08th week of 2017 patent applcation highlights part 48 |
Patent application number | Title | Published |
20170053745 | ELECTROLYTIC CAPACITOR MANUFACTURING METHOD | 2017-02-23 |
20170053746 | PLANAR MIXED-METAL PEROVSKITES FOR OPTOELECTRONIC APPLICATIONS | 2017-02-23 |
20170053747 | ELECTROLYTE FOR DYE-SENSITIZED SOLAR CELL AND METHOD FOR PREPARING SAME | 2017-02-23 |
20170053748 | CARBON ACTIVATION METHOD AND ENERGY STORAGE DEVICE THEREOF | 2017-02-23 |
20170053749 | Method of manufacturing graphene composite including ultrasonic-wave pulverization post-treatment process and method of manufacturing active material using the same | 2017-02-23 |
20170053750 | THREE-DIMENSIONAL COMPOSITES OF NICKEL COBALT OXIDE/ GRAPHENE ON NICKEL FOAM FOR SUPERCAPACITOR ELECTRODES, AND PREPARATION METHOD THEREOF | 2017-02-23 |
20170053751 | REPAIRABLE ELECTRICAL COMPONENT | 2017-02-23 |
20170053752 | LOW FOAMING CARBON ACTIVATION METHOD AND ENERGY STORAGE DEVICE THEREOF | 2017-02-23 |
20170053753 | LASER-CUT BUTTON VENEER FOR A CONTROL DEVICE HAVING A BACKLIT KEYPAD | 2017-02-23 |
20170053754 | INFORMATION PROCESSING DEVICE | 2017-02-23 |
20170053755 | INFORMATION PROCESSING DEVICE | 2017-02-23 |
20170053756 | BACKLIGHT MODULE ADAPTED FOR A KEYBOARD AND KEYBOARD THEREWITH | 2017-02-23 |
20170053757 | MULTI-POLE SWITCH ASSEMBLY WITH ADJUSTABLE SIMULTANEITY | 2017-02-23 |
20170053758 | ELECTRICAL CIRCUIT BREAKER | 2017-02-23 |
20170053759 | CIRCUIT BREAKER AND METHOD | 2017-02-23 |
20170053760 | SELF-LEARNING RELAY TURN-OFF CONTROL SYSTEM AND METHOD | 2017-02-23 |
20170053761 | Polar Relay | 2017-02-23 |
20170053762 | RELAY WITH INTEGRAL WIRELESS TRANSCEIVER FOR COMMUNICATION AND CONTROL | 2017-02-23 |
20170053763 | CONTACT DEVICE OF A STARTER CONTACTOR | 2017-02-23 |
20170053764 | ELECTROMECHANICAL POWER SWITCH INTEGRATED CIRCUITS AND DEVICES AND METHODS THEREOF | 2017-02-23 |
20170053765 | MINATURE CIRCUIT BREAKER COLOR-CODED STATE INDICATOR | 2017-02-23 |
20170053766 | ELECTRICAL SWITCHING APPARATUS AND POLE SHAFT CATCH ASSEMBLY THEREFOR | 2017-02-23 |
20170053767 | Subsea Replaceable Fuse Assembly | 2017-02-23 |
20170053768 | Hooked Fuse Barrel | 2017-02-23 |
20170053769 | X-RAY EMITTER | 2017-02-23 |
20170053770 | EMITTER ARRANGEMENT | 2017-02-23 |
20170053771 | X-RAY SOURCE | 2017-02-23 |
20170053772 | System And Method For Multi-Source X-Ray-Based Imaging | 2017-02-23 |
20170053773 | EXPOSURE APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2017-02-23 |
20170053774 | STRUCTURE ELECTRON BEAM INSPECTION SYSTEM FOR INSPECTING EXTREME ULTRAVIOLET MASK AND STRUCTURE FOR DISCHARGING EXTREME ULTRAVIOLET MASK | 2017-02-23 |
20170053775 | METHODS AND APPARATUS FOR ION SOURCES, ION CONTROL AND ION MEASUREMENT FOR MACROMOLECULES | 2017-02-23 |
20170053776 | APPARATUS AND METHOD FOR GENERATING HIGH CURRENT NEGATIVE HYDROGEN ION BEAM | 2017-02-23 |
20170053777 | CHARGED PARTICLE BEAM DEVICE AND DETECTION METHOD USING SAID DEVICE | 2017-02-23 |
20170053778 | METHOD OF PREPARING A PLAN-VIEW TRANSMISSION ELECTRON MICROSCOPE SAMPLE USED IN AN INTEGRATED CIRCUIT ANALYSIS | 2017-02-23 |
20170053779 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD | 2017-02-23 |
20170053780 | TARGET SUPPLY DEVICE, TARGET MATERIAL REFINING METHOD, RECORDING MEDIUM HAVING TARGET MATERIAL REFINING PROGRAM RECORDED THEREIN, AND TARGET GENERATOR | 2017-02-23 |
20170053781 | Multi-Station Chamber Having Symmetric Grounding Plate | 2017-02-23 |
20170053782 | APPLICATION OF POWERED ELECTROSTATIC FARADAY SHIELD TO RECONDITION DIELECTRIC WINDOW IN ICP PLASMAS | 2017-02-23 |
20170053783 | SEMICONDUCTOR APPARATUS AND CLEANING METHOD FOR THE SEMICONDUCTOR APPARATUS | 2017-02-23 |
20170053784 | METHODS AND APPARATUS FOR CO-SPUTTERING MULTIPLE TARGETS | 2017-02-23 |
20170053785 | Mass Spectrometer With Reduced Potential Drop | 2017-02-23 |
20170053786 | Mass Spectrometer Data Acquisition | 2017-02-23 |
20170053787 | COUPLING DEVICES AND SOURCE ASSEMBLIES INCLUDING THEM | 2017-02-23 |
20170053788 | PAPER CONE TIP, AND PAPER CONE SPRAY IONIZATION MASS SPECTROMETRY USING THE SAME | 2017-02-23 |
20170053789 | CORONA IONIZATION APPARATUS AND METHOD | 2017-02-23 |
20170053790 | Method of Mass Separating Ions and Mass Separator | 2017-02-23 |
20170053791 | Arc Lamp and Substrate Heating Apparatus Having the Arc Lamp | 2017-02-23 |
20170053792 | High Temperature Thermal ALD Silicon Nitride Films | 2017-02-23 |
20170053793 | METHOD AND SYSTEM FOR SCULPTING SPACER SIDEWALL MASK | 2017-02-23 |
20170053794 | AUTOMATIC CONTROL OF SPRAY BAR AND UNITS FOR CHEMICAL MECHANICAL POLISHING IN-SITU BRUSH CLEANING | 2017-02-23 |
20170053795 | METHOD FOR THE PRODUCTION OF A NITRIDE COMPOUND SEMICONDUCTOR LAYER | 2017-02-23 |
20170053796 | SELECTIVE EPITAXY USING EPITAXY-PREVENTION LAYERS | 2017-02-23 |
20170053797 | SELECTIVE ATOMIC LAYER DEPOSITION PROCESS UTILIZING PATTERNED SELF ASSEMBLED MONOLAYERS FOR 3D STRUCTURE SEMICONDUCTOR APPLICATIONS | 2017-02-23 |
20170053798 | Flowable Films and Methods of Forming Flowable Films | 2017-02-23 |
20170053799 | METHOD OF DENSIFYING FILMS IN SEMICONDUCTOR DEVICE | 2017-02-23 |
20170053800 | OXIDE FOR SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR, SEMICONDUCTOR LAYER OF THIN-FILM TRANSISTOR HAVING SAID OXIDE, AND THIN-FILM TRANSISTOR | 2017-02-23 |
20170053801 | METHOD FOR MANUFACTURING P-TYPE ZINC OXIDE FILM | 2017-02-23 |
20170053802 | METHODS OF FORMING PATTERNS OF SEMICONDUCTOR DEVICES | 2017-02-23 |
20170053803 | OVERHANG HARDMASK TO PREVENT PARASITIC EPITAXIAL NODULES AT GATE END DURING SOURCE DRAIN EPITAXY | 2017-02-23 |
20170053804 | Method and Structure for Semiconductor Device Having Gate Spacer Protection Layer | 2017-02-23 |
20170053805 | OVERHANG HARDMASK TO PREVENT PARASITIC EPITAXIAL NODULES AT GATE END DURING SOURCE DRAIN EPITAXY | 2017-02-23 |
20170053806 | Method for Manufacturing Semiconductor Device | 2017-02-23 |
20170053807 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | 2017-02-23 |
20170053808 | SELF LIMITING LATERAL ATOMIC LAYER ETCH | 2017-02-23 |
20170053809 | Etching Apparatus | 2017-02-23 |
20170053810 | ATOMIC LAYER ETCHING OF TUNGSTEN AND OTHER METALS | 2017-02-23 |
20170053811 | PULSING RF POWER IN ETCH PROCESS TO ENHANCE TUNGSTEN GAPFILL PERFORMANCE | 2017-02-23 |
20170053812 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | 2017-02-23 |
20170053813 | METHODS OF FABRICATING PACKAGE SUBSTRATES HAVING EMBEDDED CIRCUIT PATTERNS | 2017-02-23 |
20170053814 | Packaged Semiconductor Device Having Leadframe Features Preventing Delamination | 2017-02-23 |
20170053815 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD | 2017-02-23 |
20170053816 | CLEANING APPARATUS AND CLEANING METHOD | 2017-02-23 |
20170053817 | SUBSTRATE TREATING APPARATUS | 2017-02-23 |
20170053818 | LIGHT-IRRADIATION TYPE THERMAL PROCESSING METHOD AND THERMAL PROCESSING APPARATUS | 2017-02-23 |
20170053819 | WEAR DETECTION OF CONSUMABLE PART IN SEMICONDUCTOR MANUFACTURING EQUIPMENT | 2017-02-23 |
20170053820 | EDGE RING ASSEMBLY FOR IMPROVING FEATURE PROFILE TILTING AT EXTREME EDGE OF WAFER | 2017-02-23 |
20170053821 | WAFER PROCESSING BONDING ARRANGEMENT, WAFER LAMINATE, AND THIN WAFER MANUFACTURING METHOD | 2017-02-23 |
20170053822 | WARPED WAFERS VACUUM CHUCK | 2017-02-23 |
20170053823 | Bond Chuck, Methods of Bonding, and Tool Including Bond Chuck | 2017-02-23 |
20170053824 | ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING THE SAME | 2017-02-23 |
20170053825 | SEMICONDUCTOR DEVICES HAVING FIN FIELD EFFECT TRANSISTORS WITH A SINGLE LINER PATTERN IN A FIRST REGION AND A DUAL LINER PATTERN IN A SECOND REGION AND METHODS FOR MANUFACTURING THE SAME | 2017-02-23 |
20170053826 | SEMICONDUCTOR SUBSTRATE POLISHING METHODS AND SLURRIES AND METHODS FOR MANUFACTURING SILICON ON INSULATOR STRUCTURES | 2017-02-23 |
20170053827 | Method of Forming Butted Contact | 2017-02-23 |
20170053828 | METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE | 2017-02-23 |
20170053829 | WAFER PROCESSING METHOD | 2017-02-23 |
20170053830 | WAFER PROCESSING METHOD | 2017-02-23 |
20170053831 | WAFER PROCESSING METHOD | 2017-02-23 |
20170053832 | WAFER STRUCTURE AND PROCESSING METHOD THEREOF | 2017-02-23 |
20170053833 | METHODS FOR PRODUCING SEMICONDUCTOR DEVICES | 2017-02-23 |
20170053834 | FINFET DEVICES HAVING GATE DIELECTRIC STRUCTURES WITH DIFFERENT THICKNESSES ON SAME SEMICONDUCTOR STRUCTURE | 2017-02-23 |
20170053835 | DUAL LINER CMOS INTEGRATION METHODS FOR FINFET DEVICES | 2017-02-23 |
20170053836 | METHODS FOR FORMING FIN STRUCTURES | 2017-02-23 |
20170053837 | FORMING CMOSFET STRUCTURES WITH DIFFERENT CONTACT LINERS | 2017-02-23 |
20170053838 | STRAINED FINFET DEVICE FABRICATION | 2017-02-23 |
20170053839 | SEMICONDUCTOR STRUCTURES HAVING INCREASED CHANNEL STRAIN USING FIN RELEASE IN GATE REGIONS | 2017-02-23 |
20170053840 | FINFET DEVICES HAVING GATE DIELECTRIC STRUCTURES WITH DIFFERENT THICKNESSES ON SAME SEMICONDUCTOR STRUCTURE | 2017-02-23 |
20170053841 | Single-Wafer Real-Time Etch Rate and Uniformity Predictor For Plasma Etch Processes | 2017-02-23 |
20170053842 | Method And Apparatus For Analysis Of Processing Of A Semiconductor Wafer | 2017-02-23 |
20170053843 | HYBRID CORRECTIVE PROCESSING SYSTEM AND METHOD | 2017-02-23 |
20170053844 | THREE DIMENSIONAL INTEGRATED CIRCUIT STRUCTURE AND METHOD OF MANUFACTURING THE SAME | 2017-02-23 |