| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 702168000 | By probe (e.g., contact) | 33 |
| 20080208524 | SURFACE PROFILE MEASURING INSTRUMENT - A surface profile measuring instrument has a means for measuring the profile of a surface and a means for storing measurements produced by the means for measuring the profile of a surface. The instrument may have a tip physically coupled to a sensor. The instrument may also have means for processing the measurements and/or for analysing the measurements. The instrument may be connected to an external device such as a printer and/or to a display unit. | 08-28-2008 |
| 20080249741 | IMAGE DISPLAY METHOD FOR DISPLAYING SURFACE SHAPE - An image display method for displaying a surface shape by measuring the surface shape of an object surface of a work piece to be measured with a contact probe placed on a machine and displaying the surface shape of said object surface on a screen based on measured shape data of the object surface, the method having: measuring a multiplicity of measuring positions on the object surface to be measured with the probe while relatively moving the probe on the object surface in order to obtain continuous shape data of the object surface; and displaying the surface shape of the object surface in real time based on the continuous shape data. | 10-09-2008 |
| 20080294369 | Roundness measuring device, method and program for measuring roundness - A roundness measuring device includes: an eccentric position calculation unit calculating, based on a measured distance and a measured angle, a distance between a axis of the measured object and a rotation axis as an eccentric distance, and calculating an angle formed between the detection line and a line segment connecting the rotation axis and the axis of the measured object as an eccentric angle; and a measurement correction unit correcting the measured distance based on the eccentric distance, the eccentric angle, the measured angle, a radius of the measured object, and a length from the center to the surface of the detector unit, and correcting the measured angle by adding a correction angle to the measured angle, the correction angle being formed between the detection line and a line segment connecting the rotation axis and a contact point where the measured object and the detector unit come in contact with one another. | 11-27-2008 |
| 20090024355 | SHAPE MEASURING DEVICE AND METHOD - A device measures a measurement object surface shape, and includes a base to which the measurement object is secured; a slide movable in at least three different directions and secured to the base; a probe holding unit mounted to the slide; and a contact probe resiliently supported by the holding unit so as to be movable with respect to the holding unit. Additional features include a unit measuring the position and posture of the probe with respect to the holding unit; a unit calculating a contact-force vector, which the probe receives from the measurement object, from a measurement result of the measuring unit; and a controlling unit moving the probe along the surface of the measurement object. The controlling unit also controls a position of the holding unit so that a magnitude of the contact-force vector comes closer to a control target value thereof in accordance with the magnitude of the contact-force vector. | 01-22-2009 |
| 20090030650 | CONTOUR MEASURING METHOD FOR MEASURING ASPECTS OF OBJECTS - An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe ( | 01-29-2009 |
| 20090037140 | CONTOUR MEASURING METHOD FOR MEASURING ASPECTS OF OBJECTS - An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a measuring device including two contour measuring probes and a processor, the contour measuring probe having a tip extension and a displacement sensor used to sense a displacement of the tip extension, the processor being electrically connected to the displacement sensors; (2) driving two tip extensions to contact two opposite surfaces of an object respectively; (3) driving the two tip extensions to move and contacting the two opposite surfaces of the object respectively, while the displacement sensors sending the displacement information on the tip extensions to the processor; (4) computing a cross-section of the object by the processor according to the displacement information on the tip extensions; (5) repeating the step (3) and (4), the processor computing a plurality of cross-sections of the object, the cross-sections compiled to obtain aspects of object. | 02-05-2009 |
| 20090037141 | MEASURING DEVICE FOR MEASURING ASPECTS OF OBJECTS - An exemplary measuring device ( | 02-05-2009 |
| 20090292503 | MACHINE TOOL WITH NUMERICAL CONTROLLER AND ON-MACHINE MEASURING DEVICE - A machine tool is fitted with a position detector for detecting a position of a moving axis of the machine tool and an on-machine measuring device for measurement on the machine tool. An axial position detection signal output from the position detector and a measurement signal output from the on-machine measuring device are received through interfaces by a numerical controller that controls the machine tool. These interfaces are designed so that the numerical controller receives the axial position detection signal and the measurement signal with the same timing. | 11-26-2009 |
| 20090299692 | SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD - A moving vector calculation unit calculates a moving vector M representing a quantity and a direction of movement of a probe on basis of a stylus displacement vector, a stylus displacement vector D, and a direction change angle θ of the stylus displacement vector D that is caused by a frictional force between a stylus | 12-03-2009 |
| 20100217561 | METROLOGICAL INSTRUMENT - A metrological instrument determines a surface profile or form of a surface ( | 08-26-2010 |
| 20100292956 | Dimensional measurement probe - A probe for measuring the dimensions of objects on a coordinate positioning machine such as a machine tool has a workpiece-contacting stylus. This is suspended via a sensor mechanism, including strain gauges which provide an output when the stylus contacts a workpiece. A processor processes the strain gauge outputs to produce a trigger signal. It does so in accordance with an algorithm or equation or look-up table which ensures equal sensitivity in all possible directions of approach to the workpiece in the three dimensions X, Y, Z. | 11-18-2010 |
| 20100299104 | Form measuring instrument, form measuring method, and program - Form measuring instrument includes: first measuring means which moves contact piece from first position in parallel with second axis to trace surface of workpiece, measure amount of displacement of contact piece, to obtain first profile; second placing means which rotates workpiece about first axis by 90 degrees to place workpiece at second position from first position; second measuring means which moves contact piece from second position in parallel with second axis to trace surface of workpiece, measure amount of displacement of contact piece, to obtain second profile; extremum position calculating means which fits circles to first and second profiles and calculate positions, in direction parallel with second axis, of first and second extremums indicating circles' extremums; and moving means which moves workpiece in direction parallel with second axis and direction parallel with third axis such that positions, in direction parallel with second axis, of first and second extremums become 0. | 11-25-2010 |
| 20110066400 | SHAPE MEASURING APPARATUS - A 3D measuring apparatus includes a probe that has a spherical gauge head for measuring a measured object; a motion mechanism that holds and moves the probe; and a motion controller that controls the motion mechanism. The controller includes a contact point obtainer that obtains a contact point location of a surface of the measured object and the gauge head based on a central location of the gauge head; a radius of the gauge head; and a swing amount of the gauge head. The controller also includes a motion commander that calculates a location command value causing the motion mechanism to move the probe, based on the contact point location obtained by the contact point obtainer. | 03-17-2011 |
| 20110288819 | SURFACE ANALYSIS APPARATUS AND METHOD - A method of identifying characteristics of a target, marking object comprising the steps of: providing a subject, marked article having a surface having markings caused by a marking surface of the target, marking object; obtaining a 3D dataset corresponding to a 3D virtual model of the surface of the subject, marked article by means of a sensor; extracting from dataset by means of a surface segmentation analysis data indicative of a class of the target, marking object and storing said data in the database; extracting from the dataset by means of a surface wavelet filtering operation data corresponding to one or more individual characteristics of the target, marking object and storing said data in the database. | 11-24-2011 |
| 20120158359 | SHAPE MEASURING APPARATUS AND METHOD - Provided is a method for measuring the shape of the surface of an object by moving a contact probe along the surface of the object. The relationship between the surface of the object and the direction of a moving unit is supposed from the magnitudes of the components of a contact force applied to the probe. Thus, the contact force of the probe is controlled using only a moving unit that is determined to be nearly orthogonal to the surface of the object under measurement. | 06-21-2012 |
| 20120185210 | CIRCULARITY MEASURING APPARATUS AND MEASUREMENT VALUE CORRECTING METHOD FOR CIRCULARITY MEASURING METHOD - According to the present invention, a center deviation amount, which is an amount of deviation (distance) between the center line of a reference measurement target and the detection point is calculated using the reference measurement target having a known diameter, and a measurement value of a diameter of an arbitrary measurement target is corrected using the center deviation amount. Therefore, an accurate diameter value can be calculated even in the case of a measurement target having a diameter value different from the diameter value of the reference measurement target. | 07-19-2012 |
| 20120265487 | Method and Apparatus of Analyzing Sample Surface Data - An improved apparatus and method for the analysis of surface data collected using a sub-micron scale metrology instrument which provides a persistent user experience by allocating set portions of the display to major functional regions thereby allowing a quick to learn and easy to user interface for the setup, analysis, and display of microscopic 3D surface data measurements and resulting analytic data with a variety of 3D surface scanners. | 10-18-2012 |
| 20120303320 | CROSS-SECTIONAL PROFILE MEASURING METHOD - A cross-sectional profile measuring method of measuring cross-sectional profiles of an object at plural measurement sections of the object with a contact probe, includes: circularly moving the probe along a route around a circumference of the object at one of the measurement sections, a distance of the moving being longer than a measurement range corresponding to the circumference of the object by a predetermined overlapping range consisting of an acceleration range and a deceleration range; and moving the probe to next one of the measurement sections through a transfer range in a movement direction oblique to a continuous direction in which the cross-sectional profiles are adjacent to one another to offset a distance corresponding to the overlapping range. | 11-29-2012 |
| 20130006579 | METHOD OF MEASURING A CIRCULAR SHAPE CHARACTERISTIC AND CIRCULAR SHAPE CHARACTERISTIC MEASURING DEVICE AND PROGRAM - A circular shape characteristic measuring device includes a shape measuring device that obtains measured data by measuring a profile shape of a circular cross-section of an object to be measured having the circular cross-section, and a computation device that calculates a circular shape characteristic of the circular cross-section. The computation device includes: an input device configured to input one of three parameters including a cutoff value of the filtering process, a minimum number of samples, and a ratio of a radius of the circular cross-section to a radius of a gauge head; a parameter table that stores a relationship between the three parameters, and based on the input parameter, determines the other two parameters; and a sampler configured to perform sampling of the measured data based on the minimum number of samples. | 01-03-2013 |
| 20130041624 | CMM MOVING PATH ADJUSTMENT ASSISTING METHOD AND APPARATUS - A method is provided to assist adjustment for a movement path of a probe. A coordinate measuring machine includes a probe having a tip for detecting a surface of an object, and a movement mechanism for moving the probe, and measures a shape of the object by allowing the probe tip to scan the surface. A controller controls operation of the coordinate measuring machine by calculating a scanning path for allowing the probe tip to perform scanning movement and the movement path followed by the probe when the probe tip moves along the scanning path, setting control points on a line connecting each position of the probe tip and each corresponding position of the probe accepting a change in position of the control points by a user, and changing the movement path accordingly. An adjustment guide unit in the controller allows the control points to move collectively. | 02-14-2013 |
| 20130054194 | SURFACE MEASUREMENT INSTRUMENT AND CALIBRATION THEREOF - A method of calibrating a surface measurement instrument includes rotating a work piece having an undulating surface on a turntable of a metrological apparatus; measuring the surface of the work piece at a plurality of rotational positions; analysing the results of the measurement to determine parameters describing an error causing characteristic of the metrological apparatus; and using the determined parameters to correct measurement data for the error causing characteristic of the metrological apparatus. | 02-28-2013 |
| 20130238281 | SURFACE TEXTURE MEASUREMENT DEVICE, CONTROLLER FOR SURFACE TEXTURE MEASUREMENT DEVICE, AND METHOD FOR CONTROLLING THE SAME - A surface texture measurement device capable of resolving errors for each entire display range, a controller for the surface texture measurement device, and a method for controlling the surface texture measurement device that includes selecting any one of the display ranges as a reference range and defining a calibration measurement value for each display range; sequentially inputting the calibration measurement values in place of the measurement values to the range amplifier corresponding to the reference range to obtain a reference display value rDATAi; inputting the calibration measurement values to the range amplifiers corresponding to each display range, then obtaining an AD-converted value ADi and a display value DATAi; computing a gain error rate ki=rDATAi/DATAi, a display resolution DIVi=DATAi/ADi, and a corrected display resolution cDIVi=DIVi×ki; and displaying the corrected display value cDIVi=DIVi×ki. | 09-12-2013 |
| 20140025336 | SHAPE MEASURING APPARATUS AND CONTROL METHOD OF SHAPE MEASURING APPARATUS - A control method of a shape measuring apparatus divides a curve indicating a movement path of a probe into a plurality of sections. A measurement target section is selected from the plurality of sections sequentially from a starting point side of the curve indicating the movement path of the probe. A first curvature radius is calculated from a curvature of the measurement target section. A second curvature radius is calculated according to an angle between a first straight line connecting a starting point to an ending point of the measurement target section and a second straight line connecting a starting point to an ending point of a section next to the measurement target section. A smaller value from among the first curvature radius and the second curvature radius is set as an effective radius. A maximum speed of probe movement increasing according to an increase in the effective radius is calculated for the measurement target section. | 01-23-2014 |
| 20140249775 | CONTOUR METER AND METHOD FOR MEASURING THE CONTOUR OF A WORKPIECE HAVING TANGENTIALLY ADJOINING CONTOUR GEOMETRIES - A workpiece contour ( | 09-04-2014 |
| 20140278232 | INTRA-OPERATIVE REGISTRATION OF ANATOMICAL STRUCTURES - Described herein are methods, systems and devices for image-guided, computer-assisted surgical procedures, in particular for intra-operative registration of anatomical structures. Embodiments of the invention may enable a user to register the surface of an anatomical structure intra-operatively in an interactive, computer-guided process. The user may send information about acquired data points to the computer, and the computer may evaluate the aggregate of data points, optionally provide instructions to the user for acquisition of additional data points, and signal to the user when sufficient data points have been acquired for registration of the surface of the anatomical structure. | 09-18-2014 |
| 20140324383 | CONTINUOUS HIGH RESOLUTION SURFACE PROFILING APPARATUS AND METHOD - A surface profiler comprises at least one front support wheel and at least one rear support wheel for travelling along the surface of a profile to be measured, the rotational axes of said wheels being longitudinally spaced, and the wheels contacting the surface being profiled in a collinear manner. A frame carried on the wheels carries at least one inclinometer and at least two vertical distance measuring apparatus such as lasers, and may also carry an optical encoder. The lasers are collinear with each other and with the wheels. Incremental to measurements of inclination angles provided by the inclinometer, together with incremental measurements of distance to the surface being measured provided by the lasers, produce a continuous, high resolution mathematical series of elevations representing the surface profile, including reproduction of surface features that are smaller than the distance between the wheels. | 10-30-2014 |
| 20150012245 | MEASUREMENT APPARATUS AND METHOD - A computer implemented method of determining the surface shape of an aspheric object using a metrological apparatus includes positioning the object on a support surface of a turntable so that an axis of the object is tilted with respect to the axis of rotation of the turntable; using a measurement probe to make a first measurement of the object; rotating the turntable; after rotation of the turntable, using a measurement probe to make a second measurement of the object, diametrically opposite the first measurement, estimating a first angle based on fitting the first measurement data using a surface model including: a dependency on the axis tilt angle and a dependency on the radius of the base of the object; estimating a second angle based on fitting the second measurement data to the surface model; and determining the tilt angle based on the first angle and the second angle. | 01-08-2015 |
| 20150025845 | SURFACE MEASUREMENT APPARATUS AND METHOD - A stylus is deflected as a tip of the stylus follows surface variations along a measurement path on a surface of a workpiece. A transducer provides measurement data in a measurement coordinate system. A data processor is configured to: determine a relationship between the data in the measurement coordinate system and nominal surface data representing the expected surface characteristic of the workpiece in a workpiece coordinate system; simulate a measurement data set for the nominal surface using the nominal surface data and the determined relationship; if a simulated range of the simulated data set does not meet a given criterion, adjust a selected measurement data value for a selected point and repeat the simulation to determine an adjusted data value for which the simulated range meets the criterion; and determine start conditions required for a measurement procedure to provide the adjusted data value for the selected measurement point. | 01-22-2015 |
| 20150112635 | DATUM REFERENCE FRAME FOR MECHANICAL PARTS - A method of establishing a datum reference frame for a manufactured detail part used in an assembly comprises establishing a primary datum reference plane, identifying first and second mating surfaces of the part, identifying first and second functional features of size on the first and second mating surfaces, using a coordinate measuring machine (CMM) probe to identify a first point at an intersection of a centerline of the first feature and the first surface, using the CMM probe to identify a second point at an intersection of the centerline of the second feature and the second surface; and establishing a secondary compound datum reference plane through the intersection points and perpendicular to the primary datum reference plane. | 04-23-2015 |
| 20150377617 | METHOD AND APPARATUS FOR MEASURING A PART - A method and apparatus for measuring a part with a contact probe mounted on a coordinate positioning machine. The method includes measuring a plurality of points on the part when both the part and contact probe are moving continuously between different positions within the coordinate positioning machine. The probe moves, relative to the part, along a scan path such that substantially coincident points that are closely located together along a curve or surface being measured are measured at relatively far apart positions in the machine and at relatively far apart positions along the scan path. | 12-31-2015 |
| 20160084630 | CALCULATION METHOD, STORAGE MEDIUM, INFORMATION PROCESSING APPARATUS, AND MEASUREMENT APPARATUS - The present invention provides a calculation method of calculating a shape of a measurement target surface, including a step of obtaining first corrected shape data by correcting first shape measurement data by using a first correction parameter for correcting a measurement error caused by scanning a probe in a first direction, obtaining second corrected shape data by correcting second shape measurement data by using a second correction parameter for correcting a measurement error caused by scanning the probe in a second direction, and generating first whole shape data representing a shape of the whole measurement target surface by synthesizing the first corrected shape data and the second corrected shape data. | 03-24-2016 |
| 20160091295 | CALCULATION METHOD, MEASUREMENT APPARATUS, STORAGE MEDIUM, AND INFORMATION PROCESSING APPARATUS - The present invention provides a calculation method of calculating a shape of a surface to be measured, including a step of, based on an inclination angle of the surface in a scan direction of a probe, determining a first correction parameter used to correct a measurement error caused by scanning the probe in the first direction and a second correction parameter used to correct a measurement error caused by scanning the probe in the second direction. | 03-31-2016 |
| 20160146599 | CMM MOVING PATH ADJUSTMENT ASSISTING METHOD AND APPARATUS - A method is provided to assist adjustment for a movement path of a probe. A coordinate measuring machine includes a probe having a tip for detecting a surface of an object, and a movement mechanism for moving the probe, and measures a shape of the object by allowing the probe tip to scan the surface. A controller controls operation of the coordinate measuring machine by calculating a scanning path for allowing the probe tip to perform scanning movement and the movement path followed by the probe when the probe tip moves along the scanning path, setting control points on a line connecting each position of the probe tip and each corresponding position of the probe accepting a change in position of the control points by a user, and changing the movement path accordingly. A guide point allows the control points to move collectively. | 05-26-2016 |
