Class / Patent application number | Description | Number of patent applications / Date published |
327065000 |
Differential input
| 48 |
327064000 |
With logic or bistable circuit
| 14 |
327068000 |
Input provides varying reference signal | 5 |
20080204084 | LOW HEAT DISSIPATION I/O MODULE USING DIRECT DRIVE BUCK CONVERTER - A current-loop output circuit for an industrial controller provides for low power dissipation and reduced part count by driving current loads of different resistances directly from a switched voltage source. Proper filtering and design of a feedback loop allows the necessary transient response times to be obtained. | 08-28-2008 |
20090051391 | ADJUSTABLE INPUT RECEIVER FOR LOW POWER HIGH SPEED INTERFACE - A pseudo-differential input receiver is disclosed which is configured to support a wide-range of reference voltage Vref and a wide-range frequency interface with no parallel termination are described herein. The pseudo-differential receiver implementations described herein are very efficient in terms of area, power, and performance. A wide-frequency-range Vref-adjustable input receiver is described herein. The receiver can be configured with a Vref-monitoring PMOS helper FET or an enabled stacked PMOS helper FET to enable the receiver to work at Vref=0V like a conventional CMOS receiver. The receiver can also be configured with a Vref-monitoring NMOS helper FET to enable a Vref-based input receiver to work with programmability on bias currents & trip-point at Vref=(0.5˜0.7)Vdd, depending on the ratio of output driver's impedance and parallel on/off-die termination impedance. | 02-26-2009 |
20090085610 | GENERAL PURPOSE COMPARATOR WITH MULTIPLEXER INPUTS - A circuitry comprises a comparator for comparing a signal received on a first input to a signal received on a second input. A control register associated with the first multiplexer stores control values enabling connection of one input of the first multiplexer to the output of the first multiplexer. | 04-02-2009 |
20110068830 | MINIMUM LEADING EDGE BLANKING SIGNAL GENERATOR AND METHOD FOR GENERATING MINIMUM LEADING EDGE BLANKING SIGNAL - A minimum leading edge blanking (MLEB) signal generator is provided. The MLEB signal generator includes a buck unit and a signal generation unit. The buck unit receives an error amplification signal, and generates a reference blanking signal. The reference blanking signal has a voltage lower than a voltage of the error amplification signal. The signal generation unit receives the reference blanking signal, and generates the MLEB signal according to the current sensing signal. When the current sensing signal is equal to the reference blanking signal, the MLEB signal changes its voltage level. As such, the width of the MLEB signal is a time width of the high level or low level of the MLEB signal before the voltage level of the MLEB signal changes. The MLEB is provided to an external unit, such that the external unit can be prevented from misoperation, thus improving the electric performance in its entirety. | 03-24-2011 |
20130271184 | ZERO CROSSING DETECTOR (ZCD) CIRCUIT - A system for detecting a Zero Crossing point is provided. The system includes: a coupling unit connected between a high voltage side and a low voltage side of the system; and a zero crossing detector connected to the high voltage side and configured to divide a filtered mains voltage signal and to generate an output signal that indicates a zero crossing point of the filtered mains voltage signal. | 10-17-2013 |
327069000 |
With plural paths | 3 |
20120086474 | Field Device for Process Automation - A field device comprising a signal processing unit that generates a digital measurement, control or regulation signal, and comprises an output stage that converts the digital measurement, control or regulation signal into an analog voltage or current signal, The field device also includes a monitoring device which comprises a measuring device that detects the analog voltage or current signal and converts this signal into a digital voltage or current measurement signal, a first digital low-pass filter for filtering the digital measurement, control or regulation signal, a second digital low-pass filter having the same cut-off frequency as that of the first digital low-pass filter, a comparator downstream of the low-pass filters, and an evaluation device that generates an error message when the deviation between the compared signals exceeds a pre-determined level. | 04-12-2012 |
20130207691 | METHOD FOR PERFORMING A TRI-STATE COMPARISON OF TWO INPUT SIGNALS IN A WINDOW COMPARATOR CIRCUIT, AND WINDOW COMPARATOR CIRCUIT FOR IMPLEMENTING THE METHOD - A method performs a comparison of input signals in a window comparator circuit. In a first phase, input, ground and offset voltages are stored on capacitors. A comparison is performed between a first adapted input voltage and a second adapted input voltage added to an adapted offset voltage, to provide a first output signal. In a second phase, the voltages are stored on the capacitors in a different manner. A comparison is performed between the first adapted input voltage added to the adapted offset voltage and the second adapted input voltage, to provide a second output signal. Finally, a control of the state of the output signals is performed to determine if the comparison is in a low or high state if the output signals have a same low or high output level, or in an intermediate state if the output signals have a different output level. | 08-15-2013 |
20140320171 | ELECTRONIC CIRCUIT - An electronic circuit includes: a weighting circuit configured to generate a first current by weighting and combining a first input signal and a second input signal in accordance with a modifiable coefficient and to generate a second current by weighting and combining a first inverted signal and a second inverted signal in accordance with the coefficient, the first inverted signal being an inverted signal of the first input signal, the second inverted signal being an inverted signal of the second input signal; and a decision circuit configured to decide on an output signal by comparing the first current with the second current. | 10-30-2014 |
327071000 |
Three or more inputs | 1 |
20090201050 | FAULT DETECTION AND ISOLATION OF REDUNDANT SIGNALS - A method of detecting signal faults comprises sampling at least three redundant signals; calculating a difference signal for each unique pair-wise comparison of the at least three sampled redundant signals; comparing each difference signal to an expected distribution for the difference signals; and determining if one of the at least three redundant signals is faulty based on the comparison of each difference signal to the expected distribution. | 08-13-2009 |
Entries |
Document | Title | Date |
20080204083 | Voltage Comparator - Output currents from differentially connected transistors (t | 08-28-2008 |
20080315922 | COMPENSATED COMPARATOR FOR USE IN LOWER VOLTAGE, HIGHER SPEED NON-VOLATILE MEMORY - Briefly, in accordance with one or more embodiments, an offset compensated comparator is capable of being utilized for higher speed, lower voltage use. The comparator comprises a cross-coupled latch comprising n type devices and p type devices. The threshold mismatch between n type devices is captured on capacitors coupled to the gates of the n type devices to capture the mismatch between the devices. After the threshold mismatch is captured, the comparator can be used as a typical cross coupled latch. | 12-25-2008 |
20090021283 | HIGH SPEED LATCHED COMPARATOR - An improved latched comparator, including a track mode circuit, a latch and a latch and track select circuit. The track mode circuit includes two transistors having their sources connected together, and their respective gates receiving a respective first and second input, and their drains connected to the power supply by respective resistors. The latch includes a further two transistors having their sources connected together, a gate of each connected to a drain of the other, and their drains connected to a respective one of the common connection node of the first transistor and the first resistor, and the second transistor and the second resistor. The latch and track select circuit includes a further transistor having an source connected to a current sink connected to ground, having a gate connected to receive a track signal and having a drain connected to the common connection node of the first and second transistors, and a still further transistor having a source connected to the current sink connected to ground, having a gate connected to receive a latch signal and having a drain connected to the common connection node of the third and fourth transistors. Bipolar embodiments are also included. | 01-22-2009 |
20090115460 | VOLTAGE LEVEL CLAMPING CIRCUIT AND COMPARATOR MODULE - A voltage level clamping circuit which can be implemented in an integrated circuit (IC) and a high-speed comparator module, wherein the IC includes a parasitic diode coupled between a first voltage source and a second voltage source. The voltage level clamping circuit includes a switch module coupled between the first voltage source and the second voltage source and a comparator module having an output terminal coupled to the switch module, a first input terminal coupled to the first voltage source, and a second input terminal coupled to the second voltage source, for comparing a voltage level of the first voltage source with a voltage level of the second voltage source to generate an output signal, and transmitting the output signal to the switch module to control a conducting state of the switch module to selectively clamp the voltage level of the second voltage source. | 05-07-2009 |
20090153195 | COMPARATOR MODULE - A comparator module applied to a voltage level clamping circuit which can be implemented in an integrated circuit (IC) is provided. The IC includes a parasitic diode coupled between a first voltage source and a second voltage source. The voltage level clamping circuit includes a switch module and a comparator module. The comparator module has an output terminal, a first input terminal coupled to a first voltage source, and a second input terminal coupled to a second voltage source. The comparator module includes a current source module, a first voltage level adjusting circuit module, a second voltage level adjusting circuit module, and a comparing circuit module. | 06-18-2009 |
20090243662 | MOS INTEGRATED CIRCUIT AND ELECTRONIC EQUIPMENT INCLUDING THE SAME - A MOS integrated circuit includes: a voltage-to-current conversion circuit configured to convert first and second voltages to a first current having a current value corresponding to the first voltage and a second current having a current value corresponding to the second voltage; and a current comparison circuit configured to compare the respective current values of the first and second currents and to output a voltage showing the comparison result. Oxide films of MOS transistors of the current comparison circuit are thinner than oxide films of MOS transistors of the voltage-to-current conversion circuit. | 10-01-2009 |
20090267651 | SWITCH STATE DETECTOR AND ENCODER - A switch state detector for use in a system wherein a plurality of n switches (S | 10-29-2009 |
20100123483 | Circuit and Method for a Digital Process Monitor - A circuit and method for a digital process monitor is disclosed. Circuits for comparing a current or voltage to a current or voltage corresponding to a device having process dependent circuit characteristics are disclosed, having converters for converting current or voltage measurements proportional to the process dependent circuit characteristic to a digital signal and outputting the digital signal for monitoring. The process dependent circuit characteristics may be selected from transistor threshold voltage, transistor saturation current, and temperature dependent quantities. Calibration is performed using digital techniques such as digital filtering and digital signal processing. The digital process monitor circuit may be formed as a scribe line circuit for wafer characterization or placed in an integrated circuit die as a macro. The process monitor circuit may be accessed using probe pads or scan test circuitry. Methods for monitoring process dependent characteristics using digital outputs are disclosed. | 05-20-2010 |
20100188121 | LEAKAGE CURRENT DETECTION CIRCUIT AND LEAKAGE CURRENT COMPARISON CIRCUIT - A leakage current measurement circuit measuring a substrate leakage current and a gate leakage current in response to a variation in the size of an MOS transistor and a leakage current comparison circuit judging which one of the substrate leakage current and the gate leakage current is dominant. The leakage current measurement circuit includes a charge supply, a leakage current generator and a detection signal generator. The leakage current comparison circuit includes a charge supply, a leakage current comparator and a detection signal generator. | 07-29-2010 |
20100207663 | SEMICONDUCTOR DEVICE FOR RECEIVING EXTERNAL SIGNAL HAVING RECEIVING CIRCUIT USING INTERNAL REFERENCE VOLTAGE - A semiconductor device includes a reference voltage generating unit configured to produce a reference voltage by dividing a voltage difference between a positive clock terminal and a negative clock terminal, and a logic determination unit configured to determine a logic level of an external signal based on the reference voltage. | 08-19-2010 |
20100225358 | METHOD AND DEVICE FOR COMPARATOR OFFSET CANCELLATION - A method and a device for canceling an offset voltage in an output of a comparator circuit include sampling a set of offset voltages; applying a set of correction voltages equal in magnitude and opposite in polarity to the set of offset voltages, the set of correction voltages being applied to an output generating arrangement of the comparator circuit; and enabling output of the output generating arrangement after the set of correction voltages is applied. | 09-09-2010 |
20100289530 | ELECTRONIC APPARATUS AND CABLE DEVICE - [Object] To discriminate whether a cable in conformity with a conventional standard or a cable in conformity with a new standard is connected. | 11-18-2010 |
20110037499 | COMPARATOR FOR TECHNOLOGIES WITH TRANSIENT VARIATIONS OF TRANSISTOR PARAMETERS - This disclosure relates to permuting transistors to compensate for offsets generated by transient variations of the transistors' parameters. | 02-17-2011 |
20110043255 | TEMPERATURE RESPONSIVE BACK BIAS CONTROL FOR INTEGRATED CIRCUIT - The present invention provides a thermostatic biasing controller for use with an integrated circuit. In one embodiment, the thermostatic biasing controller includes a temperature sensing unit configured to determine an operating temperature of the integrated circuit. Additionally, the thermostatic biasing controller also includes a voltage controlling unit coupled to the temperature sensing unit and configured to provide a back-bias voltage corresponding to the operating temperature based on reducing a quiescent current of the integrated circuit. | 02-24-2011 |
20110089976 | MOS INTEGRATED CIRCUIT AND ELECTRONIC EQUIPMENT INCLUDING THE SAME - A MOS integrated circuit includes: a voltage-to-current conversion circuit configured to convert first and second voltages to a first current having a current value corresponding to the first voltage and a second current having a current value corresponding to the second voltage; and a current comparison circuit configured to compare the respective current values of the first and second currents and to output a voltage showing the comparison result. Oxide films of MOS transistors of the current comparison circuit are thinner than oxide films of MOS transistors of the voltage-to-current conversion circuit. | 04-21-2011 |
20110102021 | Differential Hysteresis Comparator Circuits and Methods - A comparator circuit for providing hysteresis comprises first and second differentially coupled transistors. The first of the differentially coupled transistors provides drain current to first and second load transistors. The second of the differentially coupled transistors provides drain current to third and fourth load transistors. In one example embodiment, the drain of the first of the differentially coupled transistors also drives the gate of the first and third load transistors, while the drain of the second of the differentially coupled transistors drives the gate of the second and fourth transistors. | 05-05-2011 |
20110109347 | SELF-POWERED COMPARATOR - Embodiments of the invention relate to an input-powered comparator. Embodiments of the invention also pertain to an active diode that includes an input-powered comparator and a switch. In a specific embodiment, the input-powered comparator only consumes power when an input source provides sufficiently high voltage. Embodiments of the active diode can be used in an energy harvesting system. The comparator can be powered by the input and the system can be configured such that the comparator only consumes power when the input is ready to provide power to the load or energy storage element. In a specific embodiment, when there is no input, or the input is too low for harvesting, the comparator does not draw any power from the energy storage element (e.g., battery or capacitor) of the system. | 05-12-2011 |
20110148468 | THRESHOLD COMPARATOR WITH HYSTERESIS AND METHOD FOR PERFORMING THRESHOLD COMPARISON WITH HYSTERESIS - A threshold comparator with hysteresis includes a comparator circuit, having a first input, for receiving an input voltage, a second input, and an output, which supplies an output voltage having a first value and a second value. A current generator, controlled by the output voltage, supplies a current to the first input in the presence selectively of one between the first value and second value of the output voltage. A selector circuit connects the second input of the comparator circuit to a first reference voltage source, which supplies a first reference voltage, in response to first edges of the output voltage, and to a second reference voltage source, which supplies a second reference voltage, in response to second edges of the output voltage, opposite to the first edges. | 06-23-2011 |
20110227608 | Voltage Comparators - A voltage comparator, comprises: a first branch comprising a first transistor, a first resistor (R | 09-22-2011 |
20110298497 | COMPARATOR CIRCUIT - A comparator circuit can achieve a reduction in current consumption with a simple configuration, and can suppress an increase in current consumption accompanying a rise in power source voltage. A current mirror circuit is connected to a power source, and gates of MOSFETs of the circuit are interconnected. An input signal is applied to a gate of an NMOSFET of the circuit. By determining the value of the signal with a constant voltage device, the voltage across a tail resistor is constant, even in the event that the power source voltage and the input signal change. | 12-08-2011 |
20120013364 | SYSTEM FOR ON-CHIP TEMPERATURE MEASUREMENT IN INTEGRATED CIRCUITS - A thermal sensor providing simultaneous measurement of two diodes. A first diode and a second diode are coupled to a first current source and a second current source, respectively. The ratio of the currents provided by the two sources is accurately know The voltage across each of the two diodes may be coupled to the input of a differential amplifier for determination of temperature. Alternatively, the first diode may be coupled to a first current source by a resistor with a known voltage drop, the second diode may be coupled to an adjustable second current source. The current in the second diode is equal to the sum of voltage drop across the first diode and the known voltage drop across the resistor. Under the established conditions, the Diode Equation may be used to calculate a temperature. | 01-19-2012 |
20120133396 | COMPARATOR - A comparator comprises a current mirror, a differential input pair, and a auxiliary circuit. The current mirror has a biasing end coupled to a power voltage, a first end, and a current outputting end coupled to an output node of the comparator. The differential input pair has a first and second input ends for respectively receiving a first voltage and a second voltage, a second and third ends, and a ground end, wherein the third end is coupled to the first end. The auxiliary circuit is coupled between the output node and the second end, and provides a minimum voltage of a comparison result output at the output node. The comparison result is the power voltage when the first voltage is larger than the second voltage, and the comparison result is the minimum voltage when the first voltage is less than the second voltage. | 05-31-2012 |
20120153991 | COMPARATOR WITH OFFSET COMPENSATION AND IMPROVED DYNAMIC RANGE - A comparator having first and second stages can provide component offset compensation and improved dynamic range. The first stage can receive first and second input signals and produce first and second output signals. The second stage can be coupled to the first stage to receive the first and second output signals at first and second input terminals of the second stage. The second stage can provide a voltage to the first and second terminals that differs from the supply voltage by less than a voltage of a diode drop. The comparator is operable to receive input voltages that reach the supply voltage. | 06-21-2012 |
20120176161 | System and Method for Preventing Bipolar Parasitic Activation in a Semiconductor Circuit - In an embodiment, a semiconductor device has a semiconductor body of a first semiconductor type, a first region of a second semiconductor type disposed in the semiconductor body, and a second region of the first semiconductor type disposed within the first region, where the second semiconductor type is opposite the first semiconductor type, and where an interface between the first region and the semiconductor body forms a first diode junction. The semiconductor device also has a comparator with a first input coupled to the semiconductor body and a second input coupled to the first region, and a switch having a first output node coupled to the first region, and a second output node coupled to the semiconductor body. The semiconductor body, the first region and the second region are configured to be coupled to a first supply voltage, a second supply voltage, and a third supply voltage, respectively. | 07-12-2012 |
20120223743 | Time Base Generator and Method for Providing a First Clock Signal and a Second Clock Signal - A time base generator and method for providing a first clock signal and a second clock signal comprising generating the first clock signal at a first clock frequency, dividing the first clock frequency by a first integer to produce a first auxiliary signal, dividing the second clock signal by a second integer to produce a second auxiliary signal, generating an error signal by individually weighting and comparing cycle durations or phasing of the first and second auxiliary signals, and generating the second clock signal by a voltage-controlled oscillator controlled by the error signal such that two clock signals of slightly different frequencies with defined time or phase delay are provided. | 09-06-2012 |
20120326752 | DESIGN METHOD AND STRUCTURE FOR A TRANSISTOR HAVING A RELATIVELY LARGE THRESHOLD VOLTAGE VARIATION RANGE AND FOR A RANDOM NUMBER GENERATOR INCORPORATING MULTIPLE ESSENTIALLY IDENTICAL TRANSISTORS HAVING SUCH A LARGE THRESHOLD VOLTAGE VARIATION RANGE - Disclosed are a design method and structure for a transistor having a relatively large threshold voltage (Vt) variation range due to exacerbated random dopant fluctuation (RDF). Exacerbated RDF and, thereby a relatively large Vt variation range, is achieved through the use of complementary doping in one or more transistor components and/or through lateral dopant non-uniformity between the channel region and any halo regions. Also disclosed are a design method and structure for a random number generator, which incorporates multiple pairs of essentially identical transistors having such a large Vt variation and which relies on Vt mismatch in pairs of those the transistors to generate a multi-bit output (e.g., a unique identifier for a chip or a secret key). By widening the Vt variation range of the transistors in the random number generator, detecting Vt mismatch between transistors becomes more likely and the resulting multi-bit output will be more stable. | 12-27-2012 |
20130027087 | DETECTOR CIRCUIT AND METHOD - In accordance with an embodiment, a controller includes a comparator, a delay element, and a timer. The delay element is connected to an input terminal of the comparator and the timer is connected to an output terminal of the comparator. The delay element may include a switch having a control electrode coupled for receiving a control signal. In accordance with another embodiment, a detection signal is generated in response to a comparison signal transitioning to a first level. | 01-31-2013 |
20130106465 | SELF-POWERED COMPARATOR | 05-02-2013 |
20130249600 | INTERPOLATION CIRCUIT AND RECEIVING CIRCUIT - An interpolation circuit includes: a generation circuit that generates interpolation data from a plurality of pieces of input data, using an interpolation coefficient, among input data inputted in time series including a data point and a transition point; a detection circuit that detects that the input data lacks at the data point; and a coefficient circuit that changes the interpolation coefficient for each given data interval, and skips a position for changing the interpolation coefficient to the transition point when the detection circuit detects the lack of the input data. | 09-26-2013 |
20140055167 | EARPHONE CONNECTION INTERFACE AND METHOD OF OPERATING EARPHONE, AND TERMINAL FOR SUPPORTING THE SAME - An earphone connection interface is provided. The earphone connection interface includes a first detector disposed at a first area to detect an electrical change according to a contact state of the first area, and a second detector disposed at a second area different from the first area to detect an electrical change according to a contact state of the second area | 02-27-2014 |
20140118028 | HIGH-PERFORMANCE ZERO-CROSSING DETECTOR - A zero-crossing detection circuit includes a comparator and circuitry. The comparator produces an output signal that is indicative of zero-crossing events in an input Alternating Current (AC) waveform. The circuitry may be configured to feed the comparator with first and second rails voltages, and to progressively increase the rails voltages during time intervals derived from the input AC waveform, so as to feed the comparator with target values of the rails voltages in time-proximity to the zero-crossing events. The circuitry may be configured to compensate for an error in detecting the zero crossing events caused by differences in amplitude of the input AC waveform, by correcting the input AC waveform provided to the comparator. The circuitry may be configured to activate the comparator during time intervals preceding respective anticipated times of the zero-crossing events, and to deactivate the comparator at least once during time periods other than the time intervals. | 05-01-2014 |
20140266309 | CDS CIRCUIT AND ANALOG-DIGITAL CONVERTER USING DITHERING, AND IMAGE SENSOR HAVING SAME - A correlated double sampling circuit includes a first input terminal receiving a ramp signal having first and second ramp sections, a second input terminal receiving a pixel signal, and a comparing circuit comparing the ramp signal with the pixel signal to generate an output signal, wherein the comparing circuit changes a point in time at which the output signal logically transitions during the first ramp section and the second ramp section in response to an applied dithering enable signal. | 09-18-2014 |
20140347100 | METHOD AND APPARATUS FOR DETERMINING TIME-VARYING LIMITATIONS OF A POWER SOURCE - A low-power method and apparatus is provided for adapting to time-varying limitations of a power source, such as a vehicle power source which is in a more-limited state when the engine is off. The supply voltage is monitored for changes using an unclocked, low-power first stage having an analog section, a voltage comparator. Upon detecting voltage changes reflective of a potential power source state change, the first stage generates an interrupt. In response, a second stage transitions from a low-power standby mode to a higher-power active mode. The second stage may include a microprocessor and is configured to confirm or disconfirm the state change. Upon confirmation, further operations are triggered. Upon disconfirmation, the second stage returns to standby mode. The first stage may include an operational amplifier whose two inputs are indicative of the supply voltage, one input having a different response rate to voltage variations than the other. | 11-27-2014 |
20150333746 | COMPARATOR SYSTEM - A comparator system includes: a clock node configured to supply a clock signal; a comparator configured to compare a signal of a first input node with a signal of a second input node in synchronization with the clock signal; and a first variable capacitance coupled between the first input node and the clock node. | 11-19-2015 |
20150341023 | Methods, Circuits, Devices and Systems for Comparing Signals - Disclosed is a method of comparing two or more signals which may include: for each of the two or more signals, charging to a fixed voltage a compensation capacitor associated with a sense path of the signal, discharging each of the charged capacitors to a threshold voltage of a transistor in its respective sense path and integrating a discharge current from each capacitor with the signal sensed on the respective sense path. | 11-26-2015 |
20150349758 | COMPARATOR WITH CONTROLLED CURRENT SUPPLY CAPACITY - A comparator includes an input-stage circuit that sets, in a first operating state, two voltage signals in a first voltage state, and changes, in a second operating state, the two voltage signals from the first voltage state to a second voltage state at different speeds, a latch-stage circuit that includes two field effect transistors and two inverters, the two field effect transistors receiving the two voltage signals at control nodes and disposed between two output nodes and a predetermined potential, the two inverters cross-coupled between the two output nodes and placed in an inactive state in the first operating state and in an active state in the second operating state, and a control circuit that controls current capacities in two paths through which drive voltages are applied to the two inverters, causing the current capacities to be different during at least part of a period of the second operating state. | 12-03-2015 |
20160043705 | VOLTAGE SAMPLING SCHEME WITH DYNAMICALLY ADJUSTABLE SAMPLE RATES - A apparatus including a clock source and a comparison circuit is presented. The clock source may be configured to generate a clock signal. The comparison circuit may be configured select a first frequency of the clock signal and to receive a plurality of voltage signal inputs for comparison. The comparison circuit may be further configured to compare a voltage level of a first voltage signal input of the plurality of voltage signal inputs to a voltage level of a second voltage signal input of the plurality of voltage signal inputs responsive to an active edge of the clock signal. The comparison circuit may also be configured to determine a comparison value corresponding to the comparison of the voltage levels and to select a second frequency of the clock signal dependent upon the comparison value, in which the second frequency is different than the first frequency. | 02-11-2016 |
20160065198 | COMPARATOR - A comparator is disclosed. The comparator has a power input terminal used to input electricity, a first and a second to-be-compared voltage input terminal used to receive the first and second to-be-compared voltage, an offset voltage adjusting circuit used to adjust an offset voltage, a comparative circuit used to compare the first to-be-compared voltage and a third to-be-compared voltage which is a sum of the second to-be-compared voltage and the offset voltage and to generate a comparative result, and a comparative result output terminal used to output the comparative result. | 03-03-2016 |
20160079982 | PUF CIRCUIT BASED ON ZTC POINT OF MOSFET - A physical unclonable function (PUF) circuit based on a zero temperature coefficient (ZTC) point of a metal oxide semiconductor field effect transistor (MOSFET), the PUF circuit including at least one PUF circuit unit. Each PUF circuit unit includes: a deviation signal generating circuit module, a signal selection circuit, and a comparison output circuit. The deviation signal generating circuit module includes two deviation signal generating circuits. A control voltage input terminal of the deviation signal generating circuit is supplied with a control voltage, and the control voltage enables a first NMOS, a second NMOS, a third NMOS, a fourth NMOS, a fifth NMOS, a sixth NMOS, a seventh NMOS, and an eighth NMOS to work at a ZTC point. | 03-17-2016 |