28th week of 2021 patent applcation highlights part 54 |
Patent application number | Title | Published |
20210217565 | EXTERNAL SWITCH COUPLER FOR PAD-MOUNTED TRANSFORMERS | 2021-07-15 |
20210217566 | CONTROL DEVICE FOR CONTROLLING MULTIPLE OPERATING CHARACTERISTICS OF AN ELECTRICAL LOAD | 2021-07-15 |
20210217567 | Interrupter Assembly | 2021-07-15 |
20210217568 | GAS CIRCUIT BREAKER | 2021-07-15 |
20210217569 | MAGNETIC REED SWITCH ASSEMBLY AND METHOD | 2021-07-15 |
20210217570 | RELAY DRIVE WITH POWER SUPPLY ECONOMIZER | 2021-07-15 |
20210217571 | ELECTROMAGNETIC RELAY AND CONTROL METHOD THEREOF | 2021-07-15 |
20210217572 | THERMIONIC EMISSION DEVICE AND METHOD FOR MAKING THE SAME | 2021-07-15 |
20210217573 | BIDIRECTIONAL GAS DISCHARGE TUBE | 2021-07-15 |
20210217574 | X-RAY GENERATION DEVICE AND X-RAY ANALYSIS APPARATUS | 2021-07-15 |
20210217575 | SYSTEM FOR GENERATING X-RAY BEAMS FROM A LIQUID TARGET | 2021-07-15 |
20210217576 | Liquid Crystal Polymer for Mounting X-ray Window | 2021-07-15 |
20210217577 | MULTI-BEAM PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING SAME | 2021-07-15 |
20210217578 | Aberration reduction in multipass electron microscopy | 2021-07-15 |
20210217579 | SYSTEM FOR EVACUATING A CHAMBER | 2021-07-15 |
20210217580 | CHARGED PARTICLE BEAM DEVICE | 2021-07-15 |
20210217581 | TEM-BASED METROLOGY METHOD AND SYSTEM | 2021-07-15 |
20210217582 | SYSTEM AND METHOD FOR SCANNING A SAMPLE USING MULTI-BEAM INSPECTION APPARATUS | 2021-07-15 |
20210217583 | PHOTORESIST LAYERS OF SEMICONDUCTOR COMPONENTS INCLUDING ELECTRIC FIELDS, SYSTEM, AND METHODS OF FORMING SAME | 2021-07-15 |
20210217584 | Techniques for a hybrid design for efficient and economical plasma enhanced atomic layer deposition (PEALD) and plasma enhanced chemical vapor deposition (PECVD) | 2021-07-15 |
20210217585 | METHODS AND APPARATUS FOR CARBON COMPOUND FILM DEPOSITION | 2021-07-15 |
20210217586 | SPUTTERING APPARATUS INCLUDING GAS DISTRIBUTION SYSTEM | 2021-07-15 |
20210217587 | PLASMA NON-UNIFORMITY DETECTION | 2021-07-15 |
20210217588 | AZIMUTHAL SENSOR ARRAY FOR RADIO FREQUENCY PLASMA-BASED WAFER PROCESSING SYSTEMS | 2021-07-15 |
20210217589 | UNIFORMITY CONTROL FOR RADIO FREQUENCY PLASMA PROCESSING SYSTEMS | 2021-07-15 |
20210217590 | FAST ARC DETECTING MATCH NETWORK | 2021-07-15 |
20210217591 | PROCESS CHAMBER FOR CYCLIC AND SELECTIVE MATERIAL REMOVAL AND ETCHING | 2021-07-15 |
20210217592 | CHAMBER DESIGN FOR SEMICONDUCTOR PROCESSING | 2021-07-15 |
20210217593 | SECTOR SHUNTS FOR PLASMA-BASED WAFER PROCESSING SYSTEMS | 2021-07-15 |
20210217594 | APPARATUS AND METHOD FOR TREATING SUBSTRATE | 2021-07-15 |
20210217595 | BROAD-BAND SENSORS FOR ELECTROMAGNETIC WAVES | 2021-07-15 |
20210217596 | REFRACTORY METAL PLATES | 2021-07-15 |
20210217597 | IMAGING MASS SPECTROMETRY DATA PROCESSING DEVICE | 2021-07-15 |
20210217598 | System and Method for Loading an Ion Trap | 2021-07-15 |
20210217599 | MASS SPECTROMETRY DATA PROCESSING PROGRAM | 2021-07-15 |
20210217600 | Variable Discriminator Threshold for Ion Detection | 2021-07-15 |
20210217601 | SEPARATION OF LIQUID IN DROPLETS AND SEDIMENTED MATERIAL ENCLOSED THEREIN | 2021-07-15 |
20210217602 | USER EXCHANGEABLE ABLATION CELL INTERFACE TO ALTER LA-ICP-MS PEAK WIDTHS | 2021-07-15 |
20210217603 | PROBE ELECTROSPRAY IONIZATION MASS SPECTROMETRY | 2021-07-15 |
20210217604 | ANALYTICAL DEVICE | 2021-07-15 |
20210217605 | MASS SPECTROMETER | 2021-07-15 |
20210217606 | ION TRAP ARRAY FOR HIGH THROUGHPUT CHARGE DETECTION MASS SPECTROMETRY | 2021-07-15 |
20210217607 | SILICON WAFER FOR AN ELECTRONIC COMPONENT AND METHOD FOR THE PRODUCTION THEREOF | 2021-07-15 |
20210217608 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM | 2021-07-15 |
20210217609 | METHOD OR APPARATUS FOR FORMING THIN FILM ON SUBSTRATE EMPLOYING ATOMIC LAYER EPITAXY METHOD | 2021-07-15 |
20210217610 | Methods for ALD of Metal Oxides on Metal Surfaces | 2021-07-15 |
20210217611 | METHODS OF FORMING SILICON NITRIDE | 2021-07-15 |
20210217612 | FORMING A PLANAR SURFACE OF A III-NITRIDE MATERIAL | 2021-07-15 |
20210217613 | CLEANING METHOD AND APPARATUS | 2021-07-15 |
20210217614 | MULTIPLE PATTERNING WITH SELECTIVE MANDREL FORMATION | 2021-07-15 |
20210217615 | Methods For Enhancing Selectivity In Sam-Based Selective Deposition | 2021-07-15 |
20210217616 | Method of Manufacturing Semiconductor Device | 2021-07-15 |
20210217617 | METHOD OF GROWING CRYSTALLINE LAYERS ON AMORPHOUS SUBSTRATES USING TWO-DIMENSIONAL AND ATOMIC LAYER SEEDS | 2021-07-15 |
20210217618 | METHOD OF FORMING NITRIDE SEMICONDUCTOR FILM | 2021-07-15 |
20210217619 | METHOD FOR MANUFACTURING SILICON CARBIDE BASE BODY, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SILICON CARBIDE BASE BODY, AND SEMICONDUCTOR DEVICE | 2021-07-15 |
20210217620 | SUBSTRATE PROCESSING APPARATUS, SUBSTRATE PROCESSING METHOD, AND STORAGE MEDIUM STORING PROGRAM FOR EXECUTING SUBSTRATE PROCESSING METHOD | 2021-07-15 |
20210217621 | METHOD OF INDIRECT HEATING USING LASER | 2021-07-15 |
20210217622 | Interconnect Structures and Methods and Apparatuses for Forming the Same | 2021-07-15 |
20210217623 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD | 2021-07-15 |
20210217624 | BILAYER HARDMASK FOR DIRECT PRINT LITHOGRAPHY | 2021-07-15 |
20210217625 | METHODS OF CUTTING A FINE PATTERN, METHODS OF FORMING ACTIVE PATTERNS USING THE SAME, AND METHODS OF MANUFACTURING A SEMICONDUCTOR DEVICE USING THE SAME | 2021-07-15 |
20210217626 | ETCHING METHOD AND PLATING SOLUTION | 2021-07-15 |
20210217627 | ETCHING METHOD AND SEMICONDUCTOR MANUFACTURING METHOD | 2021-07-15 |
20210217628 | GAS PHASE ETCH WITH CONTROLLABLE ETCH SELECTIVITY OF Si-CONTAINING ARC OR SILICON OXYNITRIDE TO DIFFERENT FILMS OR MASKS | 2021-07-15 |
20210217629 | METHOD OF MANUFACTURING CIRCUIT BOARD | 2021-07-15 |
20210217630 | LEAD FRAME ROLLING | 2021-07-15 |
20210217631 | ELECTRONIC DEVICE WITH ADAPTIVE VERTICAL INTERCONNECT AND FABRICATING METHOD THEREOF | 2021-07-15 |
20210217632 | SEMICONDUCTOR PACKAGING STRUCTURE WITH BACK-DEPOSITED SHIELDING LAYER AND MANUFACTURING METHOD THEREOF | 2021-07-15 |
20210217633 | SEMICONDUCTOR DEVICE HAVING A SEMICONDUCTOR DIE EMBEDDED IN A MOLDING COMPOUND | 2021-07-15 |
20210217634 | SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2021-07-15 |
20210217635 | SUBSTRATE PROCESSING APPARATUS AND APPARATUS FOR MANUFACTURING INTEGRATED CIRCUIT DEVICE | 2021-07-15 |
20210217636 | Process Chamber and Substrate Processing Apparatus Including the Same | 2021-07-15 |
20210217637 | SUBSTRATE PROCESSING DEVICE AND SUBSTRATE PROCESSING METHOD | 2021-07-15 |
20210217638 | STAGE, FILM-FORMING APPARATUS, AND FILM-PROCESSING APPARATUS | 2021-07-15 |
20210217639 | APPARATUS FOR TRANSPORTING SUBSTRATE AND SYSTEM FOR TREATING SUBSTRATE WITH THE APPARATUS | 2021-07-15 |
20210217640 | Method and Apparatus for Use in Wafer Processing | 2021-07-15 |
20210217641 | CHIP CARRIER DEVICE | 2021-07-15 |
20210217642 | SEMICONDUCTOR DIE CARRIER STRUCTURE | 2021-07-15 |
20210217643 | 3D SEMICONDUCTOR DEVICE AND STRUCTURE | 2021-07-15 |
20210217644 | COMPONENT PRODUCING METHOD, HOLDING FILM, AND HOLDING TOOL FORMING DEVICE | 2021-07-15 |
20210217645 | VACUUM HOLD-DOWN APPARATUS FOR FLATTENING BOWED SEMICONDUCTOR WAFERS | 2021-07-15 |
20210217646 | ELEMENT PICKUP DEVICE, METHOD FOR MANUFACTURING THE SAME AND METHOD FOR USING THE SAME | 2021-07-15 |
20210217647 | SUBSTRATE HOLDING APPARATUS, SUBSTRATE SUCTION DETERMINATION METHOD, SUBSTRATE POLISHING APPARATUS, SUBSTRATE POLISHING METHOD, METHOD OF REMOVING LIQUID FROM UPPER SUFACE OF WAFER TO BE POLISHED, ELASTIC FILM FOR PRESSING WAFER AGAINST POLISHING PAD, SUBSTRATE RELEASE METHOD, AND CONSTANT AMOUNT GAS SUPPLY APPARATUS | 2021-07-15 |
20210217648 | SUSCEPTOR AND CHEMICAL VAPOR DEPOSITION APPARATUS | 2021-07-15 |
20210217649 | EDGE RING AND SUBSTRATE PROCESSING APPARATUS | 2021-07-15 |
20210217650 | PROCESS KIT RING ADAPTOR | 2021-07-15 |
20210217651 | SUBSTRATE PROCESSING APPARATUS | 2021-07-15 |
20210217652 | SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THEREOF | 2021-07-15 |
20210217653 | SELECTIVE ILD DEPOSITION FOR FULLY ALIGNED VIA WITH AIRGAP | 2021-07-15 |
20210217654 | NANOSHEET TRANSISTOR WITH SELF-ALIGNED DIELECTRIC PILLAR | 2021-07-15 |
20210217655 | Deep Trench Isolation And Substrate Connection on SOI | 2021-07-15 |
20210217656 | METHODS AND APPARATUS FOR CLEAVING OF SEMICONDUCTOR SUBSTRATES | 2021-07-15 |
20210217657 | METHOD OF FABRICATING SEMICONDUCTOR DEVICE | 2021-07-15 |
20210217658 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FABRICATING THE SAME | 2021-07-15 |
20210217659 | PASSIVATION LAYER FOR INTEGRATED CIRCUIT STRUCTURE AND FORMING THE SAME | 2021-07-15 |
20210217660 | DEPOSITION SYSTEM AND METHOD USING THE SAME | 2021-07-15 |
20210217661 | TOP VIA WITH DAMASCENE LINE AND VIA | 2021-07-15 |
20210217662 | TOP VIA INTERCONNECT WITH SELF-ALIGNED BARRIER LAYER | 2021-07-15 |
20210217663 | METHOD FOR SERVERING AN EPITAXIALLY GROWN SEMICONDUCTOR BODY, AND SEMICONDUCTOR CHIP | 2021-07-15 |
20210217664 | BACKSIDE METAL PATTERNING DIE SINGULATION SYSTEM AND RELATED METHODS | 2021-07-15 |