate bias control signals having multiple bits, a bias generation unit configured to generate a pull-up bias voltage having a level that corresponds to logical values of the bias control signals, and to generate a pull-down bias voltage in response to a control signal; and a voltage controlled oscillator configured to include a plurality of delay cells respectively having a pull-up terminal and a pull-down terminal to generate an output clock signal in response to the control voltage, wherein the pull-up bias voltage is supplied to the pull-up terminals of the respective delay cells and the pull-down bias voltage is supplied to the pull-down terminals of the respective delay cells. | 2010-12-23 |
20100321078 | TIMING CONTROLLER, TIMING CONTROL METHOD, AND TIMING CONTROL SYSTEM - A timing controller includes a controller that controls an operation timing of a controlled unit, and a setting unit that associates a timing obtained by dividing a setting of the operation timing into a plurality of timings, each timing having an identification number, and sets the control unit so that an offset period based on the associated timing is added to the operation timing of the controlled unit. | 2010-12-23 |
20100321079 | SEMICONDUCTOR INTEGRATED CIRCUIT - Certain embodiments provide an electronic circuit and a correction circuit. The electronic circuit includes a plurality of semiconductor elements. The correction circuit controls voltage of the semiconductor elements such that a difference between electric characteristics of the semiconductor elements autonomously decreases. | 2010-12-23 |
20100321080 | PULSE WIDTH MODULATION CONTROL SYSTEM - A PWM control system includes a multi-phase PWM controller and at least one single-phase PWM controller. The multi-phase PWM controller is capable of generating a multi-phase PWM signal. The at least one single-phase PWM controller is capable of generating a single-phase PWM signal. A phase difference between the single-phase PWM signal and the multi-phase signal is greater than 0 degree and less than 180 degree. | 2010-12-23 |
20100321081 | CLOCK CIRCUIT FOR A MICROPROCESSOR - A mobile communication device includes an analog clock and a digital clock circuit. The analog clock circuit is configured to generate an oscillating output. The digital clock circuit is configured to generate a digital clock output having a frequency that is substantially equal to the frequency of the oscillating output. | 2010-12-23 |
20100321082 | METHOD AND DEVICE FOR CONTROLLING A COMMON-MODE VOLTAGE OF A SWITCHED-CAPACITOR SYSTEM, IN PARTICULAR AN ANALOG-TO-DIGITAL CONVERTER - The common-mode voltage of a switched-capacitor system is controlled by determining a current common-mode voltage of the switched-capacitor system, converting (in a flow-through conduction cell) the difference between the current common-mode voltage and a desired common-mode voltage into a resultant current, and reinjecting this resultant current into the switched-capacitor system via a resistive path. | 2010-12-23 |
20100321083 | Voltage Level Translating Circuit - A voltage level translating circuit that allows low voltage signals to be translated to higher voltages, a design structure utilized in the design, manufacture, and/or testing of the voltage level translating circuit, and a method of manufacturing the voltage level translating circuit are described. The translating circuit utilizes two different voltage domains. The high voltage rail of the low voltage domain acts as the ground of the high voltage domain. The translating circuit also utilizes a voltage buffer electrically connected to the high voltage domain and to the low voltage domain to prevent the circuit devices in either domain from seeing too high of a voltage. The translating circuit allows the circuits after the translating circuit to work with signals utilizing the high voltage rail of the high voltage domain. | 2010-12-23 |
20100321084 | Level shift circuit - A level shift circuit includes a level shift voltage generation circuit that receives an input signal having an amplitude between a first voltage system power supply voltage and a ground potential and outputs an output signal voltage having an amplitude between a second voltage system power supply voltage and the ground potential, a replica circuit configured to be a replica of the level shift voltage generation circuit, the replica circuit monitoring a threshold voltage of a first voltage system and a threshold voltage of a second voltage system, and enabling the level shift voltage generation circuit to generate of the output voltage synchronized in such a manner that, when the input voltage crosses the logic threshold of the first voltage system, the output voltage crosses the logic threshold of the second voltage system, and a bias generation circuit that generates a bias for adjusting variations of the output voltages of the level shift voltage generation circuit and the replica circuit, and supplies the bias to the level shift voltage generation circuit and the replica circuit. | 2010-12-23 |
20100321085 | System and Method For Direct Digitization of NMR Signals - A magnetic resonance imaging (MRI) system includes a transmitter that produces an RF excitation pulse that is applied to a subject positioned in the MRI system to induce emission of at least one of an NMR signal and an ESR signal therefrom, and that produces a reference signal indicative of the phase of the RF excitation pulse. A first analog-to-digital converter has an input for receiving the reference signal that is synchronous with the RF excitation pulse. One or more additional analog-to-digital converters/processors have inputs for receiving the at least one of NMR signals and ESR signals produced by a subject placed in the MRI system and produce one or more complex digital signals therefrom. A normalizer is connected to receive and normalize the digital reference signal and a mixer is connected to receive the normalized digital reference signal and the digital signal. Accordingly, the mixer is operable to multiply the normalized complex digital reference signal with the complex digital signal. | 2010-12-23 |
20100321086 | POWER AND IMPEDANCE MEASUREMENT CIRCUITS FOR A WIRELESS COMMUNICATION DEVICE - Exemplary embodiments disclosed are directed to power and impedance measurement circuits that may be used to measure power and/or impedance are described. A measurement circuit may include a sensor and a computation unit. The sensor may sense (i) a first voltage signal across a series circuit coupled to a load to obtain a first sensed signal and (ii) a second voltage signal at a designated end of the series circuit to obtain a second sensed signal. The sensor may mix (i) a first version of the first sensed signal with a first version of the second sensed signal to obtain a first sensor output and (ii) a second version of the first sensed signal with a second version of the second sensed signal to obtain a second sensor output. The computation unit may determine the impedance and/or delivered power at the designated end of the series circuit based on the sensor outputs. | 2010-12-23 |
20100321087 | ELECTRONIC DEVICE WITH OPTICAL MODULE - An electronic device includes an optical module, a power source module powering the optical module, a processor, a controller, and a switch module. The processor generates and maintains a delay signal for a first predetermined time in response to determination that the power source module is powered on. The processor further generates a driving signal upon determination that the first predetermined time has elapsed. The controller generates and maintains a control signal for a second predetermined time in response to determination that the power source module is powered on. The switch module is turned on to establish an electrical connection between the power source module and the optical module according to the driving signal, and turned off to cut off the electrical connection according to the control signal. | 2010-12-23 |
20100321088 | Electric Circuit - A transistor has variation in a threshold voltage or mobility due to accumulation of factors such as variation in a gate insulating film which is caused by a difference of a manufacturing process or a substrate to be used and variation in a crystal state of a channel formation region. The present invention provides an electric circuit which is arranged such that both electrodes of a capacitance device can hold a voltage between the gate and the source of a specific transistor. Further, the present invention provides an electric circuit which has a function capable of setting a potential difference between both electrodes of a capacitance device so as to be a threshold voltage of a specific transistor. | 2010-12-23 |
20100321089 | COMPLEMENTARY HIGH VOLTAGE SWITCHED CURRENT SOURCE INTEGRATED CIRCUIT - A complementary high voltage switched current source circuit has a complementary current source pair, wherein a first of the current source pair is coupled to a positive voltage rail and a second of the current source pair is coupled to a negative voltage rail. A digital logic-level control interface circuit is coupled to the complementary current source pair and to the positive voltage rail and the negative voltage rail. A pair of high voltage switches is coupled to the complementary current source pair and the digital logic-level control interface circuit and controlled by the digital control interface circuit. | 2010-12-23 |
20100321090 | SYSTEM AND CIRCUIT FOR A VIRTUAL POWER GRID - A system and circuit for virtual power grid is disclosed. In one embodiment, a switch system for a virtual power grid includes a first transistor for connecting a power supply to a node of a virtual power grid for an isolated region of circuitry via the first transistor upon a receipt of a first control signal to turn on the first transistor. The switch system further includes a second transistor for connecting the power supply to the isolated region of circuitry via the second transistor upon a receipt of a second control signal to turn on the second transistor. In addition, the switch system includes a self-timed enable module for generating and forwarding the second control signal when a voltage level at the node of the virtual power grid which is charged by the power supply via the first transistor reaches a threshold voltage. | 2010-12-23 |
20100321091 | THERMAL SWITCH FOR INTEGRATED CIRCUITS, DESIGN STRUCTURE, AND METHOD OF SENSING TEMPERATURE - A single-ended thermal switch, design structure, and method of sensing temperature. A circuit includes a first MOS transistor and a second MOS transistor connected in series between a first power supply and a second power supply. The circuit apparatus also includes a signal conditioner connected to a node between the first and second MOS transistors. The first MOS transistor and the second MOS transistor are configured such that a leakage current of the second MOS transistor decreases a voltage of the node below a switch point of the signal conditioner when the temperature exceeds a threshold temperature. | 2010-12-23 |
20100321092 | SEMICONDUCTOR DEVICE - An IGBT is disclosed which separated into two groups (first and second IGBT portioZenerns). First and second Zener diodes each composed of series-connected Zener diode parts are disposed so as to correspond to the groups respectively. Each of the first and second Zener diodes has an anode side connected to a corresponding one of first and second polysilicon gate wirings, and a cathode side connected to an emitter electrode. Temperature dependence of a forward voltage drop of each of first and second Zener diodes is used for reducing a gate voltage of a group rising in temperature to throttle a current flowing in the group and reduce the temperature of the group to thereby attain equalization of the temperature distribution in a surface of a chip. In this manner, it is possible to provide an MOS type semiconductor device in which equalization of the temperature distribution in a surface of a chip or among chips can be attained. | 2010-12-23 |
20100321093 | REFERENCE VOLTAGE OUTPUT CIRCUIT - A first output section of a reference voltage output circuit outputs a negative gradient voltage of a first magnitude. An amplifier includes a non-inverting input terminal connected to the first output section, an inverting input terminal, and an output terminal. One end of a first resistor connected to the output terminal and the other end connected to the inverting input terminal. One end of a second resistor is connected to the other end of the first resistor. A second output section connected to the other end of the second resistor outputs a negative gradient voltage of a second magnitude having an absolute value greater than the first magnitude. A resistance value ratio of the first and second resistors is set such that a temperature gradient of the voltage applied to the first resistor is a positive gradient having an absolute value of the same magnitude as the first magnitude. | 2010-12-23 |
20100321094 | METHOD AND CIRCUIT IMPLEMENTATION FOR REDUCING THE PARAMETER FLUCTUATIONS IN INTEGRATED CIRCUITS - This invention provides a method for reducing the effects of process, supply voltage and temperature variations in integrated circuits and its circuit implementation. The disclosed method builds up a detecting-feedback loop with a plurality of target MOS transistors in main circuits, an induction MOS transistor and a current-to-voltage conversion circuit, and performs a body modulation to effectively reduce the parameter fluctuations of the target MOS transistors in a sub-threshold region or a saturated region due to process, supply voltage and temperature variations. A body-modulated circuit achieves the disclosed method with only a few circuit elements, which effectively improves the stability, reliability and product yield of integrated circuits, especially sub-threshold integrated circuits, without significantly increasing the circuit complexity and power consumption. | 2010-12-23 |
20100321095 | SEMICONDUCTOR DEVICE, MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE, SEMICONDUCTOR CHIP AND SYSTEM - A semiconductor device ( | 2010-12-23 |
20100321096 | DETECTION CIRCUIT FOR OVERDRIVE CONDITIONS IN A WIRELESS DEVICE - A detection circuit that can accurately detect signal peak is described. In an exemplary design, the detection circuit includes a bias voltage generator and a MOS transistor. The bias voltage generator provides a bias voltage as a function of temperature. The MOS transistor receives an input RF signal and the bias voltage and provides a rectified signal, which may be a linear function of the input RF signal and may have reduced deviation with temperature due to the bias voltage. The bias voltage generator may generate the bias voltage based on a temperature-dependent current having a slope selected to reduce deviation in the rectified signal with temperature. An offset canceller may cancel a reference voltage from the rectified signal and provide an output signal. A bulk bias generator may generate a bulk voltage for the bulk of the MOS transistor as a function of temperature to improve operating speed at higher temperature. | 2010-12-23 |
20100321097 | POWER SUPPLY CIRCUIT FOR SATA CONTROL CHIP - A power supply circuit includes a first power circuit having a first power output terminal and a first ground output terminal, a second power circuit having a second power output terminal and a second ground output terminal, and a SATA control chip having a first input terminal, a second input terminal, a third input terminal, and a fourth input terminal. The first power circuit comprises a first filter circuit. The second power circuit comprises a second filter circuit. The first power output terminal, first ground output terminal, second power output terminal, and second ground output terminal are electrically coupled to the SATA control chip via the first input terminal, second input terminal, third input terminal, and fourth input terminal respectively. The first and second power circuits provide power to the SATA control chip via the first and second filter circuits respectively. | 2010-12-23 |