23rd week of 2019 patent applcation highlights part 60 |
Patent application number | Title | Published |
20190172671 | SWITCH ARRANGEMENTS FOR MICROELECTROMECHANICAL SYSTEMS | 2019-06-06 |
20190172672 | Switch Cell Having A Semiconductor Switch Element And Micro-Electromechanical Switch Element | 2019-06-06 |
20190172673 | FUSE ELEMENT, FUSE DEVICE, AND PROTECTIVE DEVICE | 2019-06-06 |
20190172674 | ELECTRON EMITTER AND METHOD OF FABRICATING SAME | 2019-06-06 |
20190172675 | Method and System for Focus Adjustment of a Multi-Beam Scanning Electron Microscopy System | 2019-06-06 |
20190172676 | Charged Particle Beam Apparatus and Method for Adjusting Imaging Conditions for the Same | 2019-06-06 |
20190172677 | APPARATUS OF PLURAL CHARGED-PARTICLE BEAMS | 2019-06-06 |
20190172678 | METHOD OF OBTAINING BEAM DEFLECTION SHAPE AND METHOD OF OBTAINING ARRANGEMENT ANGLE OF BLANKING APERTURE ARRAY PLATE | 2019-06-06 |
20190172679 | Adjustable Mass Resolving Aperture | 2019-06-06 |
20190172680 | ENDPOINTING FOR FOCUSED ION BEAM PROCESSING | 2019-06-06 |
20190172681 | X-Ray Spectroscopy in a charged-particle microscope | 2019-06-06 |
20190172682 | ELECTRODE PLATE | 2019-06-06 |
20190172683 | SWITCHING CIRCUIT | 2019-06-06 |
20190172684 | MECHANICAL SUPPRESSION OF PARASITIC PLASMA IN SUBSTRATE PROCESSING CHAMBER | 2019-06-06 |
20190172685 | SYNCHRONIZATION WITH A BIAS SUPPLY IN A PLASMA PROCESSING SYSTEM | 2019-06-06 |
20190172686 | METHODS FOR FORMING A METAL SILICIDE INTERCONNECTION NANOWIRE STRUCTURE | 2019-06-06 |
20190172687 | RING-SHAPED ELECTRODE | 2019-06-06 |
20190172688 | SUPPORT ASSEMBLY AND SUPPORT ASSEMBLY ASSEMBLING METHOD | 2019-06-06 |
20190172689 | EXHAUST DEVICE, PROCESSING APPARATUS, AND EXHAUSTING METHOD | 2019-06-06 |
20190172690 | SUBSTRATE PROCESSING APPARATUS | 2019-06-06 |
20190172691 | HEATING CARRIER DEVICE FOR USE ON SPUTTERING CATHODE ASSEMBLY | 2019-06-06 |
20190172692 | OFFLINE MASS CALIBRATION | 2019-06-06 |
20190172693 | COMPACT MASS SPECTROMETER | 2019-06-06 |
20190172694 | SIGNAL PROCESSING METHOD AND SYSTEM BASED ON TIME-OF-FLIGHT MASS SPECTROMETRY AND ELECTRONIC APPARATUS | 2019-06-06 |
20190172695 | APPARATUS AND METHOD FOR PROCESSING OF MASS SPECTROMETRY DATA | 2019-06-06 |
20190172696 | SIMS Spectrometry Technique | 2019-06-06 |
20190172697 | METHOD AND SYSTEM FOR PRODUCING LASER ABLATION PLUMES WITHOUT ABLATION RECOIL PRODUCTS | 2019-06-06 |
20190172698 | DISCHARGE LAMP | 2019-06-06 |
20190172699 | Low-pressure discharge lamp | 2019-06-06 |
20190172700 | FILM DEPOSITION METHOD OF DEPOSITING FILM AND FILM DEPOSITION APPARATUS | 2019-06-06 |
20190172701 | UNIFORM DEPOSITION OF SiOC ON DIELECTRIC AND METAL SURFACES | 2019-06-06 |
20190172702 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | 2019-06-06 |
20190172703 | SUBSTRATE PROCESSING METHOD | 2019-06-06 |
20190172704 | ROBUST HIGH PERFORMANCE LOW HYDROGEN SILICON CARBON NITRIDE (SiCNH) DIELECTRICS FOR NANO ELECTRONIC DEVICES | 2019-06-06 |
20190172705 | PROCESS FOR DEPOSITION OF TITANIUM OXYNITRIDE FOR USE IN INTEGRATED CIRCUIT FABRICATION | 2019-06-06 |
20190172706 | PROCESS OF FORMING SILICON NITRIDE (SIN) FILM AND SEMICONDUCTOR DEVICE PROVIDING SIN FILM | 2019-06-06 |
20190172707 | METHOD FOR MANUFACTURING A SEMICONDUCTOR DEVICE AND FILM DEPOSITION APPARATUS | 2019-06-06 |
20190172708 | METHODS FOR FORMING DOPED SILICON OXIDE THIN FILMS | 2019-06-06 |
20190172709 | SYSTEMS AND METHOD FOR INTEGRATED DEVICES ON AN ENGINEERED SUBSTRATE | 2019-06-06 |
20190172710 | METHOD OF FILLING RECESS AND PROCESSING APPARATUS | 2019-06-06 |
20190172711 | KESTERITE MATERIAL OF CZTS, CZTSe OR CZTSSe TYPE | 2019-06-06 |
20190172712 | CLEANING METHOD | 2019-06-06 |
20190172713 | LASER CRYSTALLIZING APPARATUS | 2019-06-06 |
20190172714 | HIGHLY ETCH SELECTIVE AMORPHOUS CARBON FILM | 2019-06-06 |
20190172715 | MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE WITH EFFICIENT EDGE STRUCTURE | 2019-06-06 |
20190172716 | HYDROGENATION AND NITRIDIZATION PROCESSES FOR MODIFYING EFFECTIVE OXIDE THICKNESS OF A FILM | 2019-06-06 |
20190172717 | METHODS OF FABRICATING SEMICONDUCTOR DEVICES | 2019-06-06 |
20190172718 | METHOD FOR FORMING VERTICAL SPACERS FOR SPACER-DEFINED PATTERNING | 2019-06-06 |
20190172719 | Method of Forming A Semiconductor Device Including A Pitch Multiplication | 2019-06-06 |
20190172720 | Chemical Mechanical Polishing (CMP) of Cobalt-Containing Substrate | 2019-06-06 |
20190172721 | INSULATOR SEMICONDUCTOR DEVICE-STRUCTURE | 2019-06-06 |
20190172722 | METHOD OF FORMING SEMICONDUCTOR DEVICE | 2019-06-06 |
20190172723 | Methods For Gapfill In High Aspect Ratio Structures | 2019-06-06 |
20190172724 | SEMICONDUCTOR DEVICE PACKAGES AND RELATED METHODS | 2019-06-06 |
20190172725 | High Density, Tight Array Copper Pillar Interconnect Method and Package | 2019-06-06 |
20190172726 | APPARATUS AND METHODS FOR CREATING A THERMAL INTERFACE BOND BETWEEN A SEMICONDUCTOR DIE AND A PASSIVE HEAT EXCHANGER | 2019-06-06 |
20190172727 | APPARATUS AND METHODS FOR CREATING A THERMAL INTERFACE BOND BETWEEN A SEMICONDUCTOR DIE AND A PASSIVE HEAT EXCHANGER | 2019-06-06 |
20190172728 | METHOD AND APPARATUS FOR WAFER OUTGASSING CONTROL | 2019-06-06 |
20190172729 | SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTING WAFER | 2019-06-06 |
20190172730 | SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTING WAFER | 2019-06-06 |
20190172731 | SYSTEMS FOR INTEGRATED DECOMPOSITION AND SCANNING OF A SEMICONDUCTING WAFER | 2019-06-06 |
20190172732 | DETERMINATION METHOD AND SUBSTRATE PROCESSING EQUIPMENT | 2019-06-06 |
20190172733 | SUBSTRATE PROCESSING METHOD AND SUBSTRATE PROCESSING APPARATUS | 2019-06-06 |
20190172734 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD | 2019-06-06 |
20190172735 | APPARATUS AND METHOD FOR PROCESSING WAFER | 2019-06-06 |
20190172736 | APPARATUS AND METHOD FOR SECURING COMPONENTS OF AN INTEGRATED CIRCUIT | 2019-06-06 |
20190172737 | FUME DETERMINATION METHOD, SUBSTRATE PROCESSING METHOD, AND SUBSTRATE PROCESSING EQUIPMENT | 2019-06-06 |
20190172738 | AUTO-CALIBRATION TO A STATION OF A PROCESS MODULE THAT SPINS A WAFER | 2019-06-06 |
20190172739 | SEMICONDUCTOR WAFER PLACEMENT POSITION DETERMINATION METHOD AND SEMICONDUCTOR EPITAXIAL WAFER PRODUCTION METHOD | 2019-06-06 |
20190172740 | MODULAR PRESSING DEVICE CAPABLE OF GENERATING STAGE DOWNWARD FORCES AND ELECTRONIC DEVICE TESTING APPARATUS COMPRISING THE SAME | 2019-06-06 |
20190172741 | SUBSTRATE TREATMENT APPARATUS, METHOD FOR INSTALLING SUBSTRATE TREATMENT APPARATUS, AND COMPUTER STORAGE MEDIUM | 2019-06-06 |
20190172742 | TEACHING METHOD | 2019-06-06 |
20190172743 | METHOD TO PROVIDE CONSISTENT ELECTROSTATIC CLAMPING THROUGH REAL TIME CONTROL OF ELECTROSTATIC CHARGE DEPOSITION IN AN ELECTROSTATIC CHUCK | 2019-06-06 |
20190172744 | TCB BOND TIP DESIGN TO MITIGATE TOP DIE WARPAGE AND SOLDER STRETCHING ISSUE | 2019-06-06 |
20190172745 | SUCTION DEVICE, CARRY-IN METHOD, CARRIER SYSTEM AND EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD | 2019-06-06 |
20190172746 | SUBSTRATE TRANSPORT APPARATUS | 2019-06-06 |
20190172747 | MODULATING THE MICROSTRUCTURE OF METALLIC INTERCONNECT STRUCTURES | 2019-06-06 |
20190172748 | FORMING SELF-ALIGNED VIAS AND AIR-GAPS IN SEMICONDUCTOR FABRICATION | 2019-06-06 |
20190172749 | WAFER PROCESSING METHOD | 2019-06-06 |
20190172750 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME, AND ELECTRONIC APPARATUS | 2019-06-06 |
20190172751 | METHOD FOR CONTROLLING TRANSISTOR DELAY OF NANOWIRE OR NANOSHEET TRANSISTOR DEVICES | 2019-06-06 |
20190172752 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | 2019-06-06 |
20190172753 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | 2019-06-06 |
20190172754 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOF | 2019-06-06 |
20190172755 | METHOD FOR INCORPORATING MULTIPLE CHANNEL MATERIALS IN A COMPLIMENTARY FIELD EFFECTIVE TRANSISTOR (CFET) DEVICE | 2019-06-06 |
20190172756 | HYBRID HIGH-VOLTAGE LOW-VOLTAGE FINFET DEVICE | 2019-06-06 |
20190172757 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME | 2019-06-06 |
20190172758 | EVALUATION METHOD AND MANUFACTURING METHOD OF SiC EPITAXIAL WAFER | 2019-06-06 |
20190172759 | METHOD OF DETECTING A POSSIBLE THINNING OF A SUBSTRATE OF AN INTEGRATED CIRCUIT VIA THE REAR FACE THEREOF, AND ASSOCIATED DEVICE | 2019-06-06 |
20190172760 | MICRO LIGHTING DEVICE | 2019-06-06 |
20190172761 | PIXEL STRUCTURE | 2019-06-06 |
20190172762 | METHOD OF INTEGRATED CIRCUIT (IC) CHIP FABRICATION | 2019-06-06 |
20190172763 | SEMICONDUCTOR DEVICE INCLUDING SENSOR AND DRIVING TERMINALS SPACED AWAY FROM THE SEMICONDUCTOR DEVICE CASE WALL | 2019-06-06 |
20190172764 | INTEGRATED CHIP SCALE PACKAGES | 2019-06-06 |
20190172765 | CIRCUIT BOARD AND SEMICONDUCTOR MODULE | 2019-06-06 |
20190172766 | SEMICONDUCTOR PACKAGE WITH A WIRE BOND MESH | 2019-06-06 |
20190172767 | APPARATUS AND MECHANISMS FOR REDUCING WARPAGE AND INCREASING SURFACE MOUNT TECHNOLOGY YIELDS IN HIGH PERFORMANCE INTEGRATED CIRCUIT PACKAGES | 2019-06-06 |
20190172768 | ACTIVE ESTER RESIN AND CURED PRODUCT THEREOF | 2019-06-06 |
20190172769 | SEMICONDUCTOR DIE WITH IMPROVED RUGGEDNESS | 2019-06-06 |
20190172770 | Semiconductor Device with Integrated pn Diode Temperature Sensor | 2019-06-06 |