| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324149000 | With probe, prod or terminals | 82 |
| 20080231258 | STIFFENING CONNECTOR AND PROBE CARD ASSEMBLY INCORPORATING SAME - A stiffening connector assembly and methods of use are provided herein. In some embodiments a stiffening connector assembly includes a connector configured to be coupled to a substrate; and a mechanism coupled to the connector and configured to restrict rotational movement of the connector with respect to the substrate when coupled thereto. The mechanism may further provide a lateral degree of freedom of movement in a direction substantially parallel to the substrate. | 09-25-2008 |
| 20080231259 | INTERLOCKING ELECTRICAL TEST PROBES - A pair of interlocking electrical test probes, each probe having an interlocking end which mates or can be easily joined together with the other's end such that the pair of test probes can be operable with one hand when their respective interlocking ends are joined together. The pair of interlocking electrical test probes also capable of being operated separately or independently, one in each hand when in the unjoined state. When joined together, the pair of interlocking electrical test probes are free to pivot about their interlocked or mated ends, thus allowing the distance between their contact points to be varied while being held in one hand, therefore freeing up an electrician's or technician's other hand to hold a meter, flashlight, schematic or for some other purpose. | 09-25-2008 |
| 20080238407 | PACKAGE LEVEL VOLTAGE SENSING OF A POWER GATED DIE - A system and method for voltage sensing at active power gated cores of a multi core CPU wherein a Controlled Collapse Chip Carrier bump in a gating region for an associated core is isolatable from an ungated power region by a power gate to allow voltage sensing at a designated location with substantially no current passing there through. | 10-02-2008 |
| 20080238408 | Micro probe assembly - Embodiments of the present invention improve probes and probe assemblies. In one embodiment, the present invention includes a probe test head comprising a plurality of novel probes inserted in an array of holes in upper and lower dies of the assembly. The novel assembly includes a novel alignment layer for easy repair and maintenance of the probes. | 10-02-2008 |
| 20080238409 | Probe with a Changing Device - The invention concerns a probe with at least two test prods, which are provided on a changing device connected to the probe and which can be alternately connected to an electric waveguide running inside the probe. | 10-02-2008 |
| 20080265873 | Low profile probe having improved mechanical scrub and reduced contact inductance - A vertically folded probe is provided that can provide improved scrub performance in cases where the probe height is limited. More specifically, such a probe includes a base and a tip, and an arm extending from the base to the tip as a single continuous member. The probe arm is vertically folded, such that it includes three or more vertical arm portions. The vertical arm portions have substantial vertical overlap, and are laterally displaced from each other. When such a probe is vertically brought down onto a device under test, the probe deforms. During probe deformation, at least two of the vertical arm portions come into contact with each other. Such contact between the arm portions can advantageously increase the lateral scrub motion at the probe tip, and can also advantageously reduce the probe inductance. | 10-30-2008 |
| 20080278144 | Monitoring Device to Provide Electrical Access in Restricted Spaces - An elongated, spring-biased, connector clip carries, at a distal end thereof, a plurality of electrical contacts. The clip can be used to access a plurality of terminals or contact points in an electrical unit which are not readily accessible. Distal ends of the clip are spring-biased to move toward one another so as to clamp the electrical terminals or contact points of interest. An open region is provided between the elongated fingers of the clip so that other electrical devices in the case can be avoided during insertion and use of the clip for diagnostic or test purposes. | 11-13-2008 |
| 20090085556 | METHOD OF FABRICATING MONOLITHIC NANOSCALE PROBES - A monolithic pair of nanoscale probes, including: a substrate having a cavity that extends from a surface of the substrate into its body; a dielectric layer formed on the substrate; a pair of nanoscale probe precursors formed over the dielectric layer; a plurality of sub-monolayers of electrode material selectively atomic layer deposited over the pair of nanoscale probe precursors. The dielectric layer includes a window that extends through it to the cavity of the substrate such that a portion of the dielectric layer adjacent to the window extends over the cavity. The pair of nanoscale probe precursors includes a pair of edges facing each other across the window. These edges correspond to tips of the pair of nanoscale probes. The sub-monolayers of electrode material include the pair of edges, so that a distance between the tips of the nanoscale probes is between about 0.1 nm and about 20 nm. | 04-02-2009 |
| 20090146644 | ELECTRIC METER HAVING A DETACHABLE MEASURING BAR - An electric meter having a detachable measuring bar includes a main body, a first measuring bar and a second measuring bar assembly. One end of the main body is formed with a supporting portion. The first measuring bar has a connecting portion and a probe formed at the other end of the connecting portion. The connecting portion is detachably connected with the supporting portion of the main body. The second measuring bar assembly comprises a second measuring bar and a lead. Both ends of the lead are connected to the main body and the second measuring bar. Via this arrangement, when the first measuring bar is worn or damaged in use, the first measuring bar can be replaced, thereby reducing the purchasing cost of the electric meter. | 06-11-2009 |
| 20090167293 | DIFFERENTIAL PROBE DEVICE FOR MEASURING ELECTRICAL DIFFERENTIAL SIGNALS AND METHODS FOR MEASURING SIGNALS USING A DIFFERENTIAL PROBE DEVICE - A differential probe device is provided that has a scissor-type configuration that allows the inter-tip ground path length to be very short, thereby ensuring that the probe device will have a small ground inductance. Providing the probe device with a small ground inductance ensures that the ground inductance will not cause the bandwidth of the probe device to be unduly limited, even at higher frequencies. The configuration of the probe device also enables the ground areas on the arms to remain in continuous contact over the range of available span widths between the tips, which also helps to ensure that the ground inductance is kept small and generally fixed. Also, the configuration of the probe device enables the proximal ends of the probe arms to be kept small in size to accommodate DUT layouts having small test features and/or test features that are close together. | 07-02-2009 |
| 20090261815 | Stimulus Responsive Nanoparticles - Disclosed are various embodiments of methods and systems related to stimulus responsive nanoparticles. In one embodiment includes a stimulus responsive nanoparticle system, the system includes a first electrode, a second electrode, and a plurality of elongated electro-responsive nanoparticles dispersed between the first and second electrodes, the plurality of electro-responsive nanorods configured to respond to an electric field established between the first and second electrodes. | 10-22-2009 |
| 20090267590 | METHOD OF ENABLING TRIGGERING AN OSCILLOSCOPE - A method of enabling triggering an oscilloscope includes placing a tip portion of a probe, electrically connected to the oscilloscope, on an electrical circuit, applying pressure to the probe tip, and establishing an electrical contact inside the probe as a result of pressure applied to the probe tip. The electrical contact closes an electrical circuit that triggers the oscilloscope. | 10-29-2009 |
| 20090295372 | Nanoscopic electrode molecular probes - The present invention relates to a method and apparatus for enhancing the electron transport property measurements of a molecule when the molecule is placed between chemically functionalized carbon-based nanoscopic electrodes to which a suitable voltage bias is applied. The invention includes selecting a dopant atom for the nanoscopic electrodes, the dopant atoms being chemically similar to atoms present in the molecule, and functionalizing the outer surface and terminations of the electrodes with the dopant atoms. | 12-03-2009 |
| 20090315539 | Marine electromagnetic acquisition apparatus with foldable sensor arm assembly - A marine electromagnetic acquisition apparatus includes a sensor module having at least one sensor associated therewith. A sensor arm assembly is coupled to the sensor module. The sensor arm assembly has at least one sensor arm and at least one sensor disposed along the at least one sensor arm. An actuator is coupled to the sensor arm assembly for moving the sensor arm assembly between a folded position and an unfolded position. | 12-24-2009 |
| 20100007337 | PLASMA-FACING PROBE ARRANGEMENT INCLUDING VACUUM GAP FOR USE IN A PLASMA PROCESSING CHAMBER - An arrangement for measuring process parameters within a processing chamber is provided. The arrangement includes a probe arrangement disposed in an opening of an upper electrode. Probe arrangement includes a probe head, which includes a head portion and a flange portion. The arrangement also includes an o-ring disposed between the upper electrode and the flange portion. The arrangement further includes a spacer made of an electrically insulative material positioned between the head portion and the opening of the upper electrode to prevent the probe arrangement from touching the upper electrode. The spacer includes a disk portion configured for supporting an underside of the flange portion. The spacer also includes a hollow cylindrical portion configured to encircle the head portion. The spacer forms a right-angled path between the o-ring and an opening to the processing chamber to prevent direct line-of-sight path between the o-ring and the opening to the processing chamber. | 01-14-2010 |
| 20100039101 | ELECTRICAL TESTING DEVICE - An electrical testing device used for testing an electronic device under test. The electrical testing device includes a cable configured for receiving a test signal and transmitting the received test signal therethrough, and a testing unit connected to the cable and configured for analyzing the test signal. The cable includes a flexible body, a number of first connectors connected to an end of the flexible body configured for receiving a test signal from the electronic device under test, and a second connector connected to the other end of the flexible body configured for transmitting the test signal between the flexible body and the testing unit. | 02-18-2010 |
| 20100045264 | PROBE FOR TEMPORARILY ELECTRICALLY CONTACTING A SOLAR CELL - A probe for temporarily electrically contacting a solar cell for testing purposes, has at least one elastic, electrically conductive contact element for producing the electrical contact, at least one reference sensor for indicating a distance of the contact element to an external reference surface using an electrical signal of the reference sensor, and a mounting plane to which the tip of the contact element is oriented. The probe ensures a secure electrical contact of the solar cell in a testing station with minimal mechanical stress, and is also suitable for use in an industrial continuous production method. | 02-25-2010 |
| 20100045265 | METHOD AND DEVICE FOR FORMING A TEMPORARY ELECTRICAL CONTACT TO A SOLAR CELL - In a method and devices for forming a temporary electrical contact to a solar cell for testing purposes, probes form a contact to the electrode terminals of a solar cell held by a sample holder. The probes are held by a probe holder and exhibit an elastic, electrically conductive contact element and at least one reference sensor. In order to form a contact, the solar cell and the probes are positioned in relation to each other, and then a probe is placed on an electrode terminal of the solar cell. To this end, a feed motion of the probe is carried out until a reference sensor of the probe generates a reference signal upon reaching a predefined distance. Then the feed motion is continued by a predefined path that goes beyond the contact element making contact with the electrode terminal, in order to carry out an overtravel. | 02-25-2010 |
| 20100045266 | HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS OF USE THEREOF - The present invention is directed to a high density test probe which provides a means for testing a high density and high performance integrated circuits in wafer form or as discrete chips. The test probe is formed from a dense array of elongated electrical conductors which are embedded in an compliant or high modulus elastomeric material. A standard packaging substrate, such as a ceramic integrated circuit chip packaging substrate is used to provide a space transformer. Wires are bonded to an array of contact pads on the surface of the space transformer. The space transformer formed from a multilayer integrated circuit chip packaging substrate. The wires are as dense as the contact location array. A mold is disposed surrounding the array of outwardly projecting wires. A liquid elastomer is disposed in the mold to fill the spaces between the wires. The elastomer is cured and the mold is removed, leaving an array of wires disposed in the elastomer and in electrical contact with the space transformer The space transformer can have an array of pins which are on the opposite surface of the space transformer opposite to that on which the elongated conductors are bonded. The pins are inserted into a socket on a second space transformer, such as a printed circuit board to form a probe assembly. Alternatively, an interposer electrical connector can be disposed between the first and second space transformer. | 02-25-2010 |
| 20100052657 | MEASUREMENT CONNECTOR - A connector includes a connector body, a sensor mounted to the connector body, and a connector interface configured to connect to an external device. | 03-04-2010 |
| 20100109651 | DEVICE FOR CONDUCTIVITY MEASUREMENT IN A CONTROLLED ENVIRONMENT AND METHOD THEREOF - The invention provides a device for measuring the conductivity in a controlled environment and method thereof. The device comprises (i) a sample comprising a first material such as protonic conductor, (ii) an environmental medium comprising a controlled level of a second material such as water vapor, and (iii) a separator such as a sample holder. The separator isolates the sample from the environmental medium; the separator substantially prevents the first material from migrating into the environmental medium; and the separator allows the second material to migrate between the environmental medium and the sample. The invention resolves the problems of e.g. interfacial impedance, humidity equilibration and the loss of contact between the sample and the electrode upon sample shrinking. | 05-06-2010 |
| 20100123455 | HIGH VOLTAGE CONNECTOR AND METHOD HAVING INTEGRATED VOLTAGE MEASUREMENT PROBE POINTS - An electrical connector adapted for staged disassembly to test for high voltage includes a plug having an enclosed electrical terminal with a first opening exposing the terminal and a socket having another enclosed electrical terminal with an opening exposing the other terminal. The socket opening is substantially complementary to the first opening to receive the plug sufficiently into the socket to electrically engage the terminals in first and second positions. A port in one of the socket or plug provides access to one of the terminals in one of the positions but is obstructed from access to a terminal in the other of the positions. The port is small enough to prevent a finger from accessing a terminal but large enough to receive an electrical meter probe for voltage testing. A latch on the box portions positions the port in each of the two positions. | 05-20-2010 |
| 20100127692 | MEMS BASED KELVIN PROBE FOR MATERIAL STATE CHARACTERIZATION - A device and method for monitoring the material health of a structure, providing a miniaturized MEMS Kelvin probe within a housing, wherein the Kelvin probe comprises a conductive plate formed of a stable metal and positioned substantially parallel to the structure; a piezoelectric vibrator for vibrating the conductive plate; and an electrical circuit connected to the conductive plate and the structure, wherein the conductive plate and the structure form a capacitor. The device is contained in one small, lightweight package that can be placed at one or more locations of interest. The sensor can be left in-place for continuous monitoring or for active testing at desired intervals, or be brought to the aircraft at desired intervals. | 05-27-2010 |
| 20100141241 | PROBE FOR MEASURING AN ELECTRIC FIELD - In one embodiment of the present invention, a probe for measuring an electrical field is disclosed, including at least one antenna, a detection circuit for each antenna, which detection circuit is connected to the corresponding antenna for detecting an RF signal, and a housing in which is received a processing circuit for processing a detected signal, wherein the housing is conductive and includes at least partially a substantially spherical surface for the purpose of forming a ground plane for the at least one antenna, wherein the detection circuit is arranged outside the housing and is coupled to the processing circuit via a feedthrough capacitor with a feedthrough terminal and a shield, wherein the feedthrough terminal connects the detection circuit conductively to the processing circuit and the shield is connected conductively to the conductive surface of the housing. | 06-10-2010 |
| 20100148759 | METHOD AND APPARATUS FOR INDEXING AN ADJUSTABLE TEST PROBE TIP - Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application. | 06-17-2010 |
| 20100171487 | ELECTROSENSING ANTIBODY-PROBE DETECTION AND MEASUREMENT METHOD - A method of electrosensing an antigen in a test sample using a sensor is disclosed. The sensor has two electrodes electrically disconnected and physically separated from each other and a layer of antibody immobilized on the surface of at least one of the electrodes. The antibody has specific binding reactivity with the antigen. The method comprises tethering conductivity promotion molecules over and/or distributing between the antibody-populated electrodes for improving electrical conductivity characteristics across the two electrodes, and measuring electrically across the electrodes after the test sample comes into contact with the antibody-populated electrodes. The antibody captures the antigen present in the test sample thereby altering the improved electrical conductivity characteristic across the two electrodes in which an amount representative of the altering providing an indication for electrosensing of the antigen. | 07-08-2010 |
| 20100176796 | Apparatus for testing electrical characteristics - An apparatus for testing electrical characteristics includes a probe configured to contact a test object, a DC signal transmission line configured to transmit a DC signal to the probe, a frequency signal transmission line configured to transmit a frequency signal to the probe, and a line selection unit configured to selectively connect only one of the frequency signal transmission line and the DC signal transmission line to the probe at a time in accordance with a selected test. | 07-15-2010 |
| 20100194383 | APPARATUS FOR DETERMINING AND/OR MONITORING A PROCESS VARIABLE - An apparatus for determining and/or monitoring at least one process variable of a medium. The apparatus includes: at least one probe unit; and at least one electronics unit, which supplies the probe unit with an operating signal and which receives from the probe unit a received signal. The probe unit includes at least one probe electrode and at least one guard electrode; and the probe electrode and the guard electrode are surrounded, at least partially, by at least one insulating unit. The the insulating unit has, in the region of the guard electrode, a smaller thickness than in the region of the probe electrode. | 08-05-2010 |
| 20100201349 | METHOD FOR MEASURING I-V CHARACTERISTICS OF SOLAR CELL, AND SOLAR CELL - An aspect of the invention provides a method for measuring I-V characteristics of a solar cell, the solar cell comprising a plurality of fine line-shaped electrodes formed on a first surface in a predetermined direction; and a coupling line formed on the first surface that electrically couples at least two fine line-shaped electrodes among the plurality of fine line-shaped electrodes, the coupling line having a line width larger than a line width of the fine line-shaped electrodes. The method includes: contacting a probe pin for voltage measurement with the coupling line; contacting two or more probe pins for current measurement electrically connected to each other with two or more fine line-shaped electrodes including the fine line-shaped electrodes coupled to each other by the coupling line among the plurality of fine line-shaped electrodes; and measuring I-V characteristics while irradiating the first surface with light. | 08-12-2010 |
| 20100225306 | PRINTED CIRCUIT BOARD WITH AN ADAPTABLE CONNECTOR MODULE - A printed circuit board including a P1 connector, a P2 connector, and a first common connector configured to connect an application-specific connector to the printed circuit board. | 09-09-2010 |
| 20100289482 | Method and Apparatus for Monitoring Electrical Properties of Polymerization Reactor Wall Film - Disclosed is a method for using at least one static probe during polymerization in a fluid bed polymerization reactor system to monitor a coating on a surface of the reactor system and a distal portion of each static probe, wherein the coating is exposed to flowing fluid within the reactor system during the reaction. The surface may be a reactor bed wall (exposed to the reactor's fluid bed) and the coating is exposed to flowing, bubbling fluid within the fluid bed during the reaction. The method may include steps of: during the polymerization reaction, operating the static probe to generate a sequence of data values (“high speed data”) indicative of fluid flow variation (e.g., bubbling or turbulence), and determining from the high speed data at least one electrical property of the coating (e.g., of a portion of the coating on the distal portion of the static probe). | 11-18-2010 |
| 20100308798 | SYSTEM FOR OPERATING DIFFERENTIAL PROBE - A system for operating a differential probe which includes a first metal extension and a second metal extension having the same structures is disclosed. Each of the metal extensions includes a rotatable arm, a rotatable base, and a contact end. The rotatable base and contact end of each of the metal extensions extend from two ends of the corresponding rotatable arm at an angle, the contact ends and the rotatable bases of the metal extensions are parallel to each other. The system controls a mechanical arm to adjust a vertical distance between the contact ends to be equal to a required vertical distance by rotating the first metal extension around the rotatable base of the second metal extension clockwise by a rotated angle, and rotating the second metal extension around the rotatable base of the first metal extension counterclockwise by the rotated angle. | 12-09-2010 |
| 20110001469 | Unbiased non-polarized direct current voltage divider float circuit - A non-polarized and high impedance voltage divider/float circuit may be used as a diagnostic instrument. The circuit may permit a non-polarized DC connection and permit greater voltage spans when illuminating polarity indicating devices. The diagnostic instrument of the present invention may be non-biased (that is, it may be hooked up to the power supply in either direction), may allow testing systems of various voltages and may be capable of seeing signals of opposite polarities simultaneously. | 01-06-2011 |
| 20110018524 | System and Method for Nondestructive Detection of Electrical Sensors and Cables - A system and method for noninvasive and nondestructive identification of electrical sensors and cables in multi-channel data acquisition (DAQ) systems includes a probe comprising a slotted, wound toroid in series with a blocking capacitor connected to, and powered by, a frequency generator. The frequency generator is tuned to output a test signal set at a multiple harmonic frequency of the DAQ system carrier or scanner frequency. This test signal is then induced into the electrical sensor cable by placing the cable into the toroid slot, whereby the sensor cable provides a path for the test signal to combine with the DAQ system operating frequency so that the resultant combined signal is displayed on the DAQ system monitor. In this way the specific sensor and cable may be identified to avoid the normal procedure of disconnecting or shorting the sensor cables. | 01-27-2011 |
| 20110018525 | AUTONOMOUS SYRINGE AND GRID SYSTEMS - A syringe and grid interface ( | 01-27-2011 |
| 20110043192 | COAXIAL-CABLE PROBE STRUCTURE - A coaxial-cable probe structure comprises a coaxial cable and a probing element. The coaxial cable is formed by filling and fixing an inner conductor into an outer conductor via a dielectric material. The dielectric material of the coaxial cable and the outer conductor are provided with a cutting surface. The inner conductor protrudes from the cutting surface and forms a terminal end. The coaxial cable is provided with a cutting part and the cutting part is provided with an oblique surface relative to the coaxial cable so as to have the inner conductor, the dielectric material, and the outer conductor exposed from the oblique surface. The oblique surface extends to the terminal end of the inner conductor. The probing element includes a first, a second, and a third probe and each probe has a front and a rear interface. The front interface of the second probe is connected with part of the inner conductor exposed from the oblique surface. The front interfaces of the first and third probes are electrically connected to the outer conductor of the coaxial cable. The rear interface of each probe is used to contact the bonding pad of an element under test. | 02-24-2011 |
| 20110062946 | Eddy Current Probes Having Magnetic Gap - An eddy current probe uses magnetic gap The probe has a small size; and coil number in the probe is reduced. Hence, the probe can move easily inside and outside a tube and detect an end of the tube as close as possible. | 03-17-2011 |
| 20110101961 | METHOD FOR MEASURING HEARING AID COMPATIBILITY - A method for measuring hearing aid compatibility (HAC) includes providing a probe and scanning testing points of a testing region obtained by the probe. The probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. | 05-05-2011 |
| 20110101962 | PROBE - A probe includes a circuit board, an electric field detecting probe, and a magnetic field detecting probe. The electric field detecting probe and the magnetic field detecting probe are located on the circuit board. An anti-jamming distance between the two detecting probes is a multiple of 5 millimeters and is greater than or equal to 10 millimeters. | 05-05-2011 |
| 20110273165 | REPLACEABLE PROBE HEAD - A probe head is disclosed that is detachable from a probe body containing electronics. The probe head including a housing enclosing a sensor and at least part of an electrical connector electrically coupled to the sensor. The housing has a coupling member positioned to detachably connect the housing to the probe body, and when the probe head and probe body are coupled, the electrical connector electrically couples the sensor to the electronics in the probe body. | 11-10-2011 |
| 20110309823 | Replaceable Probe Head Having An Operational Amplifier - A detachable, replaceable, and/or disposable probe head connectable to a probe body containing electronics, a probe that includes the probe head and the probe body, and the combination of a sonde and the probe are described herein. The probe head includes a housing that has a coupling member for detachably connecting the housing to the probe body, in particular to the electronics in the probe body. The probe head also includes a sensor and an electrical connector at least partially housed within the housing, and an operational amplifier electrically coupling the sensor to the electrical connector. | 12-22-2011 |
| 20120013326 | Needle head - The present idea refers to a needle head, its use in a probe arrangement, and a method for electrically contacting multiple electronic components. The needle head comprises a body with a lower surface, needle electrodes emerging from the lower surface, and multiple outlets arranged in the lower surface. A channel is arranged between an inlet in the body and the outlets for conveying a medium from the inlet to the outlets. By this means, electronic components arranged in close distance under the lower surface of the needle head are directly exposed to the medium which provides a test environment during a test of the electronic components. | 01-19-2012 |
| 20120062213 | MICROPROBE, RECORDING APPARATUS, AND METHOD OF MANUFACTURING MICROPROBE - According to one embodiment, a microprobe includes a supporting base, an insulating layer, and an electrode layer arrayed in a first direction in this order. A principal surface of the microprobe is formed in a second direction different from the first direction. A step is formed on at least the electrode layer on the principal surface, and the electrode layer is partitioned into a first area and a second area by the step. | 03-15-2012 |
| 20120091999 | INSULATED PROBE PIN AND METHOD FOR FABRICATING THE SAME - An insulated probe pin | 04-19-2012 |
| 20120119726 | MEASURING MACHINE AND MEASURING METHOD FOR MEASURING DIFFERENTIAL SIGNALS - A measuring device for the measurement of differential signals including a real-time portion, which contains two probes, a signal adder and a triggering device. The probes each record a partial signal of a differential signal. The signal adder adds the partial signals to form a differential signal. The triggering device implements a triggering on the basis of the differential signal. | 05-17-2012 |
| 20120126794 | Sensor Assembly And Methods Of Assembling A Sensor Probe - A method of assembling a sensor probe includes positioning an emitter within a probe cap, wherein the emitter is configured to generate an electromagnetic field from at least one microwave signal. An inner sleeve is coupled to the probe cap and an outer sleeve is coupled to the inner sleeve. | 05-24-2012 |
| 20120139528 | FORCE COMPENSATED PROBE - A force compensated probe for electrical measurement is provided and includes a support structure having a back plate and sidewalls, a probe for electrical measurement of an article and an elastic base disposed to supportively couple the probe to the back plate such that the probe normally protrudes away from the back plate beyond distal edges of the sidewalls, and, when the probe is applied to the article for the electrical measurement such that components of the support structure contact the article, a predefined load is consistently applied to the elastic base. | 06-07-2012 |
| 20120176122 | CONTACT PROBE, LINKED BODY OF CONTACT PROBES, AND MANUFACTURING METHODS THEREOF - A contact probe, a method of manufacturing a linked body of contact probes, and a method of manufacturing a contact probe, which allow for stable use are provided. Contact probe includes a contact portion to be brought into contact with an object to be measured, a main body portion connected to the contact portion, and a covering portion covering the whole circumference of a cross section of the main body portion in a direction intersecting with an extensional direction, excluding the contact portion. The covering portion is of a material having a lower volume resistivity than a volume resistivity of a material of the main body portion. | 07-12-2012 |
| 20120194173 | CONNECTOR, PROBE, AND METHOD OF MANUFACTURING PROBE - A connector includes multiple probes and a first insulator part and a second insulator part joined to cover the probes. Each of the probes has a monolithic structure of a single bent metal plate. | 08-02-2012 |
| 20120206128 | Electrochemical Corrosion Potential Probe Assembly - An electrochemical corrosion potential (ECP) probe assembly for monitoring ECP in a high velocity reactor line includes an airfoil shaped ECP cover that improves the streamlines over and around an ECP sensor. The airfoil shaped cover includes flow holes drilled normal to the surface of the ECP cover. As such, the direction of flow of reactor water into the ECP probe assembly is altered to reduce the flow rate internal to the ECP cover sufficiently to prevent damage to the ECP probes. To facilitate use as a retrofit component, the ECP cover may have an elliptical section that is contiguous to a circular section that conforms to the geometry of existing probe wells and probe sub-assemblies. | 08-16-2012 |
| 20120293162 | METHOD FOR TESTING MULTIPLE COUPONS - A method for testing multiple coupons is described. The x, y, and theta offset coordinates of a reference structure for each coupon are determined. Additionally, the x and y offset coordinates between the reference structure and the first test device are determined. After the reference data from all of the coupons have been determined, the testing sequence for all of the coupons can be initiated and completed without further intervention. | 11-22-2012 |
| 20120293163 | ON-CHIP MILLIMETER-WAVE POWER DETECTION CIRCUIT - An on-chip millimeter wave power detection circuit comprises a high resistive probe for voltage sensing of millimeter wave signals, the probe comprises a metal line perpendicularly connected to a transmission line, at one end, and further connected to a power root mean square (RMS) detector at the other end; and the RMS detector for measuring a RMS voltage value of the sensed millimeter wave signals, wherein the RMS detector is characterized by a known impedance. | 11-22-2012 |
| 20120313621 | PROBE BONDING METHOD HAVING IMPROVED CONTROL OF BONDING MATERIAL - In assembly of probe arrays for electrical test, a problem can arise where a bonding agent undesirably wicks between probes. According to embodiments of the invention, this wicking problem is alleviated by disposing an anti-wicking agent on a surface of the probe assembly such that wicking of the bonding agent along the probes toward the probe tips is hindered. The anti-wicking agent can be a solid powder, a liquid, or a gel. Once probe assembly fabrication is complete, the anti-wicking agent is removed. In preferred embodiments, a template plate is employed to hold the probe tips in proper position during fabrication. In this manner, undesirable bending of probes caused by introduction or removal of the anti-wicking agent can be reduced or eliminated. | 12-13-2012 |
| 20130002238 | HIGH-FREQUENCY (HF) TEST PROD - A high frequency test prod for electrically contacting at least one contact point of a specimen, using an HF coaxial line to connect the test prod housing and the contact unit electrically and mechanically between the housing and the contact unit, the HF coaxial line having an external conductor, an internal conductor arranged coaxially to the external conductor, and a gas or vacuum dielectric arranged between the external conductor and internal conductor, the external conductor designed as a hollow profile section from a rigid, elastically deformable material, wherein the internal conductor is arranged coaxially to the hollow profile section. | 01-03-2013 |
| 20130002239 | High Voltage Sensing Mechanism with Integrated On-Off Switch - The present invention is an efficient high voltage sensing mechanism that operates only when an individual needs to test the voltage across a wire. The present invention attaches around a tested wire using a jaw and a hook. The hook is tensioned using an expansion spring. The operator propels the hook outwards from the jaw, around the tested wire; thereafter, the expansion spring retracts to latch onto the tested wire against the jaw. An on-off switch is integrated into the mechanical hook device. As the hook is propelled outwards, the on-off switch moves into the “on” position, which powers the electrical processing and voltage analysis equipment. Once the hook is returned to the initial position, the on-off switch moves to the “off” position. This arrangement allows the present invention to remain unpowered for any instance a wire is not being tested. The present invention detects voltage through capacitive coupling. | 01-03-2013 |
| 20130027026 | Probe Head - A probe head includes a housing having a first housing unit to be affixed on a machine, and a second housing unit on which a stylus is supported so as to be deflectable. The second housing unit is movably supported on the first housing unit so as to allow a deflection. The probe head furthermore has a switching unit, which includes a first contact element and a second contact element, the contact elements being arranged such that when the second housing unit is deflected relative to the first housing unit, the contact elements are able to be brought into mutual contact at different points as a function of the direction of deflection, whereby an electrical switching signal is able to be triggered by this contact. | 01-31-2013 |
| 20130119976 | High voltage detection in power system electrical high voltage line - An electrical power line voltage measurement device comprises a probe including an insulated shield supporting an electrode to sense voltage from one phase of the power line. The shield houses a high voltage resistor connected in series with the electrode. A meter comprises a housing operatively associated with the shield and enclosing a measurement circuit electrically connected to the high voltage resistor for measuring leakage current. A calibration circuit correlates measured leakage current to approximate power line voltage. A display is driven by the measurement circuit for displaying approximate power line voltage. | 05-16-2013 |
| 20130249532 | Probing Chips during Package Formation - A method includes bonding a first package component on a first surface of a second package component, and probing the first package component and the second package component from a second surface of the second package component. The step of probing is performed by probing through connectors on the second surface of the second package component. The connectors are coupled to the first package component. After the step of probing, a third package component is bonded on the first surface of the second package component. | 09-26-2013 |
| 20130249533 | Multifunction Test Instrument Probe - A multifunction test instrument probe includes a housing having a hollow bore with an open end. A clamp plunger is carried in the hollow bore, with a first end including a thumb press, and a second end including an alligator clamp having a pair of jaws, with a compression spring normally biasing the thumb press away from the housing, and normally biasing the alligator clamp substantially within the hollow bore proximate the open end. A point plunger is also carried in the bore, with a first end including a thumb press, and a second end terminating in a point, with a second compression spring normally biasing the thumb press away from the housing, and biasing the point within the hollow bore proximate the open end. When the clamp plunger is depressed, the alligator clamp is extended from the open end and the jaws are urged open by a jaw spring, and when the clamp plunger is released, the compression spring acts to retract the alligator clamp back towards the hollow bore and the jaws are urged closed by contact with the open end. When the point plunger is depressed, the point is extended from the open end. When the clamp plunger is again depressed, the point retracts into the housing. | 09-26-2013 |
| 20130257413 | System and Method for Mounting Components Within a Utility Meter - An embodiment of a system includes a utility meter having an enclosure, a first component and a second component in the enclosure, and a mounting assembly configured to couple the first and second components together in the enclosure. The mounting assembly includes a first mount having first and second prongs disposed about an intermediate space, a second mount configured to extend bi-directionally into the intermediate space between the first and second prongs in opposite first and second directions, and a snap-fit fastener. The snap-fit fastener includes first and second snap portions configured to bi-directionally engage one another in the opposite first and second directions to secure the first and second mounts. | 10-03-2013 |
| 20130257414 | SYSTEM AND METHOD TO PROVIDE TALKING FEATURE AND INTERACTIVE VOICE MENU IN PHASING METERS - A high voltage detection device comprises a probe comprising an electrode for sensing a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing a control for measuring parameters of line voltage. The control comprises an input module for connection to the probe to develop a voltage signal. A signal processing module receives the voltage signal and determines parameters of line voltage and drives an audio module. The audio module provides an audio output representing the determined parameters of line voltage. | 10-03-2013 |
| 20130307527 | RETRACTABLE TEST PROBE - The retractable test probe includes a main sleeve, a needle and a rotation positioning mechanism. The needle is rooted in the main sleeve. The rotation positioning mechanism includes an eccentric incoaxially fastened to the needle and a flexible sleeve around the eccentric and in the main sleeve. When the needle is turned towards a specific direction, the eccentric will be firmly fastened in the main sleeve through the flexible sleeve, when the needle is turned reversely, the eccentric will be released from the flexible sleeve to be retractably movable. | 11-21-2013 |
| 20130320962 | Measuring Instrument for Testing Voltage - A measuring instrument, in particular a voltage tester, is provided having two probes which are arranged in separate housings through which connecting cables extend. The housings are magnetically attractive, because of either a first magnet arranged on a first one of the housings for cooperation with the magnetic material of the other housing, or a corresponding pair of opposed magnets provided in magnetically attractive relation on the two housings, respectively. Recesses are provided in the second housing opposite the corresponding magnets of the first housing. Corresponding pivot ribs extend circumferentially around the housings in the space between the first one magnet and the adjacent probe end, thereby to permit accurate spacing of the probes during the taking of a test measurement. | 12-05-2013 |
| 20130328549 | ROTATING MOBILE PROBE AND PROBING ROD USING THE SAME - A probing rod includes a main casing and a rotating mobile probe, and the rotating mobile probe includes a conductive tube, a needle and a rotating mobile structure, and the conductive tube is contained in the main casing; the rotating mobile structure includes an outer thread formed on the needle and an inner thread formed on the conductive tube, and the outer thread and the inner thread are screwed with each other, such that the needle can perform a linear movement with respect to the conductive tube. Therefore, the needle can be moved with respect to the main casing to achieve the effect of adjusting the length of the probe that extends out from the main casing. | 12-12-2013 |
| 20140015518 | LENS MODULE TESTING DEVICE - A device for testing a multiplicity of lens modules includes a base, a circuit board, a connection member, and a support assembly. The base includes a support surface. The support surface includes a loading area and a slide area. The circuit board is positioned on the base in the loading area. The circuit board includes a number of signal input interfaces. The connection element includes a shell and a number of elastic and flexible metal elements. Each metal element connects to the number of signal input interfaces. The support assembly supports the lens modules, and can slide in the slide area to bring the metal elements into electrical contact with the lens modules. | 01-16-2014 |
| 20140028291 | SENSOR FOR MEASURING TILT ANGLE BASED ON ELECTRONIC TEXTILE AND METHOD THEREOF - Disclosed are a sensor for measuring a tilt angle based on electronic textile according to the present invention and a method thereof. A sensor for measuring a tilt angle based on electronic textile according to the present invention includes a plurality of textile electrodes disposed at predetermined uniform intervals on a textile surface; a textile conductive wire of which one end is connected to a center between the plurality of textile electrodes; and a metal bead connected to another end of the textile conductive wire to thereby be connected to the textile surface. | 01-30-2014 |
| 20140117976 | INSULATED TEST CLIP COVER ASSEMBLY - An insulator for a test clip is described. The insulator includes a first clip cover configured to removably attach to a top portion of a test clip. The test clip comprises a top portion and a bottom portion pivotally attached to the top portion along a pivot axis. The insulator also comprises a second clip cover configured to removably attach to the bottom portion of the test clip. Each of the first and the second clip cover comprises one or more retaining elements configured to secure the clip cover to its respective portion of the test clip. In some implementations, each of the first and the second clip cover comprises one or more cantilevered retaining segments configured to extend over a portion of the test clip in order to secure the first and the second clip covers to the test clip. | 05-01-2014 |
| 20140125323 | Electrical Connection Module With Interruptible Circuit - An electrical connecting module includes a first electrical connection terminal with a first connection pole and a second connection pole; a module element with a second electrical connection terminal, which comprises a first connection pole and a second connection pole, and with a third electrical connection terminal, which comprises a first connection pole and a second connection pole. A test channel is provided for accommodating a test probe. wherein the test channel is intended for making electrical contact with the second connection pole of the first connection terminal by means of the test probe when there is an electrical connection between the first connection pole of the first connection terminal and the first connection pole of the third connection terminal and when the electrical connection between the second connection pole of the first connection terminal and the second connection pole of the third connection terminal is disconnected. | 05-08-2014 |
| 20140159705 | WAFER EXAMINATION DEVICE AND WAFER EXAMIINATION METHOD - A wafer examination device includes a probe, a fusion section and a measurement section. The probe is made of a metal which reacts with silicon carbide to produce silicide. The fusion section fuses the probe to a silicon carbide wafer as an examined object. The measurement section measures an electrical property of the silicon carbide wafer through the fused probe. | 06-12-2014 |
| 20140191748 | SIGNAL TEST DEVICE - A signal test device includes a probe column, a probe pin, and a cable. The probe pin includes a first end contacted with an electronic device and a second end located inside the probe column. A first conductive piece set in the probe column is connected to a signal line of the cable. A second conductive piece is set apart from and below the first conductive piece in the probe column, and is connected to the second end of the probe pin. When the first end of the probe pin is pressed to the electronic device, the probe pin moves into the probe column and the second conductive piece contacts the first conductive piece. When the second conductive piece contacts with the first conductive piece, a snapshot of a waveform of the electronic device is captured and shown on the oscilloscope. | 07-10-2014 |
| 20140197817 | Current Probe, Current Probe Measurement System, and Current Probe Measurement Method - Provided is a current probe which reduces, in current measurement, a measurement error due to an unnecessary magnetic field generated from a subject not to be measured, said subject being adjacent to a subject to be measured. The current probe is characterized in having: a sensor that detects a magnetic field; a transmission path connected to the sensor; and a pair of conductive members, which protrude toward the front from a leading edge portion of the sensor, and are provided to face the sensor. The current probe is also characterized in that a front portion of the sensor, said portion being surrounded by the protruding portions of the conductive members, is opened in the direction of a plane that faces the conductive members. | 07-17-2014 |
| 20140247037 | PROBE APPARATUS - A probe apparatus | 09-04-2014 |
| 20140253103 | CURRENT SENSOR - A current sensor comprises a housing of plastic, a current conductor with integrally shaped first and second electrical terminals, through which a current to be measured is supplied and discharged, third electrical terminals, and a semiconductor chip having at least one magnetic field sensor, which is sensitive to a component of the magnetic field generated by the current flowing through the current conductor running perpendicularly to the surface of the semiconductor chip. The first and second electrical terminals are arranged at a first side of the housing, the third electrical terminals are arranged at a side of the housing opposite to the first side. The semiconductor chip is mounted as flip chip. The semiconductor chip comprises first bumps, which make electrical connections to the third terminals, and second bumps located above the current conductor and electrically separated from the semiconductor chip by an isolation layer. | 09-11-2014 |
| 20140285182 | Accu Volt Meter - The invention provides a handheld digital voltmeter approximately the size and shape of a ballpoint pen. When its tip is placed on a live electrical wire, the Accu Volt Meter digitally displays a voltage reading on a small LCD screen and audibly states the voltage reading through an incorporated data to voice software program and a tiny incorporated speaker. | 09-25-2014 |
| 20140347038 | Method of Reconstructing Electrical Probes - A probe, comprising: a shank region having a top surface integrally connected to a bottom surface of a conical region; a pyramidal tip region having a base surface integrally connected to a top surface of the conical region; and wherein the base surface of the pyramidal tip region is contained within a perimeter of the top surface of the conical region. Also a method of fabricating the probe and a method of probing devices under test. | 11-27-2014 |
| 20150042315 | BIOELECTRIC SIGNAL DETECTING CIRCUITS, LEAD WIRE DETECTING CIRCUITS AND MEDICAL DEVICES - This disclosure relates to bioelectric signal detecting circuits, lead wire detecting circuits and medical devices. The lead wire detecting circuit may include a reference voltage generator, at least one comparator, and a logic control module, wherein input ends of the comparator are connected to an output end of the reference voltage generator and an signal output end of a lead wire, respectively, for inputting a reference voltage and a lead signal, and the comparator compares the lead signal with the reference voltage and changes an output voltage at an output end of the comparator according to a comparison result; wherein an input end of the logic control module is connected to the output end of the comparator, and the logic control module determines whether the lead wire is in a connected state or disconnected state by the output voltage at the output end of the comparator. | 02-12-2015 |
| 20150048815 | Circuit Probe for Charged Particle Beam System - A probe assembly can be connected and disconnected from its electrical harness within a vacuum chamber so that the probe assembly with the work piece mounted can be rotated and tilted without interference from a cable, and can then be reconnected without opening the vacuum chamber. Also described is a means of grounding a sample and probes when the probe assembly is disconnected from its electrical harness and a means of preventing damage to the probe mechanism and the probe itself by ensuring that the probes are not sticking up too far during operations. | 02-19-2015 |
| 20150069999 | Method for Contacting at least Two Metal Electrodes and Arrangement - A method for contacting at least two metal electrodes, wherein the metal electrodes are located in a cavity of a basic body of sintered ceramic and frontal end faces of the metal electrodes. The metal electrodes are arranged essentially planparallel to an outer surface of the basic body. The method includes steps as follows: introducing a solder into at least one hole of the basic body, wherein the hole is so embodied that it leads to a rear portion of the metal electrode away from the frontal end face of the metal electrode wherein the solder can wet the rear portion of the metal electrode, wherein the metal electrodes are in their longitudinal direction shorter than the basic body, especially have only ⅕ of the length of the basic body; introducing a cable into the hole at least until the cable extends into the solder; and heating the basic body with solder and cable above the solidification temperature of the solder. The invention relates further to an arrangement and to a conductivity sensor comprising such an arrangement. | 03-12-2015 |
| 20150137794 | NANOSCALE SENSORS FOR INTRACELLULAR AND OTHER APPLICATIONS - The present invention generally relates to nanoscale wires for use in sensors and other applications. In various embodiments, a probe comprising a nanotube (or other nanoscale wire) is provided that can be directly inserted into a cell to determine a property of the cell, e.g., an electrical property. In some cases, only the tip of the nanoscale wire is inserted into the cell; this tip may be very small relative to the cell, allowing for very precise study. In some aspects, the tip of the probe is held by a holding member positioned on a substrate, e.g., at an angle, which makes it easier for the probe to be inserted into the cell. The nanoscale wire may also be connected to electrodes and/or form part of a transistor, such that a property of the nanoscale wire, and thus of the cell, may be determined. Such probes may also be useful for studying other samples besides cells. Other aspects of the invention are generally directed to methods of making or using such probes, kits involving such probes, devices involving such probes, or the like. | 05-21-2015 |
| 20150362527 | MEASURING APPARATUS AND MEASURING METHOD - A measuring apparatus includes a stage on which an object to be measured is placed, an insulating base plate, a probe fixed on the insulating base plate, a measuring unit which measures an electrical characteristic of the object to be measured through the probe, a side wall part having such a shape as to surround the probe and smaller in width than the stage, and a supply tube through which an insulating liquid is supplied, wherein when an electrical characteristic of the object to be measured is measured, the stage, the side wall part and the insulating base plate form a measurement region surrounding the object to be measured, and the insulating liquid is applied from the supply tube to the object to be measured in the measurement region. | 12-17-2015 |
| 20160069943 | WIRELESS MODULE, ELECTRONIC MODULE, AND MEASURING METHOD - A wireless module includes a substrate, an antenna provided on a surface of the substrate, and a circuit, provided on the substrate, and configured to transmit and receive signals through the antenna. The antenna includes a terminal provided on a tip end part thereof. | 03-10-2016 |
| 20160377662 | VOLTAGE DETECTING PROBE AND MEASURING DEVICE - A voltage detecting probe includes: a shield barrel that is a barrel-shaped member made of an electrically conductive material and has an insertion concave for inserting a wire formed in a front end thereof by cutting away an outer circumferential wall at the front end along a direction perpendicular to an axis; and a detection electrode that is formed of a cylindrical member made of an electrically conductive material, whose front end surface and outer circumferential surface are covered with an insulating covering, and is housed inside the shield barrel and capable of moving relative to the shield barrel along the axis direction. When the detection electrode has been moved relative to the shield barrel and the front end surface is positioned at the insertion concave, the front end surface becomes capacitively coupled, via the insulating covering, with a wire inserted in the insertion concave. | 12-29-2016 |
