| Entries |
| Document | Title | Date |
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| 20080218219 | COMPARATOR AND IMAGE DISPLAY SYSTEM - A comparator for comparing a reference signal with a data signal includes a voltage boosting circuit, a first logic inverting circuit and a second logic inverting circuit. The voltage boosting circuit receives the reference signal to hold a voltage difference during a first time, and receives the data signal to generate a comparing signal according to the data signal and the voltage difference during a second time. The first logic inverting circuit is electrically connected to the voltage boosting circuit, outputs an initial signal to the voltage boosting circuit to hold the voltage difference during the first time, and inverts the comparing signal to output a first voltage signal during the second time. The second logic inverting circuit is electrically connected to the first logic inverting circuit during the second time, and inverts the first voltage signal to output a second voltage signal fed back to hold the comparing signal. | 09-11-2008 |
| 20080290906 | CONSTANT-CURRENT DRIVING CIRCUIT - A constant-current driving circuit includes a first current source, a reference voltage generating circuit and an output signal generating circuit. A terminal of the first current source is coupled to a terminal of a first LED string, wherein the terminal of the first current source has a first voltage. The reference voltage generating circuit is used for generating a reference voltage and comparing the first voltage with a first predetermined voltage to generate a first comparing signal to thereby adjust the reference voltage. The output signal generating circuit is used for outputting an output signal to another terminal of the first LED string and receiving the input signal, wherein the output signal generating circuit decides whether or not to output the input signal serving as the output signal according to the comparison result of the reference voltage with the second voltage. | 11-27-2008 |
| 20090002034 | Circuit Arrangement and Method for Detecting a Power Down Situation of a Voltage Supply Source - Circuit arrangement for detecting a power down situation of a second voltage comprising a first conductor, adapted the be connected to a first voltage, a second conductor, adapted the be connected to a reference voltage, an input node, adapted the be connected to the second voltage, and two output nodes, a first output node and a second output node. The output nodes are interconnected in such a manner, that (a) when the second voltage is higher than the reference voltage, the first output node is at the first voltage level and the second output node is at the reference voltage level, and (b) when the second voltage is equal to the reference voltage, the first output node is at the reference voltage level and the second output node is at the first voltage level. The circuit arrangement further comprises an inverter section arranged in between the two conductors, wherein the input node represents an inverter section input and wherein an inverter section output node is formed representing the inverter section output. | 01-01-2009 |
| 20090058472 | VOLTAGE COMPARATOR CIRCUIT - A voltage comparator circuit includes a voltage input terminal, a first resistor, a second resistor, a first transistor, a second transistor, and a voltage output terminal connected to the collector of the second transistor. The voltage input terminal is connected to ground via the first and second resistors in turn. A node between the first and second resistors is connected to the base of the first transistor. The emitter of the first transistor is grounded. The collector of the first transistor is connected to a direct current (DC) power supply and the base of the second transistor. The emitter of the second transistor is connected to the DC power supply. | 03-05-2009 |
| 20090072867 | SEMICONDUCTOR DEVICE - A semiconductor device can output a reference voltage for an arbitrary potential and can detect the voltage of each cell in a battery including multiple cells very precisely. The device includes a depletion-type MOSFET | 03-19-2009 |
| 20090096488 | TIME CONSTANT CALIBRATION DEVICE AND RELATED METHOD THEREOF - A time constant calibration device includes: a first voltage generating circuit utilizing a first current passing through a capacitive component to generate a first voltage; a second voltage generating circuit utilizing a second current passing through a resistive component to generate a second voltage; and a comparing circuit for comparing the first voltage with the second voltage to generate a comparing signal, wherein the first voltage generating circuit comprises an analog adjusting component for adjusting the first voltage according to the comparing signal until the first voltage is equal to the second voltage whereby an RC time constant defined by an equivalent capacitance corresponding to the first current passing through the capacitive component and an equivalent impedance corresponding to the second current passing through the resistive component reaches a predetermined value. | 04-16-2009 |
| 20090102516 | Comparator - A comparator has P-channel field effect transistors that are supplied at respective gates with input voltages Vin and Vref, which are objects of comparison, and that act as a differential transistor pair; and N-channel field effect transistors that serve as current channels for respective drain currents of these two P-channel field effect transistors and that act as a current mirror circuit. The comparator outputs a drain voltage Vx of an N-channel field effect transistor as a signal showing a result of comparison between the two input voltages. An N-channel field effect transistor diode-connected to the comparator is interposed between drains of the N-channel field effect transistors. | 04-23-2009 |
| 20090146694 | CIRCUIT AND METHOD FOR PREVENTING BANG-BANG ERROR, CALIBRATION CIRCUIT INCLUDING THE CIRCUIT, AND ANALOG-TO-DIGITAL CONVERTER INCLUDING THE CIRCUIT - A circuit including a comparing unit for comparing a target voltage with a stepwise-varying tracking voltage, a counting unit for counting a code according to the comparison result of the comparing unit and a control signal generating unit for generating a signal for controlling a counting operation of the counting unit. | 06-11-2009 |
| 20090174438 | Data Trigger Reset Device and Related Method - A data trigger reset device for an electronic device is provided in order to avoid system errors due to out-of-sequence reset on electronic devices of an electronic system. The data trigger reset device includes a voltage converter and a voltage comparator. The voltage converter receives an input signal and then converts the input signal to generate a data voltage signal. The voltage comparator is coupled to the voltage converter and is used for comparing the data voltage signal with a reference voltage to generate a reset signal for resetting the electronic device. | 07-09-2009 |
| 20090189646 | Method and Apparatus for Detection and Accommodation of Hot-Plug Conditions - An apparatus, method, and discriminator circuit are provided for filtering false signals. A discriminator circuit receives a low-state signal via an input and, responsive to receiving the low-state signal, the discriminator circuit compares the low-state signal to a static signal. Responsive to the low-state signal being greater than the static signal, the discriminator circuit outputs a high-voltage signal. The high-voltage signal output by the discriminator circuit indicates that the low-state signal is a false low signal. Responsive to the low-state signal being less than or equal to the static signal, the discriminator circuit outputs a low-voltage signal. The low-voltage signal output by the discriminator circuit indicates that the low-state signal is a valid low signal. | 07-30-2009 |
| 20090189647 | BIAS CURRENT GENERATOR FOR MULTIPLIE SUPPLY VOLTAGE CIRCUIT - An electronic device supplied by multiple supply voltages includes a bias current generating stage and maximum current selection stage. The bias current generating stage comprises a crude bias current generator for generating an crude bias current during a power up phase in which at least one of the multiple supply voltages has not yet reached its target supply voltage level, a reference current stage for providing a reference current having a target current value greater than the target value of the crude bias current when the multiple supply voltages have reached their target supply voltage levels. The maximum current selection stage is adapted to continuously output a bias current which is the maximum current of the crude bias current and the reference current. | 07-30-2009 |
| 20090237118 | Zero Input Current-Drain Comparator with High Accuracy Trip Point Above Supply Voltage - A comparator circuit ( | 09-24-2009 |
| 20090273373 | SEMICONDUCTOR DEVICE HAVING RECEIVING CIRCUIT USING INTERNAL REFERENCE VOLTAGE - A semiconductor device includes a reference voltage generating unit configured to produce a reference voltage by dividing a voltage difference between a positive clock terminal and a negative clock terminal, and a logic determination unit configured to determine a logic level of an external signal based on the reference voltage. | 11-05-2009 |
| 20100039142 | INPUT BUFFER CIRCUIT OF SEMICONDUCTOR APPARATUS - The input buffer circuit of a semiconductor apparatus includes a first buffering unit that that is activated by a voltage level difference between a first voltage terminal and a second voltage terminal, and generates a first compare signal and a second compare signal by comparing the voltage levels of reference voltage and an input signal; a control unit that controls the amount of current flowing between the second voltage terminal and a ground terminal by comparing the voltage levels of the reference voltage and the second compare signal; and a second buffering unit that generates an output signal by comparing the voltage levels of the input signal and the first compare signal. | 02-18-2010 |
| 20100073034 | CIRCUIT FOR COMPARING AN INPUT CURRENT WITH A THRESHOLD CURRENT - A circuit is for generating a signal that indicates whether or not an input current exceeds a pre-established threshold current and, in the affirmative case, that is representative of the difference between the input current and the threshold current. The circuit includes a diode-connected transistor biased with a first constant current in a saturation functioning condition, a sense transistor mirrored to the diode-connected transistor and biased in a linear (triode) functioning condition, a load transistor connected in series to the sense transistor, biased with a second constant current and the control terminal of which is connected in common with the respective terminals of the diode-connected transistor and of the sense transistor. The input current to be compared is injected to a common current node of the load transistor and of the sense transistor, and the output voltage is available on the other current node of the load transistor. | 03-25-2010 |
| 20100127734 | Out-Of-Band Signaling Using Detector with Equalizer, Multiplier and Comparator - Power-down mode is activated when equal voltages are detected on a pair of differential inputs. The voltage difference across the differential inputs is equalized by an equalizer and then applied to a multiplier and smoothed and filtered by a low-pass filter to produce an average signal. The average signal is compared to a reference voltage to detect when the voltage difference across the differential inputs is too small. A power-down signal is activated when the average signal is too small. The reference voltage compared can be generated by an equalizer, multiplier, and low-pass filter to match process, temperature, and supply-voltage variations in the primary signal path. The multipliers can be implemented with Gilbert cells. The equalizers can receive control signals to control attenuation of different frequency components. | 05-27-2010 |
| 20100156470 | VOLTAGE DETECTOR DEVICE AND METHODS THEREOF - A voltage detector device is disclosed that includes a coarse-range voltage detector and a fine-range voltage detector. The fine-range voltage detector is configured to remain inactive, so that it consumes a relatively small amount of power, while a monitored voltage is outside a first specified range. In response to determining that the monitored voltage is within the first specified range, the coarse-range voltage detector activates the fine-range voltage detector so that it can monitor the voltage. In response to the fine-voltage monitor determining the voltage falls within a second specified range, the fine-range voltage detector provides a signal to a functional module of an electronic device so that the functional module can provide a defined response, such as executing an interrupt routine. | 06-24-2010 |
| 20100176846 | DIFFERENTIAL HYBRID CIRCUIT - A main driver amplifier generates first differential signals (Vdp/Vdn) based on pattern data (PAT). A replica driver amplifier generates second differential signals (Vcp/Vcn) based on the pattern data (PAT). Two subtractors generate electric potential difference signals (HP=RP−Vep) and (HN=RN−Ven), respectively. Two sample hold circuits sample the electric potential difference signals (HP and HN),and hold them thereafter, respectively. A comparison unit compares a differential amplitude signal (DA=HHP−HHN) with a predetermined threshold value (VOH). A latch circuit latches an output from the comparison unit. Sampling timings of the two sample hold circuits and a latch timing of the latch circuit, can be adjusted independently. | 07-15-2010 |
| 20100207665 | Comparator circuit - A comparator circuit, includes first and second terminals to which a reference voltage that determines a threshold voltage is inputted, a third terminal to which a standard voltage is inputted, a fourth terminal to which a target voltage that is to be detected and is based on the standard voltage is inputted, first and second transistors of a first conductivity type including control terminals connected to the first and second terminals, respectively, the first and second transistors flowing currents depending on a potential difference of the reference voltage, a third transistor of a second conductivity type connected in series with the first transistor, a fourth transistor of the second conductivity type connected in series with the second transistor, a fifth transistor of the second conductivity type through which a mirror current depending on a current flowing through the third transistor, a sixth transistor of the second conductivity type flowing a mirror current depending on a current flowing through the fourth transistor, a seventh transistor of the first conductivity type connected between the sixth transistor and the fourth terminal, and an eighth transistor of the first conductivity type connected between the fifth transistor and the third terminal, the eighth transistor flowing a mirror current depending on a current passing through the seventh transistor. A voltage depending on a voltage of an intermediate node between the fifth and eighth transistors is outputted as an output signal. | 08-19-2010 |
| 20100225359 | OUTPUT SIGNAL GENERATING DEVICE - An output signal generating device according to the present invention includes a control circuit for generating a control signal, a reference signal generating unit for generating a reference signal, an output signal generating unit for generating an output signal according to a comparison result between the control signal and the reference signal, an output signal detecting unit for detecting the output signal based on a sampling signal, and an output signal storage unit for storing the output signal detected by the output signal detecting unit. The control circuit includes a readout unit for reading out the output signal stored in the output signal storage unit. According to the present invention, the output signal can be stored in real time and the results thereof can be processed by software. | 09-09-2010 |
| 20100237907 | COMPARATOR WITH OFFSET COMPENSATION, IN PARTICULAR FOR ANALOG DIGITAL CONVERTERS - A comparator formed by first and second stages. The second stage is formed by a pair of output transistors connected between a power-supply line and respective output nodes; a pair of bias transistors, connected between a respective output node and a current source; a pair of memory elements, connected between the control terminals of the output transistors and opposite output nodes; and switches coupled between the control terminals of the respective output transistors and the respective output nodes. In an initial autozeroing step, the first stage stores its offset so as to generate an offset-free current signal. In a subsequent tracking step, the second stage receives the current signal and the memory elements store control voltages of the respective output transistors. In a subsequent evaluating step, the first stage is disconnected from the second stage and the memory elements receive the current signal and switch the first and the second output node depending on the current signal. In subsequent comparisons, the tracking and evaluating steps follow one another without performing the autozeroing step. | 09-23-2010 |
| 20100277205 | SEMICONDUCTOR DEVICE AND APPARATUS INCLUDING SEMICONDUCTOR DEVICE - A semiconductor device includes a substrate on which an electronic circuit is provided. One or more pads may be present which can connect the electronic circuit to an external device outside the substrate. A current meter is electrically in contact with at least a part of the substrate and/or the pad. The meter can measure a parameter forming a measure for an amount of a current flowing between the substrate and at least one of the at least one pad. A control unit is connected to the current meter and the electronic circuit, for controlling the electronic circuit based on the measured parameter. | 11-04-2010 |
| 20100295580 | INTERROGATION CIRCUIT FOR A NANOWIRE SENSOR ARRAY AND A METHOD FOR INTERROGATING A NANOWIRE SENSOR ARRAY - An interrogation circuit for a nanowire sensor array and a method for interrogating a nanowire sensor array are provided. The circuit comprises a switch array connected to the nanowire sensor array for selectively connecting first ends of nanowire sensors of the nanowire sensor array to a reference voltage; an integration amplifier (IA) connected to second ends of the nanowire sensors at a first input of the IA and to the reference voltage at a second input of the IA, for generating an oscillating output signal clamped between first and second voltage values; wherein the switch array is further arranged for switching one of the nanowire sensors to be connected in a closed loop with the IA such that a current through said one nanowire sensor periodically charges and discharges an integration capacitor of the IA for determining a resistance of said one nanowire sensor from a frequency of the periodic charging and discharging. | 11-25-2010 |
| 20110062996 | POWER ON DETECTION CIRCUIT - A power-on-detection (POD) circuit includes first and second comparators, a voltage divider, a detection circuit coupled to a first voltage source node and the voltage divider, and logic circuitry coupled to outputs of the first and second comparators. The detection circuit outputs a control signal identifying if a first voltage source node has a voltage potential that is higher than ground. The control signal turns on and off the first and second comparators, which are respectively coupled to first and second nodes of the voltage divider and to a reference voltage node. The logic circuitry outputs a power identification signal based on the signals received from the outputs of the first and second comparators. | 03-17-2011 |
| 20110115527 | METHOD AND DETECTOR FOR DETERMINING A STATE OF A SWITCH - In an integrated circuit, a state of a switch coupled to the integrated circuit is determined by comparing a switch voltage at a first terminal of the switch to a reference voltage at a first time. If the switch voltage is higher than the reference voltage, the switch is determined to be in a first state. If the switch voltage is lower than the reference voltage, the switch voltage is stored in a storage element to produce a stored voltage. The stored voltage is compared to the switch voltage at a second time after the first time. A determination is made that the switch is in the first state if the switch voltage is higher than the stored voltage at the second time. A determination is made that the switch is in a second state if the switch voltage is not higher than the stored voltage at the second time. | 05-19-2011 |
| 20110115528 | REFERENCE VOLTAGE GENERATING CIRCUIT AND RECEIVER CIRCUIT - Disclosed is a reference voltage generating circuit including a constant current circuit which comprises: a first resistive element and a bipolar transistor connected in series between a supply voltage terminal and a constant potential point; a first MOS transistor having a gate connected to a node connecting the first resistive element with the bipolar transistor; a second resistive element connected in series between a source of the first MOS transistor and the constant potential point; a second MOS transistor connected between a drain of the first MOS transistor and the supply voltage terminal; and a third MOS transistor forming a current mirror in conjunction with the second MOS transistor, wherein a constant current generated by the constant current circuit or a current proportional to the generated constant current is converted to a voltage as a reference voltage. | 05-19-2011 |
| 20110121865 | SYSTEMS AND METHODS FOR DETECTING INTERFERENCE IN AN INTEGRATED CIRCUIT - Apparatus, systems and methods are provided for protecting a processing system from electromagnetic interference. An integrated circuit comprises a sensing arrangement configured to sense an interference signal and an interference detection module coupled to the sensing arrangement. The interference detection module is configured to detect when a power level associated with the interference signal is greater than a threshold value. In one embodiment, the interference detection module generates an interrupt for a processing system when the power level associated with the interference signal is greater than the threshold value. | 05-26-2011 |
| 20110133784 | CIRCUIT FOR DETECTING PHASE IMBALANCE OF SIGNALS - A circuit for detecting a phase imbalance of signals includes a conversion block and a comparator coupled to the conversion block. The conversion block generates generating a direct current (DC) signal based on a first signal and a second signal. The level of the DC signal is determined by a phase difference between the first signal and the second signal. The comparator compares the DC signal to a reference signal and generates an alert signal if a difference between the DC signal and the reference signal is greater than a predetermined threshold. | 06-09-2011 |
| 20110148469 | STACKED DEVICE DETECTION AND IDENTIFICATION - Various embodiments include apparatus and methods having circuitry to detect and/or assign identification information to dice arranged in a stack and coupled by conductive paths. | 06-23-2011 |
| 20110148470 | Communication device - According to an exemplary aspect of the present invention, it is possible to provide a communication device that can prevent misdetection of a disconnection and achieve a high output level on a receptacle side. In the communication device, a reference voltage generating circuit outputs a reference voltage that changes according to a first control signal. A differential amplifier circuit amplifies input signals and outputs differential output signals, the voltages of which change according to a second control signal, to a receptacle. A disconnection detector circuit outputs a disconnection detecting signal when a differential amplitude voltage between the differential output signals is equal to or higher than the reference voltage. The reference voltage generating circuit outputs the reference voltage that is larger than the differential amplitude voltage when the receptacle is terminated and that is smaller than the differential amplitude voltage when the receptacle is opened. | 06-23-2011 |
| 20110148471 | Temperature-Independent Undervoltage Detector and Related Method - Embodiments related to an undervoltage detector are described and depicted. An undervoltage detector is formed to detect a low input bias voltage with a voltage divider network including first and second series circuits of semiconductor devices coupled to terminals of the input bias voltage source, and a resistor voltage divider including first and second voltage divider resistors coupled in series with the first and second series circuits. A ratio representing the numbers of semiconductor devices in the series circuits is substantially equal to a ratio of resistances in the resistor voltage divider. The equality of the ratios may be corrected by the presence of other resistances in the undervoltage detector. The semiconductor devices are each coupled in a diode configuration. The first series circuit is coupled to a current mirror to provide a bias current for a comparator that produces an output signal for the undervoltage detector. | 06-23-2011 |
| 20110298498 | CORNER DETECTOR - A corner detector comprises a PMOS threshold voltage detector and an NMOS threshold voltage detector, the PMOS threshold voltage detector is composed of a first clock terminal, a first CMOS inverter, a first capacitor, a PMOS threshold voltage function generator and a first voltage output terminal, wherein the PMOS threshold voltage function generator is electrically connected to the first capacitor and applied to generate a first formula of voltage signal as a function of threshold voltage, the NMOS threshold voltage detector is composed of a second clock terminal, a second CMOS inverter, a second capacitor, an NMOS threshold voltage function generator and a second voltage output terminal, wherein the NMOS threshold voltage function generator is electrically connected to the second capacitor and applied to generate a second formula of voltage signal as a function of threshold voltage. | 12-08-2011 |
| 20110298499 | INTERNAL VOLTAGE GENERATOR AND INTEGRATED CIRCUIT DEVICE INCLUDING THE SAME - An internal voltage generator includes a comparison unit, a driving circuit and a bias unit. The comparison unit compares a reference voltage and an internal voltage and is configured to output a comparison voltage, which is based on a difference between the reference voltage and the internal voltage. The driving circuit receives the comparison voltage and an external power supply voltage and is configured to output the internal voltage to an output node in response to the comparison voltage. The bias unit receives the internal voltage and is configured to adaptively adjust a bias current that flows through the bias unit to drive the comparison unit, in consideration of a level of the internal voltage. | 12-08-2011 |
| 20110316588 | Resistor-programmable device at low voltage - A resistor-programmable device generates pulses counted by a counter. The counter's output controls a drive signal generator, such as an adjustable current source. The drive signal generator generates a drive signal (such as a current), which leads to the creation of a sense signal (such as a voltage) using a resistance. The resistance can have one of a set of specified values or fall within one of a set of specified windows. The resistor-programmable device can convert the resistance value into a digital value, which can be used to set a sensor trip point threshold or some other parameter. The digital or parameter value is independent of changes in the resistance that are within a specified tolerance. For instance, the same parameter value could be selected even when the resistance varies within some tolerance (such as 1%) as the resistor-programmable device can determine the window in which the resistance falls. | 12-29-2011 |
| 20120068738 | DEVICE AND METHOD FOR GENERATING THREE MODE SIGNAL - The device for generating three mode signals includes: a voltage setting block including an input terminal receiving three input signals of driving voltage, open, and ground and setting three voltages according to the three input signals; and an output block including two output terminals and a second node B receiving the three voltages from the voltage setting block, and outputting three combined signals by comparing an input voltage with a reference voltage, whereby only a small number of resistors and amplifiers generates three mode signals to further reduce the chip size than the related art and the external power source is not required to solve the problems of the related art due to noise. | 03-22-2012 |
| 20120153993 | USB PORT DETECTING CIRCUIT - A Universal Series Bus USB port detection and testing circuit, configured to detect the voltage output of a USB port of an electronic device, includes a voltage comparing circuit and an indicating circuit. The indicating circuit is connected to an output terminal of the voltage comparing circuit. The voltage comparing circuit compares the voltage output from the USB port against a reference voltage and output a signal whereby the indicating circuit indicates whether the voltage is within, or above, or below, the standard range. | 06-21-2012 |
| 20120176162 | High-Voltage Gate Driver that Drives Group III-N High Electron Mobility Transistors - A Group III-N high electron mobility transistor is driven by a high-voltage gate driver that limits the gate-to-source voltage across the transistor by controlling the maximum charge that can be placed on a boot strap capacitor that charges up the gate of the transistor to turn on the transistor. | 07-12-2012 |
| 20120242372 | Backdrive Protection Circuit - Methods, devices and circuits are provided for protection from backdrive current. One such device is subject to back voltage from an output node of the device and includes circuitry that is configured to compare the supply voltage node and the output node. In response to the comparison, the circuitry generates an output signal. Level shifted versions of the output signal are used to provide an output voltage corresponding to the higher of a supply voltage node and an output node. Switches are used to place the device in different modes in response to the output signal. | 09-27-2012 |
| 20120306540 | SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND METHOD OF TESTING THE SEMICONDUCTOR DEVICE - A coupling failure of a supply terminal or a ground terminal is easily detected. A diode is disposed between a supply terminal of a semiconductor device and a first I/O terminal so that the supply terminal is located on a cathode side, and the first I/O terminal is located on an anode side. A determination unit determines whether or not a voltage of the supply terminal is lower than a voltage of the first I/O terminal when a signal of high level equal to a supply voltage is input to the first I/O terminal. | 12-06-2012 |
| 20130076399 | COMPARISON CIRCUIT AND IMPEDANCE CALIBRATION CIRCUIT USING THE SAME - A comparison circuit includes: an offset removal unit configured to store offset information of a comparator in response to a reference voltage, and compare a pad voltage with the reference voltage based on the offset information to drive a first node; and a comparison signal output unit configured to buffer a signal of the first node and output a comparison signal. | 03-28-2013 |
| 20130076400 | COMPARATOR CIRCUIT - A comparator includes a first power source terminal, a second power source terminal, a first transistor of a first conductivity type coupled between the first power source terminal and a first node, and including a control terminal coupled to a first terminal, a second transistor of the first conductivity type coupled between the first power source terminal and a second node, and including a control terminal coupled to a second terminal, a third transistor of a second conductivity type coupled between the first node and a third terminal, and including a control terminal coupled to the first node, a fourth transistor of the second conductivity type coupled between the second node and the second power source terminal, and including a control terminal coupled to the first node, and a fourth terminal coupled to the second node. | 03-28-2013 |
| 20130076401 | INPUT BUFFER CIRCUIT OF SEMICONDUCTOR APPARATUS - The input buffer circuit of a semiconductor apparatus includes a first buffering unit that that is activated by a voltage level difference between a first voltage terminal and a second voltage terminal, and generates a first compare signal and a second compare signal by comparing the voltage levels of reference voltage and an input signal; a control unit that controls the amount of current flowing between the second voltage terminal and a ground terminal by comparing the voltage levels of the reference voltage and the second compare signal; and a second buffering unit that generates an output signal by comparing the voltage levels of the input signal and the first compare signal. | 03-28-2013 |
| 20130093467 | FOREGROUND TECHNIQUES FOR COMPARATOR CALIBRATION - A method and a device for canceling an offset voltage in an output of a comparator circuit include applying a signal to a first input of the comparator as a function of an initial tap point in a resistor ladder. While the signal is applied to the first input, a nominal voltage is applied to a second input of the comparator, and then an output of the comparator is analyzed. The signal to the first input is changed in response to the analyzing, by accessing a different tap point in the resistor ladder. | 04-18-2013 |
| 20130120026 | HIGH-STABILITY RESET CIRCUIT FOR MONITORING SUPPLY UNDERVOLTAGE AND OVERVOLTAGE - A method of monitoring supply voltage includes providing a single reference voltage, providing a single ratioed supply voltage, comparing the reference voltage to the ratioed supply voltage to provide an output signal, wherein the output signal comprises a first logic value in first and second operating conditions, and a second logic value in a third operating condition, wherein the first, second, and third operating conditions are determined by two crossing points of the reference voltage and ratioed supply voltage characteristics. The first and second operating conditions can represent undervoltage and overvoltage conditions, and the third operating condition can represent a normal operating condition. The reference voltage can be provided by a bandgap reference circuit. | 05-16-2013 |
| 20130162298 | IDENTIFYING CIRCUIT - An identifying circuit is connected between a Universal Serial Bus (USB) interface and a controller. The identifying circuit includes first and second resistors, and a diode. When a power adapter is connected to the USB interface, a negative data pin of the USB interface is floating, an identify pin of the controller receives a high level signal to determine that the power adapter is connected to the USB interface. When a computer is connected to the USB interface, the negative data pin of the USB interface outputs a low level signal, the identify pin of the controller receives a low level signal to determine that the USB interface is connected to the computer. | 06-27-2013 |
| 20130181746 | CONTINUOUS TIME CROSS-CORRELATOR - There is provided a continuous time cross-correlator comprising: a quantizer for quantizing the incoming signal into discrete levels; a delay line comprising one or more delay units separating a plurality of delay line taps; for each of said delay line taps, a comparator for comparing the signal level of the delay line tap with a correlation value; a continuous time counter for taking the outputs of the plurality of comparators as its inputs, counting the results of the comparisons and outputting the results of the comparisons; and an output comparator for comparing the counter output with a threshold value. The cross-correlator provides for high speed continuous time cross-correlation with low power consumption and a small chip area. Methods of continuous time cross correlation are also provided. | 07-18-2013 |
| 20130214817 | COMMAND DETECTING DEVICE - A command detecting device of the present invention includes a comparator, a detection state selector, a time detector, and a detection time switch. The comparator compares a command input from the outside with a certain voltage value and outputs its comparison result as a first state or a second output state. The detection state selector selects an output state that has been determined as a valid output state out of the two output states from the comparator. The time detector measures a duration time of the valid output state and switches the control command when the duration time reaches a given set time. The detection time switch switches the set time for the time detector. The output state selected as the valid output state by the detection state selector is switched by the control command. | 08-22-2013 |
| 20130278292 | DETECTOR CIRCUIT - A detector circuit, has a first diode, to an anode of which an AC signal is input and to which a constant voltage is supplied, a second diode, to an anode of which the constant voltage is supplied, and a difference current generation circuit, which generates the difference current between a first current flowing in the first diode and a second current flowing in the second diode. | 10-24-2013 |
| 20130285704 | BRIDGE INTEGRATED CIRCUIT - A bridge integrated circuit adapted for being coupled between a gate driver and a tester is provided. The bridge integrated circuit comprises a plurality of first detection units and a logic unit. Each first detection unit determines whether a corresponding gate driving signal satisfies a first standard according to one of the gate driving signals provided by the gate driver and accordingly generates a first detection signal according to the determination result. The logic unit is coupled to the first detection units and generates a test result signal in response to the first detection signal provided by each first detection unit. The test result signal is adapted for the tester. | 10-31-2013 |
| 20140028352 | DATA PERSISTENCE CONTROL APPARATUS FOR RFID TAG - A data persistence control apparatus for an RFID tag is provided. The apparatus includes a capacitor to be charged, a charge circuit to charge the capacitor, a discharge circuit to discharge the capacitor, a switch switched on to electrically connect the charge circuit to the capacitor or the discharge circuit to the capacitor, and an output circuit to output a logic high signal or a logic low signal according to an input voltage determined based on a discharged degree of the capacitor. | 01-30-2014 |
| 20140028353 | High speed signal detecting circuit and system - A high speed signal detecting circuit includes an input terminal, a reference terminal, an output terminal, a power source terminal, a ground terminal, a front-end receiver which is connected to the input terminal, the reference terminal and the ground terminal, a secondary amplifier which is connected to the front-end receiver and the ground terminal, a final amplifier which is connected to the secondary receiver, the output terminal, the power source terminal and the ground terminal, and a biasing circuit which is connected to the front-end receiver, the secondary amplifier, the final amplifier, the power source terminal and the ground terminal. A high speed signal detecting method is also provided to precisely detect high speed signal and change a detection threshold value of the high speed signals by changing a voltage value of the reference terminal and thus has a great flexibility. | 01-30-2014 |
| 20140035624 | CIRCUIT - In accordance with various embodiments, a circuit is provided, including an output node, a first potential varying stage, which is designed to couple the output node to a supply potential in reaction to an input signal, and a second potential varying stage, which is designed to couple the output node to the supply potential if the difference between the potential of the output node and the supply potential lies below a predefined threshold value. | 02-06-2014 |
| 20140253176 | PING PONG COMPARATOR VOLTAGE MONITORING CIRCUIT - A ping pong comparator voltage monitoring circuit which includes first and second comparators having inputs connected to a voltage Vin to be monitored, and second inputs connected to first and second nodes, respectively. A multiplexer alternately couples the first and second comparator outputs to an output in response to a periodic control signal. A ground-referenced voltage Vref1 is provided at a third node and a voltage Vref2 referenced to Vref1 is at a fourth node. A hysteresis hyst1 is switchably connected between the third and first nodes, and a hysteresis hyst2 is switchably connected between the fourth and second nodes. Hyst1 and hyst2 are switched in when the mux output toggles due to a rising Vin, and are switched out when the mux output toggles due to a falling Vin. | 09-11-2014 |
| 20140266313 | LIGHT RECEIVING CIRCUIT - The light receiving circuit includes: a photoelectric conversion element for causing a current corresponding to an amount of incident light to flow to a node; a voltage detection circuit for outputting a detection signal when a voltage of the node becomes equal to or higher than a first voltage; a reset circuit for causing, when the detection signal of the voltage detection circuit is input, the current of the photoelectric conversion element to flow to a GND terminal so that the voltage of the node becomes a second voltage lower than the first voltage, and for holding this state when the detection signal is no longer input; and a voltage increase detection circuit for detecting a fluctuation in the voltage of the node and outputting a detection result. | 09-18-2014 |
| 20140375357 | OPERATING CONDITIONS COMPENSATION CIRCUIT - A circuit having a centralized PT compensation circuit to provide compensation signals to localized I/O blocks on the chip. Process variations and temperature variations tend to be approximately uniform across an integrated circuit chip. Thus, a single, centralized PT compensation circuit may be used instead of one PT compensation circuit per I/O section as with solutions of the past. Further, the PT compensation circuit may generate a digital code indicative of the effects of process and temperature. Further yet, each section of I/O block may have a local voltage compensation circuit to compensate the voltage variation of the I/O block. The voltage compensation circuit utilizes an independent reference voltage. The reference voltage is generated by the PT compensation circuit, which is placed centrally in the IC chip and hence any need to repeat the reference generation for each I/O block is eliminated. | 12-25-2014 |
| 20150333745 | VOLTAGE COMPARATOR - A voltage comparator for comparing reference voltage applied to a first input node to an input voltage applied to a second input node. A first pair of transistors have output terminals coupled in series between the first input node and common node, and gate terminals connected together. A second pair of transistors, having both gate terminals of the pair connected to the gate terminals of the first pair of transistors, have output terminals coupled in series between a second input terminal, an intermediate node, and the common node. An inverter has an input coupled to the intermediate node and an output coupled to an output of the comparator. An optional feedback transistor might be used to latch the output of the comparator. Optional transistors might also be added to the first and second transistor pairs to selectively enable as the comparator and reset the latched output of the comparator. | 11-19-2015 |
| 20150372668 | COMPARATOR CONTROL CIRCUIT - A comparator control circuit includes a current source, a first input unit, a second input unit, switches, and a ground terminal. The current source generates an input current. The input current is divided into a first current flowing through the first input unit and a second current flowing through the second input unit. The first input unit receives a signal voltage. The second input unit receives a reference voltage. The first input unit and second input unit are coupled to the current source. The switches include a first switch and a second switch. The second switch has a control voltage. The ground terminal is coupled to the switches. When the first input unit is at high-level, the first switch is switched off and second switch is switched off by the control voltage to stop the second current flowing from the second input unit to the ground terminal. | 12-24-2015 |
| 20160011245 | DUAL-COMPARATOR CIRCUIT WITH DYNAMIC VIO SHIFT PROTECTION | 01-14-2016 |
| 20160026203 | CURRENT SOURCE, AN INTEGRATED CIRCUIT AND A METHOD - The present invention provides a current source comprising a first bias current control element, the first bias current control element being configured to generate a first current if the control value is lower than a reference value and configured to generate a second current if the control value equal to or higher than the reference value. In addition or alternatively the bias current source comprises a second bias current control element, the second bias current control element being configured to generate a third current if the control value is lower than or equal to the reference value and configured to generate a fourth current if the control value is higher than the reference value. Furthermore, the present invention provides an integrated circuit and a method. | 01-28-2016 |
| 20160065197 | BUTTON DETECTING CIRCUIT - The present disclosure illustrates a button detecting circuit and method thereof. The button detecting circuit includes a determining circuit, a voltage selector and a button module. The voltage selector is electrically connected to the determining circuit. The voltage selector has a plurality of candidate voltages arranged in sequence based on magnitudes of the candidate voltages. The button module which is electrically connected to the determining circuit via a single one pin comprises a threshold unit and a button network. The determining circuit receives the candidate voltage outputted from the voltage selector and outputs the candidate voltage to the button module for testing whether the threshold unit will be conducted to find a threshold voltage. The button module generates a scanning current based upon the threshold voltage. The determining circuit senses the scanning current and determines which one of a plurality of buttons disposed in the button network is pressed. | 03-03-2016 |
| 20160079972 | POWER SUPPLY VOLTAGE TRANSITION COMPARISON CIRCUIT, POWER SUPPLY VOLTAGE TRANSITION COMPARISON METHOD, AND SEMICONDUCTOR INTEGRATED CIRCUIT - A power supply voltage transition comparison circuit includes a comparator evaluation voltage setting circuit that generates a divided voltage of a power supply voltage; a comparator that compares a reference voltage with the divided voltage; a voltage evaluation circuit that evaluates the power supply voltage based on a result of the comparison; and an evaluation voltage setting value output circuit that changes a ratio between the power supply voltage and the divided voltage based on a result of an evaluation of the power supply voltage. | 03-17-2016 |
| 20160094212 | Clock Monitoring for Sequential Logic Circuits - A monitor circuit for monitoring a clock signal is described. In accordance with one example of the disclosure, the monitor circuit includes a pulse generator and a comparator circuit. The pulse generator is configured to generate a sequence of pulses synchronous to the clock signal, wherein each pulse has an edge with a monotonously rising or falling signal level. The comparator circuit receives the sequence of pulses and is configured to detect, for each clock cycle of the clock signal, whether or not the signal level of the sequence of pulses is outside a desired range at a specific time instant within the clock cycle of the clock signal. | 03-31-2016 |
