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14th week of 2021 patent applcation highlights part 43
Patent application numberTitlePublished
20210104370FUSE CUTOUT COVER WITH VARIABLE ROOFS FOR DIFFERENT FUSE CUTOUTS2021-04-08
20210104371BREAKER AND SAFETY CIRCUIT EQUIPPED WITH THE SAME2021-04-08
20210104372Three Phase Surge Protection Device2021-04-08
20210104373CATHODE ASSEMBLY COMPONENT FOR X-RAY IMAGING2021-04-08
20210104374MULTI-SOURCE ION BEAM ETCH SYSTEM2021-04-08
20210104375LOW KEV ION BEAM IMAGE RESTORATION BY MACHINE LEARNING FOR OBJECT LOCALIZATION2021-04-08
20210104376DEVICE FOR PROVIDING ELECTRONS AND METHOD FOR MAKING THE SAME2021-04-08
20210104377ION BEAM PROCESSING APPARATUS, ELECTRODE ASSEMBLY, AND METHOD OF CLEANING ELECTRODE ASSEMBLY2021-04-08
20210104378APPARATUS AND METHOD FOR REDUCTION OF PARTICLE CONTAMINATION BY BIAS VOLTAGE2021-04-08
20210104379EXPOSURE DEVICE2021-04-08
20210104380ION BEAM SPUTTERING APPARATUS AND METHOD2021-04-08
20210104381GAS SUPPLY ASSEMBLY AND SUBSTRATE PROCESSING APPARATUS INCLUDING THE SAME2021-04-08
20210104382PLASMA ETCHING METHOD AND SEMICONDUCTOR DEVICE FABRICATION METHOD INCLUDING THE SAME2021-04-08
20210104383PLASMA PROCESSING APPARATUS2021-04-08
20210104384INTEGRATED ELECTRODE AND GROUND PLANE FOR A SUBSTRATE SUPPORT2021-04-08
20210104385SUBSTRATE SUPPORT PEDESTAL AND PLASMA PROCESSING APPARATUS2021-04-08
20210104386STAGE AND PLASMA PROCESSING APPARATUS2021-04-08
20210104387SYSTEM AND METHOD FOR REMOTE SENSING A PLASMA2021-04-08
20210104388SYSTEM AND METHOD FOR PHOTOMULTIPLIER TUBE IMAGE CORRECTION2021-04-08
20210104389THERMIONIC WAVE GENERATOR (TWG)2021-04-08
20210104390MASS SPECTRAL ANALYSIS OF LARGE MOLECULES2021-04-08
20210104391INORGANIC MASS SPECTROMETER2021-04-08
20210104392APPARATUSES FOR OPTICAL AND MASS SPECTROMETRY DETECTION2021-04-08
20210104393SYSTEMS AND METHODS FOR IONIZING A SURFACE2021-04-08
20210104394MULTIPLE BEAM SECONDARY ION MASS SPECTROMETRY DEVICE2021-04-08
20210104395METHOD OF MANUFACTURING HIGH ELECTRON MOBILITY TRANSISTOR AND HIGH ELECTRON MOBILITY TRANSISTOR2021-04-08
20210104396CONFORMAL AND SMOOTH TITANIUM NITRIDE LAYERS AND METHODS OF FORMING THE SAME2021-04-08
20210104397SMOOTH TITANIUM NITRIDE LAYERS AND METHODS OF FORMING THE SAME2021-04-08
20210104398Planarizing Process and Composition2021-04-08
20210104399METHODS FOR FORMING A TOPOGRAPHICALLY SELECTIVE SILICON OXIDE FILM BY A CYCLICAL PLASMA-ENHANCED DEPOSITION PROCESS2021-04-08
20210104400EDGE EXCLUSION APPARATUS AND METHODS OF USING THE SAME2021-04-08
20210104401NOVEL METHOD FOR GATE INTERFACE ENGINEERING2021-04-08
20210104402SONOS ONO STACK SCALING2021-04-08
20210104403Process and Manufacture of Low-Dimensional Materials Supporting Both Self-Thermalization and Self-Localization2021-04-08
20210104404SEMICONDUCTOR DEVICE STRUCTURE WITH A FINE PATTERN2021-04-08
20210104405SUBSTRATE BONDING APPARATUS2021-04-08
20210104406Electrode with Alloy Interface2021-04-08
20210104407SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING2021-04-08
20210104408PROCESSING METHOD OF WAFER2021-04-08
20210104409METHOD OF FORMING PATTERNS2021-04-08
20210104410THREE-DIMENSIONAL SEMICONDUCTOR FABRICATION2021-04-08
20210104411ETCHING SOLUTION, AND METHOD OF PRODUCING SEMICONDUCTOR DEVICE2021-04-08
20210104412SUBSTRATE PROCESSING METHOD, SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING SYSTEM2021-04-08
20210104413METHOD OF ETCHING SILICON CONTAINING FILMS SELECTIVELY AGAINST EACH OTHER2021-04-08
20210104414THERMAL ATOMIC LAYER ETCH WITH RAPID TEMPERATURE CYCLING2021-04-08
20210104415DEFECT REDUCTION OF SEMICONDUCTOR LAYERS AND SEMICONDUCTOR DEVICES BY ANNEAL AND RELATED METHODS2021-04-08
20210104416STACKED SEMICONDUCTOR DEVICES AND METHODS OF FORMING SAME2021-04-08
20210104417APPARATUS AND METHOD FOR TREATING SUBSTRATE2021-04-08
20210104418APPARATUS FOR TREATING SUBSTRATE AND METHOD FOR TREATING SUBSTRATE2021-04-08
20210104419WAFER COOLING SYSTEM2021-04-08
20210104420SUPPORT UNIT, SUBSTRATE TREATING APPARATUS INCLUDING THE SAME, AND SUBSTRATE TREATING METHOD2021-04-08
20210104421CONTROL DEVICE, PROCESSING APPARATUS, AND CONTROL METHOD2021-04-08
20210104422LEAK MEASUREMENT SYSTEM, SEMICONDUCTOR MANUFACTURING SYSTEM, AND LEAK MEASUREMENT METHOD2021-04-08
20210104423PROCESS OPTIMIZATION USING DESIGN OF EXPERIMENTS AND RESPONSE SURFACE MODELS2021-04-08
20210104424LOAD PORT APPARATUS AND METHOD OF DRIVING THE SAME2021-04-08
20210104425ACCOMMODATING DEVICE FOR RETAINING WAFERS2021-04-08
20210104426ELECTROSTATIC CHUCK AND METHOD FOR MANUFACTURING SAME2021-04-08
20210104427APPARATUS AND METHODS FOR ISOLATING A REACTION CHAMBER FROM A LOADING CHAMBER RESULTING IN REDUCED CONTAMINATION2021-04-08
20210104428WAFER CHUCK, METHOD FOR PRODUCING THE SAME, AND EXPOSURE APPARATUS2021-04-08
20210104429METHODS FOR FORMING HOLE STRUCTURE IN SEMICONDUCTOR DEVICE2021-04-08
20210104430SILICON-ON-INSULATOR SUBSTRATE INCLUDING TRAP-RICH LAYER AND METHODS FOR MAKING THEREOF2021-04-08
20210104431CONTACT PLUGS FOR SEMICONDUCTOR DEVICE AND METHOD OF FORMING SAME2021-04-08
20210104432PROCESSES FOR FORMING FULLY ALIGNED VIAS2021-04-08
20210104433CONFORMAL TITANIUM NITRIDE-BASED THIN FILMS AND METHODS OF FORMING SAME2021-04-08
20210104434METHODS AND APPARATUSES FOR FORMING INTERCONNECTION STRUCTURES2021-04-08
20210104435TECHNIQUES FOR REVEALING A BACKSIDE OF AN INTEGRATED CIRCUIT DEVICE, AND ASSOCIATED CONFIGURATIONS2021-04-08
202101044363D CHIP WITH SHARED CLOCK DISTRIBUTION NETWORK2021-04-08
20210104437SEMICONDUCTOR DEVICE2021-04-08
20210104438Configuring Different Via Sizes for Bridging Risk Reduction and Performance Improvement2021-04-08
20210104439MEMORY DEVICE AND METHOD FOR FABRICATING THE SAME2021-04-08
20210104440VERTICAL TUNNELING FIELD EFFECT TRANSISTOR WITH DUAL LINER BOTTOM SPACER2021-04-08
20210104441FINFET DEVICES AND METHODS OF FORMING THE SAME2021-04-08
20210104442STABLE MIXED OXIDE CATALYSTS FOR DIRECT CONVERSION OF ETHANOL TO ISOBUTENE AND PROCESS FOR MAKING2021-04-08
20210104443Fin Field-Effect Transistor Device and Method2021-04-08
20210104444MODULES INCORPORATING ENCAPSULATION LAYERS2021-04-08
20210104445SILICON CARBIDE POWER DEVICE WITH IMPROVED ROBUSTNESS AND CORRESPONDING MANUFACTURING PROCESS2021-04-08
20210104446PACKAGED SEMICONDUCTOR DEVICES HAVING ENHANCED THERMAL TRANSPORT AND METHODS OF MANUFACTURING THE SAME2021-04-08
20210104447SILICON ON DIAMOND THERMAL AND SHIELDING MITIGATION2021-04-08
20210104448LATERAL HEAT REMOVAL FOR 3D STACK THERMAL MANAGEMENT2021-04-08
20210104449Power Semiconductor Package with Highly Reliable Chip Topside2021-04-08
20210104450LIQUID COOLED HEAT DISSIPATION DEVICE2021-04-08
20210104451SEMICONDUCTOR DEVICES WITH BACK-SIDE COILS FOR WIRELESS SIGNAL AND POWER COUPLING2021-04-08
20210104452FILM PACKAGE AND METHOD OF FABRICATING PACKAGE MODULE2021-04-08
20210104453BIDIRECTIONAL SWITCH AND BIDIRECTIONAL SWITCH DEVICE INCLUDING THE SWITCH2021-04-08
20210104454WIRING SUBSTRATE DEVICE2021-04-08
20210104455CHIP PACKAGE AND MANUFACTURING METHOD THEREOF2021-04-08
20210104456Electronic Device with Stud Bumps2021-04-08
20210104457ELECTRONIC DEVICE COMPRISING A CHIP AND AT LEAST ONE SMT ELECTRONIC COMPONENT2021-04-08
20210104458SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME2021-04-08
20210104459FUSE LINES AND PLUGS FOR SEMICONDUCTOR DEVICES2021-04-08
20210104460SEMICONDUCTOR FUSE STRUCTURE AND METHOD OF MANUFACTURING A SEMICONDUCTOR FUSE STRUCTURE2021-04-08
20210104461SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME2021-04-08
20210104462SEMICONDUCTOR DEVICES INCLUDING A THICK METAL LAYER2021-04-08
20210104463SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME2021-04-08
20210104464ALIGNMENT CARRIER FOR INTERCONNECT BRIDGE ASSEMBLY2021-04-08
20210104465ELECTRONIC PACKAGE, PACKAGING SUBSTRATE, AND METHODS FOR FABRICATING THE SAME2021-04-08
20210104466APPARATUSES INCLUDING CONDUCTIVE STRUCTURE LAYOUTS2021-04-08
20210104467PACKAGE COMPRISING A DIE AND DIE SIDE REDISTRIBUTION LAYERS (RDL)2021-04-08
20210104468INTEGRATED CIRCUIT WITH SCRIBE LANE PATTERNS FOR DEFECT REDUCTION2021-04-08
20210104469MARKING PATTERN IN FORMING STAIRCASE STRUCTURE OF THREE-DIMENSIONAL MEMORY DEVICE2021-04-08
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