| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324224000 | With temperature control of material or element of test circuit | 9 |
| 20130009633 | Method of Measuring Dimensionless Coupling Constant of Magnetic Structure - In A method for measuring a dimensionless coupling constant of a magnetic structure includes the following steps. A step of applying an external vertical magnetic field is performed for enabling magnetic moments of a RE-TM (Rare Earth-Transition metal) alloy magnetic layer of the magnetic structure to be vertical and saturated. A step of measuring a compensation temperature is performed when the sum of the magnetization of the RE-TM alloy magnetic layer is zero. A step of applying an external parallel magnetic field to the RE-TM alloy magnetic layer is performed. A step of adjusting the temperature of the magnetic structure to the compensation temperature and measuring a hysteresis loop of the magnetic structure under the external parallel magnetic field is performed, wherein the inverse of the slope of hysteresis loop is a dimensionless coupling constant. | 01-10-2013 |
| 20130038321 | INSPECTION APPARATUS AND INSPECTION METHOD OF MAGNETIC SENSOR - A magnetic sensor inspection apparatus has a rectangular frame including a stage, a probe card, and a plurality of magnetic field generating coils. A wafer-like array of magnetic sensors is mounted on the stage, which is movable in horizontal and vertical directions. The probe card includes a plurality of probes which are brought into contact with a plurality of magnetic sensors encompassed in a measurement area. The magnetic field generating coils are driven to generate a magnetic field toward the stage. A plurality of magnetic field environment measuring sensors is arranged in the peripheral portion of the probe card surrounding the probes. A magnetic field controller controls magnetic fields generated by the magnetic field generating coils based on the measurement result of the magnetic field environment measuring sensors. Thus, it is possible to concurrently inspect a wafer-like array of magnetic sensors with the probe card. | 02-14-2013 |
| 20130082694 | Hall-Effect Measurement Apparatus - A Hall-Effect measure apparatus comprises a magnetic source, a wafer on a thermal chuck, a dc current source and a voltage meter. The magnetic source generates a magnetic field in a perpendicular position relative to the wafer. Furthermore, the magnetic field is targeted at a specific region of the wafer to be tested. By performing a Hall-Effect measurement and van der Pauw measurement, the carrier mobility of the specific region of the wafer can be calculated. | 04-04-2013 |
| 20130221958 | DUAL-STAGE TRAPPED-FLUX MAGNET CRYOSTAT FOR MEASUREMENTS AT HIGH MAGNETIC FIELDS - A method and a dual-stage trapped-flux magnet cryostat apparatus are provided for implementing enhanced measurements at high magnetic fields. The dual-stage trapped-flux magnet cryostat system includes a trapped-flux magnet (TFM). A sample, for example, a single crystal, is adjustably positioned proximate to the surface of the TFM, using a translation stage such that the distance between the sample and the surface is selectively adjusted. A cryostat is provided with a first separate thermal stage provided for cooling the TFM and with a second separate thermal stage provided for cooling sample. | 08-29-2013 |
| 20150346291 | SYSTEMS, METHODS AND APPARATUS FOR MEASURING MAGNETIC FIELDS - SQUIDs may detect local magnetic fields. SQUIDS of varying sizes, and hence sensitivities may detect different magnitudes of magnetic fields. SQUIDs may be oriented to detect magnetic fields in a variety of orientations, for example along an orthogonal reference frame of a chip or wafer. The SQUIDS may be formed or carried on the same chip or wafer as a superconducting processor (e.g., a superconducting quantum processor). Measurement of magnetic fields may permit compensation, for example allowing tuning of a compensation field via a compensation coil and/or a heater to warm select portions of a system. A SQIF may be implemented as a SQUID employing an unconventional grating structure. Successful fabrication of an operable SQIF may be facilitated by incorporating multiple Josephson junctions in series in each arm of the unconventional grating structure. | 12-03-2015 |
| 20160018486 | Group III-V Ferromagnetic/Non-magnetic Semiconductor Heterojunctions and Magnetodiodes - Ferromagnetic Group III-V semiconductor/non-magnetic Group III-V semiconductor heterojunctions, with a magnetodiode device, to detect heterojunction magnetoresistance responsive to an applied magnetic field. | 01-21-2016 |
| 20160154066 | HALL SENSOR AND COMPENSATION METHOD FOR OFFSET CAUSED BY TEMPERATURE DISTRIBUTION IN HALL SENSOR | 06-02-2016 |
| 20160252589 | Hall Sensor Readout System with Offset Determination Using the Hall Element Itself | 09-01-2016 |
| 20160377575 | DETECTION METHOD, IMAGING METHOD AND RELATED APPARATUS BASED ON MAGNETISM CHARACTERISTIC DETECTION TECHNIQUE - A magnetism characteristic detection method, a magnetism characteristic detection apparatus, an imaging apparatus and an imaging method are provided, where magnetism detection and imaging are based on an integrated excitation field of a direct current (DC) magnetic field and an oscillation wave. The magnetism detection method includes the following steps. A DC magnetic field is selectively applied to an object. Further, an oscillation wave is provided to the object, where the oscillation wave is a sound wave or an ultrasound wave. Then, a magnetism characteristic variation of the object is detected. | 12-29-2016 |
