Class / Patent application number | Description | Number of patent applications / Date published |
702170000 | Thickness or width | 57 |
20080243433 | METHODS AND APPARATUS FOR GENERATING A LIBRARY OF SPECTRA - A method of generating a library from a reference substrate for use in processing product wafers is described. The method includes measuring substrate characteristics at a plurality of well-defined points of a reference substrate, measuring spectra at plurality of measurement points of the reference substrate, there being more measurement points than well-defined points, and associating measured spectra with measured substrate characteristics. | 10-02-2008 |
20090089008 | Methods and Systems for Monitoring a Solid-Liquid Interface - Methods and systems are provided for monitoring a solid-liquid interface, including providing a vessel configured to contain an at least partially melted material; detecting radiation reflected from a surface of a liquid portion of the at least partially melted material; providing sound energy to the surface; measuring a disturbance on the surface; calculating at least one frequency associated with the disturbance; and determining a thickness of the liquid portion based on the at least one frequency, wherein the thickness is calculated based on L=(2m−1)v | 04-02-2009 |
20090138235 | MAGNETIC WINDING AND METHOD OF MAKING SAME - The present invention provides an improved magnetic winding and method of calculating desired winding parameters (winding layer thickness, number of winding layers and number of turns per winding layer) for a winding in a magnetic component. The invention may be applied to general boundary conditions in a magnetic winding or component and considers relative phase displacement for sinusoidal and nonsinusoidal winding currents. Ratios of magnetic surface field intensities at corresponding inner and outer boundaries of one or more winding layer(s) are calculated, and considered with relative phase displacement to select magnetic winding configurations having desired or optimal power dissipation. In certain aspects, a normalized loss function f(H,R,B,Φ) is utilized to determine a preferred construction among a plurality of iteratively generated selections. | 05-28-2009 |
20090157349 | Method of quantifying paint and bodywork on automobiles and other painted objects using coating thickness gauges - A method is disclosed for a test and data retrieval method that not only provides an illustration of an object point condition but also provides a linear numerical data point, that gives the user a quantifiable number to determine the extent of body work and over paint for a pointed object that is being appraised, up for bid, or sold in a private treaty sale or auction. | 06-18-2009 |
20090254306 | APPARATUS AND METHOD FOR MEASURING RECORDING MEDIUM THICKNESS, APPARATUS AND METHOD FOR DETECTING MULTI-FEED OF RECORDING MEDIUM AND APPARATUS AND METHOD FOR FORMING IMAGE - A recording medium thickness measuring apparatus includes: an output value detection unit that detects an output value which fluctuates in accordance with thickness of a recording medium passing through a predetermined position of a transport path; and a calculation unit that calculates the thickness of the recording medium based on a first output value detected by the output value detection unit before passage of the recording medium and after passage of an immediately preceding recording medium in the predetermined position of the transport path, and a second output value detected by the output value detection unit while the recording medium is passing through the predetermined position. | 10-08-2009 |
20090319225 | APPARATUS FOR AND A METHOD OF DETERMINING SURFACE CHARACTERISTICS - Light from a light source ( | 12-24-2009 |
20100174508 | SYSTEMS AND METHODS FOR MONITORING SYSTEM PERFORMANCE - The present disclosure includes systems, apparatus, and methods for monitoring a pipeline network having plural inspection sites. The system comprises a memory module associated with one or more inspection sites, with each memory module storing one or more performance parameters corresponding to the associated inspection site. The system also comprises a measuring device operable to collect performance data of each associated inspection site. The system further comprises a portable reader configured to read the memory module, and in association with the measuring device, to compare the one or more performance parameters with the performance data to validate the performance data while in proximity to the associated inspection site. | 07-08-2010 |
20100198554 | MEASUREMENT OF THICKNESS OF DIELECTRIC FILMS ON SURFACES - A system and method by which thickness of a dielectric film on substrates can be noninvasively determined is invented. The system and method are especially applicable to areas and applications where traditional techniques have proven unsuccessful or limited. According to embodiments of the present invention the present system and method can be used to measure film thickness in confined and inaccessible locations, and on substrates of complex geometry. The method can be used with an arbitrary and time varying orientation of the substrate-film interface. The measurements of the film thickness on the inside of open or enclosed channels of an arbitrary geometry, and on flexible substrates are possible. With multiple embedded sensors, the film thickness in different lateral locations can be simultaneously measured. The dielectric permittivity of the FUT as a function of the distance from the substrate of the film can also be measured. | 08-05-2010 |
20100241397 | MEASUREMENT STAND AND METHOD OF ITS ELECTRICAL CONTROL - The invention relates to a measurement stand for holding a measuring probe intended in particular for measuring the thickness of thin layers, and to a method for controlling the measurement stand. | 09-23-2010 |
20100250186 | SYSTEM FOR MEASURING THICKNESS OF MAILPIECES - A method of measuring a thickness of mailpieces includes calculating, for each mailpiece comprising a unique collation, an estimated mailpiece thickness value, including combining a measured envelope thickness value, a measured insert thickness value for each insert associated with the mailpiece, and a theoretical document thickness value for an input document associated with the mailpiece. The method further includes assembling the mailpiece, obtaining a measured mailpiece thickness value for the mailpiece, and comparing the measured mailpiece thickness value with the estimated mailpiece thickness value. The method further includes, where the measured mailpiece thickness value is within a predetermined tolerance of the estimated mailpiece thickness value, storing the measured mailpiece thickness value as a reference thickness value in a database on a processing device, and where the measured mailpiece thickness value is outside of a predetermined tolerance of the estimated mailpiece thickness value, outsorting the mailpiece. | 09-30-2010 |
20100274526 | METHOD OF DETERMINING THE THICKNESS OF A MAILPIECE - A method of measuring the maximum thickness of a mailpiece while it is moving through a mail-handling machine, the method consisting in the following successive steps:
| 10-28-2010 |
20100305901 | Systems and Methods of Determining and Correlating Technical Information for Wheel Repairs - The present disclosure generally provides systems and methods of determining technical data for wheels and wheel repairs. The system and method could include a graphical user interface (GUI) to input data associated with a wheel. The input data could include information associated with outer and inner radial thicknesses of the wheel, outer and inner lateral thicknesses of the bead, outer and inner diagonal thicknesses of the wheel, outer and inner surface run-out measurements of the wheel, other suitable information related to the wheel, other suitable information, or any combination thereof. The system could further include a network having a database to store the inputted data and having control data associated with wheels. The system could still further include a processor in communication with the database to correlate the input data with the control data and to determine the reparability of the used wheel. | 12-02-2010 |
20110125458 | Spectroscopic Scatterometer System - Before the diffraction from a diffracting structure on a semiconductor wafer is measured, where necessary, the film thickness and index of refraction of the films underneath the structure are first measured using spectroscopic reflectometry or spectroscopic ellipsometry. A rigorous model is then used to calculate intensity or ellipsometric signatures of the diffracting structure. The diffracting structure is then measured using a spectroscopic scatterometer using polarized and broadband radiation to obtain an intensity or ellipsometric signature of the diffracting structure. Such signature is then matched with the signatures in the database to determine the grating shape parameters of the structure. | 05-26-2011 |
20110137610 | METHOD AND APPARATUS FOR DETECTING MAILPIECE THICKNESS IN AN INSERTER SYSTEM - A method of detecting mailpiece thickness includes detecting a leading edge of the mailpiece, moving a detecting roller downwardly over a first predetermined period of time from a first position to a second position where it contacts the mailpiece, increasing a compressive force applied by the detecting roller to the mailpiece from an initial force to a predetermined measurement force over a second predetermined period of time, and applying the measurement force to the mailpiece for a third predetermined period of time. The method further includes applying the measurement force to the mailpiece for a fourth predetermined period of time and making a number of thickness measurements of the mailpiece based on a position of the detecting roller, and determining the thickness of the mailpiece based on the number of thickness measurements. | 06-09-2011 |
20120065931 | SHEET THICKNESS MEASUREMENT APPARATUS - An apparatus and method for measuring substrate media thickness including a nip assembly having a first nip for engaging substrate media and transporting the media along a process direction. The first nip has a nip velocity. A sensor is in operative communication with the first nip for sensing the nip velocity. A processor is operably connected to the sensor. The processor determines a media thickness responsive to a change in nip velocity detected by the velocity sensor upon entry of the media in the first nip. | 03-15-2012 |
20120089366 | ACCURATELY ACCOUNTING FOR SIZING UNCERTAINTY IN INSPECTION - In one embodiment, a method implemented by a processor that receives plural sets of values corresponding to plural matched pairs of anomalies from a first inspection and second inspection following the first inspection, a first portion of each pair corresponding to the first inspection and a second portion of each pair corresponding to the second inspection, the plural sets of values corresponding to wall loss information for plural locations of a fluid carrying vessel; computes first and second statistical descriptions of a respective accuracy of the first and second inspections; and computes a revised estimate of the plural sets of values based on the first and second statistical descriptions. | 04-12-2012 |
20120197593 | Parameter extraction method for semiconductor device - A parameter extraction method for semiconductor devices includes: providing a first multi-finger device and a second multi-finger device, wherein the gate-finger numbers between the first and second multi-finger devices are different; performing an open de-embedding, then the high-frequency test apparatus measuring a first intrinsic gate capacitance of the first multi-finger device and a second intrinsic gate capacitance of the second multi-finger device; calculating a slope according to the first and second intrinsic gate capacitances, and the first and second gate-finger numbers; performing a 3D capacitance simulation for computing the poly finger-end fringing capacitances; utilizing a long channel device for measuring the gate capacitance and extracting the intrinsic gate capacitance, then calculating an inversion channel capacitance per unit area; and computing a delta channel width of the semiconductor device, according to the slope, the poly finger-end fringing capacitance, and the inversion channel capacitance per unit area. | 08-02-2012 |
20120209564 | LOW COST METHOD FOR CREATING PRODUCT CONDITION REPORTS FROM FIELD INSPECTIONS - A low cost method of measuring parameters of a product in the field, such as the coating thickness on an individual vehicle, sends the measurement data set to a common pocket-size device also carried by the inspector, labels the data set, and transmits the data set to a remote computer to produce a product condition report. Alternately, the data can be transmitted directly to a remote buyer. The method is a low cost, practical and efficient because the inspector in the field only requires two pocket-size wireless devices. Inspectors are freed from carrying relatively bulky or heavy computers in the field. Furthermore, the method employs devices already owned by a numerous inspectors and the method requires no proprietary or expensive equipment. The remote computer permits the efficient addition of further information to create detailed reports that are organized or compiled and transmitted to customers. | 08-16-2012 |
20120310596 | NIP WIDTH SENSING METHOD AND SYSTEM FOR INDUSTRIAL ROLLS - A method of determining the width of a nip formed by an industrial roll and a mating structure includes the steps of: providing an industrial roll having a cylindrical core and a polymeric cover surrounding the core, the industrial roll further comprising a plurality of pressure sensors mounted in the roll (optionally distributed in a helical pattern on the roll about a longitudinal axis of the roll); positioning the industrial roll in contact with the mating structure to form a nip; rotating the industrial roll; receiving pressure signals from the plurality of pressure sensors at a controller; and in the controller, utilizing the pressure signals from the pressure sensors to determine the width of the nip at locations on the roll associated with the pressure sensors. | 12-06-2012 |
20130173214 | METHOD AND STRUCTURE FOR INLINE ELECTRICAL FIN CRITICAL DIMENSION MEASUREMENT - A method and test circuit for electrically measuring the critical dimension of a fin of a FinFET is disclosed. The method comprises measuring the resistance of a first gate test structure, measuring the resistance of a second gate test structure, computing a linear equation relating sheet resistance to gate width, computing a Y intercept value of the linear equation to derive an external resistance value, computing a sheet resistance value for the first gate test structure based on the external resistance value, measuring the resistance of a doped fin test structure, and computing a critical dimension of a fin based on the sheet resistance value. | 07-04-2013 |
20130231892 | SYSTEM AND METHOD FOR MEASURING AND MAPPING A SURFACE RELATIVE TO A REFERENCE - A system for measuring the displacement of a surface in a material handling system relative to a base reference is provided. The system includes scanning means to generate point cloud data of the surface relative to a reference point to define a three-dimensional image of the surface, storage means to store base reference data in respect of the base reference, and processing means to process the point cloud data and the base reference data to determine the relative displacement of the surface with respect to the base reference. The processing means includes a referencing means to orientate the point cloud data relative to key reference data of the base surface and transforming the point cloud data and the base reference data into a common co-ordinate system, and displacement processing means to calculate the displacement between the surface and the base reference using both sets of data in the co-ordinate system. | 09-05-2013 |
20130238282 | DEVICE AND METHOD FOR MEASURING ICE THICKNESS - A device and method for measuring ice thickness on a first surface of a construction element. The device includes a sensor arrangement arranged in connection with the construction element and arranged to provide signals related to an impedance. A processing unit is coupled to the sensor arrangement and arranged to determine the presence of ice based on the provided impedance signals. A reference sensor arrangement is arranged to generate reference impedance measurement signals. The processing unit is further arranged to determine the ice thickness based on determinations of a relation between the impedance signals determined by the sensor arrangement and the reference impedance values generated by the reference sensor arrangement. | 09-12-2013 |
20130325398 | Three-Dimensional Perceived Softness Of Baby Care Products - Methods of determining three-dimensional perceived softness of baby care products based on assessed parameters of the products, for use in the design of new baby care products or changes in their raw materials. | 12-05-2013 |
20140039830 | TEST DEVICE TO MEASURE COATING THICKNESS AND TEST SYSTEM - A test device includes a test port, a storage unit, and a processing unit. The test port connects to a test line including a test probe. The storage unit stores a relationship table defining relationships between various thicknesses of coatings and readings from the test probe. The processing unit includes a detection module, a power control module, and a result analysis module. The detection module detects a test signal to start a test and continue for a period of time. The power control module provides power to the test port for the test period. The test probe produces a stimulus signal when receiving the power from the test port, and produces a feedback signal containing a reading when the power voltage is cut off. The result analysis module obtains the particular reading and determines the thickness of the coating according to the relationship table. | 02-06-2014 |
20140046629 | METHOD AND APPARATUS FOR MONITORING DEPOSITION - The present invention concerns an apparatus for deposition monitoring in a water system comprising a deposition measurement system, a DC power supply connected to a conductive deposition monitoring surface and a counter electrode, the apparatus has a first treatment configuration and a second treatment configuration, wherein one of the treatment configurations removes biofilm from the conductive deposition monitoring surface, and the other treatment configuration removes inorganic scale deposition from the conductive deposition monitoring surface. | 02-13-2014 |
20140309965 | Cooling Fan Having a Axial-Air-Gap Motor and a Method for Determining the Dimensional Proportion of the Motor - A cooling fan having a motor is disclosed. The cooling fan includes a stator assembly and an impeller. The stator assembly includes a shaft-coupling portion and a coil unit. The impeller includes a hub and a magnetic element. An axial air gap is formed between the magnetic element and the coil unit. A height between a bottom face of the shaft-coupling portion and a top face of the hub is from 1.5 mm to 3.5 mm. The coil unit has a first maximum width, and the hub has a second maximum width. A ratio of the first maximum width to the second maximum width is from 0.7 to 1.3. A method for determining the dimensional proportion of the motor includes selecting a ratio of a first maximum width to a second maximum width as 0.7 to 1.3, and determining the values of the first and second maximum widths. | 10-16-2014 |
20140324384 | METHOD FOR MEASURING THE THICKNESS OF A COATING LAYER BY INDUCING MAGNETIC FIELDS - A method of measuring the thickness of a coating layer of a workpiece, the layer being formed on a substrate of the workpiece. The method comprises several steps. First, feeding a probe alternating electrical signal to induction device in order to induce a magnetic field in the workpiece. Second, measuring at least one physical characteristic that varies as a function of the magnetic field induced in the workpiece. Third, determining first and second values of an indicator, the values being determined respectively from measurements of the physical characteristic taken when the electrical signal has first and second given frequencies. Forth, calculating the difference between the first and second values of the indicator and determining the thickness of the coating layer as a function of the difference and of predetermined data correlating: the difference between the values of the indicator; and corresponding values for thicknesses of the coating layer. | 10-30-2014 |
20160138912 | METHOD TO INCORPORATE SKIN AND CORE MATERIAL PROPERTIES IN PERFORMANCE ANALYSIS OF HIGH PRESSURE DIE CASTING ALUMINUM COMPONENTS - A method, device and article of manufacture for determining properties in a high pressure die cast component. Upon receipt of geometric information that corresponds to a location of interest within the component, a ray-triangle intersection relationship is used to calculate a wall thickness of the location of interest; this relationship is simplified by being used in conjunction with an octree-based relationship. One or more calculations are performed to determine a skin thickness based on the calculated wall thickness, and the skin thickness calculations are based on at least one of a logarithmic relationship, a polynomial relationship and a power law relationship. Changes in component shape or size may be taken into consideration to adjust the remaining skin layer thickness, such as that when the as-cast component is exposed to subsequent machining or related post-casting operations. From this, the properties are mapped to allow node-by-node variations in mechanical properties based on whether the node resides in the component skin region or core region. | 05-19-2016 |
20160202055 | SYSTEM FOR DETERMINING INSULATION THICKNESS | 07-14-2016 |
20160203666 | SHEET TYPE MEDIUM THICKNESS IDENTIFICATION DEVICE AND IDENTIFICATION METHOD THEREOF | 07-14-2016 |
702171000 | By ultrasonic | 2 |
20100169043 | NON-DESTRUCTIVE THICKNESS MEASUREMENT SYSTEMS AND METHODS - The present invention generally relates to improved non-destructive thickness measurement systems and methods. Embodiments of the present invention utilize quarter wave resonant frequency to measure the thickness of high-temperature pipe walls. In one embodiment, an improved non-destructive thickness measurement system is provided that utilizes Gaussian white noise to produce maximum mechanical resonance in the pipe wall and laser vibrometers to detect the pipe wall's maximum displacement. | 07-01-2010 |
20110106493 | ACOUSTIC THICKNESS MEASUREMENTS USING GAS AS A COUPLING MEDIUM - An acoustic apparatus adapted to operate in a gas filled space from a first side of an object to be measured for making a non-contact thickness measurement thereof includes an electro acoustic transducer, a transceiver coupled with the electro acoustic transducer and adapted to excite electro acoustic transducer to output an acoustic signal towards the object to be measured and receive an acoustic response signal therefrom, and a signal processor adapted to process the response signal and determine a thickness of the object. The electroacoustic transducer has a transducer-to-gas acoustic interface, and the transceiver is adapted to operate the electroacoustic transducer so as to emit into a gas filled gap an acoustic broad band pulse towards the object and to receive an acoustic resonance response signal in the acoustic response signal at a level that allows acquisition of the resonance response signal above a predetermined signal to noise level. | 05-05-2011 |
702172000 | By radiant energy (e.g., X-ray, light) | 25 |
20080208525 | OPTICAL IMAGE MEASUREMENT DEVICE - An optical image measurement device comprises: a controller configured to control the scanner to scan the target position along a plurality of radially-arranged scanning lines; and an image forming part configured to form a tomographic image on each of the plurality of scanning lines based on the result detected by the detector, and form a 3-dimensional image of the measurement object based on the plurality of tomographic images having been formed. | 08-28-2008 |
20090048803 | Method and sensor for sensing coins for valuation - A coin sensor and method of identifying coins by size and also discriminating invalid coins includes a portion of a coin track ( | 02-19-2009 |
20090222238 | Method and apparatus for layer thickness measurement - A technique for optical measurement of a thickness of a layer on a surface uses diffuse reflections at opposite boundaries of the layer, operates on transparent, or translucent layers. The thickness is determined by computing a separation between the centers of the two diffuse reflections, and using the index of refraction of the layer, and geometric properties of a beam and detector with respect to the surface. The technique is useful for quantifying thickness of a layer of rime ice, glaze ice, frosted ice, or water, for example. | 09-03-2009 |
20100106456 | METROLOGY OF THIN FILM DEVICES USING AN ADDRESSABLE MICROMIRROR ARRAY - An addressable micromirror array is employed in conjunction with circuit topology navigation software to rapidly wavelength sample selected measurement points in an integrated circuit region. | 04-29-2010 |
20100121607 | OPTICAL MEASUREMENT APPARATUS, SPECTROSCOPIC ELLIPSOMETER, RECORDING MEDIUM, AND MEASUREMENT METHOD - An optical measurement apparatus includes: a storage processing part storing into a storage part a plurality of main reference positions where measurement is to be performed and at least one movement value relative to each main reference position; a main measuring part moving a measurement position to one of the main reference positions stored in the storage part, then irradiating light, and then measuring a change in a state of reflected light; an auxiliary measuring part moving the measurement position to an auxiliary reference position based on the movement value relative to one of the main reference positions stored in the storage part, then irradiating light, and then measuring a change in a state of reflected light; a main calculating part performing analysis and calculating a film thickness or an optical constant; and an auxiliary calculating part performing analysis and calculating a film thickness or an optical constant. | 05-13-2010 |
20100286951 | FOOT MEASURING DEVICE - The invention presents an apparatus for measuring the dimensions of human feet. The apparatus is comprised of a base ( | 11-11-2010 |
20100305902 | Method for characterizing hiding of coating compositions and apparatus used therefor - The present invention is directed to an apparatus and a method that characterizes the hiding of coating compositions, such as automotive OEM and refinishes paints. The method is directed to sequentially storing in a computing device hiding data obtained by measuring the color difference (ΔRGB) in reflections of light and dark portions of target areas of a monotonic coating resulting from a coating composition applied over hiding test panel and by measuring coating thicknesses of the monotonic coating that correspond to the target areas, classifying the type of the hiding data, selecting fitting equations applicable to the classified hiding data, fitting the selected equation to match the classified hiding data and locating a hiding thickness on the monotonic coating that corresponds to the threshold value of the color difference at that location to determine the hiding thickness of the coating composition. | 12-02-2010 |
20110131009 | METHOD FOR CHARACTERIZING HIDING OF COATING COMPOSITIONS AND APPARATUS USED THEREFOR - The present invention is directed to an apparatus and a method that characterizes the hiding of coating compositions, such as automotive OEM and refinishes paints. The method is directed to sequentially storing in a computing device hiding data obtained by measuring the color difference (ΔRGB) in reflections of light and dark portions of target areas of a monotonic coating resulting from a coating composition applied over hiding test panel and by measuring coating thicknesses of the monotonic coating that correspond to the target areas, classifying the type of the hiding data, selecting fitting equations applicable to the classified hiding data, fitting the selected equation to match the classified hiding data and locating a hiding thickness on the monotonic coating that corresponds to the threshold value of the color difference at that location to determine the hiding thickness of the coating composition. | 06-02-2011 |
20110184696 | Detection and Analysis Apparatus For Membrane Filtration Process - The present invention discloses a detection and analysis apparatus, comprising a photo sensing device, comprising a plurality of sensing elements linearly arranged to form a first array, for detecting a signal of the thickness change of the cake at a linear position of the filter medium; a driving device, for driving the photo sensing device to move relatively parallel to the filter medium on the top of the cake so that the photo sensing device detects the thickness change of the cake on at least one local plane of the filter medium; and a data processing device, coupling to the photo sensing device, for continuously processing and analyzing the signal detected by the photo sensing device to thereby in-situ estimate the thickness change of the cake on the at least one local plane of the filter medium during the filtration process. | 07-28-2011 |
20120084056 | DRY COATING THICKNESS MEASUREMENT AND INSTRUMENT - There are provided instruments for measuring and/or controlling the thickness of a coating applied to a substrate. An instrument embodied by the invention comprises coating removal means for removing a quantity of the coating to partially expose the surface of the substrate. The instrument also includes sensor means for emitting and detecting signals reflected from the surface of the coating and the exposed surface of the substrate to generate one or more data sets consisting of data indicative of the position of the surface of the coating and the position of the surface of the substrate. The sensor means is arranged so as to be distanced from the coating and the substrate, and is adapted to detect the signals reflected from the surface of the substrate during relative movement between the substrate and the sensor means. The data sets generated by the sensor means are processed by processing means of the instrument to determine the dry thickness of the coating on the substrate. Methods for measuring the dry thickness of the coating utilising instruments of the invention are also provided. | 04-05-2012 |
20120116720 | METHOD AND SYSTEM FOR DETERMINING RADIATION SHIELDING THICKNESS AND GAMMA-RAY ENERGY - A system and method for determining the shielding thickness of a detected radiation source. The gamma ray spectrum of a radiation detector is utilized to estimate the shielding between the detector and the radiation source. The determination of the shielding may be used to adjust the information from known source-localization techniques to provide improved performance and accuracy of locating the source of radiation. | 05-10-2012 |
20120191412 | METHOD AND APPARATUS FOR PERFORMING FILM THICKNESS MEASUREMENTS USING WHITE LIGHT SCANNING INTERFEROMETRY - The invention relates to a method and an apparatus for measuring the thickness of a transparent film by broad band interferometry, comprising the steps of preparing a correlogram of the film by an interferometer, applying a Fourier transformation to said correlogram to obtain a Fourier phase function, removing a linear component thereof, applying a second integral transformation to the remaining non-linear component to obtain an integral amplitude function of said non-linear component, identifying the peak location of said integral amplitude function and determining the thickness of the film as the double value of the abscissa at said peak location considering a refractive index of a film which is dependent on wavelength. The last two steps may be replaced by identifying the peak locations of said integral amplitude function and determining the thickness of the films as the double values of the abscissas at the peak locations. | 07-26-2012 |
20120296604 | METHODS AND SYSTEMS FOR SENSING - A sensing device for sensing a substance includes a photonics integrated circuit having a resonator element that supports two different radiation modes, e.g. radiation modes of different polarisation, at a predetermined resonance wavelength. The resonator element is configured to convert a phase change or amplitude change experienced by the two different radiation modes upon formation of a layer of receptor molecules onto a sensing surface of the device into a resonance wavelength shift for the two different radiation modes. The sensing device also includes a detection unit arranged to detect the resonance wavelength shift for the two different radiation modes. The detection unit includes a processor that is configured to derive from the detected resonance wavelength shifts for the two different radiation modes, a layer thickness and refractive index of the layer of receptor molecules. | 11-22-2012 |
20130144554 | MICROWAVE PROBE FOR FURNACE REFRACTORY MATERIAL - Disclosed is a system and method to aid in these inspections that avoid the disadvantages of the prior art. The system and method are operative to take thickness measurements of, and thus evaluate the condition of, materials including but not limited to refractory materials, operating in frequency bands that result in less loss than previously known technologies, and utilizing a system configuration and signal processing techniques that isolate the reflected signal of interest from other spurious antenna reflections, particularly by creating (through the configuration of the antenna assembly) a time delay between such spurious reflections and the actual reflected signal of interest, thus enabling better isolation of the signal of interest. Still further, the antenna assembly is intrinsically matched to the material to be probed, such as by impedance matching the antenna to the particular material (through knowledge of the dielectric and magnetic properties of the material to be evaluated) to even further suppress spurious reflections. | 06-06-2013 |
20130204577 | Caliper Coating Measurement on Continuous Non-Uniform Web Using THZ Sensor - An analytical model simulates the propagation of radiation through a coated continuous web where layer thickness and refractive index, as variables, determine the speed and direction of transmitted radiation. The model predicts characteristics of transmitted radiation based on characteristics of incident radiation and initially assigned values for layer thicknesses. Coating thickness(s) are ascertained in a process whereby incident radiation of known characteristics is directed onto a coated web and thereafter, actual measurements of transmitted radiation are compared to predicted characteristics. Using a fitting algorithm, the assigned thickness(es) of the layer(s) of the model are adjusted and the process repeated until the actual and predicted values are within desired limits at which time, the assigned thickness(es) represent the measured calipers. Radiation measurements are obtained using terahertz time-domain spectroscopy apparatus that creates a continuous reference whereby a sample pulses' phase and amplitude can be tracked and corrected. | 08-08-2013 |
20130268237 | CONTAINER THICKNESS MEASURING SYSTEMS AND METHODS - Various embodiments are directed to systems and methods for measuring a thickness of a container. For example, a control device may receive data indicating a surface topology of the container and based on the surface topology of the container, instruct a multi-axis positioning system to position a sensor relative to a first point of the container such that: a distance from the sensor to a surface at the first point is about equal to a predetermined distance; and the sensor direction is about normal to the surface at the first point. Data indicating the thickness at the first point may be received from the sensor. | 10-10-2013 |
20130275083 | APPARATUS AND METHOD FOR MEASURING THICKNESS OF PRINTED CIRCUIT BOARD - An apparatus for measuring a thickness of at least one insulating layer of a printed circuit board (PCB), the at least one insulating layer having a transmission line located thereon. The apparatus includes an impedance measurement unit configured to input a plurality of input signals to the transmission line, each of the input signals having a respective frequency, to receive output signals from the transmission line, and to determine impedance values of the at least one insulating layer based on the input signals and the output signals; and a thickness calculation unit configured to calculate a thickness of the at least one insulating layer based on the impedance values. | 10-17-2013 |
20150012246 | THICKNESS MEASURING APPARATUS AND THICKNESS MEASURING METHOD - Provided are a thickness measuring apparatus and a thickness measuring method. The thickness measuring method includes irradiating first laser beam of a first wavelength λ | 01-08-2015 |
20150120242 | GROUPING SPECTRAL DATA FROM POLISHING SUBSTRATES - Among other things, a computer-based method is described. The method comprises receiving, by one or more computers, a plurality of measured spectra reflected from a substrate at a plurality of different positions on the substrate. The substrate comprises at least two regions having different structural features. The method also comprises performing, by the one or more computers, a clustering algorithm on the plurality of measured spectra to separate the plurality of measured spectra into a number of groups based on the spectral characteristics of the plurality of measured spectra; selecting one of the number of groups to provide a selected group having a subset of spectra from the plurality of measured spectra; and determining, in the one or more computers, at least one characterizing value for the substrate based on the subset of spectra of the selected group. | 04-30-2015 |
20150120243 | REDUCING NOISE IN SPECTRAL DATA FROM POLISHING SUBSTRATES - Among other things, a machine based method comprises representing a plurality of spectra reflected from one or more substrates at a plurality of different positions on the one or more substrates in the form of a first matrix; decomposing, by one or more computers, the first matrix into products of at least two component matrixes of a first set of component matrixes; reducing dimensions of each of the at least two component matrixes to produce a second set of component matrixes containing the at least two matrixes with reduced dimensions; and generating, by the one or more computers, a second matrix by taking a product of the matrixes of the second set of component matrixes. | 04-30-2015 |
20150120244 | METHOD AND APPARATUS FOR ROAD WIDTH ESTIMATION - A method, apparatus, and computer program product are disclosed to estimate road widths, irrespective of the presence of curbs or occlusions on the road surface. In the context of a method, a point cloud representing terrain is accessed. In one embodiment, the point cloud may be generated from lidar scanning during a trip. The point cloud is divided into sections representing portions of the terrain. The method further includes, for each section, identifying a ground planar surface of the section, estimating a drive plane of the section based on the ground planar surface and a drive direction, and calculating a road width of the section based on the ground planar surface and drive plane. The method may further include applying a smoothing algorithm to adjust the calculated road width of at least one section. A corresponding apparatus and computer program product are also provided. | 04-30-2015 |
20150330770 | LIBRARY EXPANSION SYSTEM, METHOD, AND COMPUTER PROGRAM PRODUCT FOR METROLOGY - A library expansion system, method, and computer program product for metrology are provided. In use, processing within a first multi-dimensional library is performed by a metrology system. During the processing within the first multi-dimensional library, a second multi-dimensional library is identified. The processing is then transitioned to the second multi-dimensional library. Further, processing within the second multi-dimensional library is performed by the metrology system. | 11-19-2015 |
20160076876 | SCATTEROMETRY METHOD AND SYSTEM - A method and system are presented for use in model-based optical measurements in patterned structures. The method comprises: selecting an optimal optical model for interpretation of optical measured data indicative of optical response of the structure under measurements. The selection of the optimal optical model comprises: creating a complete optical model with floating parameters defining multiple configurations of said complete model including one or more model configurations describing an optical response of the structure under measurements, utilizing the complete model for predicting a reference optical response from the structure and generating corresponding virtual reference data, and using the virtual reference data for selecting the optimal optical model for interpretation of the optical measured data. | 03-17-2016 |
20160123722 | COMPUTING DEVICE AND METHOD FOR ANALYZING THICKNESS - A computing device and a method analyze thickness of an object. The computing device obtains a point cloud of an object from a scanner coupled to the computing device. The computing device triangulates the point cloud of the object using a plurality of triangles. The computing device obtains thickness information of the object according to the triangulated point cloud of the object and generates a report according to the thickness information of the object. | 05-05-2016 |
20160169668 | METHOD FOR STUDYING A ZONE OF AN OBJECT SO AS TO DETERMINE A MASS-THICKNESS AND A COMPOSITION THEREOF BY USING AN ELECTRON BEAM AND MEASUREMENTS OF X-RAY RADIATION INTENSITY | 06-16-2016 |