| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 348093000 | Color TV | 15 |
| 20100141754 | LUMBER INSPECTION METHOD, DEVICE AND PROGRAM - An imaging means captures a color image of lumber. An image processing means obtains the color distribution of the color image captured by the imaging means, compares the obtained color distribution with a predetermined color distribution of normal lumber, judges the obtained color distribution as an abnormal one when it is deviated from the color distribution of normal lumber by a predetermined value or more, and detects a defect of the lumber having the abnormal color distribution deviated by a value larger than the predetermined value in an area on the surface of the lumber captured by the imaging means. | 06-10-2010 |
| 20100188500 | APPARATUS AND METHOD FOR SCANNING THE SURFACE OF A MOVING ARTICLE - An apparatus and method for scanning a surface of an article moving along a travel path axis provide a compact sensor configuration. A first sensor unit has a first sensing field transversely directed toward the travel path axis and defining a first scanning zone. A second sensor unit has a second sensing field transversely directed toward the travel path axis and defining a second scanning zone. The first and second sensing fields are crossing one with another at a location sufficiently remote from the first and second scanning zones so as to not adversely affect the generation of sensor output data, while providing a compact arrangement of sensor units. | 07-29-2010 |
| 20120002037 | System and Method for Ground Material Characterization in a Grinding System - A system and method for ground material characterization in a grinding system, in particular for characterizing particles in a ground material stream of ground grain products in a grain grinding system, uses an irradiation section through which at least a part of the ground material stream is fed and with irradiation means for irradiating the particles in the at least one part of the ground material stream with electromagnetic radiation; and a detection section through which the at least one part of the ground material stream is fed and with a detection means for detecting electromagnetic radiation emitted from the particles of the part of the ground material stream fed through the irradiation section. The detection means comprises an imaging system and a color image sensor for imaging the particles onto the color image sensor by way of the electromagnetic radiation emitted by the particles. The color image sensor comprises sensor image elements for spectrally selective detection of the electromagnetic radiation imaged onto the sensor image elements. | 01-05-2012 |
| 20120044344 | METHOD AND SYSTEM FOR DETECTING DEFECTS OF TRANSPARENT SUBSTRATE - A method and a system for detecting defects of a transparent substrate are provided. The system includes: a plurality of detection channels, each of which includes an illumination component for providing illumination to the substrate and an imaging component for scanning the substrate to provide image of the substrate; a transport module, for producing relative motion between the substrate and the illumination components and the imaging components included in the plurality of detection channels; and a controlling module, for controlling the illumination components and the imaging components included in the plurality of detection channels so that at least two illumination components of the illumination components included in the plurality of detection channels provide illumination to the substrate alternately, and the imaging component included in any of the plurality of detection channels scans the substrate when the illumination component included in that detection channel illuminates the substrate, wherein the imaging components included in at least two detection channels of the plurality of detections channels are the same imaging component. The method and system described by the present invention is capable of discriminating real defects from fake defects which enables substrate to be inspected with free of cleaning. | 02-23-2012 |
| 20130010102 | METHOD OF MEASURING MEASUREMENT TARGET - In order to measure a measurement target on a PCB, height information of the PCB is acquired by using a first image photographed by illuminating a grating pattern light onto the PCB. Then, a first area protruding on the PCB by greater than a reference height is determined as the measurement target by using the height information. Thereafter, color information of the PCB is acquired by using a second image photographed by illuminating light onto the PCB. Then, the first color information of the first area determined as the measurement target out of the color information of the PCB is set as reference color information. Thereafter, the reference color information is compared with color information of an area except for the first area to judge whether the measurement target is formed in the area except for the first area. Thus, the measurement target may be accurately measured. | 01-10-2013 |
| 20130021466 | APPARATUS FOR VIEWING THROUGH OPTICAL THIN FILM COLOR FILTERS AND THEIR OVERLAPS - An optical apparatus for creating an image of object features buried underneath color filters. The apparatus includes: an illumination light source producing an illuminating light, the illumination light source incorporating at least three laser light emitters operating at different wavelengths, the illuminating light being a combination of light signals produced by the at least three light emitters; an electronic control module coupled to each of the at least three laser light emitters and configured to drive each of the at least three laser light emitters using a pulsed driving signal with controllable amplitude and temporal pulse parameters; an illumination optical path delivering the illuminating light from the illumination light source to the object; an image sensor for creating the image of the object using light collected from the object; and an imaging optical path for delivering the light from the object to the image sensor. The three laser light emitters are operated in a saturation mode to reduce the illumination light coherence and eliminate the resulting speckle. | 01-24-2013 |
| 20130162811 | METHOD FOR TESTING LIGHT-EMITTING DIODES USING DIGITAL IMAGES - A method for detecting light-emitting diodes using digital images to check whether each light-emitting diode in a to-be-detected computer is normal or not, the method includes shooting a default image for at least one light-emitting diodes in a default computer; selecting one diode as a first initial light source; obtaining default location information according to the locations of the contiguous light-emitting diodes relative to the first initial light source; similarly obtaining light signal information according to the locations of the light-emitting diodes relative to a second initial light source which corresponds to the first initial light source, and comparing the light signal location information with the default location information to judge whether the light-emitting diodes are in normal work. | 06-27-2013 |
| 20130169791 | COMPUTING DEVICE AND METHOD FOR MEASURING WIDTHS OF MEASURED PARTS - In a method to measure widths of measured parts placed on a platform, a computing device connects to one or more charge coupled device (CCD) cameras. The method controls each of the CCD cameras to capture a digital image from a measured part that is placed near the CCD cameras, obtains the digital image of the measured part from each of the CCD cameras in a predefined order, and obtains a binary expression from the digital image of the measured part. When the measured part is placed in a correct position on the platform, the method further obtains three points from an upper boundary of the measured part in the binary expression and another three points from a lower boundary of the measured part in the binary expression, and calculates width of the measured part according to the obtained six points. | 07-04-2013 |
| 20130215261 | Method For Detecting Defects In Glassware Articles, And Installation For Implementing Said Method - A method for detecting low-contrast pressing or blowing defects in glassware articles includes the steps of backlighting the article by way of one or several light sources according to at least one pair of similar patterns shifted in space; capturing at least one pair of images of the backlit article according to each of the patterns of the at least one pair of patterns; combining the images of each of the pairs to form at least one composite image; and detecting the areas of stronger contrast within the composite images. | 08-22-2013 |
| 20130265411 | SYSTEM AND METHOD FOR INSPECTING SCRAPED SURFACE OF A WORKPIECE - A system for inspecting a scraped surface of a workpiece performs steps of: a) capturing an image of the scraped surface to obtain a original image section; b) removing high point regions whose areas are outside of a predetermined area range to obtain a base image; c) processing pixels of the base image using a first imaging mask to generate a judgment image; d) determining whether uniformity of the high point regions in the base image conforms a standard; e) determining whether a number of the high point regions in the base image falls within a predetermined number range; and f) evaluating whether or not a portion of the scraped surface conforms with the standard based on results of determinations made in steps d) and e). | 10-10-2013 |
| 20140210995 | INSPECTION METHOD FOR SEMICONDUCTOR LIGHT-EMITTING DEVICE AND MANUFACTURING METHOD FOR SEMICONDUCTOR LIGHT-EMITTING DEVICE - An inspection method for a semiconductor light-emitting device includes an image capturing step for irradiating light to the semiconductor light emitting device so as to excite an active layer and capturing an image of photoluminescence released from the active layer, an inspection region extracting step for extracting an inspection region of the captured image, a luminance average determination step for, determining as defective when a luminance average is smaller than a predetermined threshold, a luminance variance determination step for determining as defective when a luminance variance is larger than a predetermined threshold, and a total determination step for totally determining the semiconductor light-emitting device as defective when determined the semiconductor light emitting device as defective in at least one of the two determination results. | 07-31-2014 |
| 20140218504 | APPARATUS AND METHOD FOR SCANNING A SURFACE OF AN ARTICLE - An apparatus and a method for scanning a surface of an article such as a wooden piece transported along a travel path axis, are capable of generating two complementary color image frames representing the surface of the article in an efficient way. While the sensing field of an imaging sensor is directed transversely toward the travel path axis, a first linear-shaped light beam characterized by a first wavelength is directed toward the scanning zone to form a first reflected line onto the article surface. A second linear-shaped light beam characterized by a second wavelength is directed toward the scanning zone to form a second reflected line onto the article surface. The first and second light sources are activated alternately according to a predetermined frequency, so that the imaging sensor is caused to capture alternately the first and second reflected lines to produce interlaced sequences of reflected intensity image data, which are then separated to generate two complementary color image frames representing the surface of the article. | 08-07-2014 |
| 20150035970 | SYSTEMS AND METHODS TO DETECT COATING VOIDS - Systems and methods to identify defects of a surface coating treatment in a beverage can. One or more image suspects are acquired, including at least a portion of a surface treated by a coating. A coating characteristic detection process is performed on the one or more image suspects. At least one coating characteristic is determined based at least in part on the coating characteristic detection process. | 02-05-2015 |
| 20160025591 | AUTOMATED DEFLECTOMETRY SYSTEM FOR ASSESSING REFLECTOR QUALITY - An automated deflectometry system and method for assessing the quality of a reflective surface for use in a concentrating solar power plant. The deflectometry system comprises a holding fixture for mounting a heliostat reflector opposite a target screen having a known pattern. Digital cameras embedded in the target screen take pictures of the known pattern as reflected in the surface of the reflector. Image processing software then detects the features of the pattern in the reflector images and calculates the slope profile of the reflective surface. The slope field can be calculated by comparing the images of the reflective surface to those of a reference surface. Based on the slope profile of the reflective surface, a ray tracing calculation can be performed to simulate flux as reflected from the reflective surface onto a receiver and a quality metric can be ascribed to the heliostat reflector. The result of the quality assessment can displayed using a graphical user interface on an automated assembly line. | 01-28-2016 |
| 20190147608 | MULTIPURPOSE DIGITAL RAPID PROFILE PROJECTOR AND METHODS OF USE | 05-16-2019 |
