| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 356610000 | By projection of coded pattern | 68 |
| 20080218768 | MEASUREMENT METHOD AND DEVICE FOR BEAD CUTTING SHAPE IN ELECTRIC RESISTANCE WELDED PIPES - To precisely measure bead cutting shapes of electric resistance welded pipes without being affected by difference in luminance level between cut and uncut portions in optical cutting images, an image is obtained by overlaying an optical cutting image with the optical cutting image subjected to thinning processing. A profile of the welded pipe is approximated with a quadratic function and a region containing the bead apex coordinates is identified as the bead. Shape data of the pipe surface at the portion corresponding to the bead portion is obtained from the preset left and right boundaries of the bead portion and the apex position of the separately-calculated bead portion, and bead width, height, slope angle, and unevenness at the left and right boundaries between the bead portion and base pipe portion, are each calculated, based on the left and right bead shape approximation functions and base pipe shape approximation function. | 09-11-2008 |
| 20090002719 | SYSTEM AND METHOD FOR SCANNING AND MEASURING POINTS OF AN OBJECT - A method for scanning and measuring points of an object is provided. The method includes: (a) selecting a measuring start point and a measuring end point from an image of the object; (b) controlling a laser to move and scan the object from the measuring start point to the measuring end point with a predetermined distance according to X-axis coordinate values and Y-axis coordinate values of the measuring start point and the measuring end point to obtain scanned measuring points; (c) obtaining a vertical distance between each of the scanned measuring points and the laser; and (d) computing measuring results, namely computing a Z-axis coordinate value of each of the scanned measuring points according to the corresponding vertical distance. A related system is also provided. | 01-01-2009 |
| 20090040532 | Three-dimensional shape measuring method and apparatus for the same - A three-dimensional shape measuring apparatus includes a line laser light source ( | 02-12-2009 |
| 20090046301 | THREE-DIMENSIONAL COLOR AND SHAPE MEASURING DEVICE - A three-dimensional color and shape measuring device is provided to measure a color and a three-dimensional shape of an object to be measured with accuracy. A three-dimensional color and shape measuring device measures a color and a three-dimensional shape of an object to be measured based on an image signal acquired by picking up an image of the object to be measured by the same image pick-up part. The three-dimensional color and shape measuring device includes: a correction part which is configured to convert the image signal into a color measuring image signal by a first correction in accordance with a first gray scale characteristic and to convert the image signal into a shape-measuring image signal by a second correction in accordance with a second gray scale characteristic; and a color and shape extracting part which is configured to restore a three-dimensional image of the object to be measured by using a three-dimensional model on which a three-dimensional shape of the object to be measured is restored based on the shape-measuring image signal and a color of the object to be measured restored based on the color-measuring image signal. | 02-19-2009 |
| 20090141287 | Surface-distortion Measuring Device and Method - A surface-distortion measuring device and a surface-distortion measuring method can quantitatively, rapidly, and highly accurately measure and evaluate surface-distortion distribution at all of observable points on a specular or semi-specular surface of a measurement target. The device includes pattern displaying means | 06-04-2009 |
| 20100085577 | Vorrichtung und Verfahren zur Steigerung der Mess-Genauigkeit digitaler 3D-Geometriemesssysteme - The resolution of an optical measurement system for measuring a surface of an object, wherein a measurement light strip is captured on a surface of an object by means of a matrix sensor with a resolution limited by quantization in a quantization direction, can be improved by calculating an effective mapping location in the quantization direction on the basis of the associated real mapping location and a further real mapping location adjacent to the associated real mapping location in a direction perpendicular to the quantization direction. | 04-08-2010 |
| 20100171963 | APPARATUS FOR MEASUREMENT OF THREE-DIMENSIONAL SHAPE - A 3D shape measuring apparatus is disclosed, which is capable of simultaneously obtaining interference fringes of the lowest point and the highest point, by comprising a reflection path controller that generates a reference plane reflection path equal to a reflection path from a lowest point, and a reference plane reflection path equal to a reflection path from a highest point, the lowest and the highest points of a measured object having a height difference. | 07-08-2010 |
| 20100171964 | Method and Apparatus to Provide Corrections for a Radiation-Therapy Beam - Information is provided regarding a block's sectional contour in a particular plane as corresponds to a radiation-therapy beam. For a point at which block effects are to be assessed, a point is projected onto a plane of the block and a plurality of straight lines is then formed. Each line has a particular relationship with respect to the projected point (such as having each such line intersect all others at the projected point). Intersections amongst these straight lines and the contour are used to evaluate corrections to the dose at the point. These teachings will accommodate identifying line segments that are located within the contour and that are bound by the intersections with the contour. Elementary contributions as correspond to each of these line segments can be averaged to evaluate delivered dose corrections that are due to the presence of beam-limiting and beam-shaping devices in the particular treatment plan. | 07-08-2010 |
| 20100182614 | SHAPE MEASUREMENT APPARATUS AND METHOD - A shape measurement apparatus and method using a laser interferometer are disclosed. The shape measurement apparatus includes a plurality of laser devices, which generate beams, emit a beam of a specific frequency from among the generated beams, and output interference signals for detecting wavelengths of the generated beams, and a controller for detecting the wavelengths of the generated beams from the outputted interference signals, and controlling the laser devices on the basis of the detected wavelengths. The optical unit projects the beam of the laser device on a target object, and generates an interference pattern of the object. Several shutters are closed and opened. If the shutters are closed, they prevent the beam of each laser device to be projected on the optical unit. An image pickup unit captures the interference pattern. | 07-22-2010 |
| 20100208275 | METHOD AND APPARATUS FOR COLOUR IMAGING A THREE-DIMENSIONAL STRUCTURE - Provided is a device for determining the surface topology and associated color of a structure, such as a teeth segment, including a scanner for providing depth data for points along a two-dimensional array substantially orthogonal to the depth direction, and an image acquisition means for providing color data for each of the points of the array, while the spatial disposition of the device with respect to the structure is maintained substantially unchanged. A processor combines the color data and depth data for each point in the array, thereby providing a three-dimensional color virtual model of the surface of the structure. A corresponding method for determining the surface topology and associated color of a structure is also provided. | 08-19-2010 |
| 20100302551 | SHAPE MEASURING DEVICE - When a shape of an end face of a disc-shaped measurement target is to be measured on the basis of its projection image, a shape measuring device in which a non-parallel light component is not contained in a light flux projected to the measurement target as much as possible and moreover, correct shape measurement can be made by ensuring parallelism between a light projection direction and each face of front and back sides of the measurement target. | 12-02-2010 |
| 20110001983 | METHOD AND APPARATUS FOR OBTAINING 3-DIMENSIONAL DATA WITH A PORTABLE DEVICE - In one embodiment, a three dimensional imaging system includes a portable housing configured to be carried by a user, microelectrical mechanical system (MEMS) projector supported by the housing. sensor supported by the housing and configured to detect signals emitted by the MEMS projector, a memory including program instructions for generating an encoded signal with the MEMS projector, emitting the encoded signal, detecting the emitted signal after the emitted signal is reflected by a body, associating the detected signal with the emitted signal, comparing the detected signal with the associated emitted signal, determining an x-axis dimension, a y-axis dimension, and a z-axis dimension of the body based upon the comparison, and storing the determined x-axis dimension, y-axis dimension, and z-axis dimension of the body, and a processor operably connected to the memory, to the sensor, and to the MEMS projector for executing the program instructions. | 01-06-2011 |
| 20110013198 | DIMENSIONAL PROBE AND METHODS OF USE - Disclosed is a surface sensing apparatus, one embodiment having a source of coherent radiation capable of out-putting wavelength emissions to create a first illumination state to illuminate a surface and create a first speckle pattern, an emission deviation facility capable of influencing the emission to illuminate the surface and create a second illumination state and a second speckle pattern, and a sensor capable of sensing a representation of the first and a second speckle intensity from the first and second speckle pattern. Also disclosed are methods of sensing properties of the surface, one embodiment comprising the steps of illuminating the surface having a first surface state with the source of coherent radiation emission, sensing a first speckle intensity from the surface, influencing a relationship of the surface to the emission to create a second surface state and sensing a second speckle intensity from the surface at the second surface state. | 01-20-2011 |
| 20110188054 | INTEGRATED PHOTONICS MODULE FOR OPTICAL PROJECTION - Optical apparatus includes a semiconductor substrate and an edge-emitting radiation source, mounted on a surface of the substrate so as to emit optical radiation along an axis that is parallel to the surface. A reflector is fixed to the substrate in a location on the axis and is configured to reflect the optical radiation in a direction that is angled away from the surface. One or more optical elements are mounted on the substrate so as to receive and transmit the optical radiation reflected by the reflector. | 08-04-2011 |
| 20110194121 | METHOD AND APPARATUS FOR DETECTING CONTOUR DATA AND/OR OPTICAL CHARACTERISTICS OF A THREE-DIMENSIONAL SEMITRANSPARENT OBJECT - A method for detecting contour data of a three-dimensional object, where a grid of illumination points of a multi-point illumination is projected onto the object using an optical device and the illumination points are then projected back onto a sensor containing pixels. In order to improve signal-noise ratio and reduce background signal, it is proposed that a grid of illumination points of at least two multi-point illuminations are projected onto the object, that the beams of the illuminating points of are modulated in intensity and that a frequency-selective and/or phase-selective detection is performed of mutually associated first and second illumination points back-projected onto the sensor. The first illumination points derive from a first of the multipoint illuminations and the second illumination points derive from a second of the multipoint illuminations. Differences in intensity and/or frequency of the measurement signals of adjacent pixels of the sensor on which the mutually associated first and second image points are depicted are evaluated for the purposes of determining the contour data. | 08-11-2011 |
| 20120038934 | DIFFRACTIVE OPTICAL ELEMENT AND MEASURING DEVICE - To provide a diffractive optical element and a measuring device capable of generating light spots of dispersive type. The problem is resolved by providing a diffractive optical element having concaves and convexes and diffracting incident light in two dimensions so as to generate diffracted light, wherein when the number of a part of light spots formed by the diffracted light is denoted by n, an average distance W to the nearest neighbor in the light spots normalized by an area of a region onto which the light spots are projected falls within a range of 1/(2×n | 02-16-2012 |
| 20120105867 | PROFILE MEASURING APPARATUS, METHOD FOR MANUFACTURING STRUCTURE, AND STRUCTURE MANUFACTURING SYSTEM - There is provided a profile measuring apparatus which measures a profile of an object including: a projection unit which projects a pattern on the object from a projection direction; a measurement unit, which is displaced at a difference position for the projection unit and takes an image of the pattern from a direction different from the projection direction to measure a position on a surface of the object based on an image data obtained with the taken image; an object-rotation unit which rotates the object in two directions; and a pattern-rotation unit which is connected to the projection unit so as to be able to rotate the pattern relative to the object-rotation unit. | 05-03-2012 |
| 20120105868 | MEASUREMENT DEVICE AND MEASUREMENT METHOD - A measurement device includes a pattern light characteristic setting unit configured to set illumination light having a pattern light characteristic to be projected onto a measurement object, a reflected light measurement unit configured to measure reflected light when the measurement object is irradiated with the illumination light on, an image feature extraction unit configured to extract from the measured reflected light an image feature based on a physical characteristic of the measurement object, a feature distribution calculation unit configured to calculate a distribution characteristic for each local region of the image feature, and a pattern light control unit configured to control the pattern light characteristic of the illumination light, which includes a pattern light characteristic for distance measurement and a pattern light characteristic for image feature extraction, based on the calculated distribution characteristic for each local region. | 05-03-2012 |
| 20120105869 | THREE DIMENSIONAL INSPECTION AND METROLOGY BASED ON SHORT PULSES OF LIGHT - A system and a method may be provided. The system may include an illumination module arranged to illuminate an object by short pulses of light that form at least one spot on the object; a collection module that comprises a sensor that is arranged to generate detection signals representative of three dimensional information about the object: and a mechanical stage that is arranged to introduce a movement between the object and at least one of the collection module and the illumination module. | 05-03-2012 |
| 20120120414 | METHOD OF INSPECTING BOARD - A method of establishing a tip location of a terminal includes establishing a virtual tip line by measuring a height of a board, on which a component having a terminal and a body is mounted, and comparing the measured measurement height with a predetermined reference height, establishing a central line with respect to a width direction of the terminal along a longitudinal direction of the terminal, and establishing a tip location of the terminal by using the measurement height along the central line from an intersection point of the virtual tip line and the central line. Thus, a tip location of a terminal may be more correctly acquired. | 05-17-2012 |
| 20120133954 | MEASURING APPARATUS, MEASURING METHOD, AND PROGRAM - A measuring apparatus includes a projection control unit configured to cause a projection unit to project, onto an object, a first light pattern with light and dark portions, a second light pattern, which is smaller in distance between the light and dark portions than that of the first light pattern and has a boundary position between the light and dark portions common to the first light pattern, and a third light pattern in which the light and dark portions of the second light pattern are reversed to each other, an acquisition unit configured to acquire a first captured image of the object onto which the first light pattern is projected, a second captured image of the object onto which the second light pattern is projected, and a third captured image of the object onto which the third light pattern is projected, and a calculation unit configured to calculate the boundary position between the light and dark portions of the first captured image based on the second and the third captured image to measure the position of the object. | 05-31-2012 |
| 20120218562 | THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD - A three-dimensional shape measurement apparatus is provided that calculates the height of solder accurately. An approximation surface of a wiring pattern is prepared for an inspection block prior to the application of solder. Furthermore, an approximation surface of lands is prepared for an inspection block prior to the application of solder. Then, based on the prepared approximation surface Sr of the wiring pattern and the approximation surface Sl of the lands, an offset, that is, the distance between the approximation surface Sr of the wiring pattern and the approximation surface Sl of the lands is calculated. Then, the calculated offset is stored in a RAM or the like. Then, after the application of solder, the stored offset is read out, and the height of the solder is calculated. | 08-30-2012 |
| 20120229816 | DEVICE AND METHOD FOR OBTAINING THREE-DIMENSIONAL OBJECT SURFACE DATA - The concept includes projecting at the object surface, along a first optical axis, two or more two-dimensional (2D) images containing together one or more distinct wavelength bands. The wavelength bands vary in intensity along a first image axis, forming a pattern, within at least one of the projected images. Each projected image generates a reflected image along a second optical axis. The 3D surface data is obtained by comparing the object data with calibration data, which calibration data was obtained by projecting the same images at a calibration reference surface, for instance a planar surface, for a plurality of known positions along the z-axis. Provided that the z-axis is not orthogonal to the second optical axis, the z-axis coordinate at each location on the object surface can be found if the light intensity combinations of all predefined light intensity patterns are linearly independent along the corresponding z-axis. | 09-13-2012 |
| 20120236317 | THREE-DIMENSIONAL DISTANCE MEASUREMENT APPARATUS, THREE-DIMENSIONAL DISTANCE MEASUREMENT METHOD, AND NON-TRANSITORY COMPUTER-READABLE STORAGE MEDIUM - A three-dimensional distance measurement apparatus comprising: a distance information calculation unit configured to calculate distance information of a measurement object based on a captured image of the measurement object on which pattern light is projected; and a local pattern setting unit configured to adaptively set a spatial resolution of measurement points of the pattern light for each local region, wherein the local pattern setting unit sets the spatial resolution of the measurement points of the pattern light based on information about an arithmetic amount of the distance information calculation unit. | 09-20-2012 |
| 20120281240 | Error Compensation in Three-Dimensional Mapping - A method for forming a three-dimensional (3D) map of an object, including illuminating the object from a light source so as to project a pattern onto the object, capturing an image of the pattern using an array of detector elements, and processing the captured image so as to measure respective offsets of elements of the pattern in the captured image relative to a reference pattern, the offsets including at least a first offset of a first element of the pattern and a second offset of a second element of the pattern, measured respectively in first and second, mutually-perpendicular directions in a plane of the array. The method further includes computing a correction factor in response to the first offset, applying the correction factor to the second offset so as to find a corrected offset, and computing depth coordinates of the object in response to the corrected offset. | 11-08-2012 |
| 20120287442 | THREE-DIMENSIONAL MEASUREMENT APPARATUS, METHOD FOR CONTROLLING A THREE-DIMENSIONAL MEASUREMENT APPARATUS, AND STORAGE MEDIUM - A three-dimensional measurement apparatus comprises a detection unit configured to detect a plurality of intersection positions between first pattern light in which a bright part and a dark part are alternately arranged and second pattern light in which a phase of the first pattern light is shifted, by using tone values of a first image obtained by capturing a target object onto which the first pattern light is projected and tone values of a second image obtained by capturing the target object onto which the second pattern light is projected; and a measurement unit configured to calculate a third position based on a first intersection position included in the plurality of intersection positions and a second intersection position that is adjacent to the first intersection position and measure a three-dimensional position of the target object based on an interval between the third positions. | 11-15-2012 |
| 20120293808 | SYSTEM AND METHOD FOR NON-CONTACT METROLOGY OF SURFACES - A non-contact metrology system utilizes a display that can be programmed with a plurality of targets. The display targets shine on a specular surface and the reflected targets are detected by an imaging device. Based on the display pattern and the expected location of the reflected pattern, it is possible to characterize the reflective surface. The displayed pattern can be a regular array of targets and the reflected pattern detected by the imaging device is an irregular display of targets whose locations are based on the particular display pattern, the location of the display system and imaging device and the nature of the surface. Deviations of the actual location of targets from the expected location of targets is indicative of unexpected variations in the surface. Alternatively, the display has an irregular pattern of targets such that the reflected signals result in a regularly spaced array detected by the imaging device. | 11-22-2012 |
| 20120307260 | HYBRID SYSTEM - A system and method is provided for imaging an article within a field of view, projecting an illumination field onto the article within field of view, and selectively projecting illumination structures onto the article within the field of view. Then, image data corresponding to the illumination field and the illumination structures may be received and a feature of the article may be analyzed based on the illumination field and the illumination structures. | 12-06-2012 |
| 20130016362 | DEVICE AND METHOD USING A SPATIAL LIGHT MODULATOR TO FIND 3D COORDINATES OF AN OBJECT - A method for determining three-dimensional coordinates of an object point on a surface of an object, the method including steps of: providing a source, a projector, and a camera; in each of two instances: spatially modulating source light; sending a modulator pattern of light through the projector lens to form light spots; filtering the spots with a pinhole plate; propagating light from the light spots onto the object to produce a fringe pattern; imaging the object point with a camera lens onto an array point of the photosensitive array to obtain first and second electrical data values from the photosensitive array; and determining the three-dimensional coordinates of the first object point based at least in part on the first electrical data value, the second electrical data value, and a baseline length. | 01-17-2013 |
| 20130038881 | Projectors of Structured Light - Optical apparatus includes a beam source, which is configured to generate an optical beam having a pattern imposed thereon. A projection lens is configured to receive and project the optical beam so as to cast the pattern onto a first area in space having a first angular extent. A field multiplier is interposed between the projection lens and the first area and is configured to expand the projected optical beam so as to cast the pattern onto a second area in space having a second angular extent that is at least 50% greater than the first angular extent. | 02-14-2013 |
| 20130038882 | OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE - An information acquiring device has a light source which emits light in a predetermined wavelength band; a projection optical system which projects the light toward a target area; and a light receiving element which receives reflected light reflected on the target area for outputting a signal. First signal value information relating to a value of a signal outputted from the light receiving element during a period when the light is emitted from the light source, and second signal value information relating to a value of a signal outputted from the light receiving element during a period when the light is not emitted from the light source are stored in a storage. An information acquiring section acquires three-dimensional information of an object in the target area, based on a subtraction result obtained by subtracting the second signal value information from the first signal value information stored in the storage. | 02-14-2013 |
| 20130050710 | OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE - The information acquiring device includes a projection optical system which projects laser light onto a target area with a predetermined dot pattern; a light receiving optical system which is aligned with the projection optical system away therefrom by a predetermined distance, and has an image pickup element for capturing an image of the target area; a correcting section which divides a captured image obtained by capturing the image of the target area by the image pickup element at a time of actual measurement into a plurality of correction areas, and correcting a pixel value of a pixel in the correction area with use of a minimum pixel value among all pixel values of pixels in the correction area for generating a corrected image; and an information acquiring section which acquires three-dimensional information of an object in the target area, based on the corrected image generated by the correcting section. | 02-28-2013 |
| 20130100460 | APPARATUS FOR MEASURING WARPAGE CHARACTERISTIC OF SPECIMEN - There is provided an apparatus for measuring a warpage characteristic of a specimen, the apparatus including: a light irradiating unit irradiating light toward the specimen; alight transmitting member transmitting the light irradiated by the light irradiating unit therethrough and including a reference lattice pattern to allow a shadow to be formed on the specimen; a sensing unit sensing the shadow formed on the specimen by the reference lattice pattern; and a heating plate disposed under the light transmitting member and heating the specimen mounted thereon, wherein the reference lattice pattern formed on the light transmitting member is formed of a conductive material and is connected to a power supplying unit to thereby generate heat when power is supplied. | 04-25-2013 |
| 20130128282 | DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE - A device for measuring three dimensional shape includes a first height data acquisition unit for acquiring a height data specified from measurement values according to a multiplicity of light patterns related to an entirely irradiated region irradiated by all of the multiplicity of light patterns, and for using an acquired specified height data as a height data for the entirely irradiated region; a supplemental data acquisition unit for acquiring, based on the height data for the entirely irradiated region, a supplemental data relating to a partially irradiated region that is irradiated by only part of the multiplicity of light patterns; and a second height acquisition unit for specifying a fringe order of the measurement values for the partially irradiated region based on the supplemental data, and for acquiring as height data for the partially irradiated region a height data corresponding to the measurement values of the specified fringe order. | 05-23-2013 |
| 20130155416 | DEVICE FOR MEASURING THREE DIMENSIONAL SHAPE - A device for measuring three dimensional shape is configured to perform one of a first imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a first light pattern of multiply varied phases, and a second imaging operation as imaging processing of a single operation among a multiplicity of imaging operations performed by irradiation of a second light pattern of multiply varied phases. The device is configured to, simultaneous with completion of the first or second imaging operation, start shifting or switching operation of said first grating or a second grating relating to said first imaging operation. The device is configured to, without waiting for completion of the shifting or switching operation, perform the other imaging operation from among the first and second imaging operations. | 06-20-2013 |
| 20130155417 | THREE-DIMENSIONAL MEASUREMENT APPARATUS, METHOD FOR THREE-DIMENSIONAL MEASUREMENT, AND COMPUTER PROGRAM - On the basis of captured images at the time of projecting multiple-frequency slit-shaped light patterns having no overlapping edge positions onto an object, the edge portions of the slit-shaped light patterns are identified. When the edge portions overlap in the captured images of two or more slit-shaped light patterns, the reliability of the computed distance values of the positions corresponding to the edges is lowered. | 06-20-2013 |
| 20130201489 | PROBE ASSEMBLY AND METHODS FOR USE IN INSPECTING A COMPONENT - A probe tip includes a plurality of light emitters and a control circuit that is coupled to the light emitters. The control circuit is configured to control a projection of a plurality of light patterns from the light emitters for performing a phase-shift analysis using a plurality of images of the light patterns that are projected onto a component being inspected. The control circuit controls the projection of the light patterns by receiving electrical energy from a drive circuit. At least one of the light emitters is identified for receiving a power input based at least in part on the electrical energy received from the drive circuit. The power input is transmitted to the identified light emitter, based at least in part on the electrical energy received from the drive circuit, to enable the activation of the identified light emitter. | 08-08-2013 |
| 20130229666 | INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD - A projection pattern that includes a measurement pattern for measuring a distance to a target object, and a code pattern for identifying the measurement pattern is projected onto the target object. The target object onto which the projection pattern was projected is sensed. On the basis of a relationship between the measurement pattern and the code pattern in the sensed image, the projection pattern that is to be projected onto the target object after the projection pattern are changed, the code pattern is read out in the sensed image of the target object onto which the changed projection pattern was projected, and the measurement pattern is associated with it. Using the associated measurement pattern, a distance from the projection unit or the sensing unit to the target object is acquired. | 09-05-2013 |
| 20130250308 | OBJECT DETECTING DEVICE AND INFORMATION ACQUIRING DEVICE - An information acquiring device has a light source which emits light in a predetermined wavelength band; a projection optical system which projects the light emitted from the light source toward a target area; and a light receiving element which receives reflected light reflected on the target area for outputting a signal. First signal value information relating to a value of a signal outputted from the light receiving element during a period when the light is emitted from the light source, and second signal value information relating to a value of a signal outputted from the light receiving element during a period when the light is not emitted from the light source are stored in a storage. An information acquiring section acquires three-dimensional information of an object in the target area, based on a subtraction result obtained by subtracting the second signal value information from the first signal value information stored in the storage. | 09-26-2013 |
| 20130286408 | OPTICAL BASE PLATE ALIGNMENT - Alignment of two surfaces of two objects in a manufacturing process is achieved by determining a best fit orientation of the two objects with respect to each other using captured images reflected from the two surfaces. An image pattern is projected on a surface of each object, and a reflected image pattern is captured from the surface of each object. A reconstructed surface is determined from the captured reflected image patterns, and the two reconstructed surfaces are superimposed to determine a best fit orientation of the two objects with respect to each other. One or more movable portions of a base are actuated to align the two surfaces to each other to achieve the determined best fit orientation. | 10-31-2013 |
| 20140111812 | 3D SCANNING SYSTEM AND METHOD OF OBTAINING 3D IMAGE - Disclosed are a 3D laser scanning system and a method of obtaining a 3D image by using the system that detect, with a linear array type photo detector, a reflected light reflected from a target after rotation-emitting a line-shaped pulsed laser light through 360 degrees and obtain a 3D image through point cloud data obtained by measuring a distance to the target. | 04-24-2014 |
| 20140168662 | THREE-DIMENSIONAL MEASURING APPARATUS AND CONTROL METHOD THEREFOR - According to the invention, reliability is calculated in consideration of an uncertain error due to noise in three-dimensional measurement, thereby obtaining correct reliability as compared with a conventional technique. To achieve this, a three-dimensional measuring apparatus includes a projector which projects a striped light pattern onto an object, a camera which captures a reflected light pattern from the object onto which the striped light pattern is projected, and a calculation processing unit which executes various arithmetic operations. The calculation processing unit includes a noise calculating unit and a reliability calculating unit. | 06-19-2014 |
| 20140198319 | DEVICE FOR GENERATING AN OPTICAL DOT PATTERN - A device for capturing a three-dimensional object is presented, which allows, on one hand, a sufficiently large number of projected pixels and a high image quality of the projected pixels, and which has, on the other hand, a compact size and low assembly costs. | 07-17-2014 |
| 20140198320 | THREE-DIMENSIONAL PROFILE MEASUREMENT APPARATUS AND METHOD USING AMPLITUDE SIZE OF PROJECTION GRID - Disclosed are a three-dimensional profile measurement apparatus and method using the amplitude size of a projection grid wherein a periodic pattern of the projection grid is projected onto an object to be measured, the amplitude of the projection grid is obtained through the change of the pattern of the projection grid, and the amplitude size is continuously obtained while moving the object upwards and downwards, thus measuring the three-dimensional profile of the object. | 07-17-2014 |
| 20140211215 | Projectors of structured light - Optical apparatus includes a beam source, which is configured to generate an optical beam having a pattern imposed thereon. A projection lens is configured to receive and project the optical beam so as to cast the pattern onto a first area in space having a first angular extent. A field multiplier is interposed between the projection lens and the first area and is configured to expand the projected optical beam so as to cast the pattern onto a second area in space having a second angular extent that is at least 50% greater than the first angular extent. | 07-31-2014 |
| 20140285816 | MEASURING DEVICE, MEASURING METHOD, AND COMPUTER PROGRAM PRODUCT - According to an embodiment, a measuring device includes a projector, an image capturing unit, and a first calculator. The projector projects, onto a target, a first superimposed pattern which is obtained by superimposing a first pattern having a periodic change and a second pattern configured with a first design for specifying a period of the first pattern. The image capturing unit captures the target, onto which the first superimposed pattern is projected to obtain an image. The first calculator performs matching of the first design taken by the image capturing unit, which is included in the first superimposed pattern in the image, with the first design projected by the projecting unit, and calculates correspondence between a second superimposed pattern, which points to the first superimposed pattern captured in the image, and the first superimposed pattern. | 09-25-2014 |
| 20140376003 | ARRANGEMENT FOR OPTICAL MEASUREMENTS AND RELATED METHOD - An arrangement for optically measuring the surface of an optionally glossy target object, includes: a diffusive, semi-transparent illumination structure defining a hollow surface shape configured to surround the target object at least partially, the surface being further provided with at least two apertures, a number of light sources optically coupled to the diffusive illumination structure for illuminating the target object via the surface of the illumination structure, at least two imaging devices, each configured to image the target object via an aperture, and a control entity configured to instruct the number of light sources to form a sequence of predetermined illumination patterns illuminating the target object, to instruct the at least two imaging devices to obtain an image of the target object relative to each illumination pattern, and to derive, through the utilization of the patterns utilized and images obtained, a predetermined surface-related property of the target object. | 12-25-2014 |
| 20150043009 | LASER SCANNER HAVING A MULTI-COLOR LIGHT SOURCE AND REAL-TIME COLOR RECEIVER - A laser scanner includes a light emitter that generates a modulated light beam for measuring distance and red, blue, and green lights for capturing colors. The beam is collimated and directed to an object point with a steering mirror. Reflected light from the object point is directed by the steering mirror onto scanner optics. The reflected light is directed to an optical receiver that sends the first light in a first path and the second, third and fourth lights in a second path to a color receiver. The first light is demodulated to determine distance to the target. The second, third, and fourth lights are separated and measured to determine three color values. The color values are combined with the measured distance value to determine a color 3D coordinate for the object point. | 02-12-2015 |
| 20150055140 | DEVICE AND METHOD FOR DETERMINING SIZING INFORMATION FOR CUSTOM MASK DESIGN OF A FACIAL MASK - The present invention relates to a mask sizing device ( | 02-26-2015 |
| 20150116729 | AUTOFOCUS SYSTEM AND METHOD - Autofocus system (AF) employing, in addition to specified optical units, fringe projection and fringe detection systems (FPS, FDS) and specifically-configured data processing system. AFS is configured to project with FPS a sinusoidal fringe pattern, formed by a pattern source, on a substrate and to image the so projected pattern from substrate onto optical detector with FDS to form optical image from which topology of the substrate is defined as substrate moves relative to the projected pattern. Pattern source may include diffraction grating oriented that the projected pattern is inclined relative to direction of substrate scanning Topology profile is corrected for tilt of substrate, Goos-Hanchen errors, and for fringe-pattern-induced errors outside a chosen spatial-frequency range. To reduce errors of topology profile, at least five values of phase difference are used. AFS is configured to define temporal phase shifting in optical image without using any moving parts in the AFS. | 04-30-2015 |
| 20150138565 | CALIBRATION METHOD AND SHAPE MEASURING APPARATUS - A calibration method includes acquiring a captured image of a lattice fringe by providing a reference gauge having a reference surface whose height from a reference plane changes in a first direction, projecting a fringe pattern having the same phase along the first direction with respect to the reference surface and having a phase changing in a second direction crossing the first direction, and imaging the fringe pattern; calculating a phase of each pixel along the first direction in the captured image of the fringe pattern; and generating relational data in which the height of the reference surface corresponding to the pixel, the phase calculated with respect to the pixel, and a period of the fringe pattern at the time of calculating the phase are associated with each other. | 05-21-2015 |
| 20150146215 | THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND CONTROL METHOD THEREOF - To measure the three-dimensional shape of a target object with higher accuracy, a three-dimensional shape measurement apparatus projects a pattern image to a predetermined measurement area including a support structure on which the target object is placed; and captures an image of the predetermined measurement area. In addition, the apparatus derives, based on the captured image, a first correction value for correcting a position fluctuation of a support structure, and a second correction value for correcting a fluctuation of a projection position; and calculates, based on the captured image and the first correction value and the second correction value, a plurality of coordinates on a surface of the target object. | 05-28-2015 |
| 20150292875 | SYSTEMS, METHODS, AND MEDIA FOR PERFORMING SHAPE MEASUREMENT - Systems, methods, and media for performing shape measurement are provided. In some embodiments, systems for performing shape measurement are provided, the systems comprising: a projector that projects onto a scene a plurality of illumination patterns, wherein each of the illumination patterns has a given frequency, each of the illumination patterns is projected onto the scene during a separate period of time, three different illumination patterns are projected with a first given frequency, and only one or two different illumination patterns are projected with a second given frequency; a camera that detects an image of the scene during each of the plurality of periods of time: and a hardware processor that is configured to: determine the given frequencies of the plurality of illumination patterns; and measure a shape of an object in the scene. | 10-15-2015 |
| 20150338676 | OPTICAL DEVICE, SYSTEM AND METHODS FOR INTERROGATING A VOLUME WITH AN ILLUMINATION PATTERN - In one embodiment, the optical device for generating an illumination pattern has a beam splitter and a pattern generator mounted in series and optically coupled one with the other. The beam splitter and the pattern generator are configured to cooperate one with the other in formatting an incident light beam into the illumination pattern. The illumination pattern has a plurality of diffraction patterns each resulting from a corresponding portion of the incident light beam being split from other portions of the incident light beam by the beam splitter. Each diffraction pattern has a zero-order beam. Each diffraction pattern overlaps with at least one of the other diffraction patterns and forms at least one overlapping region therewith, wherein the plurality of zero-order beams of the plurality of diffraction patterns are separated from one another in the illumination pattern. | 11-26-2015 |
| 20150362312 | MEASUREMENT APPARATUS AND METHOD THEREOF - A shape of an object is measured using a plurality of space encoding patterns each of which includes a light portion and a dark portion. A first and second pattern sets are obtained. The first set comprises patterns each of which has the light portion of each space encoding pattern masked by a pattern mask. The second set comprises patterns each of which has the light portion of each of the space encoding pattern masked by a mask with varying the mask pattern. Captured images of an object on which the patterns of the first and second sets are sequentially projected are inputted. A correspondence between projection coordinates of the projected pattern and image coordinates of a captured image for the projected pattern is detected. A shape of the object is derived based on correspondences. | 12-17-2015 |
| 20160054118 | MEASUREMENT SYSTEM, MEASUREMENT METHOD, AND VISION CHIP - A measurement system includes: a projection apparatus that projects, onto a subject, first pattern light indicating a first pattern projection image including a first pattern image corresponding to a specific bit in gray code obtained by gray-coding projection coordinates stipulated by a projection coordinate system, and a second pattern image having the same cycle as the first pattern image, but having a different phase from the first pattern image, following a projection sequence where projections of the first and second pattern images coexist; and at least one imaging apparatus that images the first pattern light and generates an imaged image. | 02-25-2016 |
| 20160069669 | INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AND STORAGE MEDIUM - To measure a three-dimensional shape of a measurement target object at high speed, an information processing method includes acquiring a captured image captured by an imaging apparatus in a state where a pattern is projected onto the measurement target object, the pattern including a plurality of lines, identification information arranged on or between the lines to identify the lines, and a feature arranged between a plurality of the lines, identifying each line included in the captured image by acquiring a correspondence between each line included in the projected pattern and each line included in the captured image, determining a second region in the pattern corresponding to a first region between the lines in the captured image, and deriving a distance of the measurement target object by acquiring a correspondence between the first region and the determined second region. | 03-10-2016 |
| 20160069670 | PORTABLE DEVICE FOR OPTICALLY MEASURING THREE-DIMENSIONAL COORDINATES - A device for scanning and obtaining three-dimensional coordinates is provided. The device may be a hand-held scanner that includes a carrying structure having a front and reverse side, the carrying structure having a first arm, a second arm and a third arm arranged in a T-shape or a Y-shape. A housing is coupled to the reverse side, a handle is positioned opposite the carrying structure, the housing and carrying structure defining an interior space. At least one projector is configured to project at least one pattern on an object, the projector being positioned within the interior space and oriented to project the at least one pattern from the front side. At least two cameras are provided spaced apart from each other, the cameras being configured to record images of the object. The cameras and projector are spaced apart from each other by a pre-determined distance. | 03-10-2016 |
| 20160102972 | THREE-DIMENSIONAL COORDINATE MEASURING APPARATUS AND THREE-DIMENSIONAL COORDINATE MEASURING METHOD - The invention makes it possible to measure an object with a three dimensional shape that is made of various materials with a high degree of precision and at high-speed, without requiring a vast amount advance of preparation. A measuring unit detects internal scattering light measuring areas in a captured image, and obtains profiles of internal scattering light components in the areas. An estimating unit estimates the internal scattering light components in three-dimensional coordinate measuring areas based on the profiles of the internal scattering light components in the internal scattering light measuring areas. A reducing unit reduces the internal scattering light components in the three-dimensional coordinate measuring areas to generate a direct-reflected light component image. Then, a calculating unit calculates three-dimensional coordinates on measuring lines based on the direct-reflected light component image. | 04-14-2016 |
| 20160153772 | SHAPE MEASUREMENT APPARATUS AND METHOD | 06-02-2016 |
| 20160161250 | SHAPE MEASUREMENT DEVICE, STRUCTURAL OBJECT PRODUCTION SYSTEM, SHAPE MEASUREMENT METHOD, STRUCTURAL OBJECT PRODUCTION METHOD, SHAPE MEASUREMENT PROGRAM, AND RECORDING MEDIUM - The purpose of the present invention is to more quickly and easily measure the shape of an object to be measured. A shape measurement device includes: a probe including a projection optical system that projects a line-shaped pattern onto a surface of the object to be measured or projects a spot pattern while scanning in at least a linear scanning range, and an image capturing device that detects an image of the pattern projected onto the object to be measured; a movement mechanism that rotates the object to be measured and the probe relative to each other so that the object to be measured rotates relative to the probe around a rotation axis and moves at least one of the probe and the object to be measured relatively in a direction that intersects with a rotation direction in which the object to be measured rotates; a measurement region setting unit that sets a measurement region of the object to be measured; and an actual measurement region setting unit that sets an actual measurement region including an actual measurement start position and an actual measurement end position on the basis of the measurement region set by the measurement region setting unit. The actual measurement region setting unit sets whichever of the actual measurement start position and the actual measurement end position is closer to a rotation axis center to be closer to the rotation axis than the measurement region, or sets whichever of the actual measurement start position and the actual measurement end position is located further outward in the radial direction to be further from the rotation axis than the measurement range. | 06-09-2016 |
| 20160178358 | DIFFRACTION OPTICAL ELEMENT, PROJECTION DEVICE, AND MEASUREMENT DEVICE | 06-23-2016 |
| 20160202050 | METHOD AND APPARATUS FOR INSPECTING AN OBJECT EMPLOYING MACHINE VISION | 07-14-2016 |
| 20160202051 | METHOD AND DEVICE FOR THE CONTACT-FREE MEASUREMENT OF SURFACE CONTOURS | 07-14-2016 |
| 20160252346 | DETERMINING THREE-DIMENSIONAL INFORMATION FROM PROJECTIONS OR PLACEMENT OF TWO-DIMENSIONAL PATTERNS | 09-01-2016 |
| 20180023949 | 3D-MESSGERAET | 01-25-2018 |
| 20190145758 | SYSTEM AND METHOD FOR VERIFYING PROJECTION ACCURACY | 05-16-2019 |
| 20190145759 | APPARATUS FOR LASER PROFILING INSPECTION | 05-16-2019 |
