| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 348131000 | With specific illumination detail | 33 |
| 20100295939 | TABLE GAUGE - A high resolution imaging system and method for using it. More specifically, the present invention relates to an imaging system including an imaging apparatus, a processor and a various features to minimize reflected and ambient light producing consistent, high fidelity images to facilitate high resolution imaging. The system may be used for material inspection and may be particularly beneficial for enlarging an image of an object, determining the geometry or morphology of an object surface, or enabling precise measurement of a feature of an object. | 11-25-2010 |
| 20110007149 | Machine For Inspecting Glass Containers At An Inspection Station Using An Addition Of A Plurality Of Illuminations Of Reflected Light - A machine for inspecting glass containers which are being rotated at an inspection station. A light source illuminates a selected area on a rotating glass container while the container rotates through a selected angle and a camera is triggered to capture an image while the bottle rotates through that angle. A plurality of sequential images are recorded and a critical addition is made to be inspected. | 01-13-2011 |
| 20110149066 | METHOD AND SYSTEM FOR EVALUATING LIGHT UNIFORMITY THROUGH AN OPTICAL LENS - A system for evaluating light uniformity through an optical lens includes an operating platform, an image processing device and a processor. The operating platform includes a mount and a holder. The mount is configured for mounting the image processing device. The holder is configured for holding the optical lens. The image processing device is configured for capturing an image of a light spot corresponding to the optical lens. The processor is electrically coupled to the image processing device. The mount is shifted back and forth along the direction towards and away from the holder for adjusting the size of the light spot of the optical lens. The processor is configured for calculating the light uniformity through the optical lens according to a minimal light spot image from the image processing device. | 06-23-2011 |
| 20110187849 | DETECTION APPARATUS FO PARICLE ON THE GLASS - The present invention relates to an apparatus for detecting particles on a flat glass, which detects particles adhered to the flat glass having both sides such as a surface A and a surface B, comprising: a surface A laser light irradiating device for irradiating laser light of a first wavelength polarized in a direction S at a first angle based on a surface A normal vector toward the surface A in an upper part of the surface A of the flat glass; a surface A photographing device for taking a picture of a point where the laser light irradiated by the surface A laser light irradiating device is irradiated on the surface A of the flat glass; a surface B laser light irradiating device for irradiating laser light of a second wavelength toward the surface A at a second angle smaller than the first angle based on the surface A normal vector in the upper part of the surface A of the flat glass, and wherein the irradiated laser light is mostly transmitted in thickness direction of the flat glass; a surface B photographing device for taking a picture of a point where the laser light irradiated by the surface B laser light irradiating device is irradiated on the surface B of the flat glass; and a detection signal processor for analyzing video images inputted from the surface A photographing device and the surface B photographing device, and deciding from which photographing device the particles are more clearly outputted, to decide on a surface to which the particles adhere. | 08-04-2011 |
| 20110267454 | METHOD AND A DEVICE FOR DETECTING CRACKS IN AN OBJECT - A method for detecting cracks in an object includes treating an object with a fluorescent agent, illuminating the object, and recording fluorescence from the illuminated object by means of an image-recording unit. An image of the object obtained by means of the image-recording unit is digitized and analyzed automatically with regard to the color content in the image in order to detect any cracks in the object. | 11-03-2011 |
| 20120002039 | DOCKABLE BACKLIGHT - A machine vision system includes a table having a fixture for supporting an object under inspection above the table, a gantry supporting a camera further above the table, a docking station, and a profile light movable together with the gantry between an inspection position beneath the object and a docking position next to the docking station. Fittings are provided for releasably securing the profile light to the gantry and for releasably securing the profile light to the docking station. The profile light can be disengaged from the gantry and engaged with the docking station for moving the profile light to the docking position or disengaged from the docking station and reengaged with the gantry for moving the profile light to the inspection position. | 01-05-2012 |
| 20120044346 | APPARATUS AND METHOD FOR INSPECTING INTERNAL DEFECT OF SUBSTRATE - An apparatus inspects internal defects of substrate, the substrate having an upper surface and a plurality of side surfaces connected with the upper surface. The apparatus includes at least one light source arranged on one of the side surfaces of the substrate and emitting a light beam on the corresponding side surface and into the substrate, the incident angle of the light beam is limited to a first predetermined angle within a range allowing the light beam to transmit in a total internal reflection manner in the substrate; an image capturing module arranged above the substrate to capture the image of the upper surface of the substrate, a light shield mask arranged between the image capturing module and the substrate and shielding an edge portion of the upper surface of the substrate. | 02-23-2012 |
| 20120224051 | MASK INSPECTION METHOD AND MASK INSPECTION APPARATUS - According to one embodiment, a method of inspecting a defect of a semiconductor exposure mask by using an optical system, which is configured to acquire an image by an imaging module by making light of an arbitrary wavelength incident on the semiconductor exposure mask, includes acquiring a control condition for elongating a point image acquired by the optical system in a read-out direction of the imaging module, acquiring an image of a desired area of the mask under the control condition, and determining, when a peak signal with a signal intensity which is a first threshold or more. | 09-06-2012 |
| 20120249779 | APPARATUS FOR INSPECTING LIGHT EMITTING DIODE AND INSPECTING METHOD USING SAID APPARATUS - A light emitting diode (LED) inspection apparatus includes at least one LED including a phosphor applied on an emission surface, a first lighting unit to emit visible light to the LED, a second lighting unit to emit ultraviolet (UV) light to the LED, a photographing unit to generate at least one first image data by photographing the visible light reflected from the LED and to generate at least one second image data by photographing the UV light reflected from the LED, and a determination unit to determine a defect in appearance and emission characteristics of the LED using the at least one first image data and second image data. | 10-04-2012 |
| 20120249780 | SUBJECT DISCRIMINATING APPARATUS AND COIN DISCRIMINATING APPARATUS - A subject discriminating apparatus discriminates a subject having an unevenness pattern on a surface of the subject. The subject discriminating apparatus includes: a transparent unit including a supporting surface supporting the subject; a light irradiation unit irradiating illumination light onto the surface of the subject through the transparent unit; an imaging unit imaging an imaging region including at least a part of the transparent unit, and generating image data; and a discrimination processing unit discriminating the subject, using the image data generated by the imaging unit. The discrimination processing unit discriminates the subject based on discrimination image data generated by correcting subject image data using correction image data. The subject image data is generated by imaging the imaging region in a state of the subject presenting in the imaging region. The correction image data is generated by imaging the imaging region free from the subject in the imaging region. | 10-04-2012 |
| 20120307045 | SUBSTRATE INSPECTION APPARATUS AND METHOD FOR OPERATING THE SAME - In one embodiment, a substrate inspection apparatus performs, in its maintenance mode, operations including: guiding a light emitted from an illuminating unit to an imaging device via a light-guiding member disposed in a casing; judging whether or not a level of a brightness signal obtained by the imaging device falls within a predetermined allowable range when a light emitted from the illuminating unit falls on the imaging device via the light-guiding member; and alarming, if it is judged that the value of the brightness signal is out of the predetermined allowable range, that replacement of the illuminating unit is required. | 12-06-2012 |
| 20120327217 | DEFECT INSPECTING APPARATUS - A defect inspecting apparatus includes a first light source, a first image capture device that receives the reflection light emitted from the first light source and reflected by the outer peripheral surface of a lip part to grab the image of the outer peripheral surface of the lip part, a second light source, a second image capture device | 12-27-2012 |
| 20130010104 | VISUAL INSPECTOR FOR INSPECTING FLAT PANEL DISPLAY DEVICE AND VISUAL INSPECTING METHOD USING THE SAME - A visual inspector for inspecting a flat panel display device and a visual inspecting method using the same are disclosed. The visual inspector includes an inspection unit including a base frame and a loading stage rotatably coupled to the base frame to load a display panel on a front side thereof and to transmit a light to the flat panel device; a reflective illumination unit installed in the upper space of the inspection unit to illuminate the display panel loaded on the front side of the loading stage; and a transparent illumination unit coupled to the rear side of the loading stage of the inspection unit to illuminate the display panel loaded on the front side of the loading stage. | 01-10-2013 |
| 20130169795 | ILLUMINATION SYSTEM, ILLUMINATION METHOD, AND INSPECTION SYSTEM - An illumination system includes a first illumination unit which uses an amount of illumination light in accordance with a set amount of light to illuminate an illuminated object, a second illumination unit which has a response to switching of the set amount of light better than said first illumination unit and which uses illumination light which is superposed on the illumination light from said first illumination unit to illuminate said illuminated object, and an illumination controller which controls the amount of illumination light of said second illumination unit by switching the set amount of light in accordance with the control information while maintaining the amount of illumination light of said first illumination unit at a predetermined amount. | 07-04-2013 |
| 20130265415 | TERAHERTZ IMAGING DEVICE, AND METHOD OF ELIMINATING INTERFERENCE PATTERNS FROM TERAHERTZ IMAGE - A sample is irradiated with terahertz light from a light source, so that an image (G1) is generated by capturing an image of a region (R1) including a point (S) of the sample, and an image (G2) is generated by capturing an image of a region (R2) including the point (S) and separated from the region (R1) by a distance (L). A single image (V) is generated by applying a predetermined binary operation to the images (G1) and (G2). | 10-10-2013 |
| 20130286191 | INSPECTION APPARATUS - In a defect inspecting apparatus, the strength of a fatal defect signal decreases due to miniaturization. Thus, in order to assure a high SN ratio, it is necessary to reduce noises caused by scattered light from a wafer. Roughness of a pattern edge and surface roughness which serve as a scattered-light source are spread over the entire wafer. The present invention has discovered the fact that reduction of an illuminated area is a technique effective for decreasing noises. That is to say, the present invention has discovered the fact that creation of an illuminated area having a spot shape and reduction of the dimension of a spot beam are effective. A plurality of temporally and spatially divided spot beams are radiated to the wafer serving as a sample. | 10-31-2013 |
| 20140028833 | INSPECTION DEVICE - An inspection device, suitable for use when inspecting a component for defects, including a cluster of lights which are arranged into two or more groups of lights, wherein the cluster of lights is configured such that each group of lights can be operated asynchronously to the other group(s) of lights so that light can be directed asynchronously at a component, from different directions; an image capturing means which is configured to capture an image of a component when each of the groups of lights are lit, to provide a plurality of images, each image showing the component lit from a different direction; a processing means configured to perform arithmetic computation using the images, so as to provide a single image in which defects in the component can be more easily identified. Also, a corresponding method of inspecting a component and a lighting arrangement with a dome and a diffuser. | 01-30-2014 |
| 20140132755 | PORTABLE COMPOSABLE MACHINE VISION SYSTEM FOR IDENTIFYING PROJECTILES - A machine vision system for automatically identifying and inspecting objects is disclosed, including composable vision-based recognition modules and a decision algorithm to perform the final determination on object type and quality. This vision system has been used to develop a Projectile Identification System and an Automated Tactical Ammunition Classification System. The technology can be used to create numerous other inspection and automated identification systems. | 05-15-2014 |
| 20140146169 | METHOD OF ACQUIRING SEVERAL IMAGES OF THE SAME PACKAGE WITH THE AID OF A SINGLE LINEAR CAMERA - The invention relates to a method of inspecting packages with the help of a linear image sensor. According to the invention the method comprises the steps of:
| 05-29-2014 |
| 20140152808 | METHOD AND DEVICE FOR THE RELIABLE DETECTION OF MATERIAL DEFECTS IN TRANSPARENT MATERIAL - The invention relates to a method and device for the reliable detection of material defects in a continuously produced band of transparent material by means of examining a strip of a band of this material extending transversely with respect to the conveying direction and observed in transmitted light and reflected light, characterised in that it has the following features: a) uninterrupted illumination of the band of transparent material in transmitted light and reflected light by a linear lamp ( | 06-05-2014 |
| 20140218510 | REVERSE VENDING MACHINE AND METHOD OF DETECTING DIRT IN A REVERSE VENDING MACHINE - A reverse vending machine, including: a chamber adapted to receive an object returned to the reverse vending machine; a plurality of cameras arranged around the perimeter of the chamber for viewing said object; a transparent or translucent plate arranged such that the cameras in use view the object obliquely through the transparent or translucent plate; and means adapted to couple light into the plate such that the light undergoes total internal reflection in the plate. Also, a method of detecting dirt in a reverse vending machine. | 08-07-2014 |
| 20140240489 | OPTICAL INSPECTION SYSTEMS AND METHODS FOR DETECTING SURFACE DISCONTINUITY DEFECTS - Optical inspection system and methods for detecting surface discontinuity defects in glass sheet are disclosed. A reflective diffuser resides adjacent a back surface of the glass sheet and is illuminated with gradient intensity illumination. A digital camera having a two-dimensional image sensor resides adjacent the front surface of the glass sheet. The digital camera has, at the reflective diffuser, an acceptance circle that shifts relative to the gradient illumination due to the surface discontinuity. The shift causes the digital inspection image to change intensity, and the change is faster than if the illumination of the reflective diffuser had uniform intensity. | 08-28-2014 |
| 20140340511 | Uniformity Testing System and Methodology for Utilizing the Same - A system for testing an implement is disclosed. The system includes: a computing resource, an implement rotating device, a light emitting device and a light receiving device. The implement rotating device rotatably-supports the implement. The implement rotating device is communicatively-coupled to the computing resource. The light emitting device is communicatively-coupled to the computing resource. The light receiving device is communicatively-coupled to the computing resource. The implement rotating device and the implement are arranged between the light emitting device and the light receiving device. The light emitting device and the light receiving device are substantially linearly-aligned with the implement rotating device and the such that upon activating the light emitting device, light that is emitted by the light emitting device is directed toward both of the implement and the light receiving device whereby the light receiving device captures an image corresponding to a portion of the light emitted by the light emitting device and a shadow formed by at least a portion of the implement. The shadow corresponds to another portion of the light that is not received by the light receiving device. The light receiving device communicates the captured image to the computing resource for determining uniformity or a lack of uniformity of the implement. A method for utilizing the system is also disclosed. A computer program product is also disclosed. | 11-20-2014 |
| 20150042788 | Image Processing Sensor System, Image Processing Sensor Control Method, And Image Processing Sensor Used In Image Processing Sensor System - In one aspect of the invention, an image processing sensor system may include a plurality of image processing sensors each including an imaging device having an imaging unit imaging an inspection target and a lighting unit projecting light onto the inspection target, and an image processing device performing image processing on image data acquired in the imaging device and determining whether the inspection target is defective or non-defective, wherein the image processing sensors being are connected to each other so that data communication of data including the image data can be performed therebetween, and wherein a first image processing sensor transmits a signal relating to the completion of projecting light projecting light to a second image processing sensor, and the second image processing sensor starts projecting light and imaging and projection after receiving the signal relating the completion of projecting light. | 02-12-2015 |
| 20150077541 | METHOD AND APPARATUS FOR INSPECTING APPEARANCE OF OBJECT - A method and apparatus for inspecting an object is provided. By way of example, first and second images of the object obtained by using a camera and a lighting unit. The lighting unit and the camera is controlled so as to provide the first image picked up by the camera with a first quantity of light radiated from the lighting unit and the second image picked up by the camera with the second quantity of light radiated from the lighting unit. The first quantity of light is different from the second quantity of light. Differences between pixel values of the first image and pixel values of the second image are calculated. Then, it is determined whether the object has a non-defective appearance or a detective appearance, based on comparison between the differences and reference pixel values corresponding to the differences. | 03-19-2015 |
| 20150138343 | BILL COUNTER WITH A DETECTOR - A bill counter has two side panels, a bill-in part, a bill-out part, and a detector. The detector has a reflecting board, a lighting element, and an image capturing device. When the bill counter is in use, the lighting element flashes upon the passing of a bill. The reflecting board reflects the flash to uniformly illuminate the bill, and the image capturing device takes images at the same time. Because the image capturing device does not need to be located near the bill, even when the bill is moved slightly by shock, the images taken do not distort greatly, which prevents identification failure. Besides, the image capturing device eliminates the problem of image dragging, such that a mechanism of the bill counter can be simplified and a production cost is reduced. | 05-21-2015 |
| 20150138344 | IMAGING APPARATUS AND IMAGING METHOD - According to one embodiment, an imaging apparatus includes a light source for illumination, a stage on which an imaging object illuminated by illumination light from the light source is to be placed, a critical illumination optical system configured to supply the illumination light to the imaging object placed on the stage, and to have a greater magnification in a first axis direction than in a second axis direction, an imaging optical system configured to form an image of the imaging object placed on the stage and illuminated using the critical illumination optical system, and a detector configured to detect the image of the imaging object formed by the imaging optical system, and to have a detection area longer in the first axis direction than in the second axis direction. | 05-21-2015 |
| 20150355105 | Inspection Apparatus - An inspection apparatus capable of accurately detecting a defect regardless of the difference between peripheral parts formed around cell parts is realized. Dies | 12-10-2015 |
| 20160119557 | ACTIVE REAL-TIME CHARACTERIZATION SYSTEM - A system for providing active real-time characterization of an article under test is disclosed. An infrared light source, a first visible light source and a second visible light source each outputs and directs a beam of coherent light at a particular area on the article under test. A visible light camera and a visible light second harmonic generation camera, an infrared camera and an infrared second harmonic generation camera, a sum frequency camera and a third order camera are each configured to receive a respective predetermined return beam of light from the particular area on the article under test. A processor receives signals from the cameras and calculates in real time respective spectroscopic signals and compares each calculated signal with each other calculated signal and with a predetermined baseline signal to ensure that the article under test conforms to an expected value. | 04-28-2016 |
| 20160377415 | SYSTEM AND METHOD FOR MEASURING REFLECTED OPTICAL DISTORTION IN CONTOURED PANELS HAVING SPECULAR SURFACES - A system for measuring reflected optical distortion in a contoured panel having a specular surface includes a conveyor for conveying the panel in a first direction, at least one display projecting a preselected multi-phase non-repeating contrasting pattern, and at least one camera, each one of the cameras uniquely paired with one of the displays. The system may also include a control programmed to execute logic for controlling each of the cameras to acquire the desired images, and logic for analyzing and combining the data acquired by the cameras to construct a definition of the surface of the panel, and logic for performing one or more optical processing operations on the surface data to analyze the optical characteristics of the panel. | 12-29-2016 |
| 20170236266 | SYSTEM AND METHOD FOR DETECTING DEFECTS ON A SPECULAR SURFACE WITH A VISION SYSTEM | 08-17-2017 |
| 20190145906 | APPARATUS AND METHOD FOR CHECKING TYRES | 05-16-2019 |
| 348132000 | With strobe illumination | 1 |
| 20140267694 | NONDESTRUCTIVE TESTING OF A COMPONENT - In some examples, a method for nondestructive testing of a component may include flashing the component using a flash lamp configured for flash thermography, collecting first image data regarding the component using an infrared camera, flowing a fluid through the component, and collecting second image data regarding the component using the infrared camera. A system for nondestructive testing of a component may include a single inspection station and a flash lamp configured for flash thermography, means for supplying a fluid to the component, and an infrared camera disposed at the inspection station. | 09-18-2014 |
