Class / Patent application number | Description | Number of patent applications / Date published |
257700000 | Multiple contact layers separated from each other by insulator means and forming part of a package or housing (e.g., plural ceramic layer package) | 54 |
20080203557 | SEMICONDUCTOR MODULE AND METHOD OF MANUFACTURING THE SAME - Warp of a circuit device manufactured by the wafer level packaging technology is reduced. A semiconductor substrate used in a circuit device is provided with a circuit device and electrodes connected to the circuit device. A wiring layer having bumps connected to the electrodes is provided on a major surface of the semiconductor substrate. A metal layer is provided on a surface opposite to the major surface of the semiconductor substrate. | 08-28-2008 |
20080211083 | Electronic package and manufacturing method thereof - An electronic package and a manufacturing method thereof are disclosed. The electronic package manufacturing method, which includes providing a printed circuit board (PCB) having one surface on which a first chip is mounted; attaching one surface of a second chip on the other surface of the PCB, a pad being formed in the other surface of the second chip; encapsulating the second chip by coating the other surface of the PCB with an insulation material; and processing a first via by punching a hole on the insulation material, the first via being electrically interconnected to the pad, can perform stable handling in a process of mounting a semiconductor chip, make it unnecessary to add a process for chip encapsulation and realize a system in package having high density and high reliability. | 09-04-2008 |
20080211084 | INTEGRATED CIRCUIT PACKAGE SYSTEM WITH INTERPOSER - An integrated circuit package system includes: providing a mountable integrated circuit system having an encapsulation with a cavity therein and a first interposer exposed by the cavity; mounting a second interposer over the first interposer for only stacking a discrete device thereover, and with the second interposer over the encapsulation and the cavity; and mounting an electrical component over the second interposer. | 09-04-2008 |
20080217761 | Structure of semiconductor device package and method of the same - The present invention provides a semiconductor device package comprising a substrate with at lease a pre-formed die receiving cavity formed and terminal contact metal pads formed within an upper surface of the substrate. At lease a first die is disposed within the die receiving cavity. A first dielectric layer is formed on the first die and the substrate and refilled into a gap between the first die and the substrate to absorb thermal mechanical stress there between. A first re-distribution layer (RDL) is formed on the first dielectric layer and coupled to the first die. A second dielectric layer is formed on the first RDL, and then a second die is disposed on the second dielectric layer and surrounded by core pastes having through holes thereon. A second re-distribution layer (RDL) is formed on the core pastes to fill the through holes, and then a third dielectric layer formed on the second RDL. | 09-11-2008 |
20080217762 | CHIP CARRIER STRUCTURE HAVING SEMICONDUCTOR CHIP EMBEDDED THEREIN AND METAL LAYER FORMED THEREON - The present invention provides a chip carrier structure having a semiconductor chip embedded therein and a protective metal layer formed thereon and a fabrication method thereof. The chip carrier structure includes a chip-embedded carrier structure, and a metal layer formed by electroplating on the bottom surface and side surfaces of the chip-embedded carrier structure. The metal layer prevents moisture from crossing the side surfaces of the chip-embedded carrier structure, so as to prevent delamination, provide a shielding effect, and improve heat dissipation through the metal layer. | 09-11-2008 |
20080230892 | Chip package module - A chip package module is disclosed, which comprises a core plate and two rigid plates individually having a circuit layer. The core plate is sandwiched in between the two rigid plates to form a composite circuit board. Furthermore, the two rigid plates individually have a cavity to expose the surface of the core plate. In addition, the cavities individually have at least one chip disposed therein, and each chip electrically connects to the composite circuit board. The present invention reduces the height of the package module and makes the package module lighter and smaller. | 09-25-2008 |
20080265401 | Integrated chip package structure using organic substrate and method of manufacturing the same - An integrated chip package structure and method of manufacturing the same is by adhering dies on an organic substrate and forming a thin-film circuit layer on top of the dies and the organic substrate. Wherein the thin-film circuit layer has an external circuitry, which is electrically connected to the metal pads of the dies, that extends to a region outside the active surface of the dies for fanning out the metal pads of the dies. Furthermore, a plurality of active devices and an internal circuitry is located on the active surface of the dies. Signal for the active devices are transmitted through the internal circuitry to the external circuitry and from the external circuitry through the internal circuitry back to other active devices. Moreover, the chip package structure allows multiple dies with different functions to be packaged into an integrated package and electrically connecting the dies by the external circuitry. | 10-30-2008 |
20080277776 | SUBSTRATE AND MULTILAYER CIRCUIT BOARD - A substrate includes a inorganic material base board has a recess and at least one penetration hole provided around the recess, and a semiconductor device accommodated in the recess and including at least one electrode pad provided on a surface of the semiconductor device. A resin filling is provided in the at least one penetration hole and has at least one through-hole for electrically connecting a top surface and a back surface of the resin filling. An insulating layer covers the surfaces of the semiconductor device, the resin filling and the inorganic material base board and has a first opening corresponding to the at least one through-hole and a second opening corresponding to the at least one electrode pad. A conductive wiring is formed on a surface of the insulating layer for electrically connecting the at least one through-hole and the at least one electrode pad. | 11-13-2008 |
20080290497 | Mounting Board, Mounted Body, and Electronic Equipment Using the Same - The mounting board has a capacitor-forming sheet made from a valve metal, first and second board-forming structures, first and second electrodes, an extractor electrode, and a conductive polymer. The capacitor-forming sheet has an inner layer and a rough oxide film on at least one face of the inner layer. The first board-forming structure is provided on a face of the capacitor-forming sheet, and the second board-forming structure is provided on another face thereof on a side opposite to the first one. The first and second electrodes are isolated to each other and provided on a surface of at least one of the first and second board-forming structures. The extractor electrode and conductive polymer are provided inside at least one of the first and second board-forming structures. The extractor electrode electrically-connects the first electrode with the inner layer. The conductive polymer electrically-connects the second electrode with the rough oxide film. | 11-27-2008 |
20080303136 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME - A transparent board is positioned on a support board provided with a positioning mark, and a release material is provided. A semiconductor element is then positioned so that the electrode element faces upward, and the support board is then removed. An insulating resin is then formed on the release material so as to cover the semiconductor element; and a via, a wiring layer, an insulation layer, an external terminal, and a solder resist are then formed. The transparent board is then peeled from the semiconductor device through the use of the release material. A chip can thereby be mounted with high precision, there is no need to provide a positioning mark during mounting of the chip on the substrate in the manufacturing process, and the substrate can easily be removed. As a result, a semiconductor device having high density and a thin profile can be manufactured at low cost. | 12-11-2008 |
20090001550 | Method of Forming a Multilayer Substrate Core Structure Using Sequential Microvia Laser Drilling And Substrate Core Structure Formed According to the Method - A method of fabricating a substrate core structure, and a substrate core structure formed according to the method. The method includes: laser drilling a first set of via openings through a starting insulating layer; filling the first set of via openings with a conductive material to provide a first set of conductive vias; providing first and second patterned conductive layers on opposite sides of the starting insulating layer; providing a supplemental insulating layer onto the first patterned conductive layer; laser drilling a second set of via openings through the supplemental insulating layer; filling the second set of via openings with a conductive material to provide a second set of conductive vias; and providing a supplemental patterned conductive layer onto an exposed side of the supplemental insulating layer, the second set of conductive vias contacting the first patterned conductive layer and the supplemental patterned conductive layer at opposite sides thereof. | 01-01-2009 |
20090039498 | POWER SEMICONDUCTOR MODULE - A power semiconductor module is disclosed. One embodiment includes a multilayer substrate having a plurality of metal layers and a plurality of ceramic layers, where the ceramic layers are located between the metal layers. | 02-12-2009 |
20090057873 | Packaging substrate structure with electronic component embedded therein and method for manufacture of the same - A packaging substrate structure with an electronic component embedded therein and a fabricating method thereof are disclosed. The packaging substrate structure comprises a core plate; a first built-up structure disposed on a surface of the core plate and comprising a first dielectric layer and a first circuit layer disposed on the first dielectric layer; a second built-up structure disposed on the first built-up structure, wherein a cavity is disposed in the second built-up structure to expose the first built-up structure; an electronic component disposed in the cavity, wherein the electronic component has an active surface having a plurality of electrode pads and an inactive surface facing the first built-up structure; and a solder mask disposed on the surfaces of the second built-up structure and the electronic component, and having a plurality of first openings to expose the electrode pads of the electronic component. | 03-05-2009 |
20090072379 | SEMICONDUCTOR DEVICE - A semiconductor device is disclosed. One embodiment includes a carrier, a semiconductor chip attached to the carrier, a first conducting line having a first thickness and being deposited over the semiconductor chip and the carrier and a second conducting line having a second thickness and being deposited over the semiconductor chip and the carrier. The first thickness is smaller than the second thickness. | 03-19-2009 |
20090072380 | Microelectromechanical Device Packages with Integral Heaters - A microelectromechanical device package with integral a heater and a method for packaging the microelectromechanical device are disclosed in this invention. The microelectromechanical device package comprises a first package substrate and second substrate, between which a microelectromechanical device, such as a micromirror array device is located. In order to bonding the first and second package substrates so as to package the microelectromechanical device inside, a sealing medium layer is deposited, and heated by the heater so as to bond the first and second package substrates together. | 03-19-2009 |
20090072381 | SEMICONDUCTOR DEVICE WITH DOUBLE-SIDED ELECTRODE STRUCTURE AND ITS MANUFACTURING METHOD - According to the present invention, a recess portion is formed in a package substrate which is formed of a multilayer organic substrate having a multilayer wiring, and an LSI chip is accommodated within the recess portion. Wiring traces are formed on the upper surface of a resin which seals the LSI chip connected to the multilayer wiring. The wiring traces are connected to terminal wiring traces connected to the multilayer wiring on the front face of the package substrate and to front-face bump electrodes for external connection on the upper surface of the resin. On the back face side of the package substrate, back-face bump electrodes for external connection are formed and connected to the multilayer wiring. | 03-19-2009 |
20090085192 | Packaging substrate structure having semiconductor chip embedded therein and fabricating method thereof - The present invention relates to a packaging substrate structure having an semiconductor chip embedded therein and a method for manufacturing the same. The structure comprises: a substrate body having a through cavity, wherein the substrate body is a multilayer board which comprises a core board and a first built-up structure disposed on each of the opposite surfaces of the core board; an semiconductor chip disposed and fixed in the cavity, wherein the active surface of the semiconductor chip has a plurality of electrode pads thereon; and a second built-up structure disposed on at least one surface of the substrate body as well as the surface of the semiconductor chip, wherein the second built-up structure has a plurality of conductive vias conducting to the first built-up structure. The present invention can reduce the stress imposed on the surface of the semiconductor chip and increase the reliability of the whole package structure. | 04-02-2009 |
20090096082 | High speed electrical interconnects and method of manufacturing thereof - A high speed electrical interconnection system is provided. The interconnection system comprises one or more electrical signal lines, or differential pairs of signal lines, and an inhomogeneous dielectric system. The dielectric system further comprises a homogeneous dielectric layer interposed between the electrical signal lines, and electrical conducting planes including a periodic array etched in the conducting material of the conducting plane. The inhomogeneous dielectric system exhibits a lower dielectric constant as compared to the dielectric constant of the homogeneous dielectric layer, resulting in lower microwave loss, reduced signal propagation delay, reduced signal skew, and increased signal bandwidth. The interconnection system may be implemented for connecting one or more high speed electron elements on-chip, off-chip, chip-chip connection on multilayer printed circuit boards, high speed die-package, high speed connectors, and high speed electric cables. | 04-16-2009 |
20090096083 | Connecting structure for connecting at least one semiconductor component to a power semiconductor module - A connecting structure comprising a connecting device for electrically conductive connection to at least one semiconductor component and a filler. The connecting device is a film composite comprising at least two electrical films with an insulating film therebetween. The electrically conductive films are inherently structured and thus form conductor tracks. At least one semiconductor component is assigned to at least one cutout in the respective conductive film, wherein the filler is situated between the connecting device and the assigned semiconductor component. | 04-16-2009 |
20090121340 | Fully testable surface mount die package configured for two-sided cooling - A power semiconductor die is sandwiched between upper and lower heat conducting laminate structures to form a surface mount component that is configured for double-sided cooling. The upper heat conducting laminate structure electrically couples top-side die terminal(s) to conductors formed on the inboard face of the lower heat conducting laminate structure, and all of the die terminals are electrically coupled to conductors formed on the outboard face of the lower heat conducting laminate structure. The die package can be placed in a test fixture for full power testing, and when installed in an electronic assembly including a circuit board and upper and lower heatsinks, the die is thermally coupled to the upper heatsink through the upper heat conducting laminate structure, and to the lower heatsink through the circuit board and the lower heat conducting laminate structure. | 05-14-2009 |
20090127699 | LOW TEMPERATURE CO-FIRED CERAMICS SUBSTRATE AND SEMICONDUCTOR PACKAGE - A low-temperature co-fired ceramics (LTCC) substrate includes a plurality of substrate units and at least one cutting pattern. The cutting pattern is disposed between neighboring two of the substrate units. A semiconductor package including the LTCC substrate is also disclosed. | 05-21-2009 |
20090140415 | COMBINATION SUBSTRATE - A combination substrate includes a first substrate having wiring board mounting pads for installing a printed wiring board and connection pads on an opposite side of the wiring board mounting pads, a second substrate having package substrate mounting pads for mounting one or more package substrates and having connection pads on an opposite side of the package substrate mounting pads, a middle substrate positioned between the first substrate and the second substrate and including conductive members electrically connecting the connection pads on the first substrate and the connection pads on the second substrate, and a die positioned between the first substrate and the second substrate and mounted on one of the first substrate and the second substrate. | 06-04-2009 |
20090160046 | ELECTRONIC DEVICE AND METHOD - An electronic device and method is disclosed. In one embodiment, a method includes providing an electrically insulating substrate. A first electrically conductive layer is applied over the electrically insulating substrate. A first semiconductor chip is placed over the first electrically conductive layer. An electrically insulating layer is applied over the first electrically conductive layer. A second electrically conductive layer is applied over the electrically insulating layer. | 06-25-2009 |
20090166848 | Method for Enhancing the Adhesion of a Passivation Layer on a Semiconductor Device - In a method for making a semiconductor component, an integrated circuit is provided with a chip pad on an active side. A conductive track is connected to the chip pad and a passivation layer covers the conductive track. Forming the conductive track includes structuring an uneven sidewall for form closure with the passivation layer. | 07-02-2009 |
20090166849 | SEMICONDUCTOR CHIP - A semiconductor chip includes a die mounted on a packaging substrate. The die includes a semiconductor substrate; inter-metal dielectric layers on the semiconductor substrate; levels of metal interconnection, wherein at least two potential equivalent metal traces are formed in a level of the metal interconnection; a passivation layer disposed over the two metal traces, wherein two openings are formed in the passivation layer to expose portions of the two metal traces; a conductive member externally mounted on the passivation layer between the two openings; and a redistribution layer formed over the conductive member. | 07-02-2009 |
20090179321 | POWER SEMICONDUCTOR DEVICE - A power semiconductor device, having a first semiconductor region, and a second semiconductor region; mounted with a first electrode pad on a semiconductor substrate main surface at the inside surrounded by the third semiconductor region, mounted in the second semiconductor region, and a multilayer substrate having first and second wiring layers, to take out an electrode of the semiconductor chip; joining the first wiring layer part for the first electrode, mounted on the multilayer substrate, in a region opposing to the semiconductor substrate main surface at the inside surrounded by the third semiconductor region, and the first electrode pad, by a conductive material; joining the first wiring layer part for the first electrode, and the second wiring layer at a conductive part; and extending the second wiring layer to the outside of a region opposing the semiconductor substrate main surface at the inside surrounded by the third semiconductor region. | 07-16-2009 |
20090184415 | MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE - A manufacturing method of a semiconductor device comprises: providing a first insulating film whose relative dielectric constant is at most a predetermined value above a substrate; providing a second insulating film whose relative dielectric constant is greater than the predetermined value on a surface of the first insulating film; forming a recess for a wire through the second insulating film and extending into the first insulating film, and also forming a recess for a dummy wire through the second insulating film and extending into the first insulating film spaced from a formed area of the recess for the wire; providing a conductive material inside the recess for the wire and the recess for the dummy wire; and providing a wire inside the recess for the wire and providing a dummy wire inside the recess for the dummy wire by polishing and removing the conductive material. | 07-23-2009 |
20090194866 | SEMICONDUCTOR DEVICE HAVING WIRING LINE AND MANUFACTURING METHOD THEREOF - An insulating film covering the upper surface of an external connection electrode of a semiconductor construct is formed. A mask metal layer in which there is formed an opening having a planar size smaller than that of the external connection electrode is formed on the insulating film. The mask metal layer is used as a mask to apply a laser beam to the insulating film, such that a connection opening reaching the external connection electrode is formed in the insulating film. A wiring line is formed on the insulating film in such a manner as to be connected to the external connection electrode via the connection opening. | 08-06-2009 |
20090200658 | CIRCUIT BOARD STRUCTURE EMBEDDED WITH SEMICONDUCTOR CHIPS - A circuit board structure embedded with semiconductor chips is proposed. A semiconductor chip is received in a cavity of a supporting board. A dielectric layer and a circuit layer are formed on the supporting board and the semiconductor chip. A plurality of hollow conductive vias are formed in the dielectric layer for electrically connecting the circuit layer to the semiconductor chip. By providing the hollow conductive vias of present invention, the separating results of different coefficients of expansion and thermal stress are prevented, and thus electrical function of products is ensured. | 08-13-2009 |
20090230542 | Semiconductor Device With Integrated Passive Circuit and Method of Making the Same Using Sacrificial Substrate - A semiconductor device is made by providing a sacrificial substrate, forming a first insulating layer over the sacrificial substrate, forming a first passivation layer over the first insulating layer, forming a second insulating layer over the first passivation layer, forming an integrated passive device over the second insulating layer, forming a wafer support structure over the integrated passive device, removing the sacrificial substrate to expose the first insulating layer after forming the wafer support structure, and forming an interconnect structure over the first insulating layer in electrical contact with the integrated passive device. The integrated passive device includes an inductor, capacitor, or resistor. The sacrificial substrate is removed by mechanical grinding and wet etching. The wafer support structure can be glass, ceramic, silicon, or molding compound. The interconnect structure can include a solder bump, wire bond, and intermediate conduction layer formed on a backside of the semiconductor device. | 09-17-2009 |
20090256253 | Continuously Referencing Signals Over Multiple Layers in Laminate Packages - A mechanism for continuously referencing signals over multiple layers in laminate packages provides a continuous path for signals from one layer to another while using the ideal voltage reference for all areas of the package and still avoiding discontinuities in the voltage reference. A reference plane adjustment engine analyzes a package design and identifies an ideal top plane for all areas of the package, including areas under particular chip die(s) and areas that are not under a chip die. The reference plane adjustment engine then modifies the package design to reposition ground planes, source voltage planes, signal planes, and vias between layers to maintain a continuous voltage reference regardless of the top layer. The reference plane adjustment engine provides the resulting mixed voltage plane package design to a design analysis engine. A package fabrication system fabricates the package. | 10-15-2009 |
20090278251 | Pad Structure for 3D Integrated Circuit - This invention discloses an I/O pad structure in an integrated circuit (IC) which comprises a first vertical region in the IC including a top metal layer and one or more semiconductor devices formed thereunder, the top metal layer in the first vertical region serving as a first pad, the semiconductor devices being electrically connected to the first pad, and a second vertical region in the IC next to the first vertical region including the top metal layer and one or more through-silicon-vias (TSVs) formed thereunder, the top metal layer in the second vertical region serving as a second pad, and no semiconductor devices being formed beneath the second pad, the TSVs being electrically connected to the second pad, wherein the first and the second pad are electrically connected through at least one metal layer. | 11-12-2009 |
20090283901 | Semiconductor device and multilayer wiring board - A gas or an insulating material having a relative dielectric constant of not more than 2.5 on average is interposed between a first wiring layer and a second wiring layer included in a multilayer wiring structure. Between a wiring of the first wiring layer and a wiring of the second wiring layer, a conductive connector is arranged. Between a predetermined wiring of the first wiring layer and a predetermined wiring of the second wiring layer, an insulating heat conductor having a relative dielectric constant of not more than 5 is arranged. | 11-19-2009 |
20090309212 | Semiconductor Device and Method of Forming Stress Relief Layer Between Die and Interconnect Structure - A semiconductor device is made by forming a first conductive layer over a sacrificial carrier. A conductive pillar is formed over the first conductive layer. An active surface of a semiconductor die is mounted to the carrier. An encapsulant is deposited over the semiconductor die and around the conductive pillar. The carrier and adhesive layer are removed. A stress relief insulating layer is formed over the active surface of the semiconductor die and a first surface of the encapsulant. The stress relief insulating layer has a first thickness over the semiconductor die and a second thickness less than the first thickness over the encapsulant. A first interconnect structure is formed over the stress relief insulating layer. A second interconnect structure is formed over a second surface of encapsulant opposite the first interconnect structure. The first and second interconnect structures are electrically connected through the conductive pillar. | 12-17-2009 |
20100007012 | ELECTRONIC SYSTEM MODULES - This specification describes techniques for manufacturing an electronic system module. The module includes flexible multi-layer interconnection circuits with trace widths as narrow as 5 microns or less. A glass panel manufacturing facility, similar to those employed for making liquid crystal display, LCD, panels is preferably used to fabricate the interconnection circuits. A multi-layer interconnection circuit is fabricated on the glass panel using a release layer. A special assembly layer is formed over the interconnection circuit comprising a thick dielectric layer with openings formed at input/output (I/O) pad locations. Solder paste is deposited in the openings using a squeegee to form wells filled with solder. IC chips are provided with gold stud bumps at I/O pad locations, and these bumps are inserted in the wells to form flip chip connections. The IC chips are tested and reworked. The same bump/well connections can be used to attach fine-pitch cables. Module packaging layers are provided for hermetic sealing and for electromagnetic shielding. A blade server or supercomputer embodiment is also described. | 01-14-2010 |
20100013087 | EMBEDDED DIE PACKAGE AND PROCESS FLOW USING A PRE-MOLDED CARRIER - An embedded die package includes a carrier with an electrical device in the cavity of the carrier, a first dielectric layer covering the sides and top of the electrical device except for vias over selected bonding pads of the electrical device, a plurality of metal conductors, each of which is in contact with at least one of the vias, one or more additional dielectric layers lying over the metal conductors and the first dielectric layer, wherein a top layer of the one or more dielectric layers has openings with metalization underneath coupled to at least one of the metal conductors, and solder bumps protruding from each of the openings. | 01-21-2010 |
20100059876 | ELECTRONIC COMPONENT PACKAGE AND METHOD OF MANUFACTURING THE SAME - There is provided an electronic component package. The electronic component package includes: a core layer including a plurality of insulating layers formed by impregnating a base material with a resin, wherein a hollow portion is formed in the core layer; core wiring layers each disposed between the insulating layers; and an electronic component disposed in the hollow portion. The electronic component and the core wiring layer are electrically connected to each other by a bonding wire. | 03-11-2010 |
20100155933 | Package for semiconductor devices - To prevent or alleviate the occurrence of stress in the junction portion between the semiconductor element and the semiconductor package for mounting the semiconductor element, so that cracks will not occur even when there is mounted a semiconductor element having a low strength. A package for semiconductor devices is formed as a laminate of many layers including a plurality of conducting layers and insulating resin layers that are alternately laminated one upon the other and having, on one surface of the laminate, a portion for mounting a semiconductor element. The whole region or some region(s) of the insulating resin layers of the laminate, including at least the portion for mounting the semiconductor element and the peripheries thereof, are constituted by a prepreg obtained by impregnating a woven fabric of a liquid crystal polymer with an insulating resin. | 06-24-2010 |
20100213604 | INTEGRATED CIRCUIT MICRO-MODULE - Various apparatus and methods for improving the dissipation of heat from integrated circuit micro-modules are described. One aspect of the invention pertains to an integrated circuit package with one or more thermal pipes. In this aspect, the integrated circuit package includes multiple layers of a cured, planarizing dielectric. An electrical device is embedded within at least one of the dielectric layers. At least one electrically conductive interconnect layer is embedded within one or more of the dielectric layers. A thermal pipe made of a thermally conductive material is embedded in at least one associated dielectric layer. The thermal pipe thermally couples the electrical device with one or more external surfaces of the integrated circuit package. Various methods for forming the integrated circuit package are described. | 08-26-2010 |
20100213605 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE - A semiconductor device includes an electronic component having a pad surface on which an electrode pad is formed, and having a back surface opposite the pad surface, a sealing resin disposed to cover side faces of the electronic component while exposing the pad surface at a first surface thereof and the back surface at a second surface thereof, a multilayer interconnection structure including insulating layers stacked one over another and interconnection patterns, having an upper surface thereof being in contact with the first surface, the electrode pad, and the pad surface, and having a periphery thereof situated outside a periphery of the sealing resin, and another pad disposed on the upper surface of the multilayer interconnection structure outside the periphery of the sealing resin, wherein the interconnection patterns include a first interconnection pattern directly connected to the electrode pad and a second interconnection pattern directly connected to said another pad. | 08-26-2010 |
20100237495 | Semiconductor Device and Method of Providing Z-Interconnect Conductive Pillars with Inner Polymer Core - A semiconductor device is made by providing a sacrificial substrate and depositing an adhesive layer over the sacrificial substrate. A first conductive layer is formed over the adhesive layer. A polymer pillar is formed over the first conductive layer. A second conductive layer is formed over the polymer pillar to create a conductive pillar with inner polymer core. A semiconductor die or component is mounted over the substrate. An encapsulant is deposited over the semiconductor die or component and around the conductive pillar. A first interconnect structure is formed over a first side of the encapsulant. The first interconnect structure is electrically connected to the conductive pillar. The sacrificial substrate and adhesive layers are removed. A second interconnect structure is formed over a second side of the encapsulant opposite the first interconnect structure. The second interconnect structure is electrically connected to the conductive pillar. | 09-23-2010 |
20100270670 | INTEGRATED CIRCUIT PACKAGING SYSTEM AND METHOD OF MANUFACTURE THEREOF - A method of manufacture of an integrated circuit packaging system includes: providing an integrated circuit substrate having a non-active side and an active side; forming a recess in the integrated circuit substrate from the non-active side exposing a first contact and a second contact with the first contact and the second contact along the active side; forming a first via, having a first via extension extended beyond the non-active side and an opening at the non-active side, within the recess; forming a barrier liner within the opening with the barrier liner exposed beyond the non-active side; and forming a second via over the barrier liner and within the opening of the first via with the second via exposed beyond the non-active side. | 10-28-2010 |
20100295170 | SEMICONDUCTOR DEVICE - A semiconductor device includes a multilayer wiring substrate and a double-sided multi-electrode chip. The double-sided multi-electrode chip includes a semiconductor chip and has multiple electrodes on both sides of the semiconductor chip. The double-sided multi-electrode chip is embedded in the multilayer wiring substrate in such a manner that the double-sided multi-electrode chip is not exposed outside the multilayer wiring substrate. The electrodes of the double-sided multi-electrode chip are connected to wiring layers of the multilayer wiring substrate. | 11-25-2010 |
20100295171 | ELECTRONIC DEVICE AND METHOD - An electronic device and method is disclosed. In one embodiment, a method includes providing an electrically insulating substrate. A first electrically conductive layer is applied over the electrically insulating substrate. A first semiconductor chip is placed over the first electrically conductive layer. An electrically insulating layer is applied over the first electrically conductive layer. A second electrically conductive layer is applied over the electrically insulating layer. | 11-25-2010 |
20110031611 | EMBEDDED LAMINATED DEVICE - An electronic device includes at least one semiconductor chip, each semiconductor chip defining a first main face and a second main face opposite to the first main face. A first metal layer is coupled to the first main face of the at least one semiconductor chip and a second metal layer is coupled to the second main face of the at least one semiconductor chip. A third metal layer overlies the first metal layer and a fourth metal layer overlies the second metal layer. A first through-connection extends from the third metal layer to the fourth metal layer, the first through-connection being electrically connected with the first metal layer and electrically disconnected from the second metal layer. A second through-connection extends from the third metal layer to the fourth metal layer, the second through-connection being electrically connected with the second metal layer and electrically disconnected from the first metal layer. | 02-10-2011 |
20110057305 | PACKAGE SUBSTRATE HAVING SEMICONDUCTOR COMPONENT EMBEDDED THEREIN AND FABRICATION METHOD THEREOF - A package substrate having a semiconductor component embedded therein and a method of fabricating the same are provided, including: providing a semiconductor chip with electrode pads disposed on an active surface thereof; forming a passivation layer on the active surface and the electrode pads; forming on the passivation layer metal pads corresponding in position to the electrode pads, respectively, so as for the semiconductor chip to be fixed in position to an opening of a substrate body; forming a first dielectric layer on the semiconductor chip and the substrate body; forming dielectric layer openings by laser and preventing the electrode pads from being penetrated by the metal pads; removing the metal pads and the passivation layer in the dielectric layer openings so as to expose the electrode pads therefrom; and forming a first wiring layer on the first dielectric layer for electrical connection with the electrode pads. | 03-10-2011 |
20110068461 | EMBEDDED DIE PACKAGE AND PROCESS FLOW USING A PRE-MOLDED CARRIER - An embedded die package includes a carrier with an electrical device in the cavity of the carrier, a first dielectric layer covering the sides and top of the electrical device except for vias over selected bonding pads of the electrical device, a plurality of metal conductors, each of which is in contact with at least one of the vias, one or more additional dielectric layers lying over the metal conductors and the first dielectric layer, wherein a top layer of the one or more dielectric layers has openings with metalization underneath coupled to at least one of the metal conductors, and solder bumps protruding from each of the openings. | 03-24-2011 |
20110079892 | CHIP PACKAGE AND FABRICATION METHOD THEREOF - A chip package includes a substrate having a pad region, a device region, and a remained scribe region located at a periphery of the substrate; a signal and an EMI ground pads disposed on the pad region; a first and a second openings penetrating into the substrate to expose the signal and the EMI ground pads, respectively; a first and a second conducting layers located in the first and the second openings and electrically connecting the signal and the EMI ground pads, respectively, wherein the first conducting layer and the signal pad are separated from a periphery of the remained scribe region, and wherein a portion of the second conducting layer and/or the EMI ground pad extend(s) to a periphery of the remained scribe region; and a third conducting layer surrounding the periphery of the remained scribe region to electrically connect the second conducting layer and/or the EMI ground pad. | 04-07-2011 |
20110180922 | SEMICONDUCTOR CHIP, SEAL-RING STRUCTURE AND MANUFACTURING PROCESS THEREOF - A semiconductor chip includes an integrated circuit region, at least one alignment indicator region and a seal-ring. The alignment indicator region is disposed near the integrated circuit region. The seal-ring surrounding the integrated circuit region is disposed outside of the integrated circuit region, and is formed as a mark for alignment on the alignment indicator region at a corner of the semiconductor chip. A manufacturing process of the seal-ring structure is also disclosed. | 07-28-2011 |
20110316141 | LAYERED CHIP PACKAGE AND METHOD OF MANUFACTURING SAME - A layered chip package includes a main body, and wiring disposed on a side surface of the main body. The main body includes: a main part including a plurality of layer portions stacked; a plurality of first terminals disposed on the top surface of the main part and connected to the wiring; and a plurality of second terminals disposed on the bottom surface of the main part and connected to the wiring. The plurality of layer portions include a first-type layer portion and a second-type layer portion. The first-type layer portion includes a conforming semiconductor chip, and a plurality of first-type electrodes that are connected to the semiconductor chip and the wiring. The second-type layer portion includes a defective semiconductor chip, and a plurality of second-type electrodes that are connected to the wiring and not to the semiconductor chip. | 12-29-2011 |
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