05th week of 2010 patent applcation highlights part 74 |
Patent application number | Title | Published |
20100031402 | PROBE ALIGNING METHOD FOR PROBE MICROSCOPE AND PROBE MICROSCOPE OPERATED BY THE SAME - Provided is an aligning method capable of setting a sample observation unit such as an optical microscope to a probe microscope observation position at high precision. A sample having a known structure is used in advance. A surface of the sample and a shape of a cantilever provided with a probe are observed using the sample observation unit such as the optical microscope. A sample observation position and a probe position which are obtained using the sample observation unit are verified, and a relative positional relationship therebetween is recorded. Then, a first mark indicating a position of the cantilever and a second mark which is displayed in conjunction with the first mark and has the relative positional relationship with the first mark are produced to align the sample relative to the second mark. | 2010-02-04 |
20100031403 | Heat Coupling Device - The invention concerns a heat coupling device for scanning force or atomic force microscopy, comprising a first heat conducting device ( | 2010-02-04 |
20100031404 | Scanning Probe Microscope With Periodically Phase-Shifted AC Excitation - The scanning probe microscope applies a sum of an AC voltage (Uac) and a DC voltage (Udc) to its probe. The frequency of the AC voltage (Uac) substantially corresponds to the mechanical oscillation frequency of the probe, but its phase in respect to the mechanical oscillation varies periodically. The phase modulation has a frequency fmod. The microscope measures the frequency (f) or the amplitude (K) of a master signal (S) applied to the probe's actuator, or it measures the phase of the mechanical oscillation of the cantilever in respect to the master signal (S). The spectral component at frequency fmod of the measured signal is fed to a feedback loop controller, which strives to keep it zero by adjusting the DC voltage (Udc), thereby keeping the DC voltage at the contact voltage potential. | 2010-02-04 |
20100031405 | Tool Tips with Scanning Probe Microscopy and/or Atomic Force Microscopy Applications - A micro-object is affixed to a mounting structure at a desired relative orientation. The micro-object may be a tool tip optimized to work with particular microscope objectives permitting the tip to be imaged along with the object surface and used to make measurements or modifications through a travel range along the microscope imaging axis equal to or nearly equal to the working distance of the given objective. The tool tip may have a lengths exceeding 80 microns, say up to several millimeters; even the longest tips can have widths of tens of microns. | 2010-02-04 |
20100031406 | Mandevilla LINDL - A new and distinct Mandevilla plant named “ | 2010-02-04 |
20100031407 | Carnation plant named 'CFPC Chantilly' - A new variety of carnation plant named ‘CFPC Chantilly’, having a compact form of plant with well presented purple edged purple-pink center flowers. | 2010-02-04 |
20100031408 | Dianthus plant named 'WP08 UNI02' - A new cultivar of | 2010-02-04 |