| Entries |
| Document | Title | Date |
|---|
| 20080198650 | Distortion Estimation And Cancellation In Memory Devices - A method for operating a memory ( | 08-21-2008 |
| 20080278999 | SOURCE AND DRAIN SIDE EARLY BOOSTING USING LOCAL SELF BOOSTING FOR NON-VOLATILE STORAGE - Program disturb is reduced during programming of non-volatile storage by providing a boosting scheme in which isolation voltage are applied to two word lines to create a source side channel region on a source side of one isolation word line, an intermediate channel region between the isolation word lines and a drain side channel region on a drain side of the other isolation word line. Further, during a programming operation, the source and drain side channel regions are boosted early while the intermediate channel region is boosted later, when a program pulse is applied. This approach prevents charge leakage from the intermediate channel region to the source side, avoiding disturb of already programmed storage elements, while also allowing electrons to flow from the intermediate channel region to the drain side channel region, which makes the boosting of the intermediate channel region easier. | 11-13-2008 |
| 20080285341 | READING NON-VOLATILE MULTILEVEL MEMORY CELLS - Embodiments of the present disclosure provide methods, devices, modules, and systems for reading non-volatile multilevel memory cells. One method includes receiving a request to read data stored in a first cell of a first word line, performing a read operation on an adjacent cell of a second word line in response to the request, determining whether the first cell is in a disturbed condition based on the read operation. The method includes reading data stored in the first cell in response to the read request by applying a read reference voltage to the first word line and adjusting a sensing parameter if the first cell is in the disturbed condition. | 11-20-2008 |
| 20080316811 | METHOD FOR OPERATING NON-VOLATILE STORAGE WITH INDIVIDUALLY CONTROLLABLE SHIELD PLATES BETWEEN STORAGE ELEMENTS - A method for controlling non-volatile storage having individually controllable shield plates between storage elements. The shield plates are formed by depositing a conductive material such as doped polysilicon between storage elements and their associated word lines, and providing contacts for the shield plates. The shield plates reduce electromagnetic coupling between floating gates of the storage elements, and can be used to optimize programming, read and erase operations. In one approach, the shield plates provide a field induced conductivity between storage elements in a NAND string during a sense operation so that source/drain implants are not needed in the substrate. In some control schemes, alternating high and low voltages are applied to the shield plates. In other control schemes, a common voltage is applied to the shield plates. | 12-25-2008 |
| 20090003052 | SYSTEM THAT COMPENSATES FOR COUPLING BASED ON SENSING A NEIGHBOR USING COUPLING - Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). To compensate for this coupling, the read or programming process for a given memory cell can take into account the programmed state of an adjacent memory cell. To determine whether compensation is needed, a process can be performed that includes sensing information about the programmed state of an adjacent memory cell (e.g., on an adjacent bit line or other location). | 01-01-2009 |
| 20090003053 | SYSTEM THAT COMPENSATES FOR COUPLING BASED ON SENSING A NEIGHBOR USING COUPLING - Shifts in the apparent charge stored on a floating gate (or other charge storing element) of a non-volatile memory cell can occur because of the coupling of an electric field based on the charge stored in adjacent floating gates (or other adjacent charge storing elements). To compensate for this coupling, the read or programming process for a given memory cell can take into account the programmed state of an adjacent memory cell. To determine whether compensation is needed, a process can be performed that includes sensing information about the programmed state of an adjacent memory cell (e.g., on an adjacent bit line or other location). | 01-01-2009 |
| 20090034328 | MEMORY SYSTEM PROTECTED FROM ERRORS DUE TO READ DISTURBANCE AND READING METHOD THEREOF - A method of reading a memory system including a flash memory includes: reading data from a page in a first block of the flash memory, incrementing a counter each time data is read from the page to store a corresponding number of read-out cycles of the flash memory, and copying data from the first block of the flash memory to a second block of the flash memory when the counter exceeds a reference number of read-out cycles. The data from the first block includes data from the page. | 02-05-2009 |
| 20090046506 | Method and Apparatus for Programming Nonvolatile Memory - A nonvolatile memory has logic which performs a programming operation, that controls a series of programming bias arrangements to program at least a selected memory cell of the memory array with data. The series of programming bias arrangements include multiple sets of changing gate voltage values to the memory cells. | 02-19-2009 |
| 20090046507 | REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE - A method for programming that biases a selected word line with a programming voltage. An unselected word line on the source side and an unselected word line on the drain side of the selected word line are biased at a pass voltage that is less than the normal pass voltage. These unselected word lines are both located a predetermined distance from the selected word line. The remaining word lines are biased at the normal pass voltage. | 02-19-2009 |
| 20090059660 | REDUCING THE IMPACT OF INTERFERENCE DURING PROGRAMMING - A system for programming non-volatile storage is proposed that reduces the impact of interference from the boosting of neighbors. Memory cells are divided into two or more groups. In one example, the memory cells are divided into odd and even memory cells; however, other groupings can also be used. Prior to a first trigger, a first group of memory cells are programmed together with a second group of memory cells. Subsequent to the first trigger and prior to a second trigger, the first group of memory cells are programmed separately from the second group of memory cells. Subsequent to the second trigger, the first group of memory cells are programmed together with the second group of memory cells. Before and after both triggers, the first group of memory cells are verified together with the second group of memory cells. | 03-05-2009 |
| 20090067234 | Flash Memory Device and Fabrication Method Thereof - The present invention relates to a flash memory device and a fabrication method thereof. A trench may be formed within a junction region between word lines by etching a semiconductor substrate between not only a word line and a select line, but also between adjacent word lines. Accordingly, the occurrence of a program disturbance phenomenon can be prevented as the injection of hot carriers into a program-inhibited cell is minimized in a program operation. | 03-12-2009 |
| 20090073761 | Self-Boosting System for Flash Memory Cells - A low voltage of the order of or one to three volts instead of an intermediate V | 03-19-2009 |
| 20090080245 | OFFSET NON-VOLATILE STORAGE - A plurality of non-volatile storage elements on a common active layer are offset from neighbor non-volatile storage elements. This offsetting of non-volatile storage elements helps reduce interference from neighbor non-volatile storage elements. A method of manufacture is also described for fabricating the offset non-volatile storage elements. | 03-26-2009 |
| 20090080246 | Method and apparatus for reduction of bit-line disturb and soft-erase in a trapped-charge memory - A method and device for trading off inhibit disturb against bit-line disturb in a non-volatile memory where a threshold shift per inhibit disturb is increased, a threshold shift per bit-line disturb is decreased and the total threshold shift over the expected lifetime of the non-volatile memory due to inhibit disturbs is approximately equalized with the total threshold shift over the expected lifetime of the non-volatile memory due to bit-line disturbs. | 03-26-2009 |
| 20090086538 | METHOD AND APPARATUS FOR PROGRAMMING MEMORY CELL ARRAY - Disclosed are a method and device for programming an array of memory cells. | 04-02-2009 |
| 20090091973 | REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE - The programming disturb effects in a semiconductor non-volatile memory device are reduced by biasing unselected word lines of a memory block with a negative voltage followed by a positive V | 04-09-2009 |
| 20090103356 | NON-REAL TIME REPROGRAMMING OF NON-VOLATILE MEMORY TO ACHIEVE TIGHTER DISTRIBUTION OF THRESHOLD VOLTAGES - A set of non-volatile storage elements undergoes initial programming, after which a reprogramming, with higher verify levels, is performed in non-real time, such as when a control enters a standby mode, when no other read or write tasks are pending. The reprogramming can program pages in the set one at a time, stopping at a page boundary when another read or write task is pending, and restarting when the control become available again. Status flags can be provided to identify whether a page and/or the set has completed the reprogramming. In another aspect, a higher pass voltage is applied to unselected word lines during the reprogramming. In another aspect, an error count is determined using a default set of read voltages, and an alternative set of read voltages is selected if the count exceeds a threshold. | 04-23-2009 |
| 20090129146 | MITIGATION OF DATA CORRUPTION FROM BACK PATTERN AND PROGRAM DISTURB IN A NON-VOLATILE MEMORY DEVICE - In one of the disclosed embodiments, a write algorithm is used to remove errors due to back pattern effects, cell-to-cell capacitive coupling, and program disturb in memory cells. Original data to be programmed is adjusted prior to an initial programming operation of the memory cells. The original data is then programmed into the memory cells in another programming operation. In an alternate embodiment, a read adjustment weight data value is associated with each series string of memory cells. The weight data value is used to compensate data read during an initial word line read. The weight data value is updated after each read and read adjustment such that the adjusted weight data value is used on the subsequent read operations. | 05-21-2009 |
| 20090135647 | NAND FLASH MEMORY DEVICES HAVING SHIELDING LINES BETWEEN WORDLINES AND SELECTION LINES - A method of programming a flash memory includes applying a shielding voltage to at least one shielding line, which is interposed between a plurality of wordlines and a selection line and operable to reduce capacitance-coupling between the wordline and the selection line during the programming operation, and applying a program voltage to memory cells through one of the wordlines. | 05-28-2009 |
| 20090147569 | FLASH MEMORY PROGRAM INHIBIT SCHEME - A method for minimizing program disturb in Flash memories. To reduce program disturb in a NAND Flash memory cell string where no programming from the erased state is desired, a local boosted channel inhibit scheme is used. In the local boosted channel inhibit scheme, the selected memory cell in a NAND string where no programming is desired, is decoupled from the other cells in the NAND string. This allows the channel of the decoupled cell to be locally boosted to a voltage level sufficient for inhibiting F-N tunneling when the corresponding wordline is raised to a programming voltage. Due to the high boosting efficiency, the pass voltage applied to the gates of the remaining memory cells in the NAND string can be reduced relative to prior art schemes, thereby minimizing program disturb while allowing for random page programming. | 06-11-2009 |
| 20090147571 | SELF-BOOSTING SYSTEM WITH SUPPRESSION OF HIGH LATERAL ELECTRIC FIELDS - In an improved EASB programming scheme for a flash device (e.g. a NAND flash device), the number of word lines separating a selected word line (to which a program voltage is applied) and an isolation word line (to which an isolation voltage is applied) is adjusted as a function (e.g. inverse function) of distance of the selected word line from the drain side select gate to reduce program disturb due to high vertical and lateral electric fields at or near the isolation transistor when programming word lines closer to the drain side select gate. The selected and isolation word lines are preferably separated by two or more word lines to which intermediate voltage(s) are applied. | 06-11-2009 |
| 20090154232 | Disturb control circuits and methods to control memory disturbs among multiple layers of memory - Embodiments of the invention relate generally to data storage and computer memory, and more particularly, to systems, integrated circuits and methods for controlling memory disturbs to and among multiple layers of memory that include, for example, third dimensional memory technology. Each layer of memory can include a plurality of non-volatile memory cells that store data as a plurality of conductivity profiles that can be non-destructively read by applying a read voltage across a selected non-volatile memory cell. Data can be written to a selected non-volatile memory cell by applying a write voltage having a predetermined magnitude and polarity across the selected non-volatile memory cell. Stored data is retained in the plurality of non-volatile memory cells in the absence of power. | 06-18-2009 |
| 20090251962 | Three-Dimensional Memory Device and Driving Method Thereof - A driving method of a three-dimensional memory device having a plurality of layers is provided. One of the layers is selected. A well of the selected layer is biased with a first well voltage. A word line voltage is applied to a selected word line of the selected layer. A well of an unselected layer is biased with a second well voltage higher than the first well voltage. | 10-08-2009 |
| 20090303788 | METHODS AND APPARATUS UTILIZING PREDICTED COUPLING EFFECT IN THE PROGRAMMING OF NON-VOLATILE MEMORY - Methods and memory devices configured to utilize predicted coupling effects of neighboring memory cells in the programming of target memory cells can be utilized to tighten the distribution of threshold voltages for a given bit pattern by compensating for anticipated threshold voltage shift due to capacitive coupling, which can facilitate more discernable Vt ranges, and thus a higher number of bits of data per memory cell. Tightening the distribution of threshold voltages can further facilitate wider margins between Vt ranges, and thus an increased reliability in reading the correct data value of a memory cell. | 12-10-2009 |
| 20090323412 | READ DISTURB MITIGATION IN NON-VOLATILE MEMORY - Read disturb is reduced in non-volatile storage. In one aspect, when a read command is received from a host for reading a selected word line, a word line which is not selected for reading is randomly chosen and its storage elements are sensed to determine optimized read compare levels for reading the selected word line. Or, a refresh operation may be indicated for the entire block based on an error correction metric obtained in reading the storage elements of the chosen word line. This is useful especially when the selected word line is repeatedly selected for reading, exposing the other word lines to additional read disturb. In another aspect, when multiple data states are stored, one read compare level is obtained from sensing, e.g., from a threshold voltage distribution, and other read compare levels are derived from a formula. | 12-31-2009 |
| 20100027331 | MEMORY AND READING METHOD THEREOF - A method for reading a memory, which includes a memory cell having a first half cell and a second half cell, includes the following steps. A first voltage is applied to the memory cell to determine whether a threshold voltage of the first half cell is higher than a predetermined value or not. If the threshold voltage of the first half cell is higher than the predetermined value, a second voltage higher than the first voltage is applied to the memory cell to read data stored in the second half cell, otherwise a third voltage lower than the first voltage is applied to the memory cell to read the data stored in the second half cell. | 02-04-2010 |
| 20100061147 | REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE - The programming disturb effects in a semiconductor non-volatile memory device are reduced by biasing unselected word lines of a memory block with a negative voltage followed by a positive V | 03-11-2010 |
| 20100067295 | Refresh Method for a Non-volatile Memory - A refresh method for a non-volatile memory for preventing disturb phenomenon includes reading data of a memory unit of the non-volatile memory at a first time point within a predefined period and storing the data in a buffer, determining whether data of the memory unit and data of the buffer are identical at a second time point within the predefined period, so as to generate a determination result, and refreshing the memory unit according to the determination result. | 03-18-2010 |
| 20100091565 | M+N BIT PROGRAMMING AND M+L BIT READ FOR M BIT MEMORY CELLS - A memory device and programming and/or reading process is described that programs and/or reads the cells in the memory array with higher threshold voltage resolution than required. In programming non-volatile memory cells, this allows a more accurate threshold voltage placement during programming and enables pre-compensation for program disturb, increasing the accuracy of any subsequent read or verify operation on the cell. In reading/sensing memory cells, the increased threshold voltage resolution allows more accurate interpretations of the programmed state of the memory cell and also enables more effective use of probabilistic data encoding techniques such as convolutional code, partial response maximum likelihood (PRML), low-density parity check (LDPC), Turbo, and Trellis modulation encoding and/or decoding, reducing the overall error rate of the memory. | 04-15-2010 |
| 20100103731 | METHOD ANALYZING THRESHOLD VOLTAGE DISTRIBUTION IN NONVOLATILE MEMORY - A distribution analyzing method for a nonvolatile memory device having memory cells exhibiting overlapping first and second threshold voltage distributions includes; detecting a degree of overlap between the first and second threshold voltage distributions by reading data stored in the memory cells and determining read index data from the read data, and estimating a distribution characteristic for at least one of the overlapping threshold voltage distributions using the read index data. | 04-29-2010 |
| 20100103732 | CONTROLLING AC DISTURBANCE WHILE PROGRAMMING - A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation. | 04-29-2010 |
| 20100118604 | NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE HAVING NON-SELECTED WORD LINES ADJACENT TO SELECTED WORD LINES BEING CHARGED AT DIFFERENT TIMING FOR PROGRAM DISTURB CONTROL - A non-volatile semiconductor memory device includes a memory cell array of data-rewritable non-volatile memory cells or memory cell units containing the memory cells, and a plurality of word lines each commonly connected to the memory cells on the same row in the memory cell array. In write pulse applying during data writing, a high voltage for writing is applied to a selected word line, and an intermediate voltage for writing is applied to at least two of non-selected word lines. The beginning of charging a first word line located between the selected word line and a source line to a first intermediate voltage for writing is followed by the beginning of charging a second word line located between the selected word line and a bit line contact to a second intermediate voltage for writing. | 05-13-2010 |
| 20100128521 | APPLYING NEGATIVE GATE VOLTAGE TO WORDLINES ADJACENT TO WORDLINE ASSOCIATED WITH READ OR VERIFY TO REDUCE ADJACENT WORDLINE DISTURB - Systems, methods, and devices that facilitate applying a predefined negative gate voltage to wordlines adjacent to a selected wordline associated with a memory cell selected during a read or verify operation to facilitate reducing adjacent wordline disturb are presented. A memory component can comprise an optimized operation component that can apply a predefined negative gate voltage to wordlines adjacent to a selected wordline associated with a memory cell selected for a read or verify operation, based at least in part on predefined operation criteria, to facilitate reducing adjacent wordline disturb in the selected memory cell to facilitate reducing a shift in the voltage threshold and maintain a desired operation window. The optimized operation component optionally can include an evaluator component that can facilitate determining whether a negative gate voltage applied to adjacent wordlines is to be adjusted to facilitate reducing adjacent wordline disturb below a predetermined threshold amount. | 05-27-2010 |
| 20100135074 | Post-Facto Correction for Cross Coupling in a Flash Memory - A method of storing and reading data, using a memory that includes a plurality of cells (e.g. flash cells), such that data are stored in the cells by setting respective values of a physical parameter of the cells (e.g. threshold voltage) to be indicative of the data, and such that data are read from the cells by measuring those values. One of the cells and its neighbors are read. The data stored in the cell are estimated, based on the measurements and on respective extents to which the neighbors disturb the reading. Preferably, the method also includes determining those respective extents to which the neighbors disturb the reading, for example based on the measurements themselves. | 06-03-2010 |
| 20100135075 | READING NON-VOLATILE MULTILEVEL MEMORY CELLS - Embodiments of the present disclosure provide methods, devices, modules, and systems for reading non-volatile multilevel memory cells. One method includes receiving a request to read data stored in a first cell of a first word line, performing a read operation on an adjacent cell of a second word line in response to the request, determining whether the first cell is in a disturbed condition based on the read operation. The method includes reading data stored in the first cell in response to the read request by applying a read reference voltage to the first word line and adjusting a sensing parameter if the first cell is in the disturbed condition. | 06-03-2010 |
| 20100142268 | PROGRAMMING METHOD TO REDUCE GATE COUPLING INTERFERENCE FOR NON-VOLATILE MEMORY - A non-volatile memory device and programming process is described that compensates for coupling effects on threshold gate voltages of adjacent floating gate or non-conductive floating node memory cells by adjusting the threshold voltage level programmed in view of the data being programmed on a following programming cycle into adjacent memory cells, so that the coupling effect results in the desired target threshold voltages for the cells. In one embodiment of the present invention, memory cell coupling is compensated for by adjusting programming level of one or more memory cells of a first page a memory array to a higher or lower threshold verify target voltage given the data/programming level to be written to directly adjacent memory cells of a second page, so that coupling between the directly adjacent memory cells of the first and second pages brings the memory cells of first page to their final target programming level. | 06-10-2010 |
| 20100149866 | Systems and Devices Including Memory Resistant to Program Disturb and Methods of Using, Making, and Operating the Same - Disclosed are methods, systems and devices, one such device being a memory device configured to concurrently assert a first pulse pattern through a plurality of conductors disposed on both a source side and a drain side of a floating-gate transistor, wherein a source side of the first pulse pattern has a different median voltage than a drain side of the first pulse pattern. | 06-17-2010 |
| 20100182831 | Non-Volatile Memory And Method With Reduced Neighboring Field Errors - A memory device and a method thereof allow programming and sensing a plurality of memory cells in parallel in order to minimize errors caused by coupling from fields of neighboring cells and to improve performance. The memory device and method have the plurality of memory cells linked by the same word line and a read/write circuit is coupled to each memory cells in a contiguous manner. Thus, a memory cell and its neighbors are programmed together and the field environment for each memory cell relative to its neighbors during programming and subsequent reading is less varying. This improves performance and reduces errors caused by coupling from fields of neighboring cells, as compared to conventional architectures and methods in which cells on even columns are programmed independently of cells in odd columns. | 07-22-2010 |
| 20100188897 | APPARATUS FOR REDUCING THE IMPACT OF PROGRAM DISTURB - The unintentional programming of an unselected (or inhibited) non-volatile storage element during a program operation that intends to program another non-volatile storage element is referred to as “program disturb.” A system is proposed for programming and/or reading non-volatile storage that reduces the effect of program disturb. In one embodiment, different verify levels are used for a particular word line (or other grouping of storage elements) during a programming process. In another embodiment, different compare levels are used for a particular word (or other grouping of storage elements) during a read process. | 07-29-2010 |
| 20100188898 | REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE - The programming disturb effects in a semiconductor non-volatile memory device can be mitigated by biasing unselected memory cells with a negative voltage while a well containing the memory cells receives a positive voltage. A selected memory cell in the well can be biased with a negative voltage while the well is at the positive voltage then the selected memory cell bias transitions to a positive programming voltage when the well returns to a ground potential. | 07-29-2010 |
| 20100195383 | Isolated P-well Architecture for a Memory Device - A memory device and a method to prevent or reduce program disturb by isolating P-wells of strings in a non-volatile memory array. During a program operation, the isolated P-wells may be coupled to corresponding bitlines, which may be selected or inhibited, and may be at different voltages. During erase, read, and verify operations, the isolated P-wells may be coupled to source. | 08-05-2010 |
| 20100195384 | SYSTEM AND METHOD TO READ DATA SUBJECT TO A DISTURB CONDITION - Systems and methods for reading data are disclosed. In a particular embodiment, a method includes measuring characteristics of a plurality of cells at a memory. The characteristics correspond to a plurality of values including a first value stored at a particular cell and a second value stored at a second cell of the memory. The method includes testing whether at least some of the plurality of values match a particular pattern correlated to a disturb condition at the particular cell, and providing a data value corresponding to the particular cell. The data value is determined at least in part based on a result of the testing. | 08-05-2010 |
| 20100202196 | METHOD OF READING NONVOLATILE MEMORY DEVICE AND NONVOLATILE MEMORY DEVICE FOR IMPLEMENTING THE METHOD - A nonvolatile memory device includes a read margin critical value calculation unit configured to calculate a critical value of a read margin between a read voltage and a threshold voltage of a specific cell, an interference value calculation unit configured to calculate an interference value affecting the threshold voltage of the specific cell, a comparison unit configured to compare the critical value and the interference value and to output a result of the comparison, and a data selection unit configured to output either first data, read from the specific cell using a first read voltage, or second data, read from the specific cell using a second read voltage, based on the result outputted from the comparison unit. | 08-12-2010 |
| 20100259978 | METHODS AND APPARATUS UTILIZING EXPECTED COUPLING EFFECT IN THE PROGRAMMING OF MEMORY CELLS - Methods and memory devices configured to utilize predicted coupling effects of neighboring memory cells in the programming of target memory cells can be utilized to tighten the distribution of threshold voltages for a given bit pattern by compensating for anticipated threshold voltage shift due to capacitive coupling, which can facilitate more discernable Vt ranges, and thus a higher number of bits of data per memory cell. Tightening the distribution of threshold voltages can further facilitate wider margins between Vt ranges, and thus an increased reliability in reading the correct data value of a memory cell. | 10-14-2010 |
| 20100265764 | Methods of accessing storage devices - Methods of accessing storage devices. The methods include rearranging a writing order of continuous first and second data according to a reading order, and writing the first and second data in a first and second storage region of the storage device, respectively, according to the writing order. The reading order reads the second storage region first that provides interference on the first storage region. | 10-21-2010 |
| 20100265765 | Non-volatile semiconductor memory device in which program disturb is reduced and method of programming the same - A non-volatile semiconductor memory device capable of reducing program disturb and a method of programming the same are provided. A bit line connected to a non-selected memory cell in the same block as a selected memory cell enters a floating state by inactivating a bit line selection switch, so that voltage levels of an first conductivity type channel and a source/drain terminal formed in a pocket second conductivity type well below a memory transistor have an intermediate level of a voltage level of a selection line and the pocket P type well. Therefore, program disturb caused by FN tunneling and junction hot electrons can be inhibited. | 10-21-2010 |
| 20100271874 | READ DISTURB MITIGATION IN NON-VOLATILE MEMORY - Read disturb is reduced in non-volatile storage. In one aspect, when a read command is received from a host for reading a selected word line, a word line which is not selected for reading is randomly chosen and its storage elements are sensed to determine optimized read compare levels for reading the selected word line. Or, a refresh operation may be indicated for the entire block based on an error correction metric obtained in reading the storage elements of the chosen word line. This is useful especially when the selected word line is repeatedly selected for reading, exposing the other word lines to additional read disturb. In another aspect, when multiple data states are stored, one read compare level is obtained from sensing, e.g., from a threshold voltage distribution, and other read compare levels are derived from a formula. | 10-28-2010 |
| 20100302844 | METHOD AND APPARATUS FOR PROVIDING A NON-VOLATILE MEMORY WITH REDUCED CELL CAPACITIVE COUPLING - A flash memory architecture that provides a mechanism for reducing floating gate to floating gate coupling. The floating gates of the memory cells are shifted, either vertically or horizontally thereby offsetting the floating gates of the memory cells to an intervening space between the gates of adjacent memory cells. The shift of the floating gates decreases the floating gate to floating gate coupling. | 12-02-2010 |
| 20100329002 | FORECASTING PROGRAM DISTURB IN MEMORY BY DETECTING NATURAL THRESHOLD VOLTAGE DISTRIBUTION - Program disturb is reduced in a non-volatile storage system during a programming operation by determining a susceptibility of a set of storage elements to program disturb and taking a corresponding precautionary measure, if needed, to reduce the likelihood of program disturb occurring. During programming of a lower page of data, a natural threshold voltage distribution of the set of storage elements is determined by tracking storage elements which are programmed to a particular state, and determining how many program pulses are need for a number N | 12-30-2010 |
| 20110032757 | Programming Memory With Reduced Pass Voltage Disturb And Floating Gate-To-Control Gate Leakage - Program disturb is reduced in a non-volatile storage system by programming storage elements on a selected word line WLn in separate groups, according to the state of their WLn−1 neighbor storage element, and applying an optimal pass voltage to WLn−1 for each group. Initially, the states of the storage elements on WLn−1 are read. A program iteration includes multiple program pulses. A first program pulse is applied to WLn while a first pass voltage is applied to WLn−1, a first group of WLn storage elements is selected for programming, and a second group of WLn storage elements is inhibited. Next, a second program pulse is applied to WLn while a second pass voltage is applied to WLn−1, the second first group of WLn storage elements is selected for programming, and the first group of WLn storage elements is inhibited. A group can include one or more data states. | 02-10-2011 |
| 20110038202 | CONTROL DRIVER FOR MEMORY AND RELATED METHOD - A control driver for non-volatile memory includes a driving circuit, a level shift up circuit, and a select circuit. The select circuit receives a plurality of decoding signals, asserts a select signal when all of the decoding signals are asserted, and does not assert the select signal when any of the decoding signals is not asserted. The level shift up circuit receives the select signal, outputs the pull-up signal at a first voltage when the select signal is asserted, and outputs the pull-up signal at a second voltage when the select signal is not asserted. The driving circuit has a pull-up transistor for pulling up a control line signal according to the pull-up signal, and a pull-down transistor for pulling down the control line signal according to the pull-up signal. | 02-17-2011 |
| 20110038203 | Reduction of Read Disturb Errors in NAND FLASH Memory - Methods and apparatuses for reduction of Read Disturb errors in a NAND FLASH memory system utilizing modified or extra FLASH memory cells. | 02-17-2011 |
| 20110058413 | MITIGATION OF DATA CORRUPTION FROM BACK PATTERN AND PROGRAM DISTURB IN A NON-VOLATILE MEMORY DEVICE - In one of the disclosed embodiments, a write algorithm is used to remove errors due to back pattern effects, cell-to-cell capacitive coupling, and program disturb in memory cells. Original data to be programmed is adjusted prior to an initial programming operation of the memory cells. The original data is then programmed into the memory cells in another programming operation. In an alternate embodiment, a read adjustment weight data value is associated with each series string of memory cells. The weight data value is used to compensate data read during an initial word line read. The weight data value is updated after each read and read adjustment such that the adjusted weight data value is used on the subsequent read operations. | 03-10-2011 |
| 20110069542 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE INCLUDING NAND-TYPE FLASH MEMORY AND THE LIKE - A nonvolatile semiconductor memory device is provided with a memory cell array, a judgment potential correction circuit, and a readout circuit. In the memory cell array, a plurality of memory cells are arranged in a matrix form, and the array includes a first memory cell as a readout object and a second memory cell disposed adjacent to the first memory cell. The judgment potential correction circuit corrects a judgment potential based on a threshold value of the second memory cell. The readout circuit reads the first memory cell as the readout object by use of the corrected judgment potential. | 03-24-2011 |
| 20110069543 | Methods of Operating Nonvolatile Memory Devices to Inhibit Parasitic Charge Accumulation Therein - Methods of operating a charge trap nonvolatile memory device include operations to erase a first string of nonvolatile memory cells by selectively erasing even-numbered nonvolatile memory cells in the first string and then selectively erasing the odd-numbered nonvolatile memory cells in the first string, which may be interleaved with the even-numbered nonvolatile memory cells. This operation to selectively erase the even-numbered nonvolatile memory cells may include erasing the even-numbered nonvolatile memory cells while simultaneously biasing the odd-numbered nonvolatile memory cells in a blocking condition that inhibits erasure of the odd-numbered nonvolatile memory cells. The operation to selectively erase the odd-numbered nonvolatile memory cells may include erasing the odd-numbered nonvolatile memory cells while simultaneously biasing the even-numbered nonvolatile memory cells in a blocking condition that inhibits erasure of the even-numbered nonvolatile memory cells. | 03-24-2011 |
| 20110075477 | REDUCING THE IMPACT OF INTERFERENCE DURING PROGRAMMING - A system for programming non-volatile storage is proposed that reduces the impact of interference from the boosting of neighbors. Memory cells are divided into two or more groups. In one example, the memory cells are divided into odd and even memory cells; however, other groupings can also be used. Prior to a first trigger, a first group of memory cells are programmed together with a second group of memory cells. Subsequent to the first trigger and prior to a second trigger, the first group of memory cells are programmed separately from the second group of memory cells. Subsequent to the second trigger, the first group of memory cells are programmed together with the second group of memory cells. Before and after both triggers, the first group of memory cells are verified together with the second group of memory cells. | 03-31-2011 |
| 20110096597 | PROGRAMMING A FLASH MEMORY DEVICE - An initial verify read operation is performed after each programming pulse. The verify voltage starts at an initial verify voltage for the first word line and increases for each word line that is verified up to a maximum verify voltage. A second verify read operation is then performed after the program/verify operation. The second verify read operation uses a verify voltage that is substantially close to the maximum verify voltage used during the program/verify step. | 04-28-2011 |
| 20110116311 | REDUCTION OF PUNCH-THROUGH DISTURB DURING PROGRAMMING OF A MEMORY DEVICE - In one or more of the disclosed embodiments, a punch-through disturb effect in a memory device can be reduced by biasing a selected word line at a program voltage to program a selected memory cell, biasing word lines on the drain side of the series string with a V | 05-19-2011 |
| 20110122687 | TECHNIQUES FOR REDUCING DISTURBANCE IN A SEMICONDUCTOR DEVICE - Techniques for reducing disturbance in a semiconductor memory device are disclosed. In one particular exemplary embodiment, the techniques may be realized as a semiconductor memory device having reduced disturbance. The semiconductor memory device may comprise a plurality of memory cells arranged in arrays of rows and columns. The semiconductor memory device may also comprise a plurality of data sense amplifiers, coupled to the plurality of memory cells, configured to perform one or more operations during an operation/access cycle, wherein the operation/access cycle may comprise an operation segment and a disturbance recovery segment. | 05-26-2011 |
| 20110122689 | REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE - A method for programming that biases a selected word line with a programming voltage. An unselected word line on the source side and an unselected word line on the drain side of the selected word line are biased at a pass voltage that is less than the normal pass voltage. These unselected word lines are both located a predetermined distance from the selected word line. The remaining word lines are biased at the normal pass voltage. | 05-26-2011 |
| 20110128782 | REDUCING EFFECTS OF ERASE DISTURB IN A MEMORY DEVICE - Methods for programming and memory devices are disclosed. One such method for programming includes initially biasing a subset of a plurality of control gates of a string of memory cells with a negative voltage, wherein the subset is less than all of the plurality of control gates of the string. The control gate of a selected memory cell is subsequently biased with a programming voltage during a programming phase. | 06-02-2011 |
| 20110157973 | NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE CAPABLE OF PREVENTING OVER-PROGRAMMING - According to one embodiment, a semiconductor memory device includes a memory cell array, a data memory circuit, a power generation circuit, and a controller. In the memory cell array, a plurality of memory cells which store two-or-more-bit data are arrayed in a matrix. When data is written to all memory cells connected to selected word lines, the controller performs a write operation with a write voltage obtained by adding the step-up voltage to the write voltage until a write count indicating a number of times by which writing is performed reaches a first write count. When the first write count is exceeded, the controller controls whether the step-up voltage is to be added or not, for each write operation. | 06-30-2011 |
| 20110157978 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD OF READING DATA FROM NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - At the time of reading, an unselected word line voltage is fixed to a first predetermined voltage (0 V or 3 V), and when selecting a word line, a selected word line voltage is set to a second predetermined voltage (−3.5 V or 0 V). This configuration eliminates an application of a pulsed voltage to the word line at the time of reading, making it possible to reduce an influence of read disturbance. In addition, even when a voltage in a range from a power source voltage to a ground voltage or a voltage over the power source voltage is required at the time of reading, it becomes a voltage about 1.5 times an absolute value of the power source voltage. Therefore, a voltage step-up circuit having a large number of stages is not required, and as a result, it is possible to achieve a reduced operation time with a low power consumption. | 06-30-2011 |
| 20110182117 | METHOD OF PROGRAMMING NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A method of programming a nonvolatile semiconductor memory device using a negative bias voltage. The method includes turning ON the string selection transistors connected to selected bit lines and turning OFF the string selection transistors connected to unselected bit lines in the same memory block, in a program mode. This can be achieved by applying a negative bias voltage to a bulk substrate and applying a voltage having a voltage level higher than the threshold voltage of string selection transistors connected to selected bit lines and lower than the threshold voltage of string selection transistors connected to unselected bit lines. The method may reduce programming disturbance between a selected cell string and an unselected cell string. | 07-28-2011 |
| 20110188307 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR DRIVING SAME - According to one embodiment, a nonvolatile semiconductor memory device includes a memory unit and a control unit. The memory unit includes a charge storage film and a memory cell transistor. The transistor is provided for each of storage regions configured to store charge in the film. The control unit sets the transistors to an erase threshold by setting erase information in the regions; subsequently sets the transistors to thresholds corresponding to information having n values by programming the information having the n values to at least one of the regions in which the erase information is set; and controls information of at least one storage region before being programmed adjacent to the regions programmed with the information to have a value providing a threshold of the transistor nearer than the erase threshold to the thresholds corresponding to the information having the n values in the state of the transistors provided in the regions being set to the thresholds corresponding to the information having the n values. | 08-04-2011 |
| 20110216586 | Methods And Apparatus For Intercell Interference Mitigation Using Modulation Coding - Methods and apparatus are provided for intercell interference mitigation using modulation coding. During programming of a flash memory, a modulation encoding is performed that selects one or more levels for programming the flash memory such that a reduced number of cells in the flash memory are programmed with a value that violates one or more predefined criteria. During a reading of a flash memory, a modulation decoding is performed that assigns one or more levels to cells in the flash memory such that a reduced number of cells in the flash memory are read with a value that violates one or more predefined criteria. The predefined criteria can be based, for example, on one or more of an amount of disturbance caused by the programmed cell; a voltage shift of a programmed cell: a voltage stored by a programmed cell; an amount of change in current through a programmed cell; and an amount of current through a programmed cell. | 09-08-2011 |
| 20110235410 | DEVICE AND METHOD TO READ DATA SUBJECT TO A DISTURB CONDITION - A storage device includes a plurality of memory elements and a controller. The controller is configured to receive measured characteristics of the memory elements. The measured characteristics correspond to a plurality of values including a first value stored at a first memory element of the plurality of memory elements and a second value stored at a second memory element of the plurality of memory elements. The controller is configured to test whether at least some of the plurality of values match a particular pattern correlated to a disturb condition at the first memory element. The controller is configured to provide a data value corresponding to the first memory element, where the data value is determined at least in part based on a result of the test. | 09-29-2011 |
| 20110235412 | CONTROLLING AC DISTURBANCE WHILE PROGRAMMING - A system and methodology that can minimize disturbance during an AC operation associated with a memory, such as, program, read and/or erase, is provided. The system pre-charges all or a desired subset of the bit lines in a memory array to a specified voltage, during an AC operation to facilitate reducing AC disturbances between neighboring cells. A pre-charge voltage can be applied to all bit lines in a block in the memory array, or to bit lines associated with a selected memory cell and neighbor memory cells adjacent to the selected memory cell in the block. The system ensures that source and drain voltage levels can be set to desired levels at the same or substantially the same time, while selecting a memory cell. This can facilitate minimizing AC disturbances in the selected memory cell during the AC operation. | 09-29-2011 |
| 20110249493 | NAND FLASH MEMORY - In a state in which a first and second selection gate transistors are turned off and a first voltage is applied to a control gate of a second memory cell transistor which is connected to a source line side of a first memory cell transistor selected from among the memory cell transistors and which is to be cut off, a second voltage which is higher than the first voltage and which causes a plurality of third memory cell transistors remaining unselected in the memory cell transistors to conduct is applied to control gates of the third memory cell transistors, and thereafter a threshold voltage of the first memory cell transistor is changed to a threshold voltage higher than the first threshold voltage corresponding to the erase state by applying a third voltage which is higher than the second voltage to a control gate of the first memory cell transistor. | 10-13-2011 |
| 20110249494 | MULTIPLE SELECT GATES WITH NON-VOLATILE MEMORY CELLS - Multiple select gates in association with non-volatile memory cells are described. Various embodiments include multiple select gate structure, process, and operation and their applicability for memory devices, modules, and systems. In one embodiment a memory array is described. The memory array includes a number of select gates coupled in series to a number of non-volatile memory cells. A first select gate includes a control gate and a floating gate electrically connected together and a second select gate includes a control gate and a floating gate which are electrically separated by a dielectric layer. | 10-13-2011 |
| 20110286265 | PROGRAMMING NON-VOLATILE STORAGE WITH SYNCHONIZED COUPLING - A process for programming non-volatile storage is able to achieve faster programming speeds and/or more accurate programming through synchronized coupling of neighboring word lines. The process for programming includes raising voltages for a set of word lines connected a group of connected non-volatile storage elements. The set of word lines include a selected word line, unselected word lines that are adjacent to the selected word line and other unselected word lines. After raising voltages for the set of word lines, the process includes raising the selected word line to a program voltage and raising the unselected word lines that are adjacent to the selected word line to one or more voltage levels concurrently with the raising the selected word line to the program voltage. The program voltage causes at least one of the non-volatile storage elements to experience programming. | 11-24-2011 |
| 20110286266 | MEMORY SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME - In a read step or a program (write) verification step of a semiconductor memory device, read voltages different from one another are applied to a pair of word lines respectively disposed on both sides of a selected word line to suppress the enlargement of program distribution. | 11-24-2011 |
| 20110299331 | FLASH MEMORY PROGRAM INHIBIT SCHEME - A method for minimizing program disturb in Flash memories. To reduce program disturb in a NAND Flash memory cell string where no programming from the erased state is desired, a local boosted channel inhibit scheme is used. In the local boosted channel inhibit scheme, the selected memory cell in a NAND string where no programming is desired, is decoupled from the other cells in the NAND string. This allows the channel of the decoupled cell to be locally boosted to a voltage level sufficient for inhibiting F-N tunneling when the corresponding wordline is raised to a programming voltage. Due to the high boosting efficiency, the pass voltage applied to the gates of the remaining memory cells in the NAND string can be reduced relative to prior art schemes, thereby minimizing program disturb while allowing for random page programming. | 12-08-2011 |
| 20110305080 | Post-Facto Correction for Cross Coupling in a Flash Memory - A method of storing and reading data, using a memory that includes a plurality of cells (e.g. flash cells), such that data are stored in the cells by setting respective values of a physical parameter of the cells (e.g. threshold voltage) to be indicative of the data, and such that data are read from the cells by measuring those values. One of the cells and its neighbors are read. The data stored in the cell are estimated, based on the measurements and on respective extents to which the neighbors disturb the reading. Preferably, the method also includes determining those respective extents to which the neighbors disturb the reading, for example based on the measurements themselves. | 12-15-2011 |
| 20120026788 | DISTORTION ESTIMATION AND CANCELLATION IN MEMORY DEVICES - A method for operating a memory ( | 02-02-2012 |
| 20120026789 | DISTORTION ESTIMATION AND CANCELLATION IN MEMORY DEVICES - A method for operating a memory ( | 02-02-2012 |
| 20120063223 | Most compact flotox-based combo NVM design without sacrificing EEPROM endurance cycles for 1-die data and code storage - Disclosed is a low-cost hybrid storage solution that allows Code like sector-alterable NOR and Data like block-alterable NAND and byte-alterable EEPROM being integrated on a same die. The disclosed combo NVM design of the present invention is a truly Data-oriented NVM design that allows 2T-EEPROM to integrate both 0.5T-NAND and 1T-NOR without sacrificing any EEPROM's byte-write performance in the same die. The invention provides several new embodiment sets of preferable bias conditions of Program, Program-Inhibit, Erase and Erase-Inhibit for operating bit-write, byte-write, sector-write and page-write for several preferable Flotox-based EEPROM, NOR and NAND or combo NVM arrays that include types of shared SL, 8-pair BLs and SLS, with or without GBL, normally Erased Vt and Programmed Vt, or the reversed Erased-Vt or Programmed-Vt, etc. Further disclosed is a flexible X-decoder design to allow the flexible selection of pages to be erased to save erase time. Also disclosed is using on-chip negative voltage for FT's gate along with the less positive HV applied to FTs' channel region for same write performance but with the benefits of channel length reduction in cell and less BVDS electric requirement in peripheral devices for more scalable manufacturing process. | 03-15-2012 |
| 20120120725 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A method of operating a semiconductor memory device includes a memory array having memory cell strings including a first and a second memory cell groups having memory cells, a first and a second dummy elements, a drain select transistor and a source select transistor, wherein the first memory cell group and the second memory cell group are arranged between the drain select transistor and the source select transistor; connecting electrically the first memory cell group to the second memory cell group during a program operation or a read operation of the first memory cell group or the second memory cell group; and performing separately an erase operation of the first memory cell group and an erase operation of the second memory cell group, selecting simultaneously one of the first dummy element and the second dummy element during the erase operation of the selected memory cell group. | 05-17-2012 |
| 20120140556 | METHOD OF OPERATING FLASH MEMORY - A method of operating a flash memory is described. When a first storage site has 2 | 06-07-2012 |
| 20120140557 | PROGRAMMING METHOD FOR NON-VOLATILE MEMORY DEVICE - Provided is a method of programming a non-volatile memory device. The method includes applying a first programming pulse to a corresponding wordline of the non-volatile memory device, applying a second programming pulse to the wordline, wherein a voltage of the second programming pulse is different from that of the first programming pulse, and applying voltages to each bitline connected to the wordline, the voltages applied to each of the bitlines are different from each other according to a plurality of bit values to be programmed to corresponding memory cells in response to the first programming pulse or the second programming pulse. | 06-07-2012 |
| 20120236639 | Reduction of Read Disturb Errors in NAND FLASH Memory - Methods and apparatuses for reduction of Read Disturb errors in a NAND FLASH memory system utilizing modified or extra FLASH memory cells. | 09-20-2012 |
| 20120236640 | REDUCING EFFECTS OF ERASE DISTURB IN A MEMORY DEVICE - A method for programming includes initially biasing a subset of a plurality of control gates of a string of memory cells with a negative voltage, wherein the subset is less than all of the plurality of control gates of the string. The control gate of a selected memory cell is subsequently biased with a programming voltage during a programming phase. | 09-20-2012 |
| 20120262986 | SOURCE SIDE ASYMMETRICAL PRECHARGE PROGRAMMING SCHEME - A method for programming NAND flash cells to minimize program stress while allowing for random page programming operations. The method includes asymmetrically precharging a NAND string from a positively biased source line while the bitline is decoupled from the NAND string, followed by the application of a programming voltage to the selected memory cell, and then followed by the application of bitline data. After asymmetrical precharging and application of the programming voltage, all the selected memory cells will be set to a program inhibit state as they will be decoupled from the other memory cells in their respective NAND strings, and their channels will be locally boosted to a voltage effective for inhibiting programming. A VSS biased bitline will discharge the locally boosted channel to VSS, thereby allowing programming of the selected memory cell to occur. | 10-18-2012 |
| 20120307557 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND DATA ERASE METHOD THEREOF - A nonvolatile semiconductor memory device according to an aspect includes a semiconductor substrate, a memory cell array, memory strings, drain side selection transistors, source side selection transistors, word lines, bit lines, a source line, a drain side selection gate line, a source side selection gate line, and a control circuit. The control circuit applies a first voltage to a selected bit line, thereby executing an erase operation on a selected memory string connected to the selected bit line, and the control circuit applies a second voltage to a non-selected bit line, thereby prohibiting the erase operation for the selected memory string connected to the non-selected bit line. The first voltage is more than the second voltage. | 12-06-2012 |
| 20120307558 | APPARATUS FOR REDUCING THE IMPACT OF PROGRAM DISTURB - The unintentional programming of an unselected (or inhibited) non-volatile storage element during a program operation that intends to program another non-volatile storage element is referred to as “program disturb.” A system is proposed for programming and/or reading non-volatile storage that reduces the effect of program disturb. In one embodiment, different verify levels are used for a particular word line (or other grouping of storage elements) during a programming process. In another embodiment, different compare levels are used for a particular word (or other grouping of storage elements) during a read process. | 12-06-2012 |
| 20130003454 | NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - A non-volatile semiconductor memory device according to embodiments has a memory cell array and a reading circuit, and, in a reading sequence, the reading circuit executes a prereading operation of supplying a first reading voltage to an adjacent word line and supplying a first reading pass voltage to a selected word line, and after executing the prereading operation, executes a main reading operation of supplying a fixed second reading voltage to the selected word line and supplying a fixed second reading pass voltage to the adjacent word line while sensing a plurality of electrical physical amounts of a target memory cell with different reading conditions. | 01-03-2013 |
| 20130039125 | FLASH MEMORY PROGRAM INHIBIT SCHEME - A method for minimizing program disturb in Flash memories. To reduce program disturb in a NAND Flash memory cell string where no programming from the erased state is desired, a local boosted channel inhibit scheme is used. In the local boosted channel inhibit scheme, the selected memory cell in a NAND string where no programming is desired, is decoupled from the other cells in the NAND string. This allows the channel of the decoupled cell to be locally boosted to a voltage level sufficient for inhibiting F-N tunneling when the corresponding wordline is raised to a programming voltage. Due to the high boosting efficiency, the pass voltage applied to the gates of the remaining memory cells in the NAND string can be reduced relative to prior art schemes, thereby minimizing program disturb while allowing for random page programming. | 02-14-2013 |
| 20130083596 | NONVOLATILE MEMORY DEVICE - Embodiments of present invention relate to a nonvolatile memory device that includes a first page buffer controlling any one of a first even bit line and a first odd bit line; a second page buffer controlling any one of a second even bit line and a second odd bit line; wherein the second page buffer operates the second odd bit line according to program when the first page buffer operates the first even bit line according to program, and the second page buffer operates the second even bit line according to program when the first page buffer operates the first odd bit line according to program. | 04-04-2013 |
| 20130088916 | DISTURB VERIFY FOR PROGRAMMING MEMORY CELLS - Apparatuses and methods for disturb verify for programming operations are described. Programming memory cells can include applying a number of programming pulses to a first memory cell, performing a disturb verify operation on a second memory cell adjacent to the first memory cell, and inhibiting the first memory cell from further programming in response to the second memory cell failing the disturb verify operation. Other apparatuses and methods are also disclosed. | 04-11-2013 |
| 20130121071 | REDUCING EFFECTS OF PROGRAM DISTURB IN A MEMORY DEVICE - The programming disturb effects in a semiconductor non-volatile memory device can be mitigated by biasing unselected memory cells with a negative voltage while a well containing the memory cells receives a positive voltage. A selected memory cell in the well can be biased with a negative voltage while the well is at the positive voltage then the selected memory cell bias transitions to a positive programming voltage when the well returns to a ground potential. | 05-16-2013 |
| 20130128660 | READING METHOD OF NON-VOLATILE MEMORY DEVICE - A reading method of a non-volatile memory device that includes a plurality memory cells that each include one floating gate and two control gates disposed adjacent to the floating gate on two alternate sides of the floating gate, respectively, and two adjacent memory cells share one control gate, the reading method comprising applying a read voltage to control gates of a selected memory cell, applying a second pass voltage to alternate control gates of the memory cells different from the control gates of the selected memory cells starting from the control gates next to the selected memory cell, and applying a first pass voltage that is lower than the second pass voltage to alternate the control gates of the memory cells different from the control gates of the selected memory cells starting from the control gates secondly next to the selected memory cell. | 05-23-2013 |
| 20130128661 | MEMORY AND METHOD FOR OPERATING THE SAME - A memory includes a first memory cell, a bit line corresponding to the first memory cell, at least one second memory cell adjacent to the first memory cell, and a page buffer configured to read data of the first memory cell by precharging the bit line to a voltage level which is decided in response to data of the at least one second memory cell. | 05-23-2013 |
| 20130141970 | HIGH-SPEED READABLE SEMICONDUCTOR STORAGE DEVICE - According to one embodiment, a semiconductor storage device includes a memory cell array and a controller. The memory cell array includes a first memory cell, a second memory cell, a third memory cell, and a fourth memory cell. The controller writes data having n values (n is natural numbers of 2 or more to k or less) in the second memory cell and simultaneously writes the fourth memory cell, after writing the data having the n values in the first memory cell. When reading the data from the first memory cell, the controller reads data of the first memory cell and the third memory cell which is selected simultaneously with the first memory cell and, changes a read voltage of the first memory cell based on the data read from the third memory cell. | 06-06-2013 |
| 20130141971 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - A control circuit provides an at least partially negative threshold voltage distribution to a memory cell, thereby erasing retained data of the memory cell, and provides multiple levels of positive threshold voltage distributions thereto, thereby programming multiple levels of data to the memory cell. The control circuit, when executing a program operation to the memory cell, executes a first program operation that provides the multiple levels of positive threshold voltage distributions to a first memory cell which is a memory cell subject to program, and executes a second program operation that provides a positive threshold voltage distribution, to a second memory cell adjacent to the first memory cell, irrespective of (regardless of) whether data to be programmed to the second memory cell is (already) present in the second memory cell or not. | 06-06-2013 |
| 20130163324 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A semiconductor memory device includes a memory cell array including first memory cells and second memory cells connected to at least one word line, a circuit group configured to perform a pre-program operation on the first memory cells using a target voltage and a main program operation on the first memory cells and the second memory cells using a final target voltage, and a control circuit configured to set the target voltage depending on variations in threshold voltages of the first memory cells caused by the main program operation of the second memory cells. | 06-27-2013 |
| 20130163325 | NON-VOLATILE MEMORY DEVICE, METHOD FOR FABRICATING THE SAME, AND METHOD FOR OPERATING THE SAME - A non-volatile memory device includes a first string and a second string that each include a first drain selection transistor, a second drain selection transistor, a plurality of memory cells, and a source selection transistor that are coupled in series in that order, respectively, a first bit line coupled with a node between the first and second drain selection transistors of the first string, and a second bit line coupled with an end node of the second string on the side of the first drain selection transistor of the second string, wherein gates of the first drain selection transistors of the first and second strings are coupled with each other, and gates of the second drain selection transistors of the first and second strings are coupled with each other. | 06-27-2013 |
| 20130163327 | WORD-LINE INTER-CELL INTERFERENCE DETECTOR IN FLASH SYSTEM - Aspects of the subject technology encompass a method for retrieving information stored in flash memory. In certain implementations, the method can include operations for reading a plurality of memory cells in a word line, generating a plurality of read signals based on the reading of the plurality of memory cells and identifying, from among the plurality of read signals, a first read signal associated with a first memory cell and a second read signal associated with a second memory cell, wherein the first memory cell is adjacent to the second memory cell in the word line. In certain aspects, the method can further include operations for generating an output for the first memory cell, wherein the output is based on the first and second read signals. A data storage system and article of manufacture are also provided. | 06-27-2013 |
| 20130235657 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE - According to one embodiment, a nonvolatile semiconductor memory device includes a memory cell array and a controller. The controller is configured to perform a verify operation using a first verification voltage and a second verification voltage (first verification voltage| 09-12-2013 | |
| 20130250675 | Method and Apparatus for Reducing Erase Disturb of Memory By Using Recovery Bias - A nonvolatile memory array is divided into multiple memory groups. The nonvolatile memory array receives an erase command to erase a first set of the memory groups, and not a second set of the memory groups. The control circuitry is responsive to the erase command to erase the first set of memory groups, by applying a recovery bias arrangement that adjusts threshold voltages of memory cells in at least one memory group of the second set of memory groups. By applying the recovery bias arrangement to memory cells in at least one memory group of the second set of memory groups, erase disturb is corrected during the recovery bias arrangement, at least in part. | 09-26-2013 |
| 20130258770 | Parametric Tracking to Manage Read Disturbed Data - Method and apparatus for managing data in a memory, such as a flash memory array. In accordance with various embodiments, data are stored in a first location in a memory, and read from the first location a selected number of times. At least one parameter associated with the first location is measured after the data are read the selected number of times. The data are thereafter migrated to a second location in the memory responsive to the measured parameter indicating a presence of read disturbance in the data in the first location. | 10-03-2013 |
| 20130258771 | METHOD OF PROGRAMMING A NONVOLATILE MEMORY DEVICE - In method of programming a nonvolatile memory device including first and second cell strings that are coupled to one bitline, a first channel of the first cell string and a second channel of the second cell string are precharged by applying a first voltage to the bitline, one cell string is selected from the first and second cell strings, and a memory cell included in the selected cell string is programmed by applying a second voltage greater than a ground voltage and less than the first voltage to the bitline. | 10-03-2013 |
| 20130265823 | Nonvolatile Semiconductor Memory Device Cross-Reference to Related Applications - A nonvolatile semiconductor memory device is provided which includes: a P-type memory cell transistor having a source, a drain, a gate, and a charge storage layer; and a control circuit which, in a case where the P-type memory cell transistor has its threshold greater than or equal to a first value (Vr) and less than or equal to a second value (Vrd), carries out a program operation of injecting electrons into the charge storage layer. | 10-10-2013 |
| 20130272064 | METHOD, APPARATUS, AND SYSTEM FOR IMPROVED READ OPERATION IN MEMORY - Various embodiments include methods, apparatus, and systems for reading an adjacent cell of a memory array in an electronic device to determine a threshold voltage value of the adjacent cell, the adjacent cell being adjacent a target cell, and reading the target cell of the memory array using a wordline voltage value based on the threshold voltage value of the adjacent cell. Additional apparatus, systems, and methods are described. | 10-17-2013 |
| 20130286730 | SEMICONDUCTOR MEMORY DEVICE WHICH STORES MULTILEVEL DATA - According to one embodiment, a semiconductor memory device includes a memory cell, a flag memory cell for a flag, a dummy cell and a controller. The flag memory cell is selected at the same time as the memory cell. The dummy cell is selected at the same time as the memory cell and the flag memory cell. The controller controls write and read of the memory cell, the flag memory cell and the dummy cell. Data is written also in the dummy cell which neighbors the flag cell. | 10-31-2013 |
| 20130294155 | PLURAL OPERATION OF MEMORY DEVICE - An integrated circuit device comprises a semiconductor substrate, a first memory block on the substrate comprising NAND memory cells, a second memory block on the substrate comprising NAND memory cells, and controller circuitry. The first and second memory blocks are configurable to store data for a first pattern of data usage in response to a first operation algorithm to read, program and erase data, and for a second pattern of data usage in response to a second operation algorithm to read, program and erase data, respectively. The controller circuitry is coupled to the first and second memory blocks, and is configured to execute the first and second operation algorithms, wherein a word line pass voltage for read operations applied in the first operation algorithm is at a lower voltage level than a second word line pass voltage for read operations applied in the second operation algorithm. | 11-07-2013 |
| 20130294156 | MEMORY KINK CHECKING - This disclosure concerns memory kink checking. One embodiment includes selectively applying one of a plurality of voltages to a first data line according to a programming status of a first memory cell, wherein the first memory cell is coupled to the first data line and to a selected access line. An effect on a second data line is determined, due at least in part to the voltage applied to the first data line and a capacitive coupling between at least the first data line and the second data line, wherein the second data line is coupled to a second memory cell, the second memory cell is adjacent to the first memory cell, and the second memory cell is coupled to the selected access line. A kink correction is applied to the second data line, responsive to the determined effect, during a subsequent programming pulse applied to the second memory cell. | 11-07-2013 |
| 20130301351 | Channel Boosting Using Secondary Neighbor Channel Coupling In Non-Volatile Memory - In a non-volatile storage system, a programming portion of a program-verify iteration has multiple programming pulses, and storage elements along a word line are selected for programming according to a pattern. Unselected storage elements are grouped to benefit from channel-to-channel capacitive coupling from both primary and secondary neighbor storage elements. The coupling is helpful to boost channel regions of the unselected storage elements to a higher channel potential to prevent program disturb. Each selected storage element has a different relative position within its set. For example, during a first programming pulse, first, second and third storage elements are selected in first, second and third sets, respectively. During a second programming pulse, second, third and first storage elements are selected in the first, second and third sets, respectively. During a third programming pulse, third, first and second storage elements are selected in the first, second and third sets, respectively. | 11-14-2013 |
| 20130314987 | Ramping Pass Voltage To Enhance Channel Boost In Memory Device - In a non-volatile storage system, first and second substrate channel regions for an unselected NAND string are boosted during programming to inhibit program disturb. The first and second substrate channel regions are created on either side of an isolation word line. During a program pulse time period in which a program pulse is applied to a selected word line, a voltage applied to an unselected word line which extends directly over the second channel region is stepped up to a respective pre-program pulse voltage, at a faster rate at which a voltage applied to an unselected word line which extends directly over the first channel region is stepped up to a respective pre-program pulse voltage. This helps improve the isolation between the channel regions. | 11-28-2013 |
| 20130322169 | MULTI-LEVEL CELL (MLC) UPDATE WITH PROTECTED MODE CAPABILITY - Method and apparatus for managing data in a memory, such as a flash memory array. In accordance with some embodiments, a first block of data is written to a group of memory cells at a first memory location in single-level cell (SLC) mode. The first block of data is copied from the first memory location to a group of memory cells at a second memory location to provide a backup copy of the first block of data during a protected mode of operation. A second block of data is subsequently overwritten to the group of memory cells at the first memory location so that the first memory location stores both the first and second blocks of data in multi-level cell (MLC) mode. | 12-05-2013 |
| 20130343123 | FLASHMEMORY PROGRAM INHIBIT SCHEME - A method for minimizing program disturb in Flash memories. To reduce program disturb in a NAND Flash memory cell string where no programming from the erased state is desired, a local boosted channel inhibit scheme is used. In the local boosted channel inhibit scheme, the selected memory cell in a NAND string where no programming is desired, is decoupled from the other cells in the NAND string. This allows the channel of the decoupled cell to be locally boosted to a voltage level sufficient for inhibiting F-N tunneling when the corresponding wordline is raised to a programming voltage. Due to the high boosting efficiency, the pass voltage applied to the gates of the remaining memory cells in the NAND string can be reduced relative to prior art schemes, thereby minimizing program disturb while allowing for random page programming. | 12-26-2013 |
| 20130343124 | SEMICONDUCTOR MEMORY DEVICE AND OPERATION METHOD FOR SAME - According to one embodiment, a control circuit is configured to perform a first read operation and a second read operation. The control circuit is configured to perform the plurality of first sense operations when applying a first reading voltage to the word line in the first read operation. The control circuit is configured to perform a second sense operation when applying a second reading voltage to the word line in the second read operation. The control circuit is configured to select one of informations read out by the plurality of sense operations based on data stored in adjacent memory cells. | 12-26-2013 |
| 20140036586 | MEMORY DEVICE HAVING A DIFFERENT SOURCE LINE COUPLED TO EACH OF A PLURALITY OF LAYERS OF MEMORY CELL ARRAYS - In an embodiment, a memory device may have a plurality of layers of memory cell arrays. Each layer may have a plurality of strings of memory cells and a different source line coupled to each layer of the plurality of layers. | 02-06-2014 |
| 20140043896 | METHOD OF PREVENTING PROGRAM-DISTURBANCES FOR A NON-VOLATILE SEMICONDUCTOR MEMORY DEVICE - A method of preventing program-disturbances for a non-volatile semiconductor memory device having a plurality of memory cells of which each includes a selection transistor and a memory transistor coupled in series between a bit-line and a common source-line is provided. First non-selected memory cells that share a first selection-line with a selected memory cell, and second non-selected memory cells that do not share the first selection-line with the selected memory cell are determined when the selected memory cell is selected to be programmed among the memory cells. A negative voltage is applied to second selection-lines that are coupled to the second non-selected memory cells when the selected memory cell is programmed by applying a positive voltage to the first selection-line that is coupled to the selected memory cell. | 02-13-2014 |
| 20140056064 | MEMORY SYSTEM AND OPERATING METHOD THEREOF - Provided are a memory system and an operating method thereof. The operating method reads an observation memory cell at least one time with different read voltages to configure a first read data symbol, reads a plurality of interference memory cells adjacent to the observation memory cell at least one time with different read voltages to configure second read data symbols, and determines a logical value of the observation memory cell based on the first read data symbol and the second read data symbols. | 02-27-2014 |
| 20140056065 | Reducing Weak-Erase Type Read Disturb In 3D Non-Volatile Memory - A read process for a 3D stacked memory device provides an optimum level of channel boosting for unselected memory strings, to repress both normal and weak-erase types of read disturbs. The channel is boosted by controlling of voltages of bit lines (Vb1), drain-side select gates (Vsgd_unsel), source-side select gates (Vsgs_unsel), a selected level (word line layer) of the memory device (Vcg_sel), and unselected levels of the memory device (Vcg_unsel). A channel can be boosted by initially making the drain-side and source-side select gates non-conductive, to allow capacitive coupling from an increasing Vcg_unsel. The drain-side and/or source-side select gates are then made conductive by raising Vsgd_unsel and/or Vsgs_unsel, interrupting the boosting. Additionally boosting can occur by making the drain-side and/or source-side select gates non-conductive again while Vcg_unsel is still increasing. Or, the channel can be driven at Vb1. Two-step boosting drives the channel at Vb1, then provides boosting by capacitive coupling. | 02-27-2014 |
| 20140063937 | MEMORY DEVICES AND OPERATING METHODS FOR A MEMORY DEVICE - Devices and methods facilitate memory device operation in all bit line architecture memory devices. In at least one embodiment, memory cells comprising alternating rows are concurrently programmed by row and concurrently sensed by row at a first density whereas memory cells comprising different alternating rows are concurrently programmed by row and concurrently sensed by row at a second density. In at least one additional embodiment, memory cells comprising alternating tiers of memory cells are programmed and sensed by tier at a first density and memory cells comprising different alternating tiers of memory cells are programmed and sensed by tier at a second density. | 03-06-2014 |
| 20140063938 | NONVOLATILE MEMORY DEVICE AND SUB-BLOCK MANAGING METHOD THEREOF - A nonvolatile memory device includes a memory block, a row decoder, a voltage generator and control logic. The memory block includes memory cells stacked in a direction intersecting a substrate, the memory block being divided into sub-blocks configured to be erased independently. The row decoder is configured to select the memory block by a sub-block unit. The voltage generator is configured to generate an erase word line voltage to be provided to a first word line of a selected sub-block of the sub-blocks and a cut-off voltage, higher than the erase word line voltage, to be provided to a second word line of the selected sub-block during an erase operation. The control logic is configured to control the row decoder and the voltage generator to perform an erase operation on the selected sub-block. | 03-06-2014 |
| 20140098606 | REDUCING PROGRAMMING DISTURBANCE IN MEMORY DEVICES - Apparatus and methods are disclosed, such as a method that includes precharging channel material of a string of memory cells in an unselected sub-block of a block of memory cells to a precharge voltage during a first portion of a programming operation. A programming voltage can then be applied to a selected memory cell in a selected sub-block of the block of memory cells during a second portion of the programming operation. The selected memory cell is coupled to a same access line as an unselected memory cell in the unselected sub-block. Additional methods and apparatus are disclosed. | 04-10-2014 |
| 20140112068 | METHODS OF PROGRAMMING MEMORY DEVICES - Methods of programming memory devices include biasing each data line of a plurality of data lines to a program inhibit voltage; discharging a first portion of data lines of the plurality of data lines, wherein the first portion of data lines of the plurality of data lines are coupled to memory cells selected for programming; and applying a plurality of programming pulses to the memory cells selected for programming while biasing a remaining portion of data lines of the plurality of data lines to the program inhibit voltage. | 04-24-2014 |
| 20140133223 | MEMORY SEMICONDUCTOR DEVICE AND METHOD OF OPERATING THE SAME - In a read step or a program (write) verification step of a semiconductor memory device, read voltages different from one another are applied to a pair of word lines respectively disposed on both sides of a selected word line to suppress the enlargement of program distribution. | 05-15-2014 |
| 20140133224 | ARCHITECTURE AND METHOD FOR MEMORY PROGRAMMING - Methods of programming a memory, memory devices, and systems are disclosed, for example. In one such method, each data line of a memory to be programmed is biased differently depending upon whether one or more of the data lines adjacent the data line are inhibited. In one such system, a connection circuit provides data corresponding to the inhibit status of a target data line to page buffers associated with data lines adjacent to the target data line. | 05-15-2014 |
| 20140140129 | PROGRAMMING METHOD FOR NAND FLASH MEMORY DEVICE TO REDUCE ELECTRONS IN CHANNELS - In a programming method for a NAND flash memory device, a self-boosting scheme is used to eliminate excess electrons in the channel of an inhibit cell string that would otherwise cause programming disturb. The elimination is enabled by applying a negative voltage to word lines connected to the inhibit cell string before boosting the channel, and this leads to bringing high program immunity. A row decoder circuitry to achieve the programming operation and a file system architecture based on the programming scheme to improve the efficiency of file management are also described. | 05-22-2014 |
| 20140185375 | MEMORY SYSTEM TO DETERMINE INFERENCE OF A MEMORY CELL BY ADJACENT MEMORY CELLS, AND OPERATING METHOD THEREOF - Provided are a memory system and an operating method thereof. The operating method reads an observation memory cell at least one time with different read voltages to configure a first read data symbol, reads a plurality of interference memory cells adjacent to the observation memory cell at least one time with different read voltages to configure second read data symbols, and determines a logical value of the observation memory cell based on the first read data symbol and the second read data symbols. | 07-03-2014 |
| 20140269050 | DETERMINING READ VOLTAGES FOR READING MEMORY - A method of reading data at a data storage device that includes a non-volatile memory having a three-dimensional (3D) configuration includes identifying a first set of storage elements of a first word line of the non-volatile memory that satisfy a condition. The condition is based on one or more states of one or more storage elements. The method includes determining a first read voltage corresponding to the first set of storage elements of the first word line and determining a second read voltage corresponding to a second set of storage elements of the first word line that do not satisfy the condition. The method includes reading data from the first word line by applying the first read voltage to the first set of storage elements of the first word line and applying the second read voltage to the second set of storage elements of the first word line. | 09-18-2014 |
| 20140286092 | MEMORY KINK CHECKING - This disclosure concerns memory kink checking. One embodiment includes selectively applying one of a plurality of voltages to a first data line according to a programming status of a first memory cell, wherein the first memory cell is coupled to the first data line and to a selected access line. An effect on a second data line is determined, due at least in part to the voltage applied to the first data line and a capacitive coupling between at least the first data line and the second data line, wherein the second data line is coupled to a second memory cell, the second memory cell is adjacent to the first memory cell, and the second memory cell is coupled to the selected access line. A kink correction is applied to the second data line, responsive to the determined effect, during a subsequent programming pulse applied to the second memory cell. | 09-25-2014 |
| 20140301139 | Method to Reduce Program Disturbs in Non-Volatile Memory Cells - A non-volatile memory and methods of operating the same to reduce disturbs is provided. In one embodiment, the method includes coupling a first positive high voltage to a first global wordline in a first row of an array of memory cells, and coupling a second negative high voltage (V | 10-09-2014 |
| 20140301140 | Reduction of Read Disturb Errors - Methods and apparatuses for reduction of Read Disturb errors in a memory system utilizing modified or extra memory cells. | 10-09-2014 |
| 20140307504 | DATA STORAGE DEVICE, AND FABRICATION AND CONTROL METHODS THEREOF - A data storage device and fabrication and control methods thereof are disclosed. The data storage device includes a first-first sub-block of memory cells, a second-first sub-block of memory cells, a first well switch, a second well switch and a first group of word lines. The first well switch is operative to convey a first well bias to bias the first-first sub-block of memory cells. The second well switch is operative to convey a second well bias to bias the second-first sub-block of memory cells. Further, the first-first and the second-first sub-blocks both are activated according to the first group of word lines. | 10-16-2014 |
| 20140307505 | MEMORY DISTURB REDUCTION FOR NONVOLATILE MEMORY - Technology is described that supports reduced program disturb of nonvolatile memory. A three/two dimensional NAND array includes a plurality of pages, which are divided into a plurality of page groups. Access is allowed to memory cells within a first page group of a plurality of page groups in an erase block of the three dimensional NAND array, while access is minimized to memory cells within a second page group of the plurality of page groups in the erase block of the three/two dimensional NAND array. Pages in the same page group are physically nonadjacent with each other in the three/two dimensional NAND array. | 10-16-2014 |
| 20140313822 | GROUP CLASSIFICATION METHOD FOR SOLID STATE STORAGE DEVICE - A group classification method includes the following steps. Firstly, a voltage shift parameter table is established. The voltage shift parameter table includes a first positional parameter table corresponding to a first neighboring cell. Then, M | 10-23-2014 |
| 20140340963 | APPARATUS AND METHODS INCLUDING SOURCE GATES - Apparatus and methods are disclosed, such as an apparatus that includes a string of charge storage devices associated with a pillar (e.g., of semiconductor material), a source gate device, and a source select device coupled between the source gate device and the string. Additional apparatus and methods are described. | 11-20-2014 |
| 20140347921 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A semiconductor memory device includes memory cell strings including selection transistors and memory cells coupled between the selection transistors, a peripheral circuit configured to apply an operating voltage to the memory cell strings during a read operation or a verify operation, and a control circuit configured to control the peripheral circuit so that the operating voltage being applied to the selection transistors is controlled to reduce a potential level of a channel of the memory cell strings during the read operation or the verify operation. | 11-27-2014 |
| 20140347922 | SEMICONDUCTOR MEMORY DEVICE AND METHOD OF OPERATING THE SAME - A method of operating a semiconductor memory device includes checking an erase-program cycling number, setting a target erase level to be maintained when the erase-program cycling number is less than a predetermined critical number, and setting the target erase level to be increased when the erase-program cycling number is greater than or equal to the predetermined critical number, and performing an erase operation so that threshold voltages of selected memory cells are less than the set target erase level. | 11-27-2014 |
| 20140369116 | SHIELDED VERTICALLY STACKED DATA LINE ARCHITECTURE FOR MEMORY - Apparatuses and methods are disclosed, including an apparatus that includes first and second strings of vertically stacked memory cells, and first and second pluralities of vertically stacked data lines. A data line of the first plurality of data lines is coupled to the first string through a first select device. A data line of the second plurality of data lines is coupled to the second string through a second select device and is adjacent to the data line coupled to the first string. Such an apparatus can be configured to couple the data line coupled to the first string to a shield potential during at least a portion of a memory operation involving a memory cell of the second string. | 12-18-2014 |
| 20140369117 | MULTIPLE STEP PROGRAMMING IN A MEMORY DEVICE - Method of operating a memory include programming a memory cell and reading the memory cell to determine a programmed threshold voltage of the memory cell. If the programmed threshold voltage is within a threshold voltage distribution of a plurality of threshold voltage distributions, the memory cell is reprogrammed, and if the programmed threshold voltage is not within a threshold voltage distribution of the plurality of threshold voltage distributions, the memory cell is allowed to remain at the programmed threshold voltage. | 12-18-2014 |
| 20140376310 | METHOD OF WRITING DATA IN NON-VOLATILE MEMORY DEVICE - A method of writing data in a non-volatile memory device includes receiving a program command and a first row address corresponding to a first word line; performing a first partial programming operation with respect to first memory cells coupled to the first word line; performing a second partial programming operation with respect to second memory cells coupled to a second word line adjacent to the first word line; performing a first verification operation by verifying the first partial programming operation; and selectively performing a first additional programming operation with respect to the first memory cells depending on a result of the first verification operation. | 12-25-2014 |
| 20150029788 | METHODS OF PROGRAMMING MEMORY DEVICES - Methods of programming memory devices include biasing each data line of a plurality of data lines to a program inhibit voltage; discharging a first portion of data lines of the plurality of data lines, wherein the first portion of data lines of the plurality of data lines are coupled to memory cells selected for programming; and applying a plurality of programming pulses to the memory cells selected for programming while biasing a remaining portion of data lines of the plurality of data lines to the program inhibit voltage. | 01-29-2015 |
| 20150055411 | METHOD OF OPERATING A NONVOLATILE MEMORY DEVICE HAVING READ DISTURBED PAGE - A method of operating a nonvolatile memory device by programming pages using a N-bit programming mode until a threshold voltage distribution shift for an un-programmed page in the same memory block is determined, and thereafter programming the un-programmed page using a M-bit programming mode, where M is less than N. | 02-26-2015 |
| 20150055412 | METHOD AND APPARATUS FOR REDUCING ERASE DISTURB OF MEMORY BY USING RECOVERY BIAS - A nonvolatile memory array is divided into multiple memory groups. The nonvolatile memory array receives an erase command to erase a first set of the memory groups, and not a second set of the memory groups. The control circuitry is responsive to the erase command to erase the first set of memory groups, by applying a recovery bias arrangement that adjusts threshold voltages of memory cells in at least one memory group of the second set of memory groups. By applying the recovery bias arrangement to memory cells in at least one memory group of the second set of memory groups, erase disturb is corrected during the recovery bias arrangement, at least in part. | 02-26-2015 |
| 20150063023 | PLURAL OPERATION OF MEMORY DEVICE - An integrated circuit device comprises a semiconductor substrate, a first memory block on the substrate comprising NAND memory cells, a second memory block on the substrate comprising NAND memory cells, and controller circuitry. The first and second memory blocks are configurable to store data for a first pattern of data usage in response to a first operation algorithm to read, program and erase data, and for a second pattern of data usage in response to a second operation algorithm to read, program and erase data, respectively. The controller circuitry is coupled to the first and second memory blocks, and is configured to execute the first and second operation algorithms, wherein a word line pass voltage for read operations applied in the first operation algorithm is at a lower voltage level than a second word line pass voltage for read operations applied in the second operation algorithm. | 03-05-2015 |
| 20150070985 | Linear Programming Based Decoding For Memory Devices - Technologies are generally described herein for linear programming based decoding for memory devices. In some examples, a cell threshold voltage level of a memory cell is detected. An interference voltage level of an interference cell that interferes with the memory cell can be determined. The cell threshold voltage level can be decoded in accordance with a set of beliefs to determine the value of the memory cell. The set of beliefs can include a minimization of an objective function of a linear program representing inter-cell interference between the memory cell and the interference cell. | 03-12-2015 |
| 20150103592 | PROGRAMMING TIME IMPROVEMENT FOR NON-VOLATILE MEMORY - Disclosed herein are techniques for providing a programming voltage to a selected word line in a non-volatile memory array. This may be a 3D NAND, 2D NAND, or another type of memory array. The programming voltage may be quickly ramped up on the selected word line, without the need for adding a stronger charge pump to the memory device. The voltage on the selected word line may be ramped up to a target voltage during a channel pre-charge phase. The target voltage may be limited in magnitude so that program disturb does not occur. Next, during a channel boosting phase, the unselected word lines are increased to a boosting voltage. The voltage on the selected word line is also increased during the boosting phase to a second target level. Then, the voltage on the selected word line is charged up from the second target level to a program voltage. | 04-16-2015 |
| 20150103593 | Method of Writing Data in Non-Volatile Memory and Non-Volatile Storage Device Using the Same - A method of writing data in a non-volatile memory includes writing data from a first memory unit to a second memory unit of the non-volatile memory; checking a health of the second memory unit to generate a health result; and reserving the data in the first memory unit and mapping information corresponding to the first memory unit when the health result indicates that the second memory unit is unhealthy. | 04-16-2015 |
| 20150103594 | INTER-CELL INTERFERENCE CANCELLATION - A read module reads memory cells along a first word line by applying a plurality of threshold voltages to the first word line; generates first information about a first memory cell located along the first word line and a first bit line indicating a location of a threshold voltage distribution of the first memory cell relative to the plurality of threshold voltages; reads a second memory cell located along the first word line, a second word line near the first word line, or a second bit line near the first bit line; and generates second information about the second memory cell indicating a state of the second memory cell causing interference to the first memory cell. A compensation module compensates for the interference by assigning one or more of a log-likelihood ratio and a hard decision to the first memory cells based on the first information and the second information. | 04-16-2015 |
| 20150109858 | MEMORY DEVICE AND COLUMN DECODER FOR REDUCING CAPACITIVE COUPLING EFFECT ON ADJACENT MEMORY CELLS - A memory device includes a memory cell array and a column decoder. The memory cell array includes a plurality of even local bit lines and a plurality of odd local bit lines. The column decoder includes a plurality of even pass transistors and a plurality of odd pass transistors. Each of the even pass transistors has a, control terminal coupled to a respective one of a plurality of even selection lines, a first terminal coupled to a respective one of the even local bit lines, and a second terminal coupled to an even global bit line. Each of the odd pass transistors has a control terminal coupled to a respective one of a plurality of odd selection lines, a first terminal coupled to a respective one of the odd local bit lines, and a second terminal coupled to an odd global bit line. | 04-23-2015 |
| 20150117097 | Systems and Methods for Sub-Zero Threshold Characterization in a Memory Cell - Systems and method relating generally to data processing, and more particularly to systems and methods for characterizing a solid state memory. | 04-30-2015 |
| 20150131372 | MEMORY CONTROLLER, MEMORY DEVICE AND METHOD OF OPERATING - A memory controller has a bit line driver configured to supply a selected bit line voltage to a selected bit line and an unselected bit line voltage to an unselected bit line. The selected bit line is coupled to a selected memory cell, and the unselected bit line is coupled to an unselected memory cell. The memory controller further has a word line driver configured to supply a selected word line voltage to a selected word line and an unselected word line voltage to an unselected word line. The selected word line is coupled to the selected memory cell, and the unselected word line is coupled to the unselected memory cell. The unselected bit line voltage is equal to or higher than a difference between the unselected word line voltage and a threshold voltage of the unselected memory cell. | 05-14-2015 |
| 20150131373 | Incremental Programming Pulse Optimization to Reduce Write Errors - In a data storage system having multi-level memory cells, a counter tracks the number of program/erase cycles, anticipated read cycles, or anticipated length of data retention of a cell. When a threshold number of cycles is reached or length of retention or read frequency are anticipated, the cell is programmed using more program voltage pulses, narrower program voltage pulses or some other modification to the incremental step programming pulse to reduce the range where the intermediate least significant (lower) bit read voltage may be erroneous, thereby reducing the probability of write errors when the most significant page (upper) is programmed. | 05-14-2015 |
| 20150294731 | Method to Reduce Program Disturbs in Non-Volatile Memory Cells - A non-volatile memory and methods of operating the same to reduce disturbs is provided. In one embodiment, the method includes coupling a first positive high voltage to a first global wordline in a first row of an array of memory cells, and coupling a second negative high voltage (V | 10-15-2015 |
| 20150302931 | LEVEL COMPENSATION IN MULTILEVEL MEMORY - Some embodiments include apparatuses and methods having a compensation unit to provide a compensation value based at least in part on a threshold voltage value of a memory cell. At least one of such embodiments includes a controller to select a code during an operation of retrieving information from the memory cell to represent a value of information stored in the memory cell. Such a code can be associated with an address having an address value based at least in part on the compensation value. Additional apparatuses and methods are described. | 10-22-2015 |
| 20150325309 | MEMORY APPARATUS, SYSTEMS, AND METHODS - Threshold voltages in a charge storage memory are controlled by threshold voltage placement, such as to provide more reliable operation and to reduce the influence of factors such as neighboring charge storage elements and parasitic coupling. Pre-compensation or post-compensation of threshold voltage for neighboring programmed aggressor memory cells reduces the threshold voltage uncertainty in a flash memory system. Using a buffer having a data structure such as a lookup table provides for programmable threshold voltage distributions that enables the distribution of data states in a multi-level cell flash memory to be tailored, such as to provide more reliable operation. Additional apparatus, systems, and methods are provided. | 11-12-2015 |
| 20150332782 | DISTORTION CANCELLATION IN 3-D NON-VOLATILE MEMORY - A method in a memory that includes multiple analog memory cells arranged in a three-dimensional (3-D) configuration, includes identifying multiple groups of potentially-interfering memory cells that potentially cause interference to a group of target memory cells. Partial distortion components, which are inflicted by the respective groups of the potentially-interfering memory cells on the target memory cells, are estimated. The partial distortion components are progressively accumulated so as to produce an estimated composite distortion affecting the target memory cells, while retaining only the composite distortion and not the partial distortion components. The target memory cells are read, and the interference in the target memory cells is canceled based on the estimated composite distortion. | 11-19-2015 |
| 20150348644 | READOUT OF INTERFERING MEMORY CELLS USING ESTIMATED INTERFERENCE TO OTHER MEMORY CELLS - A method includes storing data in a memory that includes multiple analog memory cells. After storing the data, an interference caused by a first group of the analog memory cells to a second group of the analog memory cells is estimated. The data stored in the first group is reconstructed based on the estimated interference caused by the first group to the second group. | 12-03-2015 |
| 20150364206 | MEMORY SYSTEM AND CONTROL METHOD - A memory system according to embodiments comprises a memory chip that includes a memory cell array having a plurality of memory cells, a first writing unit that writes first data in a first memory cell in the memory cell array, and a second writing unit that writes second data in a second memory cell which is adjacent to the first memory cell. The second data is used in adjusting a threshold value of the first memory cell. | 12-17-2015 |
| 20150364207 | NAND FLASH MEMORY HAVING MULTIPLE CELL SUBSTRATES - A NAND flash memory bank having a plurality of bitlines of a memory array connected to a page buffer, where NAND cell strings connected to the same bitline are formed in at least two well sectors. At least one well sector can be selectively coupled to an erase voltage during an erase operation, such that unselected well sectors are inhibited from receiving the erase voltage. When the area of the well sectors decrease, a corresponding decrease in the capacitance of each well sector results. Accordingly, higher speed erasing of the NAND flash memory cells relative to a single well memory bank is obtained when the charge pump circuit drive capacity remains unchanged. Alternately, a constant erase speed corresponding to a single well memory bank is obtained by matching a well segment having a specific area to a charge pump with reduced drive capacity. A reduced drive capacity charge pump will occupy less semiconductor chip area, thereby reducing cost. | 12-17-2015 |
| 20150371714 | WORD-LINE INTER-CELL INTERFERENCE DETECTOR IN FLASH SYSTEM - Read signals are obtained from memory cells, and a first read signal and a second read signal are identified, from among the plurality of read signals. The first read signal is associated with a first memory cell in a first word line and the second read signal is associated with a second memory cell in a second word line, and the second word line is adjacent to the first word line. An output for the first memory cell is generated, wherein the output is based on the first and the second read signals. | 12-24-2015 |
| 20160005491 | Look Ahead Read Method For Non-Volatile Memory - A read operation for selected memory cell on a selected word line compensates for program disturb which is a nonlinear function of the data state of an adjacent memory cell on an adjacent word line. When a command to perform a read operation for the selected memory cell is received, a read operation is first performed on the adjacent memory cell to determine its data state, or to classify the adjacent memory cell into a threshold voltage range which includes one or more data states, or a portion of a data state. The selected memory cell is then read using a baseline control gate voltage which does not provide compensation, and one or more elevated control gate voltages which provide compensation, to distinguish between two adjacent data states. An optimal sensing result is selected based on the data state or threshold voltage range of the adjacent memory cell. | 01-07-2016 |
| 20160012904 | Determination of Word Line to Word Line Shorts Between Adjacent Blocks | 01-14-2016 |
| 20160012905 | Systems and Methods for Reduced Program Disturb for 3D NAND Flash | 01-14-2016 |
| 20160012906 | SEMICONDUCTOR MEMORY DEVICE FOR STORING MULTIVALUED DATA | 01-14-2016 |
| 20160019949 | PROGRAMMING MEMORIES WITH MULTI-LEVEL PASS SIGNAL - Memories and methods for programming memories with multi-level pass signals are provided. One method includes programming cells of the memory selected to be programmed to a particular target data state of the memory, using program disturb to program cells of the memory selected to be programmed to target data states that are lower than the particular target data state while programming cells of the memory selected to be programmed to the particular target data state, and boosting a channel voltage for cells of the memory selected to be programmed to the target data states that are lower than the particular target data state. Boosting may include using a multi-step pass signal. | 01-21-2016 |
| 20160027513 | NONVOLATILE MEMORY DEVICE, PROGRAM METHOD THEREOF, AND STORAGE DEVICE INCLUDING THE SAME - A nonvolatile memory device includes memory cells stacked in a direction perpendicular to a substrate and further includes a first memory cell string connected between a selected bit line and a selected string selection line, a second memory cell string connected between the selected bit line and an unselected string selection line, and a third memory cell string connected to an unselected bit line. During a bit line setup section of a program operation, a ground voltage is provided to the selected bit line and a power supply voltage provided to the unselected string selection line is changed to the ground voltage. | 01-28-2016 |
| 20160078960 | METHOD AND APPARATUS FOR WRITING DATA TO NON-VOLATILE MEMORY - Devices and methods implemented therein are disclosed for storing data in memory pages of a non-volatile memory of the storage device. The device comprises a non-volatile memory, a reading circuit, a programming circuit and a read disturb detector. The non-volatile memory has an erased memory page comprising a plurality of multi-layer cells (MLCs). The reading circuit is configured to read a respective electric charge stored in each of the plurality of MLCs. The programming circuit is configured to store data in the plurality of MLCs at either one of a first storage density or a second storage density. The read disturb detector is configured to determine whether the erased memory page is read disturbed and if the erased memory page is read disturbed, cause the programming circuit to store data into the MLCs at the second storage density that is less than the first storage density. | 03-17-2016 |
| 20160099058 | Programming Of Drain Side Word Line To Reduce Program Disturb And Charge Loss - Techniques are provided for programming the memory cells of a drain-side edge word line of a set of word lines before programming memory cells of any other word line of the set. Pass voltages applied to the other word lines act as stress pulses which redistribute holes in the charge-trapping material of the memory cells of the other word lines to reduce short-term charge loss and downshifting of the threshold voltage. Additionally, one or more initial program voltages used for the drain-side edge word line are relatively low and also act as stress pulses. The memory cells of the drain-side edge word line are programmed to a narrower Vth window than the memory cells of the other word lines. This compensates for a higher level of program disturb of erased state memory cells of the drain-side edge word line due to reduced channel boosting. | 04-07-2016 |
| 20160099068 | NONVOLATILE MEMORY DEVICE AND PROGRAM METHOD THEREOF - According to example embodiments of inventive concepts, a nonvolatile memory device includes at least two strings that are vertically stacked on a substrate and share one bit line. A program method of the nonvolatile memory device includes setting a pre-charge condition on the basis of a disturb environment between the at least two cell strings, pre-charging or not pre-charging an unselected cell string among the at least two cell strings in response to the pre-charge condition and programming memory cells in a selected cell string among the at least two cell strings. | 04-07-2016 |
| 20160118131 | Adaptive Program Pulse Duration Based On Temperature - Techniques are provided for reducing program disturb in a memory device. The techniques include compensating for a temperature in the memory device to reduce the upshift in the threshold voltage (Vth) of erased-state memory cells. A minimum allowable program pulse duration increases with temperature to account for an increase in the attenuation of a program pulse along a word line. A program pulse duration which accounts for reduced channel boosting at relatively high temperatures is reduced as the temperature increases. An optimum program pulse duration is based on the larger of these durations. The optimum program pulse duration can also be based on factors such as a measure of program disturb or a memory hole width. Program disturb can also be reduced by easing the requirements of a verify test for the highest data state. | 04-28-2016 |
| 20160133334 | READ-THRESHOLD CALIBRATION IN A SOLID STATE STORAGE SYSTEM - A read-threshold calibration method in a solid state storage system including measuring a threshold voltage distribution of solid state storage elements; determining a threshold voltage; decoding data according to the determined threshold voltage; filtering the threshold voltage distribution of solid state storage elements with a predetermined filter length when the decoding fails; changing the filter length; and repeating the determining, decoding, filtering, and changing steps with the changed filter length until the decoding is successful. | 05-12-2016 |
| 20160141046 | Techniques for Reducing Read Disturb in Partially Written Blocks of Non-Volatile Memory - Techniques are presented to reduce the amount of read disturb on partially written blocks of NAND type non-volatile memory, both for when determining the last written word line in a block and also for data read. In both cases, non-selected word lines that are unwritten or, in the case of finding the last written word line, may be unwritten are biased with a lower read-pass voltage then is typically used. The result of such reads can also be applied to an algorithm for finding the last written word by skipping a varying number of word lines. Performance in a last written page determination can also be improved by use of shorter bit line settling times than for a standard read. | 05-19-2016 |
| 20160141047 | Boundary Word Line Operation in Nonvolatile Memory - One or more word lines in a Multi Level Cell (MLC) block are identified as being at high risk of read disturb errors and data is selectively copied from such high risk word lines to a location outside the MLC block where the copy is maintained. Subsequent read requests for the data may be directed to the copy of the data outside the MLC block. | 05-19-2016 |
| 20160141048 | BACKGROUND THRESHOLD VOLTAGE SHIFTING USING BASE AND DELTA THRESHOLD VOLTAGE SHIFT VALUES IN NON-VOLATILE MEMORY - In one embodiment, a computer-implemented method includes determining, by a processor, after the writing of data to a non-volatile memory block, one or more delta threshold voltage shift (TVS | 05-19-2016 |
| 20160180954 | SYSTEMS AND METHODS TO MITIGATE PROGRAM GATE DISTURB IN SPLIT-GATE FLASH CELL ARRAYS | 06-23-2016 |
| 20160379718 | SYSTEMS AND METHODS FOR SUB-ZERO THRESHOLD CHARACTERIZATION IN A MEMORY CELL - Systems and methods relating generally to data processing, and more particularly to systems and methods for characterizing a solid state memory. In one embodiment, the systems and methods may include programming a first cell of a solid state memory device to a negative voltage, programming a second cell of the solid state memory device to a positive voltage, wherein the second cell is adjacent to the first cell, calculating a voltage shift on the negative voltage programmed to the first cell, characterizing a shifted voltage level on the first cell as an interim voltage, and subtracting the voltage shift from the interim voltage to yield an actual voltage on the first cell. | 12-29-2016 |
