| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 356452000 | Having particular linear mirror drive or configuration | 18 |
| 20080252897 | Method and a System for the Assessment of Samples - The present invention offers an alternative strategy for the correlation of interference information to chemical and/or physical properties of a sample. This strategy can be implemented in a method and a system, which offer substantial technical and commercial advantages over state of the art techniques based on interference spectroscopy. The invention further provides a method for standardizing an interferometer, as well as a method and a system using the standardized | 10-16-2008 |
| 20080285044 | Devices in miniature for interferometric use and fabrication thereof - A device in miniature and fabrication of such a device for interferometric use is described, the device including a substrate with at least one deep reactive ion etching structure on at least one surface of the substrate forming an optical bench. The optical bench preferably comprises a moving stage, an actuator, one or more connector sockets and one or more optical components. | 11-20-2008 |
| 20100110441 | Microscope - A microscope comprising: a light sampler for collecting light from a measurement area of a sample; a multi-element detector having a plurality of photoelectric elements, for detecting the light collected by the light sampler, each photoelectric element corresponding to a minute measurement region in the measurement area with one-to-one correspondence; a Fourier transform spectrophotometer as a spectroscope; a data sampler for concurrently sampling intensity data sent from each photoelectric element of the multi-element detector at a timing determined by the Fourier transform spectrophotometer; and a data processor for obtaining time-resolved spectrum data for each minute measurement region according to temporally changed interference light data obtained by the data sampler. | 05-06-2010 |
| 20100284017 | Miniature Fourier Transform Spectrometer and Method of Operation - A Micro-Electro-Mechanical Systems (MEMS) interferometer is implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator. The interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a MEMS interferometer. | 11-11-2010 |
| 20110063619 | MEMS Michelson Interferometer and Method of Fabrication - An interferometer system includes an optical bench and at least two mirror structures, being patterned from one or more layers on the optical bench and erected to extend substantially perpendicularly to the bench to define two interferometer arms to provide a Micro-Electro-Mechanical Systems (MEMS) interferometer. The MEMS interferometer is further implemented in a Fourier transform spectrometer, which includes a common housing containing the interferometer and a gas cell, possibly including a preconcentrator. | 03-17-2011 |
| 20110176138 | INTERFEROMETER WITH VARIABLE OPTICAL PATH LENGTH REFERENCE MIRROR AND APPLICATIONS THEREOF - An interferometer includes a variable optical path length reference mirror to produce a final interferogram from a combination of interferograms. Each of the interferograms is generated at a different optical path length of the reference mirror. | 07-21-2011 |
| 20110181885 | Large Displacement Micro-Lamellar Grating Interferometer - A micro-lamellar grating interferometer for deriving the spectrum of an incident beam from a scene of interest from a generated interferogram is disclosed with a method for using the same. | 07-28-2011 |
| 20110194117 | MIRROR-TILT-INSENSITIVE FOURIER TRANSFORM SPECTROMETER - Methods and designs for providing reduced sensitivity to mirror tilt in Fourier transform spectrometers are disclosed. According to an embodiment for two-directional tilt compensation, the FT spectrometer can include a beam splitter positioned to receive an incoming beam from a light source and split the incoming beam into a first sub-beam and a second sub-beam, a corner-cube retroreflector positioned to receive the first sub-beam from the beam splitter, a dual reflective mirror positioned to receive the first sub-beam from the corner-cube retroreflector at one surface and the second sub-beam at the other surface. An optical path delay can be created using a set of mirrors, tilting the beam splitter and/or a glass cube. | 08-11-2011 |
| 20110199614 | Interferometer step scanning systems and methods - In some embodiments, the pathlength difference (retardation) in a step scanning infrared (IR) spectrometer interferometer is maintained under AC servomechanism (servo) control for a first period following a step change, and under DC servo control for a second period following the first period. Data is acquired during and/or after the DC servo control period. Switching off the AC servo control prior to data acquisition allows limiting the dither-frequency noise that could otherwise affect signals of interest, particularly in fast-time-scale applications such as high-speed time-resolved spectroscopy (TSR). A mirror position control circuit controls a mirror position stepping as well as switching a mirror servo control from AC to DC. | 08-18-2011 |
| 20120038927 | Light Reflection Mechanism, Optical Interferometer and Spectrometric Analyzer - Provided is an inexpensive, high performance, compact, and energy saving light reflection mechanism comprising a first moving portion having a reflecting surface on the front surface, a supporting portion which supports the first moving portion, a first beam and a translating beam which couple the first moving portion and the supporting portion in the form of cantilever beam above and below the supporting portion, and a drive portion which moves the first moving portion, wherein a large amplitude can be obtained by small energy when the first moving portion is forced into resonance vibration in the direction perpendicular to the first reflecting surface. Also provided is an optical interferometer and a spectral analyzer. | 02-16-2012 |
| 20120120404 | Flexure Mounted Moving Mirror to Reduce Vibration Noise - A novel means of provided a hybrid flexure mounted moving mirror component in an interferometer is introduced herein. In particular, a linear bearing in combination with a novel flexure mounting having novel tilt and velocity control of the moving optical component is provided. Such an arrangement enables correction of the errors at the mirror itself while also solving the problem of isolating vibration and noise caused by the imperfections in the bearing surfaces used in many conventional interferometers. Using such a coupled flexure mounting of the present invention, in addition to the above benefits, also enhances velocity control because the resultant low mass of the moving mirror assembly enables the systems disclosed herein to respond faster than conventional mirror velocity controlled interferometer instruments and with a lower velocity error so as to provide a more stable and lower noise spectra from the analytical instrument. | 05-17-2012 |
| 20140078509 | MICROELECTROMECHANICAL SYSTEM (MEMS) AND (MEM) OPTICAL INTERFEROMETER FOR HYPER-SPECTRAL IMAGING AND ANALYSIS - A microelectromechanical system (MEMS) ( | 03-20-2014 |
| 20140098371 | Fourier transform micro spectrometer based on spatially-shifted interferogram bursts - A spectrometer with improved resolution includes a spectral domain modulator having a periodic response in the spectral domain to modulate a wideband source spectrum and cause one or more shifted bursts in the interferogram. | 04-10-2014 |
| 20150355023 | System and Method of Alignment for Balanced Detection in a Spectral Domain Optical Coherence Tomography - An alignment process for a balance detecting spectral domain optical coherence tomography system. The alignment process includes comparing a spectral performance curve of a first detector array to a spectral performance curve of a second detector array to determine if the system is aligned. | 12-10-2015 |
| 20150369667 | IMAGING SPECTROMETER WITH EXTENDED RESOLUTION - Interferometric transform spectrometer (ITS) systems and methods of operation thereof. In one example, an ITS system includes a Michelson interferometer that introduces a varying optical path length difference (OPD) between its two arms so as to produce an interferogram, a detector that receives and samples the interferogram, and a scan controller coupled to the detector and to Michelson interferometer. The scan controller controls the Michelson interferometer to vary the OPD in discrete steps such that the detector provides M samples of the interferogram for each of two scan segments. In the first scan segment, the M samples have a uniform or non-uniform sample spacing and the OPD has a first maximum value. In the second scan segment, the M samples have an incrementally increasing sample spacing and the OPD has a second maximum value that is at least twice the first maximum value. | 12-24-2015 |
| 20160033675 | GRAVITY AND/OR ACCELERATION MEASUREMENTS USING DUAL INTERFEROMETER CONFIGURATIONS - An apparatus for estimating gravitational properties includes an optical source, a first interferometer including a fixed reference reflector and a first reflector coupled to a first moveable mass, a second interferometer including the fixed reference reflector and a second reflector coupled to a second moveable mass, a first detector configured to detect a first interference pattern generated by the first interferometer, and a second detector configured to detect a second interference pattern generated by the second interferometer. The first mass is configured to move a first amount in response to a change in gravitational force, and the second mass is configured to move a second amount in response to a change in gravitational force, the second amount being smaller than the first amount. The apparatus also includes a processor configured to estimate the change in gravitational force based on a combination of the first and second interference patterns. | 02-04-2016 |
| 20160084712 | Linear-Motion Stage - A linear-motion stage that is angularly or radially symmetric or asymmetric, or monolithic may be used as the moving mechanism in a Fourier transform spectrometer. In embodiments, a linear-motion stage includes a base; a first multiple-arm linkage extending from the base to a first carriage attachment piece; and a second multiple-arm linkage extending from the first carriage attachment piece to the base. The first multiple-arm linkage constrains a motion of the first carriage attachment piece to motion in a first plane and the second multiple-arm linkage constrains the first carriage attachment piece to motion in a second plane, the first and second planes intersecting at a plane intersection line. The first and second multiple-arm linkages constrain the motion of the first carriage attachment piece along a carriage motion line. | 03-24-2016 |
| 20160131528 | INTERFEROMETER, SPECTROPHOTOMETER USING INTERFEROMETER AND CONTROL METHOD FOR INTERFEROMETER - The present invention provides an interferometer and the like, that is capable of ensuring the speed stability of the movable mirror while achieving the speed up of the reciprocal movement of the moving mirror and suppressing the increment of the maximum instantaneous thrust force required for the turning back as much as possible. The interferometer includes a moving mirror, a movement mechanism for reciprocating the moving mirror, a movement control part for controlling the movement mechanism and allowing the moving mirror to be reciprocated at a constant speed, and a measurement part for measuring a position of the moving mirror. The movement control part is adapted to receive target position data indicating a target position of the moving mirror, and control the movement mechanism to bring the measurement position of the moving mirror measured by the measurement part close to the target position indicated by the target position data. | 05-12-2016 |
