| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 356446000 | With diffusion | 86 |
| 20080246971 | Methods For Using Light Reflection Patterns To Determine Diving Angle Of Grain - Methods are provided for using light reflection patterns to determine various properties of fibrous materials, such as wood. More specifically, the present invention relates to methods for determining a dive angle for grain. Further, the present invention relates to methods for using information in T2 plots, combined with knowledge of the microstructure of a wood sample surface, to find pith location and/or ring curvature. | 10-09-2008 |
| 20080259343 | Angularly resolved scatterometer and inspection method - In an angularly resolved scatterometer, an aperture plate including at least one obscuration extending into the image of the pupil plane is provided. Defocus values of a target pattern are determined from the radial distance between the innermost point of the images of the obscurations and the nominal center if the pupil image. Defocus errors are compensated for by capturing a plurality of normalization images using a reference plate at a plurality of different defocus positions and subtracting a suitable normalization from the measurement spectrum of a target pattern | 10-23-2008 |
| 20080304069 | SYSTEMS AND METHODS FOR INSPECTING A SPECIMEN WITH LIGHT AT VARYING POWER LEVELS - Systems and methods for inspecting a specimen with light at varying power levels are provided. One system configured to inspect a specimen includes a light source configured to generate light. The system also includes a power attenuator subsystem configured to alter a power level of the light directed to the specimen during inspection between at least two power levels including a full power level and a minimum power level equal to or greater than about 10% of the full power level. In addition, the system includes a detection subsystem configured to generate output responsive to the light scattered from the specimen. The output can be used to detect defects on the specimen. | 12-11-2008 |
| 20080304070 | Bi-Directional Reflectance Distribution Measuring Instrument - The invention concerns a bidirectional reflectance distribution meter having a light source which illuminates a sample using pre-determinable elevation and a light receiver, which can be moved relative to the light source in order to receive light from the sample. To this end, it has been designed that the light receiver comprises several receiver elements to collect simultaneously a broad elevation angle range, and that at least one of the light receiver element and the light source is movable around an axis that extends generally vertical to the sample. | 12-11-2008 |
| 20080316494 | CONTROLLING A DYNAMIC SIGNAL RANGE IN AN OPTICAL TIME DOMAIN REFLECTOMETRY - A technique includes providing an optical source signal to an optical fiber to produce a backscatter signal. A receiver is provided to detect the backscatter signal. During an acquisition period in which the backscatter signal is present, a sensitivity of the receiver is varied with respect to time to regulate an input signal range of an amplifier of the receiver. | 12-25-2008 |
| 20090021743 | Coaxial Diffuse Reflectance Read Head - Improved performance in reflectance photometry is obtained by employing an optical fiber to direct collimated light to a test area and to return both diffuse and specular light from the test area. Specular light is prevented from reaching a light detector by a spatial filter, while diffuse light is collected and measured. | 01-22-2009 |
| 20090033941 | METHODS AND APPARATUS FOR IDENTIFYING THIN FILMS ON A SUBSTRATE - The present invention provides systems, apparatus and methods for detecting a film in an electronic device disposed in an electronic device processing tool. The invention includes a mounting member adapted to couple the apparatus to a view port of the electronic device processing tool, an optical energy source disposed within the mounting member and adapted to illuminate the electronic device within the electronic device processing tool, an optical system adapted to pass wavelengths indicative of a presence of the film, and an optical detector positioned to receive optical energy reflected from the substrate and passing through the optical system adapted to detect a presence or absence of the film. Numerous other features are disclosed. | 02-05-2009 |
| 20090040525 | SYSTEMS CONFIGURED TO INSPECT A WAFER - Systems configured to inspect a wafer are provided. One system includes an illumination subsystem configured to illuminate an area on the wafer by directing light to the wafer at an oblique angle of incidence. The system also includes a collection subsystem configured to simultaneously collect light scattered from different spots within the illuminated area and to focus the light collected from the different spots to corresponding positions in an image plane. In addition, the system includes a detection subsystem configured to separately detect the light focused to the corresponding positions in the image plane and to separately generate output responsive to the light focused to the corresponding positions in the image plane. The output can be used to detect defects on the wafer. | 02-12-2009 |
| 20090073448 | Method of measuring the overlay error, an inspection apparatus and a lithographic apparatus - The reflected radiation from a target mark including, for example, a plurality of gratings is detected by an array of pixels. The overlay error of the gratings for each pixel is detected, and an array of overlay errors is determined. Rather than simply averaging the overlay error value for all the pixels, filtering is performed. Pixels may be filtered according to the detected value of the overlay error or the detected intensity of the pixel. | 03-19-2009 |
| 20090097033 | Microgloss measurment of paper and board - Microgloss is a novel two-dimensional representation of how light is reflected from a target surface area. Systems and methods for measuring the microgloss can yield data for characterizing the reflective properties of a variety of products for which surface appearance is important. These products include paper, plastics, metals, and ceramics. Microgloss characteristics can be used as parameters for controlling the supercalendering process in papermaking. Microgloss characteristics can be used in conjunction with standard gloss to classify products. | 04-16-2009 |
| 20090116023 | Optical Inspection Of Test Surfaces - In one aspect, the amount of data needed to store image intensity data obtained from a scatterometer ( | 05-07-2009 |
| 20090116024 | METHOD FOR OBTAINING A HIGH RESOLUTION IMAGE - The invention relates to microscopy, in particular to a method for obtaining a high resolution image and can be used for observing biological objects, micro and nano-structures and for the micro-lithography quality inspection. The aim of said invention is to increase the rate of the image producing process, to reduce the cost thereof and to simplify said process. The inventive method for obtaining a high resolution image consists in carrying out the object examination by means of an optical far field microscope and in processing data. Particles are applied to the object under examination and said object is placed in a particle suspension-containing liquid, wherein a particle redistribution along the surface of the object under examination is carried out. The capturing or scattering or luminescent particles are used. The aim is also attained by the use of a light reflected from the object surface or by means of a light passing therethrough. For the particle redistribution, the Brownian motion or liquid directed flows, or magnetic or electric fields are used. | 05-07-2009 |
| 20090128824 | OPTICAL IMAGING SYSTEM WITH EXTENDED DEPTH OF FOCUS - The invention concerns an optical imaging apparatus comprising (o) a light source ( | 05-21-2009 |
| 20090161111 | CALIBRATION METHOD FOR COMPENSATING FOR NON-UNIFORMITY ERRORS IN SENSORS MEASURING SPECULAR REFLECTION - This invention relates to a method for the calibration of linear array photo sensors operating in a specular reflection mode. Errors may be introduced when a highly diffused image is measured by the linear array photosensor that was calibrated in a specular mode. These errors result in artifacts such as streaks in the captured image. The method measures non-uniformity errors using a highly diffuse white reflective surface, and then applies an appropriate scaled pixel-wise correction factor to the image when the sensor is used in the specular mode. | 06-25-2009 |
| 20090279096 | APPARATUS AND METHOD FOR ON-LINE DETECTING WELDING PART OF STRIP - There is provided an on-line detection system and method for a weld of a steel strip, which can emit a laser beam onto the surface of a steel strip moving at a high speed and measure the reflectivity of the laser beam reflecting from the same, thereby detecting the weld of the steel strip easily on-line. In the on-line detection system, reflectivity measuring means emits a laser beam onto a moving steel strip and continuously measuring the reflectivity of the laser beam returning from the surface of the steel strip, and signal processing means detects a weld of the steel strip based on change in the reflectivity measured on the weld. | 11-12-2009 |
| 20090279097 | OPTICAL MEASUREMENT DEVICE - An optical measurement device for measuring the optical appearance of a surface ( | 11-12-2009 |
| 20100027018 | DEVICE AND METHOD FOR ACQUIRING IMAGE DATA FROM A TURBID MEDIUM - The invention relates to a method of acquiring image data from a turbid medium ( | 02-04-2010 |
| 20100053627 | REFLECTIVE SCATTEROMETER - A reflective scatterometer capable of measuring a sample is provided. The reflective scatterometer includes a paraboloid mirror, a light source, a first reflector, a second reflector and a detector. The paraboloid mirror has an optical axis and a parabolic surface, wherein the sample is disposed on the focal point of the parabolic surface and the normal direction of the sample is parallel with the optical axis. A collimated beam generated from the light source is reflected by the first reflector to the parabolic surface and then is reflected by the parabolic surface to the sample to form a first diffracted beam. The first diffracted beam is reflected by the parabolic surface to the second reflector and is then reflected by the second reflector to the detector. | 03-04-2010 |
| 20100091291 | APPARATUS AND A METHOD FOR OBSERVING THE SURFACE OF A SAMPLE - An apparatus for observing the appearance of the surface ( | 04-15-2010 |
| 20100103426 | OPTICAL SENSOR INTERROGATION SYSTEM BASED ON FDML WAVELENGTH SWEPT LASER - Provided is an optical sensor interrogation system. The optical sensor interrogation system includes: a light source unit which matches round-trip time of light and wavelength tunable cycle time of light in a resonator and emits light; a sensing unit which receives an optical signal in which a center wavelength periodically tunes, from the light source unit and tunes the center wavelength of the optical signal according to physical changes applied from the outside; and a signal processing unit which receives the optical signal reflected from the sensing unit, detects data, and images the data. In particular, the light source unit includes a delaying unit which delays the round-trip time of light and a tunable filter which tunes the wavelength of light so as to match the round-trip time of light with the wavelength tunable cycle time of light. Accordingly, a Fourier domain mode locking (FDML) wavelength swept laser, which operates at speed of several tens kHz or above, is used as a light source so that strain of a fluid, which changes in a short time interval of 0.1 msec or below, is precisely measured and thus a real-time analysis may be performed at high speed. | 04-29-2010 |
| 20100118309 | Evaluation Method of Fouling, Fouling Evaluation Apparatus, Production Method of Optical Member, Optical Layered Body, and Display Product - The present invention provides a quantitative evaluation method of fouling of antifouling properties, a fouling evaluation apparatus, and a production method of optical members, which can be applied to various members, and haves high reproducibility and enable to detect a subtle difference between fouling, and an optical layered body having a property of preventing fingerprints from adhering, an anti-contamination property and a degree of recovery from fouling, and a display product including the optical layered body. | 05-13-2010 |
| 20100118310 | SURFACE INSPECTION METHOD AND SURFACE INSPECTION APPARATUS - A surface inspection apparatus capable of acquiring scattered light intensity distribution information for each scattering azimuth angle, and detecting foreign matters and defects with high sensitivity. A concave mirror for condensation and another concave mirror for image formation are used to cope with a broad cubic angle. Since mirrors for condensation and image formation are used, a support for clamping the periphery of a lens is unnecessary, and an effective aperture area does not decrease. A plurality of azimuth-wise detection optical systems is disposed and reflected light at all azimuths can be detected by burying the entire periphery without calling for specific lens polishing. A light signal unification unit sums digital data from a particular system corresponding to a scattering azimuth designated in advance in the systems for improving an S/N ratio. | 05-13-2010 |
| 20100195108 | MULTIPLE PASS IMAGING SPECTROSCOPY - A method of imaging an optically thin sample is described wherein a collimated beam is directed through the sample and then reflected back through the sample one or more times. The beam is then directed toward a detector which collects and analyzes the spatial and spectral composition of the beam. In some embodiments, the detector is a focal plane array with a large number of detector elements. In other embodiments the relative position of a single detector or a small detector array and the sample is altered and the process is repeated, thereby tracing out a large virtual detector array. In either case, the spectral information received by the detector elements can be related, by methods which are elaborated below, to information about the spatial distribution of absorption in the sample. | 08-05-2010 |
| 20100195109 | COAXIAL DIFFUSE REFLECTANCE READ HEAD - Improved performance in reflectance photometry is obtained by employing an optical fiber to direct collimated light to a test area and to return both diffuse and specular light from the test area. Specular light is prevented from reaching a light detector by a spatial filter, while diffuse light is collected and measured. | 08-05-2010 |
| 20100284014 | DETERMINING BIOLOGICAL TISSUE OPTICAL PROPERTIES VIA INTEGRATING SPHERE SPATIAL MEASUREMENTS - An optical sample is mounted on a spatial-acquisition apparatus that is placed in or on an enclosure. An incident beam is irradiated on a surface of the sample and the specular reflection is allowed to escape from the enclosure through an opening. The spatial-acquisition apparatus is provided with a light-occluding slider that moves in front of the sample to block portions of diffuse scattering from the sample. As the light-occluding slider moves across the front of the sample, diffuse light scattered into the area of the backside of the light-occluding slider is absorbed by back side surface of the light-occluding slider. By measuring a baseline diffuse reflectance without a light-occluding slider and subtracting measured diffuse reflectance with a light-occluding slider therefrom, diffuse reflectance for the area blocked by the light-occluding slider can be calculated. | 11-11-2010 |
| 20100296096 | IMAGING OPTICAL INSPECTION DEVICE WITH A PINHOLE CAMERA - The invention relates to an imaging optical inspection setup for inspecting a sample ( | 11-25-2010 |
| 20100321698 | METHOD AND APPARATUS FOR THE SIMULTANEOUS GENERATION AND DETECTION OF OPTICAL DIFFRACTION INTERFERENCE PATTERN ON A DETECTOR - The present invention provides for a novel method and apparatus for the simultaneous generation and detection of optical diffraction interference pattern on a photo detector. The monitoring method and apparatus disclosed herein comprises of a (any) continuous wave coherent collimated beam of light (or a laser) falling on an (any) optically reflective coating on the surface of the body with inherent vibrations, or with manifest vibrations induced from another source through any medium where the said light is reflected, and then received on the surface of a (any) photo detector in such a way that the received light falls partially on the active sensing area, and partially on the outer perimeter of the active sensing area. | 12-23-2010 |
| 20100328672 | Goniophotometer - A goniophotometer has a main rotating table, a sync-rotating table, a luminaire rotating table and light detecting tubes ( | 12-30-2010 |
| 20110001978 | Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method - A method of determining an overlay error between two successive layers produced by a lithographic process on a substrate, including using the lithographic process to form a calibration structure including a periodic structure of the same pitch on each of the layers, such that an overlaid pair of periodic structures is formed, the structures being parallel, but offset relative to each other by an overlay amount. A spectrum produced by directing a beam of radiation onto the calibration structure is measured and compared with one or more modeled spectra so as to determine values of the grating parameters for the calibration structure from the measured spectrum. The lithographic process is used to form further overlaid periodic structures on the same or one or more subsequent substrates, the determined grating parameter values for the calibration structure being used to determine overlay amounts for the further overlaid periodic structures. | 01-06-2011 |
| 20110007320 | LIGHT TRANSMITTER, LIGHT RECEIVER AND MEASURING DEVICE FOR MEASURING OPTICAL PROPERTIES OF TRANSPARENT SUBSTRATES - A measuring device for measuring optical properties of transparent substrates includes a light transmitter and/or light receiver comprising a hollow cylinder having a highly reflective and diffusely dispersive inner surface. The light transmitter comprises a light source arranged in its interior and a light exit opening at a distance from the light source. The light receiver has a light sensor instead of the light source, at a distance from a light entrance opening. The light source and light sensor are arranged at such a distance from the light exit opening and light entrance opening respectively, given a corresponding direction of propagation of the light, that light emitted by the light source or received by the light sensor and multiply reflected in the hollow cylinder emerges as diffuse light from the light exit opening or is incident on the light sensor. | 01-13-2011 |
| 20110013193 | METHOD FOR ATTENUATED TOTAL REFLECTION FAR ULTRAVIOLET SPECTROSCOPY AND AN APPARATUS FOR MEASURING CONCENTRATIONS THEREWITH - In far ultraviolet spectroscopy using attenuated total reflection, total reflection light is measured by using evanescent waves of total reflection light. The penetration depth thereof is equal to or larger than 150 nm in a wavelength range in the far ultraviolet range wherein the penetration depth depends on a wavelength of the far ultraviolet light, refractive index of an object to be measured, refractive index of optical material of the probe and incident angle of the far ultraviolet light at an interface between the probe and the object. The attenuated total reflection probe is made of an optical material selected so as to have the penetration depth equal to or higher than 150 nm in far ultraviolet wavelength range, and the probe makes contact with the object to be measured at the interface, and the far ultraviolet light is incident on the interface at incident angle larger than critical angle in the wavelength range so as to have the penetration depth equal to or higher than 150 nm. The total reflection light from the interface is measured, and absorbance of the object to be measured is determined. | 01-20-2011 |
| 20110019197 | Scattered Light Separation - An apparatus for detecting top scattered light from a substrate. A source directs a light onto a position on the substrate. The light thereby reflects off in a specular beam, scatters off the top surface, and scatters off a bottom surface of the substrate. An objective receives the top and bottom scattered light. The objective has a first focal point focused on the position on the top surface of the substrate, and a second focal point focused on a pinhole field stop. The pinhole field stop passes the top scattered light that is focused on the pinhole field stop, and blocks the bottom scattered light. A sensor receives and quantifies the top scattered light. | 01-27-2011 |
| 20110026032 | Method of Assessing a Model of a Substrate, an Inspection Apparatus and a Lithographic Apparatus - A method of assessing a model of a substrate is presented. A scatterometry measurement is taken using radiation at a first wavelength. The wavelength of the radiation is then changed and a further scatterometry measurement taken. If the scatterometry measurements are consistent across a range of wavelengths then the model is sufficiently accurate. However, if the scatterometry measurements change as the wavelength changes then the model of the substrate is not sufficiently accurate. | 02-03-2011 |
| 20110043811 | MASK DEFECT MEASUREMENT METHOD, MASK QUALITY DETERMINATION METHOD, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE - A method for measuring a shape of a phase defect existing on an exposure mask includes making inspection light incident on the mask, measuring the intensity of light scattered in an angular range in which the width of an scattering area on the phase defect can be predicted, calculating a radius of the phase defect based on the measured scattered light intensity, changing the angular range of scattered light to be measured, remeasuring scattered light intensity in the thus changed angular range, and calculating a scattering cross-sectional area based on the scattered light intensity obtained by remeasurement. A process of remeasuring the scattered light intensity and calculating the scattering cross-sectional area is repeatedly performed until the remeasured scattered light intensity is saturated and the shape of the phase defect is determined by using the calculated radius of the phase defect and each of the calculated scattering cross-sectional areas. | 02-24-2011 |
| 20110043812 | Method and apparatus for determining reflectance data of a subject - An apparatus for obtaining reflectance data of an object includes a diffuser having a surface. The apparatus includes a mapping portion that affects a mapping between a light field at the object's surface and a light field at the diffuser surface for BRDF capture of the object. A method for obtaining reflectance data usable to determine a plurality of values of the BRDF of an object. The method includes the steps of illuminating the object. There is the step of affecting a mapping between a light field at the object's surface and a light field at a diffuser surface for BRDF capture of the object with a mapping portion. An apparatus and a method for measuring an 8D reflectance field of an object or a 3D object. | 02-24-2011 |
| 20110109910 | NON-INVASIVE OPTICAL CHARACTERIZATION OF BIOMATERIAL MINERALIZATION - In one aspect, the present invention generally provides methods for characterizing mineralization of a material, e.g., a biomaterial, by illuminating the material with radiation and analyzing radiation scattered from the material in response to the illumination. For example, in some embodiments, a material can be illuminated with polarized radiation at a plurality of wavelengths and the elastically scattered radiation corresponding to two or more of those wavelengths can be collected at two polarizations: one parallel and the other perpendicular to the illumination polarization. A differential intensity of the scattered radiation at the two polarizations can be analyzed as a function of wavelength to obtain information regarding the morphology of mineral deposits in the sample. Further, the total scattered radiation can be analyzed to derive information regarding the level of mineralization. | 05-12-2011 |
| 20110176137 | Optical Sensor - The invention relates to an optical sensor for detecting characteristic reflection patterns caused by randomly distributed and/or oriented microreflectors. The invention furthermore relates to the method od using a sensor according to the invention for identifying and/or authenticating objects. | 07-21-2011 |
| 20110267623 | Multi-Wavelength Reference Microplate For Label-Independent Optical Reader - A multi-wavelength reference microplate for a label-independent optical reader is disclosed. The microplate includes a support plate that supports a plurality of reference wells. At least one of the reference wells is configured as a multi-wavelength reference well having disposed therein two or more resonant waveguide grating sections that respectively reflect two or more different reference resonant wavelengths within the light source wavelength band. Methods for making and using the microplates are also disclosed. | 11-03-2011 |
| 20110267624 | SENSOR SYSTEM IN A MOTOR VEHICLE - A sensor system is described for detecting wetting of a window includes a photodetector having multiple light-sensitive elements and a light source for emitting light to a detection region of the window in such a way that a portion of the light is reflected at the window, and another portion of the light passes through the window. The light source and the light-sensitive element are situated in such a way that a portion of the light from the light source which passes through the window is reflected at the wetting and strikes a portion of the light-sensitive elements. The light source includes a lighting element which is set up to irradiate into a transparent body. The transparent body has a surface which has defined unevennesses for the diffuse radiation of the irradiated light. | 11-03-2011 |
| 20110273718 | IMAGING SYSTEM AND RELATED TECHNIQUES - A method and apparatus for imaging using a double-clad fiber is described. | 11-10-2011 |
| 20110273719 | OPTICAL IMAGING FOR OPTICAL DEVICE INSPECTION - An optical imaging apparatus based on optical frequency domain measurement (OFDM) collects scatter data at multiple locations within or on the DUT as a function of time. A light source launches light into a device under test (DUT) which scatters light at one or more locations along the DUT. A light detector detects a portion of light scattered at each of multiple locations along the DUT. Data is determined using OFDM data processing that corresponds to an amount of light collected at each of the multiple locations along the DUT as a function of time. The data is stored for each of the multiple locations along the DUT. User information is provided that indicates an amount of light scattered at each of the multiple locations along the DUT based on the stored time domain data. The OFDM processing permits fine time resolution (e.g., 0.1 picoseconds) that allows small optical delay distances (e.g., 30 microns) to be resolved and allows for accurate detection of small amounts of scatter (e.g., one trillionth) to be detected simultaneously with the fine time resolution. | 11-10-2011 |
| 20110279820 | DUV-UV BAND SPECTROSCOPIC OPTICAL SYSTEM AND SPECTROMETER USING SAME - Disclosed are a spectroscopic optical system and a spectrometer both enabling vertical illumination by means of an optical system using only refractive lenses and enabling wide-band color correction in the DUV-UV (190 to 400 nm) range. The spectroscopic optical system and spectrometer each comprise a light source ( | 11-17-2011 |
| 20110310393 | CATADIOPTRIC ILLUMINATION SYSTEM FOR METROLOGY - A catadioptric optical system operates in a wide spectral range. In an embodiment, the catadioptric optical system includes a first reflective surface positioned and configured to reflect radiation; a second reflective surface positioned and configured to reflect radiation reflected from the first reflective surface as a collimated beam, the second reflective surface having an aperture to allow transmission of radiation through the second reflective surface; and a channel structure extending from the aperture toward the first reflective surface and having an outlet, between the first reflective surface and the second reflective surface, to supply radiation to the first reflective surface. | 12-22-2011 |
| 20120019832 | OPTICAL NAVIGATION WITH SPECULAR REFLECTION BLOCKING - A system for optical navigation includes a light source and an imaging system. The light source illuminates a navigation surface. The navigation surface reflects light from the light source. The imaging system is located approximately within a path of the reflected light. The imaging system includes a lens, a mask, and an image sensor. The lens receives reflected light from the navigation surface. The lens focuses a specular portion of the reflected light to a focus region. The mask is located at approximately the focus region. The mask filters out substantially all of the specular portion of the reflected light and passes at least some of a scatter portion of the reflected light outside of the focus region. The image sensor generates a navigation signal based on the scattered portion of the light that passes outside the focus region and is incident on the image sensor. | 01-26-2012 |
| 20120033223 | Inspection Method and Apparatus, Lithographic Apparatus, Lithographic Processing Cell and Device Manufacturing Method for Determining a Property of a Substrate - In a method for determining one or more properties of a substrate, scatterometry spectra can be measured from one or more targets on the substrate. Reconstructions of each of said spectra can be performed to derive one or more values for the property of the substrate, by comparing representations of each of the measured spectra with one or more modeled representations of spectra calculated using variable parameter values. At least one parameter in the reconstruction for each spectrum can be linked to the value of the parameter used in the reconstruction for a different spectrum. | 02-09-2012 |
| 20120069343 | MEASUREMENT DEVICE AND MEASUREMENT METHOD - A measurement device includes a light sensing element on which light from a measurement target region placing a measurement target thereon forms an image, and a plurality of light emitting elements that are disposed around the light sensing element and radiate light to the measurement target region, wherein the plurality of light emitting elements are disposed to be tilted with respect to the normal line of the measurement target region such that the central line of radiated emission from each of the light emitting elements passes through a substantial center of the measurement target region. | 03-22-2012 |
| 20120081710 | METHOD TO DETERMINE THE SATIN-EFFECT ON METAL PLATED SUBSTRATES - Subject of the present application is a method to determine the satin-effect on metal plated substrates comprising the following steps: i) irradiate the sample with light, ii) detect the intensity distribution of the scattered light, iii) determine at least one of the following parameters:—the Aq value of the intensity distribution, wherein the Aq value represents the variance of the backscattered light angle (φ | 04-05-2012 |
| 20120147378 | EVALUATION METHOD OF FOULING, FOULING EVALUATION APPARATUS, PRODUCTION METHOD OF OPTICAL MEMBER, OPTICAL LAYERED BODY, AND DISPLAY PRODUCT - The present invention provides a quantitative evaluation method of fouling of antifouling properties, a fouling evaluation apparatus, and a production method of optical members, which can be applied to various members, and haves high reproducibility and enable to detect a subtle difference between fouling, and an optical layered body having a property of preventing fingerprints from adhering, an anti-contamination property and a degree of recovery from fouling, and a display product including the optical layered body. | 06-14-2012 |
| 20120194820 | GONIOPHOTOMETR FOR MEASURING 3D LIGHT INTENSITY DISTRIBUTION OF LIGHT SOURCE - A goniophotometer includes an arc reflector; a holder for positioning a light source at the center of the arc reflector; a stationary detector substantially disposed at the center of the arc reflector and aimed at an arc reflective surface of the reflector; a driving device for rotating the holder with respect to the reflector and the detector about an axis of the light source; and a computing unit configured to convert a detection result of the detector into a measurement value. | 08-02-2012 |
| 20120287437 | ATTRACTION STATE INSPECTION DEVICE, SURFACE MOUNTING APPARATUS, AND PART TEST DEVICE - An attraction state inspection device includes a diffusion member that is disposed inside a nozzle group in which a plurality of nozzles that attract parts are disposed, and transmits incident light while diffusing the light, an image pickup is disposed on a side of the nozzle group apart from the diffusion member in a first direction, picks up an image of a part attracted by one nozzle positioned in the first direction with respect to the diffusion member, from among the plurality of nozzles, against a background of the diffusion member, and obtains an image of the part, an irradiation unit that is disposed opposite the image pickup unit with the diffusion member interposed therebetween, and radiates light toward the nozzle group, and an inspection unit that inspects an attraction state of the part on the basis of the image of the picked up part. | 11-15-2012 |
| 20120300212 | ARRANGEMENT FOR DETECTING MARKS ON REFLECTIVE MATERIAL FOR REGULATING REGISTRATION ON PRINTING MACHINES - An arrangement for detecting marks on reflective material for regulating registration on printing machines includes a camera, a reflector plate with an opening, a light protection element and an illuminating element. The camera is arranged behind the opening of the reflector plate to record an image of the registration marks through the opening. The reflector plate can be flat or curved inwards like a parabola, and has a light protection element on the edges thereof. The flat reflector plate must be at least big enough that the plate edges reflected on the web material lie outside the mark regions to be recorded. The illuminating element is arranged inside the light protection element, and the surface of the reflector plate and the surface of the light protecting element are a white diffusely reflecting colour, on the sides facing the reflective web material. | 11-29-2012 |
| 20120314219 | DEVICE FOR REFERENCED MEASUREMENTS OF REFLECTED LIGHT AND A METHOD FOR CALIBRATING SUCH A DEVICE - A device for referenced measurement of reflected light and a method for calibrating such a device are disclosed. | 12-13-2012 |
| 20130141730 | Illumination Source for use in Inspection Methods and/or Lithography; Inspection and Lithographic Apparatus and Inspection Method - An illumination system for a lithographic or inspection apparatus. A plurality of optical waveguides transmit radiation from the illumination source to an output. A switching system enables selective control of one or more subsets of the optical waveguides. An inspection method uses an illumination system and inspection and lithographic apparatuses comprise an illumination system. In one example, the optical waveguides and switching system are replaced by a plurality of parallel optical bandpass filter elements. The optical bandpass filter elements each only transmit a predetermined wavelength or a band of wavelengths of radiation. At least two of the parallel optical bandpass filter elements each being operable to transmit a different wavelength or band of wavelengths. | 06-06-2013 |
| 20130148127 | Fiber Optic Measurement of Parameters for Downhole Pump Diffuser Section - A system for monitoring operating parameters for the pump section of an electrical submersible pump. The system includes an optic fiber associated with the pump section of an electrical submersible pump and having a sensor to detect at least one operating parameter within the pump section. The system also includes a signal analyzer operably associated with the optic fiber to receive an optical signal representative of the detected operating parameter. | 06-13-2013 |
| 20130188191 | Optical Analysis System For Dynamic, Real-Time Detection And Measurement - A system and a method for real-time processing and monitoring, the system including a light source to provide an illumination light and a calibration light are provided. The system includes an optical element to separate the illumination light and the calibration light; an optical element to direct the illumination light to a sample; an optical element to direct the calibration light to a first detector and a second detector; an optical element to collect light backscattered from the sample; an optical element to separate light backscattered from the sample into a first scattered light portion and a second scattered light portion; an optical element to direct the first scattered light portion through at least one multivariate optical element to the first detector; and an optical element to direct the second scattered light portion to the second detector. | 07-25-2013 |
| 20130215427 | IMAGING SYSTEM USING AND RELATED TECHNIQUES - A method and apparatus for imaging using a double-clad fiber is described. | 08-22-2013 |
| 20130222806 | APPARATUS AND METHOD FOR INSPECTING MATTER - The present invention relates to an apparatus ( | 08-29-2013 |
| 20130229661 | Metrology Systems and Methods - Various metrology systems and methods are provided. One metrology system includes a light source configured to produce a diffraction-limited light beam, an apodizer configured to shape the light beam in the entrance pupil of illumination optics, and optical elements configured to direct the diffraction-limited light beam from the apodizer to an illumination spot on a grating target on a wafer and to collect scattered light from the grating target. The metrology system further includes a field stop and a detector configured to detect the scattered light that passes through the field stop. In addition, the metrology system includes a computer system configured to determine a characteristic of the grating target using output of the detector. | 09-05-2013 |
| 20130271769 | Distributed Optical Fibre Sensor - There is disclosed a distributed optical fibre sensor arranged to deliver probe light pulses of different wavelengths into corresponding different sensing optical fibres, and to determine one or more parameters as functions of position along each of the sensing fibres from detected backscattered light of each corresponding wavelength. In another arrangement, the different wavelengths are directed in different corresponding directions around a loop of sensing optical fibre. | 10-17-2013 |
| 20130293897 | SYSTEM AND APPARATUS FOR MEASUREMENT OF LIGHT SCATTERING FROM A SAMPLE - An apparatus and method for providing a solution that enables technicians or other technical professionals to obtain accurate gloss, haze and DOI values for a reflecting sample due to the surface conditions of the sample. The apparatus and method allow for the generation of a data model of the surface of a sample using a sensor array designed to detect the divergence of a collimated beam of light reflected off the surface of the sample. The same principle enables technical professionals to obtain accurate haze and clarity values for a transparent or translucent sample that is trans-illuminated by light. | 11-07-2013 |
| 20140002825 | OPTICAL CHARACTERISTIC MEASURING APPARATUS | 01-02-2014 |
| 20140036271 | PROBE APPARATUS FOR MEASURING DEPTH-LIMITED PROPERTIES WITH LOW-COHERENCE ENHANCED BACKSCATTERING - Low-coherence enhanced backscattering (LEBS) spectroscopy is an angular resolved backscattering technique that is sensitive to sub-diffusion light transport length scales in which infoniiation about the scattering phase function is preserved. Lens-based and lens-free fiber optic LEBS probes are described that are capable of measuring optical properties of a target tissue through depth-limited measurements of backscattering angles within the enhanced backscattered cone. | 02-06-2014 |
| 20140043615 | SYSTEM, APPARATUS AND METHOD FOR EMITTANCE CONTROL AND SUPPRESSING STRAY LIGHT - A system, apparatus and method employing carbon nanotubes on substrates such as silicon, titanium, copper, stainless steel and other substrates, where the carbon nanotubes are blacker than existing paints and coatings, thereby providing an exponential increase in stray light suppression depending on the number of bounces of such treated surfaces. Additionally, the present invention is directed to techniques to better absorb and radiate unwanted energies. Further, the alternate substrates offer strength of material for numerous components and in numerous physical applications. The present invention is also directed to techniques for improving the adhesion of the nanotubes to the alternate substrate materials and also extending the wavelength of operation from the near ultraviolet to the far infrared portion of the spectrum (0.2 microns to 120 microns wavelength). | 02-13-2014 |
| 20140043616 | METHOD AND APPARATUS FOR PROVIDING IMAGE DATA FOR CONSTRUCTING AN IMAGE OF A REGION OF A TARGET OBJECT - Embodiments of the present invention provide a method ( | 02-13-2014 |
| 20140078507 | DEVICES AND METHODS FOR MEASURING LIGHT - The invention features devices and methods for collecting and measuring light from external light sources. In general, the devices of the invention feature a light diffusing element, e.g., as a component of a light collector, connected by a light conducting conduit, e.g., a fiber optic cable, to a light measuring device, e.g., a spectrometer. This light diffusing element allows, e.g., for substantially uniform light diffusion across its surface and thus accurate measurements, while permitting the total footprint of the device to remain relatively small and portable. This light diffusing element also allows flexibility in scaling of the device to permit use in a wide range of applications. | 03-20-2014 |
| 20140146322 | Apodization for Pupil Imaging Scatterometry - The disclosure is directed to various apodization schemes for pupil imaging scatterometry. In some embodiments, the system includes an apodizer disposed within a pupil plane of the illumination path. In some embodiments, the system further includes an illumination scanner configured to scan a surface of the sample with at least a portion of apodized illumination. In some embodiments, the system includes an apodized pupil configured to provide a quadrupole illumination function. In some embodiments, the system further includes an apodized collection field stop. The various embodiments described herein may be combined to achieve certain advantages. | 05-29-2014 |
| 20140160481 | REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE - Provided herein is an apparatus, including a photon emitter configured for emitting photons onto a surface of an article; a first reflective surface and a second reflective surface configured to reflect the photons onto the surface of the article; and a processing means configured for processing signals from a photon detector array corresponding to photons scattered from surface features of the article. | 06-12-2014 |
| 20140168654 | FIBER-TYPE IMAGE CAPTURING METHOD AND APPARATUS THEREOF - A fiber-type image capturing apparatus includes a fiber optic, an optical rotating module, an outer tube, an air inlet hole, and an air outlet hole. The optical rotating module is connected to one end of the fiber optic and has a light forward exit and a light lateral exit. The optical rotating module further includes a stator, a rotor, and a light path selector. The stator is fixed correspondingly to the fiber optic. The rotor has a fan blade which is pivotally connected to the stator. The light path selector is installed at the rotor and has a forward scanning path and a lateral scanning path. The outer tube fixes the fiber optic and the optical rotating module. The air inlet hole is disposed at the outer tube and feeds the fan blade with air. The air outlet hole is disposed at the outer tube and vents the air. | 06-19-2014 |
| 20140192361 | RECORDING MEDIUM DETERMINING DEVICE AND RECORDING MEDIUM DETERMINATION METHOD - A recording medium determining device includes a light irradiating portion that irradiates a recording medium with visible light; a regular reflection light receiving portion that receives regular reflection light regularly reflected by the recording medium irradiated with light from the light irradiating portion; a diffused reflection light receiving portion that receives diffused reflection light diffusely reflected by the recording medium irradiated with light from the light irradiating portion; and a determining portion that determines the type of recording medium on the basis of each light amount of two or more visible light components with different wavelengths to one another among the light components received by the regular reflection light receiving portion and each light amount of two or more visible light components with different wavelengths to one another among the light components received by the diffused reflection light receiving portion. | 07-10-2014 |
| 20140268161 | METHODS AND APPARATUS FOR AN OPTICAL SYSTEM OUTPUTTING DIRECT LIGHT AND HAVING A SENSOR - In some embodiments, an apparatus includes a housing and an image sensor that is coupled to the housing. The apparatus also includes a non-imaging optical system coupled to the housing that can output light to a surface and produce a scattered light component and a specular reflected light component. The image sensor and the non-imaging optical system are collectively configured in such a manner that during operation, the image sensor receives from a surface (1) at least a portion of the scattered light component and not the specular reflected light component or (2) at least a portion of the scattered light component having a magnitude and at least a portion of the specular reflective light component having a magnitude less than the magnitude of the portion of the scattered light component. | 09-18-2014 |
| 20140307260 | Optical detection device - An optical detection device is provided. The detection device includes a light source emitting light rays, a focusing lens, and a sample testing member. The focusing lens refracts the light rays emitting from the light source to a pre-defined area on the sample testing member and focuses light rays diffusely reflected by the sample testing member. The detection device further includes an aperture diaphragm having an aperture. The aperture is configured to allow the focused reflected light rays to pass through. The detection device further includes a photodetector configured to receive the focused reflected rays passing through the aperture. | 10-16-2014 |
| 20140347669 | Dynamic Characterization of Particles With Flow Cytometry - Flow cytometry concepts are modified to enable dynamic characterizations of particles to be obtained using optical scattering data. Particles in flow will be introduced into a sample volume. Light scattered by a particle in the sample volume is collected and analyzed. What differentiates the concepts disclosed herein from conventional flow cytometry is the use of an acoustic source that is disposed to direct acoustic energy into the sample volume. As the particle passes through the sample volume, it responds to the acoustic energy, causing changes in the light scattered by the particle. Those changes, which are not measured during conventional flow cytometry, can be analyzed to determine additional physical properties of the particle. | 11-27-2014 |
| 20150015888 | DYNAMIC RADIALLY CONTROLLED LIGHT INPUT TO A NONINVASIVE ANALYZER APPARATUS AND METHOD OF USE THEREOF - An analyzer apparatus and method of use thereof is described to dynamically irradiate a sample with incident light where the incident light is varied in time in terms of any of: position, radial position relative to a point of the skin of a subject, solid angle, incident angle, depth of focus, energy, and/or intensity. For example, the incident light is varied in radial position as a function of time relative to one or more of a sample site, a point on skin of the subject, a detection optic, and/or a sample volume observed by a detection system. The radially varied incident light is used to enhance and/or vary light probing the epidermis, the dermis, and/or the subcutaneous fat of the subject or of a group of subjects. | 01-15-2015 |
| 20150042999 | Illumination Source for use in Inspection Methods and/or Lithography; Inspection and Lithographic Apparatus and Inspection Method - An illumination system for a lithographic or inspection apparatus. A plurality of optical waveguides transmit radiation from the illumination source to an output. A switching system enables selective control of one or more subsets of the optical waveguides. An inspection method uses an illumination system and inspection and lithographic apparatuses comprise an illumination system. In one example, the optical waveguides and switching system are replaced by a plurality of parallel optical bandpass filter elements. The optical bandpass filter elements each only transmit a predetermined wavelength or a band of wavelengths of radiation. At least two of the parallel optical bandpass filter elements each being operable to transmit a different wavelength or band of wavelengths. | 02-12-2015 |
| 20150098086 | Adjusting Sample Holder Orientation For Symmetric Incident Beam and Scattered Beam Geometry to Compensate for Refraction Index Related Distortions - An apparatus with an electromagnetic radiation source generates an incident-beam. A sample container accommodates a sample, receives the incident beam for interaction with the sample, and enables a scattered beam, which is to be detected, to propagate out of the sample container. An electromagnetic radiation detector detects the scattered beam which is received from the sample container. The sample container is oriented with regard to a direction of the incident beam so that an incident trajectory of the incident beam directly before propagating into the sample container up to a symmetry axis of the sample container is symmetric with a scattered trajectory of the scattered beam, which is to be detected, from the symmetry axis up to a position of the scattered beam directly after having left the sample container, such that the scattered trajectory outside of the sample container is independent of a refraction index of the sample container and of the sample. | 04-09-2015 |
| 20150116718 | OPTICAL SENSOR AND IMAGE FORMING APPARATUS INCORPORATING SAME - An optical sensor includes a light-emitting unit to emit light onto a measuring object, a regular reflection light receiver to receive regular reflection light from the measuring object out of the light emitted by the light-emitting unit, and a diffuse reflection light receiver to receive diffuse reflection light from the measuring object out of the light emitted by the light-emitting unit. An angle of incidence of the light emitted onto a surface of the measuring object is not smaller than 75° and not larger than 85°. The diffuse reflection light receiver receives, out of the diffuse reflection light from the measuring object, diffuse reflection light having an angle of reflection with respect to a perpendicular to the surface of the measuring object larger than 0° and smaller than an angle of reflection of the regular reflection light with respect to the perpendicular to the surface of the measuring object. | 04-30-2015 |
| 20150116719 | CATADIOPTRIC ILLUMINATION SYSTEM FOR METROLOGY - A catadioptric optical system operates in a wide spectral range. In an embodiment, the catadioptric optical system includes a first reflective surface positioned and configured to reflect radiation; a second reflective surface positioned and configured to reflect radiation reflected from the first reflective surface as a collimated beam, the second reflective surface having an aperture to allow transmission of radiation through the second reflective surface; and a channel structure extending from the aperture toward the first reflective surface and having an outlet, between the first reflective surface and the second reflective surface, to supply radiation to the first reflective surface. | 04-30-2015 |
| 20150138559 | FLARE-MEASURING MASK, FLARE-MEASURING METHOD, AND EXPOSURE METHOD - A method for measuring flare information of a projection optical system includes arranging, on an object plane of the projection optical system, a sectoral pattern surrounded by a first side, a second side which is inclined at a predetermined angle with respect to the first side, and an inner diameter portion and an outer diameter portion which connect both ends of the first side and both ends of the second side; projecting an image of the sectoral pattern via the projection optical system; and determining the flare information based on a light amount of the image of the sectoral pattern and a light amount provided at a position away from the image. With the flare measuring method, it possible to correctly measure the flare information in an arbitrary angle range. | 05-21-2015 |
| 20150323455 | Distributed Optical Fibre Sensor - There is disclosed a distributed optical fibre sensor arranged to deliver probe light pulses of different wavelengths into corresponding different sensing optical fibres, and to determine one or more parameters as functions of position along each of the sensing fibres from detected backscattered light of each corresponding wavelength. In another arrangement, the different wavelengths are directed in different corresponding directions around a loop of sensing optical fibre. | 11-12-2015 |
| 20150355087 | INTEGRATING SPHERE TYPE DEVICE WITH SPECULAR CONTROL - The invention relates to a light integrating cavity device, such as an integrating sphere, for measuring diffuse reflectance of a sample. A light trap is movable within a light scattering cavity of the device for controlling specular reflections during measurements. The light trap may be rotatable around the sample under test inside the cavity so that specular reflections off the sample can be included or excluded from the measurement. The sample may also be placed at the outside against a measurement port, and a measurement instrument is moveable on a rotating arm within or outside of the cavity. | 12-10-2015 |
| 20150377697 | OPTICAL PERSPIRATION SENSOR USING FRUSTRATED TOTAL INTERNAL REFLECTION - Systems and methods may provide for receiving an electrical measurement signal from a first photodetector coupled to a first waveguide and determining a total intensity level of reflected light in the first waveguide based on the electrical measurement signal. Additionally, a perspiration level of skin in contact with the first waveguide may be determined based on the total intensity level of the reflected light in the first waveguide. In one example, an electrical control signal is received from a second photodetector coupled to a second waveguide that is physically isolated from the skin, wherein the total intensity level of the reflected light in the first waveguide is determined further based on the electrical control signal. | 12-31-2015 |
| 20160054221 | METHOD AND SYSTEM FOR IMAGING A TARGET - A system for characterizing a bi-directional reflectance distribution function scattered light pattern of a portion of a sample is disclosed. The system can comprise a hemispherical member comprising an reflective inner surface; an entrance port operable to receive electromagnetic radiation from an electromagnetic radiation source; a first reflective optical element operable to receive at least a portion of the electromagnetic radiation and to direct the at least the portion of the electromagnetic radiation onto the portion of the sample to be characterized; a wide-angle lens operable receive the electromagnetic radiation that was specularly reflected and diffusely scattered from the portion of the sample onto the inner surface of the hemispherical member; and an imaging device operable to record intensity information imaged by the wide-angle lens to characterize the bi-directional reflectance distribution function scattered light pattern of the portion of the sample. | 02-25-2016 |
| 20160061724 | OPTICAL OBSERVATION APPARATUS AND OPTICAL OBSERVATION METHOD - Optical observation apparatus includes: light source emitting broadband light; image fiber with first and second end faces, wherein end faces of plural cores are two-dimensionally arrayed in first and second end faces; imaging optical system provided on first end face side of image fiber, causing light from first end face to be imaged on imaging plane; and axial aberration optical system provided on second end face side of image fiber, having an axial chromatic aberration on optical axis, and causing light from second end face toward object to be observed to be converged. Image fiber takes light from light source from first end face, and transmits light to second end face, and takes light, reflected and scattered by a surface of object, converged by axial aberration optical system, and focused for each plural core on second end face, from second end face and transmits light to first end face. | 03-03-2016 |
| 20160069799 | REFLECTIVE SURFACES FOR SURFACE FEATURES OF AN ARTICLE - Provided herein is an apparatus including a photon emitter configured for reflecting photons from a surface of an article onto a first reflective surface. In addition, a second reflective surface is configured for reflecting photons from the surface of the article back onto the surface of the article. The apparatus also includes a detector configured to provide information corresponding to photons scattered from features of the article. | 03-10-2016 |
| 20160123874 | SPECKLE-BASED AUTHENTICATION APPARATUS, AUTHENTICATION SYSTEM COMPRISING THE SAME, AND SPECKLE-BASED AUTHENTICATION METHOD - Provided are a speckle-based authentication apparatus, an authentication system that includes the speckle-based authentication apparatus, and an authentication method using the speckle-based authentication apparatus. The speckle-based authentication apparatus includes an optical source configured to radiate light onto an object that is placed apart from the optical source; and a detector configured to detect a speckle pattern generated from the object in response to the light being radiated onto the object and detect location information of the object. Thus, the object is authenticated by comparing the speckle pattern detected by the detector with a speckle pattern stored in advance. | 05-05-2016 |
| 20160198985 | ATTENUATED TOTAL REFLECTION SPECTROSCOPIC ANALYSIS APPARATUS HAVING DEVICE FOR MEASURING SPECIMEN CONTACT AREA AND METHOD OF OPERATING THE SAME | 07-14-2016 |
