21st week of 2018 patent applcation highlights part 51 |
Patent application number | Title | Published |
20180144903 | Inter-Electrode Gap Variation Methods for Compensating Deposition Non-Uniformity | 2018-05-24 |
20180144904 | PHOSPHOROUS TRIFLUORIDE CO-GAS FOR CARBON IMPLANTS | 2018-05-24 |
20180144905 | MULTI CHARGED PARTICLE BEAM WRITING APPARATUS AND MULTI CHARGED PARTICLE BEAM WRITING METHOD | 2018-05-24 |
20180144906 | Methods for Processing Substrates Using Small Plasma Chambers | 2018-05-24 |
20180144907 | THERMAL REPEATABILITY AND IN-SITU SHOWERHEAD TEMPERATURE MONITORING | 2018-05-24 |
20180144908 | SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND BAFFLE STRUCTURE OF THE SUBSTRATE PROCESSING APPARATUS | 2018-05-24 |
20180144909 | PLASMA ETCHING DEVICE WITH PLASMA ETCH RESISTANT COATING | 2018-05-24 |
20180144910 | METHOD FOR TREATING THE SURFACE OF A MOVING FILM, AND FACILITY FOR IMPLEMENTING SAID METHOD | 2018-05-24 |
20180144911 | METHOD AND SYSTEM OF MONITORING AND CONTROLLING DEFORMATION OF A WAFER SUBSTRATE | 2018-05-24 |
20180144912 | SPUTTERING TARGET | 2018-05-24 |
20180144913 | TUBULAR TARGET | 2018-05-24 |
20180144914 | METHOD OF MANUFACTURING ELECTRON MULTIPLIER BODY, PHOTOMULTIPLIER TUBE, AND PHOTOMULTIPLIER | 2018-05-24 |
20180144915 | CONDUCTIVE OXIDE-COATED ELECTRODES VIA NANO- OR MICRO-STRUCTURED MATERIALS | 2018-05-24 |
20180144916 | LOCK MASS LIBRARY FOR INTERNAL CORRECTION | 2018-05-24 |
20180144917 | COMPACT MASS SPECTROMETER | 2018-05-24 |
20180144918 | TECHNIQUES FOR MASS ANALYZING A COMPLEX SAMPLE | 2018-05-24 |
20180144919 | SYSTEMS AND METHODS FOR DETECTION AND QUANTIFICATION OF SELENIUM AND SILICON IN SAMPLES | 2018-05-24 |
20180144920 | OVERSAMPLED TIME OF FLIGHT MASS SPECTROMETRY | 2018-05-24 |
20180144921 | MULTI-REFLECTING TOF MASS SPECTROMETER | 2018-05-24 |
20180144922 | CAPACITORS AND RADIO FREQUENCY GENERATORS AND OTHER DEVICES USING THEM | 2018-05-24 |
20180144923 | METHOD FOR CHARACTERISING IONS | 2018-05-24 |
20180144924 | GAS DISCHARGE LAMP AND A DEVICE FOR CONTROLLING THE TEMPERATURE THEREOF | 2018-05-24 |
20180144925 | DRIVE METHOD AND DRIVE CIRCUIT FOR LIGHT-EMITTING DEVICE USING GAS DISCHARGE, AND ULTRAVIOLET IRRADIATION DEVICE | 2018-05-24 |
20180144926 | ADVANCED INTERCONNECT WITH AIR GAP | 2018-05-24 |
20180144927 | SEMICONDUCTOR STRUCTURES COMPRISING SILICON NITRIDE AND RELATED METHODS | 2018-05-24 |
20180144928 | Orientation Layer for Directed Self-Assembly Patterning Process | 2018-05-24 |
20180144929 | METHOD FOR FORMING HIGH ASPECT RATIO PATTERNING STRUCTURE | 2018-05-24 |
20180144930 | Amorphous Boron Nitride Dielectric | 2018-05-24 |
20180144931 | METHOD OF FORMING SILICON-CONTAINING FILM | 2018-05-24 |
20180144932 | DEPOSITION APPARATUS AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME | 2018-05-24 |
20180144933 | Method for Producing a Nitride Compound Semiconductor Device | 2018-05-24 |
20180144934 | COMPOSITIONALLY MATCHED MOLECULAR SOLDERS FOR SEMICONDUCTORS | 2018-05-24 |
20180144935 | Method for Formation of a Transition Metal Dichalcogenide (TMDC) Material Layer | 2018-05-24 |
20180144936 | Assistant Pattern for Measuring Critical Dimension of Main Pattern In Semiconductor Manufacturing | 2018-05-24 |
20180144937 | METHODS OF PATTERNING A TARGET LAYER | 2018-05-24 |
20180144938 | METHOD OF MANUFACTURING SEMINCONDUCTOR DEVICE | 2018-05-24 |
20180144939 | DOPANT INTRODUCTION METHOD AND THERMAL TREATMENT METHOD | 2018-05-24 |
20180144940 | PHOSPHINE CO-GAS FOR CARBON IMPLANTS | 2018-05-24 |
20180144941 | Methods and Apparatus for Fabricating IC Chips with Tilted Patterning | 2018-05-24 |
20180144942 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING FORMING PROTECTIVE FILM WITHIN RECESS IN SUBSTRATE | 2018-05-24 |
20180144943 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | 2018-05-24 |
20180144944 | METHODS OF FORMING PATTERNS USING IMPRINT PROCESS | 2018-05-24 |
20180144945 | PLACING UNIT AND PLASMA PROCESSING APPARATUS | 2018-05-24 |
20180144946 | METHOD OF PLASMA DISCHARGE IGNITION TO REDUCE SURFACE PARTICLES | 2018-05-24 |
20180144947 | PHOTOMASK MANUFACTURING METHOD | 2018-05-24 |
20180144948 | METHOD FOR ETCHING LAYER TO BE ETCHED | 2018-05-24 |
20180144949 | System and Method For Selective Nitride Etch | 2018-05-24 |
20180144950 | BACKPLANE FOR DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | 2018-05-24 |
20180144951 | METHOD FOR CREATING THROUGH-CONNECTED VIAS AND CONDUCTORS ON A SUBSTRATE | 2018-05-24 |
20180144952 | SEMICONDUCTOR PACKAGE WITH CANTILEVER PADS | 2018-05-24 |
20180144953 | SUBSTRATE PROCESSING APPARATUS, EXHAUST SYSTEM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2018-05-24 |
20180144954 | DRYING HIGH ASPECT RATIO FEATURES | 2018-05-24 |
20180144955 | RAPID HEAT TREATMENT APPARATUS | 2018-05-24 |
20180144956 | METHOD FOR COOLING SEMICONDUCTOR MANUFACTURING APPARATUS AND SUBSTRATE SUPPORT APPARATUS | 2018-05-24 |
20180144957 | Diodes Offering Asymmetric Stability During Fluidic Assembly | 2018-05-24 |
20180144958 | METHOD AND APPARATUS FOR EMBEDDING SEMICONDUCTOR DEVICES | 2018-05-24 |
20180144959 | ELECTROSTATIC CHUCKING FORCE MEASUREMENT TOOL FOR PROCESS CHAMBER CARRIERS | 2018-05-24 |
20180144960 | NEXT GENERATION WARPAGE MEASUREMENT SYSTEM | 2018-05-24 |
20180144961 | INSPECTION DEVICE AND SUBSTRATE PROCESSING APPARATUS | 2018-05-24 |
20180144962 | WAFER SUSCEPTOR | 2018-05-24 |
20180144963 | METHOD AND APPARATUS FOR ASSEMBLING AND TESTING A MULTI-INTEGRATED CIRCUIT PACKAGE | 2018-05-24 |
20180144964 | Overhead Manufacturing, Processing and Storage System | 2018-05-24 |
20180144965 | BUFFER STATION WITH SINGLE EXIT-FLOW DIRECTION | 2018-05-24 |
20180144966 | EXCHANGE AND FLIP CHAMBER DESIGN FOR HETEROJUNCTION SOLAR CELL FORMATION | 2018-05-24 |
20180144967 | METHOD FOR ALIGNING SUBSTRATES BEFORE BONDING | 2018-05-24 |
20180144968 | SUBSTRATE PROCESSING APPARATUS ARRANGED IN PROCESS CHAMBER AND OPERATING METHOD THEREOF | 2018-05-24 |
20180144969 | HYBRID SUBSTRATE CARRIER | 2018-05-24 |
20180144970 | Semiconductor Device, Method, and Tool of Manufacture | 2018-05-24 |
20180144971 | PATTERN ARRAY DIRECT TRANSFER APPARATUS AND METHOD THEREFOR | 2018-05-24 |
20180144972 | LTPS ARRAY SUBSTRATE, METHOD FOR MANUFACTURING THE SAME, AND DISPLAY DEVICE | 2018-05-24 |
20180144973 | Electromigration Improvement Using Tungsten For Selective Cobalt Deposition On Copper Surfaces | 2018-05-24 |
20180144974 | Method of Wafer Thinning and Realizing Backside Metal Structures | 2018-05-24 |
20180144975 | METHOD FOR PRODUCING SOI WAFER | 2018-05-24 |
20180144976 | POST SPACER SELF-ALIGNED CUTS | 2018-05-24 |
20180144977 | STAIRCASE ENCAPSULATION IN 3D NAND FABRICATION | 2018-05-24 |
20180144978 | COMPOSITE CONTACT PLUG STRUCTURE AND METHOD OF MAKING SAME | 2018-05-24 |
20180144979 | SELF-ALIGNED LITHOGRAPHIC PATTERNING | 2018-05-24 |
20180144980 | Deposition And Treatment Of Films For Patterning | 2018-05-24 |
20180144981 | DEVICE CHIP PACKAGE MANUFACTURING METHOD | 2018-05-24 |
20180144982 | SEMICONDUCTOR DEVICES AND METHODS FOR MANUFACTURING SEMICONDUCTOR DEVICES | 2018-05-24 |
20180144983 | DEVICE WAFER PROCESSING METHOD | 2018-05-24 |
20180144984 | SEMICONDUCTOR CHIP HAVING ON-CHIP NOISE PROTECTION CIRCUIT | 2018-05-24 |
20180144985 | CMOS PROCESS-DEPENDENT NEAR-THRESHOLD VOLTAGE REGULATION | 2018-05-24 |
20180144986 | FIN CUT PROCESS AND FIN STRUCTURE | 2018-05-24 |
20180144987 | FIN FIELD-EFFECT TRANSISTOR AND FABRICATION METHOD THEREOF | 2018-05-24 |
20180144988 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | 2018-05-24 |
20180144989 | Guard Rings Including Semiconductor Fins and Regrown Regions | 2018-05-24 |
20180144990 | METHOD OF FINFET CONTACT FORMATION | 2018-05-24 |
20180144991 | CO-INTEGRATION OF TENSILE SILICON AND COMPRESSIVE SILICON GERMANIUM | 2018-05-24 |
20180144992 | METHOD OF FABRICATION OF A FET TRANSISTOR HAVING AN OVERLAPPED GATE | 2018-05-24 |
20180144993 | DEVICES AND METHODS RELATED TO RADIO-FREQUENCY SWITCHES HAVING IMPROVED ON-RESISTANCE PERFORMANCE | 2018-05-24 |
20180144994 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF | 2018-05-24 |
20180144995 | OPTICAL INSPECTION APPARATUS AND METHOD AND METHOD OF FABRICATING SEMICONDUCTOR DEVICE USING THE APPARATUS | 2018-05-24 |
20180144996 | SYSTEM, METHOD AND NON-TRANSITORY COMPUTER READABLE MEDIUM FOR TUNING SENSITIVIES OF, AND DETERMINNG A PROCESS WINDOW FOR, A MODULATED WAFER | 2018-05-24 |
20180144997 | SAMPLE WITH IMPROVED EFFECT OF BACKSIDE POSITIONING, FABRICATION METHOD AND ANALYSIS METHOD THEREOF | 2018-05-24 |
20180144998 | INSPECTION APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME | 2018-05-24 |
20180144999 | METHOD OF SEMICONDUCTOR WAFER BONDING AND SYSTEM THEREOF | 2018-05-24 |
20180145000 | ION IMPLANTATION METHOD AND ION IMPLANTATION APPARATUS | 2018-05-24 |
20180145001 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | 2018-05-24 |
20180145002 | DIE EDGE INTEGRITY MONITORING SYSTEM | 2018-05-24 |