| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 702121000 | Including multiple test instruments | 18 |
| 20090043526 | INTEGRATED HIGH-EFFICIENCY MICROWAVE SOURCING CONTROL PROCESS - A technique for controlling instrumentation in an automatic test system includes providing a group of hardware resources that can be configured in a variety of ways to realize different instrument configurations, which generally correspond to different traditional instrument types. An instrument driver is provided for each of the different instrument configurations, and calls to each instrument driver may be inserted into a test program for controlling the respective instrument configuration. The instrument drivers direct control of the hardware resources via a support driver. The support driver thus provides a central location through which control of the various hardware configurations is processed. From the user's point of view, the instrumentation is programmed as if it consists of a collection of traditional instrument types. But at the hardware level the instrumentation is highly integrated and efficiently realized. | 02-12-2009 |
| 20090076761 | ROUTED EVENT TEST SYSTEM AND METHOD - An efficient automated test system and method are presented. In one embodiment, an automated test system is implemented in a routed event distribution architecture. In one exemplary implementation, an automated test system includes a plurality of test instruments, a switched event bus, and a test controller component. The plurality of test instruments perform testing. The switched event bus communicatively couples the plurality of instruments. The switched event bus comprises an event distribution switch that flexibly routes event information across event lines of the switched event bus. The test controller controls the testing and the switched event bus. | 03-19-2009 |
| 20090144013 | DESIGN FOR TESTABILITY TECHNIQUE FOR PHASE DETECTORS USED IN DIGITAL FEEDBACK DELAY LOCKED LOOPS - A method and circuit for testing phase detectors in a delay locked loop is provided. The method includes storing output from a first phase detector and from a second phase detector when the counter is at the +0, +1, and −1 counter positions, and comparing the results to determine whether a phase detector is faulty. The circuit implementing this technique uses a second phase detector configured to receive the signals entering a first phase detector. Particularly, the circuit is routed such that a signal entering the D input of the first phase detector is inputted into the clock input of the second phase detector, and a signal entering the clock input of the first phase detector is inputted into the D input of the second phase detector. The circuit is also coupled to a test controller located on-die or at a high volume manufacturing (HVM) tester. | 06-04-2009 |
| 20100076716 | PORTABLE ELECTROMECHANICAL ACTUATOR TEST SYSTEM - A portable electromechanical actuator test system includes a command generator, a rechargeable battery system, an electronic power supply, and a power controller, all disposed within a portable housing. The command generator at least selectively supplies test actuator commands to, and receives operational feedback signals from, an electromechanical actuator (EMA) controller. The rechargeable battery system and electronic power supply each supply electric power. The power controller is coupled to receive the electric power supplied from both the rechargeable battery system and the electronic power supply, and is operable to at least selectively supply electric power to the EMA controller and to an EMA that is controlled by the EMA controller. | 03-25-2010 |
| 20100262398 | Methods of Selecting Sensors for Detecting Abnormalities in Semiconductor Manufacturing Processes - A method of selecting a sensor in a semiconductor manufacturing process is provided. The method includes measuring responses of a plurality of sensors when a first of a plurality of process conditions is varied, identifying one or more of the sensors having a steady state response after the first of the process conditions is varied, and selecting a sensor having a highest value within a response range from among the sensors having the steady state response for the first process condition that is varied. This methodology may be performed for multiple different process conditions. Thus, when process conditions in multiple processes of manufacturing a semiconductor device are varied, sensors having a steady state response can be selected from among multiple sensors for detecting abnormalities in the processes. | 10-14-2010 |
| 20100318314 | Polymorphic automatic test systems and methods - An Analog/mixed signal automatic test system includes a software architecture that creates a virtual composite instruments through novel software dynamic allocation of low level resources. These virtual composite instruments provide backwards and forwards compatibility to a variety of automatic test equipment, known or available on the market. The virtual composite instruments are free from the normal constraints imposed by hardware implementations. Creation of the virtual composite instruments allows a single piece of automatic test equipment system to emulate many implementations of automatic test equipment, providing higher utilization, and therefore a lower cost test solution for device manufacturers. The test instruments are preferably object controls and are preferably instantiated and controlled by the test system server. This allows multiple users to control the tester simultaneously across, for example, the Internet. | 12-16-2010 |
| 20110054826 | APPARATUS AND METHOD FOR SIMULTANEOUSLY TESTING WIRELESS COMMUNICATION TERMINALS - Disclosed herein is an apparatus and apparatus for simultaneously testing a plurality of wireless communication terminals. The apparatus for simultaneously testing a plurality of wireless communication terminals includes one or more virtual Operating Systems (OSs) each configured to be run under an actual Operating System (OS) and to connect a wireless communication terminal with a test module independently of the actual OS, a plurality of test modules each configured to test a wireless communication terminal under the actual OS or one of the virtual OSs, and a control module configured to assign a plurality of wireless communication terminals recognized by the actual OS to the actual OS and the virtual OSs in a one-to-one correspondence and to assign the plurality of test modules to the actual OS and the virtual OSs in a one-to-one correspondence so that the test modules can be run simultaneously. | 03-03-2011 |
| 20110191056 | INFORMATION SERVICE PROVIDING SYSTEM, INFORMATION SERVICE PROVIDING DEVICE, AND METHOD THEREFOR - The information service providing device of the disclosure of the present application selects sensors which may be used for the implementation of an information service to be provided within a plurality of sensors which the device can make use of, and in addition, selects the most appropriate one within the sensors which may be used and selects an appropriate parameter for the sensors and processing programs in order for the information service to be provided appropriately, and set to these in response to the environment in which the information service is implemented. Furthermore, the information service providing device of the disclosure of the present application provides, with only the receipt of the designation of desired information service by a user, various information services are provided by appropriately combining various kinds of sensors and a plurality of processing programs. | 08-04-2011 |
| 20120016620 | SYSTEM AND METHOD FOR TESTING AN OBJECT USING A MECHANICAL ARM - A system and method for testing objects using a mechanical arm includes establishing coordinate system based on a work area of the mechanical arm, and obtaining test parameters from a storage system. The method further includes controlling the mechanical arm to get an object and position the object to the position of a test platform according to the test parameters, controlling the mechanical arm to get test tool from a tool shelf and position the test tool to a position of test point on the object to test the object according to the test parameters. The method also includes controlling the mechanical arm to get the object from the test platform and position the object to the location reserved for the object according to the test parameters. | 01-19-2012 |
| 20120290245 | METHOD AND APPARATUS FOR PARALLEL TESTING OF SEMICONDUCTOR DEVICES - Method and apparatus for parallel testing of multiple regions on a substrate used in high performance combinatorial development of new materials and processes are described. The apparatus comprises dedicated hardware for each probe assembly with multiple PC controllers networked using a master/slave configuration. | 11-15-2012 |
| 20130110445 | PROGRAMMABLE TEST INSTRUMENT | 05-02-2013 |
| 20130124135 | COMPUTING DEVICE AND METHOD FOR AUTOMATICALLY REPLACING PROBES FOR COORDINATE MEASURING MACHINES - In a computing device, computerized method, and a non-transitory storage medium, correction data of a probe holder is read. The probe holder comprises one or more slots that houses all available probes and is placed on the coordinate measuring machine. The correction data comprises coordinates of the slots. A coordinate of one of the slots is obtained from the correction data. A Z-axis of the coordinate measuring machine moves to a position that corresponds to the extracted coordinates, to detach a probe which is currently installed on the Z-axis and to place the detached probe into the slot, and/or to pick up and install another probe which is currently housed in the slot onto the Z-axis. | 05-16-2013 |
| 20130179109 | CONCURRENT TEST INSTRUMENTATION - A program can be instrumented to test the program. The test instruments are classified, and concurrency constraints applied based on the classifications. A testing tool determines classifications of a plurality of test instruments in the instrumented program. The testing tool prevents concurrent instantiation of multiple of the plurality of test instruments in a first classification of the classifications. Multiple of the plurality of test instruments in a second classification of the classifications are concurrently instantiated. | 07-11-2013 |
| 20140039825 | AREA MONITORING SYSTEM AND CORRESPONDING METHOD FOR OPERATING THE SAME - A monitoring system monitoring an environmental condition of an area by measuring an environmental quantity, including: a static monitoring section including plural static sensor units each configured to collect first measure data relating to the environmental quantity in respective portions of the area; a mobile monitoring section including at least one robot configured to move within the area to collect second measure data relating to the environmental quantity in a portion of the area surrounding the robot; and a central unit communicating with the static sensor units and robot to perform: conditioned to assessing an anomalous environmental condition from first measure data collected by at least one static sensor unit, commanding the robot to operate according to anomaly routines, and conditioned to assessing an anomalous environmental condition from second measure data collected by the robot, commanding at least one static sensor unit to operate according to anomaly routines. | 02-06-2014 |
| 20140278198 | AUTOMATED EXPERIMENT SCHEDULING - Various embodiments are generally directed to an automated A/B testing system using a combination of classical and alternative statistical analysis to control the performance A/B tests. An apparatus includes a processor circuit; and logic to commence collection of a specified number of samples of user responses to multiple versions of a user interface in a test, employ an alternative statistical analysis to analyze the samples as they are collected, determine whether a proposed version elicits a statistically significant improvement in user response over a control version, terminate the test before the specified number of samples are collected in response to a statistically significant improvement over the control version elicited by the proposed version, and complete collection of the specified number of samples and employ a classical statistical analysis to analyze the samples in response to the proposed version not eliciting the statistically significant improvement. Other embodiments are described and claimed. | 09-18-2014 |
| 20150057961 | UNIVERSAL DEVICE MULTI-FUNCTION TEST APPARATUS - Methods and systems for a universal device multi-function test apparatus are provided. Specifically, the universal device multi-function test apparatus is configured to receive multiple device types, manufacturers, and/or models attached to a nest via an interface module. The device can then be subjected to a battery of tests in a unified and controlled test environment. Information related to the initiated tests, even including results, may be associated with the device and stored in memory, written to the device, and/or forwarded for further processing/repair operations. | 02-26-2015 |
| 20150073742 | Industrial Sensor System and Method of Use - An industrial sensor system is disclosed. Said system comprising a communication module, a one or more sensors, and a power system. Said one or more sensors having a body and a logic board. Said one or more signals generated by said logic boards of said one or more sensors. Said logic board of said one or more sensors having a microcontroller capable of processing said one or more signals and a communication BUS capable of communicating with said communication module and other among said one or more sensors over a network. | 03-12-2015 |
| 20150346063 | MEASURING DEVICE, MEASURING SYSTEM AND METHOD FOR OPERATING A MEASURING SYSTEM WITH RAPID SYNCHRONIZATION OF SETTINGS - A measuring device comprises a measuring unit and a synchronization unit. In this context, the measuring unit is embodied to implement a measurement task on the basis of first measurement parameters. The synchronization unit is accordingly embodied to synchronize the first measurement parameters with a further measuring device. The measuring device is then embodied to implement the measurement task jointly with the further measuring device on the basis of at least the first measurement parameters. | 12-03-2015 |
