| Entries |
| Document | Title | Date |
|---|
| 20090100553 | SCANNING PROBE-BASED LITHOGRAPHY METHOD - A resist medium in which features are lithographically produced by scanning a surface of the medium with an AFM probe positioned in contact therewith. The resist medium comprises a substrate; and a polymer resist layer within which features are produced by mechanical action of the probe. The polymer contains thermally reversible crosslinkages. Also disclosed are methods that generally includes scanning a surface of the polymer resist layer with an AFM probe positioned in contact with the resist layer, wherein heating the probe and a squashing-type mechanical action of the probe produces features in the layer by thermally reversing the crosslinkages. | 04-16-2009 |
| 20090133168 | SCANNING PROBE MICROSCOPE - A scanning probe microscope is provided, which can be stably used for a long time even if excitation efficiency varies during scan. A cantilever ( | 05-21-2009 |
| 20090151030 | DUAL TIP ATOMIC FORCE MICROSCOPY PROBE AND METHOD FOR PRODUCING SUCH A PROBE - One inventive aspect is related to an atomic force microscopy probe. The probe comprises a tip configuration with two probe tips on one cantilever arm. The probe tips are electrically isolated from each other and of approximately the same height with respect to the cantilever arm. The outer surface of the tip configuration has the shape of a body with a base plane and an apex. The body is divided into two sub-parts by a gap located approximately symmetrically with respect to the apex and approximately perpendicular to the base plane. Another inventive aspect related to methods for producing such an AFM probe. | 06-11-2009 |
| 20090178165 | CANTILEVER WITH PIVOTING ACTUATION - Improved actuation device useful in direct-write nanolithography and imaging including use of a pivot point for downward deflection of a cantilever with long travel path. A device comprising at least one holder, at least one cantilever, an extension of the said cantilever wherein the extension is integrated with an actuator, wherein the cantilever is adapted for actuated movement. The actuator can be electrostatic, thermal, or piezoelectric. The cantilever can comprise a tip, and material can be transferred from the tip to a surface. | 07-09-2009 |
| 20090205091 | Array and cantilever array leveling - Faster and better methods for leveling arrays including software and user interface for instruments. A method comprising: (i) providing at least one array of cantilevers supported by at least one support structure, (ii) providing at least one substrate, (iii) providing at least one instrument to control the position of the array with respect to the substrate, (iv) leveling the array with respect to the substrate, wherein the leveling is performed via a user interface on the instrument which is adapted to have the user input positional information from the motors and piezoelectric extender when at least one cantilever deflects from the substrate. Uniform z-displacements can be achieved. | 08-13-2009 |
| 20090222958 | Method and Apparatus for Obtaining Quantitative Measurements Using a Probe Based Instrument - A method includes determining the point at which a tip of a probe based instrument contacts a sample and/or the area of that contact by dynamically oscillating a cantilever of the instrument in flexural and/or torsional modes. The method additionally includes using oscillation characteristics, such as amplitude, phase, and resonant frequency, to determine the status of the contact and to provide quantitative data. Static and quasi-static measurements, including contact stiffness and elastic modulus, can be obtained from the thus obtained data. Quasistatic measurements, such as creep and viscoelastic modulus, can be obtained by repeating the static measurements for a number of force profiles at different force application rates and correlating the resultant data using known theories. | 09-03-2009 |
| 20090249521 | High frequency deflection measurement of IR absorption - An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community. | 10-01-2009 |
| 20090255016 | APPARATUS STRUCTURE AND SCANNING PROBE MICROSCOPE INCLUDING APPARATUS STRUCTURE - Provided are a structure of an apparatus for analysis, inspection, and measurement in which a support structure supporting a detection unit is resistant to disturbance, suppresses a reduction in resolution during large-sample measurement, and has high rigidity, and a probe microscope using the apparatus structure. The apparatus structure supporting the detection unit which is opposed to a sample which is located on a unit movable in at least one axis direction and is an object to be analyzed has an arch shape. In the apparatus structure having the arch shape and supporting the detection unit, a surface substantially perpendicular to a flat surface portion of a sample holder located immediately under the apparatus structure is formed. The detection unit is supported on the perpendicular surface. The arch-shaped apparatus structure is a curved structure consistent with a catenary curve. | 10-08-2009 |
| 20090260113 | Probe Microscope Setup Method - A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing. | 10-15-2009 |
| 20090293161 | CANTILEVER DEVICE AND CANTILEVER CONTROLLING METHOD - The amplitude control of a cantilever based on the van der Pol model is performed through a feedback using the measurement data on a deflection of the cantilever. A self-oscillating circuit integrates a deflection angle signal of a cantilever detected by a deflection angle measuring mechanism using an integrator, multiplies a resulting integral value by linear feedback gain K | 11-26-2009 |
| 20090300806 | ATOMIC FORCE MICROSCOPE - A surface shape of a member to be measured is measured by reflecting measuring light at a reflection surface of a probe and utilizing an atomic force exerting between the probe and utilizing an atomic force exerting between the probe and the member to be measured. In addition to a first scanner for driving the probe, a second scanner for moving a focus position of an optical system is provided. Position conversion data representing a correlation between amounts of control of the first scanner and the second scanner are obtained in advance. By synchronously driving the first scanner and the second scanner, the focus position of the optical system is caused to follow the probe to improve measurement accuracy. | 12-03-2009 |
| 20090313729 | SCAN TYPE PROBE MICROSCOPE AND CANTILEVER DRIVE DEVICE - A driving laser unit ( | 12-17-2009 |
| 20100017924 | METHOD FOR USING AN ATOMIC FORCE MICROSCOPE - The present invention relates to a method of using an atomic force microscope comprising exciting natural lower and higher vibration modes of a microlever (M) placed on a sample, and analyzing the variation of one variable of a first output signal (A | 01-21-2010 |
| 20100024082 | ATOMIC FORCE MICROSCOPE - There is provided an atomic force microscope (AFM) with increase the speed and sensitivity of detection of the resonant frequency shift in a cantilever. An AFM ( | 01-28-2010 |
| 20100031404 | Scanning Probe Microscope With Periodically Phase-Shifted AC Excitation - The scanning probe microscope applies a sum of an AC voltage (Uac) and a DC voltage (Udc) to its probe. The frequency of the AC voltage (Uac) substantially corresponds to the mechanical oscillation frequency of the probe, but its phase in respect to the mechanical oscillation varies periodically. The phase modulation has a frequency fmod. The microscope measures the frequency (f) or the amplitude (K) of a master signal (S) applied to the probe's actuator, or it measures the phase of the mechanical oscillation of the cantilever in respect to the master signal (S). The spectral component at frequency fmod of the measured signal is fed to a feedback loop controller, which strives to keep it zero by adjusting the DC voltage (Udc), thereby keeping the DC voltage at the contact voltage potential. | 02-04-2010 |
| 20100064397 | CONTROLLED ATOMIC FORCE MICROSCOPE - The invention relates to an atomic force microscope including a microtip placed on a flexible support connected to a microscope head facing a surface to be studied, which includes means for controlling the distance between the head and the surface for a given value and means for inhibiting vibration of the microtip. | 03-11-2010 |
| 20100071099 | ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD USING ATOMIC FORCE MICROSCOPE - A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a Δf | 03-18-2010 |
| 20100088788 | STRESS MICRO MECHANICAL TEST CELL, DEVICE, SYSTEM AND METHODS - The invention provides a stress micro mechanical system for measuring stress and strain in micro- and nano-fibers tubes, and wires as well as for measuring the interface adhesion force and stress in nanofibers and nanotubes embedded in a polymer matrix. A preferred system of the invention has a substrate for supporting a MEMS fabrication. The MEMS fabrication includes freestanding sample attachment points that are movable in a translation direction relative to one another when the substrate is moved and a sample is attached between the sample attachment points. An optical microscope images surfaces of the MEMS fabrication. Software conducts digital image correlation on obtained images to determine the movement of the surfaces at a resolution much greater than the hardware resolution of the optical microscope. A preferred method for measuring stress and strain in micro- and nano-fibers, tubes, and wires, and/or measuring the force required to pull-out individual micro- and nano-fibers, tubes, and wires from a polymer matrix and to therefore measure interfacial adhesion is also provided. In the method a sample is attached between freestanding platforms in a MEMS device. Relative translational movement between the platforms is created and motion of the platforms is imaged with an optical microscope. Mechanical and adhesion properties of the sample are determined by applying a digital image correlation algorithm to the image data. | 04-08-2010 |
| 20100115674 | ATOMIC FORCE MICROSCOPE APPARATUS - An object of the present invention is to provide an atomic force microscope apparatus allowing tracking errors to be made as close to zero as possible to reduce images obtained through high-speed scanning from being degraded. To accomplish the object of the present invention, the present invention provides an atomic force microscope apparatus imaging a surface topography of a sample in a contact mode, the apparatus including a cantilever having a probe interacting with the sample surface via an atomic force and being subjected to a deflection by the atomic force, laser light provision means for allowing first laser light to enter the cantilever, light detection means, a controller estimating the surface topography of the sample surface, and data storage means for recording the estimated surface topography. | 05-06-2010 |
| 20100132077 | SURFACE ANALYSIS AND MEASUREMENT METHOD BASED ON FLOW RESISTANCE OF FLUID AND ATOMIC FORCE MICROSCOPE USING THE METHOD - Provided is a surface analysis and measurement method based on the flow resistance of a fluid. The method comprises: spraying a fluid on the surface of a sample; identifying and determining if a flow resistance value of the fluid colliding with the sample surface is optimal for the measurement of the surface topography of the sample; setting the determined optimal flow resistance value to a reference value and moving the sample in the X-Y axes to allow the entire surface of the sample to be scanned; varying the position of the sample in the Z axis together with the X-Y axis movement to adjust varying flow resistance values of the fluid along the irregular surface topography of the sample to the set flow resistance value during scanning; and expressing the movement ranges of the sample in the X, Y and Z axes as numerical values and representing the numerical values as brightness values on a computer screen to display the surface topography of the sample. Further provided is an atomic force microscope using the method. | 05-27-2010 |
| 20100154086 | NOVEL ENHANCED PROCESSES FOR MOLECULAR SCREENING AND CHARACTERIZATION - A general high-throughput screening (HTS) process using an atomic force microscope (AFM) to detect and measure molecular recognition events. The AFM is used to measure changes in molecular complex height, friction, shape, elasticity or any other relevant parameters that report a molecular recognition event. In addition, the force involved in molecular recognition and bonding is directly measured using the technique of force spectroscopy. In one embodiment, a flow chamber is used to introduce molecules and assay their effect on a molecular interaction occurring between molecules on the AFM probe and a surface. In some cases the surface may be an introduced microparticle. In a second embodiment, the sample is a solid phase array of molecules that is interrogated by a functionalized AFM probe, and the effects of introduced agents at each molecular address in the array is measured by force spectroscopy. | 06-17-2010 |
| 20100180356 | Nanoindenter - A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements. | 07-15-2010 |
| 20100192267 | Scanning Probe Microscope with Independent Force Control and Displacement Measurements - A nanoindenter that includes an interferometer, a rod, a force actuator and a controller is disclosed. The interferometer generates a light beam that is reflected from a moveable reflector, the interferometer determining a distance between a reference location and the moveable reflector. The rod is characterized by a rod axis and includes a tip on a first end thereof, the rod includes the moveable reflector at a location proximate to the tip. The tip is disposed in a manner that allows the tip to be forced against the surface of a sample. The force actuator applies a force to the rod in a direction parallel to the rod axis in response to a force control signal coupled to the actuator. The controller receives the determined distance from the interferometer and generates the force control signal. The invention can also be used as a scanning probe microscope. | 07-29-2010 |
| 20100218288 | ATOMIC FORCE MICROSCOPY DEVICES, ARRANGEMENTS AND SYSTEMS - Various embodiments of the present invention are directed to microscopy cantilevers. Consistent with an example embodiment, aspects of the invention are directed to a cantilever having a body and a force sensor arrangement extending from an end of the body and including a tip near a free end of the force sensor arrangement. The force sensor arrangement exhibits a high temporal response to the tip's interaction with a sample, relative to the response of the cantilever. The force sensor arrangement's response is detected and used to characterize the sample. | 08-26-2010 |
| 20100223698 | High Resolution Wide Angle Tomographic Probe - The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes. | 09-02-2010 |
| 20100235956 | ATOMIC FORCE MICROSCOPY TRUE SHAPE MEASUREMENT METHOD - An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90° with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated. | 09-16-2010 |
| 20100263098 | METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJECTS TO BE ANALYZED - The invention relates to a method for the combined analysis of a sample with objects to be analysed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analysed in the sample are obtained by analysing the one or more objects to be analysed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analysed by analysing the one or more objects to be analysed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects. | 10-14-2010 |
| 20100269232 | Scanning Probe Microscope that Outputs Metadata with Image - A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe mount, a probe position signal generator, and a controller. The probe mount is adapted to receive a probe having a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The probe position signal generator generates a position signal indicative of a position of the probe tip. The controller receives the position signal and derives a pixel value for a corresponding location on the sample from the position signal over a pixel time period. The controller generates an image that includes the pixel value. The controller stores a plurality of intermediate pixel data values at different times during the pixel time period. | 10-21-2010 |
| 20100275334 | Modular atomic force microscope - A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available. | 10-28-2010 |
| 20100281586 | METHOD AND DEVICE TO PROBE A MEMBRANE BY APPLYING AN IN-PLANE ELECTRIC FIELD - The present invention disposes a membrane between two electrical conductive walls having a height at least as great as the thickness of the membrane. The conductive walls are fabricated on an electrically insulative chip base. The chip base has one or more through hole between the electrically conducting walls. The chip is placed inside a container having a well below the through hole of the electrically insulative base. At least one passageway extends from the well to the periphery of the container. This invention probes changes of the membrane as an in-plane electric field is applied between the conductive walls. The well may include various compounds while-other compounds can be placed in contact with the top of the membrane. The passageways are used to introduce substances into and out of the well. | 11-04-2010 |
| 20100325761 | Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force. | 12-23-2010 |
| 20110047662 | APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFERENT MATERIALS - The present invention relates to an apparatus and a method for investigating surface properties of different materials, which make it possible to carry out atomic force microscopy with a simplified and faster shear force method. The apparatus according to the invention is characterized by perpendicular orientation of the measuring tip of a self-actuated cantilever with respect to the surface of the sample. A piezoresistive sensor and a bimorph actuator are preferably DC-isolated. The measuring tip is in the form of a carbon nanotube, in particular. A plurality of cantilevers can be arranged in the form of a cantilever array which is characterized by a comb-like arrangement of individual pre-bent cantilevers. The method according to the invention is distinguished by a fast feedback signal on account of the distance between the measuring tip and the surface to be investigated being regulated using the change in a DC signal which supplies the actuator. | 02-24-2011 |
| 20110055985 | DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND MODIFICATION OF SURFACE PROPERTIES - The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device. | 03-03-2011 |
| 20110055986 | Athermal Atomic Force Microscope Probes - An atomic force microscopy system includes an imaging probe having a first thermal displacement constant and a sample placement surface. At least a portion of the sample placement surface has a second thermal displacement constant. The sample placement surface is spaced apart from the imaging probe at a predetermined displacement. The sample placement surface is configured so that the second thermal displacement constant matches the first thermal displacement constant so that when the imaging probe and the sample placement surface are subject to a predetermined temperature, both the portion of the sample placement surface and the imaging prove are displaced by a same distance. | 03-03-2011 |
| 20110067150 | Cantilever with paddle for operation in dual-frequency mode - A microcantilever system comprising a paddle, its use and a method of simultaneously acquiring the topography and measuring the tip-sample interactions of a sample with it. | 03-17-2011 |
| 20110093990 | METHOD AND STRUCTURE FOR CHARACTERISING AN ATOMIC FORCE MICROSCOPY TIP - A method for characterising an atomic force microscopy tip using a characterisation structure having two inclined sidewalls opposite one another and of which at least one actual lateral distance separating the two inclined sidewalls corresponding to a given height is known, the method including scanning the surfaces of the inclined sidewalls by the tip, the scanning being carried out while the tip oscillates solely vertically; measuring, for the given height, the lateral distance separating the two inclined sidewalls, the measurement incorporating the convolution of the shape of the tip with the shape of the characterisation structure; and determining a characteristic dimension of the tip as a function of the measured lateral distance, and of the actual lateral distance. | 04-21-2011 |
| 20110167525 | PROBE DETECTION SYSTEM - A probe detection system ( | 07-07-2011 |
| 20110265227 | PIEZOELECTRIC MICROCANTILEVERS AND USES IN ATOMIC FORCE MICROSCOPY - The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric microcantilever, which includes a piezoelectric layer and a non-piezoelectric layer is capable of self actuation and detection. The piezoelectric layer may be constructed from a lead magnesium niobate-lead titanate (Pb(Mg | 10-27-2011 |
| 20110283428 | High frequency deflection measurement of IR absorption - An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community. | 11-17-2011 |
| 20110296563 | FLEXIBLY DISPLACEABLE COUPLING DEVICE FOR ACOUSTICALLY EXCITED ATOMIC FORCE MICROSCOPY WITH ACOUSTIC EXCITATION OF THE SAMPLE - A coupling device for an atomic force microscope with acoustic sample excitation includes a sound generator, in particular an ultrasonic test head, and designed for coupling of sound waves generated using the sound generator into a sample body for the acoustic excitation of the sample body, where the coupling device has a liquid reservoir fillable and/or filled with a liquid in its inner space; the lower side of the sample body can be arranged and/or is arranged laterally displaceably on the liquid reservoir; the end of the sound generator formed for coupling the sound waves into the sample body is arranged in the inner space of the liquid reservoir and/or that sound waves can be coupled into the inner space with this end; and the spatial section of the inner space of the liquid reservoir disposed between this end and the lower side of the sample body is completely fillable and/or filled with the liquid. | 12-01-2011 |
| 20110302677 | DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES ON POLYMER BASED DEVICES - Detection and characterization of laser-induced heat affected zones on polymer based devices, such as polymeric stents, are described where Nano Thermal Analysis may be used with atomic force microscopy to obtain the thermal behavior of materials with a spatial resolution of under, e.g., 100 nm. Heat may be applied locally to the measured polymeric stem via a probe tip and the resulting thermal-mechanical response can be measured. | 12-08-2011 |
| 20110307980 | HIGH-SPEED AND HIGH-RESOLUTION ATOMIC FORCE MICROSCOPE - According to example embodiments, an atomic force microscope includes a probe tip, a cantilever including the probe tip, a displacement measurement device, and a movement device. A vibrating displacement of the cantilever changes according to a force between atoms of the probe tip and atoms of a surface of a sample. The displacement measurement device is configured to irradiate a beam emitted from a light source on the cantilever and to measure a displacement of the cantilever based on the beam reflected from the cantilever. The movement device is configured to move the cantilever and the displacement measurement device simultaneously when the sample is scanned. | 12-15-2011 |
| 20120036602 | Video rate-enabling probes for atomic force microscopy - Method for producing a probe for atomic force microscopy with a silicon nitride cantilever and an integrated single crystal silicon tetrahedral tip with high resonant frequencies and low spring constants intended for high speed AFM imaging. | 02-09-2012 |
| 20120079634 | TANDEM PIEZOELECTRIC ACTUATOR AND SINGLE DRIVE CIRCUIT FOR ATOMIC FORCE MICROSCOPY - An apparatus for atomic force microscopy (AFM) comprises a first actuator configured to move a cantilever along an axis; a second actuator configured to move the cantilever along the axis; an amplifier; and a crossover network connected between the amplifier, and the first actuator and the second actuator. The crossover network is adapted to provide a first drive signal to the first actuator over a first frequency range and to provide a second drive signal to the second actuator over a second frequency range. | 03-29-2012 |
| 20120079635 | METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY - In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain embodiments, an AFM device engages a probe to a surface using a piezo voltage. The probe scans the surface to produce a first scan. The first scan is used to estimate a vertical offset such that the probe uses the piezo voltage to engage the surface for a second scan at a different vertical position. | 03-29-2012 |
| 20120117695 | AFM MEASURING METHOD AND SYSTEM THEREOF - Provided are an AFM measuring method and a system thereof. The tip of a cantilever is provided to a plurality of points on a substrate, to which incident light is radiated from a light source. Scattered light is generated between the tip of the cantilever and the substrate by the incident light and the intensity of the scattered light is measured. The measured intensity of the scattered light is input to a data processing unit so as to find a point where the intensity of the incident is highest. The tip of the cantilever is moved to the point where the intensity of the incident light is highest. | 05-10-2012 |
| 20120131703 | QUANTITATIVE ANALYSIS OF MRNA AND PROTEIN EXPRESSION - Provided is a highly selective and non-destructive method and apparatus for the measurement of one or more target molecules within a target environment. The apparatus comprises of a modified AFM (atomic force microscope) tip to create a tapered nanoscale co-axial cable, and wherein the application of an alternating potential between the inner and outer electrodes of the co-axial cable creates a dielectrophoretic force for attracting molecules toward the tip-end which is pre-treated with one or more specific ligands. | 05-24-2012 |
| 20120216322 | Digital Q control for enhanced measurement capability in cantilever-based instruments - A digital system for controlling the quality factor in a resonant device. The resonant device can be a a device that includes a cantilever within its system, such as an atomic force microscope. The quality factor can be digitally controlled to avoid noise effect in the analog components. A direct digital synthesizer implemented in a way that provides access to the output of the phase accumulator. That output is a number which usually drives a lookup table to produce a cosine or sine output wave. The output wave is created, but the number is also adjusted to form a second number that drives a second lookup table to create an adjustment factor to adjust the output from the cosine table. The adjusted digital signal than drives a DA converter which produces an output drive for the cantilever. | 08-23-2012 |
| 20120278957 | Scanning probe microscope with compact scanner - A scanner for a scanning probe microscope (SPM) including a head has a scanner body that houses an actuator, and a sensor that detects scanner movement. The scanner body is removable from the head by hand and without the use of tools and has a total volume of less than about five (5) square inches. Provisions are made for insuring that movement of a probe device coupled to the scanner is restricted to be substantially only in the intended direction. A fundamental resonance frequency for the scanner can be greater than 10 kHz. | 11-01-2012 |
| 20120278958 | Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy in Liquid - Provided are methods and systems for high resolution imaging of a material immersed in liquid by scanning probe microscopy. The methods further relate to imaging a material submersed in liquid by tapping mode atomic force microscopy (AFM), wherein the AFM has a microfabricated AFM probe comprising a nanoneedle probe connected to a cantilever beam. The nanoneedle probe is immersed in the liquid, and the rest of the AFM probe, including the cantilever beam to which the nanoneedle probe is attached, remains outside the liquid. The cantilever is oscillated and the nanoneedle probe tip taps the material to image the material immersed in liquid. In an aspect, the material is supported on a shaped substrate to provide a spatially-varying immersion depth with specially defined regions for imaging by any of the methods and systems of the present invention. | 11-01-2012 |
| 20120304343 | AUTOMATIC GAIN TUNING IN ATOMIC FORCE MICROSCOPY - A method for optimizing loop gain of an atomic force microscope (AFM) apparatus includes determining a change in gain of the physical system and adjusting a controller frequency response of the controller in an AFM loop to compensate for the determined change in gain. The AFM loop has a corresponding loop response that includes the product of the controller frequency response and a physical system response of the physical system. | 11-29-2012 |
| 20130081159 | ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE - Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a system drift error in the first scan based on the second scan. Another embodiment may comprise performing a global scan of a first area, a local scan of a second area within the first area, correcting a leveling error in the local scan based on the global scan, and outputting a corrected sample image. Another embodiment may comprise performing a first scan at a first position at a first angle, a second scan at a flat region using the same scan angle and scan size to correct a scanner runout error in the first scan based on the second scan. | 03-28-2013 |
| 20130111636 | NON-LINEAR INTERACTION IMAGING AND SPECTROSCOPY | 05-02-2013 |
| 20130174301 | METHOD AND APPARATUS FOR IN SITU PREPARATION OF SERIAL PLANAR SURFACES FOR MICROSCOPY - Systems and methods for preparing solid samples for analysis, such as microscopic examination in cross section or planimetric orientation. The sample preparation systems may include a sample support configured to secure a solid sample, an excitation beam source that generates an excitation beam configured to remove material from a surface of the sample, a beam shield configured to at least partially protect the sample from the excitation beam, and a beam shield holder configured to secure the beam shield, where the adjustment of the relative positions of the beam shield and sample holder permits the excitation beam to selectively expose a series of substantially planar surfaces of the sample. | 07-04-2013 |
| 20130205455 | SYSTEM AND METHOD OF PERFORMING ATOMIC FORCE MEASUREMENTS - A system for performing atomic force measurements including: a sensor including: a beam having a first side and a second side, the beam including a tip positioned on a surface of the first side for interacting with a sample; and a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam; a light source optically coupled to an input of the sensor for inputting light; and an analyser coupled to an output of the sensor; wherein the beam and the interrogating grating coupler form a resonant cavity, a movement of the beam modulates the light source and the analyser determines a deflection of the beam according to the modulated light. | 08-08-2013 |
| 20130340126 | Multiple Frequency Atomic Force Microscopy - An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described. | 12-19-2013 |
| 20140020140 | MULTI-HEAD PROBE AND MANUFACTURING AND SCANNING METHODS THEREOF - A multi-head probe suitable for an atomic force microscopy (AFM) comprises a tip base, a single cantilever beam and at least two tips. The tip base has a tip end, which is ground to form a surface. The cantilever beam is connected to the tip base and for supporting the tip base. The at least two tips are disposed on the surface. | 01-16-2014 |
| 20140020141 | MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING - A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling. | 01-16-2014 |
| 20140041084 | Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy - Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information using contact resonance with multiple excitation signals are also described. | 02-06-2014 |
| 20140304863 | Marking Paper Products - Methods of marking paper products and marked paper products are provided. Some methods include irradiating the paper product to alter the functionalization of the paper. | 10-09-2014 |
| 20140352005 | TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQUID INTERFACE WITH AN ATOMIC FORCE MICROSCOPE - A mechanism is provided for sequencing a biopolymer. The biopolymer is traversed from a first medium to a second medium. The biopolymer includes bases. As the biopolymer traverses from the first medium to the second medium, different forces are measured corresponding to each of the bases. The bases are distinguished from one another according to the different measured forces which are measured for each of the bases. | 11-27-2014 |
| 20150020245 | METHODS AND SYSTEMS FOR OPTIMIZING FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY - Energy dissipation measurements in Frequency Modulation-Atomic Force Microscopy (FM-AFM) should provide additional information for dynamic force measurements as well as energy dissipation maps for robust material properties imaging as they should not be dependent directly upon the cantilever surface interaction regime. However, unexplained variabilities in experimental data have prevented progress in utilizing such energy dissipation studies. The inventors have demonstrated that the frequency response of the piezoacoustic cantilever excitation system, traditionally assumed flat, can actually lead to surprisingly large apparent damping by the coupling of the frequency shift to the drive-amplitude signal. Accordingly, means for correcting this source of apparent damping are presented allowing dissipation measurements to be reliably obtained and quantitatively compared to theoretical models. The methods are non-destructive and can be both easily and routinely integrated into FM-AFM measurements within vacuum environments where measurements exploiting prior art solutions cannot be performed. | 01-15-2015 |
| 20150047080 | COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICROSCOPE COMBINED, CONTROL DEVICE OF THE SAME, CONTROL METHOD AND CONTROL PROGRAM, AND STORAGE MEDIUM - A compound microscope includes an optical microscope to acquire time-series successive optical observation images of an observation target, a scanning probe microscope to acquire time-series successive probe-derived observation images of the observation target, and a control device to simultaneously give a common control command to the optical microscope and the scanning probe microscope. | 02-12-2015 |
| 20150067932 | AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE IMAGING AND SPECTROSCOPY - A method of using a AFM/NMR probe, the method comprising the steps of injecting a sample to be analyzed with magnetic particles, introducing a probe into proximity with the sample, the probe capable of both transmitting and sensing electromagnetic radiation; generating a magnetic field via the probe, and adjusting the magnitude of the magnetic field to manipulate the magnetic particles within the sample. | 03-05-2015 |
| 20150106979 | OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PROBE SPECTROSCOPY MEASUREMENTS APPLIED IN A WIDE SPATIAL REGION WITH AN EXTENDED RANGE OF FORCE SENSITIVITY - An optical and atomic force microscopy measurement integrated system is described. The system has an atomic force microscope having a first probe configured to interact with a sample to be analysed, an optical tweezer, a second probe configured to be held in the focus of the optical tweezer, movement means for moving the two probes, measurement means for measuring the variations of position of the two probes and processing means configured to receive, as an input, the measurement signals of the two probes to generate an output signal representative of the sample. | 04-16-2015 |
| 20150301080 | Automated Atomic Force Microscope and the Operation Thereof - Improvements for rapidly calibrating and automatically operating a scanning probe microscope are disclosed. A central component of the SPM is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized, resulting in high-throughput, repeatable and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, avoiding tip or sample damage from the beginning of the measurement process. | 10-22-2015 |
| 20160053312 | TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQUID INTERFACE WITH AN ATOMIC FORCE MICROSCOPE - A mechanism is provided for sequencing a biopolymer. The biopolymer is traversed from a first medium to a second medium. The biopolymer includes bases. As the biopolymer traverses from the first medium to the second medium, different forces are measured corresponding to each of the bases. The bases are distinguished from one another according to the different measured forces which are measured for each of the bases. | 02-25-2016 |
| 20160085003 | MATERIALS, COMPONENTS, AND METHODS FOR USE WITH EXTREME ULTRAVIOLET RADIATION IN LITHOGRAPHY AND OTHER APPLICATIONS - Nanostructured photonic materials, and associated components for use in devices and systems operating at ultraviolet (UV), extreme ultraviolet (EUV), and/or soft Xray wavelengths are described. Such a material may be fabricated with nanoscale features tailored for a selected wavelength range, such as at particular UV, EUV, or soft Xray wavelengths or wavelength ranges. Such a material may be used to make components such as mirrors, lenses or other optics, panels, lightsources, masks, photoresists, or other components for use in applications such as lithography, wafer patterning, astronomical and space applications, biomedical applications, biotech or other applications. | 03-24-2016 |
| 20090100553 | SCANNING PROBE-BASED LITHOGRAPHY METHOD - A resist medium in which features are lithographically produced by scanning a surface of the medium with an AFM probe positioned in contact therewith. The resist medium comprises a substrate; and a polymer resist layer within which features are produced by mechanical action of the probe. The polymer contains thermally reversible crosslinkages. Also disclosed are methods that generally includes scanning a surface of the polymer resist layer with an AFM probe positioned in contact with the resist layer, wherein heating the probe and a squashing-type mechanical action of the probe produces features in the layer by thermally reversing the crosslinkages. | 04-16-2009 |
| 20090133168 | SCANNING PROBE MICROSCOPE - A scanning probe microscope is provided, which can be stably used for a long time even if excitation efficiency varies during scan. A cantilever ( | 05-21-2009 |
| 20090151030 | DUAL TIP ATOMIC FORCE MICROSCOPY PROBE AND METHOD FOR PRODUCING SUCH A PROBE - One inventive aspect is related to an atomic force microscopy probe. The probe comprises a tip configuration with two probe tips on one cantilever arm. The probe tips are electrically isolated from each other and of approximately the same height with respect to the cantilever arm. The outer surface of the tip configuration has the shape of a body with a base plane and an apex. The body is divided into two sub-parts by a gap located approximately symmetrically with respect to the apex and approximately perpendicular to the base plane. Another inventive aspect related to methods for producing such an AFM probe. | 06-11-2009 |
| 20090178165 | CANTILEVER WITH PIVOTING ACTUATION - Improved actuation device useful in direct-write nanolithography and imaging including use of a pivot point for downward deflection of a cantilever with long travel path. A device comprising at least one holder, at least one cantilever, an extension of the said cantilever wherein the extension is integrated with an actuator, wherein the cantilever is adapted for actuated movement. The actuator can be electrostatic, thermal, or piezoelectric. The cantilever can comprise a tip, and material can be transferred from the tip to a surface. | 07-09-2009 |
| 20090205091 | Array and cantilever array leveling - Faster and better methods for leveling arrays including software and user interface for instruments. A method comprising: (i) providing at least one array of cantilevers supported by at least one support structure, (ii) providing at least one substrate, (iii) providing at least one instrument to control the position of the array with respect to the substrate, (iv) leveling the array with respect to the substrate, wherein the leveling is performed via a user interface on the instrument which is adapted to have the user input positional information from the motors and piezoelectric extender when at least one cantilever deflects from the substrate. Uniform z-displacements can be achieved. | 08-13-2009 |
| 20090222958 | Method and Apparatus for Obtaining Quantitative Measurements Using a Probe Based Instrument - A method includes determining the point at which a tip of a probe based instrument contacts a sample and/or the area of that contact by dynamically oscillating a cantilever of the instrument in flexural and/or torsional modes. The method additionally includes using oscillation characteristics, such as amplitude, phase, and resonant frequency, to determine the status of the contact and to provide quantitative data. Static and quasi-static measurements, including contact stiffness and elastic modulus, can be obtained from the thus obtained data. Quasistatic measurements, such as creep and viscoelastic modulus, can be obtained by repeating the static measurements for a number of force profiles at different force application rates and correlating the resultant data using known theories. | 09-03-2009 |
| 20090249521 | High frequency deflection measurement of IR absorption - An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community. | 10-01-2009 |
| 20090255016 | APPARATUS STRUCTURE AND SCANNING PROBE MICROSCOPE INCLUDING APPARATUS STRUCTURE - Provided are a structure of an apparatus for analysis, inspection, and measurement in which a support structure supporting a detection unit is resistant to disturbance, suppresses a reduction in resolution during large-sample measurement, and has high rigidity, and a probe microscope using the apparatus structure. The apparatus structure supporting the detection unit which is opposed to a sample which is located on a unit movable in at least one axis direction and is an object to be analyzed has an arch shape. In the apparatus structure having the arch shape and supporting the detection unit, a surface substantially perpendicular to a flat surface portion of a sample holder located immediately under the apparatus structure is formed. The detection unit is supported on the perpendicular surface. The arch-shaped apparatus structure is a curved structure consistent with a catenary curve. | 10-08-2009 |
| 20090260113 | Probe Microscope Setup Method - A scanning probe microscope and method of operation for monitoring and assessing proper tracking between the tip and sample, as well as automating at least some aspects of AFM setup previously done manually. Preferably, local slopes corresponding to the acquired data are compared to determine a tracking metric that is self-normalizing. | 10-15-2009 |
| 20090293161 | CANTILEVER DEVICE AND CANTILEVER CONTROLLING METHOD - The amplitude control of a cantilever based on the van der Pol model is performed through a feedback using the measurement data on a deflection of the cantilever. A self-oscillating circuit integrates a deflection angle signal of a cantilever detected by a deflection angle measuring mechanism using an integrator, multiplies a resulting integral value by linear feedback gain K | 11-26-2009 |
| 20090300806 | ATOMIC FORCE MICROSCOPE - A surface shape of a member to be measured is measured by reflecting measuring light at a reflection surface of a probe and utilizing an atomic force exerting between the probe and utilizing an atomic force exerting between the probe and the member to be measured. In addition to a first scanner for driving the probe, a second scanner for moving a focus position of an optical system is provided. Position conversion data representing a correlation between amounts of control of the first scanner and the second scanner are obtained in advance. By synchronously driving the first scanner and the second scanner, the focus position of the optical system is caused to follow the probe to improve measurement accuracy. | 12-03-2009 |
| 20090313729 | SCAN TYPE PROBE MICROSCOPE AND CANTILEVER DRIVE DEVICE - A driving laser unit ( | 12-17-2009 |
| 20100017924 | METHOD FOR USING AN ATOMIC FORCE MICROSCOPE - The present invention relates to a method of using an atomic force microscope comprising exciting natural lower and higher vibration modes of a microlever (M) placed on a sample, and analyzing the variation of one variable of a first output signal (A | 01-21-2010 |
| 20100024082 | ATOMIC FORCE MICROSCOPE - There is provided an atomic force microscope (AFM) with increase the speed and sensitivity of detection of the resonant frequency shift in a cantilever. An AFM ( | 01-28-2010 |
| 20100031404 | Scanning Probe Microscope With Periodically Phase-Shifted AC Excitation - The scanning probe microscope applies a sum of an AC voltage (Uac) and a DC voltage (Udc) to its probe. The frequency of the AC voltage (Uac) substantially corresponds to the mechanical oscillation frequency of the probe, but its phase in respect to the mechanical oscillation varies periodically. The phase modulation has a frequency fmod. The microscope measures the frequency (f) or the amplitude (K) of a master signal (S) applied to the probe's actuator, or it measures the phase of the mechanical oscillation of the cantilever in respect to the master signal (S). The spectral component at frequency fmod of the measured signal is fed to a feedback loop controller, which strives to keep it zero by adjusting the DC voltage (Udc), thereby keeping the DC voltage at the contact voltage potential. | 02-04-2010 |
| 20100064397 | CONTROLLED ATOMIC FORCE MICROSCOPE - The invention relates to an atomic force microscope including a microtip placed on a flexible support connected to a microscope head facing a surface to be studied, which includes means for controlling the distance between the head and the surface for a given value and means for inhibiting vibration of the microtip. | 03-11-2010 |
| 20100071099 | ATOMIC FORCE MICROSCOPE AND INTERACTION FORCE MEASUREMENT METHOD USING ATOMIC FORCE MICROSCOPE - A frequency shift Δf obtained by an FM-AFM can be expressed by a simple linear coupling of a Δf | 03-18-2010 |
| 20100088788 | STRESS MICRO MECHANICAL TEST CELL, DEVICE, SYSTEM AND METHODS - The invention provides a stress micro mechanical system for measuring stress and strain in micro- and nano-fibers tubes, and wires as well as for measuring the interface adhesion force and stress in nanofibers and nanotubes embedded in a polymer matrix. A preferred system of the invention has a substrate for supporting a MEMS fabrication. The MEMS fabrication includes freestanding sample attachment points that are movable in a translation direction relative to one another when the substrate is moved and a sample is attached between the sample attachment points. An optical microscope images surfaces of the MEMS fabrication. Software conducts digital image correlation on obtained images to determine the movement of the surfaces at a resolution much greater than the hardware resolution of the optical microscope. A preferred method for measuring stress and strain in micro- and nano-fibers, tubes, and wires, and/or measuring the force required to pull-out individual micro- and nano-fibers, tubes, and wires from a polymer matrix and to therefore measure interfacial adhesion is also provided. In the method a sample is attached between freestanding platforms in a MEMS device. Relative translational movement between the platforms is created and motion of the platforms is imaged with an optical microscope. Mechanical and adhesion properties of the sample are determined by applying a digital image correlation algorithm to the image data. | 04-08-2010 |
| 20100115674 | ATOMIC FORCE MICROSCOPE APPARATUS - An object of the present invention is to provide an atomic force microscope apparatus allowing tracking errors to be made as close to zero as possible to reduce images obtained through high-speed scanning from being degraded. To accomplish the object of the present invention, the present invention provides an atomic force microscope apparatus imaging a surface topography of a sample in a contact mode, the apparatus including a cantilever having a probe interacting with the sample surface via an atomic force and being subjected to a deflection by the atomic force, laser light provision means for allowing first laser light to enter the cantilever, light detection means, a controller estimating the surface topography of the sample surface, and data storage means for recording the estimated surface topography. | 05-06-2010 |
| 20100132077 | SURFACE ANALYSIS AND MEASUREMENT METHOD BASED ON FLOW RESISTANCE OF FLUID AND ATOMIC FORCE MICROSCOPE USING THE METHOD - Provided is a surface analysis and measurement method based on the flow resistance of a fluid. The method comprises: spraying a fluid on the surface of a sample; identifying and determining if a flow resistance value of the fluid colliding with the sample surface is optimal for the measurement of the surface topography of the sample; setting the determined optimal flow resistance value to a reference value and moving the sample in the X-Y axes to allow the entire surface of the sample to be scanned; varying the position of the sample in the Z axis together with the X-Y axis movement to adjust varying flow resistance values of the fluid along the irregular surface topography of the sample to the set flow resistance value during scanning; and expressing the movement ranges of the sample in the X, Y and Z axes as numerical values and representing the numerical values as brightness values on a computer screen to display the surface topography of the sample. Further provided is an atomic force microscope using the method. | 05-27-2010 |
| 20100154086 | NOVEL ENHANCED PROCESSES FOR MOLECULAR SCREENING AND CHARACTERIZATION - A general high-throughput screening (HTS) process using an atomic force microscope (AFM) to detect and measure molecular recognition events. The AFM is used to measure changes in molecular complex height, friction, shape, elasticity or any other relevant parameters that report a molecular recognition event. In addition, the force involved in molecular recognition and bonding is directly measured using the technique of force spectroscopy. In one embodiment, a flow chamber is used to introduce molecules and assay their effect on a molecular interaction occurring between molecules on the AFM probe and a surface. In some cases the surface may be an introduced microparticle. In a second embodiment, the sample is a solid phase array of molecules that is interrogated by a functionalized AFM probe, and the effects of introduced agents at each molecular address in the array is measured by force spectroscopy. | 06-17-2010 |
| 20100180356 | Nanoindenter - A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements. | 07-15-2010 |
| 20100192267 | Scanning Probe Microscope with Independent Force Control and Displacement Measurements - A nanoindenter that includes an interferometer, a rod, a force actuator and a controller is disclosed. The interferometer generates a light beam that is reflected from a moveable reflector, the interferometer determining a distance between a reference location and the moveable reflector. The rod is characterized by a rod axis and includes a tip on a first end thereof, the rod includes the moveable reflector at a location proximate to the tip. The tip is disposed in a manner that allows the tip to be forced against the surface of a sample. The force actuator applies a force to the rod in a direction parallel to the rod axis in response to a force control signal coupled to the actuator. The controller receives the determined distance from the interferometer and generates the force control signal. The invention can also be used as a scanning probe microscope. | 07-29-2010 |
| 20100218288 | ATOMIC FORCE MICROSCOPY DEVICES, ARRANGEMENTS AND SYSTEMS - Various embodiments of the present invention are directed to microscopy cantilevers. Consistent with an example embodiment, aspects of the invention are directed to a cantilever having a body and a force sensor arrangement extending from an end of the body and including a tip near a free end of the force sensor arrangement. The force sensor arrangement exhibits a high temporal response to the tip's interaction with a sample, relative to the response of the cantilever. The force sensor arrangement's response is detected and used to characterize the sample. | 08-26-2010 |
| 20100223698 | High Resolution Wide Angle Tomographic Probe - The present invention concerns the enhancing of the mass resolution of wide angle tomographic atom probes. The invention consists of an atom probe also comprising a sample-holding device and a detector which are separated from one another by a distance L and enclosed in a chamber, an “Einzel” type electrostatic lens consisting of three electrodes arranged inside the chamber between the sample and the detector, to which electrical potentials are applied so as to form an electrical field that strongly focuses the beam of ions emitted by the sample under test when the probe is operating. According to the invention, the geometry of the electrodes is defined precisely so as to greatly limit the effects of the spherical aberration that affects the “Einzel” lens on the beam of ions, said spherical aberration being clearly sensitive when the lens is greatly polarized. The invention applies more particularly to the atom probes known as 3D atom probes. | 09-02-2010 |
| 20100235956 | ATOMIC FORCE MICROSCOPY TRUE SHAPE MEASUREMENT METHOD - An atomic force microscopy (AFM) method includes a scanning probe that scans a surface of a structure to produce a first structure image. The structure is then rotated by 90° with respect to the scanning probe. The scanning probe scans the surface of the structure again to produce a second structure image. The first and second structure images are combined to produce best fit image of the surface area of the structure. The same method is used to produce the best fit image of a flat standard. The best fit image of the flat standard is subtracted from the best fit image of the structure to obtain a true topographical image in which Z direction run out error is substantially reduced or eliminated. | 09-16-2010 |
| 20100263098 | METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJECTS TO BE ANALYZED - The invention relates to a method for the combined analysis of a sample with objects to be analysed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analysed in the sample are obtained by analysing the one or more objects to be analysed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analysed by analysing the one or more objects to be analysed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects. | 10-14-2010 |
| 20100269232 | Scanning Probe Microscope that Outputs Metadata with Image - A scanning probe microscope and method for using the same are disclosed. The scanning probe microscope includes a probe mount, a probe position signal generator, and a controller. The probe mount is adapted to receive a probe having a tip that moves in response to an interaction between the tip and a local characteristic of a sample. The probe position signal generator generates a position signal indicative of a position of the probe tip. The controller receives the position signal and derives a pixel value for a corresponding location on the sample from the position signal over a pixel time period. The controller generates an image that includes the pixel value. The controller stores a plurality of intermediate pixel data values at different times during the pixel time period. | 10-21-2010 |
| 20100275334 | Modular atomic force microscope - A modular AFM/SPM which provides faster measurements, in part through the use of smaller probes, of smaller forces and movements, free of noise artifacts, that the old generations of these devices have increasingly been unable to provide. The modular AFM/SPM includes a chassis, the foundation on which the modules of the instrument are supported; a view module providing the optics for viewing the sample and the probe; a head module providing the components for the optical lever arrangement and for steering and focusing those components; a scanner module providing the XYZ translation stage that actuates the sample in those dimensions and the engage mechanism; a isolation module that encloses the chassis and provides acoustic and/or thermal isolation for the instrument and an electronics module which, together with the separate controller, provide the electronics for acquiring and processing images and controlling the other functions of the instrument. All these modules and many of their subassemblies are replaceable and potentially upgradeable. This allows updating to new technology as it becomes available. | 10-28-2010 |
| 20100281586 | METHOD AND DEVICE TO PROBE A MEMBRANE BY APPLYING AN IN-PLANE ELECTRIC FIELD - The present invention disposes a membrane between two electrical conductive walls having a height at least as great as the thickness of the membrane. The conductive walls are fabricated on an electrically insulative chip base. The chip base has one or more through hole between the electrically conducting walls. The chip is placed inside a container having a well below the through hole of the electrically insulative base. At least one passageway extends from the well to the periphery of the container. This invention probes changes of the membrane as an in-plane electric field is applied between the conductive walls. The well may include various compounds while-other compounds can be placed in contact with the top of the membrane. The passageways are used to introduce substances into and out of the well. | 11-04-2010 |
| 20100325761 | Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force. | 12-23-2010 |
| 20110047662 | APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFERENT MATERIALS - The present invention relates to an apparatus and a method for investigating surface properties of different materials, which make it possible to carry out atomic force microscopy with a simplified and faster shear force method. The apparatus according to the invention is characterized by perpendicular orientation of the measuring tip of a self-actuated cantilever with respect to the surface of the sample. A piezoresistive sensor and a bimorph actuator are preferably DC-isolated. The measuring tip is in the form of a carbon nanotube, in particular. A plurality of cantilevers can be arranged in the form of a cantilever array which is characterized by a comb-like arrangement of individual pre-bent cantilevers. The method according to the invention is distinguished by a fast feedback signal on account of the distance between the measuring tip and the surface to be investigated being regulated using the change in a DC signal which supplies the actuator. | 02-24-2011 |
| 20110055985 | DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND MODIFICATION OF SURFACE PROPERTIES - The invention relates to a device for an atomic force microscope (AFM) for the study and/or modification of surface properties. The device comprises a cantilever (flexible bar) having an integrated, piezoresistive sensor, an integrated bimorphic actuator, and a measuring tip. The measuring tip carries at least two metal electrodes, which can be activated via electrical terminals. The measuring tip and/or the cantilever have at least one nanoscopic hole through which synchrotron radiation or laser light is directed onto the material surface to be studied. Furthermore, the invention relates to a method for the study and modification of surface properties and surface-proximal properties, which can be executed using such a device. To this end, atomic force microscopy (AFM), surface enhanced Raman scattering (SERS), photo emission spectroscopy (XPS, XAS), and material modification by local exposure are executed in sequence or simultaneously using the same device. | 03-03-2011 |
| 20110055986 | Athermal Atomic Force Microscope Probes - An atomic force microscopy system includes an imaging probe having a first thermal displacement constant and a sample placement surface. At least a portion of the sample placement surface has a second thermal displacement constant. The sample placement surface is spaced apart from the imaging probe at a predetermined displacement. The sample placement surface is configured so that the second thermal displacement constant matches the first thermal displacement constant so that when the imaging probe and the sample placement surface are subject to a predetermined temperature, both the portion of the sample placement surface and the imaging prove are displaced by a same distance. | 03-03-2011 |
| 20110067150 | Cantilever with paddle for operation in dual-frequency mode - A microcantilever system comprising a paddle, its use and a method of simultaneously acquiring the topography and measuring the tip-sample interactions of a sample with it. | 03-17-2011 |
| 20110093990 | METHOD AND STRUCTURE FOR CHARACTERISING AN ATOMIC FORCE MICROSCOPY TIP - A method for characterising an atomic force microscopy tip using a characterisation structure having two inclined sidewalls opposite one another and of which at least one actual lateral distance separating the two inclined sidewalls corresponding to a given height is known, the method including scanning the surfaces of the inclined sidewalls by the tip, the scanning being carried out while the tip oscillates solely vertically; measuring, for the given height, the lateral distance separating the two inclined sidewalls, the measurement incorporating the convolution of the shape of the tip with the shape of the characterisation structure; and determining a characteristic dimension of the tip as a function of the measured lateral distance, and of the actual lateral distance. | 04-21-2011 |
| 20110167525 | PROBE DETECTION SYSTEM - A probe detection system ( | 07-07-2011 |
| 20110265227 | PIEZOELECTRIC MICROCANTILEVERS AND USES IN ATOMIC FORCE MICROSCOPY - The invention is direct to a piezoelectric microcantilever for static contact and dynamic noncontact atomic force microscopy which may be carried out in solution. The piezoelectric microcantilever, which includes a piezoelectric layer and a non-piezoelectric layer is capable of self actuation and detection. The piezoelectric layer may be constructed from a lead magnesium niobate-lead titanate (Pb(Mg | 10-27-2011 |
| 20110283428 | High frequency deflection measurement of IR absorption - An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that cab be made generally available to the scientific community. | 11-17-2011 |
| 20110296563 | FLEXIBLY DISPLACEABLE COUPLING DEVICE FOR ACOUSTICALLY EXCITED ATOMIC FORCE MICROSCOPY WITH ACOUSTIC EXCITATION OF THE SAMPLE - A coupling device for an atomic force microscope with acoustic sample excitation includes a sound generator, in particular an ultrasonic test head, and designed for coupling of sound waves generated using the sound generator into a sample body for the acoustic excitation of the sample body, where the coupling device has a liquid reservoir fillable and/or filled with a liquid in its inner space; the lower side of the sample body can be arranged and/or is arranged laterally displaceably on the liquid reservoir; the end of the sound generator formed for coupling the sound waves into the sample body is arranged in the inner space of the liquid reservoir and/or that sound waves can be coupled into the inner space with this end; and the spatial section of the inner space of the liquid reservoir disposed between this end and the lower side of the sample body is completely fillable and/or filled with the liquid. | 12-01-2011 |
| 20110302677 | DETECTION AND CHARACTERIZATION OF LASER-INDUCED HEAT AFFECTED ZONES ON POLYMER BASED DEVICES - Detection and characterization of laser-induced heat affected zones on polymer based devices, such as polymeric stents, are described where Nano Thermal Analysis may be used with atomic force microscopy to obtain the thermal behavior of materials with a spatial resolution of under, e.g., 100 nm. Heat may be applied locally to the measured polymeric stem via a probe tip and the resulting thermal-mechanical response can be measured. | 12-08-2011 |
| 20110307980 | HIGH-SPEED AND HIGH-RESOLUTION ATOMIC FORCE MICROSCOPE - According to example embodiments, an atomic force microscope includes a probe tip, a cantilever including the probe tip, a displacement measurement device, and a movement device. A vibrating displacement of the cantilever changes according to a force between atoms of the probe tip and atoms of a surface of a sample. The displacement measurement device is configured to irradiate a beam emitted from a light source on the cantilever and to measure a displacement of the cantilever based on the beam reflected from the cantilever. The movement device is configured to move the cantilever and the displacement measurement device simultaneously when the sample is scanned. | 12-15-2011 |
| 20120036602 | Video rate-enabling probes for atomic force microscopy - Method for producing a probe for atomic force microscopy with a silicon nitride cantilever and an integrated single crystal silicon tetrahedral tip with high resonant frequencies and low spring constants intended for high speed AFM imaging. | 02-09-2012 |
| 20120079634 | TANDEM PIEZOELECTRIC ACTUATOR AND SINGLE DRIVE CIRCUIT FOR ATOMIC FORCE MICROSCOPY - An apparatus for atomic force microscopy (AFM) comprises a first actuator configured to move a cantilever along an axis; a second actuator configured to move the cantilever along the axis; an amplifier; and a crossover network connected between the amplifier, and the first actuator and the second actuator. The crossover network is adapted to provide a first drive signal to the first actuator over a first frequency range and to provide a second drive signal to the second actuator over a second frequency range. | 03-29-2012 |
| 20120079635 | METHODS AND DEVICES FOR CORRECTING ERRORS IN ATOMIC FORCE MICROSCOPY - In certain embodiments, a probe scans a surface to produce a first scan. The first scan is used to estimate a vertical offset for scanning the surface to produce a second scan. In certain embodiments, an AFM device engages a probe to a surface using a piezo voltage. The probe scans the surface to produce a first scan. The first scan is used to estimate a vertical offset such that the probe uses the piezo voltage to engage the surface for a second scan at a different vertical position. | 03-29-2012 |
| 20120117695 | AFM MEASURING METHOD AND SYSTEM THEREOF - Provided are an AFM measuring method and a system thereof. The tip of a cantilever is provided to a plurality of points on a substrate, to which incident light is radiated from a light source. Scattered light is generated between the tip of the cantilever and the substrate by the incident light and the intensity of the scattered light is measured. The measured intensity of the scattered light is input to a data processing unit so as to find a point where the intensity of the incident is highest. The tip of the cantilever is moved to the point where the intensity of the incident light is highest. | 05-10-2012 |
| 20120131703 | QUANTITATIVE ANALYSIS OF MRNA AND PROTEIN EXPRESSION - Provided is a highly selective and non-destructive method and apparatus for the measurement of one or more target molecules within a target environment. The apparatus comprises of a modified AFM (atomic force microscope) tip to create a tapered nanoscale co-axial cable, and wherein the application of an alternating potential between the inner and outer electrodes of the co-axial cable creates a dielectrophoretic force for attracting molecules toward the tip-end which is pre-treated with one or more specific ligands. | 05-24-2012 |
| 20120216322 | Digital Q control for enhanced measurement capability in cantilever-based instruments - A digital system for controlling the quality factor in a resonant device. The resonant device can be a a device that includes a cantilever within its system, such as an atomic force microscope. The quality factor can be digitally controlled to avoid noise effect in the analog components. A direct digital synthesizer implemented in a way that provides access to the output of the phase accumulator. That output is a number which usually drives a lookup table to produce a cosine or sine output wave. The output wave is created, but the number is also adjusted to form a second number that drives a second lookup table to create an adjustment factor to adjust the output from the cosine table. The adjusted digital signal than drives a DA converter which produces an output drive for the cantilever. | 08-23-2012 |
| 20120278957 | Scanning probe microscope with compact scanner - A scanner for a scanning probe microscope (SPM) including a head has a scanner body that houses an actuator, and a sensor that detects scanner movement. The scanner body is removable from the head by hand and without the use of tools and has a total volume of less than about five (5) square inches. Provisions are made for insuring that movement of a probe device coupled to the scanner is restricted to be substantially only in the intended direction. A fundamental resonance frequency for the scanner can be greater than 10 kHz. | 11-01-2012 |
| 20120278958 | Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy in Liquid - Provided are methods and systems for high resolution imaging of a material immersed in liquid by scanning probe microscopy. The methods further relate to imaging a material submersed in liquid by tapping mode atomic force microscopy (AFM), wherein the AFM has a microfabricated AFM probe comprising a nanoneedle probe connected to a cantilever beam. The nanoneedle probe is immersed in the liquid, and the rest of the AFM probe, including the cantilever beam to which the nanoneedle probe is attached, remains outside the liquid. The cantilever is oscillated and the nanoneedle probe tip taps the material to image the material immersed in liquid. In an aspect, the material is supported on a shaped substrate to provide a spatially-varying immersion depth with specially defined regions for imaging by any of the methods and systems of the present invention. | 11-01-2012 |
| 20120304343 | AUTOMATIC GAIN TUNING IN ATOMIC FORCE MICROSCOPY - A method for optimizing loop gain of an atomic force microscope (AFM) apparatus includes determining a change in gain of the physical system and adjusting a controller frequency response of the controller in an AFM loop to compensate for the determined change in gain. The AFM loop has a corresponding loop response that includes the product of the controller frequency response and a physical system response of the physical system. | 11-29-2012 |
| 20130081159 | ADVANCED ATOMIC FORCE MICROSCOPY SCANNING FOR OBTAINING A TRUE SHAPE - Advanced atomic force microscopy (AFM) methods and apparatuses are presented. An embodiment may comprise performing a first scan at a first angle, a second scan at a second angle, and correcting a system drift error in the first scan based on the second scan. Another embodiment may comprise performing a global scan of a first area, a local scan of a second area within the first area, correcting a leveling error in the local scan based on the global scan, and outputting a corrected sample image. Another embodiment may comprise performing a first scan at a first position at a first angle, a second scan at a flat region using the same scan angle and scan size to correct a scanner runout error in the first scan based on the second scan. | 03-28-2013 |
| 20130111636 | NON-LINEAR INTERACTION IMAGING AND SPECTROSCOPY | 05-02-2013 |
| 20130174301 | METHOD AND APPARATUS FOR IN SITU PREPARATION OF SERIAL PLANAR SURFACES FOR MICROSCOPY - Systems and methods for preparing solid samples for analysis, such as microscopic examination in cross section or planimetric orientation. The sample preparation systems may include a sample support configured to secure a solid sample, an excitation beam source that generates an excitation beam configured to remove material from a surface of the sample, a beam shield configured to at least partially protect the sample from the excitation beam, and a beam shield holder configured to secure the beam shield, where the adjustment of the relative positions of the beam shield and sample holder permits the excitation beam to selectively expose a series of substantially planar surfaces of the sample. | 07-04-2013 |
| 20130205455 | SYSTEM AND METHOD OF PERFORMING ATOMIC FORCE MEASUREMENTS - A system for performing atomic force measurements including: a sensor including: a beam having a first side and a second side, the beam including a tip positioned on a surface of the first side for interacting with a sample; and a grating structure positioned adjacent the second side of the beam, the grating structure including an interrogating grating coupler configured to direct light towards the beam; a light source optically coupled to an input of the sensor for inputting light; and an analyser coupled to an output of the sensor; wherein the beam and the interrogating grating coupler form a resonant cavity, a movement of the beam modulates the light source and the analyser determines a deflection of the beam according to the modulated light. | 08-08-2013 |
| 20130340126 | Multiple Frequency Atomic Force Microscopy - An apparatus and technique for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work is described. | 12-19-2013 |
| 20140020140 | MULTI-HEAD PROBE AND MANUFACTURING AND SCANNING METHODS THEREOF - A multi-head probe suitable for an atomic force microscopy (AFM) comprises a tip base, a single cantilever beam and at least two tips. The tip base has a tip end, which is ground to form a surface. The cantilever beam is connected to the tip base and for supporting the tip base. The at least two tips are disposed on the surface. | 01-16-2014 |
| 20140020141 | MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING - A method of analyzing a sample that includes applying a first set of energies at a first set of frequencies to a sample and applying, simultaneously with the applying the first set of energies, a second set of energies at a second set of frequencies, wherein the first set of energies and the second set of energies form a multi-mode coupling. The method further includes detecting an effect of the multi-mode coupling. | 01-16-2014 |
| 20140041084 | Material Property Measurements Using Multiple Frequency Atomic Fore Microscopy - Apparatus and techniques for extracting information carried in higher eigenmodes or harmonics of an oscillating cantilever or other oscillating sensors in atomic force microscopy and related MEMs work are described. Similar apparatus and techniques for extracting information using contact resonance with multiple excitation signals are also described. | 02-06-2014 |
| 20140304863 | Marking Paper Products - Methods of marking paper products and marked paper products are provided. Some methods include irradiating the paper product to alter the functionalization of the paper. | 10-09-2014 |
| 20140352005 | TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQUID INTERFACE WITH AN ATOMIC FORCE MICROSCOPE - A mechanism is provided for sequencing a biopolymer. The biopolymer is traversed from a first medium to a second medium. The biopolymer includes bases. As the biopolymer traverses from the first medium to the second medium, different forces are measured corresponding to each of the bases. The bases are distinguished from one another according to the different measured forces which are measured for each of the bases. | 11-27-2014 |
| 20150020245 | METHODS AND SYSTEMS FOR OPTIMIZING FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY - Energy dissipation measurements in Frequency Modulation-Atomic Force Microscopy (FM-AFM) should provide additional information for dynamic force measurements as well as energy dissipation maps for robust material properties imaging as they should not be dependent directly upon the cantilever surface interaction regime. However, unexplained variabilities in experimental data have prevented progress in utilizing such energy dissipation studies. The inventors have demonstrated that the frequency response of the piezoacoustic cantilever excitation system, traditionally assumed flat, can actually lead to surprisingly large apparent damping by the coupling of the frequency shift to the drive-amplitude signal. Accordingly, means for correcting this source of apparent damping are presented allowing dissipation measurements to be reliably obtained and quantitatively compared to theoretical models. The methods are non-destructive and can be both easily and routinely integrated into FM-AFM measurements within vacuum environments where measurements exploiting prior art solutions cannot be performed. | 01-15-2015 |
| 20150047080 | COMPOUND MICROSCOPE WITH SCANNING PROBE MICROSCOPE AND OPTICAL MICROSCOPE COMBINED, CONTROL DEVICE OF THE SAME, CONTROL METHOD AND CONTROL PROGRAM, AND STORAGE MEDIUM - A compound microscope includes an optical microscope to acquire time-series successive optical observation images of an observation target, a scanning probe microscope to acquire time-series successive probe-derived observation images of the observation target, and a control device to simultaneously give a common control command to the optical microscope and the scanning probe microscope. | 02-12-2015 |
| 20150067932 | AFM-COUPLED MICROSCALE RADIOFREQUENCY PROBE FOR MAGNETIC RESONANCE IMAGING AND SPECTROSCOPY - A method of using a AFM/NMR probe, the method comprising the steps of injecting a sample to be analyzed with magnetic particles, introducing a probe into proximity with the sample, the probe capable of both transmitting and sensing electromagnetic radiation; generating a magnetic field via the probe, and adjusting the magnitude of the magnetic field to manipulate the magnetic particles within the sample. | 03-05-2015 |
| 20150106979 | OPTICAL AND ATOMIC FORCE MICROSCOPY INTEGRATED SYSTEM FOR MULTI-PROBE SPECTROSCOPY MEASUREMENTS APPLIED IN A WIDE SPATIAL REGION WITH AN EXTENDED RANGE OF FORCE SENSITIVITY - An optical and atomic force microscopy measurement integrated system is described. The system has an atomic force microscope having a first probe configured to interact with a sample to be analysed, an optical tweezer, a second probe configured to be held in the focus of the optical tweezer, movement means for moving the two probes, measurement means for measuring the variations of position of the two probes and processing means configured to receive, as an input, the measurement signals of the two probes to generate an output signal representative of the sample. | 04-16-2015 |
| 20150301080 | Automated Atomic Force Microscope and the Operation Thereof - Improvements for rapidly calibrating and automatically operating a scanning probe microscope are disclosed. A central component of the SPM is the force transducer, typically a consumable cantilever element. By automatically calibrating transducer characteristics along with other instrumental parameters, scanning parameters can be rapidly and easily optimized, resulting in high-throughput, repeatable and accurate measurements. In contrast to dynamic optimization schemes, this can be accomplished before the surface is contacted, avoiding tip or sample damage from the beginning of the measurement process. | 10-22-2015 |
| 20160053312 | TARGETED SEQUENCING OF BIOMOLECULES BY PULLING THROUGH A LIQUID-LIQUID INTERFACE WITH AN ATOMIC FORCE MICROSCOPE - A mechanism is provided for sequencing a biopolymer. The biopolymer is traversed from a first medium to a second medium. The biopolymer includes bases. As the biopolymer traverses from the first medium to the second medium, different forces are measured corresponding to each of the bases. The bases are distinguished from one another according to the different measured forces which are measured for each of the bases. | 02-25-2016 |
| 20160085003 | MATERIALS, COMPONENTS, AND METHODS FOR USE WITH EXTREME ULTRAVIOLET RADIATION IN LITHOGRAPHY AND OTHER APPLICATIONS - Nanostructured photonic materials, and associated components for use in devices and systems operating at ultraviolet (UV), extreme ultraviolet (EUV), and/or soft Xray wavelengths are described. Such a material may be fabricated with nanoscale features tailored for a selected wavelength range, such as at particular UV, EUV, or soft Xray wavelengths or wavelength ranges. Such a material may be used to make components such as mirrors, lenses or other optics, panels, lightsources, masks, photoresists, or other components for use in applications such as lithography, wafer patterning, astronomical and space applications, biomedical applications, biotech or other applications. | 03-24-2016 |
