Class / Patent application number | Description | Number of patent applications / Date published |
073789000 | Stress-strain relationship determination | 8 |
20090114032 | METHOD OF EVALUATING MATERIALS USING CURVATURE - A method of evaluating material properties of polymeric materials includes making one or more material samples or slabs, with each of the samples or slabs having a pair of material layers in contact with one another. The layers are layers of organic matrix polymer material that have different characteristics from each other, for example having a difference in composition and/or cure characteristics. Characteristics of the test slabs and the interface between the layers can be determined by examining curvatures of the test slabs. A number of samples may be made up having the same material in a first layer, and range of different materials in the respective second layers. The range may cover a range of various material compositions and/or cure characteristics. | 05-07-2009 |
20110277553 | SPECIMEN CREEP TEST AND METHODS OF USING SUCH TESTS - A method for testing the mechanical properties of a specimen having a first contact surface and a second contact surface spaced apart and opposing the first contact surface, the method comprising: applying forces to the contact surfaces of the specimen to deform the specimen over a period of time and determining the response of the specimen to the forces over time; and defining a spatial distance between the contact surfaces such that the equivalent gauge length of the specimen is greater than the distance between the contact surfaces. | 11-17-2011 |
20130255396 | SURFACE SHAPE MEASURING DEVICE - A surface shape measuring device includes a substrate, an electrode portion including at least one electrode pattern, the electrode pattern extending on the substrate, a coating layer on the substrate to cover the electrode pattern, and a detector electrically connected to the electrode pattern and detecting a change in a physical quantity of the electrode pattern generated by the deformation of the substrate or the coating layer by an external load applied thereto. | 10-03-2013 |
20160202159 | RIGID STRUCTURAL AND LOW BACK FACE SIGNATURE BALLISTIC UD/ARTICLES AND METHOD OF MAKING | 07-14-2016 |
073790000 | Compression | 4 |
20090044632 | METHOD AND APPARATUS TO MONITOR THE COMPRESSIVE STRENGTH OF INSULATION BOARDS - An edge-strength measuring device for measuring the compressive strength of a foam matrix along the edges thereof, the device comprising at least one measuring implement having one or more contacting elements for engaging with the edges of the foam matrix, and at least one measuring device in communication with said contacting elements for measuring the resistance imparted by the foam matrix when said contacting element is engaged with the edge. | 02-19-2009 |
20140020476 | Viscoelasticity Measuring Apparatus - A viscoelasticity measuring apparatus that measures viscoelasticity of a measurement target with high precision is provided. The measuring apparatus includes: a casing; a surface contact part provided in the casing and brought into surface contact with skin; a ball indenter that moves toward the skin more than the surface contact part and is pushed into the skin; a driving unit that supports the ball indenter and moves the ball indenter toward the skin; a load cell whose right end side is fixed to the casing and left end side supports the driving unit, the load cell detecting a pushing load that pushes the ball indenter into the skin; and a control unit that obtains displacement of the ball indenter. | 01-23-2014 |
20150128716 | STIFFNESS MEASUREMENT METHOD AND DEVICE - A calculating device of the stiffness measurement device pressurizes an object to be measured with a predetermined pressure and the stiffness of the object to be measured in the squeal frequency band is calculated based on an inclination of a stress-displacement performance curve immediately after a start of depressurization after the pressurization. According to this device, there is no need to oscillate the object with a high frequency band and there is no need to enhance the stiffness of the housing of the measurement device, which leads to a downsizing of the device. Further, there is no need for measuring of acceleration speed of the object to be measured and accelerator can be eliminated to reduce the cost of the stiffness measurement device. | 05-14-2015 |
20160123859 | MICRO ELECTRO-MECHANICAL HEATER - A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface. | 05-05-2016 |