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49th week of 2008 patent applcation highlights part 26
Patent application numberTitlePublished
20080297712IPS-LCD device having optical compensation films - An IPS-LCD device includes TFT and CF (color filter) substrates sandwiching therebetween an LC layer, first and second polarizing films sandwiching therebetween the pair of substrates, an optical compensation film having a negative single-axis optical anisotropy and sandwiched between the TFT substrate and the first polarizing film, and a second optical compensation film having a two-axis optical anisotropy and sandwiched between the CF substrate and the second polarizing film. The retardation I1 of the first optical compensation film and the retardation I2 of the second optical compensation film satisfy the following relationships: either 2008-12-04
20080297713Circuit Signal Connection Interface, a Manufacture Method Thereof, and an Electronic Device Using the Same - A circuit signal connection interface, a manufacturing method thereof, and an electronic device using the same are provided. The circuit signal connection interface includes a first signal line and a second signal line juxtaposed to each other, an insulation layer, and a first conductive pad. The first conductive pad electrically connects to the first signal line, and crosses the second signal line. The insulation layer is disposed between the second signal line and the first conductive pad. The electronic device further includes a circuit device including a first conducting bump and a second conducting bump connected to each other in a parallel manner. The first conducting bump electrically connects to a first portion of the first conductive pad while the second conducting bump electrically connects to a second portion of the first conductive pad.2008-12-04
20080297714Active-Matrix Liquid Crystal Display - A display device includes first and second substrates with a liquid crystal layer therebetween, video signal lines and scan lines on one of the substrates, and display electrodes connected to a video signal line through an active device. Pixel areas are defined by the video signal and scan signal lines, and each pixel area has the display electrode, a reference electrode and the active device. Display electrodes are arranged on the first substrate and reference electrodes are arranged the second substrate. A part of the reference electrodes have a plurality layers and is conductive. A sealing material is formed between the substrates and along a periphery thereof and include conductive beads. A connecting terminal is formed from an edge of the first substrate to under the sealing material, and is connected electrically to the reference electrodes thorough the sealing material.2008-12-04
20080297715LIQUID CRYSTAL CELL AND METHOD OF MANUFACTURING THE SAME - Provided are a liquid crystal cell of a liquid crystal display and a method of manufacturing the same, comprising spacers disposed between a color filter substrate and an array substrate, wherein the color filter substrate comprises a central area and a peripheral area, and the spacers provided in the peripheral area are higher than those provided in the central area. The embodiments of the present invention can effectively prevent the occurrence of the gravity mura, the peripheral mura, and the gap mura to improve the display quality.2008-12-04
20080297716EYEGLASSES STRUCTURE - A pair of eyeglasses includes an eyeglasses body, and a light emitting device; the eyeglasses body has a holding room therein, and a covering part thereon, which seals the holding room; the light emitting device is held in the holding room so as to be protected with the covering part; thus, the light emitting device will emit light to prettify the eyeglasses when turned on; furthermore, the wearer of the eyeglasses is prevented from contacting the light emitting device to have accidents.2008-12-04
20080297717Spring hinge structure for eyewear - A spring hinge for an eyewear includes a front frame having an attachment portion and a first articulation hinge element, a temple connected to the front frame and having a hollow housing at an end portion, a cover member with a front bump for covering an outside opening of the temple, and a U-shaped slide member with a second articulation hinge element. The U-shaped slide member is housed in the hollow housing to be slidable along a longitudinal direction of the temple. A compression coil spring is provided between the front bump and the U-shaped member in a compressed state. The temple and the attached portion are rotationally connected at the first and second articulation hinge elements. When the temple is pushed outwardly, the temple is opened from a position perpendicular to the front frame, while the compression coil spring is being compressed.2008-12-04
20080297718Glasses combined with sun/wind screens - A glasses combined with retractable screens is provided. The glasses combined with retractable screens is comprised of a frame of glasses that has void space therein. Small spring re-winders are installed inside of both of legs of the glasses frame and inside of upper glasses frame that surrounds lenses. Screens such as veils, satins, and gauzes etc., are engaged to the re-winders. When a wearer of the glasses of current application is exposed to strong sun light or winds, she/he drags small pulls, which are small metal hooks and attached at one end of the screen, out of the frame and fix them by proper means, such as tie to other pulls or fix them with hair pin. Screens, which came out lower face of legs of the glasses frame, cover cheeks of the wearer and other screen, which comes out of the upper glasses frame, covers upper part of the face of the wearer including hair.2008-12-04
20080297719Glasses combined with sun/wind screens-II - A glasses combined with retractable screens is provided. The glasses combined with retractable screens is comprised of a frame of glasses that has void space therein. Small spring re-winders are installed inside of both of legs of the glasses frame. Screens such as veil, scarf, satin, and gauze etc., are engaged to the re-winders. When a wearer is exposed to strong sun light or winds, the wearer drags small pulls, which are small metal hooks and attached at one end of the screen, out of the frame and fix it to proper means, such as tying it to other pulls that attached to other screen. The screens come out of lower face of the legs of the glasses frame to cover cheeks of the wearer and the screens come out of the upper face of the legs of the glasses frame to cover upper part of the face of the wearer including hair.2008-12-04
20080297720Transparent Optical Component with Cells Separated by Walls - A transparent optical component comprises a set of cells (2008-12-04
20080297721LENS DESIGNS FOR TREATING ASTHENOPIA CAUSED BY VISUAL DEFECTS - The invention provides ophthalmic lenses that provide correction for each of refractive asthenopia, muscular asthenopia and foveal suppression.2008-12-04
20080297722Ophthalmic apparatus - An ophthalmic apparatus capable of performing alignment of the apparatus with respect to an examinee's eye with ease regardless of characteristics of the eye or an environment of the apparatus includes a measurement unit performing examination/measurement of the eye, a projection optical system for projecting an alignment target onto an anterior segment of the eye, an image-pickup optical system for picking up an anterior-segment image with an image of the projected target by a two-dimensional image-pickup element, and a calculation and control unit detecting the target image, and based on the detection result, detecting an alignment condition of the measurement unit with the eye, wherein the calculation and control unit detects two-dimensional luminance distribution in an image obtained by the element, and based on the detection result, changes projection light intensity of light of the target and/or gain of the element so that the target image becomes detectable.2008-12-04
20080297723Correction of Presbyopia Using Adaptive Optics, Wavefront Sensor Eye Alignment and Light Shield, and Associated Methods - Devices, systems, and methods measure, diagnose, and/or treat one or both eyes of a patient. Adaptive optics systems (such as those having a deformable mirror) may be configured to an aspherical or multi-spherical presbyopia-mitigating prescriptive shape to allow objective and/or subjective measurements of a candidate prescription. A plurality of viewing distances allow subjective and/or objective evaluations of performance using a light spot or a test viewing image. Measurements of aberrations at selected viewing conditions (including distances and/or brightness) with correlating pupil sizes may also be provided. Wavefront measurement systems and methods may help position and isolate the eye from ambient light.2008-12-04
20080297724Ophthalmic apparatus and a method to determine power of an intraocular lens - An ophthalmic apparatus capable of obtaining characteristics of a cornea which are suitable for calculating power of an intraocular lens to be injected into an examinee's eye which has undergone refractive surgery comprises an input unit which inputs data on a shape of the cornea after refractive surgery, and a calculation unit having a program which calculates post-operative corneal refractive power based on the post-operative corneal shape, wherein the program determines a non-corrected region based on the post-operative corneal shape, estimates a pre-operative corneal shape in a corrected region by calculating an approximate curve from a corneal shape in the non-corrected region, calculates pre-operative corneal refractive power based on the pre-operative corneal shape, calculates correction refractive power in the refractive surgery based on the post-operative corneal shape and the pre-operative corneal shape, and calculates post-operative corneal refractive power based on the pre-operative corneal refractive power and the correction refractive power.2008-12-04
20080297725Ophthalmic Apparatus - To provide an ophthalmic apparatus by which an examiner can provide assistance such as lifting an examinee's eyelid while easily observing an observation image of an examinee's eye displayed on a monitor. The ophthalmic apparatus has a measurement part including a measurement optical system for examining or measuring the examinee's eye, a fixed support part which supports the measurement part to be movable, an observation optical system provided in the measurement part and having an image-pickup element, for observing an anterior segment of the eye, a monitor which displays an image of the anterior segment picked up by the element, and a holding unit which holds the monitor to be movable with respect to the measurement part or the fixed support part to change a placement position of the monitor between a first position where its screen is approximately vertical and a second position where the screen is approximately horizontal.2008-12-04
20080297726PROJECTION SYSTEM FOR AUTOMOTIVE AND OTHER APPLICATIONS - A projection system includes a projection device and a viewing surface. The projection device is configured to project an image onto the viewing surface. The viewing surface has a first side and a second side. The viewing surface is substantially diffuse reflective when viewed from the first side and substantially transparent when viewed from the second side. The viewing surface can also include a plurality of louvers adapted to attenuate light passing through the viewing surface. The viewing surface and the plurality of louvers can be part of a projection screen. The projection system can be included in a motor vehicle.2008-12-04
20080297727Spotlight projecting apparatus - An apparatus includes a laser projector and a laser beam ECU that is connected to a vehicle communication apparatus for communicating with an information center that provides a guidance service by an operator. According to an operation guidance by the operator, information indicating a switch to be operated is sent from the information center to the laser beam ECU through the vehicle communication apparatus. Then, the laser beam ECU identifies the switch to be operated based on the information and controls the laser projector to direct a laser beam to the switch to be operated.2008-12-04
20080297728Color Projector with a Compact Optical Integrator and Method of Projecting an Image Using the Same - In the color projector (2008-12-04
20080297729Projector - A projector includes: an image creation unit that projects image information upon a screen, comprising a plurality of picture elements that create an image pattern corresponding to the image information; and an illumination unit in which light emitting members are disposed upon a vertical plane with respect to an optical axis which passes through a center of the image creation unit, at equal distances from the optical axis and moreover in different locations.2008-12-04
20080297730Projector - A projector includes: a plurality of light sources for generating lights having different colors; a spatial optical modulator for performing a line-modulation of the lights; wavelength selection filters, disposed between the light sources and the spatial optical modulator, for transmitting or reflecting the lights according to light wavelengths; and a scanner for projecting the light incident from the spatial optical modulator in a line-scan scheme.2008-12-04
20080297731APPARENT SPECKLE REDUCTION APPARATUS AND METHOD FOR MEMS LASER PROJECTION SYSTEM - A laser projection system is disclosed having reduced apparent speckle. The system includes a laser emitting a first beam on an optical element. The optical element emits a second beam incident on a scanner that scans the beam onto a projection screen. The optical element may be an exit pupil expander, delay plate, or have a locally electrically modulated index of refraction. In other embodiments, the laser has a tunable wavelength distribution that is changed for each frame displayed by the projection system to reduce apparent speckle. In still other embodiments, the angular content of a beam incident on a scanner is modulated to produce a time varying speckle pattern.2008-12-04
20080297732LIGHT SOURCE UNIT AND IMAGE PROJECTION APPARATUS HAVING THE SAME - A light source unit and an image projection apparatus are provided. The light source unit includes: a light source part including a light source and a reflective member which reflects light emitted from the light source; and an infrared ray dividing part which is provided corresponding to a shape of the reflective member, is spaced apart from the reflective member, and includes a blocking part to block part of infrared rays generated from the light source and passing through the reflective member and a passing part having an opening formed through the blocking part. The image projection apparatus includes the light source unit and a casing accommodating the light source unit.2008-12-04
20080297733Distortion Detection System and Distortion Detection Method - The present invention relates to a distortion detecting system and a distortion detecting method having a structure for efficiently detecting distortion of a projected image that is projected onto a projected surface by a projector. The distortion detecting system includes a photodetecting apparatus, and an analyzing apparatus. When a reference brightness image is projected onto the projected surface by the projector, the photodetecting apparatus forms the projected image on the projected surface onto the photosensitive surface of the photodetector, and outputs light intensity profile data that indicates a one-dimensional distribution of incident light intensity in each of a first direction and a second direction on an image for inspection formed on the photosensitive surface. The analyzing apparatus detects distortion of the projected image by analyzing the light intensity profile data in the respective first direction and second direction outputted from the photodetecting apparatus based on known information concerning the reference brightness image.2008-12-04
20080297734PROJECTION DISPLAY DEVICE AND METHOD FOR CONTROLLING OFF-BEAMS THEREOF - A projection display device and a method for controlling off-beams thereof are provided. The projection display device includes a case, a light source which is disposed in the case and outputs color light, a digital micro mirror device (DMD) which is disposed in the case, and controls micro mirrors and reflects the color light received from the light source, thereby outputting on-beams and off-beams, and an output unit which is disposed in the case and allows the off-beams output from the DMD to be projected to the outside of the case. Accordingly, the off-beams output from the DMD are output to the outer case through a shutter, prism, color filter, or an integral lens, so that a color of the outer case can be adjusted and also an exterior of the projection display device can be brightened.2008-12-04
20080297735LAMP DRIVING METHOD - A lamp driving method for a projection apparatus is provided. The projection apparatus has a light valve and a lamp. The lamp driving method includes adjusting a brightness of the lamp to different values according to multiple states of the light valve. The lamp driving method improves the energy efficiency of the projection apparatus.2008-12-04
20080297736PROJECTOR AND CONTROL METHOD THEREOF - Disclosed herein is a projector that can be loaded with lamps of a plurality of kinds, each of a plurality of the lamps loadable into the projector being given a lamp serial code formed by arranging lamp information including at least a minimum wattage and a maximum wattage of the lamp and a check sum in predetermined order, the projector including: a lamp power supply for driving the lamp loaded in the projector, the lamp power supply being provided in advance with a plurality of mode ranges each as a range from a minimum wattage to a maximum wattage of output of the lamp power supply, and one predetermined mode range of the plurality of mode ranges being freely set in the lamp power supply; and a control circuit for controlling the lamp power supply.2008-12-04
20080297737PROJECTOR, CONTROL METHOD, CONTROL PROGRAM, AND RECORDING MEDIUM - A projector to form image light by modulating light emitted from a light source according to image information and enlarges and projects the image light includes a projector main body with a light passing opening regulated by a blocking member, a reproduction device, and a control unit to control operation of projector components. The reproduction device reproduces information recorded on inserted recording medium. The control unit includes a startup information receiving section, a closed condition checking section, a medium judging section, and a light source controlling section. The light source controlling section executes immediate light turn-on control when the light passing opening is in the opened condition and image/video media exists.2008-12-04
20080297738Projector - The projector with at least two light sources for emission of light beams and a projection unit for controllable deflection of the light beams onto a projection surface has a control device to control light output of the light sources and a deflection of the projection unit, and also at least one digital delay element and at least one analog delay element for combined time delay of at least one of the light beams and/or deflection of the projection unit.2008-12-04
20080297739PROJECTOR AND DRIVING METHOD OF LIGHT SOURCE FOR PROJECTOR - A projector includes an discharge lamp which has a first electrode and a second electrode and emits light by generating discharge between the first and second electrodes, and a driving system which supplies power by alternating polarities of the first electrode and the second electrode. The driving system is operable in a restoration mode. The driving system melts surface layers of a tip and a surrounding area of the tip extending from a main body of one of the first and second electrodes, and expands a new tip on a tip area of the main body of the one electrode in the restoration mode.2008-12-04
20080297740Projection system and method of use thereof - A projection system and method of use thereof, wherein a computer in electrical communication with at least one projector projects a layout, preferably onto a floor projection surface utilizing short throw lenses, wherein the layout preferably comprises a grid and indicia relating to an exhibitor.2008-12-04
20080297741VIDEO PROJECTION DEVICE - A video projection device has one of a plurality of types of projection lenses replaceably loaded and projects a video on a screen at a fixed position. The video projection device includes: a converter lens which is composed of a plurality of lenses, which is afocal as a whole, and which is detachably provided in front of the projection lens to convert projection magnification; and a gap adjustment mechanism changing a predetermined gap in the converter lens to a setting in accordance with at least one of a projection distance to the screen and the type of the projection lens loaded.2008-12-04
20080297742Projector apparatus - A projector apparatus capable of adjusting a projecting image without the user manually adjusting the image or selecting the past setting information for every usage opportunity. A projector apparatus according to the present invention is a projector apparatus capable of performing automatic adjustment based on past setting information related to before-use adjustment; the projector apparatus including an identification information receiving device for receiving, at an arbitrary installation location, information specific to the installation location; and a CPU for executing the automatic adjustment based on the specific information received by the identification information receiving device.2008-12-04
20080297743EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD - A scanning exposure apparatus exposing a substrate to a pattern of an original through a projection optical system while relatively moving the original and the substrate, includes a substrate stage movable while holding the substrate; a measurement system measuring a position of the substrate in an optical-axis direction of the projection optical system; and a controller relatively moving the original and the substrate while controlling a position of the substrate stage in the optical-axis direction, on the basis of the position of the substrate detected by the measurement system. The controller keeps accelerating the substrate stage up to a starting position of the irradiation of the exposure light for a target shot area on the substrate, and during the acceleration, controls the position of the substrate stage in the optical-axis direction, on the basis of a position of a surface of an exposed shot area, which has been exposed previously.2008-12-04
20080297744Lithographic apparatus and device manufacturing method - An immersion lithographic apparatus is described with a drain configured to remove liquid from a gap between an edge of the substrate and the substrate table on which the substrate is supported. The drain is provided with a means to provide liquid to the drain irrespective of the position of the substrate table and/or a means to saturate gas within the drain. Those measures reduce the variations in heat load due to evaporation of liquid in the drain.2008-12-04
20080297745PROJECTION OBJECTIVE FOR IMMERSION LITHOGRAPHY - In a projection objective provided for imaging a pattern arranged in an object plane of the projection objective into an image plane of the projection objective with the aid of an immersion medium arranged between a last optical element of the projection objective in the light path and the image plane, the last optical element has a transparent substrate and a protective layer system that is fitted to the substrate, is provided for contact with the immersion medium and serves for increasing the resistance of the last optical element to degradation caused by the immersion medium.2008-12-04
20080297746Exposure method, exposure apparatus, and method for producing device - A liquid immersion exposure apparatus in which a substrate is exposed with an exposure beam, includes a projection optical system by which the substrate is exposed to the exposure beam, a first inlet disposed at a first position, which is capable of supplying a first liquid to a space adjacent to a bottom surface of the projection optical system, and a second inlet disposed at a second position which is different from the first position, the second inlet being capable of supplying a second liquid that is different from the first liquid to the space.2008-12-04
20080297747Lithographic Apparatus and Device Manufacturing Method - One or more patterning arrays are mounted to a mounting plate via height adjustment structures that enable the flatness of the active surfaces of the patterning arrays to be controlled. The height adjustment structures may comprise an array of piezoelectric actuators or screws. Alternatively, the backside of the patterning means may be polished to optical flatness and bonded by crystal bonding to an optically flat surface of a rigid mounting body.2008-12-04
20080297748Lithographic apparatus - A substrate table for a lithographic apparatus includes a mask constructed and arranged to prevent exposure of a peripheral exposure region of a substrate on the substrate table. The mask is attached to a moveable carrier. The moveable carrier has a range of movement which at least partially circumnavigates the substrate table.2008-12-04
20080297749IMMERSION LITHOGRAPHIC PROCESS USING A VARIABLE SCAN SPEED - A lithography system and a lithography method is provided for increasing reliability and efficiency of immersion lithography. By varying a scan speed between a wafer and an optical component depending on at least one process parameter during exposure of the wafer, loosening of a fluid meniscus during the relative movement of the optical component and the wafer is avoided.2008-12-04
20080297750Optical axis adjustment device and exposure apparatus using the same - In order to adjust the optical axis of a light beam L2008-12-04
20080297751Exposure method, exposure apparatus, and method for producing device - An exposure method includes measuring coordinates of alignment marks before and after exposing a first wafer to determine a fluctuation amount of a parameter of the alignment; measuring coordinates of alignment marks before exposing a second wafer to determine a parameter of the alignment; and aligning and exposing the second wafer based on a parameter obtained by correcting the parameter with the fluctuation amount determined for the first wafer. A high overlay accuracy can be obtained even when the alignment information is gradually changed, for example, due to the linear expansion and contraction of the substrate during the exposure of the substrate.2008-12-04
20080297752FOCUS SENSITIVE LITHOGRAPHIC APPARATUS, SYSTEMS, AND METHODS - A system includes an illuminator, a mask, and a measurement device. The illuminator includes a light source. The mask includes at least one focus determination pattern having a first pattern portion and an adjacent second pattern portion. The first pattern portion and the second pattern portion have substantially the same width but produce a phase difference in light transmitted through the pattern portions. The measurement device measures a first critical dimension and a second critical dimension of a feature produced on a target by the at least one focus determination pattern. The difference between the first critical dimension and the second critical dimension relates to an amount of defocus and is sensitive to the focus change. The system may also include a feedback control loop where a determination regarding an amount of defocus is used to focus the position of a wafer or a mask or both of them onto the target. Additional apparatus, systems, and methods are disclosed.2008-12-04
20080297753APPARATUS AND METHOD FOR DEFECT-FREE MICROLITHOGRAPHY - An illumination source pupil for microlithography includes a substrate of substantially opaque material having an x-axis and a y-axis defined with respect to the substrate. The substrate has a first arcuate opening therein, and a second arcuate opening therein. The substrate also includes a third opening therein positioned at the intersection of the x-axis and the y-axis.2008-12-04
20080297754Microlithographic projection exposure apparatus - The disclosure relates to a microlithographic projection exposure apparatus, such as are used for the production of large-scale integrated electrical circuits and other microstructured components. The disclosure relates in particular to coatings of optical elements in order to increase or reduce the reflectivity.2008-12-04
20080297755Focusing-device for the radiation from a light source - A focusing-device for the radiation from a light source (2008-12-04
20080297756Transverse electric-field type liquid crystal display device, process of manufacturing the same, and scan-exposing device - A process of manufacturing a liquid crystal display device of transverse electric-field type, wherein a halftone photomask which is used to form a photoresist pattern has a fully light-shielding area preventing UV irradiation of a portion of an active matrix substrate in which a thin-film transistor element is to be formed, so that the photoresist pattern includes a positive resist portion which has a first thickness and which is formed on the above-indicated portion of the substrate. The halftone mask further has a fully light-transmitting area which permits fully UV transmission therethrough to provide the photoresist pattern with a resist-free area which corresponds to a portion of the substrate in which a contact hole serving as a third connection portion connecting an external scanning-line driver circuit and a scanning-line terminal portion through a junction electrode is to be formed. The photoresist pattern also has a positive resist portion which is formed in the other portion of the substrate and which has a second thickness smaller than the first thickness. Also disclosed in a scan-exposing device used in the process is also disclosed.2008-12-04
20080297757Light-Modulating Nano/Micro Scale Aperture Array Device Having Immersion Layer and High Speed Nano Scale Pattern Recording System Using the Same - An optical modulating fine aperture array device is provided. The device includes a spatial light modulation unit provided with at least one light capacity cell arranged in a shape of a matrix, wherein each of the light capacity control cells is capable of individually controlling a degree of an inputted light which passing therethrough, a micro-lens array provided with at least one micro-lens arranged in a shape of a matrix, wherein each of the micro-lenses condenses the light passing through each of the light capacity control cells, a substrate made of an optical transparent material and having a thickness substantially to a focal length of the micro-lens, wherein the micro-lens array is attached to one side of the substrate, an aperture array arranged on other side surface of the substrate and provided with at least one fine aperture, wherein each of the fine apertures discharges light passing through the substrate by condensing the light by each of the micro-lenses and an immersion thin film layer made of an optically transparent dielectric, including and formed to have a predetermined thickness from the aperture array.2008-12-04
20080297758Lithographic support structure - The invention relates to a transfer apparatus for transferring an object (W). the transfer apparatus comprises a gripper (2008-12-04
20080297759Device for Optical Distance Measurement - The invention relates to a device for optical distance measurement, in particular a handheld device, having an emission branch (2008-12-04
20080297760Geodesic Measuring Instrument with a Piezo Drive - In a geodesic measuring instrument (2008-12-04
20080297761Measuring Apparatus - A measuring apparatus (1) for contactless detection of a distance between a surface (2008-12-04
20080297762SYSTEM AND METHOD FOR DETERMINING CROSSWINDS - A system and method for measuring crosswinds includes using a laser to send a signal on a signal path, and receiving response signals backscattered off of aerosols or other materials in the atmosphere along the signal path. Wavefronts of the received responses are perturbated by thermal cell turbulence in the atmosphere that perturbs optical wavefront propagation. Signals backscattered by airborne aerosols at different distances from the laser in the wavefront imager arrive at different times at the wavefront imager. Thus the wavefront perturbations vary with range, and data on the perturbed wavefront may be collected by the wavefront imager. Crosswinds cause movements in the optical perturbations over time, as the thermal cell turbulence moves. By comparing wavefronts of signals sent at different times an amount of thermal cell displacement may be determined at a series of ranges away from the laser and the wavefront imager.2008-12-04
20080297763SINGLE AXIS SCANNING PIV SYSTEM AND METHOD - A single axis scanning PIV system, comprising a laser for generating a laser beam, optics for scanning the laser beam through particles in motion, an optical imager for capturing, images of the particles due to interaction between the laser beam and the particles, and a processor for implementing an algorithm that determines velocity information of the particles based on the images.2008-12-04
20080297764Sensor for determining body parameters - A sensor for measuring at least one body parameter, particularly blood and/or tissue parameters, is used for carrying out the measurements of electromagnetic radiation in the transmission or reflection methods, wherein the sensor uses at least one LED as a source of electromagnetic radiation. At least one photodetector is used as the receiving element. At least one LED is used in a non-invasive measurement of the parameters for ensuring a sufficiently high residual intensity of the radiation received by the photodetector and transmitted or reflected by the blood and/or tissue, wherein the LED has a light intensity of at least 200 millicandela and/or a light yield of at least 2 lumen/watt.2008-12-04
20080297765Apparatus and Method for Determining Trench Parameters - An apparatus includes an evaluating unit and a peak detection unit. The peak detection unit may be configured to determine at least one peak parameter of a peak in a Fourier transformed reflection spectrum of infrared radiation reflected off a sample that may comprise trench structures. The evaluation unit may be configured to determine from the at least one peak parameter and from a correction value containing information about an effective refractive index of the sample, a trench parameter of the trench structures.2008-12-04
20080297766System and method for measuring fluid aeration - An aeration measurement system for a fluid actuation system is disclosed. The aeration measurement system has a container configured to receive fluid, and a light source configured to emit light into the container. The aeration measurement system also has a light receiver that is configured to receive light from the light source while the light is passing through the fluid. The aeration measurement system further has a controller in communication with the light source and light receiver. The controller is configured to determine an amount of aeration in the fluid based on the received light.2008-12-04
20080297767Reducing exposure risk in ultraviolet light-based electro-optical systems - In an electro-optical system for reading ultraviolet (UV) light-responsive indicia illuminated by a UV light beam having a wavelength shorter than visible light, safety techniques are described for reducing exposure to the UV light beam to within safe limits.2008-12-04
20080297768Polarization Mode Dispersion Analyzer - A polarization mode dispersion analyzer having a light source, a sensor, an output phase signal analyzer, and a controller. The light source generates a probe light signal that is intensity modulated and also polarization modulated, the light source being adapted to apply the light signal to a device under test. The sensor generates an output phase signal related to the phase of the intensity modulation of an output optical signal leaving the device under test. The output phase signal analyzer measures an amplitude and phase of at least one frequency component of the output phase signal at a frequency related to the polarization modulation. The controller generates a signal indicative of a differential group delay of the device under test utilizing the measured amplitude and phase. The controller also measures a group delay associated with the device under test.2008-12-04
20080297769Through-container optical evaluation system - An apparatus, and method of its use, to determine a characteristic of a fluid sample contained inside a closed container. The ratio of intensity for detected radiation (e.g., light), subsequent to its transmission through the container's walls and fluid in the container, at each of a reference wavelength and a measurement wavelength is compared to a predetermined value to make a determination of the fluid's characteristic. Desirably, the wavelengths are applied to the same location on the container to minimize a source of signal error. The reference wavelength is selected for its substantial lack of attenuation when transmitted through a known fluid composition. The measurement wavelength is selected for its predictive interaction (e.g., absorption) with the fluid.2008-12-04
20080297770Method for determining physical properties of a multilayered periodic structure - There is provided a method of calculating physical properties of a periodic structure. At least one physical property related to reflectivity or transmittance of a periodic structure is measured, and then, at least one physical property related to reflectivity or transmittance of a virtual periodic structure is calculated to obtain corresponding physical properties from the virtual periodic structure. The at least one calculated physical property is compared with the at least one measured physical property. When the virtual periodic structure is horizontally divided into a plurality of layers, at least three substances can have horizontally repeated periods in the middle layers of the divided structure. In accordance with an embodiment of the present invention, the microscopic formation of the periodic structure including a native oxide layer formed on the periodic structure or an intentionally formed surface coating layer thereon can be nondestructively and accurately tested.2008-12-04
20080297771Optical measuring system with a high-speed optical sensing device abling to sense luminous intensity and chromaticity - A high-speed optical sensing device is provided in the present invention. The high-speed optical sensing device has an optical detector, a lens set, and a beam splitter. The optical detector is utilized for detecting luminous intensity. The lens set is utilized for concentrating light beams toward a color analyzer. The beam splitter is aligned to the illuminating device to be detected and is utilized to separate the light beam generated by the illuminating device to the optical detector and the lens set simultaneously.2008-12-04
20080297772Detecting a Disturbance in the Propagation of Light in an Optical Waveguide - An optical time domain reflectometry apparatus has a laser and light modulator for producing coherent light pulses, each having two sections of higher intensity separated by a gap of lower or substantially zero intensity. As the light pulses propagate along the optical fibre, light is continuously Rayleigh backscattered by inhomogeneities of the optical fibre. A photodetector generates backscatter signals representing the intensity of light Rayleigh backscattered in the optical fibre as each light pulse travels along the optical fibre. The PC uses these backscatter signals to derive a difference signal representing a change dI in intensity between signals generated from two successive pulses. The PC then calculates the Root Mean Square (RMS) of the difference signal averaged over the interval between the two sections of the light pulses. Next, the PC averages the backscatter signal generated from the first of the pulses over the same interval and normalises the RMS difference signal using the averaged signal to obtain a compensated difference signal that depends only on differences in the rate of change of phase of light of the light pulses as they travelled along the waveguide. This is repeated at different wavelengths to allow the compensated difference signal to be adjusted to represent the magnitude of the differences.2008-12-04
20080297773Using Sets of Otdr Receive Fibers with Different Lengths of Marker Events to Verify Optical Fiber connectivity - A test receiver for use with an Optical Time Domain Reflectometer (OTDR), including a first receive fiber having a first attribute, and a second receive fiber having a second attribute different from the first attribute. The attributes may be lengths, marker events, or both. This configuration reduces the number of times an OTDR operator must travel back and forth between cable ends when testing fibers.2008-12-04
20080297774Methods and apparatus for optical analysis of samples in biological sample containers - An apparatus and method for optically analyzing samples in a biological sample container containing samples arranged at different locations on the base of the container. An optical acquisition device is provided comprising a detector and an objective. The position of the upper and lower surfaces of the base at each of the sample locations is determined by a confocal polychromatic displacement sensor. Light is collected from each of the sample locations by adjusting the focal plane to be coincident with, or vertically offset from, the upper surface of the base, as determined from the displacement sensor. This allows for rapid scanning of large numbers of samples in a multi-well plate or other biological sample containers.2008-12-04
20080297775Method and Device for Analysing the Imaging Behavior of an Optical Imaging Element - The invention relates to a method for analyzing the imaging behavior of a first optical imaging element, whereby an object is imaged into an image plane by a second optical imaging element and light in the image plane is detected in a spatially resolved manner, the two optical imaging elements differing in terms of at least one imaging characteristic. Values are determined for the intensity and for at least one second characteristic of the light, said values being then stored in image points, and processed in an emulation step. An emulation image is produced, emulating the imaging of the object by the first optical imaging element, taking into account the influence of the second characteristic. A series of images is produced by dividing a range of values of the second characteristic into subdomains, associating an image with each subdomain, and associating the corresponding intensity value with the image points of each image, in case the value of the second characteristic, associated with the image point, falls in the subdomain associated with the respective image. Otherwise, a pre-determined intensity value is associated therewith. The series of images is converted into a series of intermediate images in the emulation step. A constant value of the second characteristic is used in the emulation for each intermediate image, said value originating from the respective subdomain and differing from the values of the second characteristic for the other intermediate images. The intermediate images are then combined to form an emulation image.2008-12-04
20080297776Cup attaching apparatus - A cup attaching apparatus for attaching a cup as a processing jig to an eyeglass lens, comprises: an illumination optical system comprising an illumination light source and arranged to illuminate the lens from a side of a front surface of the lens by illumination light from the light source; an imaging optical system comprising an imaging device and a retroreflection member placed on an opposite side from the light source with respect to the lens, the imaging optical system being adapted such that the retroreflection member returns the illumination light passing through the lens back to its incoming direction, and the imaging device receives the returned illumination light, and the imaging optical system being adjusted to focus on a point near a surface of the lens; an image processing device adapted to process an image signal from -the- imaging device to detect at least one of a mark point provided on a unifocal lens, a small lens portion of a bifocal lens, and a progressive mark provided on a progressive focal lens and obtain a position of the detected one; and an arithmetic control device adapted to determine an attaching position of the cup based on the position obtained by the image processing device.2008-12-04
20080297777METHOD OF AND APPARATUS FOR DETERMINING GEOMETRICAL DIMENSIONS OF A VEHICLE WHEEL - A method and an apparatus of determining geometrical dimensions of a motor vehicle wheel (rim/tyre assembly) 2008-12-04
20080297778OPTICAL AXIS ADJUSTING DEVICE AND OPTICAL AXIS ADJUSTING METHOD USING THE SAME - An optical axis adjusting device for adjusting an optical axis in an optical head device may include a rotatable part which is turnably mounted on a main base so that the optical head device is capable of being turned with an axis X which is set to be at a spot position of one of the return light beams of the two laser beams. The optical axis adjusting device may include a correcting means for converting an optical axis shift on the light receiving face when the other laser beam is emitted to a non-corresponding optical medium, into an optical axis shift on the light receiving face when the other laser beam is emitted to the other corresponding optical medium.2008-12-04
20080297779INSPECTION DEVICE AND INSPECTION METHOD - An inspection device for inspecting defects of an inspection object including a light source for irradiating a luminous flux to the inspection object; an optical system for guiding reflected light from the inspection object; a photoelectric image sensor having a plurality of photoelectric cells arranged, for converting the light guided to detection signals; a detection signal transfer unit having channels each constituted by a signal correction unit, a converter and an image formation unit, and corresponding to each of a plurality of regions formed by dividing the photoelectric image sensor, respectively; and an image synthesis unit for forming an image of the surface of the object by synthesizing partial images outputted; the inspection device inspecting defects of the object by processing the synthesized image; whereby it becomes possible to correct a detection signal from said photoelectric cell close to a predetermined reference target value.2008-12-04
20080297780Method and Configuration for Detecting Material Defects in Workpieces - A method and a configuration for automatically or visually detecting material defects, in particular cracks, in a workpiece, includes applying a test agent to the workpiece. The test agent contains color pigments which can be excited by using shortwave light. The workpiece is then irradiated with shortwave light from a light source, light emitted by the workpiece is detected by an observer's eye or by a detector, and the signals from the detector are evaluated by an electronic evaluation device in order to determine the material defects. The light source is associated with a first optical interference filter which selects the light emitted by the light source, as a bandpass filter, before the light impinges on the workpiece.2008-12-04
20080297781WAFER SURFACE INSPECTION APPARATUS AND WAFER SURFACE INSPECTION METHOD - A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign particles and to suppress break-down of the foreign particles.2008-12-04
20080297782WAFER SURFACE INSPECTION APPARATUS AND WAFER SURFACE INSPECTION METHOD - A wafer surface inspection method and apparatus of high sensitivity, and free from performance degradation in terms of cleanliness, coordinate repeatability of foreign particles and the like. Gas for cooling is sprayed onto a laser irradiation position on the wafer surface to prevent an increase in temperature of the foreign particles and to suppress break-down of the foreign particles.2008-12-04
20080297783DEFECT INSPECTION SYSTEM AND METHOD OF THE SAME - In an inspection subject substrate, there is a problem that a defect signal is overlooked due to scattered light from a pattern and sensitivity decreases in an irregular circuit pattern part. The inventors propose a defect inspection method, characterized by comprising: an illumination step of guiding light emitted from a light source to a predetermined area on an inspection subject substrate under a plurality of predetermined optical conditions; a detection step of obtaining an electric signal by guiding scattered light components propagating in a predetermined range of azimuthal angle and in a predetermined range of elevation angle to a detector for each of a plurality of scattered light distributions occurred correspondingly to the plurality of optical conditions in the predetermined area; and a defect determination step of determining a defect based on the plurality of electric signals obtained in the detection step.2008-12-04
20080297784Inspection technique for transparent substrates - A method for inspecting a transparent substrate provides an index-matching fluid between an index-matched optical coupler and a surface of the transparent substrate. The method repeats, at two or more positions along the surface of the transparent substrate, steps of illuminating an inspection volume within the transparent substrate by directing a ribbon of light through the optical coupler and into the transparent substrate and detecting scattered light from the inspection volume at a detector that is optically conjugate with the inspection volume.2008-12-04
20080297785APPARATUS FOR SEARCHING FOR AND DETECTING DEFECTS IN PARTS BY ENDOSCOPY - Apparatus for searching for and detecting defects on parts that are substantially inaccessible, being located behind a wall, the apparatus comprising a first endoscope for illumination in visible light and for observation, the first endoscope and pipes for feeding and spraying penetration test substances being housed together in a rod which can be passed through an orifice in the wall in order to examine a part, the apparatus further comprising a second endoscope independent of the first endoscope and the rod for illuminating in ultraviolet light and for observing the portion of the part that has been treated by the penetration test substances.2008-12-04
20080297786INSPECTING DEVICE AND INSPECTING METHOD - An object of the invention is to provide an inspecting method and an inspecting device which can detect a foreign material and a pattern defect at a high speed and a high precision, and can suppress a cost increase, by correcting a photographed image of an inspected subject and regulating a direction of an image sensor photographing the inspected subject without depending only upon a positional displacement correcting control of a stage. In an inspecting method of inspecting an inspected subject mounted on a moving stage by photographing by an image sensor, the method determines a positional displacement amount between a target position and an actual position of the stage which moves for photographing, and carries out a sampling position correction in correspondence to the positional displacement amount, on the basis of a photographed image sampling from a photographed range of the target position which is photographed.2008-12-04
20080297787Optical Array for the Spectrally Selective Identification of Light of a Light Beam - Disclosed is an optical array (2008-12-04
20080297788APPARATUS AND METHOD OF BIOMETRIC DETERMINATION USING SPECIALIZED OPTICAL SPECTROSCOPY SYSTEMS - Methods and apparatuses for performing biometric determinations using optical spectroscopy of tissue. The biometric determinations that are disclosed include determination or verifications of identity, estimation of age, estimation of sex, determination of sample liveness and sample authenticity. The apparatuses disclosed are based upon discrete light sources such as light emitting diodes, laser diodes, vertical cavity surface emitting lasers, and broadband sources with multiple narrow-band optical filters. The multiple light sources are encoded in a manner that the tissue response for each source can be efficiently measured. The light sources are spaced at multiple distances from a detector to contribute differing information to the biometric determination task as do light sources with different wavelength characteristics. Apparatuses are disclosed that incorporate a spectral biometric sensor with a personal electronic device such as cellular telephones, personal digital assistants, wristwatches, electronic fobs for the purpose of providing secure biometric access to protected property.2008-12-04
20080297789Raman Spectral Analysis of Pathogens - A method of ablating a viable biological pathogen in a sample. A viable biological pathogen in a portion of the sample is identified by irradiating the sample; assessing radiation scattered from the sample for radiation that exhibits a Raman shift characteristic of the viable biological pathogen, and delivering an ablating agent to the identified portion.2008-12-04
20080297790WORK HANDLING - Apparatus suitable for use in conjunction with a container in which one or more plants is growing and having associated with it a device for receiving an enquiry signal and automatically responding by transmitting an unique identifier signal the apparatus comprising 2008-12-04
20080297791Reflection characteristic measuring apparatus, and method for calibrating reflection characteristic measuring apparatus - In a reflection characteristic measuring apparatus 2008-12-04
20080297792FLUORESCENCE DETECTING MODULE FOR MICROREACTION AND FLUORESCENCE DETECTING SYSTEM HAVING THE SAME - A fluorescence detecting module for detecting fluorescence in a microchamber and a fluorescence detecting system. The fluorescence detecting module includes a light source irradiating excitation light a collimating lens condensing excitation light irradiated, a dichroic mirror selectively transmitting or reflecting the light according to a wavelength thereof, an objective lens condensing excitation light selected to be irradiated on a sample in a microchamber and condensing fluorescence generated in the microchamber, a focusing lens focusing fluorescence selected by the dichroic mirror, and a fluorescence detecting element detecting fluorescence focused. The fluorescence detecting system for a microfluid chip in which microchambers are arranged, includes a frame, at least one fluorescence detecting module, a holder supporting the fluorescence detecting module, a driver allowing the holder to make a reciprocating motion along a direction in which the microchambers are arranged, and a guide supporting the holder to be moved and guiding the movement.2008-12-04
20080297793SMALL OBJECT IDENTIFYING DEVICE AND ITS IDENTIFYING METHOD - A small object identifying device and its identifying method according to which a large number of small objects can be identified. In one embodiment, the device includes a dispersion region section which disperses a large quantity of several kinds of small objects which are labeled by a combination of the presence/absence or measure of label elements of several kinds. A measuring device distributes and associates kinds of said label elements to two or more measurement points and measures the presence/absence or the measure of said label elements of the kinds which have been associated with respective measurement points. An identifying section associates the measurement results measured at each measurement point to thereby identify said small objects.2008-12-04
20080297794APPARATUS FOR OPTICAL INSPECTION OF WAFERS DURING POLISHING - A measurement system installable within a processing equipment and more specifically within the exit station of a polishing machine. The optical scheme of this system includes a spectrophotometric channel, an imaging channel and also means for holding the wafer under measurement.2008-12-04
20080297795Methods and apparatus for optical analysis of samples in biological sample containers - An apparatus and method for optically analyzing samples in a biological sample container containing samples arranged at different locations on the base of the container. An optical acquisition device is provided comprising a detector and an objective. The position of the upper and lower surfaces of the base at each of the sample locations is determined by a confocal polychromatic displacement sensor. Light is collected from each of the sample locations by adjusting the focal plane to be coincident with, or vertically offset from, the upper surface of the base, as determined from the displacement sensor. This allows for rapid scanning of large numbers of samples in a multi-well plate or other biological sample containers.2008-12-04
20080297796Method for the wavelength calibration of a spectrometer - The invention concerns methods for the wavelength calibration of spectrometers and in particular secondary spectrometers which achieve considerably better calibration accuracies than the conventional peak search methods especially for spectrometers with a relatively large bandwidth. The methods according to the invention are based on the principle of a stepwise relative shift of corresponding measured-value blocks of a model and calibration spectrum where a correlation value is calculated for each shift step. A shift value is determined for each measured-value block at which the correlation value reaches an optimum. A value pair consisting of a position marker of the measured-value block and the associated shift value is determined for each measured-value block. These value pairs represent the design points for fitting to a suitable assignment function. The coefficients obtained in this manner can be used directly as coefficients of a wavelength assignment or be combined with the coefficients of an existing first wavelength assignment in that they for example replace these coefficients or are offset against the coefficients of an existing first wavelength assignment.2008-12-04
20080297797CHAMBER PARTICLE DETECTION SYSTEM - Embodiments of the present invention provide an apparatus and a method for chamber particle source identification. The chamber particle source identification method and apparatus can greatly shorten the time it takes to identify chamber particle source(s). In one embodiment, a chamber particle monitor assembly for a processing chamber is provided. The chamber particle monitor assembly includes at least one laser light source, which can scan laser light in a chamber process volume within the processing chamber. The chamber particle monitor assembly also includes a plurality of laser light collectors, which can collect laser light emitted from the at least one laser light source continuously to monitor particle performance within the processing chamber. The plurality of laser light collectors are placed in the processing chamber such that none of the plurality of laser light collectors share a common axis. The chamber particle monitor assembly further includes an analyzer that analyzes signals representing the laser light collected by the plurality of laser light collectors to provide chamber particle information. The plurality of laser light collectors enables construction of three-dimensional (3-D) images of particle distribution within the processing volume.2008-12-04
20080297798Apparatus and Method to Monitor Particulates - An apparatus, method and system for detecting and quantizing levels of specific airborne particle contamination in areas to be monitored for a plurality of users 2008-12-04
20080297799EVANESCENT WAVE MULTIMODE OPTICAL WAVEGUIDE AND SENSOR WITH HIGH MODE COUPLING - There is provided an evanescent wave multimode optical waveguide sensitive to a chemical species or to a physical parameter. The optical waveguide comprises a core and a cladding having a cladding refractive index lower than that of the core for guiding light to be propagated in the optical waveguide. The cladding defines with the core an optical waveguide providing mode coupling. A chemical indicator is provided in the cladding for causing a variation of the optical absorption of the cladding as a function of the chemical species or the physical parameter. The cladding is interrogated by the evanescent wave of the propagated light. The mode coupling causes unabsorbed light power to be redistributed among the multiple modes while light propagates along the optical waveguide.2008-12-04
20080297800OPTICAL ELEMENT, SENSOR DEVICE, MANUFACTURING METHOD OF OPTICAL ELEMENT, DETECTION ELEMENT, TARGET SUBSTANCE MEASURING DEVICE AND DETECTION METHOD - An optical element 2008-12-04
20080297801METHOD FOR CALCULATING OPTICAL CONSTANTS AND SUBSTRATE PROCESSING SYSTEM - An optical constant calculation method capable of calculating an accurate optical constant of an underlayer film to accurately identify a substrate surface structure. After each of films is layered on a wafer, there are measured the reflectivity of an oxide film under which an organic insulation film is formed and the reflectivity of an organic insulation film exposed after removal by plasma of the oxide film. Based on the measured reflectivities, the optical constant of the organic insulation film after being altered by heat treatment and the optical constant of the organic insulation film after being altered by plasma are calculated.2008-12-04
20080297802DETECTING ELEMENT, DETECTING DEVICE, AND METHOD OF PRODUCING THE DETECTING ELEMENT - A detecting element and a detecting device having high sensitivity, and a production method thereof are provided. The detecting element for detecting a target substance in a sample includes a substrate and a metal structure. The substrate has a pore in which the thickness direction of the substrate corresponds to the depth direction of the pore and in which part of the substrate forming the pore constitutes part of the outer surface of the substrate. The metal structure exists in the pore, and has a ring shape.2008-12-04
20080297803Optical sensor device for detecting wetting - An optical sensor device (2008-12-04
20080297804IMAGING SYSTEM WITH LOW COHERENCE LIGHT SOURCE - An imaging system uses a low coherence light source to image objects at a relatively far distance (at least 10 cm) and/or of a relatively large size (having a dimension of at least 10 cm). An imaging plane is located such that its image path is substantially equal to a reference path that the light follows within the imaging device. The imaging plane has a thickness of about the coherence length of the light. Only light returning from the imaging plane forms part of the image. Light returning on other paths is effectively negated due to a lack of coherence. The imaging plane may be a fixed distance from the imaging system. Alternatively, the imaging plane may be at a variable distance from the imaging system, with the reference path having a changeable length.2008-12-04
20080297805Spectral balancing system and method for reducing noise in fiber optic gyroscopes - Methods and apparatus are provided for reducing output noise of optical gyros. The apparatus includes a sensing system for circulating counter-propagating light beams and producing an output light beam, a coupler having multiple ports and supplying an input light beam to the sensing system, a first detector coupled to the coupler for detecting a rotation rate based on the output light beam, a second detector coupled to the coupler for detecting noise based on the input light beam, and at least one optical device coupled to one of the ports of the coupler. The optical device is configured to reduce a spectral mismatch between the input light beam received by the second detector and the output light beam received by the first detector.2008-12-04
20080297806APPARATUS AND METHOD FOR CONTROLLING RANGING DEPTH IN OPTICAL FREQUENCY DOMAIN IMAGING - Exemplary embodiments of an apparatus are provided. For example, the exemplary apparatus can include at least one first arrangement providing at least one first electro-magnetic radiation to a sample, at least one second electro-magnetic radiation to a first reference and at least one third electro-magnetic radiation to a second reference. A frequency of radiation provided by the first arrangement generally varies over time. The exemplary apparatus may also include at least one second arrangement which is configured to detect a first interference between at least one fourth electro-magnetic radiation associated with the first electro-magnetic radiation and at least one fifth electro-magnetic radiation associated with the second radiation. The second arrangement is also configured to detect a second interference between at least one sixth electro-magnetic radiation associated with the first electro-magnetic radiation and at least one seventh electro-magnetic radiation associated with the third radiation.2008-12-04
20080297807High Precision Code Plates and Geophones - An apparatus and method are disclosed for imaging a diffraction grating with a very high depth of focus, using a highly accurate code plate position measurement system. Positions may be measured to an accuracy of 1 nm or even smaller. The system may be used in fields such as manufacturing integrated circuits, and low- and very-low-frequency geophones, and other low- and very-low-frequency acoustic detectors.2008-12-04
20080297808Optical Sensor For Extreme Environments - An optical sensing probe includes a tube having a tip portion configured for placement in an environment in which conditions are to be sensed and an etalon having a known characteristic disposed proximate the tip portion. The tube also includes a head portion remote from the tip portion containing a light directing element for directing light beams at the etalon and receiving reflected light beams from the etalon wherein the received reflected light beams are used for determining an environmental condition proximate the tip portion. A method for measuring a thickness of the etalon may include directing a light beams at different frequencies at the etalon and receiving the light beams from the etalon. The method may also include identifying conditions of the respective light beams condition received from the etalon and then calculating a first thickness of the etalon responsive to the respective conditions and the known characteristic.2008-12-04
20080297809Optical position measuring arrangement - An optical position measuring arrangement including a source of illumination that generates one or several bundles of illuminating beams, a measuring graduation that is illuminated by the source of illumination so as to generate a periodic fringe pattern of a defined fringe pattern period and a fiber-optical scanning head, wherein the fiber-optical scanning head scans the periodic fringe pattern. A scanning plate is arranged in the fiber-optical scanning head, wherein the scanning plate is matched to the fringe pattern period and scans the periodic fringe pattern. Fringe patterns, which are phase-shifted in relation to each other, are generated within a fringe pattern period in bundles of partial signal beams in the one or several bundles of illuminating beams via a wavelength-dependent local separation, and the bundles of partial signal beams are employed for conversion into position-dependent phase-shifted scanning signals.2008-12-04
20080297810IMAGE FORMING APPARATUS AND CONTROL METHOD THEREOF - An image forming apparatus comprises a scaling correction circuit that corrects scaling in a sub-scanning direction of image data according to scaling data, a screen processing circuit that, of image data whose scaling in the sub-scanning direction has been corrected by the scaling correction circuit, performs screen processing on image data included in a screen area; and an image forming unit that forms an image based on the image data that has been processed by the screen processing circuit. The scaling correction circuit changes the scaling in the sub-scanning direction such that a pixel arrangement of the screen area after the scaling is changed becomes a pixel arrangement of image data before the scaling was changed.2008-12-04
20080297811User interface presentation of page layout output mimics for multiple-image up jobs - An image forming device capable of copying and/or scanning a physical original document is provided. The image forming device includes a User Interface providing an accurate output mimic illustrating a representation of the output sheet having a long edge and a short edge with representations of the one or more original documents arranged in rows and columns thereon each including a long edge, a short edge and an image top for indicating the orientation of the output.2008-12-04
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