| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 356243100 | STANDARD | 51 |
| 20080309929 | METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS - Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems. | 12-18-2008 |
| 20090002696 | STANDARD FOR WAVELENGTH AND INTENSITY FOR SPECTROMETERS - The description relates to a standard for wavelength and intensity for spectrometers, particularly for calibrating and testing measurement heads in spectrometers which are usable primarily in the near infrared region (NIR) of the spectrum. The standard comprises a holder and a plate body arranged in the holder. The plate body is made of transparent plastic with high strength and dimensional stability over a large temperature range. The plastic has distinct absorption bands throughout the entire NIR range and has a chemical structure and composition ensuring an extensive moisture barrier against water absorption and water release in a reliable and stable manner over time. The plate body advantageously comprises an amorphous, transparent copolymer based on cyclic and/or linear olefins. | 01-01-2009 |
| 20090033926 | Device for Calibrating an Image Sensor System in a Motor Vehicle - A device for calibrating an image sensor system in a motor vehicle includes an onboard calibration object situated on engine hood of vehicle. The engine hood is put into a selected position to perform the calibration. | 02-05-2009 |
| 20090103081 | Calibration of a radiometric optical monitoring system used for fault detection and process monitoring - The present invention is directed to a system and method for radiometric calibration of spectroscopy equipment utilized in fault detection and process monitoring. Initially, a reference spectrograph is calibrated to a local primary standard (a calibrated light source with known spectral intensities and traceable to a reference standard). Other spectrographs are then calibrated from the reference spectrograph rather than the local primary calibration standard. This is accomplished by viewing a light source with both the reference spectrograph and the spectrograph to be calibrated. The output from the spectrograph to be calibrated is compared to the output of the reference spectrograph and then adjusted to match that output. The present calibration process can be performed in two stages, the first with the spectrographs calibrated to the reference spectrograph and then are fine tuned to a narrow band light source at the plasma chamber. Alternatively, the reference spectrograph can be calibrated to the local primary standard while optically coupled to the plasma chamber. There, the local primary standard calibration light source is temporarily positioned within the plasma chamber, or in a light chamber disposed along the interior of the chamber for calibrating the reference spectrograph. Other spectrographs can be calibrated to the reference spectrograph while coupled to the plasma chamber with the local primary standard calibration light source, thereby calibrating every component in the entire optical path to the reference spectrograph. | 04-23-2009 |
| 20090153850 | OPTICAL FLUORESCENCE TOMOGRAPHY CALIBRATION - The invention relates to a device for imaging an interior of a turbid medium and a medical image acquisition device comprising: a) a measurement volume ( | 06-18-2009 |
| 20090190124 | Uniform light generating system for testing an image-sensing device and method of using the same - A uniform light generating system for testing an image-sensing device includes a light-generating unit, a light-transmitting unit, a light-diffusing unit, and a lens unit. The light-generating unit has a substrate and a plurality of light-emitting elements electrically disposed on the substrate. The light-transmitting unit has one side communicated with the light-generating unit for receiving and uniformizing light beams projected from the light-emitting elements. The light-diffusing unit has one side disposed on the other side of the light-transmitting unit for receiving and diffusing the light beams that have passed through the light-transmitting unit. The lens unit is disposed on the other side of the light-diffusing unit for transmitting the light beams that have passed through the light-diffusing unit to the image-sensing device. | 07-30-2009 |
| 20100091273 | Reference Light Source Device - The present invention relates to a system for the optical detection of light from analytical samples, the system comprising an analytical instrument comprising an optical detection unit and a sample block unit for receiving a plurality of analytical samples, the system further comprising a calibration device for calibrating the optical detection unit of the analytical instrument, wherein the calibration device comprises a substrate and at least one electrically powered reference light source coupled to the substrate, said at least one reference light source emitting light being detected by the optical detection unit. | 04-15-2010 |
| 20100220321 | Normalization of Data - Methods for normalizing output from an instrument employing a reference standard or non-fluorescing substance disposed within at least one of a plurality of reaction chambers. The method comprises collecting and analyzing a signal associated with the reference standard or non-fluorescing substance to determine a normalizing bias. The normalizing bias is then applied to the data signal collected from a remainder of the plurality of reaction chambers. | 09-02-2010 |
| 20100238435 | CALIBRATION DEVICE FOR USE IN AN OPTICAL PART MEASURING SYSTEM - A calibration device for use in an optical, part measuring system is provided. The device has a central axis and a plurality of regions which are rotationally symmetric about the axis. The device includes a series of step-shaped portions defining a multi-step region having a plurality of step edges. A profile of the multi-step region contains information for calibrating the system. The device further includes a plurality of cylindrically-shaped portions spaced apart along the axis and defining constant diameter regions containing information for calibrating the system. The device still further includes a frustum-shaped portion defining a pair of spaced, slope edge regions and a sloped region having boundaries marked by the pair of slope edge regions. The frustum-shaped portion has first and second diameters at its boundaries which define a range of diameters of parts capable of being measured in the system. A profile of the slope edge regions and the sloped region contains information for calibrating the system. | 09-23-2010 |
| 20100321681 | Fluorescent Color Calibrator for Calibrating RGB Pixel Values - A fluorescent color calibrator for calibrating RGB pixel values is provided. The fluorescent color calibrator includes a plurality of fluorogenic compounds adapted to fluoresce in a visible color spectrum; and a second plurality of fluorogenic compounds adapted to fluoresce in multiple visible gray spectrums. Also provided is a method for using the fluorescent color calibrator to standardize fluorescent colors when viewing with an RGB monitor. | 12-23-2010 |
| 20110090494 | Method for calibrating a photo-tunable microlens - A tunable microlens uses at least two layers of electrodes and a droplet of conducting liquid. Such a droplet, which forms the optics of the microlens, moves toward an electrode with a higher voltage relative to other electrodes in the microlens. When calibration of the microlens is desired, an equal and constant voltage is passed over the first layer of electrodes and a different, constant voltage is passed over the second layer of electrodes, which may, for example, be disposed in a star-like pattern. A driving force relative to each electrode in the second layer results and is proportional to the length of the circumference of the droplet that intersects with each of the electrodes. This driving force reaches equilbrium, and hence the droplet reaches its nominal centered position relative to the second layer of electrodes, when the length of intersection of the circumference of the droplet with each of the electrodes in the second layer is equal. | 04-21-2011 |
| 20110157583 | METHOD OF CALIBRATING SENSITIVITY GAIN - The present invention is directed to a method of calibrating sensitivity gain. In a preview mode, an imaging device is calibrated by a standard light source, therefore obtaining standard sensitivity gain of the preview mode. In a capture mode, the imaging device is calibrated by the standard light source, therefore obtaining standard sensitivity gain of the capture mode. A gain ratio of the standard sensitivity gain of the capture mode to the standard sensitivity gain of the preview mode is determined, and is then used to deduce the exposure parameters of the capture mode according to the exposure parameters of the preview mode. | 06-30-2011 |
| 20110157584 | METHOD OF CALIBRATING A LIGHT SOURCE - The present invention is directed to a method of calibrating a light source. In one embodiment, a standard image sensor is used to capture emitted light of a standard and a to-be-calibrated light source in order to obtain a standard and a nonstandard image, respectively. A standard and a nonstandard luminance response are generated according to the standard and the nonstandard image, respectively. The to-be-calibrated light source is adjusted until the nonstandard luminance response is about equal to the standard luminance response. In another embodiment, the standard image sensor is used to capture emitted light of the standard and the to-be-calibrated light source. According to sampled outputs of the standard image sensor, a standard and a nonstandard chrominance response are respectively generated, which are used to compensate an image sensor under test. | 06-30-2011 |
| 20110199608 | METHOD FOR CALIBRATING A DEVICE FOR OPTICAL CURVATURE MONITORING - A method for calibrating a device for monitoring the curvature of a stiffener ( | 08-18-2011 |
| 20110211192 | OPTICAL MEASURING DEVICE AND CALIBRATION DEVICE - There is provided an optical measuring device including: plural light-receiving units; a frame to which the respective light-receiving units are mounted on a same circumference whose axial center is a predetermined position, with optical axes of the light-receiving units being directed toward the axial center, an object of measurement being disposed at an axially central portion of the circumference; a measuring section that outputs measured values corresponding to received light amounts; a reference sample disposed, instead of the object of measurement, at the axially central portion of the circumference such that a longitudinal direction of the reference sample runs along an axis of the circumference; a reference light source that illuminates light of the predetermined wavelength toward the reference sample; and a calibrating section that calibrates the sensitivities of the plural light-receiving units at a time of measuring the object of measurement. | 09-01-2011 |
| 20110299070 | METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS - Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems. | 12-08-2011 |
| 20110304849 | DEVICE FOR CALIBRATING OPTICAL SCANNER, METHOD OF MANUFACTURING THE DEVICE, AND METHOD OF CALIBRATING OPTICAL SCANNER USING THE DEVICE - A device for calibrating an optical scanner includes a substrate; and a pattern disposed on the substrate, the pattern comprising a photoresist. | 12-15-2011 |
| 20120133930 | METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS - Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems. | 05-31-2012 |
| 20120218546 | Laser Scanner, Laser Scanner Measuring System, Calibration Method For Laser Scanner Measuring System And Target For Calibration - A laser scanner measuring system is disclosed, which has a laser scanner and a calibration target. The laser scanner comprises a light emitting element for emitting a pulsed laser beam, a rotary projecting unit for projecting the pulsed laser beam, a distance measuring unit, and a control unit for driving and controlling the light emitting element and the distance measuring unit. The calibration target has a reflection sector with a known shape and with high reflectance and is installed at a known position. In use, there is a step for judging a reflected pulsed laser beam from the reflection sector by detecting a level of light quantity, a step for determining a center position of the reflection sector based on the result of the judgment, and a step for calibrating the laser scanner measuring system based on the determined center position and on the known position. | 08-30-2012 |
| 20130016347 | PROBE AND OPTICAL MEASUREMENT APPARATUS - A probe detachably connected to an optical measurement apparatus includes: a fiber that emits light by the optical measurement apparatus, and outputs reflected light and/or scattered light from an object to be measured; a covering member that covers a side face of the fiber; a cap that covers a distal end of the probe; a standard object that is provided on a surface of the cap facing the distal end of the fiber and that is used in calibration measurement by light emitted from the distal end of the fiber; an adhesive member that adheres the cap to the distal end of the probe and is made of an adhesive material; a heat-generating portion that generates heat to be applied to the adhesive member; and a thermal conduction portion that conducts heat that decreases the adhesive strength of the adhesive material with respect to the covering member. | 01-17-2013 |
| 20130050690 | CALIBRATION DEVICE FOR LIGHT MEASURING EQUIPMENT - Disclosed herein is a calibration device for a light measuring equipment, the calibration device including: a standard illuminant emitting light for calibration; and a universal jig fixing target light measuring equipments to be calibrated having various sizes and moving in a direction in parallel with an optical axis of the standard illuminant. Therefore, it is possible to use both of a method of performing calibration by changing a distance between the standard illuminant and the target light measuring equipment to be calibrated and a method of performing calibration by changing a current applied to the standard illuminant. In addition, it is possible to perform calibration for the light measuring equipment having a plurality of sensors and to significantly improve accuracy of calibration. | 02-28-2013 |
| 20130250289 | CHECK-TILE FOR COLOUR MEASUREMENT INSTRUMENTS - The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular of goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising:
| 09-26-2013 |
| 20130258331 | CHECK-TILE FOR COLOUR MEASUREMENT INSTRUMENTS - The invention relates to a check-tile for validating instrument scales of colour measurement instruments, in particular goniospectrophotometers, said check-tile comprising a non-transparent (opaque) substrate coated with a multi-layer coating, said multi-layer coating comprising:
| 10-03-2013 |
| 20140185041 | LIGHT SOURCE DEVICE, SURFACE INSPECTING APPARATUS USING THE DEVICE, AND METHOD FOR CALIBRATING SURFACE INSPECTING APPARATUS USING THE DEVICE - A surface inspecting apparatus can inspect a smaller defect by using a PSL of a smaller particle size. However, the particle size of the PSL is restricted. In the conventional surface inspecting apparatus, therefore, no consideration has been taken as to how to inspect the defect of such a small particle size as is not set in the PSL which will be needed in the near future in an inspection of a semiconductor manufacturing step. The invention has a light source device for generating light which simulated at least one of a wavelength, a light intensity, a time-dependent change of the light intensity, and a polarization of light which was scattered, diffracted, or reflected by an inspection object, and the light is inputted to a photodetector of the surface inspecting apparatus. The smaller defect can be inspected. | 07-03-2014 |
| 20140307256 | PROCESS COMPATIBLE SEGMENTED TARGETS AND DESIGN METHODS - Methods of designing metrology targets are provided, which comprise distinguishing target elements from their background area by segmenting the background area and optionally segmenting the target elements. The provided metrology targets may maintain a required feature size when measured yet be finely segmented to achieve process and design rules compatibility which results in higher accuracy of the metrology measurements. Particularly, all transitions between target features and adjacent background features may be designed to maintain a feature size of the features below a certain threshold. | 10-16-2014 |
| 20150015876 | Luminescence Reference Standards - The present teachings provide for systems, and components thereof, for detecting and/or analyzing light. These systems can include, among others, optical reference standards utilizing luminophores, such as nanocrystals, for calibrating, validating, and/or monitoring light-detection systems, before, during, and/or after sample analysis. | 01-15-2015 |
| 20150055129 | METHOD OF SUPPORTING AN ITEM IN A MOUNTING APPARATUS - A method of supporting an item in a mounting apparatus includes providing an item having first, second, and third members that are at least partially-spherical. The method additionally includes supporting the first member with a first mount configured to constrain the first member against movement along three mutually-orthogonal directions. The method also includes supporting the second member with a second mount configured to constrain the second member against movement along exactly two of the directions, and supporting the third member with a third mount configured to constrain the third member against movement along exactly one of the directions. | 02-26-2015 |
| 20160033398 | SUBSTRATE TARGET FOR IN-SITU LITHOGRAPHY METROLOGY, METROLOGY METHOD FOR IN-SITU LITHOGRAPHY, AND METHOD OF MANUFACTURING INTEGRATED CIRCUIT DEVICE BY USING IN-SITU METROLOGY - A substrate can include a feature pattern included in an integrated circuit on the substrate and an in-situ metrology pattern spaced apart from the feature pattern on the substrate, the in-situ metrology pattern and the feature pattern both configured to have equal heights relative to a surface of the substrate. | 02-04-2016 |
| 20160084758 | METROLOGY IMAGING TARGETS HAVING REFLECTION-SYMMETRIC PAIRS OF REFLECTION-ASYMMETRIC STRUCTURES - Metrology targets, design files, and design and production methods thereof are provided. Metrology targets comprising at least one reflection-symmetric pair of reflection-asymmetric structures are disclosed. The structures may or may not be periodic, may comprise a plurality of unevenly-spaced target elements, which may or may not be segmented. The asymmetry may be with respect to target element segmentation or structural dimensions. Also, target design files and metrology measurements of the various metrology targets are disclosed. | 03-24-2016 |
| 20160178351 | POLARIZATION MEASUREMENTS OF METROLOGY TARGETS AND CORRESPONDING TARGET DESIGNS | 06-23-2016 |
| 20160183805 | CALIBRATOR AND CALIBRATION APPARATUS - A calibrator calibrates optical characteristics of an optical measurement apparatus in water by inserting a measurement probe connected to the optical measurement apparatus into the calibrator. The optical measurement apparatus is configured to perform optical measurement on body tissue. The calibrator includes: an accommodation portion that has an opening at one end thereof and accommodates the water, a distal end of the measurement probe being configured to be inserted into the accommodation portion; and a removing unit that is arranged in the water and is configured to remove a substance adhered to the distal end of the measurement probe inserted into the accommodation portion. | 06-30-2016 |
| 356243200 | For fluid suspended particles | 4 |
| 20090059218 | STABLE TURBIDITY CALIBRATION STANDARDS - The present invention relates to a turbidity calibration standard comprising: a number of from 1 to 5 sequentially-interfaced layers, wherein each layer independently comprises a light-permeable polymer or light-permeable interpolymer; a measured light transmission modulating amount of at least one light transmission modulator, which is distributed in any one or more of the layers; and a light-permeable container, which contains the layers and the at least one light transmission modulator. Also, the invention relates to methods of making and using the standard, and kits comprising the standard. | 03-05-2009 |
| 20110235030 | METHOD AND DEVICE FOR FLOW CYTOMETRY WITHOUT SHEATH FLUID - A method and a device employing the method of flow cytometry, preferably applicable but not limited to the counting and differentiation of leukocytes. It relates more particularly to the field of simplified haematology instruments with moderate operating costs. The method is characterized in that a technique of impedance measurement is used for identifying the particles whose trajectory did not pass through a predetermined optical measurement zone in order to process them selectively, thus avoiding the use of sheath fluids for guiding the particles towards the measurement zone. | 09-29-2011 |
| 20130242296 | METHOD AND SYSTEM FOR CALIBRATING A FLOW CYTOMETER - A method and system for calibrating a flow cytometer to a refractive index X, the method comprising: analysing a first mixture of particles in the cytometer and recording the results produced, wherein the first mixture comprises particles having refractive index X, wherein the particles of refractive index X have a plurality of different sizes; analysing a second mixture of particles in the cytometer and recording the results produced, wherein the second mixture comprises particles having refractive index Y, wherein refractive index Y does not equal refractive index X, and wherein the particles of refractive index Y have a plurality of different sizes, wherein there is at least a partial overlap between the particle sizes in the first and second mixtures, and wherein the size of at least one particle of the second mixture is known; and using the results produced by the first and second mixture to calibrate the cytometer to refractive index X. | 09-19-2013 |
| 20150124248 | Suspended Solids Test Device and Method - A Total Suspended Solids (TSS) Device which includes a plurality of calibrated sample containers in a case, such that each calibrated sample container contains a calibrated sample, wherein each calibrated sample is a sample with a known suspended solids concentration prepared from a site sample, such that said TSS device is configured to allow a discharge sample in a discharge sample container to be visually compared to each of the calibrated samples in the calibrated sample containers in said case, where the discharge sample is a sample of a liquid discharge from a site. | 05-07-2015 |
| 356243400 | Surface standard | 16 |
| 20090033927 | Method for producing colors - The invention relates to a method ( | 02-05-2009 |
| 20090190125 | Device and Method for Spectrometric System - The invention relates to a device for use in analysing the performance of a spectrometric system of the type which comprises a spectrometer to which a probe for propagating electromagnetic radiation is connected. The device comprises a holder for holding both a reflectance standard and the probe so that the tip of the probe is fixated at a predetermined position relative to the reflectance standard and so that at least part of the electromagnetic radiation emitted from the probe is diffusely reflected from the reflectance standard back to the probe. The invention also relates to a method, a kit and an assembly. | 07-30-2009 |
| 20090201495 | Calibration Method For Edge Inspection Apparatus - A calibration method for an edge inspection apparatus having: a light emitting portion which irradiates light onto an edge of a substrate being inspected; and a detection portion which detects optical characteristics of the light reflected by the edge to detect the defect occurring in the edge based on the optical characteristics, wherein the calibration method including: a pseudo-defect formation step of forming a plurality of pseudo-defects on an edge of a substrate for calibration along a circumferential direction thereof, in which at least one of a position in the thickness direction of the substrate, the shape and the size is set so as to be different between the pseudo-defects; a detection step of irradiating the inspection light onto the respective pseudo-defects, and detecting the optical characteristics of the reflection light by the detection portion; and an adjustment step of calibrating the edge inspection apparatus based on the optical characteristics. | 08-13-2009 |
| 20110102784 | METHOD OF AND APPARATUS FOR OBTAINING HIGH DYNAMIC RANGE SPECTRALLY, SPATIALLY AND ANGULARLY RESOLVED RADIATION DATA - A method of obtaining high dynamic range, spectrally, spatially and angularly resolved radiance of a sample surface of a sample, such as a paper sheet, accomplished by an electromagnetic irradiator irradiating electromagnetic radiation of controlled spectral distribution onto a sample surface of a sample and, using an electromagnetic sensitive sensor to register the reflected spectral distribution. The spectral distribution of the intensity of the electromagnetic field is modeled to have been reflected by a plurality of spatially well defined part-surfaces of the sample surface of the sample. The electromagnetic sensitive sensor being well-defined in terms of the functional dependency between input radiation and output signal and the registering exposure time-period being selected individually for each individual sensor element, such as to compile an information volume that represents the registered high dynamic range spectrally resolved electromagnetic radiance as a function of the position of the part-surfaces within the sample surface of the sample and of the respective angle enforced on the sample while measuring. | 05-05-2011 |
| 20110235031 | SUBSTRATE FOR SURFACE ENHANCED RAMAN SCATTERING STUDIES - The invention relates to a substrate for surface enhanced Raman scattering studies comprising a semiconductor surface with whiskers, coated with metal selected from the group consisting of silver, gold, platinum, copper and/or alloys thereof, where the semiconductor mentioned is a gallium-containing nitride and essentially each whisker contains a linear defect inside. | 09-29-2011 |
| 20130003053 | DETERMINATION OF ABSOLUTE DIMENSIONS OF PARTICLES USED AS CALIBRATION STANDARDS FOR OPTICAL MEASUREMENT SYSTEM - The present invention includes providing a plurality of standard particles; providing a substantially crystalline material having one or more characteristic spatial parameters, disposing the plurality of standard particles proximate to a portion of the substantially crystalline material, acquiring imagery data of the plurality of standard particles and the portion of the substantially crystalline material, establishing a spatial relationship between the plurality of standard particles and the portion of the substantially crystalline material utilizing the acquired imagery data, and determining one or more spatial parameters of the plurality of standard particles utilizing the one or more characteristic spatial parameters of the substantially crystalline material and the established spatial relationship between the plurality of standard particles and the portion of the substantially crystalline material. | 01-03-2013 |
| 20130314700 | SURFACE-DEFECT INSPECTION DEVICE - A data processing and controlling portion calculates the amounts of coordinate deviations between artificial defects on a standard sample and detected defects, checks the sensitivity (instrumental sensitivity (luminance, brightness, or the like)), and proceeds to execution of hardware corrections. If the coordinate deviation is less than a certain value, software corrections are carried out. In the case of the software corrections, coordinate corrections are made for the whole standard sample. The amounts of coordinate deviations are computed and checked. If the amounts of coordinate deviations are outside a tolerance, coordinate corrections are made for each region obtained by dividing the standard sample. | 11-28-2013 |
| 20150055130 | Multilayered Tissue Phantoms, Fabrication Methods, and Use - A method for producing a multilayer tissue phantom involves successively forming at least two layers, each layer formed by depositing a viscous flowable material over a supporting element or over a previously formed layer of the phantom supported by the supporting element, selectively redistributing the material while material is solidifying to control a thickness distribution of the layer, and allowing the material to solidify sufficiently to apply a next layer. The supporting element supports the material in 2 or 3 directions and effectively molds a lumen of the tissue. The neighbouring layers are of different composition and of chosen thickness to provide desired optical properties and mechanical properties of the phantom. The phantom may have selected attenuation and backscattering properties to mimic tissues for optical coherence tomography imaging. | 02-26-2015 |
| 20160033399 | OPTICAL METROLOGY WITH PURGED REFERENCE CHIP - An integrated metrology module includes a chuck for holding a sample and positioning the sample with respect to an optical metrology device, a reference chip for the optical metrology device, the reference chip being movable to various positions with respect to the optical metrology device, and a reference chip purge device provides a flow of purge gas or air over the reference chip while the reference chip is in the various positions. The reference chip purge device may be static or movable with the reference chip. | 02-04-2016 |
| 356243500 | Color | 2 |
| 20080304059 | High-Sensitivity Method For Detecting Differences Between the Physically Measurable Properties of a Sample and a Reference - A method for detecting differences between physically measurable properties of a sample and a reference sample. A two-dimensional reference field is generated and first and second two-dimensional patterns are produced respectively from the reference sample and the sample. A correction is made to sample response functions to eliminate time-dependent and location-dependent fluctuations of the detector. | 12-11-2008 |
| 20090190126 | COLOR SENSOR PERFORMANCE - The present disclosure includes a number of method, medium, and apparatus claims utilized for color sensor performance. One method includes determining performance of a color sensor, which can be performed by measuring a color parameter intensity and reflectance spectral power distribution of a particular type of print medium with a color sensing utility of a print apparatus. The method also can include detecting a magnitude of a difference between the measured color parameter intensity and reflectance spectral power distribution of the particular type of print medium and a predetermined intensity and reflectance spectral power distribution of the color parameter of the particular type of print medium, where the predetermined intensity and reflectance spectral power distribution is stored in memory. | 07-30-2009 |
| 356243800 | Light intensity | 5 |
| 20090051910 | Calibration reference light source and calibration system using the same - In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost. | 02-26-2009 |
| 20110116086 | METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS - Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems. | 05-19-2011 |
| 20110116087 | METHOD AND SYSTEM FOR STANDARDIZING MICROSCOPE INSTRUMENTS - Methods and apparatus for standardizing quantitative measurements from a microscope system. The process includes a calibration procedure whereby an image of a calibration slide is obtained through the optics of the microscope system. The calibration slide produces a standard response, which can be used to determine a machine intrinsic factor for the particular system. The machine intrinsic factor can be stored for later reference. In use, images are acquired of a target sample and of the excitation light source. The excitation light source sample is obtained using a calibration instrument configured to sample intensity. The calibration instrument has an associated correction factor to compensate its performance to a universally standardized calibration instrument. The machine intrinsic factor, sampled intensity, and calibration instrument correction factor are usable to compensate a quantitative measurement of the target sample in order to normalize the results for comparison with other microscope systems. | 05-19-2011 |
| 20120013900 | CALIBRATION OF A SPATIAL LIGHT MODULATOR - A method for calibrating a spatial light modulator comprising an array of channels includes selecting a plurality of channel sets; operating each of the channel sets to provide corresponding output radiation; providing a detector for measuring the output radiation; determining a plurality of intensity values, each representing an intensity of the output radiation provided by a different one of the channel sets; providing a correction factor for each of the channels sets, wherein each correction factor remains constant during a subsequent recalibration of the spatial light modulator; modifying each determined intensity value in accordance with a corresponding one of the correction factors; determining a difference between one of the modified intensity values and a target intensity value; and reducing the determined difference by adjusting a control level of at least one channel in the channel set corresponding to the one of the modified intensity values. | 01-19-2012 |
| 20120013901 | CALIBRATION OF A SPATIAL LIGHT MODULATOR - A method for calibrating a spatial light modulator comprising an array of channels includes selecting a plurality of channel sets; operating each of the channel sets to provide corresponding output radiation; providing a detector for measuring the output radiation; determining a plurality of intensity values, each representing an intensity of the output radiation provided by a different one of the channel sets; providing a correction factor for each of the channels sets, wherein each correction factor remains constant during a subsequent recalibration of the spatial light modulator; modifying each determined intensity value in accordance with a corresponding one of the correction factors; determining a difference between one of the modified intensity values and a target intensity value; and reducing the determined difference by adjusting a control level of at least one channel in the channel set corresponding to the one of the modified intensity values. | 01-19-2012 |
