| Entries |
| Document | Title | Date |
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| 20080198386 | Vibration detection device - A vibration detection device includes: a light source emitting a laser beam; an interferometer including a first vibrating body and a second vibrating body both capable of reflecting the laser beam, the interferometer splitting the laser beam into beams traveling along first to third optical paths, and the interferometer causing interference between a first reflected beam reflected by the first vibrating body in the first optical path and a reference beam passing through the third optical path to form a first interference pattern, and causing interference between a second reflected beam reflected by the second vibrating body in the second optical path and the reference beam to form a second interference pattern; and a detection means quantizing the vibrations of the first and second vibrating bodies on the basis of the formed first and second interference patterns to detect the vibrations. | 08-21-2008 |
| 20080231861 | Polarization Maintaining Optical Delay Circuit - The invention relates to a polarization maintaining optical delay circuit ( | 09-25-2008 |
| 20080291463 | POLARIZATION-SENSITIVE SPECTRAL INTERFEROMETRY - A polarization sensitive spectral interferometer apparatus and method for analyzing a sample. The polarization sensitive spectral interferometer apparatus and method determines polarization properties of the sample. | 11-27-2008 |
| 20080316495 | OPTICAL CHARACTERISTIC MEASURING APPARATUS - An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized states of the first and second input lights being perpendicular to each other, and outputs the first and second input light; an interference section which inputs one branched light of the first and second input lights to a measuring object, makes output light from the measuring object interfere with other branched light of the first and second input lights, and outputs a plurality of interference lights; a plurality of light receiving sections which are respectively provided for the interference lights, receives the interference lights respectively, and outputs signals in accordance with optical powers of the interference lights respectively; and a low-pass filter for filtering the outputted signals. | 12-25-2008 |
| 20090009772 | OPTICAL MEASURING APPARATUS AND OPTICAL MEASURING METHOD - An optical measuring apparatus, includes an optical branch element for splitting a measured light into plural lights, a time delay processing portion for giving a predetermined time delay to one split light of the measured light, an optical phase diversity circuit for outputting an in-phase signal component and an quadrature-phase signal component of the measured light by virtue of an interference between the measured light and a reference light between which a relative time difference corresponds to a time give by the time delay, while using other split light of the measured light or the measured light to which a process is applied by the time delay processing portion as the reference light, a data processing circuit for calculating at least one of an amount of change of an amplitude and an amount of change of a phase of the measured light, based on the in-phase signal component and the quadrature-phase signal component, and an optical time gate processing portion or an electric time gate processing portion provided on a route extending from the optical branch element to the data processing circuit, for extracting at least one of split lights of the measured light every predetermined bit time while shifting a timing, wherein changes of amplitude/phase distributions in time are measured. | 01-08-2009 |
| 20090033944 | Coded polarization-dependent interferometry - An apparatus and a method of polarization dependent analyzation of an optical signal transmitted through a DUT includes splitting the optical signal into a first signal part having an initial first polarization and a second signal part having an initial second polarization, coding the first signal part using a first code and coding the second signal part using a second code, providing the coded signal parts to the DUT, detecting a DUT-signal coming from the DUT in response to the coded signal parts, and determining a first part of the DUT-signal corresponding to the first signal part by means of the first code and determining a second part of the DUT-signal corresponding to the second signal part by means of the second code. | 02-05-2009 |
| 20090040527 | Method and apparatus for speckle noise reduction in electromagnetic interference detection - Interference measurements obtained by comparison of a same beam (i.e. same nominal polarization, intensity, coherence length and wavelength) striking a same region on a sample at a same angle, but having a different beam wavefront upon intersection with the region are shown to provide images with independent coherent speckle noise patterns. Accordingly a plurality of interference measurements with diverse beam wavefronts can be used to identify or reduce coherent speckle noise. Reduction of the coherent speckle noise can be performed by compounding the aligned images. A change in the beam wavefront may be provided by displacing the sample in the direction of the beam between or during the measurements, when the beam is a focused beam (i.e. converging or diverging). | 02-12-2009 |
| 20090079991 | Optical Characteristic Measuring Apparatus - An optical characteristic measuring apparatus includes: a light source section which sweeps wavelengths of a first input light and a second input light respectively, frequencies of the first and second input lights being different from each other and polarized states of the first and second input lights being perpendicular to each other, and outputs the first and second input light; an interference section which inputs one branched light of the first and second input lights to a measuring object, makes output light from the measuring object interfere with other branched light of the first and second input lights, and outputs a plurality of interference lights; a plurality of light receiving sections which are respectively provided for the interference lights, receives the interference lights respectively, and outputs signals in accordance with optical powers of the interference lights respectively; and a low-pass filter for filtering the outputted signals. | 03-26-2009 |
| 20090086215 | Polarization-Multiplexed Multilevel Differential Phase Shift Keyed Signal Detector - An apparatus and method for detecting a PMUX multilevel DPSK signal having at least two polarization components with equal symbol periods, which comprises utilizing two polarization-independent Optical Delay Interferometers (ODIs), detecting the four outputs of the two ODIs with two balanced detectors, and digitizing the two detected electronic signals at a sampling rate of twice the symbol rate of the said polarization component signals. | 04-02-2009 |
| 20090109442 | Interferometer with Double Polarizing Beam Splitter - An interferometer has a first reflective surface having a nominal orientation; a second reflective surface having a nominal orientation orthogonal to the nominal orientation of the first reflective surface; a retroreflector facing the first reflective surface; a double polarizing beam splitter (DPBS) between the first reflective surface and the retroreflector; and a respective quarter-wave plate between the DPBS and each of the reflective surfaces. The DPBS has first and second beam-splitting surfaces each having a nominal orientation with respect to the first reflective surface. At least part of at least one of the first reflective surface, the second reflective surface and the beam-splitting surfaces is effectively tilted relative to the respective nominal orientation of such surface, and constitutes a respective tilted surface. | 04-30-2009 |
| 20090251707 | Method and Apparatus for Phase Sensitive Surface Plasmon Resonance - There is disclosed a phase sensitive surface plasmon resonance sensing apparatus wherein a testing beam may be reflected from a sensing surface at a plurality of angles. There are also disclosed methods for surface plasmon resonance sensing. | 10-08-2009 |
| 20090290166 | Adjustable Interferometer for Laser Ultrasonic Measurement - An interferometer includes a cavity including a pair of mirrors defining a cavity length. An input beam and a counter-propagating reference beam are directed into the cavity. The interferometer generates a feedback control signal and an ultrasound signal for optimal performance and measurement of a target, respectively. | 11-26-2009 |
| 20100027027 | Jones phase microscopy of transparent samples - Methods for displaying anisotropic properties of an object. The object is illuminated with a first test beam characterized by a first polarization that, after traversing the object, is combined with a reference beam. The combined light of the first transmitted test beam and the reference beam is analyzed by a first pair of polarization analyzers, and interference created between the first transmitted test beam and the reference beam as analyzed by the first pair of analyzers is detected to derive intensity, phase and polarization of the first transmitted test beam. The same is then done with a second test beam that has a polarization with a component orthogonal to the first polarization. Based on the two analyzed beams, complex elements of a Jones matrix associated with the object in a local coordinate system are determined and a plurality of tangible images are displayed that characterize the object based on the complex elements of the Jones matrix. | 02-04-2010 |
| 20100053633 | Interferometer using polarization modulation - The invention relates to an interferometer, comprising a light source, adapted to generate a coherent light beam, a detector adapted to analyze the phase difference of optical light beams, location means for locating an object to be measured, a first optical path from the light source to the object and a second optical path from the object to the detector, wherein the first and the second optical path have a common section adjacent to the object, wherein an optical polarization modulator has been arranged in the first path. | 03-04-2010 |
| 20100091294 | METHOD OF AND APPARATUS FOR MEASURING ELECTRIC FIELD VECTOR AND MICROSCOPE USING SAME - A system for measuring an electric field vector includes an optical extractor configured to extract an optical signal having a spatial resolution of a nanometer level. The optical signal corresponds to incident light at a measuring position within an examination area of a surface of a specimen. The system further includes a polarization analyzer for analyzing a polarization characteristic of the optical signal extracted by the optical extractor, and an electric field vector determinator for determining at least a size and an orientation axis of an electric vector at the measuring position using the polarization characteristic analyzed by the polarization analyzer. | 04-15-2010 |
| 20100157310 | OPTICAL SYSTEM FOR CREATING INTERFERENCE BETWEEN PHOTONS - An optical system including: a photon source; first directing elements configured to direct photons to follow a first path through the optical system; second directing elements configured to direct photons to follow a second path through the optical system, wherein the second path is the reverse of the first path, photons travelling through the first path having a different polarization to those travelling through the second path; and a mechanism varying the relative phase shift between photons following the first path and photons following the second path. | 06-24-2010 |
| 20100182609 | METHOD AND APPARATUS FOR LOCALIZED POLARIZATION SENSITIVE IMAGING - Embodiments include apparatuses and methods for spectral domain polarization sensitive optical coherence tomography including a reference assembly for detection of the polarization sensitive spectral interferograms formed by vertically and horizontally polarized beam components. Interference signals between the reference and sample beams may be modulated at a constant frequency. | 07-22-2010 |
| 20100245837 | POLARIZATION INTERFEROMETER, OPTICAL MODULE, AND OPTICAL RECEIVER - A interferometer includes a first splitter for splitting one of a signal and a reference lights into a first and a second branch lights; a second splitter for splitting the other of a signal and a reference lights into a third and a fourth branch lights; a first coupler for causing the first and the third branch lights to interfere with each other, and outputting a first detection light; a second coupler for causing the second and the fourth branch light to interfere with each other, and outputting a second detection light; a first polarization phase controller provided between the first beam splitter and the first coupler, and outputting the phase-controlled polarization components of the first branch light; and a second polarization phase controller provided between the second beam splitter and the second coupler, and outputting the phase-controlled polarization components of the fourth branch light. | 09-30-2010 |
| 20100277743 | PHOTOREFRACTIVE INTERFEROMETER - A method of coupling optical energy comprising: generating a first beam of optical energy; generating a second beam of optical energy coherent with the first beam; polarizing optical energy from the first and second beams in a same direction; and transmitting the polarized optical energy from the first and second beams into a photorefractive body so that the energy interferes in the body to generate an interference pattern that is extant in substantially all the volume of the body. | 11-04-2010 |
| 20100328674 | HIGH-RESOLUTION SURFACE PLASMON MICROSCOPE WITH HETERODYNE INTERFEROMETRY IN RADIAL POLARIZATION MODE - The present invention relates to a high-resolution scanning surface-plasmon microscope including a source (LG) of coherent light and a medium for coupling and confining a surface plasmon including an objective (O, O | 12-30-2010 |
| 20110019200 | APPARATUS FOR VISUAL INSPECTION - An apparatus is provided which reduces the dependency of the direction of polarization on channels of an image sensor so as to improve the sensitivity of inspection. In the apparatus, the direction of an illumination beam incident on a polarizing beam splitter is made to be substantially parallel to the longitudinal direction of a field of view of an image sensor projected on the polarizing beam splitter. | 01-27-2011 |
| 20110032532 | QUANTUM ENTANGLEMENT GENERATING SYSTEM AND METHOD, AND QUANTUM ENTANGLEMENT GENERATING AND DETECTING SYSTEM AND METHOD - A quantum entanglement generating system ( | 02-10-2011 |
| 20110037986 | INTERFERENCE MEASURING APPARATUS AND MEASURING METHOD THEREOF - The present invention discloses an interference measuring apparatus, which comprises a light source module, a beam splitter, a first lens module, a reflecting module, a second lens module, and a detection device. A light beam generated from the light source module can be projected on the beam splitter. The beam splitter splits the light beam to generate a first light beam and a second light beam, wherein the first light beam passes through the first lens module and then projects onto the reflecting module, and the second light beam passes through the second lens module and projects onto an object. Furthermore, the first light beam and the second light beam are reflected by the reflecting module and the object, respectively, then both the first light beam and the second light beam are leaded to the detection device to form an interference pattern for obtaining the contours and internal cross-sectional image of the object. | 02-17-2011 |
| 20110063621 | PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD - According to one embodiment, a pattern inspection apparatus includes a light source, a beam splitter, a first optical system, a second optical system, a controller, a phase controller and a detector. The beam splitter splits an emitted light into first and second optical paths. The first optical system delivers the light to a first pattern and delivers a first reflected light from the first pattern. The second optical system delivers the light to a second pattern and delivers a second reflected light from the second pattern. The controller is provided on the optical path, and intensities of the first and second reflected lights are substantially equal. The phase controller is provided on the optical path, and phases of the first and second reflected lights are inverted. In addition, the detector detects a light that the first and second reflected lights are made to interfere with each other. | 03-17-2011 |
| 20110075153 | Compact isolated analysis system - A compact OCT-like scanning device reduces radiation back-propagating to the radiation source by means of a polarized optical element that is reflective for linearly polarized light or radiation at one orientation and which is transmissive for radiation orthogonal to the reflected linearly polarized light or radiation. The device is also compatible with viewing the surface of the target being scanned either directly by visual means or by means of a camera. | 03-31-2011 |
| 20110096337 | ADAPTIVE OPTICS APPARATUS AND IMAGING APPARATUS INCLUDING THE SAME - An adaptive optics apparatus includes a light modulation unit configured to modulate each of two polarization components of light at a position that is optically conjugate to an object, the light being emitted by a light source; and an irradiation unit configured to irradiate the object with light that is modulated by the light modulation unit. | 04-28-2011 |
| 20110096338 | Delay interferometer using magneto-optic effect - A delay interferometer includes first and second optical paths into which incident signal light is split, a first converter including one or more conversion parts to convert the signal light on the first optical path into circularly polarized light and to convert the circularly polarized light into linearly polarized signal light, a phase adjuster to shift an optical phase of the circularly polarized light through a magneto-optic effect, and a second converter to convert a polarization state of the signal light on the second optical path into substantially the same polarization state as a polarization state of the linearly polarized signal light. | 04-28-2011 |
| 20110170114 | METHOD OF CONTROLLING A TRANSFORMATION PROCESS OF CHARGE MATERIAL TO A PRODUCT - A method for controlling a transformation process in which the conversion of charge materials to a product takes place along a transformation interface from the crystal and/or grain and/or phase and/or pore surface into the charge material, wherein one or more chemical elements in the charge materials is released and/or incorporated and/or rearranged and wherein the conversion of the charge materials takes place along advancing transformation interfaces. The charge materials are identified on the basis of at least one optical, in particular microscopic, analysis with respect to their phases and/or phase components and/or their phase morphology, structure, texture and/or their chemical composition. On the basis of these variables, reference functions for the charge materials, which describe the conversion of the charge materials in the process, are assigned and used for establishing the process parameters of the transformation process. | 07-14-2011 |
| 20110292401 | Apparatus and method for optical interrogation - An interrogation apparatus and method use a partial shear optical interference apparatus to interrogate the optical properties of an array of target specimen probe volumes as compared to an array of reference sample probe volumes. The apparatus produces a formatted probe beam that contains a partially sheared probe beam pair that is formatted into an array of completely sheared probe beam pairs. Target specimen probe volumes and reference sample probe volumes are suitably organized and exposed to the array of completely sheared probe beam pairs. | 12-01-2011 |
| 20110299090 | REAL-TIME INTERFEROMETER - A detour unit splits a light beam from a light source unit into first and second beams and makes the first beam travel longer than the second beam by a predetermined optical distance, and then combines the first and second beams into a single combined light beam. In the detour unit, a first λ/2 plate is disposed on an optical path of the first beam. A second μ/2 plate is disposed on an optical path of the second beam. Directions of optical axes of the first and second λ/2 plates are different from each other by 45 degrees. A λ/4 plate is disposed on an optical path between the detour unit and a beam expanding unit. Thereby, the first and second beams are converted into two circularly polarized beams having opposite rotation directions, respectively. | 12-08-2011 |
| 20120099113 | SYSTEM AND METHOD FOR PROVIDING FULL JONES MATRIX-BASED ANALYSIS TO DETERMINE NON-DEPOLARIZING POLARIZATION PARAMETERS USING OPTICAL FREQUENCY DOMAIN IMAGING - Exemplary embodiments of apparatus, methods and systems according to the present disclosure can be provided for optical frequency domain imaging (e.g., partially fiber-based) to obtain information associated with an anatomical structure or a sample. For example, it is possible to provide at least one first electro-magnetic radiation, where a frequency of radiation associated with the first electro-magnetic radiation(s) varies over time. In addition, it is possible to separate at least one portion of a radiation which is (i) the first electro-magnetic radiation(s) and/or (ii) at least one further radiation into second and third radiations having difference orthogonal states, and to apply at least one first characteristic to the second radiation and at least one second characteristic to at least one third radiation. The first and second characteristics can be different from one another. | 04-26-2012 |
| 20120140239 | METHOD FOR MONITORING THIN FILM DEPOSITION USING DYNAMIC INTERFEROMETER - A method for real-time monitoring thin film deposition using a dynamic interferometer is revealed. An optical monitoring extracting the temporal phase change of the reflection coefficient of the deposition film stacks. The dynamic interferometer, which gets rid of the influence of vibration and air turbulence, was used in the method to directly detect fluctuating phase of a deposition film stack. Combing with the reflectance or transmittance measurements, the real-time reflection coefficient under normal incidence of monitoring light can be found as well as optical admittance for enhancing the error compensation of the thin film deposition. | 06-07-2012 |
| 20120176622 | WHITE LIGHT SAGNAC INTERFEROMETER POLARIMETERS - Snapshot imaging polarimeters comprise Sagnac interferometers that include diffraction gratings situated to produce shear between counter-propagating optical fluxes produced by a polarizing beam splitter. The counter-propagating, sheared optical fluxes are focused onto a focal plane array to produce fringe patterns. The fringe patterns correspond to a scene polarization distribution modulated onto a spatial carrier frequency associated with a diffraction order. Multi-blazed gratings can be used so that modulations at a plurality of spatial frequencies are produced, with each spatial frequency corresponding to a spectral component of an input optical flux. Modulated fringe patterns can be demodulated to obtain scene Stokes parameter distributions. | 07-12-2012 |
| 20120224183 | INTERFEROMETRIC METROLOGY OF SURFACES, FILMS AND UNDERRESOLVED STRUCTURES - An interferometry method for determining information about a test object includes directing test light to the test object positioned at a plane, wherein one or more properties of the test light vary over a range of incidence angles at the plane, the properties of the test light being selected from the group consisting of the spectral content, intensity, and polarization state; subsequently combining the test light with reference light to form an interference pattern on a multi-element detector so that different regions of the detector correspond to different angles of the test light emerging from the test object, wherein the test and reference light are derived from a common source; monitoring the interference pattern using the multi-element detector while varying an optical path difference between the test light and the reference light; determining the information about the test object based on the monitored interference pattern. | 09-06-2012 |
| 20120224184 | OPTICAL DETECTOR FOR DETECTING OPTICAL SIGNAL BEAMS, METHOD TO DETECT OPTICAL SIGNALS, AND USE OF AN OPTICAL DETECTOR TO DETECT OPTICAL SIGNALS - An optical detector for detecting an optical signal beam (OSB) modulated in a way that it includes an in-phase and/or a quadrature component, includes: a polarisation beam splitter arranged to split the OSB into two polarised OSBs; a non-polarisation beam splitter arranged to further split each of the two polarised OSBs into two split polarised OSBs; at least one birefringent element providing a phase shift, the birefringent element being arranged in a path of at least one polarised OSB and/or in a path of at least one split polarised OSB so that an in-phase and quadrature phase offset between two split polarised OSBs originating from the same polarised OSB is formed in output signal beams; and at least two detection means arranged to receive at least one output signal beam that includes a in-phase and/or quadrature component of the OSB. | 09-06-2012 |
| 20120236315 | POLARIZATION INTERFEROMETER - An interferometer includes an optical assembly for directing an input optical field, a space-variant polarization converter, and an analyzer. The optical assembly is configured and operable to produce first and second spatially separated optical fields of incident coherent radiation of substantially the same intensity and different polarizations and to define first and second spatially separated optical paths for propagation of said first and second optical fields thereby allowing interaction between the first optical field and an element affecting a phase thereof in said first optical path. The space-variant polarization converter is accommodated in said combined path and being configured and operable to simultaneously apply space-variant polarization conversion to two beams corresponding to combined first and second optical fields having different polarizations and produce radially and azimuthally polarized beams respectively. The analyzer is located downstream of said polarization converter. | 09-20-2012 |
| 20120242999 | INTERFEROMETRIC QUASI-AUTOCOLLIMATOR - Systems and method are disclosed for measuring small angular deflections of a target using weak value amplification. A system includes a beam source, a beam splitter, a target reflecting surface, a photodetector, and a processor. The beam source generates an input beam that is split into first and second beams by the beam splitter. The first and second beams are propagated to the target reflecting surface, at least partially superimposed at the target reflecting surface, and incident to the target reflecting surface normal to the target reflecting surface. The first beam is reflected an additional even number of times during propagation to the photodetector. The second beam is reflected an additional odd number of times during propagation to the photodetector. The first and second beams interfere at the photodetector so as to produce interference patterns. The interference patterns are interpreted to measure angular deflections of the target reflecting surface. | 09-27-2012 |
| 20120250027 | Surface Wave Assisted Structures and Systems - A surface wave assisted system having an aperture layer with a surface and an aperture, and a plurality of grooves around the aperture. The plurality of grooves is configured to generate an optical transfer function at the aperture by inducing a surface wave for interfering with transmission of light of a range of spatial frequency. | 10-04-2012 |
| 20130021616 | OPTICAL APPARATUS - Provided is an optical apparatus characterized in that alight from a light source is split to a first light and a second light, and the first light is focused onto an observation object, that an optical filter having a light shielding region for high resolution is disposed in at least one optical path selected from optical paths of the first light, second light and response light from the observation object, that an interference light formed by causing interference between the response light and the reference light in polarized states different from each other is split to multiple beams, and desired amplitude information signals are obtained from the multiple beams through a phase plate and a polarization plate to increase intensity of the second light, whereby the signal to noise ratio is improved. | 01-24-2013 |
| 20130027713 | WHITE LIGHT ACHROMATIC GRATING IMAGING POLARIMETER - White-light snapshot channeled linear imaging (CLI) polarimeters include polarization gratings (PGs) configured to produce a compensated shear between portions of an input light flux in first and second polarization states. The disclosed CLI polarimeters can measure a 2-dimensional distribution of linear Stokes polarization parameters by incorporating two identical PGs placed in series along an optical axis. In some examples, CLI polarimeters are configured to produce linear (S | 01-31-2013 |
| 20130176573 | INTERFEROMETER AND METHOD FOR CONTROLLING THE COALESCENCE OF A PAIR OF PHOTONS - An interferometer for controlling the coalescence of a pair of photons, including: an optical source, which generates a first and a second pump pulse coherent with each other and shifted in time by a delay; and a first interferometric stage, which receives the first pump pulse and generates an antisymmetric state with two coalescent photons (1/√{square root over (2)}(|2 | 07-11-2013 |
| 20130265584 | Temperature-stable incoherent light source - Embodiments generally relate to a light source and methods for minimizing temperature sensitivity of a light source light source. In one embodiment a light source includes a light-emitting diode, a light beam having an optical axis, a photodetector and a polarizer. The diode is operatively configured to emit the light beam. The beam splitter, positioned to intercept the light beam, includes a first optical surface operatively configured to reflect a first portion of the light beam and to transmit a second portion of the light beam therethrough. The photodetector is positioned to capture the first portion of the light beam after reflection by the beam splitter and operatively configured to generate photocurrent proportional to an intensity of that captured first portion. The polarizer is positioned between the diode and the beam splitter, and is operatively configured to polarize the light beam along a polarization direction perpendicular to its optical axis. | 10-10-2013 |
| 20130329230 | OPTICAL SENSING DEVICES AND METHODS FOR DETECTING SAMPLES USING THE SAME - An optical sensing device including a source unit configured to generate a polychromatic light beam containing p-polarized beam and s-polarized beam; an interferometric unit configured to introduce birefringent retardation for generating optical path difference between the p-polarized beam and the s-polarized beam; a SPR sensing unit configured to receive both p-polarized beam and s-polarized beam and induce a SPR effect to the p-polarized beam associated with a target sample; and a detection unit for detecting target sample characteristics by obtaining an interference spectrum of the p-polarized beam and the s-polarized beam from the SPR sensing unit. | 12-12-2013 |
| 20130329231 | TRACKING TYPE LASER INTERFEROMETER FOR OBJECTS WITH ROTATIONAL DEGREES OF FREEDOM - A laser interferometer and a method for operating a laser interferometer perform a differential position measurement by laser interferometry of two elements while offering a rotational degree of freedom to one of the elements using a reflecting sphere as a mirror for the laser beam. The laser interferometer and method do not require the object to be aligned with the rotation axis, but instead can track the object in off-centered geometries. This is achieved by employing the pointing of the reflected beam from the sphere as a feedback signal to realign the interferometer which then has a constant beam pointing to the center of the sphere in all cases. The laser interferometer and method keep the direction of the measurement constant. The laser interferometer and method are suitable for homodyne and heterodyne types of laser interferometer technology. | 12-12-2013 |
| 20140078511 | VARIABLE POLARIZATION SEPARATION VIA BEAM SPLITTER ROTATION - An apparatus for separating polarization of light includes a rotatable beam splitter including an input for receiving light with a first polarization and an output for outputting light with a second polarization different from the first polarization. Rotation of the rotatable beam splitter changes the first polarization of the input light to the second polarization of the output light. An optical network and method are also set forth. | 03-20-2014 |
| 20140125989 | SIX-AXIS FOUR-SUBDIVIDING INTERFEROMETER - Six-axis four-subdividing interferometer comprising a six-axis light splitting system and an interference module which are sequentially arranged along the incident direction of polarization orthogonal double-frequency laser, wherein the six-axis light splitting system comprises five 45-degree plane beam splitters and four 45-degree full-reflecting minors. | 05-08-2014 |
| 20140176962 | Interferometer - An interferometer includes a light source and a beam splitter, via which the beam of rays emitted by the light source is split into a measurement beam and a reference beam. The measurement beam propagates in a measuring arm extending in a first direction between the beam splitter and a measuring reflector. The measuring reflector brings about an offset perpendicular to the direction of incidence between the measurement beam falling on it and the measurement beam reflected back by it. In a reference arm extending in a second direction, the reference beam propagates between the beam splitter and a reference reflector. In addition, the interferometer has a detector system, to which the superposed and recombined measurement beam and reference beam are able to be supplied, and via which a distance-dependent interference signal with respect to the position of the measuring reflector is able to be generated. The measuring reflector in each case includes at least one transmission grating as well as a reflector element. | 06-26-2014 |
| 20140192364 | ELLIPSOMETRY SYSTEM - An ellipsometry system and a detection unit thereof are capable of achieving miniaturization and price reduction associated therewith. The ellipsometry system includes the detection unit that: has an optical polarization element; separates an interference polarization beam obtained by causing the object-reflected polarization beam and reference reflected polarization beam to interfere with each other into a plurality of interference polarization beams on a wavelength basis; and detects the respective separated polarization components in each wavelength. The optical polarization element: has a birefringence characteristic including a first refractive index and a second refractive index; receives the separated interference polarization beams of the respective wavelengths in a wavelength order and in a parallel manner; separates the separated interference polarization beam of each wavelength, on a polarization component basis, while transmitting the same, and outputs the respective separated polarization components in each wavelength in the same direction but along different optical axes. | 07-10-2014 |
| 20140218747 | CHIP-SCALE INTERFEROMETRY FOR HYPERENTANGLEMENT PROCESSING - An interferometer module for quantum processing is described including a substrate having two or more input ports and two or more output ports; multiple photonic pathways embedded in the substrate for conveying photons from the two or more input ports and the two or more output ports; and one or more partial beam splitters embedded in the substrate in a photonic pathway for generating spatial and polarization entanglement. | 08-07-2014 |
| 20140285813 | WAVEFRONT SENSING APPARATUS, METHOD AND APPLICATIONS - A wavefront sensing technique using Polarization Rotation INTerferometry (PRINT) provides a self-referencing, high-resolution, direct measurement of the spatially dependent phase profile of a given optical beam. A self-referencing technique is used to create a reference beam in the orthogonal polarization and a polarization measurement to measure the spatial-dependent polarization parameters to directly determine the absolute phase profile of the beam under test. A high-resolution direct measurement of the spatially-resolved phase profile of one or more optical beams is realized. | 09-25-2014 |
| 20140347672 | APPARATUS AND METHOD FOR QUANTITIVE PHASE TOMOGRAPHY THROUGH LINEAR SCANNING WITH COHERENT AND NON-COHERENT DETECTION - The disclosed invention describes a new apparatus performing a new data acquisition for quantitative refractive index tomography. It is based on a linear scanning of the specimen, opposed to the classical approaches based on rotations of either the sample or the illumination beam, which are based on the illumination with plane waves, which orientation is successively modified in order to acquire angular information. On the contrary, the inventive apparatus and method rely on a specially shaped illumination, which provides straightforwardly an angular distribution in the illumination of the specimen. The specimen can thus be linearly scanned in the object plane in order to acquire the data set enabling tomographic reconstruction, where the different positions directly possess the information on various angles for the incoming wave vectors. | 11-27-2014 |
| 20140368831 | INTERFEROMETER USING ASYMMETRIC POLARIZATION AND OPTICAL DEVICE USING THE INTERFEROMETER - The present invention relates to an interferometer and an optical device using same. Unclear interference patterns and restrictions between light source and the interferometer for conventional devices require precise control devices. The present invention enables to control a wave plate of an interferometer to make the amplitude of object beam split by a polarization beam splitter asymmetric against that of reference beam, resulting the brightness of interference patterns adjustable, while using tunable laser as light source of an optical device and adopting frequency scanning methods to prevent restrictions between light source and interferometer. The interferometer and an optical device according to the present invention comprise: a wave plate controlling polarization direction of linearly polarized light incident to a polarization beam splitter; the polarization beam splitter; a wave plate converting polarization beam for the object beam and the reference beam to be interfered in an image pick-up device; and a polarizer. | 12-18-2014 |
| 20140376002 | Interferometer - An interferometer includes a light source, a beam splitter, a measuring reflector, a reference retroreflector, a detector system, and two transparent plane plates. The beam splitter splits a first beam of rays, emitted by the light source, into at least one measuring beam and at least one reference beam, via which a first splitting plane is defined. The measuring beam propagates in a measuring arm and the reference beam propagates in a reference arm until being recombined at a recombining location in a first recombining plane. The first recombining plane is oriented parallel to the first splitting plane. The measuring reflector, on which the measuring beam falls perpendicularly at least twice, is disposed in the measuring arm and is joined to an object to be measured that is movable along a measuring direction. The reference retroreflector, on which the reference beam falls at least once, is disposed in the reference arm. At least one first distance signal with regard to the position of the object to be measured is ascertainable via the detector system from the interfering measuring and reference beams superposed at the recombining location. The first transparent plane plate and the second transparent plane plate are disposed parallel to each other in the beam path between the light source and the detector system. The reference retroreflector is formed in the first plane plate and the beam splitter is disposed on the second plane plate. | 12-25-2014 |
| 20150062593 | POLARIZATION BASED INTERFEROMETRIC DETECTOR - A sensor and method for determining the optical properties of a sample material is disclosed. The sensor comprises a light source that generates a linearly polarized light beam having a predetermined polarization orientation with respect to the plane of incidence. The linearly polarized light beam is reflected off the sample and is split into second and third light beams where the second and third light beam consist of the combined projections of mutually orthogonal components of the first light beam. A signal processor measures the intensity difference between the second and third light beams to calculate the phase difference induced by the sample material. | 03-05-2015 |
| 20150308950 | OPTICAL SENSING APPARATUS AND A METHOD FOR DETECTING CHARACTERISTICS OF A SAMPLE - An optical sensing apparatus and a method for detecting characteristics of a sample. | 10-29-2015 |
