Class / Patent application number | Description | Number of patent applications / Date published |
257504000 | Including means for establishing a depletion region throughout a semiconductor layer for isolating devices in different portions of the layer (e.g., "JFET" isolation) | 7 |
20080265362 | BUILDING FULLY-DEPLETED AND BULK TRANSISTORS ON SAME CHIP - An integrated circuit having fully-depleted silicon-on-insulator (FD-SOI) transistors and bulk transistors on a semiconductor substrate is disclosed. | 10-30-2008 |
20100264509 | Enhanced Transmission Lines for Radio Frequency Applications - An integrated circuit structure includes a semiconductor substrate of a first conductivity type; a depletion region in the semiconductor substrate; and a deep well region substantially enclosed by the depletion region. The deep well region is of a second conductivity type opposite the first conductivity type, and includes a first portion directly over the deep well region and a second portion directly under the deep well region. A transmission line is directly over the depletion region. | 10-21-2010 |
20110079870 | SEMICONDUCTOR DEVICE - This specification discloses a semiconductor device having higher electric strength. | 04-07-2011 |
20110147880 | POWER SEMICONDUCTOR DEVICE WITH NEW GUARD RING TERMINATION DESIGN AND METHOD FOR PRODUCING SAME - A power semiconductor device, such as a power diode, and a method for producing such a device, are disclosed. The device includes a first layer of a first conductivity type, a second layer of a second conductivity type arranged in a central region on a first main side of the first layer, a third electrically conductive layer arranged on the second layer, and a fourth electrically conductive layer arranged on the first layer at a second main side opposite to the first main side. A junction termination region surrounds the second layer with self-contained sub-regions of the second conductivity type. A spacer region is arranged between the second layer and the junction termination region and includes a self-contained spacer sub-region of the second conductivity type which is electrically disconnected from the second layer. This spacer sub-region has a width for enabling a reliable alignment of a shadow mask during an ion implantation such that an implanted lifetime control region having carrier lifetime reducing defects may be restricted to a central area while no such defects are implanted into the junction termination region to improve electrical characteristics. | 06-23-2011 |
20110215435 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE - Some embodiments of the present invention relate to a semiconductor device and a method of manufacturing a semiconductor device capable of preventing the deterioration of electrical characteristics. A p-type collector region is provided on a surface layer of a backside surface of an n-type drift region. A p | 09-08-2011 |
20140015091 | SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND SOI SUBSTRATE - Provided is a semiconductor device showing stable high-frequency characteristics. | 01-16-2014 |
20160035722 | SEMICONDUCTOR DEVICES AND STRUCTURES - An Integrated Circuit device, including: a first layer including first transistors; and a second layer including second transistors overlaying the first layer, where the first transistors are facing down and the second transistors are facing up, and where the second layer includes a through layer via of less than 300 nm diameter. | 02-04-2016 |