| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 356043000 | OPTICAL PYROMETERS | 17 |
| 20090153837 | OPTICAL POWER MONITOR BASED ON THERMO-CHROMIC MATERIAL - This invention relates to an optical power monitor based on thermo-chromic material. The incident light produces a temperature change in the thermo-chromic material, causing a change in its color which is utilized to monitor the power level of the incident light. | 06-18-2009 |
| 20090251684 | OPTICAL TRANSMISSION MODULE, WAVELENGTH MONITOR, AND WAVELENGTH DRIFT DETECTION METHOD - To detect a wavelength drift of laser light with no error, an optical transmission module ( | 10-08-2009 |
| 20110069301 | METHOD AND DEVICE FOR SINTERING AN OBJECT WHILE DETERMINING THE GEOMETRIC SURFACE PROFILE OF THE OBJECT - The invention relates to a method and a device for sintering objects by means of time-resolved detection of two- or three-dimensional surface profiles and, optionally, by means of temperature measurement in a high temperature furnace on the basis of optical measurement methods. During sintering, each surface point on an object can be measured for its position and, optionally, its temperature, and a change can be determined by successive measurements. The measured change additionally permits control of the sintering regime. | 03-24-2011 |
| 20120026482 | Use of fiber optic sensor techniques for monitoring and diagnostics of large AC generators - A method for monitoring the operating conditions of an electric generator including the entire stator core and all winding components for conditions of mechanical strain and temperature throughout the machine by means of distributive fiber optic sensors based on both Rayleigh back scattering techniques and Brillouin frequency shift fiber optic sensor analysis both of which do not have the gaps and limitations associated with standard fiber Bragg grating fiber optic point sensors, by virtue of the fact that both Rayleigh and Brillouin scans and allow accurate strain and temperature determinations at all points along standard fiber optic cables of considerable length, approximately two kilometers in the case of the Brillouin, which effectively yields many tens of thousands of sensors throughout the entire standard fiber optic cable. Raman distributive temperature sensing also has a limited application. Single mode and polarizing maintaining fibers can both be analyzed and read with any Rayleigh or Brillouin distributive fiber optic sensor laser system allowing great flexibility in sensor spatial resolution, total sensed length, resolution and other factors not possible with conventional fiber Bragg gratings. A sealed fiber collection box located outside the electric generator permits enhanced reliability and reconfiguration into any number of desirable fiber layouts necessary for specific static and dynamic measurements in an optimal manner. | 02-02-2012 |
| 20120105826 | High Sampling Resolution DTS System and Method - A method of improving sampling resolution in a distributed temperature measurement system using a fiber optic distributed sensor by means of programmed delayed trigger signals to a laser light source in order to improve the spatial resolution of such systems. | 05-03-2012 |
| 20120212728 | MEASURING DEVICE FOR MEASUREMENT OF PARAMETERS IN MOLTEN MASSES - A measuring device is provided for measurement of parameters, in particular for measuring the temperature, in molten masses, in particular in molten metal or molten cryolite masses having a melting point above 500° C. The measuring device has an optical fiber for receiving radiation from the molten mass and a cable reel having an external circumference for winding up the optical fiber and an internal space surrounded by the external circumference. A distributor and a mode filter for the optical fiber are arranged in the internal space. | 08-23-2012 |
| 20120307233 | HEATED WAFER CARRIER PROFILING - A method for characterizing a surface comprises rotating a carrier about an axis of rotation where the carrier has a top surface adapted to hold at least one semiconductor wafer with a major surface of the wafer extending generally transverse to the axis of rotation. A surface characterization tool is moved over a plurality of positions relative to the top surface of the carrier, where a measurement location over the top surface of the carrier is changed while said top surface of the carrier is heated to a predetermined temperature. Characterization signals over the plurality of positions with the surface characterization tool are produced and contain information about the heated top surface of the carrier, or when semiconductor wafers are held on the carrier, information about the semiconductor wafer can also be obtained. | 12-06-2012 |
| 20120327393 | TEMPERATURE MEASURING APPARATUS, SUBSTRATE PROCESSING APPARATUS AND TEMPERATURE MEASURING METHOD - The temperature measuring apparatus includes a data input portion, a peak interval calculation portion, an optical path length calculation portion, and a temperature calculation portion. The data input portion inputs a spectrum of interference light that is obtained when measuring light is irradiated onto a surface of the object and the measuring light reflected from the surface and the measuring light reflected from a rear surface interfere with each other. The peak interval calculation portion calculates a peak interval of the input spectrum. The optical path length calculation portion calculates an optical path length based on the peak interval. The temperature calculation portion calculates the temperature of the object based on the optical path length. | 12-27-2012 |
| 20120327394 | TEMPERATURE MEASURING SYSTEM, SUBSTRATE PROCESSING APPARATUS AND TEMPERATURE MEASURING METHOD - The temperature measuring system using optical interference includes a light source which generates measuring light; a spectroscope which measures an interference intensity distribution that is an intensity distribution of reflected light; optical transfer mechanisms which emit light reflected from a surface and a rear surface of the object to be measured to the spectroscope; an optical path length calculation unit which calculates an optical path length by performing Fourier transformation; and a temperature calculation unit which calculates a temperature of the object to be measured on the basis of a relation between optical path lengths and temperatures. The light source has a half-value and half-width of a light source spectrum that satisfies conditions based on a wavelength span of the spectroscope. The spectroscope measures the intensity distribution by using the number of samplings that satisfies conditions based on the wavelength span and a maximum measurable thickness. | 12-27-2012 |
| 20130120737 | APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STRUCTURES VIA LASER DIFFRACTION - Embodiments of the present invention generally relate to apparatus for and methods of measuring and monitoring the temperature of a substrate having a | 05-16-2013 |
| 20150092186 | AMBIENT LIGHT DETECTION AND DATA PROCESSING - A method, apparatus, and a computer program is provided. The method comprises: determining an ambient light value from ambient light data provided by at least one ambient light sensor, in dependence upon the spectral distribution of the ambient light data provided by the at least one ambient light sensor and a manufacturer of the at least one ambient light sensor. | 04-02-2015 |
| 20150124244 | EMISSIVITY INDEPENDENT OPTICAL PYROMETER - Disclosed herein are representative embodiments of methods, apparatus, and systems for determining the temperature of an object using an optical pyrometer. Certain embodiments of the disclosed technology allow for making optical temperature measurements that are independent of the surface emissivity of the object being sensed. In one of the exemplary embodiments disclosed herein, a plurality of spectral radiance measurements at a plurality of wavelengths is received from a surface of an object being measured. The plurality of the spectral radiance measurements is fit to a scaled version of a black body curve, the fitting comprising determining a temperature of the scaled version of the black body curve. The temperature is then output. The present disclosure is not to be construed as limiting and is instead directed toward all novel and nonobvious features and aspects of the various disclosed embodiments, alone or in various combinations and subcombinations with one another. | 05-07-2015 |
| 20160097680 | EQUIPMENT AND METHOD FOR ADVANCED IMAGING BURNER CONTROL PROCESS - A process is provided for diagnosing conditions of a combustion process in an enclosure is provided, and includes steps of: capturing images of selected regions of the enclosure using a plurality of image-capturing devices connected to the enclosure; receiving a plurality of signals representing the conditions of the combustion process from at least one sensor associated with the enclosure; estimating a three-dimensional (3D) radiance or temperature field of the combustion process in the selected regions; evaluating the captured images, the plurality of signals, and the 3D radiance or temperature field for analyzing the conditions of the combustion process at a predetermined interval; and adjusting at least one furnace parameter based on the evaluation of the images, the plurality of signals, and the 3D radiance or temperature field for controlling the conditions of the combustion process in the enclosure. | 04-07-2016 |
| 20160146671 | PYROMETRIC DETECTION DEVICE, METHOD FOR CALIBRATING THE SAME, AND APPARATUS FOR PRODUCING THREE-DIMENSIONAL WORK PIECES - A pyrometric detection device for use in an apparatus for producing three-dimensional work pieces comprises a pyrometric detecting unit ( | 05-26-2016 |
| 20160178440 | MANAGEMENT SYSTEM | 06-23-2016 |
| 356045000 | Plural color responsive | 2 |
| 20100128254 | Sensing Temperature Of A Light Emitting Diode | 05-27-2010 |
| 20120092646 | GAS SENSOR UTILIZING BANDPASS FILTERS TO MEASURE TEMPERATURE OF AN EMITTER - The invention relates to a sensor having a filter arrangement, downstream of which there is arranged a detector arrangement, and an evaluating device which is connected to the detector arrangement, the filter arrangement has at least a first filter, the suspect filter, which is configured as a band pass filter allowing the passage of a first predetermined band, the suspect band, at least one second filter, the reference filter(s), which is configured as band pass filters allowing the passage of a second predetermined band(s), the reference band(s), and where the detector arrangement has at least one detector associated with the at least one of the filters. The sensor uses the band pass filters to measure the temperature of an emitting source. The sensor with advantage could be utilized within the IR band, and could advantageously be used to detect CO | 04-19-2012 |
